INTEL 82562EZ_08

82562EZ(EX)/82547GI(EI) Dual
Footprint
Design Guide
Networking Silicon
317520-002
Revision 2.2
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82562EZ(EX)/82547GI(EI) Dual Footprint
Revision History
Revision
Revision Date
Description
0.25
Jul 2002
Initial publication of preliminary design guide information.
0.75
Sep 2002
Published revised design guide information:
• Added information on EEPROM settings
• Added design checklist
• Revised reference design schematic
• Revised Ball Number to signal mapping Table to conform to changes in
82547EI datasheet rev 0.75
1.0
Oct 2002
Published revised design guide information:
• Added layout checklist
• Updated LAN disable circuit
• Removed EEPROM information due to publication of separate guides
1.5
Sep 2003
Published revised design guide information:
• Added 82547GI coverage
• Removed Confidential status
• Updated schematics, removed redundant caps
• Revised LAN disable circuit
1.6
Nov 2004
Added crystal start-up information. Information includes:
• New crystal parameters
• Crystal selection guidelines
• Crystal validation methods
• Crystal testing methods
Changed signal name FL_SO to the correct signal name FLSH_SO.
Added 82562EX applicability.
Added new values for TX and RX terminations (next to LAN silicon). New
values are now 110 Ω for both TX and RX terminations.
Added new starting values for RBIAS100 and RBIAS10. New starting values
are now 649 Ω for RBIAS100 and 619 Ω for RBIAS10.
Updated reference schematics to reflect new Tx and Rx termination values,
new LAN disable circuit, and RBIAS100/RBIAS10 values.
Removed excess capacitors and changed pins F12 and H12 to no connects.
Added a 1K Ω resistor to pin A13 output.
1.7
Jan 2005
• Changed text in the Catalyst EEPROM revision H table note from
“Revision H or higher not supported” to “Revision H is not supported”.
• Removed the Design and Layout Checklists. These checklists are now
separate Microsoft* Excel spreadsheets.
1.8
Jan 2005
Updated reference schematics to reflect current differential pair termination
resistor values for the 82547GI/EI.
Updated section 4.2.1 “Termination Resistors for Designs Based on 82562EZ/
EX PLC Device” to reflect current resistor and RBIAS values.
Updated section 4.3.1 “Termination Resistors for Designs Based on 8257GI(EI)
Gigabit Ethernet Controller” to reflect current resistor values.
1.9
June 2006
Updated reference schematics for signals EE_MODE and JTAG_TRST#
(changed resistor values from 1 K Ω to 100 Ω).
2.0
Feb 2007
Updated sections 3.1.3, 3.1.1.8, and Table 5 in section 3.1.1 (changed max
ESR rate from 20 Ω to 10 Ω for the 82547GI/EI).
2.1
June 2007
Updated reference schematics: sheets 4 and 6.
2.2
Jan 2008
Added Table 6; approved crystals for the 82547GI(EI).
