HM5164165F Series HM5165165F Series E0099H10 (1st edition) (Previous ADE-203-1058C(Z)) Jan. 31, 2001 L EO 64M EDO DRAM (4-Mword × 16-bit) 8k refresh/4k refresh Description Features Pr The HM5164165F S erie s, HM5165165F S erie s ar e 64M-bit dynamic R AMs orga nized as 4, 194,304-w ord × 16-bit. The y have re alize d high per forma nce and low powe r by employing C MOS proc ess tec hnology. HM5164165F Series, HM5165165F Series offer Extended Data Out (EDO) Page Mode as a high speed access mode. They have the package variations of standard 50-pin plastic SOJ and standerd 50-pin plastic TSOPII od • Single 3.3 V supply: 3.3 V ± 0.3 V • Access time: 50 ns/60 ns (max) • Power dissipation ⎯ Active: 432 mW/396 mW (max) (HM5164165F Series) : 504 mW/432 mW (max) (HM5165165F Series) ⎯ Standby : 1.8 mW (max) (CMOS interface) : 1.1 mW (max) (L-version) • EDO page mode capability • Refresh cycles ⎯ RAS-only refresh 8192 cycles /64 ms (HM5164165F, HM5164165FL) 4096 cycles /64 ms (HM5165165F, HM5165165FL) ⎯ CBR/Hidden refresh 4096 cycles /64 ms (HM5164165F, HM5164165FL, HM5165165F, HM5165165FL) t uc This product became EOL in December, 2006. Elpida Memory, Inc. is a joint venture DRAM company of NEC Corporation and Hitachi, Ltd. HM5164165F Series, HM5165165F Series EO • 4 variations of refresh ⎯ RAS-only refresh ⎯ CAS-before-RAS refresh ⎯ Hidden refresh ⎯ Self refresh (L-version) • 2CAS-byte control • Battery backup operation (L-version) Ordering Information Access time Package HM5164165FJ-5 HM5164165FJ-6 50 ns 60 ns 400-mil 50-pin plastic SOJ (CP-50DA) HM5164165FLJ-5 HM5164165FLJ-6 50 ns 60 ns HM5165165FJ-5 HM5165165FJ-6 50 ns 60 ns HM5165165FLJ-5 HM5165165FLJ-6 50 ns 60 ns L Type No. HM5164165FLTT-5 HM5164165FLTT-6 HM5165165FLTT-5 HM5165165FLTT-6 50 ns 60 ns 400-mil 50-pin plastic TSOP II (TTP-50DB) 50 ns 60 ns 50 ns 60 ns 50 ns 60 ns od HM5165165FTT-5 HM5165165FTT-6 Pr HM5164165FTT-5 HM5164165FTT-6 t uc Data Sheet E0099H10 2 HM5164165F Series, HM5165165F Series Pin Arrangement (HM5164165F Series) 50-pin TSOP 50-pin SOJ 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 L EO Pin Description 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 VSS I/O15 I/O14 I/O13 I/O12 VSS I/O11 I/O10 I/O9 I/O8 NC VSS LCAS UCAS OE NC NC A12 A11 A10 A9 A8 A7 A6 VSS Function Address input — Row/Refresh address A0 to A12 — Column address A0 to A8 I/O0 to I/O15 Data input/output RAS Row address strobe UCAS, LCAS Column address strobe WE Write enable OE Output enable VCC Power supply VSS Ground NC No connection t uc A0 to A12 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 (Top view) (Top view) Pin name VCC I/O0 I/O1 I/O2 I/O3 VCC I/O4 I/O5 I/O6 I/O7 NC VCC WE RAS NC NC NC NC A0 A1 A2 A3 A4 A5 VCC Pr VSS I/O15 I/O14 I/O13 I/O12 VSS I/O11 I/O10 I/O9 I/O8 NC VSS LCAS UCAS OE NC NC A12 A11 A10 A9 A8 A7 A6 VSS od VCC I/O0 I/O1 I/O2 I/O3 VCC I/O4 I/O5 I/O6 I/O7 NC VCC WE RAS NC NC NC NC A0 A1 A2 A3 A4 A5 VCC Data Sheet E0099H10 3 HM5164165F Series, HM5165165F Series Pin Arrangement (HM5165165F Series) 50-pin TSOP 50-pin SOJ 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 L EO Pin Description Function Address input — Row/Refresh address A0 to A11 — Column address A0 to A9 I/O0 to I/O15 Data input/output RAS Row address strobe UCAS, LCAS Column address strobe WE Write enable OE Output enable VCC Power supply VSS Ground NC No connection Data Sheet E0099H10 4 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 VSS I/O15 I/O14 I/O13 I/O12 VSS I/O11 I/O10 I/O9 I/O8 NC VSS LCAS UCAS OE NC NC NC A11 A10 A9 A8 A7 A6 VSS t uc A0 to A11 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 (Top view) (Top view) Pin name VCC I/O0 I/O1 I/O2 I/O3 VCC I/O4 I/O5 I/O6 I/O7 NC VCC