QIMONDA HYB18T1G402AF

September 2006
HYS72T 256322 H P– 3 S– A
HYS72T256322HP–3.7–A
2 4 0 - P i n D u a l - D i e R e g i s te r e d D D R 2 S D R A M M o d u l e s
DDR2 SDRAM
RDIMM SDRAM
RoHs Compliant
Internet Data Sheet
Rev. 1.01
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
HYS72T256322HP–3S–A, HYS72T256322HP–3.7–A
Revision History: 2006-09, Rev. 1.01
Page
Subjects (major changes since last revision)
All
Qimonda update
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Adapted internet edition
Previous Revision: 2005-11, Rev. 1.0
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03062006-PK3L-ZYSE
2
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
1
Overview
This chapter gives an overview of the 240-pin Dual Die Registered Very Low Profile DDR2 SDRAM Modules with parity product
family and describes its main characteristics.
1.1
Features
• 240-pin PC2-5300 and PC2-4200 DDR2 SDRAM memory
modules for PC, Workstation and Server main memory
applications
• Two ranks 256M x 72 module organization and
2 x 128M × 4 chip organization
• 2 GByte module built with 512-Mbit DDR2 SDRAMs in PTFBGA-63 chipsize packages.
• Standard Double-Data-Rate-Two Synchronous DRAMs
(DDR2 SDRAM) with a single + 1.8 V (± 0.1 V) power
supply
• All speed grades faster than DDR2-400 comply with
DDR2-400 timing specifications as well.
• VLP (Very Low Profile) Registered DIMM Parity bit for
address and control bus
• Programmable CAS Latencies (3, 4 & 5), Burst Length (4
& 8) and Burst Type
• Auto Refresh (CBR) and Self Refresh
• High Temperature Self Refresh
• All inputs and outputs SSTL_18 compatible
• Off-Chip Driver Impedance Adjustment (OCD) and On-Die
Termination (ODT)
• Serial Presence Detect with E2PROM
• Based on standard reference layouts Raw Card “W”
• RDIMM with parity Dimensions (nominal): 18.30 mm high,
133.35 mm wide
• RoHS compliant products1)
TABLE 1
Performance for –3S & –3.7
Product Type Speed Code
–3S
–3.7
Unit
Speed Grade
PC2–5300 5–5–5
PC2–4200 4–4–4
—
333
266
MHz
266
266
MHz
200
200
MHz
15
15
ns
15
15
ns
45
45
ns
60
60
ns
max. Clock Frequency
@CL5
@CL4
@CL3
min. RAS-CAS-Delay
min. Row Precharge Time
min. Row Active Time
min. Row Cycle Time
fCK5
fCK4
fCK3
tRCD
tRP
tRAS
tRC
1) RoHS Compliant Product: Restriction of the use of certain hazardous substances (RoHS) in electrical and electronic equipment as defined
in the directive 2002/95/EC issued by the European Parliament and of the Council of 27 January 2003. These substances include mercury,
lead, cadmium, hexavalent chromium, polybrominated biphenyls and polybrominated biphenyl ethers.
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
3
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
1.2
Description
The Qimonda HYS72T256322HP–[3S/3.7]–A module family
are Very Low Profile (VLP) Registered Dual-Die DIMM
(RDIMM with parity) with 18.30 mm height based on DDR2
technology. DIMMs are available as ECC modules in
256M x 72 (2 GByte) organization and density, intended for
mounting into 240-Pin connector sockets.
The memory array is designed with 512-Mbit Double-DataRate-Two (DDR2) Synchronous DRAMs. All control and
address signals are re-driven on the DIMM using register
devices and a PLL for the clock distribution. This reduces
capacitive loading to the system bus, but adds one cycle to
the SDRAM timing. Decoupling capacitors are mounted on
the PCB board. The DIMMs feature serial presence detect
based on a serial E2PROM device using the 2-pin I2C
protocol. The first 128 bytes are programmed with
configuration data and the second 128 bytes are available to
the customer.
TABLE 2
Ordering Information for RoHS Compliant Products
Product Type
1)
Compliance Code
2)
Description
SDRAM Technology
2 GB 2R×4 PC2–5300P–555–12–W0
2 Ranks, ECC
512 Mbit (×4)
2 GB 2R×4 PC2–4200P–444–12–W0
2 Ranks, ECC
512 Mbit (×4)
PC2-5300
HYS72T256322HP–3S–A
PC2-4200
HYS72T256322HP–3.7–A
1) All part numbers end with a place code, designating the silicon die revision. Example: HYS72T256322HP–3.7–A, indicating Rev. “A” dies
are used for DDR2 SDRAM components. For all Qimonda DDR2 module and component nomenclature see Chapter 6 of this data sheet.
2) The Compliance Code is printed on the module label and describes the speed grade, for example “PC2–4200P–444–12–W0”, where
4200P means Registered Parity DIMM modules with 4.26 GB/sec Module Bandwidth and “444-12” means Column Address Strobe (CAS)
latency = 4, Row Column Delay (RCD) latency = 4 and Row Precharge (RP) latency = 4 using the latest JEDEC SPD Revision 1.2 and
produced on the Raw Card “W”
TABLE 3
Address Format
DIMM
Density
Module
Organization
Memory
Ranks
ECC/
Non-ECC
# of
SDRAMs
# of row/bank/columns bits
Raw Card
2 GB
256M × 72
2
ECC
18
14/2/11
W
TABLE 4
Components on Modules
Product Type1)
DRAM Components1)
DRAM Density
DRAM Organization
HYS72T256322HP
HYB18T1G402AF
512 Mbit
2 x 128M × 4
Note2)
1) Green Product
2) For a detailed description of all available functions of the DRAM components on these modules see the component data sheet.
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
4
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
2
Pin Configuration
This chapter contains the pin configuration.
2.1
Pin Configuration
The pin configuration of the Registered DDR2 SDRAM DIMM
is listed by function in Table 6 (240 pins). The abbreviations
used in columns Pin and Buffer Type are explained in Table 7
and Table 8 respectively. The pin numbering is depicted in
Figure 1.
TABLE 6
Pin Configuration of RDIMM
Ball No.
Name
Pin
Type
Buffer
Type
Function
CK0
I
SSTL
Clock Signal CK0, Complementary Clock Signal CK0
Clock Signals
185
186
CK0
I
SSTL
52
CKE0
I
SSTL
171
CKE1
I
SSTL
NC
NC
—
Not Connected
Note: 1-Rank module
193
S0
I
SSTL
76
S1
I
SSTL
Chip Select Rank 1:0
Note: 2-Ranks module
NC
NC
—
Not Connected
Note: 1-Rank module
192
RAS
I
SSTL
74
CAS
I
SSTL
Row Address Strobe (RAS), Column Address Strobe (CAS), Write
Enable (WE)
73
WE
I
SSTL
18
RESET
I
CMOS
Register Reset
71
BA0
I
SSTL
Bank Address Bus 1:0
190
BA1
I
SSTL
54
BA2
I
SSTL
Clock Enables 1:0
Note: 2-Ranks module
Control Signals
Address Signals
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
Bank Address Bus 2
6
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Ball No.
Name
Pin
Type
Buffer
Type
Function
188
A0
I
SSTL
Address Bus 12:0, Address Signal 10/AutoPrecharge
183
A1
I
SSTL
63
A2
I
SSTL
182
A3
I
SSTL
61
A4
I
SSTL
60
A5
I
SSTL
180
A6
I
SSTL
58
A7
I
SSTL
179
A8
I
SSTL
177
A9
I
SSTL
70
A10
I
SSTL
AP
I
SSTL
57
A11
I
SSTL
176
A12
I
SSTL
196
A13
I
SSTL
Address Signal 13
Note: Modules based on ×4, ×8
NC
NC
—
Not Connected
Note: Modules based on ×16
A14
I
SSTL
Address Signal 14
Note: 2 Gbit based module
174
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
7
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Ball No.