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Contents
1.0
Introduction......................................................................................................................... 1
1.1
1.2
1.3
Scope............................................................................................................................................ 1
Reference Documents .................................................................................................................. 2
Product Codes .............................................................................................................................. 2
2.0
System Data Port Interfaces .............................................................................................. 3
2.1
2.2
LCI Connection to 82562EZ(EX) Platform LAN Connect Device ................................................. 3
CSA Port Connection to 82547GI(EI) Gigabit Ethernet Controller ............................................... 4
2.2.1 Generation/Distribution of Reference Voltages ............................................................... 4
2.2.2 CSA Port Resistive Compensation .................................................................................. 5
3.0
Ethernet Component Design Guidelines ............................................................................ 7
3.1
General Design Considerations for Ethernet Controllers.............................................................. 7
3.1.1 Crystal Selection Parameters .......................................................................................... 7
3.1.2 Reference Crystal ..........................................................................................................10
3.1.3 Reference Crystal Selection ..........................................................................................11
3.1.4 Circuit Board ..................................................................................................................11
3.1.5 Temperature Changes...................................................................................................11
3.1.6 Integrated Magnetics Module ........................................................................................12
Designing with the 82562EZ(EX) Platform LAN Connect Device...............................................12
3.2.1 82562EZ/EX PLC Device LAN Disable Guidelines .......................................................12
3.2.2 Serial EEPROM for 82562EZ(EX) Implementations......................................................13
3.2.3 Magnetics Modules for 82562EZ(EX) PLC Device........................................................14
3.2.4 Power Supplies for 82562EZ(EX) PLC Implementations ..............................................14
3.2.5 82562EZ(EX) Device Test Capability ............................................................................14
Designing with the 82547GI(EI) Gigabit Ethernet Controller ......................................................14
3.3.1 82547GI(EI) Ethernet Controller LAN Disable Guidelines .............................................14
3.3.2 Serial EEPROM for 82547GI(EI) Controller Implementations .......................................15
3.3.3 EEPROM Map Information ............................................................................................17
3.3.4 Magnetics Modules for 82547GI(EI) Controller Applications .........................................17
3.3.5 Power Supplies for the 82547GI(EI) Device ..................................................................17
3.3.6 82547GI(EI) Controller Power Supply Filtering..............................................................18
3.3.7 82547GI(EI) Controller Power Management and Wake Up...........................................18
3.3.8 82547GI(EI) Device Test Capability ..............................................................................19
3.2
3.3
4.0
Ethernet Component Layout Guidelines ..........................................................................21
4.1
General Layout Considerations for Ethernet Controllers ............................................................21
4.1.1 Guidelines for Component Placement ...........................................................................21
4.1.2 Crystals..........................................................................................................................22
4.1.3 Board Stack Up Recommendations...............................................................................22
4.1.4 Differential Pair Trace Routing.......................................................................................23
4.1.5 Signal Trace Geometry..................................................................................................24
4.1.6 Trace Length and Symmetry .........................................................................................24
4.1.7 Impedance Discontinuities.............................................................................................25
4.1.8 Reducing Circuit Inductance..........................................................................................25
4.1.9 Signal Isolation ..............................................................................................................25
4.1.10 Power and Ground Planes.............................................................................................25
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.4
4.5
4.1.11 Traces for Decoupling Capacitors ................................................................................. 26
4.1.12 Ground Planes Under the Magnetics Module................................................................ 26
4.1.13 Special Considerations for Non-Integrated
Magnetics Modules and RJ-45 Connectors................................................................... 28
Layout for the 82562EZ(EX) Platform LAN Connect Device ...................................................... 29
4.2.1 Termination Resistors for Designs Based on 82562EZ(EX) PLC Device...................... 29
4.2.2 Light Emitting Diodes for Designs Based on 82562EZ(EX) PLC Device....................... 29
Layout for the 82547GI(EI) Gigabit Ethernet Controller ............................................................. 30
4.3.1 Termination Resistors for Designs Based on 82547GI(EI) Gigabit Ethernet Controller 30
4.3.2 Light Emitting Diodes for Designs Based on 82547GI(EI) Controller ............................ 30
Physical Layer Conformance Testing ......................................................................................... 30
Troubleshooting Common Physical Layout Issues..................................................................... 31
5.0
Design and Layout Checklists.......................................................................................... 33
6.0
Ball Number to Signal Mapping with Population Options................................................. 35
7.0
