APEX SA51M

TABLE 4 GROUP A INSPECTION
SA51M
M I C R O T E C H N O L O G Y
HTTP://WWW.APEXMICROTECH.COM
SG PARAMETER
SYMBOL
TEMP. POWER
(800) 546-APEX
(800) 546-2739
TEST CONDITIONS
1
1
1
1
Quiescent Current
ON Voltage
OFF Leakage
Input Voltage Threshold
IQ
VDS
IDSS
VINTH
25°C
25°C
25°C
25°C
+28Vdc
+28Vdc
+70Vdc
+28Vdc
PWM Not switching
ID = 5A
Output off, VDS = 70V
Input increased until AOUT and BOUT change
state
3
3
3
3
Quiescent Current
ON Voltage
OFF Leakage
Input Voltage Threshold
IQ
VDS
IDSS
VINTH
–55°C
–55°C
–55°C
–55°C
+28Vdc
+28Vdc
+70Vdc
+28Vdc
PWM Not switching
ID = 5A
Output off, VDS = 70V
Input increased until AOUT and BOUT change
state
2
2
2
2
Quiescent Current
ON Voltage
OFF Leakage
Input Voltage Threshold
IQ
VDS
IDSS
VINTH
125°C
125°C
125°C
125°C
+28Vdc
+28Vdc
+70Vdc
+28Vdc
PWM Not switching
ID = 5A
Output OFF, VDS = 70V
Input increased until AOUT and BOUT change
state
4
Operating Supply Current
IS
25°C
+28Vdc
PWM = 500khz TTL
7
Disable Function
DIS
25°C
+28Vdc
Disable > 3.6V, PWM input=500KHz,
verify no switching
MIN
MAX
UNITS
0.8
18
1.8
25
2.7
mA
V
µA
V
0.8
18
1.2
25
2.7
mA
V
µA
V
0.8
18
2.4
250
2.7
mA
V
µA
V
60
mA
Pass/Fail
1/VCC=+12Vdc, RSENSE = Disable = Ground, RL = 1K ohm, AOUT to BOUT
BURN IN CIRCUIT
R2
–12V +12V
1
+28V
8
7
C2
2
+12V
3
C3
4
DUT
1
DEVICE CELL
OUTPUT
R1
2
NE555
DEVICE CELL
INPUT
R3
6
3
5
–12V
C4
4
C5
C1
This data
sheet has been carefully CORPORATION
checked and is believed
to be reliable,(520)
however,
no responsibility
assumed888-3329
for possible•inaccuracies
or omissions.
All specifications
subject to change without notice.
APEX
MICROTECHNOLOGY
• TELEPHONE
690-8600
• FAXis(520)
ORDERS (520)
690-8601
• EMAILare
[email protected]
SA51MU REV. A JANUARY 1998
© 1998 Apex Microtechnology Corp.