Name
Pin
Type
Buffer
Type
Function
3
DQ0
I/O
SSTL
Data Bus 63:0
4
DQ1
I/O
SSTL
9
DQ2
I/O
SSTL
10
DQ3
I/O
SSTL
122
DQ4
I/O
SSTL
123
DQ5
I/O
SSTL
128
DQ6
I/O
SSTL
129
DQ7
I/O
SSTL
12
DQ8
I/O
SSTL
13
DQ9
I/O
SSTL
21
DQ10
I/O
SSTL
22
DQ11
I/O
SSTL
131
DQ12
I/O
SSTL
132
DQ13
I/O
SSTL
140
DQ14
I/O
SSTL
141
DQ15
I/O
SSTL
24
DQ16
I/O
SSTL
25
DQ17
I/O
SSTL
30
DQ18
I/O
SSTL
31
DQ19
I/O
SSTL
143
DQ20
I/O
SSTL
144
DQ21
I/O
SSTL
149
DQ22
I/O
SSTL
150
DQ23
I/O
SSTL
33
DQ24
I/O
SSTL
34
DQ25
I/O
SSTL
39
DQ26
I/O
SSTL
40
DQ27
I/O
SSTL
152
DQ28
I/O
SSTL
153
DQ29
I/O
SSTL
158
DQ30
I/O
SSTL
159
DQ31
I/O
SSTL
80
DQ32
I/O
SSTL
81
DQ33
I/O
SSTL
86
DQ34
I/O
SSTL
87
DQ35
I/O
SSTL
199
DQ36
I/O
SSTL
200
DQ37
I/O
SSTL
205
DQ38
I/O
SSTL
Data Signals
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
8
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Ball No.
Name
Pin
Type
Buffer
Type
Function
206
DQ39
I/O
SSTL
Data Bus 63:0
89
DQ40
I/O
SSTL
90
DQ41
I/O
SSTL
95
DQ42
I/O
SSTL
96
DQ43
I/O
SSTL
208
DQ44
I/O
SSTL
209
DQ45
I/O
SSTL
214
DQ46
I/O
SSTL
215
DQ47
I/O
SSTL
98
DQ48
I/O
SSTL
99
DQ49
I/O
SSTL
107
DQ50
I/O
SSTL
108
DQ51
I/O
SSTL
217
DQ52
I/O
SSTL
218
DQ53
I/O
SSTL
226
DQ54
I/O
SSTL
227
DQ55
I/O
SSTL
110
DQ56
I/O
SSTL
111
DQ57
I/O
SSTL
116
DQ58
I/O
SSTL
117
DQ59
I/O
SSTL
229
DQ60
I/O
SSTL
230
DQ61
I/O
SSTL
235
DQ62
I/O
SSTL
236
DQ63
I/O
SSTL
42
CB0
I/O
SSTL
43
CB1
I/O
SSTL
48
CB2
I/O
SSTL
49
CB3
I/O
SSTL
161
CB4
I/O
SSTL
162
CB5
I/O
SSTL
167
CB6
I/O
SSTL
168
CB7
I/O
SSTL
Check Bits
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
Check Bits 7:0
9
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Ball No.
Name
Pin
Type
Buffer
Type
Function
7
DQS0
I/O
SSTL
Data Strobes 17:0
6
DQS0
I/O
SSTL
16
DQS1
I/O
SSTL
15
DQS1
I/O
SSTL
28
DQS2
I/O
SSTL
27
DQS2
I/O
SSTL
37
DQS3
I/O
SSTL
36
DQS3
I/O
SSTL
84
DQS4
I/O
SSTL
83
DQS4
I/O
SSTL
93
DQS5
I/O
SSTL
92
DQS5
I/O
SSTL
105
DQS6
I/O
SSTL
104
DQS6
I/O
SSTL
114
DQS7
I/O
SSTL
113
DQS7
I/O
SSTL
46
DQS8
I/O
SSTL
45
DQS8
I/O
SSTL
126
DQS9
I/O
SSTL
125
DQS9
I/O
SSTL
135
DQS10
I/O
SSTL
134
DQS10
I/O
SSTL
147
DQS11
I/O
SSTL
146
DQS11
I/O
SSTL
156
DQS12
I/O
SSTL
155
DQS12
I/O
SSTL
203
DQS13
I/O
SSTL
202
DQS13
I/O
SSTL
212
DQS14
I/O
SSTL
211
DQS14
I/O
SSTL
224
DQS15
I/O
SSTL
223
DQS15
I/O
SSTL
233
DQS16
I/O
SSTL
232
DQS16
I/O
SSTL
165
DQS17
I/O
SSTL
164
DQS17
I/O
SSTL
Data Strobe Bus
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
10
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Ball No.
Name
Pin
Type
Buffer
Type
Function
EEPROM
120
SCL
I
CMOS
Serial Bus Clock
119
SDA
I/O
OD
Serial Bus Data
239
SA0
I
CMOS
Serial Address Select Bus 2:0
240
SA1
I
CMOS
101
SA2
I
CMOS
Parity
55
ERR_OUT
O
CMOS
PAR_IN
I
CMOS
VREF
VDDSPD
VDDQ
AI
—
I/O Reference Voltage
PWR
—
EEPROM Power Supply
PWR
—
I/O Driver Power Supply
53, 59, 64, 67, 69, VDD
172, 178, 184, 187,
189, 197
PWR
—
Power Supply
2, 5, 8, 11, 14, 17, VSS
20, 23, 26, 29, 32,
35, 38, 41, 44, 47,
50, 65, 66, 79, 82,
85, 88, 91, 94, 97,
100, 103, 106, 109,
112, 115, 118, 121,
124, 127, 130, 133,
136, 139, 142, 145,
148, 151, 154, 157,
160, 163, 166, 169,
198, 201, 204, 207,
210, 213, 216, 219,
222, 225, 228, 231,
234, 237
GND
—
Ground Plane
19, 55, 68, 102,
NC
137, 138, 173, 220,
221
NC
—
Not connected
195
ODT0
I
SSTL
77
ODT1
I
SSTL
On-Die Termination Control 1:0
Note: 2-Ranks module
NC
NC
—
Parity bits
Power Supplies
1
238
51, 56, 62, 72, 75,
78, 170, 175, 181,
191, 194
Other Pins
Note: 1-Rank modules
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
11
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
TABLE 7
Abbreviations for Buffer Type
Abbreviation
Description
SSTL
Serial Stub Terminated Logic (SSTL_18)
CMOS
CMOS Levels
OD
Open Drain. The corresponding pin has 2 operational states, active low and tristate,
and allows multiple devices to share as a wire-OR.
TABLE 8
Abbreviations for Pin Type
Abbreviation
Description
I
Standard input-only pin. Digital levels.
O
Output. Digital levels.
I/O
I/O is a bidirectional input/output signal.
AI
Input. Analog levels.
PWR
Power
GND
Ground
NU
Not Usable
NC
Not Connected
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
12
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
FIGURE 1
Pin Configuration for RDIMM (240 pins)
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Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
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0337
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
3
Electrical Characteristics
This chapter lists the electrical characteristics.
3.1
Absolute Maximum Ratings
This chapter contains the absolute maximum ratings table.
TABLE 9
Absolute Maximum Ratings
Parameter
Symbol
Voltage on any pins relative to VSS
Voltage on VDD relative to VSS
Voltage on VDDQ relative to VSS
Storage Humidity (without condensation)
Values
VIN, VOUT
VDD
VDDQ
HSTG
Unit
Min.
Max.
–0.5
2.3
V
–1.0
2.3
V
–0.5
2.3
V
5
95
%
Note/Test
Condition
Attention: Stresses above the max. values listed here may cause permanent damage to the device. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability. Maximum ratings
are absolute ratings; exceeding only one of these values may cause irreversible damage to the integrated
circuit.
3.2
DC Operating Conditions
This chapter contains the DC operating conditions tables.
TABLE 10
Operating Conditions
Parameter
Symbol
Values
Unit
Min.
Max.
