AGILENT N7782B

Agilent
N7782B PER Analyzer
and N7783B Thermal
Cycling Unit
Data Sheet
Key Benefits
Introduction
•
Accurate PER-measurement up to 50 dB
•
Real-time display
•
Easy-to-use: Reliable results independent
of operator skill set
Agilent’s N7782B Series of polarization extinction ratio
(PER) Analyzers has been designed for high speed and
highly accurate testing of PER in PM fibers. The polarimetric
measurement principle guarantees reliable measurements
of PER values of up to 50 dB.
•
Swept-wavelength and heating/stretching
method available
•
Measurement of the PER versus wavelength
•
Fast/slow axis detection
•
Instruments available for 850 nm up
to 1640 nm
•
Internal fixed wavelength sources at
850 nm/1310 nm/1550 nm available.
The real time measurement capability in combination with
automation interfaces makes this unit ideally suited for
integration in manufacturing systems, for example pig-tailing
stations for laser diodes and planar wave guide components.
Analog interfaces are provided for integration of the system
in control loop applications.
Applications
Laser diode PMF pig-tailing
Characterization of PMF cross-coupling
Alignment of the PM fiber during the pig-tailing process is
supported by real-time display of the PER and the optical
power.
Polarization crosstalk in a PM fiber is measured and displayed as PER.
PM splice characterization
PMF splicing
The angular misalignment of a PM splice can be measured
in a non-destructive way. Even multiple splices in a chain
can be characterized independently.
In order to support the alignment during the splicing process of PM fibers the Agilent N7782B provides real time
display of the optical power and of the angular misalignment of the two fibers.
Using Agilent’s tunable laser source 81600B Series in combination with the N7782B PER analyzer allows measuring
the PER as a function of wavelength.
PM component characterization
Measurement of the PER on PM components like fiber
polarizers, PMF couplers, PMF splitters, etc.
Agilent’s software package includes drivers for most of the
tunable laser sources commonly used in industry.
N7782B and N7783B Application Examples
N7783B
α
N7782B
Thermal cycling unit
Laser diode
PMF
PER analyzer
Figure 1. Laser diode pigtailing using
the combination of N7782B and N7783B.
Control
The heating / stretching method
The heating / stretching method provides accurate measurements of the PER at a single wavelength.
This method supports in particular well the measurement
using narrow-band laser sources.
An optional internal laser source allows stand-alone operation of the system.
Agilent’s thermal cycling unit, N7783B, is fully controlled by
the N7782B PER analyzer and allows accurate and repeatable cycling of the temperature of the fiber under test. The
PER measurement system consisting of the N7782B and
the N7783B shows excellent accuracy and repeatability.
Ease of use and automation interfaces, such as analog
output ports for active alignment, make it particularly useful
for production environments.
2
Ref. PER = 15.33 dB
P = 7.23 dBm
Figure 2.
Agilent N7782B PER Analyzer and N7783B Thermal Cycling Unit Data Sheet
Live PER = 31.68 dB
Splice angle characterization
For characterizing an optical connection between two
polarization maintaining fibers (PMFs), such as an optical
splice, two thermal cycling units (N7783B) can be used.
This eliminates the influence of input polarization or
subsequent fibers at the output and isolates the angular
misalignment of the connection located between the two
thermal cycling units.
Figure 3.
Table 1: Specificationsa) N7782B PER Analyzer
Wavelength
Specification Wavelength Range
1270 nm … 1375 nm (Opt 300, O-Band)
1270 nm … 1375 nm, 1460 nm … 1620 nm (Opt 400, O/C/L-Band)
1460 nm … 1620 nm (Opt 500, C/L-Band)
Operating wavelength rangeb)
1260 nm ... 1640 nm
PER Analysis
PER Range[c,d]
0 … 50 dB
[c,d]
PER Uncertainty, Single-TCU Method
(typical)
PER= 0 dB ... 30 dB:
PER= 30 dB … 50 dB:
0.30 dB
0.60 dB
Splice Angle Analysis
Splice Angle Uncertainty, Dual-TCU Method[c,d]
(typical)
±(0.1° + 4% - Angle)
Optical Power
Input Power Range
-50 dBm ... +7 dBm
Internal Laser Source
Wavelength
O-Band (Opt. 401):
C-Band (Opt. 501, 401):
1290 nm … 1360 nm, 1310 nm typ.
1510 nm … 1580 nm, 1550 nm typ.
Output Power[e] (typical)
O-Band (Opt. 401):
C-Band (Opt. 501, 401):
-12 dBm
-10 dBm
[a]
[b]
[c]
[d]
[e]
Ambient temperature change max. ± 0.5°C since normalization. Specification valid on day of calibration.
PER measurements are possible outside the specification wavelength range if the user performs a manual calibration.
Note that a fully polarized light source is needed for calibration.
Input power > -30 dBm
Narrow-band light source with DOP > 95% needed.
At room temperature.
Agilent N7782B PER Analyzer and N7783B Thermal Cycling Unit Data Sheet
3
Table 2: Specificationsa) N7782B-101 PER Analyzer
Wavelength
Specification Wavelength[e]
850 nm nominal
2)
Operating Wavelength Range
830 nm ... 1000 nm
PER Analysis
PER Range[c,d]
0 ... 40 dB
PER Uncertainty, Single-TCU Method[c,d] (typical)
PER= 0 dB ... 30 dB:
PER= 30 dB … 40 dB:
0.30 dB
0.60 dB
Splice Angle Analysis
Splice Angle Uncertainty, Dual-TCU Method[c,d] (typical)
±(0.1° + 5%
Angle)
Optical Power
Input Power Range
-35 dBm ... +10 dBm
Internal Laser Source
Wavelength
Output Power
[a]
[b]
[c]
[d]
[e]
[f]
830 nm ... 880 nm, 850 nm typ.
[f]
(typical)
- 11 dBm
Ambient temperature change max. ± 0.5°C since normalization. Specification valid on day of calibration.
PER measurements are possible outside the specification wavelength range if the user performs a manual calibration
Note that a fully polarized light source is needed for calibration.
Input power > -20 dBm
Narrow-band light source with DOP > 95% needed.
The specification wavelength matches the wavelength of the internal laser source.
At room temperature.
Table 3: Specificationsa) N7783B Thermal Cycling Unit
Temperature
Minimum Peak-to-Peak Temperature Tuning Range[b]
50 K
Ambient Temperature Range
20°C ... 30°C
[a]
[b]
4
Ambient temperature change max. ± 0.5°C since normalization. Specification valid on day of calibration.
Measured on the surface of the TEC elements.
Agilent N7782B PER Analyzer and N7783B Thermal Cycling Unit Data Sheet
Agilent N7782B PER Analyzer and N7783B Thermal Cycling Unit Data Sheet
5
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Revised: July 17, 2008
Product specifications and descriptions
in this document subject to change
without notice.
© Agilent Technologies, Inc. 2008
Printed in USA, November 27, 2008
5989-8111EN