WE RAS NC NC NC NC A0 A1 A2 A3 A4 A5 VCC Pr VSS I/O15 I/O14 I/O13 I/O12 VSS I/O11 I/O10 I/O9 I/O8 NC VSS LCAS UCAS OE NC NC NC A11 A10 A9 A8 A7 A6 VSS od VCC I/O0 I/O1 I/O2 I/O3 VCC I/O4 I/O5 I/O6 I/O7 NC VCC WE RAS NC NC NC NC A0 A1 A2 A3 A4 A5 VCC HM5164165F Series, HM5165165F Series Block Diagram (HM5164165F Series) RAS UCAS LCAS EO Row address buffers I/O buffers I/O0 to I/O15 od A9 to A12 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array Pr • • • buffers Row decoder A8 address L to Column decoder Column • • • OE Timing and control A0 A1 WE t uc Data Sheet E0099H10 5 HM5164165F Series, HM5165165F Series Block Diagram (HM5165165F Series) RAS UCAS LCAS EO Column decoder Column address Row address buffers A10 I/O buffers I/O0 to I/O15 od A11 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array 4M array Pr • • • buffers Row decoder A9 • • • L to OE Timing and control A0 A1 WE t uc Data Sheet E0099H10 6 HM5164165F Series, HM5165165F Series Operation Table LCAS UCAS WE OE I/O 0 to I/O 7 I/O 8 to I/O 15 Operation H × × × × High-Z High-Z Standby L L H H L Dout High-Z Read cycle L H L H L High-Z Dout L L L H EO RAS L L L L H L L H Dout Dout L* × Din × L* 2 × × Din L* 2 × Din Din L* 2 H Din × L* 2 H × Din L L* 2 H Din Din H H to L L to H Dout/Din High-Z L H to L L to H High-Z Dout/Din H L L H L L L L L 2 Early write cycle Delayed write cycle L L L L H L L L H to L L to H Dout/Din Dout/Din L H H × × High-Z High-Z RAS-only refresh cycle H to L H L H × High-Z High-Z CAS-before-RAS refresh cycle or H to L L H H × High-Z High-Z Self refresh cycle (L-version) H to L L L H × High-Z High-Z L L L H H High-Z High-Z Read-modify-write cycle Read cycle (Output disabled) od Pr L Notes: 1. H: VIH (inactive) L: VIL (active) ×: VIH or VIL 2. t WCS ≥ 0 ns: Early write cycle t WCS < 0 ns: Delayed write cycle 3. Mode is determined by the OR function of the UCAS and LCAS. (Mode is set by the earliest of UCAS and LCAS active edge and reset by the latest of UCAS and LCAS inactive edge.) However write operation and output High-Z control are done independently by each UCAS, LCAS. ex. if RAS = H to L, LCAS = L, UCAS = H, then CAS-before-RAS refresh cycle is selected. t uc Data Sheet E0099H10 7 HM5164165F Series, HM5165165F Series Absolute Maximum Ratings Symbol Value Unit Terminal voltage on any pin relative to VSS VT –0.5 to VCC + 0.5 (≤ 4.6 V (max)) V Power supply voltage relative to VSS VCC –0.5 to +4.6 V Short circuit output current Iout 50 mA Power dissipation PT 1.0 W Storage temperature Tstg –55 to +125 °C EO Parameter DC Operating Conditions L Parameter Min Typ Max Unit Notes VCC 3.0 3.3 3.6 V 1, 2 VSS 0 0 0 V 2 Input high voltage VIH 2.0 — VCC + 0.3 V 1 Input low voltage VIL –0.3 — 0.8 V 1 Ta 0 — 70 ˚C Supply voltage Ambient temperature range Pr Symbol Notes: 1. All voltage referred to VSS . 2. The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS pins must be on the same level. od t uc Data Sheet E0099H10 8 HM5164165F Series, HM5165165F Series DC Characteristics (HM5164165F Series) HM5164165F -5 Symbol Min Max Min Max Unit Test conditions I CC1 — 120 — 110 mA t RC = min I CC2 — 2 — 2 mA TTL interface RAS, UCAS, LCAS = VIH Dout = High-Z — 0.5 — 0.5 mA CMOS interface RAS, UCAS, LCAS ≥ VCC – 0.2 V Dout = High-Z I CC2 — 300 — 300 µA CMOS interface RAS, UCAS, LCAS ≥ VCC – 0.2 V Dout = High-Z I CC3 — 120 — 110 mA t RC = min I CC5 — 5 — 5 mA RAS = VIH UCAS, LCAS = VIL Dout = enable I CC6 — 120 — 110 mA t RC = min EDO page mode current* 1, * 3 I CC7 — 120 — 110 mA RAS = VIL , CAS cycle, t HPC = t HPC min Battery backup current* 4 (Standby with CBR refresh) (L-version) I CC10 — Self refresh mode current (L-version) I CC11 — Input leakage current I LI