0
+55
°C
0
+95
°C
Storage Temperature
TOPR
TCASE
TSTG
–50
+100
°C
Barometric Pressure (operating & storage)
PBar
+69
+105
kPa
Operating Humidity (relative)
HOPR
10
90
%
DIMM Module Operating Temperature Range (ambient)
DRAM Component Case Temperature Range
1)
2)
3)
4)
Note
1)2)3)4)
5)
DRAM Component Case Temperature is the surface temperature in the center on the top side of any of the DRAMs.
Within the DRAM Component Case Temperature range all DRAM specification will be supported.
Above 85 °C DRAM case temperature the Auto-Refresh command interval has to be reduced to tREFI = 3.9 µs.
When operating this product in the 85 °C to 95 °C TCASE temperature range, the High Temperature Self Refresh has to be enabled by
setting EMR(2) bit A7 to “1”. Note, when the High Temperature Self Refresh is enabled there is an increase of IDD6 by approximately 50%
5) Up to 3000 m
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HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
TABLE 11
Supply Voltage Levels and DC Operating Conditions
Parameter
Device Supply Voltage
Output Supply Voltage
Input Reference Voltage
SPD Supply Voltage
DC Input Logic High
DC Input Logic Low
Symbol
VDD
VDDQ
VREF
VDDSPD
VIH(DC)
VIL (DC)
IL
Values
Unit
Min.
Typ.
Max.
1.7
1.8
1.9
V
1.7
1.8
1.9
V
1)
0.49 × VDDQ
0.5 × VDDQ
0.51 × VDDQ
V
2)
1.7
—
3.6
V
VREF + 0.125
—
V
– 0.30
—
VDDQ + 0.3
VREF – 0.125
V
In / Output Leakage Current
–5
—
5
µA
1) Under all conditions, VDDQ must be less than or equal to VDD
2) Peak to peak AC noise on VREF may not exceed ± 2% VREF (DC).VREF is also expected to track noise in VDDQ.
3) Input voltage for any connector pin under test of 0 V ≤ VIN ≤ VDDQ + 0.3 V; all other pins at 0 V. Current is per pin
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Note
15
3)
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
3.3
AC Characteristics
This chapter describes the AC characteristics.
3.3.1
Speed Grades Definitions
This chapter contains the Speed Grades Definitions tables.
TABLE 12
Speed Grade Definition Speed Bins for DDR2–667
Speed Grade
DDR2–667
IFX Sort Name
–3S
CAS-RCD-RP latencies
5–5–5
Parameter
Clock Frequency
@ CL = 3
@ CL = 4
@ CL = 5
Row Active Time
Row Cycle Time
RAS-CAS-Delay
Row Precharge Time
Unit
Note
tCK
Symbol
Min.
Max.
—
tCK
tCK
tCK
tRAS
tRC
tRCD
tRP
5
8
ns
1)2)3)4)
3.75
8
ns
1)2)3)4)
3
8
ns
1)2)3)4)
45
70000
ns
1)2)3)4)5)
60
—
ns
1)2)3)4)
15
—
ns
1)2)3)4)
15
—
ns
1)2)3)4)
1) Timings are guaranteed with CK/CK differential Slew Rate of 2.0 V/ns. For DQS signals timings are guaranteed with a differential Slew
Rate of 2.0 V/ns in differential strobe mode and a Slew Rate of 1 V/ns in single ended mode. Timings are further guaranteed for normal
OCD drive strength (EMRS(1) A1 = 0) only.
2) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross. The DQS/DQS, RDQS/RDQS,
input reference level is the crosspoint when in differential strobe mode
3) Inputs are not recognized as valid until VREF stabilizes. During the period before VREF stabilizes, CKE = 0.2 x VDDQ is recognized as low.
4) The output timing reference voltage level is VTT.
5) tRAS.MAX is calculated from the maximum amount of time a DDR2 device can operate without a refresh command which is equal to 9 x tREFI.
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HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
TABLE 13
Speed Grade Definition Speed Bins for DDR2-533
Speed Grade
DDR2–533C
QAG Sort Name
–3.7
CAS-RCD-RP latencies
4–4–4
Parameter
Clock Frequency
@ CL = 3
@ CL = 4
@ CL = 5
Row Active Time
Row Cycle Time
RAS-CAS-Delay
Row Precharge Time
Unit
Note
tCK
Symbol
Min.
Max.
—
tCK
tCK
tCK
tRAS
tRC
tRCD
tRP
5
8
ns
1)2)3)4)
3.75
8
ns
1)2)3)4)
3.75
8
ns
1)2)3)4)
45
70000
ns
1)2)3)4)5)
60
—
ns
1)2)3)4)
15
—
ns
1)2)3)4)
15
—
ns
1)2)3)4)
1) Timings are guaranteed with CK/CK differential Slew Rate of 2.0 V/ns. For DQS signals timings are guaranteed with a differential Slew
Rate of 2.0 V/ns in differential strobe mode and a Slew Rate of 1 V/ns in single ended mode.Timings are further guaranteed for normal
OCD drive strength (EMRS(1) A1 = 0) .
2) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross. The DQS / DQS, RDQS / RDQS,
input reference level is the crosspoint when in differential strobe mode
3) Inputs are not recognized as valid until VREF stabilizes. During the period before VREF stabilizes, CKE = 0.2 x VDDQ is recognized as low.
4) The output timing reference voltage level is VTT.
5) tRAS.MAX is calculated from the maximum amount of time a DDR2 device can operate without a refresh command which is equal to 9 x tREFI.
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
3.3.2
AC Timing Parameters
This chapter contains the AC Timing Parameters.
TABLE 14
DRAM Component Timing Parameter by Speed Grade - DDR2–667
Parameter
Symbol
DDR2–667
Unit
Note1)2)3)4)5)6)7)
8)
Min.
Max.
–450
+450
ps
9)
–400
+400
ps
9)
0.48
0.52
tCK.AVG
10)11)
0.48
0.52
tCK.AVG
10)11)
3000
8000
ps
100
––
ps
12)13)14)
175
––
ps
13)14)15)
0.6
—
0.35
—
tCK.AVG
tCK.AVG
—
ps
9)16)
tAC.MIN
2 x tAC.MIN
tAC.MAX
tAC.MAX
tAC.MAX
ps
9)16)
ps
9)16)
—
240
ps
17)
Min(tCH.ABS,
tCL.ABS)
__
ps
18)
—
340
ps
19)
DQ/DQS output hold time from DQS
tQHS
tQH
tHP – tQHS
—
ps
20)
Write command to DQS associated clock edges
WL
RL–1
DQ output access time from CK / CK
DQS output access time from CK / CK
Average clock high pulse width
tAC
tDQSCK
tCH.AVG
tCL.AVG
Average clock period
tCK.AVG
DQ and DM input setup time
tDS.BASE
DQ and DM input hold time
tDH.BASE
Control & address input pulse width for each input tIPW
DQ and DM input pulse width for each input
tDIPW
Data-out high-impedance time from CK / CK
tHZ
DQS/DQS low-impedance time from CK / CK
tLZ.DQS
DQ low impedance time from CK/CK
tLZ.DQ
DQS-DQ skew for DQS & associated DQ signals tDQSQ
CK half pulse width
tHP
Average clock low pulse width
DQ hold skew factor
nCK
21)
DQS latching rising transition to associated clock tDQSS
edges
– 0.25
+ 0.25
tCK.AVG
tDQSH
DQS input low pulse width
tDQSL
DQS falling edge to CK setup time
tDSS
DQS falling edge hold time from CK
tDSH
Write postamble
tWPST
Write preamble
tWPRE
Address and control input setup time
tIS.BASE
Address and control input hold time
tIH.BASE
Read preamble
tRPRE
Read postamble
tRPST
CAS to CAS command delay
tCCD
Write recovery time
tWR
Auto-Precharge write recovery + precharge time tDAL
Internal write to read command delay
tWTR
0.35
—
0.35
—
0.2
—
0.2
—
0.4
0.6
0.35
—
tCK.AVG
tCK.AVG
tCK.AVG
tCK.AVG
tCK.AVG
tCK.AVG
200
—
ps
22)23)
275
—
ps
23)24)
0.9
1.1
25)26)
0.4
0.6
tCK.AVG
tCK.AVG
2
—
nCK
15
—
ns
1)
WR + tnRP
—
nCK
28)29)
7.5
—
ns
1)30)
DQS input high pulse width
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21)
25)27)
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Parameter
Symbol
DDR2–667
Unit
Note1)2)3)4)5)6)7)
8)
Min.
