HITACHI HM5118165LTT-6

HM5118165 Series
16 M EDO DRAM (1-Mword × 16-bit)
1 k Refresh
ADE-203-636D (Z)
Rev. 4.0
Nov. 1997
Description
The Hitachi HM5118165 is a CMOS dynamic RAM organized as 1,048,576-word × 16-bit. It employs the
most advanced 0.5 µm CMOS technology for high performance and low power. The HM5118165 offers
Extended Data Out (EDO) Page Mode as a high speed access mode. It is packaged in 42-pin plastic SOJ
and 50-pin plastic TSOP II.
Features
• Single 5 V (±10%)
• Access time : 50 ns/60 ns/70 ns (max)
• Power dissipation
 Active mode : 1045 mW/935 mW/825 mW (max)
 Standby mode : 11 mW (max)
: 0.83 mW (max) (L-version)
• EDO page mode capability
• Refresh cycles
 1024 refresh cycles : 16 ms
: 128 ms (L-version)
• 4 variations of refresh
 RAS-only refresh
 CAS-before-RAS refresh
 Hidden refresh
 Self refresh (L-version)
• 2CAS-byte control
• Battery backup operation (L-version)
HM5118165 Series
Ordering Information
Type No.
Access time
Package
HM5118165J-5
HM5118165J-6
HM5118165J-7
50 ns
60 ns
70 ns
400-mil 42-pin plastic SOJ (CP-42D)
HM5118165LJ-5
HM5118165LJ-6
HM5118165LJ-7
50 ns
60 ns
70 ns
HM5118165TT-5
HM5118165TT-6
HM5118165TT-7
50 ns
60 ns
70 ns
HM5118165LTT-5
HM5118165LTT-6
HM5118165LTT-7
50 ns
60 ns
70 ns
2
400-mil 50-pin plastic TSOP II (TTP-50/44DC)
HM5118165 Series
Pin Arrangement
HM5118165J/LJ Series
HM5118165TT/LTT Series
VCC
1
42
VSS
I/O0
2
41
I/O15
I/O1
3
40
I/O14
I/O2
4
39
I/O13
I/O3
5
38
I/O12
VCC
6
37
VSS
I/O4
7
36
I/O11
I/O5
8
35
I/O10
I/O6
9
34
I/O9
I/O7
10
33
I/O8
NC
11
32
NC
NC
12
31
LCAS
WE
13
30
UCAS
RAS
14
29
OE
NC
15
28
A9
NC
16
27
A8
A0
17
26
A7
A1
18
25
A6
A2
19
24
A5
A3
20
23
A4
21
22
VSS
VCC
(Top view)
VCC
I/O0
I/O1
I/O2
I/O3
VCC
I/O4
I/O5
I/O6
I/O7
NC
1
2
3
4
5
6
7
8
9
10
11
50
49
48
47
46
45
44
43
42
41
40
V SS
I/O15
I/O14
I/O13
I/O12
V SS
I/O11
I/O10
I/O9
I/O8
NC
NC
NC
WE
RAS
NC
NC
A0
A1
A2
A3
VCC
15
16
17
18
19
20
21
22
23
24
25
36
35
34
33
32
31
30
29
28
27
26
NC
LCAS
UCAS
OE
A9
A8
A7
A6
A5
A4
VSS
(Top view)
Pin Description
Pin name
Function
A0 to A9
Address input
— Row/Refresh address A0 to A9
— Column address
A0 to A9
I/O0 to I/O15
Data input/Data output
RAS
Row address strobe
UCAS, LCAS
Column address strobe
WE
Read/Write enable
OE
Output enable
VCC
Power supply
VSS
Ground
NC
No connection
3
HM5118165 Series
Block Diagram
RAS
UCAS LCAS
WE
OE
Timing and control
A0
Column decoder
A1
to
Column
•
•
•
address
buffers
•
•
•
Row
address
buffers
4
Row decoder
A9
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
1M array
I/O buffers
I/O0
to
I/O15
HM5118165 Series
Truth Table
RAS
LCAS
UCAS
WE
OE
Output
Operation
H
D
D
D
D
Open
Standby
L
L
H
H
L
Valid
Lower byte Read cycle
L
H
L
H
L
Valid
Upper byte
L
L
L
H
L
Valid
Word
L
L
L
L
L
L
H
L
L
H
H
L
L
H
L
L
*2
D
Open
Lower byte Early write cycle
L*
2
D
Open
Upper byte
L*
2
D
Open
Word
L*
2
H
Undefined
Lower byte Delayed write cycle
L*
2
H
Undefined
Upper byte
2
H
Undefined
Word
L
L
L
L*
L
L
H
H to L
L to H
Valid
Lower byte Read-modify-write cycle
L
H
L
H to L
L to H
Valid
Upper byte
L
L
L
H to L
L to H
Valid
Word
L
H
H
D
D
Open
Word
RAS-only refresh cycle
H to L
H
L
D
D
Open
Word
CAS-before-RAS refresh cycle or
H to L
L
H
D
D
Open
Word
Self refresh cycle (L-version)
H to L
L
L
D
D
Open
Word
L
L
L
H
H
Open
Read cycle (Output disabled)
Notes: 1. H: High (inactive) L: Low (active) D: H or L
2. t WCS ≥ 0 ns Early write cycle
t WCS < 0 ns Delayed write cycle
3. Mode is determined by the OR function of the UCAS and LCAS. (Mode is set by the earliest of
UCAS and LCAS active edge and reset by the latest of UCAS and LCAS inactive edge.)