Output leakage current EO Parameter -6 1, Operating current* * 2 Standby current L Standby current (L-version) RAS-only refresh current* 2 CAS-before-RAS refresh current od Pr Standby current* 1 1.2 — 1.2 mA CMOS interface Dout = High-Z CBR refresh: t RC = 15.6 µs t RAS ≤ 0.3 µs 500 — 500 µA CMOS interface RAS, UCAS, LCAS ≤ 0.2 V Dout = High-Z –5 5 –5 5 I LO –5 5 –5 5 Output high voltage VOH 2.4 VCC 2.4 VCC Output low voltage VOL 0 0.4 0 0.4 0 V ≤ Vin ≤ VCC + 0.3 V µA 0 V ≤ Vout ≤ VCC Dout = disable V High Iout = –2 mA V Low Iout = 2 mA t uc µA Notes: 1. I CC depends on output load condition when the device is selected. I CC max is specified at the output open condition. 2. Address can be changed once or less while RAS = VIL. 3. Measured with one sequential address change per EDO cycle, t HPC . 4. VIH ≥ VCC – 0.2 V, 0 V ≤ VIL ≤ 0.2 V. Data Sheet E0099H10 9 HM5164165F Series, HM5165165F Series DC Characteristics (HM5165165F Series) HM5165165F -5 Parameter -6 Max Min Max Unit Test conditions I CC1 — 140 — 120 mA t RC = min I CC2 — 2 — 2 mA TTL interface RAS, UCAS, LCAS = VIH Dout = High-Z — 0.5 — 0.5 mA CMOS interface RAS, UCAS, LCAS ≥ VCC – 0.2 V Dout = High-Z I CC2 — 300 — 300 µA CMOS interface RAS, UCAS, LCAS ≥ VCC – 0.2 V Dout = High-Z I CC3 — 140 — 120 mA t RC = min I CC5 — 5 — 5 mA RAS = VIH UCAS, LCAS = VIL Dout = enable I CC6 — 140 — 120 mA t RC = min EDO page mode current* 1, * 3 I CC7 — 120 — 110 mA RAS = VIL , CAS cycle, t HPC = t HPC min Battery backup current* 4 (Standby with CBR refresh) (L-version) I CC10 — Self refresh mode current (L-version) I CC11 — Input leakage current I LI –5 Output leakage current I LO Output high voltage Output low voltage EO Symbol Min 1, Operating current* * 2 Standby current L Standby current (L-version) RAS-only refresh current* 2 CAS-before-RAS refresh current od Pr Standby current* 1 — 1.2 mA CMOS interface Dout = High-Z CBR refresh: t RC = 15.6 µs t RAS ≤ 0.3 µs 500 — 500 µA CMOS interface RAS, UCAS, LCAS ≤ 0.2 V Dout = High-Z 5 –5 5 µA 0 V ≤ Vin ≤ VCC + 0.3 V –5 5 –5 5 µA 0 V ≤ Vout ≤ VCC Dout = disable VOH 2.4 VCC 2.4 VCC V High Iout = –2 mA VOL 0 0.4 0 0.4 V Low Iout = 2 mA t uc 1.2 Notes: 1. I CC depends on output load condition when the device is selected. I CC max is specified at the output open condition. 2. Address can be changed once or less while RAS = VIL. 3. Measured with one sequential address change per EDO cycle, t HPC . 4. VIH ≥ VCC – 0.2 V, 0 V ≤ VIL ≤ 0.2 V. Data Sheet E0099H10 10 HM5164165F Series, HM5165165F Series Capacitance (Ta = 25°C, VCC = 3.3 V ± 0.3 V) Symbol Min Typ Max Unit Notes Input capacitance (Address) CI1 — — 5 pF 1 Input capacitance (Clocks) CI2 — — 7 pF 1 CI/O — — 7 pF 1, 2 EO Parameter Output capacitance (Data-in, Data-out) Notes : 1. Capacitance measured with Boonton Meter or effective capacitance measuring method. 2. RAS, UCAS and LCAS = VIH to disable Dout. L od Pr t uc Data Sheet E0099H10 11 HM5164165F Series, HM5165165F Series AC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V)*1, *2, *19, *26 Test Conditions Input rise and fall time: 2 ns Input pulse levels: VIL = 0 V, VIH = 3.0 V Input timing reference levels: 0.8 V, 2.0 V Output timing reference levels: 0.8 V, 2.0 V Output load: 1 TTL gate + C L (100 pF) (Including scope and jig) EO • • • • • Read, Write, Read-Modify-Write and Refresh Cycles (Common parameters) L Parameter HM5164165F/HM5165165F -5 -6 Min Max Min Max Unit Random read or write cycle time t RC 84 — 104 — ns RAS precharge time t RP 30 — 40 — ns t CP 8 — 10 — ns t RAS 50 10000 60 10000 ns t CAS 8 10000 10 10000 ns t ASR 0 — 0 — ns t RAH 8 — 10 — ns CAS precharge time RAS pulse width CAS pulse width Row address setup time Row address