Max.
tRTP
tXSNR
tXSRD
tXP
7.5
—
ns
1)
tRFC +10
—
ns
1)
200
—
nCK
2
—
nCK
tXARD
tXARDS
2
—
nCK
7 – AL
—
nCK
CKE minimum pulse width ( high and low pulse
width)
tCKE
3
—
nCK
Mode register set command cycle time
tMRD
tMOD
tOIT
tDELAY
2
—
nCK
0
12
ns
28)
0
12
ns
28)
tIS + tCK .AVG +
tIH
––
ns
Internal Read to Precharge command delay
Exit self-refresh to a non-read command
Exit self-refresh to read command
Exit precharge power-down to any valid
command (other than NOP or Deselect)
Exit power down to read command
Exit active power-down mode to read command
(slow exit, lower power)
MRS command to ODT update delay
OCD drive mode output delay
Minimum time clocks remain ON after CKE
asynchronously drops LOW
31)
1) For details and notes see the relevant Qimonda component data sheet
2) VDDQ = 1.8 V ± 0.1V; VDD = 1.8 V ± 0.1 V. See notes 5)6)7)8)
3) Timing that is not specified is illegal and after such an event, in order to guarantee proper operation, the DRAM must be powered down
and then restarted through the specified initialization sequence before normal operation can continue.
4) Timings are guaranteed with CK/CK differential Slew Rate of 2.0 V/ns. For DQS signals timings are guaranteed with a differential Slew
Rate of 2.0 V/ns in differential strobe mode and a Slew Rate of 1 V/ns in single ended mode.
5) The CK / CK input reference level (for timing reference to CK / CK) is the point at which CK and CK cross. The DQS / DQS, RDQS / RDQS,
input reference level is the crosspoint when in differential strobe mode.
6) Inputs are not recognized as valid until VREF stabilizes. During the period before VREF stabilizes, CKE = 0.2 x VDDQ is recognized as low.
7) The output timing reference voltage level is VTT.
8) New units, ‘tCK.AVG‘ and ‘nCK‘, are introduced in DDR2–667 and DDR2–800. Unit ‘tCK.AVG‘ represents the actual tCK.AVG of the input clock
under operation. Unit ‘nCK‘ represents one clock cycle of the input clock, counting the actual clock edges. Note that in DDR2–400 and
DDR2–533, ‘tCK‘ is used for both concepts. Example: tXP = 2 [nCK] means; if Power Down exit is registered at Tm, an Active command
may be registered at Tm + 2, even if (Tm + 2 - Tm) is 2 x tCK.AVG + tERR.2PER(Min).
9) When the device is operated with input clock jitter, this parameter needs to be derated by the actual tERR(6-10per) of the input clock. (output
deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2–667 SDRAM has tERR(6-10PER).MIN = – 272
ps and tERR(6- 10PER).MAX = + 293 ps, then tDQSCK.MIN(DERATED) = tDQSCK.MIN – tERR(6-10PER).MAX = – 400 ps – 293 ps = – 693 ps and
tDQSCK.MAX(DERATED) = tDQSCK.MAX – tERR(6-10PER).MIN = 400 ps + 272 ps = + 672 ps. Similarly, tLZ.DQ for DDR2–667 derates to tLZ.DQ.MIN(DERATED)
= - 900 ps – 293 ps = – 1193 ps and tLZ.DQ.MAX(DERATED) = 450 ps + 272 ps = + 722 ps. (Caution on the MIN/MAX usage!)
10) Input clock jitter spec parameter. These parameters are referred to as 'input clock jitter spec parameters' and these parameters apply to
DDR2–667 and DDR2–800 only. The jitter specified is a random jitter meeting a Gaussian distribution.
11) These parameters are specified per their average values, however it is understood that the relationship between the average timing and
the absolute instantaneous timing holds all the times.
12) Input waveform timing tDS with differential data strobe enabled MR[bit10] = 0, is referenced from the input signal crossing at the VIH.AC level
to the differential data strobe crosspoint for a rising signal, and from the input signal crossing at the VIL.AC level to the differential data strobe
crosspoint for a falling signal applied to the device under test. DQS, DQS signals must be monotonic between Vil(DC)MAX and Vih(DC)MIN. See
Figure 3.
13) If tDS or tDH is violated, data corruption may occur and the data must be re-written with valid data before a valid READ can be executed.
14) These parameters are measured from a data signal ((L/U)DM, (L/U)DQ0, (L/U)DQ1, etc.) transition edge to its respective data strobe signal
((L/U/R)DQS / DQS) crossing.
15) Input waveform timing tDH with differential data strobe enabled MR[bit10] = 0, is referenced from the differential data strobe crosspoint to
the input signal crossing at the VIH.DC level for a falling signal and from the differential data strobe crosspoint to the input signal crossing
at the VIL.DC level for a rising signal applied to the device under test. DQS, DQS signals must be monotonic between VIL.DC.MAX and
VIH.DC.MIN. See Figure 3.
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HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
16) tHZ and tLZ transitions occur in the same access time as valid data transitions. These parameters are referenced to a specific voltage level
which specifies when the device output is no longer driving (tHZ), or begins driving (tLZ) .
17) tDQSQ: Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers as well as output
slew rate mismatch between DQS / DQS and associated DQ in any given cycle.
18) tHP is the minimum of the absolute half period of the actual input clock. tHP is an input parameter but not an input specification parameter.
It is used in conjunction with tQHS to derive the DRAM output timing tQH. The value to be used for tQH calculation is determined by the
following equation; tHP = MIN (tCH.ABS, tCL.ABS), where, tCH.ABS is the minimum of the actual instantaneous clock high time; tCL.ABS is the
minimum of the actual instantaneous clock low time.
19) tQHS accounts for: 1) The pulse duration distortion of on-chip clock circuits, which represents how well the actual tHP at the input is
transferred to the output; and 2) The worst case push-out of DQS on one transition followed by the worst case pull-in of DQ on the next
transition, both of which are independent of each other, due to data pin skew, output pattern effects, and pchannel to n-channel variation
of the output drivers.
20) tQH = tHP – tQHS, where: tHP is the minimum of the absolute half period of the actual input clock; and tQHS is the specification value under
the max column. {The less half-pulse width distortion present, the larger the tQH value is; and the larger the valid data eye will be.}
Examples: 1) If the system provides tHP of 1315 ps into a DDR2–667 SDRAM, the DRAM provides tQH of 975 ps minimum. 2) If the system
provides tHP of 1420 ps into a DDR2–667 SDRAM, the DRAM provides tQH of 1080 ps minimum.
21) These parameters are measured from a data strobe signal ((L/U/R)DQS / DQS) crossing to its respective clock signal (CK / CK) crossing.
The spec values are not affected by the amount of clock jitter applied (i.e. tJIT.PER, tJIT.CC, etc.), as these are relative to the clock signal
crossing. That is, these parameters should be met whether clock jitter is present or not.
22) Input waveform timing is referenced from the input signal crossing at the VIH.AC level for a rising signal and VIL.AC for a falling signal applied
to the device under test. See Figure 4.
23) These parameters are measured from a command/address signal (CKE, CS, RAS, CAS, WE, ODT, BA0, A0, A1, etc.) transition edge to
its respective clock signal (CK / CK) crossing. The spec values are not affected by the amount of clock jitter applied (i.e. tJIT.PER, tJIT.CC,
etc.), as the setup and hold are relative to the clock signal crossing that latches the command/address. That is, these parameters should
be met whether clock jitter is present or not.
24) Input waveform timing is referenced from the input signal crossing at the VIL.DC level for a rising signal and VIH.DC for a falling signal applied
to the device under test. See Figure 4.