However write OPERATION and output High-Z control are done independently by each UCAS,
LCAS.
ex. if RAS = H to L, UCAS = H, LCAS = L, then CAS-before-RAS refresh cycle is selected.
5
HM5118165 Series
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Voltage on any pin relative to V SS
VT
–1.0 to +7.0
V
Supply voltage relative to VSS
VCC
–1.0 to +7.0
V
Short circuit output current
Iout
50
mA
Power dissipation
PT
1.0
W
Operating temperature
Topr
0 to +70
°C
Storage temperature
Tstg
–55 to +125
°C
Recommended DC Operating Conditions (Ta = 0 to +70°C)
Parameter
Symbol
Min
Typ
Max
Unit
Notes
Supply voltage
VCC
4.5
5.0
5.5
V
1, 2
Input high voltage
VIH
2.4
—
6.5
V
1
Input low voltage
VIL
–1.0
—
0.8
V
1
Notes: 1. All voltage referred to VSS
2. The supply voltage with all VCC pins must be on the same level. The supply voltage with all VSS
pins must be on the same level.
DC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, VSS = 0 V)
HM5118165
-5
Parameter
1,
Operating current* *
Standby current
Standby current
(L-version)
6
2
-6
-7
Symbol
Min Max Min Max Min Max Unit
Test conditions
I CC1
—
200 —
170 —
150 mA
t RC = min
I CC2
—
2
—
2
—
2
mA
TTL interface
RAS, UCAS, LCAS = VIH
Dout = High-Z
—
1
—
1
—
1
mA
CMOS interface
RAS, UCAS,
LCAS ≥ VCC – 0.2 V
Dout = High-Z
—
150 —
150 µA
CMOS interface
RAS, UCAS,
LCAS ≥ VCC – 0.2 V
Dout = High-Z
I CC2
150 —
HM5118165 Series
DC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, VSS = 0 V) (cont.)
HM5118165
-5
Parameter
-6
-7
Symbol
Min Max Min Max Min Max Unit
Test conditions
I CC3
—
200 —
170 —
150 mA
t RC = min
Standby current*
I CC5
—
5
5
5
RAS = VIH,
UCAS, LCAS = VIL
Dout = enable
CAS-before-RAS refresh
current
I CC6
—
190 —
170 —
150 mA
t RC = min
EDO page mode current*1, * 3 I CC7
—
185 —
165 —
145 mA
t HPC = min
RAS-only refresh current*
2
1
—
—
mA
Battery backup current*
(Standby with CBR refresh)
(L-version)
I CC10
—
500 —
500 —
500 µA
CMOS interface
Dout = High-Z
CBR refresh: tRC = 125 µs
t RAS ≤ 0.3 µs
Self refresh mode current
(L-version)
I CC11
—
300 —
300 —
300 µA
CMOS interface
RAS, UCAS, LCAS ≤ 0.2
V
Dout = High-Z
Input leakage current
I LI
–10 10
–10 10
–10 10
µA
0 V ≤ Vin ≤ 7 V
Output leakage current
I LO
–10 10
–10 10
–10 10
µA
0 V ≤ Vout ≤ 7 V
Dout = disable
Output high voltage
VOH
2.4
VCC 2.4
VCC 2.4
VCC
V
High Iout = –2 mA
Output low voltage
VOL
0
0.4
0.4
0.4
V
Low Iout = 2 mA
4
0
0
Notes: 1. I CC depends on output load condition when the device is selected. ICC max is specified at the
output open condition.
2. Address can be changed once or less while RAS = VIL.
3. Address can be changed once or less while UCAS and LCAS = VIH.
4. VIH ≥ VCC – 0.2 V, 0 V ≤ VIL ≤ 0.2 V.
Capacitance (Ta = 25°C, VCC = 5 V ± 10%)
Parameter
Symbol
Typ
Max
Unit
Notes
Input capacitance (Address)
CI1
—
5
pF
1
Input capacitance (Clocks)
CI2
—
7
pF
1
Output capacitance (Data-in, Data-out)
CI/O
—
7
pF
1, 2
Notes : 1. Capacitance measured with Boonton Meter or effective capacitance measuring method.