Dual Footprint Reference Schematic ............................................................................... 43
A
Measuring LAN Reference Frequency Using a Frequency Counter................................ 51
B
GigConf.exe Register Settings for 82547GI(EI) Devices ................................................. 57
4.2
4.3
Figures
1
2
3
4
5
6
5
6
7
8
9
10
11
12
vi
ICH5 Platform LAN Connect Sections .......................................................................................... 3
CSA Port Locally Generated Reference Divider Circuits.............................................................. 4
CSA port CI_RCOMP Circuits ...................................................................................................... 5
Crystal Circuit ............................................................................................................................... 9
LAN Disable Circuitry ................................................................................................................. 13
82547GI(EI) LAN Disable Circuitry ............................................................................................. 15
General Placement Distances .................................................................................................... 22
Trace Routing ............................................................................................................................. 23
Ground Plane Separation ........................................................................................................... 26
Ideal Ground Split Implementation ............................................................................................. 27
Termination Plane Example for 82562EZ(EX) PLC Device and Discrete Magnetics ................. 28
82562EZ(EX) PLC Device Differential Signal Termination......................................................... 29
Indirect Probing Setup ................................................................................................................ 52
Direct Probing Method ................................................................................................................ 55
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Tables
1
2
3
4
5
6
7
8
9
10
11
12
13
14
LAN Component Connections/Features ....................................................................................... 1
Product Ordering Codes ............................................................................................................... 2
CSA Port Reference Circuit Specifications................................................................................... 4
CSA Port CI_RCOMP Resistor Values......................................................................................... 5
Crystal Parameters ....................................................................................................................... 7
82547GI(EI) Recommended Crystals...........................................................................................8
82562EZ(EX) Memory Layout (128 Byte EEPROM) ..................................................................13
82562EZ(EX) Memory Layout (512 Byte EEPROM) ..................................................................14
82562EZ(EX) Recommended Magnetics Modules.....................................................................14
Microwire 64 x 16 Serial EEPROMs ...........................................................................................16
SPI Serial EEPROMs for 82547GI(EI) Controller .......................................................................16
82547GI(EI) EEPROM Memory Layout......................................................................................17
82547GI(EI) Recommended Magnetics Modules.......................................................................17
Ball Number to Signal Mapping ..................................................................................................35
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1.0
Introduction
Intel currently supports several footprint compatible Ethernet options depending upon the target
application. The term “footprint compatible” means that the silicon devices are all manufactured in
a 15 mm x 15 mm, 196-ball grid array package with the same ball pattern. Many of the critical
signal pin locations are identical, allowing designers to create a single LAN on Motherboard
(LOM) design that accommodates all devices. This is a flexible, cost-effective, multipurpose
design technique that allowing maximized value while matching performance needs.
Note:
Since some of the signal pins have different usages, the term “pin-compatible” is not applicable.
Available LAN components with the same footprint include the 82547GI(EI) Gigabit Ethernet
Controller and the 82562EZ(EX) Platform LAN Connect components.
The LAN component used on a specific platform depends on the end user’s need for connection
speed and manageability. As the requirements change, footprint compatibility makes it possible to
re-focus the platform without the need to redesign a new a motherboard.
Table 1.
LAN Component Connections/Features
LAN Component
®
1.1
Interface
Connection
Features
Intel 82547GI(EI)
CSA
Gigabit Ethernet (1000BASE-T)
with Alert Standard Format
(ASF) alerting
Gigabit Ethernet, ASF 2.0
alerting
Intel® 82562EX (196 BGA)
LCI
10/100 Ethernet with ASF
alerting
Ethernet 10/100
connection, ASF 1.0
alerting
Intel® 82562EZ (196 BGA)
LCI
Basic 10/100 Ethernet
Ethernet 10/100
connection
Scope
This application note contains Ethernet design guidelines applicable to LOM designs based on the
Intel® 865 Chipset and Intel® 875 Chipset. The document identifies similarities and differences
between the 82562EZ(EX) Platform LAN Connect device and the 82547GI(EI) Gigabit Ethernet
Controller.
Section 2 describes the port interfaces specific to each device.
Section 3 explains what you need to know to hook up an Ethernet device to the system.
Section 4 describes board layout techniques applicable to these devices.
Section 5 provides a reference to the design and layout checklists.
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Section 6 compares pin names and numbers between the two components.
Section 7 concludes with a reference design schematic of the full dual footprint configuration.
Note:
1.2
It is assumed that the reader is acquainted with high-speed design and board layout techniques.
Additional documents may be referred to for further information.
Reference Documents
• 82547GI(EI) Gigabit Ethernet Controller Datasheet. Intel Corporation.
• 82562EZ 10/100 Mbps Platform LAN Connect (PLC) Networking Silicon Datasheet. Intel
Corporation.
• 82562ET/EM Platform LAN Connect Printed Circuit Board Design Guide. Intel Corporation.
• 82547GI(EI)/82541(PI/GI/EI)/82541ER EEPROM Map and Programming Information. Intel
Corporation.
• ICH2 Integrated LAN Controller Function Disable and Power Control. Intel Corporation.