25) tRPST end point and tRPRE begin point are not referenced to a specific voltage level but specify when the device output is no longer driving
(tRPST), or begins driving (tRPRE). Figure 2 shows a method to calculate these points when the device is no longer driving (tRPST), or begins
driving (tRPRE) by measuring the signal at two different voltages. The actual voltage measurement points are not critical as long as the
calculation is consistent.
26) When the device is operated with input clock jitter, this parameter needs to be derated by the actual tJIT.PER of the input clock. (output
deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2–667 SDRAM has tJIT.PER.MIN = – 72 ps
and tJIT.PER.MAX = + 93 ps, then tRPRE.MIN(DERATED) = tRPRE.MIN + tJIT.PER.MIN = 0.9 x tCK.AVG – 72 ps = + 2178 ps and tRPRE.MAX(DERATED) = tRPRE.MAX
+ tJIT.PER.MAX = 1.1 x tCK.AVG + 93 ps = + 2843 ps. (Caution on the MIN/MAX usage!).
27) When the device is operated with input clock jitter, this parameter needs to be derated by the actual tJIT.DUTY of the input clock. (output
deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2–667 SDRAM has tJIT.DUTY.MIN = – 72 ps
and tJIT.DUTY.MAX = + 93 ps, then tRPST.MIN(DERATED) = tRPST.MIN + tJIT.DUTY.MIN = 0.4 x tCK.AVG – 72 ps = + 928 ps and tRPST.MAX(DERATED) = tRPST.MAX
+ tJIT.DUTY.MAX = 0.6 x tCK.AVG + 93 ps = + 1592 ps. (Caution on the MIN/MAX usage!).
28) DAL = WR + RU{tRP(ns) / tCK(ns)}, where RU stands for round up. WR refers to the tWR parameter stored in the MRS. For tRP, if the result
of the division is not already an integer, round up to the next highest integer. tCK refers to the application clock period. Example: For
DDR2–533 at tCK = 3.75 ns with tWR programmed to 4 clocks. tDAL = 4 + (15 ns / 3.75 ns) clocks = 4 + (4) clocks = 8 clocks.
29) tDAL.nCK = WR [nCK] + tnRP.nCK = WR + RU{tRP [ps] / tCK.AVG[ps] }, where WR is the value programmed in the EMR.
30) tWTR is at lease two clocks (2 x tCK) independent of operation frequency.
31) tCKE.MIN of 3 clocks means CKE must be registered on three consecutive positive clock edges. CKE must remain at the valid input level the
entire time it takes to achieve the 3 clocks of registration. Thus, after any CKE transition, CKE may not transition from its valid level during
the time period of tIS + 2 x tCK + tIH.
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
FIGURE 2
Method for calculating transitions and endpoint
VOH - x mV
VTT + 2x mV
VOH - 2x mV
VTT + x mV
tLZ
tHZ
tRPRE begin point
tRPST end point
VOL + 2x mV
VTT - x mV
VOL + x mV
VTT - 2x mV
T1 T2
T1 T2
tHZ,tRPST end point = 2*T1-T2
tLZ,tRPRE begin point = 2*T1-T2
FIGURE 3
Differential input waveform timing - tDS and tDS
DQS
DQS
tDS
tDH
tDS
tDH
VDDQ
VIH(ac) min
VIH(dc) min
VREF(dc)
VIL(dc) max
VIL(ac) max
VSS
FIGURE 4
Differential input waveform timing - tlS and tlH
CK
CK
tIS
tIH
tIS
tIH
VDDQ
VIH(ac) min
VIH(dc) min
VREF(dc)
VIL(dc) max
VIL(ac) max
VSS
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
TABLE 15
DRAM Component Timing Parameter by Speed Grade - DDR2–533
Parameter
Symbol
DDR2–533
Unit
Note1)2)3)4)5)
6)7)
Min.
Max.
tAC
tCCD
tCH
tCKE
tCL
tDAL
–500
+500
ps
2
—
0.45
0.55
3
—
0.45
0.55
WR + tRP
—
tCK
tCK
tCK
tCK
tCK
Minimum time clocks remain ON after CKE
asynchronously drops LOW
tDELAY
tIS + tCK + tIH
––
ns
9)
DQ and DM input hold time (differential data
strobe)
tDH(base)
225
––
ps
10)
–25
—
ps
11)
tDIPW
tDQSCK
tDQSL,H
tDQSQ
0.35
—
tCK
–450
+450
ps
0.35
—
tCK
—
300
ps
tDQSS
tDS(base)
– 0.25
+ 0.25
tCK
100
—
ps
11)
–25
—
ps
11)
tDSH
0.2
—
tCK
DQS falling edge to CK setup time (write cycle) tDSS
0.2
—
tCK
DQ output access time from CK / CK
CAS A to CAS B command period
CK, CK high-level width
CKE minimum high and low pulse width
CK, CK low-level width
Auto-Precharge write recovery + precharge
time
DQ and DM input hold time (single ended data tDH1(base)
strobe)
DQ and DM input pulse width (each input)
DQS output access time from CK / CK
DQS input low (high) pulse width (write cycle)
DQS-DQ skew (for DQS & associated DQ
signals)
Write command to 1st DQS latching transition
DQ and DM input setup time (differential data
strobe)
DQ and DM input setup time (single ended data tDS1(base)
strobe)
DQS falling edge hold time from CK (write
cycle)
Clock half period
Data-out high-impedance time from CK / CK
Address and control input hold time
Address and control input pulse width
(each input)
Address and control input setup time
DQ low-impedance time from CK / CK
DQS low-impedance from CK / CK
Mode register set command cycle time
OCD drive mode output delay
Data output hold time from DQS
Data hold skew factor
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03062006-PK3L-ZYSE
tHP
tHZ
tIH(base)
tIPW
22
11)
12)
MIN. (tCL, tCH)
tIS(base)
tLZ(DQ)
tLZ(DQS)
tMRD
tOIT
tQH
tQHS
8)18)
—
tAC.MAX
ps
13)
375
—
ps
11)
0.6
—
tCK
250
—
ps
11)
2 × tAC.MIN
ps
14)
tAC.MIN
tAC.MAX
tAC.MAX
ps
14)
2
—
tCK
0
12
ns
tHP –tQHS
—
—
400
ps
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Parameter
Symbol
DDR2–533
Unit
Note1)2)3)4)5)
6)7)
Average periodic refresh Interval
tREFI
Min.
Max.
—
7.8
µs
14)15)
—
3.9
µs
16)18)
17)
Auto-Refresh to Active/Auto-Refresh
command period
tRFC
105
—
ns
Precharge-All (4 banks) command period
tRP
tRP
tRPRE
tRPST
tRRD
tRP + 1tCK
—
ns
15 + 1tCK
—
ns
0.9
1.1
14)
0.40
0.60
tCK
tCK
Precharge-All (8 banks) command period
Read preamble
Read postamble
Active bank A to Active bank B command
period
7.5
—
ns
10
—
ns
16)20)
tRTP
tWPRE
tWPST
tWR
7.5
—
ns
0.25 x tCK
—
0.40
0.60
tCK
tCK
15
—
ns
Write recovery time for write with AutoPrecharge
WR
tWR/tCK
Internal Write to Read command delay
tWTR
tXARD
7.5
Exit active power-down mode to Read
command (slow exit, lower power)
Internal Read to Precharge command delay
Write preamble
Write postamble
Write recovery time for write without AutoPrecharge
14)
14)18)
19)
tCK
20)
—
ns
21)
2
—
tCK
22)
tXARDS
6 – AL
—
tCK
22)
Exit precharge power-down to any valid
command (other than NOP or Deselect)
tXP
2
—
tCK
Exit Self-Refresh to non-Read command
tXSNR
tXSRD
tRFC +10
—
ns
200
—
tCK
Exit power down to any valid command
(other than NOP or Deselect)
Exit Self-Refresh to Read command
1) For details and notes see the relevant Qimonda component data sheet
2) VDDQ = 1.8 V ± 0.1 V; VDD = 1.8 V ±0.1 V. See notes 5)6)7)8)
3) Timing that is not specified is illegal and after such an event, in order to guarantee proper operation, the DRAM must be powered down
and then restarted through the specified initialization sequence before normal operation can continue.