hold time t ASC Column address hold time t CAH RAS to CAS delay time t RCD RAS to column address delay time t RAD RAS hold time t RSH CAS hold time t CSH CAS to RAS precharge time Notes 30 0 — 0 — ns 27 8 — 10 — ns 27 12 37 14 45 ns 3 10 25 12 30 ns 4 13 — 15 — ns 38 — 40 — ns t CRP 5 — 5 — ns 28 OE to Din delay time t OED 13 — 15 — ns 5 OE delay time from Din t DZO 0 — 0 — ns 6 CAS delay time from Din t DZC 0 — 0 — ns 6 Transition time (rise and fall) tT 2 50 2 50 ns 7 Data Sheet E0099H10 12 t uc Column address setup time od Pr Symbol HM5164165F Series, HM5165165F Series Read Cycle HM5164165F/HM5165165F -5 -6 Symbol Min Max Min Max Unit Notes Access time from RAS t RAC — 50 — 60 ns 8, 9 Access time from CAS t CAC — 13 — 15 ns 9, 10, 17 Access time from address t AA — 25 — 30 ns 9, 11, 17 Access time from OE t OEA — 13 — 15 ns 9 Read command setup time t RCS 0 — 0 — ns 27 Read command hold time to CAS t RCH 0 — 0 — ns 12, 28 Read command hold time from RAS t RCHR 50 — 60 — ns Read command hold time to RAS t RRH 0 — 0 — ns Column address to RAS lead time t RAL 25 — 30 — ns Column address to CAS lead time t CAL 15 — 18 — ns CAS to output in low-Z t CLZ 0 — 0 — ns t OH 3 — 3 — ns Output data hold time from OE t OHO 3 — 3 — ns Output buffer turn-off time t OFF — 13 — 15 ns 13, 21 t OEZ — 13 — 15 ns 13 t CDD 13 — 15 — ns 5 L EO Parameter Output buffer turn-off to OE CAS to Din delay time Output data hold time from RAS t OHR Output buffer turn-off to RAS t OFR Output buffer turn-off to WE t WEZ WE to Din delay time t WED RAS to Din delay time t RDD od Pr Output data hold time 12 21 3 — 3 — ns 21 — 13 — 15 ns 13, 21 — 13 — 15 ns 13 13 — 15 — ns 13 — 15 — ns t uc Data Sheet E0099H10 13 HM5164165F Series, HM5165165F Series Write Cycle HM5164165F/HM5165165F -5 -6 Symbol Min Max Min Max Unit Notes Write command setup time t WCS 0 — 0 — ns 14, 27 Write command hold time t WCH 8 — 10 — ns 27 Write command pulse width t WP 8 — 10 — ns Write command to RAS lead time t RWL 13 — 15 — ns Write command to CAS lead time t CWL 8 — 10 — ns 29 Data-in setup time t DS 0 — 0 — ns 15, 29 Data-in hold time t DH 8 — 10 — ns 15, 29 Notes L EO Parameter Read-Modify-Write Cycle Pr HM5164165F/HM5165165F -5 Parameter -6 Min Max Min Max Unit Read-modify-write cycle time t RWC 116 — 140 — ns RAS to WE delay time t RWD 67 — 79 — ns 14 t CWD 30 — 34 — ns 14 42 — 49 — ns 14 13 — 15 — ns CAS to WE delay time Column address to WE delay time t AWD OE hold time from WE t OEH Refresh Cycle od Symbol -5 t uc HM5164165F/HM5165165F -6 Parameter Symbol Min Max Min Max Unit Notes CAS setup time (CBR refresh cycle) t CSR 5 — 5 — ns 27 CAS hold time (CBR refresh cycle) t CHR 8 — 10 — ns 28 WE setup time (CBR refresh cycle) t WRP 0 — 0 — ns WE hold time (CBR refresh cycle) t WRH 8 — 10 — ns RAS precharge to CAS hold time t RPC 5 — 5 — ns Data Sheet E0099H10 14 27 HM5164165F Series, HM5165165F Series EDO Page Mode Cycle HM5164165F/HM5165165F -5 -6 Symbol Min Max Min Max Unit Notes EDO page mode cycle time t HPC 20 — 25 — ns 20 EDO page mode RAS pulse width t RASP — 100000 — 100000 ns 16 Access time from CAS precharge t CPA — 28 — 35 ns 9, 17, 28 RAS hold time from CAS precharge t CPRH 28 — 35 — ns Output data hold time from CAS low t DOH 3 — 3 — ns CAS hold time referred OE t COL 8 — 10 — ns CAS to OE setup time t COP 5 — 5 — ns Read command hold time from CAS precharge t RCHC 28 — 35 — ns Write pulse width during CAS precharge t WPE 8 — 10 — ns OE precharge time 8 — 10 — ns L EO Parameter t OEP 9, 22 Pr EDO Page Mode Read-Modify-Write Cycle HM5164165F/HM5165165F -5 Symbol EDO page mode read-modify-write cycle t HPRWC time WE delay time from CAS precharge od Parameter t CPW Min Max Min Max Unit 