• PCI Bus Power Management Interface Specification, Rev. 1.1, PCI Special Interest Group.
• IEEE Standard 802.3, 2000 Edition. Incorporates various IEEE standards previously published
separately.
• I/O Control Hub 2, 3, and 4 EEPROM Map and Programming Information. Intel Corporation.
• I/O Control Hub 5, 6, and 7 EEPROM Map and Programming Information. Intel Corporation.
Programming information can be obtained through your local Intel representative.
1.3
Product Codes
Table 2 lists the product ordering codes for the 82562EZ(EX)and 82547GI(EI).
Table 2.
Product Ordering Codes
Device
2
Product Code
Product Code (Lead Free)
82562EZ
GD82562EZ
LU82562EZ
82562EX
GD82562EX
LU82562EX
82547GI
GD82547GI
LU82547GI
82547EI
GD82547EI
LU82547EI
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
2.0
System Data Port Interfaces
The 82562EZ(EX) Platform LAN Connect Device and the 82547GI(EI) Gigabit Ethernet
controller employ different system interfaces, as illustrated in Figure 1.
GMCH
Intel®
82547GI(EI)
CSA
Magnetics
Module
Connector
LCI
Intel®
82562EZ(EX)
Intel®
ICH5
Figure 1. ICH5 Platform LAN Connect Sections
2.1
LCI Connection to 82562EZ(EX) Platform LAN Connect
Device
The 82562EZ(EX) Platform LAN Connect device uses the LAN Connect Interface (LCI) to
connect to the I/O Control Hub 5 (ICH5). LCI is a point-to-point interface optimized to support one
device.
Line termination mechanisms are not specified for the LCI. Slew rate controlled output buffers
achieve acceptable signal integrity by controlling signal reflection, undershoot and ringing.
For details about how to connect the LCI interface between the 82562EZ(EX) Platform LAN
Connect device and ICH5, please refer to the 82562ET/EM Platform LAN Connect Printed Circuit
Board (PCB) Design Guide, the Intel® 865 Chipset design guide, or the Intel® 875 Chipset design
guide.
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
2.2
CSA Port Connection to 82547GI(EI) Gigabit Ethernet
Controller
The 82547GI(EI) Gigabit Ethernet Controller uses the Communications Streaming Architecture
(CSA) port to connect to the Memory Control Hub (MCH). CSA is a point-to-point interface
supporting one device.
CSA has a theoretical bandwidth of 266 MB/s, sufficient to support Gigabit Ethernet speeds. The
connection to the MCH places the Ethernet controller close to system memory for minimum
latency.
The CSA interface uses IGTL buffers to achieve very high data speeds while controlling
transmission line characteristics. For details on connecting the CSA interface between the
82547GI(EI) Gigabit Ethernet Controller and the MCH, please refer to the Intel® 865 Chipset
design guide, or the Intel® 875 Chipset design guide.
2.2.1
Generation/Distribution of Reference Voltages
The 11-bit CSA port on the 82547GI(EI) controller has a dedicated CI_VREF pin to sample the
reference voltage. The nominal CSA port reference voltage is 0.35 V ± 3%. In addition to the
reference voltage, a reference swing voltage, CI_SWING must be supplied to control buffer
voltage swing characteristics. The nominal CSA port reference voltage swing must be 0.8 V ± 3%.
Table 3.
CSA Port Reference Circuit Specifications
Reference Voltage
Specification (V)
Reference Swing Voltage
Specification (V)
0.350 ± 3%
0.8 ± 3%
1.2 V Voltage Divider Circuit
Recommended Resistor Values (Ω)
R1 = 523 ± 1%
R2 = 665 ± 1%
R3 = 604 ± 1%
1.2V
0.8 V
R3
CI_SWING
C1
R2
C2
Intel®
82547GI(EI)
CI_VREF
C1
R1
C2
0.35 V
Figure 2. CSA Port Locally Generated Reference Divider Circuits
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
The values of R1, R2 and R3 must be rated at ±1% tolerance. The selected resistor values must also
ensure that the reference voltage and reference swing voltage tolerance are maintained over the
input leakage specification. A 0.1 µF capacitor (C1 in Figure 2) should be placed within 0.5 inches
to each resistor divider, and a 0.01 µF bypass capacitor (C2 in Figure 2) should be placed within
0.25 inches of reference voltage pins. If the length of the trace from the voltage divider to the pin is
greater than 1 inch, place more than one 0.01 µF capacitor near the reference voltage pin. The trace
length from the voltage divider circuit to the CI_REF pins must be no longer than 3.5 inches.