2. RAS, UCAS and LCAS = VIH to disable Dout.
7
HM5118165 Series
AC Characteristics (Ta = 0 to +70°C, VCC = 5 V ± 10%, VSS = 0 V)*1, *2, *18, *19, *20
Test Conditions
•
•
•
•
•
Input rise and fall time: 2 ns
Input levels: 0 V, 3.0 V
Input timing reference levels: 0.8 V, 2.4 V
Output timing reference levels: 0.8 V, 2.0 V
Output load: 1 TTL gate + C L (100 pF) (Including scope and jig)
Read, Write, Read-Modify-Write and Refresh Cycles (Common parameters)
HM5118165
-5
-6
-7
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Unit
Random read or write cycle time
t RC
84
—
104
—
124
—
ns
RAS precharge time
t RP
30
—
40
—
50
—
ns
CAS precharge time
t CP
7
—
10
—
13
—
ns
RAS pulse width
t RAS
50
10000 60
10000 70
10000 ns
CAS pulse width
t CAS
7
10000 10
10000 13
10000 ns
Row address setup time
t ASR
0
—
0
—
0
—
ns
Row address hold time
t RAH
7
—
10
—
10
—
ns
Column address setup time
t ASC
0
—
0
—
0
—
ns
21
Column address hold time
t CAH
7
—
10
—
13
—
ns
21
RAS to CAS delay time
t RCD
11
37
14
45
14
52
ns
3
RAS to column address delay time
t RAD
9
25
12
30
12
35
ns
4
RAS hold time
t RSH
10
—
13
—
13
—
ns
CAS hold time
t CSH
35
—
40
—
45
—
ns
23
CAS to RAS precharge time
t CRP
5
—
5
—
5
—
ns
22
OE to Din delay time
t OED
13
—
15
—
18
—
ns
5
OE delay time from Din
t DZO
0
—
0
—
0
—
ns
6
CAS delay time from Din
t DZC
0
—
0
—
0
—
ns
6
Transition time (rise and fall)
tT
2
50
2
50
2
50
ns
7
8
Notes
HM5118165 Series
Read Cycle
HM5118165
-5
-6
-7
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Unit
Notes
Access time from RAS
t RAC
—
50
—
60
—
70
ns
8, 9
Access time from CAS
t CAC
—
13
—
15
—
18
ns
9, 10, 17
Access time from address
t AA
—
25
—
30
—
35
ns
9, 11, 17
Access time from OE
t OEA
—
13
—
15
—
18
ns
9
Read command setup time
t RCS
0
—
0
—
0
—
ns
21
Read command hold time to CAS
t RCH
0
—
0
—
0
—
ns
12, 22
Read command hold time from
RAS
t RCHR
50
—
60
—
70
—
ns
Read command hold time to RAS
t RRH
0
—
0
—
0
—
ns
Column address to RAS lead time
t RAL
25
—
30
—
35
—
ns
Column address to CAS lead time
t CAL
15
—
18
—
23
—
ns
CAS to output in low-Z
t CLZ
0
—
0
—
0
—
ns
Output data hold time
t OH
3
—
3
—
3
—
ns
Output data hold time from OE
t OHO
3
—
3
—
3
—
ns
Output buffer turn-off time
t OFF
—
13
—
15
—
15
ns
13, 27
Output buffer turn-off to OE
t OEZ
—
13
—
15
—
15
ns
13
CAS to Din delay time
t CDD
13
—
15
—
18
—
ns
5
Output data hold time from RAS
t OHR
3
—
3
—
3
—
ns
27
Output buffer turn-off to RAS
t OFR
—
13
—
15
—
15
ns
27
Output buffer turn-off to WE
t WEZ
—
13
—
15
—
15
ns
WE to Din delay time
t WED
13
—
15
—
18
—
ns
RAS to Din delay time
t RDD
13
—
15
—
18
—
ns
RAS next CAS delay time
t RNCD
50
—
60
—
70
—
ns
12
27
9
HM5118165 Series
Write Cycle
HM5118165
-5
-6
-7
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Unit
Notes
Write command setup time
t WCS
0
—
0
—
0
—
ns
14, 21
Write command hold time
t WCH
7
—
10
—
13
—
ns
21
Write command pulse width
t WP
7
—
10
—
10
—
ns
Write command to RAS lead time
t RWL
7
—
10
—
13
—
ns
Write command to CAS lead time
t CWL
7
—
10
—
13
—
ns
23
Data-in setup time
t DS
0
—
0
—
0
—
ns
15, 23
Data-in hold time
t DH
7
—
10
—
13
—
ns
15, 23
Notes
Read-Modify-Write Cycle
-5
-6
-7
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Unit
Read-modify-write cycle time
t RWC
111
—
135
—
161
—
ns
RAS to WE delay time
t RWD
67
—
79
—
92
—
ns
14
CAS to WE delay time
t CWD
30
—
34
—
40
—
ns
14
Column address to WE delay time
t AWD
42
—
49
—
57
—
ns
14
OE hold time from WE
t OEH
13
—
15
—
18
—
ns
Refresh Cycle
HM5118165
-5
Parameter
-7
Min
Max
Min
Max
Min
Max
Unit
Notes
CAS setup time (CBR refresh cycle) t CSR
5
—
5
—