57 — 68 — ns 45 — 54 — ns Parameter Symbol Max Refresh period t REF 64 Notes 14, 28 t uc Refresh (HM5164165F Series) -6 Unit Note ms 8192 cycles Data Sheet E0099H10 15 HM5164165F Series, HM5165165F Series Refresh (HM5165165F Series) Parameter Symbol Max Unit Note Refresh period t REF 64 ms 4096 cycles EO Self Refresh Mode (L-version) HM5164165FL/HM5165165FL -5 -6 Symbol Min Max Min Max Unit Notes RAS pulse width (self refresh) t RASS 100 — 100 — µs 25 RAS precharge time (self refresh) t RPS 90 — 110 — ns 25 CAS hold time (self refresh) t CHS –50 — –50 — ns 29 L Parameter od Pr Notes: 1. AC measurements assume t T = 2 ns. 2. An initial pause of 200 µs is required after power up followed by a minimum of eight initialization cycles (any combination of cycles containing RAS-only refresh or CAS-before-RAS refresh). 3. Operation with the t RCD (max) limit insures that t RAC (max) can be met, t RCD (max) is specified as a reference point only; if t RCD is greater than the specified t RCD (max) limit, than the access time is controlled exclusively by t CAC . 4. Operation with the t RAD (max) limit insures that t RAC (max) can be met, t RAD (max) is specified as a reference point only; if t RAD is greater than the specified t RAD (max) limit, then access time is controlled exclusively by t AA . 5. Either t OED or t CDD must be satisfied. 6. Either t DZO or t DZC must be satisfied. 7. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also, transition times are measured between VIH (min) and VIL (max). 8. Assumes that t RCD ≤ t RCD (max) and t RAD ≤ t RAD (max). If t RCD or t RAD is greater than the maximum recommended value shown in this table, t RAC exceeds the value shown. 9. Measured with a load circuit equivalent to 1 TTL loads and 100 pF. 10. Assumes that t RCD ≥ t RCD (max) and t RCD + t CAC (max) ≥ t RAD + t AA (max). 11. Assumes that t RAD ≥ t RAD (max) and t RCD + t CAC (max) ≤ t RAD + t AA (max). 12. Either t RCH or t RRH must be satisfied for a read cycles. 13. t OFF (max), t OEZ (max), t WEZ (max) and t OFR (max) define the time at which the outputs achieve the open circuit condition and are not referred to output voltage levels. 14. t WCS , t RWD, t CWD, t AWD and t CPW are not restrictive operating parameters. They are included in the data sheet as electrical characteristics only; if t WCS ≥ t WCS (min), the cycle is an early write cycle and the data out pin will remain open circuit (high impedance) throughout the entire cycle; if t RWD ≥ t RWD (min), t CWD ≥ t CWD (min), and t AWD ≥ t AWD (min), or t CWD ≥ t CWD (min), t AWD ≥ t AWD (min) and t CPW ≥ t CPW (min), the cycle is a read-modify-write and the data output will contain data read from the selected cell; if neither of the above sets of conditions is satisfied, the condition of the data out (at access time) is indeterminate. 15. t DS and t DH are referred to UCAS and LCAS leading edge in early write cycles and to WE leading edge in delayed write or read-modify-write cycles. t uc Data Sheet E0099H10 16 HM5164165F Series, HM5165165F Series L EO 16. t RASP defines RAS pulse width in EDO page mode cycles. 17. Access time is determined by the longest among t AA , t CAC and t CPA. 18. In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying data to the device. 19. When output buffers are enabled once, sustain the low impedance state until valid data is obtained. When output buffer is turned on and off within a very short time, generally it causes large VCC/V SS line noise, which causes to degrade VIH min/VIL max level. 