4) Timings are guaranteed with CK/CK differential Slew Rate of 2.0 V/ns. For DQS signals timings are guaranteed with a differential Slew
Rate of 2.0 V/ns in differential strobe mode and a Slew Rate of 1 V/ns in single ended mode.
5) The CK / CK input reference level (for timing reference to CK / CK) is the point at which CK and CK cross. The DQS / DQS, RDQS/ RDQS,
input reference level is the crosspoint when in differential strobe mode.
6) Inputs are not recognized as valid until VREF stabilizes. During the period before VREF stabilizes, CKE = 0.2 x VDDQ is recognized as low.
7) The output timing reference voltage level is VTT.
8) For each of the terms, if not already an integer, round to the next highest integer. tCK refers to the application clock period. WR refers to
the WR parameter stored in the MR.
9) The clock frequency is allowed to change during self-refresh mode or precharge power-down mode.
10) For timing definition, refer to the Component data sheet.
11) Consists of data pin skew and output pattern effects, and p-channel to n-channel variation of the output drivers as well as output Slew Rate
mis-match between DQS / DQS and associated DQ in any given cycle.
12) MIN (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can
be greater than the minimum specification limits for tCL and tCH).
Rev. 1.01, 2006-09
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HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
13) The tHZ, tRPST and tLZ, tRPRE parameters are referenced to a specific voltage level, which specify when the device output is no longer driving
(tHZ, tRPST), or begins driving (tLZ, tRPRE). tHZ and tLZ transitions occur in the same access time windows as valid data transitions.These
parameters are verified by design and characterization, but not subject to production test.
14) The Auto-Refresh command interval has be reduced to 3.9 µs when operating the DDR2 DRAM in a temperature range between 85 °C
and 95 °C.
15) 0 °C≤ TCASE ≤ 85 °C
16) 85 °C < TCASE ≤ 95 °C
17) A maximum of eight Auto-Refresh commands can be posted to any given DDR2 SDRAM device.
18) The tRRD timing parameter depends on the page size of the DRAM organization. See Table 2 “Ordering Information for RoHS
Compliant Products” on Page 4.
19) The maximum limit for the tWPST parameter is not a device limit. The device operates with a greater value for this parameter, but system
performance (bus turnaround) degrades accordingly.
20) WR must be programmed to fulfill the minimum requirement for the tWR timing parameter, where WRMIN[cycles] = tWR(ns)/tCK(ns) rounded
up to the next integer value. tDAL = WR + (tRP/tCK). For each of the terms, if not already an integer, round to the next highest integer. tCK
refers to the application clock period. WR refers to the WR parameter stored in the MRS.
21) Minimum tWTR is two clocks when operating the DDR2-SDRAM at frequencies ≤ 200 ΜΗz.
22) User can choose two different active power-down modes for additional power saving via MRS address bit A12. In “standard active powerdown mode” (MR, A12 = “0”) a fast power-down exit timing tXARD can be used. In “low active power-down mode” (MR, A12 =”1”) a slow
power-down exit timing tXARDS has to be satisfied.
3.3.3
ODT AC Electrical Characteristics
This chapter contains the ODT AC electrical characteristics tables.
TABLE 16
ODT AC Characteristics and Operating Conditions for DDR2-667
Symbol
tAOND
tAON
tAONPD
tAOFD
tAOF
tAOFPD
tANPD
tAXPD
Parameter / Condition
Values
Unit
Min.
Max.
ODT turn-on delay
2
2
tCK
ODT turn-on
tAC.MIN
tAC.MIN + 2 ns
tAC.MAX + 0.7 ns
2 tCK + tAC.MAX + 1 ns
ns
ODT turn-on (Power-Down Modes)
Note
1)
ns
ODT turn-off delay
2.5
2.5
tCK
ODT turn-off
tAC.MAX + 0.6 ns
2.5 tCK + tAC.MAX + 1 ns
ns
ODT turn-off (Power-Down Modes)
tAC.MIN
tAC.MIN + 2 ns
ODT to Power Down Mode Entry Latency
3
—
ODT Power Down Exit Latency
8
—
2)
ns
tCK
tCK
1) ODT turn on time min. is when the device leaves high impedance and ODT resistance begins to turn on. ODT turn on time max is when
the ODT resistance is fully on. Both are measure from tAOND.
2) ODT turn off time min. is when the device starts to turn off ODT resistance. ODT turn off time max is when the bus is in high impedance.
Both are measured from tAOFD.
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
TABLE 17
ODT AC Characteristics and Operating Conditions for DDR2-533 &DDR2-400
Symbol
tAOND
tAON
tAONPD
tAOFD
tAOF
tAOFPD
tANPD
tAXPD
Parameter / Condition
Values
Unit
Min.
Max.
ODT turn-on delay
2
2
tCK
ODT turn-on
tAC.MAX + 1 ns
2 tCK + tAC.MAX + 1 ns
ns
ODT turn-on (Power-Down Modes)
tAC.MIN
tAC.MIN + 2 ns
ODT turn-off delay
2.5
2.5
tCK
ODT turn-off
tAC.MAX + 0.6 ns
2.5 tCK + tAC.MAX + 1 ns
ns
ODT turn-off (Power-Down Modes)
tAC.MIN
tAC.MIN + 2 ns
ODT to Power Down Mode Entry Latency
3
—
ODT Power Down Exit Latency
8
—
tCK
tCK
Note
1)
ns
2)
ns
1) ODT turn on time min. is when the device leaves high impedance and ODT resistance begins to turn on. ODT turn on time max is when
the ODT resistance is fully on. Both are measure from tAOND.
2) ODT turn off time min. is when the device starts to turn off ODT resistance. ODT turn off time max is when the bus is in high impedance.
Both are measured from tAOFD.
Rev. 1.01, 2006-09
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
3.4
Currents Specifications and Conditions
This chapter contains the Specifications and Conditions.
TABLE 18
IDD Measurement Conditions
Parameter
Symbol
Operating Current 0
IDD0
One bank Active - Precharge; tCK = tCK.MIN, tRC = tRC.MIN, tRAS = tRAS.MIN, CKE is HIGH, CS is
HIGH between valid commands. Address and control inputs are SWITCHING, Databus inputs
are SWITCHING.
Operating Current 1
One bank Active - Read - Precharge; IOUT = 0 mA, BL = 4, tCK = tCK.MIN, tRC = tRC.MIN, tRAS =
tRAS.MIN, tRCD = tRCD.MIN, AL = 0, CL = CL.MIN; CKE is HIGH, CS is HIGH between valid
commands. Address and control inputs are SWITCHING, Databus inputs are SWITCHING.
IDD1
Precharge Standby Current
All banks idle; CS is HIGH; CKE is HIGH; tCK = tCK.MIN; Other control and address inputs are
SWITCHING, Data bus inputs are SWITCHING
IDD2N
Precharge Power-Down Current
Other control and address inputs are STABLE, Data bus inputs are FLOATING.
IDD2P
Precharge Quiet Standby Current
All banks idle; CS is HIGH; CKE is HIGH; tCK = tCK.MIN; Other control and address inputs are
STABLE, Data bus inputs are FLOATING.
IDD2Q
Active Power-Down Current
IDD3P(0)
All banks open; tCK = tCK.MIN, CKE is LOW; Other control and address inputs are STABLE, Data
bus inputs are FLOATING. MRS A12 bit is set to LOW (Fast Power-down Exit);
Active Power-Down Current
IDD3P(1)
All banks open; tCK = tCK.MIN, CKE is LOW; Other control and address inputs are STABLE, Data
bus inputs are FLOATING. MRS A12 bit is set to HIGH (Slow Power-down Exit);
Active Standby Current
IDD3N
Burst Read: All banks open; Continuous burst reads; BL = 4; AL = 0, CL = CLMIN; tCK = tCK.MIN;
tRAS = tRAS.MAX, tRP = tRP.MIN; CKE is HIGH, CS is HIGH between valid commands. Address
inputs are SWITCHING; Data Bus inputs are SWITCHING; IOUT = 0 mA.