5
—
ns
21
CAS hold time (CBR refresh cycle) t CHR
7
—
10
—
10
—
ns
22
RAS precharge to CAS hold time
5
—
5
—
5
—
ns
21
10
Symbol
-6
t RPC
HM5118165 Series
EDO Page Mode Cycle
HM5118165
-5
-6
-7
Parameter
Symbol
Min Max
Min Max
Min Max
Unit
Notes
EDO page mode cycle time
t HPC
20
—
25
30
ns
25
EDO page mode RAS pulse width
t RASP
—
100000 —
100000 —
100000 ns
16
Access time from CAS precharge
t CPA
—
28
—
35
—
40
ns
9, 17, 22
RAS hold time from CAS precharge t CPRH
28
—
35
—
40
—
ns
Output data hold time from CAS low t DOH
3
—
3
—
3
—
ns
CAS hold time referred OE
t COL
7
—
10
—
13
—
ns
CAS to OE setup time
t COP
5
—
5
—
5
—
ns
Read command hold time from
CAS precharge
t RCHC
28
—
35
—
40
—
ns
—
—
9
EDO Page Mode Read-Modify-Write Cycle
HM5118165
-5
Parameter
Symbol
-6
-7
Min
Max
Min
Max
Min
Max
Unit
EDO page mode read-modify-write t HPRWC
cycle time
57
—
68
—
79
—
ns
WE delay time from CAS precharge t CPW
45
—
54
—
62
—
ns
Notes
14, 22
Refresh
Parameter
Symbol
Max
Unit
Note
Refresh period
t REF
16
ms
1024 cycles
Refresh period (L-version)
t REF
128
ms
1024 cycles
11
HM5118165 Series
Self Refresh Mode (L-version)
HM5118165L
-5
-6
-7
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Unit
Notes
RAS pulse width (self refresh)
t RASS
100
—
100
—
100
—
µs
28, 29, 30,
31
RAS precharge time (self refresh)
t RPS
90
—
110
—
130
—
ns
CAS hold time (self refresh)
t CHS
–50
—
–50
—
–50
—
ns
Notes: 1. AC measurements assume t T = 2 ns.
2. An initial pause of 200 µs is required after power up followed by a minimum of eight initialization
cycles (any combination of cycles containing RAS-only refresh or CAS-before-RAS refresh).
3. Operation with the tRCD (max) limit insures that tRAC (max) can be met, tRCD (max) is specified as a
reference point only; if t RCD ≥ tRAD (max) + tAA (max) – tCAC (max), then access time is controlled
exclusively by t CAC .
4. Operation with the tRAD (max) limit insures that tRAC (max) can be met, tRAD (max) is specified as a
reference point only; if t RAD is greater than the specified tRAD (max) limit, then access time is
controlled exclusively by tAA .
5. Either t OED or tCDD must be satisfied.
6. Either t DZO or tDZC must be satisfied.
7. VIH (min) and VIL (max) are reference levels for measuring timing of input signals. Also, transition
times are measured between V IH (min) and VIL (max).
8. Assumes that t RCD ≤ tRCD (max) and tRAD ≤ tRAD (max). If tRCD or tRAD is greater than the maximum
recommended value shown in this table, t RAC exceeds the value shown.
9. Measured with a load circuit equivalent to 1 TTL loads and 100 pF.
10. Assumes that t RCD ≥ tRCD (max) and tRCD + tCAC (max) ≥ tRAD + tAA (max).
11. Assumes that t RAD ≥ tRAD (max) and tRCD + tCAC (max) ≤ tRAD + tAA (max).
12. Either t RCH or tRRH must be satisfied for a read cycles.
13. t OFF (max) and tOEZ (max) define the time at which the outputs achieve the open circuit condition
and are not referred to output voltage levels.
14. t WCS , t RWD, t CWD, t AWD and t CPW are not restrictive operating parameters. They are included in the
data sheet as electrical characteristics only; if t WCS ≥ tWCS (min), the cycle is an early write cycle
and the data out pin will remain open circuit (high impedance) throughout the entire cycle; if tRWD
≥ tRWD (min), tCWD ≥ tCWD (min), and tAWD ≥ tAWD (min), or tCWD ≥ tCWD (min), tAWD ≥ tAWD (min) and tCPW ≥
t CPW (min), the cycle is a read-modify-write and the data output will contain data read from the
selected cell; if neither of the above sets of conditions is satisfied, the condition of the data out
(at access time) is indeterminate.