Both the voltage reference and voltage swing reference signals should be routed at least 10mils
wide and spaced at least 20 mils from all other signals.
2.2.2
CSA Port Resistive Compensation
The CSA port uses a resistive compensation signal (CI_RCOMP) to compensate buffer
characteristics for temperature, voltage, and process.
Table 4.
CSA Port CI_RCOMP Resistor Values
Component
®
Intel 82547GI(EI)
Trace Impedance
RCOMP Resistor Value
RCOMP Resistor Tied To
60 Ω ± 15%
R1 = 30.1 Ω ± 1%
VCC1.2
1.2V
R1
CI_RCOMP
Intel®
82547GI(EI)
Figure 3. CSA port CI_RCOMP Circuits
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
3.0
Ethernet Component Design Guidelines
These sections provide recommendations for selecting components and connecting special pins.
The main design elements are the 82562EZ(EX) Platform LAN Connect device or the
82547GI(EI) Gigabit Ethernet Controller, an integrated magnetics module with RJ-45 connector,
and a crystal clock source.
3.1
General Design Considerations for Ethernet Controllers
These recommendations apply to all designs, 10/100 or 10/100/1000 Mb/s.
Follow good engineering practices with respect to unused inputs by terminating them with pull-up
or pull-down resistors, unless the data sheet, design guide or reference schematic indicates
otherwise. Do not attach pull-up or pull-down resistors to any balls identified as No Connect.
These devices may have special test modes that could be entered inadvertently.
3.1.1
Crystal Selection Parameters
Quartz crystals are generally considered to be the mainstay of frequency control components due to
their low cost and ease of implementation. They are available from numerous vendors in many
package types and with various specification options.
All crystals used with Intel® Ethernet controllers are described as “AT-cut”, which refers to the
angle at which the unit is sliced with respect to the long axis of the quartz stone.
Table 5 lists the crystal electrical parameters and provides suggested values for typical designs. The
parameters listed are described in the following subsections.
Table 5.
Crystal Parameters
Parameter
Vibration Mode
Nominal Frequency
Frequency Tolerance
Suggested Value
Fundamental
25,000 MHz at 25° C (required)
• ±30 ppm recommended; ±50 ppm across the entire operating
temperature range as required by IEEE specifications
• ±30 ppm required for the 82547GI(EI)
Temperature Stability
• ±50 ppm at 0° C to 70° C
• ±30 ppm at 0° C to 70° C required for the 82547GI(EI)
Calibration Mode
Load Capacitance
Parallel
• 16 pF to 20 pF
• 18 pF required for the 82547GI(EI)
Shunt Capacitance
Equivalent Series Resistance
6 pF maximum
• 50 Ω maximum
• 10 Ω maximum required for the 82547GI(EI)
Drive Level
Aging
0.5 mW maximum
±5 ppm per year maximum
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
.Table 6 lists the approved crystals for use with the 83547GI(EI) B1 steppings.
Table 6.
82547GI(EI) Recommended Crystals
Manufacturer
3.1.1.1
Manufacturer's Part Number
Raltron (<20 Ω ESR and +/-30 ppm)
AS-25.000-20-F-SMD-TR
TXC
6C25000355
Vibration Mode
Crystals in the frequency range listed in Table 5 are available in both fundamental and third
overtone. Unless there is a special need for third overtone, use fundamental mode crystals.
At any given operating frequency, third overtone crystals are thicker and more rugged than
fundamental mode crystals. Third overtone crystals are more suitable for use in military or harsh
industrial environments. Third overtone crystals require a trap circuit (extra capacitor and inductor)
in the load circuitry to suppress fundamental mode oscillation as the circuit powers up. Selecting
values for these components is beyond the scope of this document.