20. t HPC (min) can be achieved during a series of EDO page mode write cycles or EDO page mode read cycles. If both write and read operation are mixed in a EDO page mode RAS cycle (EDO page mode mix cycle (1), (2)), minimum value of CAS cycle (tCAS + t CP + 2 t T) becomes greater than the specified t HPC (min) value.The value of CAS cycle time of mixed EDO page mode is shown in EDO page mode mix cycle (1) and (2). 21. Data output turns off and becomes high impedance from later rising edge of RAS and CAS. Hold time and turn off time are specified by the timing specifications of later rising edge of RAS and CAS between t OHR and t OH , and between t OFR and t OFF. 22. t DOH defines the time at which the output level go cross. VOL = 0.8 V, VOH = 2.0 V of output timing reference level. 23. Before and after self refresh mode, execute CBR refresh to all refresh addresses in or within 64 ms period on the condition a and b below. a. Enter self refresh mode within 15.6 µs after either burst refresh or distributed refresh at equal interval to all refresh addresses are completed. b. Start burst refresh or distributed refresh at equal interval to all refresh addresses within 15.6µs after exiting from self refresh mode. 24. In case of entering from RAS-only-refresh, it is necessary to execute CBR refresh before and after self refresh mode according as note 23. 25 At t RASS > 100 µs, self refresh mode is activated, and not activated at t RASS < 10 µs. It is undefined within the range of 10 µs ≤ t RASS ≤ 100 µs. For t RASS ≥ 10 µs, it is necessary to satisfy t RPS. 26. When both UCAS and LCAS go low at the same time, all 16-bit data are written into the device. UCAS and LCAS cannot be staggered within the same write/read cycles. 27. t ASC, t CAH , t RCS , t WCS , t WCH, t CSR and t RPC are determined by the earlier falling edge of UCAS or LCAS. 28. t CRP , t CHR, t RCH, t CPA and t CPW are determined by the later rising edge of UCAS or LCAS. 29. t CWL, t DH, t DS and t CHS should be satisfied by both UCAS and LCAS. 30. t CP is determined by the time that both UCAS and LCAS are high. 31. XXX: H or L (H: VIH (min) ≤ VIN ≤ VIH (max), L: VIL (min) ≤ VIN ≤ VIL (max)) ///////: Invalid Dout When the address, clock and input pins are not described on timing waveforms, their pins must be applied VIH or VIL. od Pr t uc Data Sheet E0099H10 17 HM5164165F Series, HM5165165F Series Notes concerning 2CAS control Please do not separate the UCAS/LCAS operation timing intentionally. However skew between UCAS/LCAS are allowed under the following conditions. EO 1. Each of the UCAS/LCAS should satisfy the timing specifications individually. 2. Different operation mode for upper/lower byte is not allowed; such as following. RAS Delayed write UCAS L LCAS Pr WE Early write 3. Closely separated upper/lower byte control is not allowed. However when the condition (tCP ≤ tUL) is satisfied, EDO page mode can be performed. UCAS LCAS od RAS t uc t UL 4. Byte control operation by remaining UCAS or LCAS high is guaranteed. Data Sheet E0099H10 18 HM5164165F Series, HM5165165F Series Timing Waveforms*31 Read Cycle EO tRC tRAS tRP RAS tCSH tT tASR tRAD tRAH tRAL tCAL tASC tCAH Pr Address tRSH tCAS L UCAS LCAS tCRP tRCD Column Row tRRH tRCHR tRCS od WE tRCH tDZC tCDD tWED tRDD High-Z tDZO tOEA OE tCAC tAA tRAC tCLZ t uc ; Din tOED tOEZ tOHO tOFF tOH tOFR tOHR tWEZ Dout Dout Data Sheet E0099H10 19 HM5164165F Series, HM5165165F Series Early Write Cycle tRC tRAS tRP EO RAS tCSH tCRP tRCD tRSH tCAS tT L UCAS LCAS tASR tASC tCAH Pr Address tRAH Row Column tWCS tDS tDH Din High-Z* Dout t uc Din od WE tWCH * t WCS Data Sheet E0099H10 20 t WCS (min) HM5164165F Series, HM5165165F Series Delayed Write Cycle*18 tRC tRAS tRP EO RAS tCSH tCRP tRCD tRSH tCAS tT L UCAS LCAS tRAH tASR Address tASC Row tCAH Column Pr tRCS WE High-Z tDS tDH Din tOED tDZO tOEH tOEP OE tOEZ tCLZ t uc ; Din tRWL tWP od tDZC tCWL High-Z Dout Invalid Dout Data Sheet E0099H10 21 HM5164165F Series, HM5165165F Series Read-Modify-Write Cycle*18 tRWC tRAS tRP EO RAS tRCD L UCAS LCAS tT Address tASR tCAS tCRP tRAD tASC tRAH Row tCAH Column Pr tCWL tCWD tRCS tRWL tWP tAWD tRWD WE od tDZC tDH tDS High-Z Din ; Din tOED tOEH tOEA tOEP OE tCAC tAA tOEZ tRAC tOHO Dout Dout tCLZ Data Sheet E0099H10 22 t uc tDZO High-Z HM5164165F Series, HM5165165F Series RAS-Only Refresh Cycle tRC tRAS EO tRP RAS tT tRPC tCRP tCRP UCAS LCAS L Address tASR tRAH Row tOFR High-Z od t uc ; Dout Pr tOFF Data Sheet E0099H10 23 HM5164165F Series, HM5165165F Series CAS-Before-RAS Refresh Cycle tRC tRP tRC tRP EO tRAS tRAS tRP RAS tT tRPC tCP tRPC tCSR tCHR tCP tCRP tCSR tCHR UCAS L LCAS tWRP tWRH tWRP tWRH WE Pr Address tOFR od tOFF High-Z Data Sheet E0099H10 24 t uc ; Dout HM5164165F Series, HM5165165F Series Hidden Refresh Cycle tRC tRAS tRP tRC tRAS tRC tRP tRAS tRP EO RAS tT tRSH UCAS LCAS tRAD Address tCRP tRAL L tASR tCHR tRCD tRAH tASC Row tCAH Column Pr tRRH tRCS WE tWED od tDZC tRCH tCDD tRDD High-Z Din tDZO OE tCAC tAA tRAC t uc tOEA tOED tOFF ; tCLZ tOEZ tWEZ tOHO tOH Dout Dout tOFR tOHR Data Sheet E0099H10 25 HM5164165F Series, HM5165165F Series EDO Page Mode Read Cycle t RP t HPC t RASP EO RAS tT UCAS LCAS t CSH t CP t HPC t CAS t HPC t CPRH t CP t t CRP RSH t CAS tCAS tCAS t RCHC t RCHR t RCS t CP t RRH t RCH t RCH t RCS WE Address tRAH tASC tCAH L tASR Row Column 1 t WPE t ASC t CAH t ASC t CAH Column 2 Column 3 t CAL t CAL t RAL t CAH tASC t WED Column 4 t CAL t CAL tRDD tCDD tDZC Pr High-Z Din tCOL tOEP tCOP tOED tOEP ; tDZO OE tAA tCAC tCAC tAA tWEZ tRAC Dout tCPA tAA tCAC tOEZ tOHO tOEZ tOEA tDOH Dout 1 Dout 2 tOFR tOHR tOEZ tCPA od tCPA tOEA Dout 2 tOHO Dout 3 tAA tCAC tOHO tOFF tOH tOEA Dout 4 t uc Data Sheet E0099H10 26 HM5164165F Series, HM5165165F Series EDO Page Mode Read Cycle (2CAS control) t RP t RASP EO RAS tT t CSH t CAS LCAS UCAS t HPC t CP t CRP tRSH tCAS t CAS t RCHC t RRH t RCH t RCS tASR tRAH tASC Row tCAH Column 1 t ASC t CAH t ASC t CAH Column 2 Column 3 Pr Address tHPC t CP t CAS L WE t HPC t CP t CAL tDZC t CAL t RAL t CAH tASC t WED Column 4 t CAL tRDD t CAL tCDD High-Z Din tCOL tCOP od tDZO tOEP OE tOEA tOFR tOHR tOEZ tCPA tCPA tAA tCAC tOEZ tOEZ tOHO tAA ; tCAC tAA tOED tOEP tDOH L Dout tOHO tOFF tOH tOHO Dout 1 Dout 2 Dout 2 tCPA tAA tCAC U Dout tCAC t uc tRAC tOEA Dout 1 Dout 4 tOEA Dout 3 Dout 4 Data Sheet E0099H10 27 HM5164165F Series, HM5165165F Series EDO Page Mode Early Write Cycle tRP tRASP EO RAS tT tCSH tHPC tCAS tRCD tCP tRSH tCAS tCP tCAS tCRP UCAS LCAS L tASR Address Row tRAH tASC Column 1 Column 2 tWCH tDH Din 1 tWCS tWCH tASC tCAH Column N tWCS tWCH tDS tDH Din 2 High-Z* tDS tDH Din N t uc Dout tCAH od tDS Din tASC Pr tWCS WE tCAH * t WCS Data Sheet E0099H10 28 t WCS (min) HM5164165F Series, HM5165165F Series EDO Page Mode Delayed Write Cycle*18 tRASP EO tRP RAS tT tCP tRCD UCAS LCAS tASR tHPC tCAS tCAS L tASC tCAH tASC tCAH Row Column 1 Column 2 tASC tCAH Column N tCWL Pr tCWL tWP tDZC tDS tRCS Din 1 tDZO tOED tDH Din 2 tDZO tOED tOEP tOEH tDZO tDH Din N tOED tOEP tOEH t uc ; tOEP tOEH tWP tDZC tDS od tWP tDZC tDS tDH Din tCWL tRWL tRCS tRCS WE tRSH tCAS tRAD tRAH Address tCRP tCP tCSH OE tCLZ tCLZ tOEZ tCLZ tOEZ Dout Invalid Dout Invalid Dout tOEZ High-Z Invalid Dout Data Sheet E0099H10 29 HM5164165F Series, HM5165165F Series EDO Page Mode Read-Modify-Write Cycle*18 t RASP EO t RP RAS tT t HPRWC t CP t RCD t RSH t CP t CAS t CAS t CRP t CAS UCAS LCAS L t ASR Address t RAD t ASC t RAH Row t ASC t CAH t CAH Column 1 Column 2 t CWL Column N t CPW t CWL Pr t RWD t AWD t RCS t WP od t OED t DZC t DS t DH Din 2 t OED