15. These parameters are referred to UCAS and LCAS leading edge in early write cycles and to WE
leading edge in delayed write or read-modify-write cycles.
16. t RASP defines RAS pulse width in EDO page mode cycles.
17. Access time is determined by the longest among t AA , t CAC and t CPA.
18. In delayed write or read-modify-write cycles, OE must disable output buffer prior to applying data
to the device.
19. When both UCAS and LCAS go low at the same time, all 16-bit data are written into the device.
UCAS and LCAS cannot be staggered within the same write/read cycles.
12
HM5118165 Series
20 All the V CC and VSS pins shall be supplied with the same voltages.
21. t ASC, tCAH , t RCS , t WCS , t WCH, t CSR and t RPC are determined by the earlier falling edge of UCAS or LCAS.
22. t CRP , t CHR, t RCH, t CPA and tCPW are determined by the later rising edge of UCAS or LCAS.
23. t CWL, t DH, t DS and t CSH should be satisfied by both UCAS and LCAS.
24. t CP is determined by the time that both UCAS and LCAS are high.
25. t HPC (min) can be achieved during a series of EDO page mode write cycles or EDO page mode
read cycles. If both write and read operation are mixed in a EDO page mode RAS cycle (EDO
page mode mix cycle (1), (2)), minimum value of CAS cycle (tCAS + tCP + 2 tT) becomes greater
than the specified t HPC (min) value. The value of CAS cycle time of mixed EDO page mode is
shown in EDO page mode mix cycle (1) and (2).
26. When output buffers are enabled once, sustain the low impedance state until valid data is
obtained. When output buffer is turned on and off within a very short time, generally it causes
large V CC/V SS line noise, which causes to degrade V IH min/VIL max level.
27. Data output turns off and becomes high impedance from later rising edge of RAS and CAS.
Hold time and turn off time are specified by the timing specifications of later rising edge of RAS
and CAS between t OHR and t OH, and between tOFR and t OFF.
28. Please do not use tRASS timing, 10 µs ≤ tRASS ≤ 100 µs. During this period, the device is in
transition state from normal operation mode to self refresh mode. If t RASS ≥ 100 µs, then RAS
precharge time should use tRPS instead of tRP.
29. If you use distributed CBR refresh mode with 15.6 µs interval in normal read/write cycle, CBR
refresh should be executed within 15.6 µs immediately after exiting from and before entering
into self refresh mode.
30. If you use RAS only refresh or CBR burst refresh mode in normal read/write cycle, 1024 cycles
of distributed CBR refresh with 15.6 µs interval should be executed within 16 ms immediately
after exiting from and before entering into the self refresh mode.
31. Repetitive self refresh mode without refreshing all memory is not allowed. Once you exit from
self fresh mode, all memory cells need to be refreshed before re-entering the self refresh mode
again.
32. XXX: H or L (H: VIH (min) ≤ VIN ≤ VIH (max), L: VIL (min) ≤ VIN ≤ VIL (max))
///////: Invalid Dout
When the address, clock and input pins are not described on timing waveforms, their pins must
be applied VIH or VIL.
13
HM5118165 Series
Notes concerning 2CAS control
Please do not separate the UCAS/LCAS operation timing intentionally. However skew between
UCAS/LCAS are allowed under the following conditions.
1. Each of the UCAS/LCAS should satisfy the timing specifications individually.
2. Different operation mode for upper/lower byte is not allowed; such as following.
RAS
Delayed write
UCAS
Early write
LCAS
WE
3. Closely separated upper/lower byte control is not allowed. However when the condition (tCP ≤ tUL) is
satisfied, EDO page mode can be performed.