3.1.1.2
Nominal Frequency
Intel® Ethernet controllers use a crystal frequency of 25.000 MHz. The 25 MHz input is used to
generate a 125 MHz transmit clock for 100BASE-TX and 1000BASE-TX operation; 10 MHz and
20 MHz transmit clocks, for 10BASE-T operation.
3.1.1.3
Frequency Tolerance
The frequency tolerance for an Ethernet physical layer device is dictated by the IEEE 802.3
specification as ±50 parts per million (ppm). This measurement is referenced to a standard
temperature of 25° C.
Note:
Intel recommends a frequency tolerance of ±30 ppm.
3.1.1.4
Temperature Stability and Environmental Requirements
Temperature stability is a standard measure of how the oscillation frequency varies over the full
operational temperature range (and beyond). Several optional temperature ranges are currently
available, including -40° C to +85° C for industrial environments. Some vendors separate operating
temperatures from temperature stability. Manufacturers may also list temperature stability as 50
ppm in their data sheets.
Note:
Crystals also carry other specifications for storage temperature, shock resistance, and reflow solder
conditions. Crystal vendors should be consulted early in the design cycle to discuss the application
and its environmental requirements.
3.1.1.5
Calibration Mode
The terms “series-resonant” and “parallel-resonant” are often used to describe crystal circuits.
Specifying parallel mode is critical to determining how the crystal frequency is calibrated at the
factory.
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
A crystal specified and tested as series resonant oscillates without problem in a parallel-resonant
circuit, but the frequency is higher than nominal by several hundred parts per million. The purpose
of adding load capacitors to a crystal circuit is to establish resonance at a frequency higher than the
crystal’s inherent series resonant frequency.
Figure 4 illustrates a simplified schematic of the 82562EZ(EX) and the 82547GI(EI) controller’s
crystal circuit. The crystal and the capacitors form a feedback element for the internal inverting
amplifier. This combination is called parallel-resonant, because it has positive reactance at the
selected frequency. In other words, the crystal behaves like an inductor in a parallel LC circuit.
LAN
Silicon
X1 or Xin
C1
LAN
Silicon
X2 or Xout
C2
Figure 4. Crystal Circuit
3.1.1.6
Load Capacitance
The formula for crystal load capacitance is as follows:
( C1 ⋅ C2 )
C L = ------------------------- + C stray
( C1 + C2 )
where C1 = C2 = 22 pF (as suggested in most Intel reference designs)
and Cstray = allowance for additional capacitance in pads, traces and the chip carrier
within the Ethernet controller package
An allowance of 3 pF to 7 pF accounts for lumped stray capacitance. The calculated load
capacitance is 16 pF with an estimated stray capacitance of about 5 pF.
Individual stray capacitance components can be estimated and added. For example, surface mount
pads for the load capacitors add approximately 2.5 pF in parallel to each capacitor. This technique
is especially useful if Y1, C1 and C2 must be placed farther than approximately one-half (0.5) inch
from the controller. It is worth noting that thin circuit boards generally have higher stray
capacitance than thick circuit boards.
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Standard capacitor loads used by crystal manufacturers include 16 pF, 18 pF and 20 pF. Any of
these values will generally operate with the controller. However, a difference of several picofarads
between the calibrated load and the actual load will pull the oscillator slightly off frequency.
Note:
C1 and C2 may vary by as much as 5% (approximately 1 pF) from their nominal values.
3.1.1.7
Shunt Capacitance
The shunt capacitance parameter is relatively unimportant compared to load capacitance. Shunt
capacitance represents the effect of the crystal’s mechanical holder and contacts. The shunt
capacitance should equal a maximum of 6 pF (7 pF is also acceptable).
3.1.1.8
Equivalent Series Resistance
Equivalent Series Resistance (ESR) is the real component of the crystal’s impedance at the
calibration frequency, which the inverting amplifier’s loop gain must overcome. ESR varies
inversely with frequency for a given crystal family. The lower the ESR, the faster the crystal starts
up. Use crystals with an ESR value of 50 Ω or better.
Note:
Check the specific controller documentation carefully; some devices may have tighter ESR
requirements. For example, Intel recommends that 82547GI(EI) devices use crystals with an ESR
value of 10 Ω or less.