Operating Current
IDD4R
Burst Read: All banks open; Continuous burst reads; BL = 4; AL = 0, CL = CLMIN; tCK = tCK.MIN;
tRAS = tRAS.MAX., tRP = tRP.MIN; CKE is HIGH, CS is HIGH between valid commands. Address
inputs are SWITCHING; Data Bus inputs are SWITCHING; IOUT = 0 mA.
Operating Current
IDD4W
Burst Write: All banks open; Continuous burst writes; BL = 4; AL = 0, CL = CLMIN; tCK = tCK.MIN;
tRAS = tRAS.MAX., tRP = tRP.MAX; CKE is HIGH, CS is HIGH between valid commands. Address
inputs are SWITCHING; Data Bus inputs are SWITCHING;
Burst Refresh Current
IDD5B
tCK = tCK.MIN., Refresh command every tRFC = tRFC.MIN interval, CKE is HIGH, CS is HIGH
between valid commands, Other control and address inputs are SWITCHING, Data bus inputs
are SWITCHING.
Distributed Refresh Current
IDD5D
tCK = tCK.MIN, Refresh command every tRFC = tREFI interval, CKE is LOW and CS is HIGH
between valid commands, Other control and address inputs are SWITCHING, Data bus inputs
are SWITCHING.
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Note1)2)3)4)5)6)7)8)
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Parameter
Symbol
Self-Refresh Current
CKE ≤ 0.2 V; external clock off, CK and CK at 0 V; Other control and address inputs are
FLOATING, Data bus inputs are FLOATING. RESET is LOW. IDD6 current values are
guaranteed up to TCASE of 85 °C max.
IDD6
Note1)2)3)4)5)6)7)8)
All Bank Interleave Read Current
IDD7
All banks are being interleaved at minimum tRC without violating tRRD using a burst length of 4.
Control and address bus inputs are STABLE during DESELECTS. IOUT = 0 mA.
1) VDDQ = 1.8 V ± 0.1 V; VDD = 1.8 V ± 0.1 V
2) IDD specifications are tested after the device is properly initialized and IDD parameter are specified with ODT disabled.
3) Definitions for IDD see Table 19
4) IDD1, IDD4R and IDD7 current measurements are defined with the outputs disabled (IOUT = 0 mA). To achieve this on module level the output
buffers can be disabled using an EMRS(1) (Extended Mode Register Command) by setting A12 bit to HIGH.
5) For two rank modules: for all active current measurements the other rank is in Precharge Power-Down Mode IDD2P
6) RESET signal is HIGH for all currents, except for IDD6 (Self Refresh)
7) All current measurements includes Register and PLL current consumption
8) For details and notes see the relevant Qimonda component data sheet
TABLE 19
Definitions for IDD
Parameter
Description
LOW
VIN ≤ VIL(ac).MAX, HIGH is defined as VIN ≥ VIH(ac).MIN
STABLE
inputs are stable at a HIGH or LOW level
FLOATING
inputs are VREF = VDDQ /2
SWITCHING
inputs are changing between HIGH and LOW every other clock (once per 2 cycles) for address and control
signals, and inputs changing between HIGH and LOW every other data transfer (once per cycle) for DQ
signals not including mask or strobes.
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
TABLE 20
IDD Specification for HYS72T256322HP–[3S/3.7]–A
1740
mA
2)
2220
1920
mA
2)
2400
1940
mA
3)
780
640
mA
3)
2040
1580
mA
3)
2400
1940
mA
3)
1280
1080
mA
3)
810
680
mA
3)
3030
2190
mA
2)
3210
2280
mA
2)
3210
2910
mA
2)
810
720
mA
3)4)
180
144
mA
3)4)
3330
3100
mA
2)
HYS72T256322HP–3.7–A
Note1)
HYS72T256322HP–3S–A
Unit
Product Type
Organization
2 GB
2 GB
2 Ranks
2 Ranks
×72
×72
–3S
–3.7
Symbol
Max.
Max.
IDD0
IDD1
IDD2N
IDD2P
IDD2Q
IDD3N
IDD3P( MRS = 0)
IDD3P( MRS = 1)
IDD4R
IDD4W
IDD5B
IDD5D
IDD6
IDD7
1960
1) Module IDD is calculated on the basis of component IDD and currents includes Registers and PLL. ODT disabled. IDD1, IDD4R and IDD7 are
defined with the outputs disabled.
2) The other rank is in IDD2P Precharge Power-Down Standby Current mode
3) Both ranks are in the same IDD mode
4) Values for 0 °C ≤ TCASE ≤ 85 °C
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
4
SPD Codes
This chapter lists all hexadecimal byte values stored in the EEPROM of the products described in this data sheet. SPD stands
for serial presence detect. All values with XX in the table are module specific bytes which are defined during production.
List of SPD Code Tables
• Table 21 “SPD Codes for PC2–4200P–444” on Page 29
TABLE 21
SPD Codes for PC2–4200P–444
Product Type
HYS72T256322HP–3.7–A
HYS72T256322HP–3S–A
Organization
2 GByte
2 GByte
×72
×72
2 Ranks (×4)
2 Ranks (×4)
Label Code
PC2–4200P–444
PC2–5300P–555
JEDEC SPD Revision
Rev. 1.2
Rev. 1.2
Byte#
Description
HEX
HEX
0
Programmed SPD Bytes in EEPROM
80
80
1
Total number of Bytes in EEPROM
08
08
2
Memory Type (DDR2)
08
08
3
Number of Row Addresses
0E
0E
4
Number of Column Addresses
0B
0B
5
DIMM Rank and Stacking Information
11
11
6
Data Width
48
48
7
Not used
00
00
8
Interface Voltage Level
05
05
9
tCK @ CLMAX (Byte 18) [ns]
tAC SDRAM @ CLMAX (Byte 18) [ns]
3D
30
10
50
45
11
Error Correction Support (non-ECC, ECC)
06
06
12
Refresh Rate and Type
82
82
13
Primary SDRAM Width
04
04
14
Error Checking SDRAM Width
04
04
15
Not used
00
00
16
Burst Length Supported
0C
0C
17
Number of Banks on SDRAM Device
04
04
18
Supported CAS Latencies
38
38
19
DIMM Mechanical Characteristics
00
00
20
DIMM Type Information
01
01
21
DIMM Attributes
05
05
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Product Type
HYS72T256322HP–3.7–A
HYS72T256322HP–3S–A
Organization
2 GByte
2 GByte
×72
×72
2 Ranks (×4)
2 Ranks (×4)
Label Code
PC2–4200P–444
PC2–5300P–555
JEDEC SPD Revision
Rev. 1.2
Rev. 1.2
Byte#
Description
HEX
HEX
22
Component Attributes
03
03
23
3D
3D
30
tCK @ CLMAX -1 (Byte 18) [ns]
tAC SDRAM @ CLMAX -1 [ns]
tCK @ CLMAX -2 (Byte 18) [ns]
tAC SDRAM @ CLMAX -2 [ns]
tRP.MIN [ns]
tRRD.MIN [ns]
tRCD.MIN [ns]
tRAS.MIN [ns]
31
Module Density per Rank
32
38
tAS.MIN and tCS.MIN [ns]
tAH.MIN and tCH.MIN [ns]
tDS.MIN [ns]
tDH.MIN [ns]
tWR.MIN [ns]
tWTR.MIN [ns]
tRTP.MIN [ns]
1E
1E
39
Analysis Characteristics
00
00
40
tRC and tRFC Extension
tRC.MIN [ns]
tRFC.MIN [ns]
tCK.MAX [ns]
tDQSQ.MAX [ns]
tQHS.MAX [ns]
00
00
3C
3C
69
69
80
80
1E
18
28
22
46
PLL Relock Time
0F
0F
47
TCASE.MAX Delta / ∆T4R4W Delta
51
53
24
25
26
27
28
29
33
34
35
36
37
41
42
43
44
45
50
50
50
50
60
60
3C
3C
1E
1E
3C
3C
2D
2D
01
01
25
20
37
27
10
10
22
17
3C
3C
1E
1E
48
Psi(T-A) DRAM
78
78
49
∆T0 (DT0)
3F
4B
50
∆T2N (DT2N, UDIMM) or ∆T2Q (DT2Q, RDIMM)
22
2E
51
∆T2P (DT2P)
1E
26
52
∆T3N (DT3N)
1E
26
53
∆T3P.fast (DT3P fast)
24
2B
54
∆T3P.slow (DT3P slow)
17
1B
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Product Type
HYS72T256322HP–3.7–A
HYS72T256322HP–3S–A
Organization
2 GByte
2 GByte
×72
×72
2 Ranks (×4)
2 Ranks (×4)
Label Code
PC2–4200P–444
PC2–5300P–555
JEDEC SPD Revision
Rev. 1.2
Rev. 1.2
Byte#