RAS
UCAS
LCAS
t UL
4. Byte control operation by remaining UCAS or LCAS high is guaranteed.
14
HM5118165 Series
Timing Waveforms*32
Read Cycle
t RC
t RAS
t RP
RAS
t CSH
t CRP
t RCD
t RSH
t CAS
tT
UCAS
LCAS
t RAD
t ASR
Address
t RAH
t RAL
t ASC
t CAL
t CAH
Column
Row
t RRH
t RCHR
t RCH
t RCS
WE
t WED
t DZC
t CDD
t RDD
High-Z
Din
t DZO
t OEA
t OED
OE
t OEZ
t OHO
t OFF
t CAC
t AA
t OH
t OFR
t OHR
t RAC
t CLZ
t WEZ
Dout
Dout
15
HM5118165 Series
Early Write Cycle
tRC
tRAS
tRP
RAS
tCSH
tCRP
tRCD
tRSH
tCAS
tT
UCAS
LCAS
tASR
Address
tRAH
Row
tASC
tCAH
Column
tWCS
tWCH
WE
tDS
Din
Dout
tDH
Din
High-Z*
* t WCS
16
t WCS (min)
HM5118165 Series
Delayed Write Cycle*18
t RC
t RAS
t RP
RAS
t CSH
t CRP
t RCD
t RSH
t CAS
tT
UCAS
LCAS
t ASR
Address
t RAH
t ASC
Row
t CAH
Column
t CWL
t RWL
t WP
t RCS
WE
t DZC
Din
t DS
High-Z
t DH
Din
t OEH
t DZO
t OED
OE
t OEZ
t CLZ
High-Z
Dout
Invalid Dout
17
HM5118165 Series
Read-Modify-Write Cycle*18
t RWC
t RAS
t RP
RAS
tT
t RCD
t CAS
t CRP
UCAS
LCAS
t RAD
t ASR
Address
t RAH
t ASC
Row
t CAH
Column
t RCS
t CWD
tCWL
t AWD
t RWL
t RWD
t WP
WE
t DZC
t DH
t DS
High-Z
Din
Din
t OED
t DZO
t OEH
t OEA
OE
t CAC
t OEZ
t AA
t RAC
t OHO
Dout
Dout
t CLZ
18
High-Z
HM5118165 Series
RAS-Only Refresh Cycle
t RC
t RAS
t RP
RAS
tT
t CRP
t RPC
t CRP
UCAS
LCAS
t ASR
Address
t RAH
Row
t OFR
t OFF
High-Z
Dout
19
HM5118165 Series
CAS-Before-RAS Refresh Cycle
t RC
t RP
t RAS
t RC
t RP
t RAS
t RP
RAS
tT
t RPC
t CP
t CSR
t CHR
t RPC
t CP
t CRP
t CSR
t CHR
UCAS
LCAS
Address
t OFR
t OFF
Dout
20
High-Z
HM5118165 Series
Hidden Refresh Cycle
t RC
t RAS
t RP
t RC
t RAS
t RC
t RP
t RAS
t RP
RAS
tT
t RSH
t CHR
t CRP
t RCD
UCAS
LCAS
t RAD
t ASR t RAH
Address
t RAL
t ASC
Row
t CAH
Column
t RRH
t RCH
t RCS
WE
t WED
t DZC
t CDD
t RDD
High-Z
Din
t DZO
t OED
t OEA
OE
t CAC
t AA
t RAC
t OFF
t OH
t CLZ
Dout
t OEZ
t WEZ
t OHO
Dout
t OFR
t OHR
21
HM5118165 Series
EDO Page Mode Read Cycle
t RP
t RNCD
t HPC
t RASP
RAS
tT
t CSH
t CP
t HPC
t CAS
UCAS
LCAS
t HPC
t CPRH
t CP
t
t CRP
RSH
t CAS
t RCHR
t RCS
t CP
tCAS
tCAS
t RCHC
t RCH t RCS
t RRH
t RCH
WE
tASR
Address
tRAH tASC
Row
tCAH
Column 1
t ASC t CAH
t ASC t CAH
Column 2
Column 3
t CAL
t CAL
t RAL
t CAH
tASC
t WED
Column 4
t CAL
t CAL
tRDD
tCDD
tDZC
High-Z
Din
tCOL
tDZO
tCOP
tOED
OE
tAA
tCAC
tCAC
tAA
tWEZ
tCPA
tAA
tCAC
tOEZ
tOHO
tDOH
Dout 2
Dout 2
tOHO
Dout 3
tCAC
tOHO
tOFF
tOH
tOEA
Dout 4
Dout 1
tAA
tOEZ
tOEA
tRAC
Dout
tOFR
tOHR
tOEZ
tCPA
tCPA
tOEA
22
HM5118165 Series
EDO Page Mode Read Cycle (2CAS)
t RP
t RNCD
t RASP
RAS
tT
t CSH
t HPC
t CP
t CAS
LCAS
tHPC
t CP
t HPC
t CP
t CRP
tRSH
t CAS
tCAS
UCAS
t CAS
t RCHC
t RRH
t RCH
t RCS
WE
tASR
Address
tRAH tASC
Row
tCAH
Column 1
t ASC t CAH
t ASC t CAH
Column 2
Column 3
t CAL
t CAL
t RAL
t CAH
tASC
t WED
Column 4
t CAL
tRDD
t CAL
tDZC
tCDD
High-Z
Din
tCOL
tCOP
tOED
tDZO
OE
tOEA
tAA
tCAC
tCAC
tAA
tOEZ
tAA
tOEZ
tOHO
tDOH
tRAC
L Dout
tCPA
tCPA
tOEA
tOHO
Dout 1
Dout 2
Dout 2
tCPA
tAA
tCAC
U Dout
tCAC
Dout 1
tOFR
tOHR
tOEZ
tOHO
tOFF
tOH
Dout 4
tOEA
Dout 3
Dout 4
23
HM5118165 Series
EDO Page Mode Early Write Cycle
tRP
tRASP
RAS
tT
tCSH
tHPC
tCAS
tRCD
tCP
tRSH
tCAS
tCP
tCAS
tCRP
UCAS
LCAS
tASR
Address
Row
tRAH
tASC
tCAH
Column 1
tWCS
tWCH
tASC
tCAH
Column 2
tWCS
tWCH
tASC
tCAH
Column N
tWCS
tWCH
WE
tDS
Din
Dout
tDH
Din 1
tDS
tDH
Din 2
tDS
tDH
Din N
High-Z*
* t WCS
24
t WCS (min)
HM5118165 Series
EDO Page Mode Delayed Write Cycle*18
t RASP
t RP
RAS
tT
t CP
t CSH
t RCD
t CRP
t CP
t HPC
t CAS
t CAS
t RSH
t CAS
UCAS
LCAS
t RAD
t ASR
t ASC
t RAH
Address
t ASC
t CAH
Row
t ASC
t CAH
Column 1
t CAH
Column 2
t CWL
Column N
t CWL
t CWL
t RWL
t RCS
t RCS
t RCS
WE
t WP
t WP
t WP
t DZC t DS
t DZC t DS
t DZC t DS
t DH
t DH
Din
1
Din
Din
2
t DZO
Din
N
t DZO
t DZO
t DH
t OED
t OED
t OED
t OEH
t OEH
t OEH
OE
t CLZ
t CLZ
t OEZ
t CLZ
t OEZ
t OEZ
High-Z
Dout
Invalid Dout
Invalid Dout
Invalid Dout
25
HM5118165 Series
EDO Page Mode Read-Modify-Write Cycle*18
t RASP
t RP
RAS
tT
t HPRWC
t CP
t RCD
t RSH
t CP
t CAS
t CAS
t CRP
t CAS
UCAS
LCAS
t RAD
t ASR
Address
t ASC
t RAH
Row
t ASC
t CAH
t CAH
Column 1
t ASC
t CAH
Column 2
t RWD
t CWL
Column N
t CPW
t AWD
t CWL
t CPW
t AWD
t CWD
t RCS
t CWL
t AWD
t CWD
t RCS
t RWL
t CWD
WE
t RCS
t WP
t WP
t DZC t DS
t WP
t DZC t DS
t DZC t DS
t DH
t DH
Din
1
Din
t DZO
t OED
t DH
Din
2
t OED
t DZO
t OED
t DZO
t OEH
t OEH
t OEH
Din
N
OE
t OHO
t OEA
t CAC
t OHO
t OEA
t CAC
t AA
t AA
t CPA
t RAC
t OEZ
t CLZ
t OHO
t OEA
t CAC
t AA
t CPA
t OEZ
t CLZ
t OEZ
t CLZ
High-Z
Dout
Dout 1
26
Dout 2
Dout N
HM5118165 Series
EDO Page Mode Mix Cycle (1)
t RP
t RASP
RAS
tT
t CAS
UCAS
LCAS
t CRP
t CP
t CP
t CP
t CAS
tCAS
tCAS
t CSH
tRSH
t RCD
t WCS
t WCH
tCPW
tAWD
WE
t ASC
tRAH
tASR
Address
Row
tCAH
Column 1
t RRH
t RCH
t RCS
t RCS
t ASC t CAH
tASC t CAH
Column 2
Column 3
tWP
tASC
t RAL
t CAH
Column 4
t CAL
t DS
Din
Din 1
tRDD
tCDD
t CAL
t DH
t DH
t DS
High-Z
Din 3
tOED
tWED
OE
tCPA
tAA
tCAC
Dout
tOFR
tWEZ
tCPA
tCPA
tAA
tOEA
t DOH
Dout 2
t OEZ
tCAC t OHO
Dout 3
tAA
tOEZ
tCAC
tOHO
tOEA
tOFF
tOH
Dout 4
27
HM5118165 Series
EDO Page Mode Mix Cycle (2)
t RP
t RNCD
t RASP
RAS
tT
t CSH
t CAS
UCAS
LCAS
t RCD
t CAS
tCAS
t RCH
tWCS t WCH
tRAH
Row
tCAH
Column 1
t ASC t CAH
t ASC t CAH
Column 2
Column 3
t CAL
t RRH
t RCH
tWP
tCPW
t ASC
tRSH
t RCS
t RCS
WE
Address
tCAS
t RCHR
t RCS
tASR
t CRP
t CP
t CP
t CP
t RAL
t CAH
tASC
Column 4
t CAL
t CAL
t DS
t DS
High-Z
Din
t DH
Din 2
Din 3
tOED
tOED
tCOP
t OEA
tAA
tOEA
tCAC
tOEZ
tCPA
tAA
tOEZ
t OHO
t OHO
Dout 1
tOFR
tWEZ
tCPA
tCAC
tRAC
28
tWED
tCOL
OE
Dout
tRDD
tCDD
t DH
Dout 3
tAA
tCAC
tOEZ
tOEA
tOFF
tOH
tOHO
Dout 4
HM5118165 Series
Self Refresh Cycle (L-version)* 28, 29, 30, 31
t RASS
t RP
t RPS
RAS
tT
t RPC
t CP
t CRP
t CSR
t CHS
UCAS
LCAS
t OFR
t OFF
Dout
High-Z
29
HM5118165 Series
Package Dimensions
HM5118165J/LJ Series (CP-42D)
Unit: mm
27.06
27.43 Max
0.43 ± 0.10
0.41 ± 0.08
1.27
0.10
Dimension including the plating thickness
Base material dimension
30
2.50 ± 0.12
1.30 Max
0.80 +0.25
–0.17
10.16 ± 0.13
21
0.74
3.50 ± 0.26
1
11.18 ± 0.13
22
42
9.40 ± 0.25
Hitachi Code
JEDEC
EIAJ
Weight (reference value)
CP-42D
Conforms
—
1.75 g
HM5118165 Series
HM5118165TT/LTT Series (TTP-50/44DC)
Unit: mm
26
10.16
50
