HANBit HMS25632M8G/Z8 HAN SRAM MODULE 1Mbyte (256K x 32-Bit) BIT Part No. HMS25632M8, HMS25632Z8 GENERAL DESCRIPTION The HMS25632M8G/Z8 is a high-speed static random access memory (SRAM) module containing 262,144 words organized in a x32-bit configuration. The module consists of eight 256K x 4 SRAMs mounted on a 64-pin, double-sided, FR4-printed circuit board. PD0 and PD1 identify the module’s density allowing interchangeable use of alternate density, industry- standard modules. Four chip enable inputs, (/CE1, /CE2, /CE3 and /CE4) are used to enable the module’s 4 bytes independently. Output enable (/OE) and write enable (/WE) can set the memory input and output. Data is written into the SRAM memory when write enable (/WE) and chip enable (/CE) inputs are both LOW. Reading is accomplished when /WE remains HIGH and /CE and output enable (/OE) are LOW. For reliability, this SRAM module is designed as multiple power and ground pin. All module components may be powered from a single +5V DC power supply and all inputs and outputs are fully TTL-compatible. FEATURES PIN ASSIGNMENT Part Identification -HMS25632M8G : 64Pin SIMM Design, Gold Plate Lead -HMS25632Z8 : 64Pin ZIP Design → Pin-Compatible with the HMS25632M8G Access times: 8, 10, 12, 15and 20ns High-density 1MByte design High-reliability, high-speed design Single + 5V ±0.5V power supply Easy memory expansion with /CE and /OE functions All inputs and outputs are TTL-compatible Industry-standard pinout OPTIONS MARKING Timing 8ns access - 8 10ns access -10 12ns access -12 15ns access -15 20ns access -20 Packages 64-pin SIMM M 64-pin ZIP Z PD0 DQ0 DQ1 DQ2 DQ3 Vcc A7 A8 A9 DQ4 DQ5 DQ6 DQ7 /WE A14 /CE1 /CE3 A16 Vss DQ16 DQ17 DQ18 DQ19 A10 A11 A12 A13 DQ20 DQ21 DQ22 DQ23 Vss 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 33 35 37 39 41 43 45 47 49 51 53 55 57 59 61 63 2 4 6 8 10 12 14 16 18 20 22 24 26 28 30 32 34 36 38 40 42 44 46 48 50 52 54 56 58 60 62 64 ZIP TOP VIEW 1 Vss PD1 DQ8 DQ9 DQ10 DQ11 A0 A1 A2 DQ12 DQ13 DQ14 DQ15 Vss A15 /CE2 /CE4 A17 /OE DQ24 DQ25 DQ26 DQ27 A3 A4 A5 Vcc A6 DQ28 DQ29 DQ30 DQ31 PD0 = Vss PD1 = Vss HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 FUNCTIONAL BLOCK DIAGRAM DQ0 - DQ31 A0 - A17 32 18 A0-17 A0-17 DQ 0-3 DQ 4-7 /WE /WE U1 /OE U5 /OE /CE /CE /CE1 A0-17 A0-17 DQ 8-11 DQ12-15 /WE /WE U2 /OE U6 /OE /CE /CE /CE2 A0-17 A0-17 DQ16-19 DQ20-23 /WE /WE U3 /OE U7 /OE /CE /CE /CE3 A0-17 A0-17 DQ24-27 /WE /WE /OE /OE DQ28-31 /WE U4 U8 /OE /CE /CE /CE4 PRESENCE-DETECT PD0 = Vss PD1 = Vss TRUTH TABLE MODE /OE /CE /WE OUTPUT POWER STANDBY X H X HIGH-Z STANDBY NOT SELECTED H L H HIGH-Z ACTIVE READ L L H Dout ACTIVE WRITE X L L Din ACTIVE 2 HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 ABSOLUTE MAXIMUM RATINGS PARAMETER SYMBOL RATING VIN,OUT -0.5V to Vcc+0.5V Voltage on Vcc Supply Relative to Vss VCC -0.5V to +7.0V Power Dissipation PD 8W TSTG -65oC to +150oC Voltage on Any Pin Relative to Vss Storage Temperature 0oC to +70oC Operating Temperature TA Stresses greater than those listed under " Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. RECOMMENDED DC OPERATING CONDITIONS PARAMETER * ( TA=0 to 70 o C ) SYMBOL MIN TYP. MAX Supply Voltage VCC 4.5V 5.0V 5.5V Ground VSS 0 0 0 Input High Voltage VIH 2.2 - Vcc+0.5V** Input Low Voltage VIL -0.5* - 0.8V VIL(Min.) = -2.0V (Pulse Width ≤ 10ns) for I ≤ 20 mA ** VIH(Min.) = Vcc+2.0V (Pulse Width ≤ 10ns) for I ≤ 20 mA DC AND OPERATING CHARACTERISTICS (1)(0oC ≤ TA ≤ 70 oC ; Vcc = 5V ± 0.5V ) PARAMETER Input Leakage Current Output Leakage Current TEST CONDITIONS VIN = Vss to Vcc /CE=VIH or /OE =VIH or /WE=VIL VOUT=Vss to VCC SYMBO L MIN MAX UNITS ILI -2 2 µA IL0 -2 2 µA 2.4 Output High Voltage IOH = -4.0Ma VOH Output Low Voltage IOL = 8.0mA VOL V 0.4 V * Vcc=5.0V, Temp=25 oC DC AND OPERATING CHARACTERISTICS (2) MAX DESCRIPTION Power Supply Current: Operating Power Supply Current: Standby TEST CONDITIONS Min. Cycle, 100% Duty /CE=VIL, VIN=VIH or VIL, IOUT=0mA SYMBOL -12 -15 -20 UNIT ICC 70 68 65 mA Min. Cycle, /CE=VIH ISB 30 30 30 mA f=0MHZ, /CE≥VCC-0.2V, VIN≥ VCC-0.2V or VIN≤0.2V ISB1 5 5 5 mA 3 HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 CAPACITANCE DESCRIPTION TEST CONDITIONS SYMBOL MAX UNIT Input /Output Capacitance VI/O=0V CI/O 8 pF Input Capacitance VIN=0V CIN 6 pF * NOTE : Capacitance is sampled and not 100% tested AC CHARACTERISTICS (0oC ≤ TA ≤ 70 oC ; Vcc = 5V ± 0.5V, unless otherwise specified) TEST CONDITIONS PARAMETER VALUE Input Pulse Level 0 to 3V Input Rise and Fall Time 3ns Input and Output Timing Reference Levels 1.5V Output Load See below Output Load Output Load (B) for tHZ, tLZ, tWHZ, tOW, tOLZ & tOHZ +5V +5V 480Ω 480Ω DOUT 255Ω DOUT 30pF* 255Ω 5pF* READ CYCLE -12 PARAMETER -15 -20 SYMBOL UNIT MIN MAX 12 MIN MAX 15 MIN MAX 20 ns Read Cycle Time tRC Address Access Time tAA 12 15 20 ns Chip Select to Output tCO 12 15 20 ns Output Enable to Output tOE 6 7 9 ns Output Enable to Low-Z Output tOLZ 0 0 0 ns Chip Enable to Low-Z Output tLZ 3 3 3 ns Output Disable to High-Z Output tOHZ 0 6 0 7 0 9 ns Chip Disable to High-Z Output tHZ 0 6 0 7 0 9 ns Output Hold from Address Change tOH 3 4 3 3 ns HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 Chip Select to Power Up Time tPU - Chip Select to Power Down Time tPD - 0 0 12 ns 15 20 ns WRITE CYCLE PARAMETER -12 -15 -20 SYMBOL UNIT MIN MAX MIN MAX MIN MAX Write Cycle Time tWC 12 15 20 ns Chip Select to End of Write tCW 8 9 10 ns Address Set-up Time tAS 0 0 0 ns Address Valid to End of Write tAW 8 9 10 ns Write Pulse Width tWP 8 9 10 ns Write Recovery Time tWR 0 0 0 ns Write to Output High-Z tWHZ 0 Data to Write Time Overlap tDW 6 7 8 ns Data Hold from Write Time tDH 0 0 0 ns End of Write to Output Low-Z tOW 3 3 5 ns 6 0 7 0 9 ns TIMING DIAGRAMS TIMING WAVEFORM OF READ CYCLE( Address Controlled) ( /CE = /OE = VIL , /WE = VIH) tRC Address tAA tOH Data out Previous Data Valid Data Valid 5 HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 TIMING WAVEFORM OF READ CYCLE ( /CE Controlled ) tRC Address tHZ(3,4,5) tAA tCO /CE tLZ(4,5) tOHZ tOE /OE tOH tOLZ Data Out High-Z Vcc Supply Current Data Valid tPD tPU lCC 50% 50% lSB Notes (Read Cycle) 1. /WE is high for read cycle. 2. All read cycle timing is referenced from the last valid address to first transition address. 3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or VOL levels. 4. At any given temperature and voltage condition, t HZ (max.) is less than tLZ (min.) both for a given device and from device to device. 5. Transition is measured ± 200mV from steady state voltage with Load (B). This parameter is sampled and not 100% tested. 