Description
HEX
HEX
55
∆T4R (DT4R) / ∆T4R4W Sign (DT4R4W)
34
4A
56
∆T5B (DT5B)
1E
20
57
∆T7 (DT7)
20
22
58
Psi(ca) PLL
C4
C4
59
Psi(ca) REG
8C
8C
60
∆TPLL (DTPLL)
61
68
61
∆TREG (DTREG) / Toggle Rate
78
94
62
SPD Revision
12
12
63
Checksum of Bytes 0-62
44
72
64
Manufacturer’s JEDEC ID Code (1)
7F
7F
65
Manufacturer’s JEDEC ID Code (2)
7F
7F
66
Manufacturer’s JEDEC ID Code (3)
7F
7F
67
Manufacturer’s JEDEC ID Code (4)
7F
7F
68
Manufacturer’s JEDEC ID Code (5)
7F
7F
69
Manufacturer’s JEDEC ID Code (6)
51
51
70
Manufacturer’s JEDEC ID Code (7)
00
00
71
Manufacturer’s JEDEC ID Code (8)
00
00
72
Module Manufacturer Location
xx
xx
73
Product Type, Char 1
37
37
74
Product Type, Char 2
32
32
75
Product Type, Char 3
54
54
76
Product Type, Char 4
32
32
77
Product Type, Char 5
35
35
78
Product Type, Char 6
36
36
79
Product Type, Char 7
33
33
80
Product Type, Char 8
32
32
81
Product Type, Char 9
32
32
82
Product Type, Char 10
48
48
83
Product Type, Char 11
50
50
84
Product Type, Char 12
33
33
85
Product Type, Char 13
2E
53
86
Product Type, Char 14
37
41
87
Product Type, Char 15
41
20
Rev. 1.01, 2006-09
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Product Type
HYS72T256322HP–3.7–A
HYS72T256322HP–3S–A
Organization
2 GByte
2 GByte
×72
×72
2 Ranks (×4)
2 Ranks (×4)
Label Code
PC2–4200P–444
PC2–5300P–555
JEDEC SPD Revision
Rev. 1.2
Rev. 1.2
Byte#
Description
HEX
HEX
88
Product Type, Char 16
20
20
89
Product Type, Char 17
20
20
90
Product Type, Char 18
20
20
91
Module Revision Code
2x
2x
92
Test Program Revision Code
xx
xx
93
Module Manufacturing Date Year
xx
xx
94
Module Manufacturing Date Week
xx
xx
95 - 98
Module Serial Number
xx
xx
99 - 127 Not used
00
00
128 255
FF
FF
Blank for customer use
Rev. 1.01, 2006-09
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Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
5
Package Outlines
This chapter contains the package outlines of the products.
FIGURE 5
’! " #
Package Outline Raw Card XX - L-DIM-240-54
!
8
X
#
›
"
-).
!
›
›
2›
›
$ETAILO FC ONTA CTS
› ! " #
',$ Notes
1. Drawing according to ISO 8015
2. Dimensions in mm
3. General tolerances +/- 0.15
Rev. 1.01, 2006-09
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33
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
6
Product Type Nomenclature
Qimonda’s nomenclature uses simple coding combined with
some propriatory coding. Table 22 provides examples for
module and component product type number as well as the
field number. The detailed field description together with
possible values and coding explanation is listed for modules
in Table 23 and for components in Table 24.
TABLE 22
Nomenclature Fields and Examples
Example for
Field Number
1
2
3
4
5
6
7
8
9
10
11
Micro-DIMM
HYS
64
T
64/128
0
2
0
K
M
–5
–A
DDR2 DRAM
HYB
18
T
512/1G 16
0
A
C
–5
TABLE 23
DDR2 DIMM Nomenclature
Field
Description
Values
Coding
1
Qimonda Module Prefix
HYS
Constant
2
Module Data Width [bit]
64
Non-ECC
72
ECC
3
DRAM Technology
T
DDR2
4
Memory Density per I/O [Mbit];
Module Density1)
32
256 MByte
64
512 MByte
128
1 GByte
256
2 GByte
512
4 GByte
5
Raw Card Generation
0 .. 9
Look up table
6
Number of Module Ranks
0, 2, 4
1, 2, 4
7
Product Variations
0 .. 9
Look up table
8
Package, Lead-Free Status
A .. Z
Look up table
9
Module Type
D
SO-DIMM
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
M
Micro-DIMM
R
Registered
U
Unbuffered
F
Fully Buffered
34
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Field
Description
Values
Coding
10
Speed Grade
–2.5F
PC2–6400 5–5–5
–2.5
PC2–6400 6–6–6
11
Die Revision
–3
PC2–5300 4–4–4
–3S
PC2–5300 5–5–5
–3.7
PC2–4200 4–4–4
–5
PC2–3200 3–3–3
–A
First
–B
Second
1) Multiplying “Memory Density per I/O” with “Module Data Width” and dividing by 8 for Non-ECC and 9 for ECC modules gives the overall
module memory density in MBytes as listed in column “Coding”.
TABLE 24
DDR2 DRAM Nomenclature
Field
Description
Values
Coding
1
2
Qimonda Component Prefix
HYB
Constant
Interface Voltage [V]
18
SSTL_18
3
DRAM Technology
T
DDR2
4
Component Density [Mbit]
256
256 Mbit
512
512 Mbit
1G
1 Gbit
2G
2 Gbit
40
×4
80
×8
16
×16
0 .. 9
Look up table
5+6
Number of I/Os
7
Product Variations
8
Die Revision
9
10
Package, Lead-Free Status
Speed Grade
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
A
First
B
Second
C
FBGA, lead-containing
F
FBGA, lead-free
–25F
DDR2-800 5-5-5
–2.5
DDR2-800 6-6-6
–3
DDR2-667 4-4-4
–3S
DDR2-667 5-5-5
–3.7
DDR2-533 4-4-4
–5
DDR2-400 3-3-3
35
Internet Data Sheet
HYS72T256322HP–[3S/3.7]–A
Registered DDR2 SDRAM Modules
Table of Contents
1
1.1
1.2
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2
2.1
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
3
3.1
3.2
3.3
3.3.1
3.3.2
3.3.3
3.4
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DC Operating Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Speed Grades Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AC Timing Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ODT AC Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Currents Specifications and Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
4
SPD Codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
5
Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
6
Product Type Nomenclature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
14
14
14
16
16
18
24
26
Table of Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Rev. 1.01, 2006-09
03062006-PK3L-ZYSE
36
Internet Data Sheet
Edition 2006-09
Published by Qimonda AG
Gustav-Heinemann-Ring 212
D-81739 München, Germany
© Qimonda AG 2006.
All Rights Reserved.
Legal Disclaimer
The information given in this Internet Data Sheet shall in no event be regarded as a guarantee of conditions or characteristics
(“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any
information regarding the application of the device, Qimonda hereby disclaims any and all warranties and liabilities of any kind,
including without limitation warranties of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest Qimonda Office.
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in question please
contact your nearest Qimonda Office.
Qimonda Components may only be used in life-support devices or systems with the express written approval of Qimonda, if a
failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect
the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human
body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health
of the user or other persons may be endangered.
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