3.1.1.9
Drive Level
Drive level refers to power dissipation in use. The allowable drive level for a Surface Mounted
Technology (SMT) crystal is less than its through-hole counterpart, because surface mount crystals
are typically made from narrow, rectangular AT strips, rather than circular AT quartz blanks.
Some crystal data sheets list crystals with a maximum drive level of 1 mW. However, Intel®
Ethernet controllers drive crystals to a level less than the suggested 0.5 mW value. This parameter
does not have much value for on-chip oscillator use.
3.1.1.10
Aging
Aging is a permanent change in frequency (and resistance) occurring over time. This parameter is
most important in its first year because new crystals age faster than old crystals. Use crystals with a
maximum of ±5 ppm per year aging.
3.1.2
Reference Crystal
The normal tolerances of the discrete crystal components can contribute to small frequency offsets
with respect to the target center frequency. To minimize the risk of tolerance-caused frequency
offsets causing a small percentage of production line units to be outside of the acceptable frequency
range, it is important to account for those shifts while empirically determining the proper values for
the discrete loading capacitors, C1 and C2.
Even with a perfect support circuit, most crystals will oscillate slightly higher or slightly lower than
the exact center of the target frequency. Therefore, frequency measurements (which determine the
correct value for C1 and C2) should be performed with an ideal reference crystal. When the
capacitive load is exactly equal to the crystal’s load rating, an ideal reference crystal will be
perfectly centered at the desired target frequency.
10
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
3.1.3
Reference Crystal Selection
There are several methods available for choosing the appropriate reference crystal:
• If a Saunders and Associates (S&A) crystal network analyzer is available, then discrete crystal
components can be tested until one is found with zero or nearly zero ppm deviation (with the
appropriate capacitive load). A crystal with zero or near zero ppm deviation will be a good
reference crystal to use in subsequent frequency tests to determine the best values for C1 and
C2.
• If a crystal analyzer is not available, then the selection of a reference crystal can be done by
measuring a statistically valid sample population of crystals, which has units from multiple
lots and approved vendors. The crystal, which has an oscillation frequency closest to the center
of the distribution, should be the reference crystal used during testing to determine the best
values for C1 and C2.
• It may also be possible to ask the approved crystal vendors or manufacturers to provide a
reference crystal with zero or nearly zero deviation from the specified frequency when it has
the specified CLoad capacitance.
Note:
For 82547GI(EI) devices, Intel® recommends choosing a crystal with a ESR value of 10 Ω or less,
an equivalent Cload of 18 pF, and a maximum of 30 ppm frequency shift. Cload is defined to be the
load capacitance of the crystal, specified by the crystal vendor.
When choosing a crystal, customers must keep in mind that to comply with IEEE specifications for
10/100 and 10/100/1000Base-T Ethernet LAN, the transmitter reference frequency must be precise
within ±50 ppm. Intel® recommends customers to use a transmitter reference frequency that is
accurate to within ±30 ppm to account for variations in crystal accuracy due to crystal
manufacturing tolerance. For information about measuring transmitter reference frequency, refer to
Appendix A, “Measuring LAN Reference Frequency Using a Frequency Counter”.
3.1.4
Circuit Board
Since the dielectric layers of the circuit board are allowed some reasonable variation in thickness,
the stray capacitance from the printed board (to the crystal circuit) will also vary. If the thickness
tolerance for the outer layers of dielectric are controlled within ±17 percent of nominal, then the
circuit board should not cause more than ±2 pF variation to the stray capacitance at the crystal.
When tuning crystal frequency, it is recommended that at least three circuit boards are tested for
frequency. These boards should be from different production lots of bare circuit boards.
Alternatively, a larger sample population of circuit boards can be used. A larger population will
increase the probability of obtaining the full range of possible variations in dielectric thickness and
the full range of variation in stray capacitance.
Next, the exact same crystal and discrete load capacitors (C1 and C2) must be soldered onto each
board, and the LAN reference frequency should be measured on each circuit board.
The circuit board, which has a LAN reference frequency closest to the center of the frequency
distribution, should be used while performing the frequency measurements to select the appropriate
value for C1 and C2.