6. Device is continuously selected with /CE = VIL. 7. Address valid prior to coincident with /CE transition low. TIMING WAVEFORM OF WRITE CYCLE (/OE = Clock ) tWC Address tAW tWR(5) /OE tCW(3) /CE tWP(2) tAS(4) /WE tDH tDW Data In High-Z Data Valid tOHZ(6) Data Out High-Z 6 HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 TIMING WAVEFORM OF WRITE CYCLE (/OE Low Fixed ) tWC Address tAW tWR(5) tCW(3) /CE tOH tAS(4) /WE tWP(2) tDW tDH High-Z Data In tWHZ(6,7) tOW (10) (9) High-Z(8) Data Out Notes (Write Cycle) 1. All write cycle timing is referenced from the last valid address to the first transition address. 2. A write occurs during the overlap of a low /CE and a low /WE. A write begins at the latest transition among /CE going low and /WE going low: A write ends at the earliest transition among /CE going high and /WE going high. tWP is measured from the beginning of write to the end of write. 3. tCW is measured from the later of /CE going low to the end of write. 4. tAS is measured from the address valid to the beginning of write. 5. tWR is measured from the end of write to the address change. tWR applied in case a write ends as /CE, or /WE going high. 6. If /OE,/CE and /WE are in the read mode during this period, the I/O pins are in the output low-Z state. Inputs of opposite phase of the output must not be applied because bus contention can occur. 7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle. 8. If /CE goes low simultaneously with /WE going low or after /WE going low, the outputs remain high impedance state. 9. DOUT is the read data of the new address. 10. When /CE is low: I/O pins are in the output state. The input signals in the opposite phase leading to the output should not be applied. FUNCTIONAL DESCRIPTION /CE /WE /OE MODE I/O PIN SUPPLY CURRENT H X* X Not Select High-Z l SB, l SB1 L H H Output Disable High-Z lCC L H L Read DOUT lCC L L X Write DIN lCC Note: X means Don't Care 7 HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 PACKAGING DIMMENSIONS SIMM Design 98.04 mm 10.16 mm 6.35 mm 16 mm 1 64 2.03 mm 1.02 mm 6.35 mm 6.35 mm 1.27 mm 3.34 mm 85.09 mm 2.54 mm 0.25 mm MAX MIN 1.29±0.08 mm Gold: 1.04±0.10 mm 1.27 Solder: 0.914±0.10 mm (Solder & Gold Plating Lead) ZIP Design 89 mm CUT 1.5 mm 14 mm 64 1 6 mm 40 mm 2.54 mm 2 mm 90 mm 1.29±0.08 mm 2.5 mm 8 HANBit Electronics Co.,Ltd. HANBit HMS25632M8G/Z8 ORDERING INFORMATION 1 2 3 HMS 4 5 6 7 8 256 32 M 8G -15 15ns Access Time HANBit Component, Gold Memory Modules SIMM x32bit SRAM 256K 1. - Product Line Identifier HANBit ------------------------------------------------------ H 2. - Memory Modules 3. - SRAM 4. - Depth : 256K 5. - Width : x 32bit 6. - Package Code SIMM ------------------------------------------------------- M ZIP ------------------------------------------------------- Z 7. - Number of Memory Components ---8 , Gold Plate Lead --G 8. - Access time 8 ----------------------------------------------------------- 8ns 10 ----------------------------------------------------------- 10ns 12 ----------------------------------------------------------- 12ns 15 ----------------------------------------------------------- 15ns 20 ----------------------------------------------------------- 20ns 9 HANBit Electronics Co.,Ltd.