20.95
21.35 Max
40 36
11 15
0.80
25
0.80
0.27 ± 0.07
0.13 M
0.25 ± 0.05
1.15 Max
11.76 ± 0.20
0.10
Dimension including the plating thickness
Base material dimension
0.13 ± 0.05
3.20
0.145 ± 0.05
0.125 ± 0.04
1.20 Max
0° – 5°
0.50 ± 0.10
Hitachi Code
JEDEC
EIAJ
Weight (reference value)
0.68
1
TTP-50/44DC
Conforms
—
0.50 g
31
HM5118165 Series
When using this document, keep the following in mind:
1. This document may, wholly or partially, be subject to change without notice.
2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part of
this document without Hitachi’s permission.
3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any
other reasons during operation of the user’s unit according to this document.
4. Circuitry and other examples described herein are meant merely to indicate the characteristics and
performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any intellectual
property claims or other problems that may result from applications based on the examples described
herein.
5. No license is granted by implication or otherwise under any patents or other rights of any third party or
Hitachi, Ltd.
6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL
APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are
requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL
APPLICATIONS.
Hitachi, Ltd.
Semiconductor & IC Div.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100, Japan
Tel: Tokyo (03) 3270-2111
Fax: (03) 3270-5109
For further information write to:
Hitachi Semiconductor
(America) Inc.
2000 Sierra Point Parkway
Brisbane, CA. 94005-1897
USA
Tel: 800-285-1601
Fax:303-297-0447
Hitachi Europe GmbH
Continental Europe
Dornacher Straße 3
D-85622 Feldkirchen
München
Tel: 089-9 91 80-0
Fax: 089-9 29 30-00
Hitachi Europe Ltd.
Electronic Components Div.
Northern Europe Headquarters
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA
United Kingdom
Tel: 01628-585000
Fax: 01628-585160
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Singapore 049318
Tel: 535-2100
Fax: 535-1533
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Unit 706, North Tower,
World Finance Centre,
Harbour City, Canton Road
Tsim Sha Tsui, Kowloon
Hong Kong
Tel: 27359218
Fax: 27306071
Copyright © Hitachi, Ltd., 1997. All rights reserved. Printed in Japan.
32
HM5118165 Series
Revision Record
Rev.
Date
Contents of Modification
1.0
Sep. 30, 1996
Initial issue
Y. Kasama
M. Mishima
Addition of HM5118165-5 Series
Y. Kasama
M. Mishima
Y. Kasama
Y. Matsuno
2.0
Nov. 26, 1996
Drawn by
Approved by
Power dissipation (active)
1018/907 mW(max) to 1045/935/825 mW (max)
DC Characteristics
I CC7 max: 185/165 mA to 185/165/145 mA
AC Characteristics
t RCD min:
t RAD min:
t RSH min:
t RRH min:
t RWC min:
t RPC min:
20/20 ns to 11/14/14 ns
15/15 ns to 9/12/12 ns
15/18 ns to 10/13/13 ns
0/0 ns to 5/5/5 ns
136/161 ns to 111/135/161 ns
0/0 ns to 5/5/5 ns
Timing Waveforms
Addition of t RNCD timing to EDO page mode mix
cycle (2)
3.0
Feb. 24, 1997
AC Characteristics
t RRH min: 5/5/5 ns to 0/0/0 ns
4.0
Nov. 1997
Change of Subtitle
33