t DZO t OEP t OEH t DH Din N t OED t DZO t OEP t OEH OE t OHO t OEA t CAC t OHO t OEA t CAC t AA t OEZ t CLZ t OHO t OEA t CAC t AA t CPA t RAC t uc ; t OEP t OEH t RWL t CWD t WP Din 1 t CWL t AWD t RCS t DZC t DS t DH t DZO t CWD t WP t DZC t DS Din t CPW t AWD t RCS t CWD WE t ASC t CAH t AA t CPA t OEZ t CLZ t OEZ t CLZ High-Z Dout Dout 1 Dout 2 Data Sheet E0099H10 30 Dout N HM5164165F Series, HM5165165F Series EDO Page Mode Mix Cycle (1) *20 t RP t RASP EO RAS tT UCAS LCAS t CAS t CRP t CP t CP t CP t CAS tCAS t CSH tCAS tCWL tRSH t RCD t WCS tCPW tAWD WE L t ASC tRAH tASR Address Row tASC t CAH Column 2 Column 3 tASC t RAL t CAH Column 4 t CAL tRDD tCDD t CAL t DH Din 1 tWP t DH t DS High-Z Din 3 tOED ; Din Column 1 t ASC t CAH Pr t DS tCAH t RRH t RCH t RCS t RCS t WCH OE tCPA tAA tOEA tAA tCAC Dout tWED t DOH Dout 2 tOFR tWEZ tCPA od tCPA tOEP t OEZ tCAC t OHO Dout 3 tAA tOEZ tCAC tOHO tOEA tOFF tOH Dout 4 t uc Data Sheet E0099H10 31 HM5164165F Series, HM5165165F Series EDO Page Mode Mix Cycle (2)* 20 t RP t RASP RAS EO CAS tT UCAS LCAS t CSH t CAS t RCD t CAS tCAS t RCHR t RCS t RCH tWCS t WCH tCWL t ASC tRAH Row tCAH Column 1 t ASC t CAH t ASC t CAH Column 2 Column 3 tRSH t RCS t RRH t RCH tWP tCPW L Address tCAS t RCS WE tASR t CRP t CP t CP t CP t RAL t CAH tASC Column 4 t CAL t CAL t DS t DH Pr t DS High-Z Din Din 2 Din 3 t OEP t OEP tOED tOED tCOP tWED tCOL OE t OEA tOEA tCAC tOEZ tCPA tAA tCAC tRAC t OHO Dout 1 tOFR tWEZ tCPA od tAA Dout tRDD tCDD t DH tOEZ t OHO Dout 3 tAA tCAC tOEZ tOEA tOFF tOH tOHO Dout 4 t uc Data Sheet E0099H10 32 HM5164165F Series, HM5165165F Series Self Refresh Cycle (L-version)* 23, 24, 25 tRASS tRP tRPS EO RAS tT ; ; tRPC tCP UCAS LCAS tCRP tCHS tCSR L tWRP tWRH WE ; Pr tOFR tOFF Dout High-Z od t uc Data Sheet E0099H10 33 HM5164165F Series, HM5165165F Series Package Dimensions HM5164165FJ/FLJ Series HM5165165FJ/FLJ Series (CP-50DA) 20.95 21.38 Max 3.50 ± 0.26 Pr 1.09 Max 0.80 *0.32 ± 0.08 0.30 ± 0.04 2.55 ± 0.12 25 0.47 0.90 ± 0.26 1 11.18 ± 0.13 26 10.16 ± 0.13 50 L EO Unit: mm 9.40 ± 0.25 0.10 CP-50DA Conforms — 1.2 g od *Dimension including the plating thickness Base material dimension Hitachi Code JEDEC EIAJ Weight (reference value) t uc Data Sheet E0099H10 34 HM5164165F Series, HM5165165F Series HM5164165FTT/FLTT Series HM5165165FTT/FLTT Series (TTP-50DB) Unit: mm EO 20.95 21.35 Max 26 10.16 50 1 25 L 0.80 0.10 *0.30 +– 0.05 0.28 ± 0.05 0.13 M 0.80 11.76 ± 0.20 1.15 Max 0.10 *Dimension including the plating thickness Base material dimension 0.50 ± 0.10 Hitachi Code JEDEC EIAJ Weight (reference value) 0.68 0.13 ± 0.05 *0.145 ± 0.05 0.125 ± 0.04 Pr 1.20 Max 0° – 5° TTP-50DB — — 0.51 g od t uc Data Sheet E0099H10 35 HM5164165F Series, HM5165165F Series Cautions L EO 1. Elpida Memory, Inc. neither warrants nor grants licenses of any rights of Elpida Memory, Inc.’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Elpida Memory, Inc. bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Elpida Memory, Inc. makes every attempt to ensure that its products are of high quality and reliability. However, contact Elpida Memory, Inc. before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Elpida Memory, Inc. particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Elpida Memory, Inc. bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Elpida Memory, Inc. product does not cause bodily injury, fire or other consequential damage due to operation of the Elpida Memory, Inc. product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Elpida Memory, Inc.. 7. Contact Elpida Memory, Inc. for any questions regarding this document or Elpida Memory, Inc. semiconductor products. od Pr t uc Data Sheet E0099H10 36