SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 • Hermetic Surface Mounted Package. • Designed For High Reliability and Space Applications. • Screening Options Available. ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VDS VGS VGD IG PD Drain – Source Voltage Gate – Source Voltage Gate – Drain Voltage Gate Current Total Power Dissipation at 40V -40V -40V 50mA 300mW 2mW/°C -55 to +175°C -65 to +200°C TA = 25°C Derate Above 25°C TJ Tstg Junction Temperature Range Storage Temperature Range THERMAL PROPERTIES Symbols Parameters RθJA Thermal Resistance, Junction To Ambient Min. Typ. Max. Units 500 °C/W Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8518 Issue 2 Page 1 of 4 SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols Parameters Test Conditions V(BR)GSS VDS = 0V IG = 1.0µA -40 VDS = 20V ID = 1.0nA -0.5 -3 IDSS Gate – Source Breakdown Voltage Gate – Source Cut-off Voltage Saturation Drain Current VDS = 20V VGS = 0V 5 30 mA IGSS Gate Reverse Current VDS = 0V VGS = -20V -100 pA TA = 150°C -200 nA ID(off) Drain Cut-off Current VGS = -5V 100 pA TA = 150°C 200 nA VDS(on) Drain – Source On Voltage Drain – Source On Resistance VGS = 0V ID = 3mA 0.4 V VGS = 0 ID = 1.0mA 100 Ω VDS = 20V VGS = 0V f = 1.0MHz VDS = 0V 26 VGS = -5V 5 VGS(off) (1) RDS(on) Min. Typ Max. Units V VDS = 20V DYNAMIC CHARACTERISTICS Ciss Common – Source Input Capacitance Crss Common – Source Reverse Transfer Capacitance RDS(on) Drain – Source On Resistance VGS = 0 f = 1.0KHz Equivalent Input Noise Voltage VDG = 10V ēn (2) pF f = 1.0MHz f = 1.0KHz tr Rise Time td(on) Turn-on Delay Time VDD = 10V tf Fall Time VGS = 0V td(off) Turn-off Delay Time ID = 0A 100 ID = 1.0mA Ω nV √Hz 3 5 VGSX = -5V ID(on) = 3mA 15 ns 30 50 Notes (1) Pulse Width ≤ 300us, δ ≤ 2% (2) By design only, not a production test. Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8518 Issue 2 Page 2 of 4 SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 MECHANICAL DATA Dimensions in mm (inches) R0.31 (0.012) 0.51 ± 0.10 (0.02 ± 0.004) See Package Variant Table 2 0.76 ± 0.15 (0.03 ± 0.006) R (0 0. .0 56 22 ) 2.54 ± 0.13 (0.10 ± 0.005) 4 3 1.02 ± 0.10 (0.04 ± 0.004) 1 1.91 ± 0.10 (0.075 ± 0.004) 0.31 (0.012) rad. 3.05 ± 0.13 (0.12 ± 0.005) 1.40 (0.055) max. C1 Underside View PACKAGE VARIANT TABLE Variant A B C D Pad 1 Drain Drain Source Source Pad 2 Source Source Drain Drain Pad 3 Gate Gate Gate Gate Pad 4 No Pad (3-Pins Only) Lid Contact * No Pad (3-Pins Only) Lid Contact * * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/mil/lcc1_4 on the Semelab web site. Package variant to be specified at order. Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8518 Issue 2 Page 3 of 4 SILICON SMALL SIGNAL N-CHANNEL JFET 2N4393C1 SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part number is built from part, package variant and screening level. The part number can be extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type – See Electrical Stability Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Screened parts are typically marked with specification number, serial number (or week of seal) as shown in the example below. All non screened parts are printed with three characters only eg. 22A. Customer specific marking requirements can be arranged at time of order but is approximately limited to two lines of 7 Characters. This is to ensure text remains readable.. Example Marking: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 2N4393C1 part, package variant D, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 2N4393C1D-JQRS (Include quantity for flight parts) 2N4393C1D-JQRS.GRPC (chargeable conformance option) 2N4393C1D-JQRS.GCDE (charge for destructive parts) 2N4393C1D-JQRS.GCDM (charge for destructive parts) 2N4393C1D-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking, package or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with all enquiries High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8518 Issue 2 Page 4 of 4