3.1.5
Temperature Changes
Temperature changes can cause the crystal frequency to shift. Therefore, frequency measurements
should be done in the final system chassis across the system’s rated operating temperature range.
11
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
3.1.6
Integrated Magnetics Module
The magnetics module has a critical effect on overall IEEE and regulatory conformance. The
device should meet the performance required for a design with reasonable margin to allow for
manufacturing variation. Occasionally, components that meet basic specifications may cause the
system to fail IEEE testing because of interactions with other components or the printed circuit
board itself. Carefully qualifying new magnetics modules can go a long way toward preventing this
type of problem.
The steps involved in magnetics module qualification are similar to those for oscillator
qualification:
1. Verify that the vendor's published specifications in the component datasheet meet the required
IEEE specifications.
2. Independently measure the component's electrical parameters on the test bench, checking
samples from multiple lots. Check that the measured behavior is consistent from sample to
sample as well as meeting the published specifications.
3. Perform physical layer conformance testing and EMC (FCC and EN) testing in real systems.
Vary temperature and voltage while performing system level tests (for IEEE only).
Magnetics modules for 1000BASE-T Ethernet are similar to those designed solely for
10/100 Mbps, with the exception of four differential signal pairs instead of two for 10/100 Mbps.
3.2
Designing with the 82562EZ(EX) Platform LAN Connect
Device
This section provides design guidelines specific to the PLC device.
3.2.1
82562EZ/EX PLC Device LAN Disable Guidelines
Note:
ICHx Integrated LAN Controller resides on the ICHx VccSus3_3 and VccSus1_8 power wells
(typically referred to as “auxiliary” (“aux”) or “standby” supplies at the platform level).
The ICHx Integrated LAN’s RST# is the ICHx Resume-well input. It can be held low indefinitely
to keep the ICHx Integrated LAN Controller in a reset state. The LAN Reset (RST#) signal must
not be deasserted sooner than 10 ms after the Resume power supply reaches its nominal voltage.
This ensures that the ICHx Integrated LAN Controller is initialized. Figure 5 illustrates a possible
solution for ICHx Integrated LAN disable.
12
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
3.3Vstb
470 Ω
3.3Vstb
100 Ω
TESTEN
100 Ω
ISOL_TCK
Super IO
GP Port
or
ICHx GPIO
24, 25, 27, 28
or
µController
(mobile)
100 Ω
1K
MMBT3904
ISOL_TI
100 Ω
1K
ISOL_TEX
3.3Vstb
LAN_RST#
ICHx
Sensor/
Supervisor
RST#
RSMRST#
Figure 5. LAN Disable Circuitry
Note:
3.2.2
The 100 Ω resistors for the Test Mode signals are required for the Exclusive OR (XOR) Tree and
Isolate Mode.
Serial EEPROM for 82562EZ(EX) Implementations
Serial EEPROM for LAN implementations based on 82562EZ(EX) devices connects to the ICH5.
Depending upon the size of the EEPROM, the 82562EZ(EX) may or may not support legacy
manageability. Table 7 and Table 8 list the EEPROM map for the 82562EZ(EX) PLC device. For
details on the EEPROM, refer to the appropriate I/O Control Hub 2, 3, 4, 5, 6, and 7 EEPROM
Map and Programming Information.
Table 7.
82562EZ(EX) Memory Layout (128 Byte EEPROM)
00h
HW/SW Reserved Area
3Fh
NOTE: No manageability provided.
13
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 8.
82562EZ(EX) Memory Layout (512 Byte EEPROM)
00h
HW/SW Reserved Area
3Fh
40h
FFh
ASF and Legacy
Manageability
NOTE: Legacy manageability only.
3.2.3
Magnetics Modules for 82562EZ(EX) PLC Device
A 5-core magnetics module should be carefully selected for your design. Table 9 lists suggested
integrated magnetics modules for use with the 82562EZ(EX) PLC device. These modules also
contain integrated USB jacks.
Note:
Table 9.
These components are pin-compatible with the magnetics modules listed in Table 13 for the
82547GI(EI) controller.
82562EZ(EX) Recommended Magnetics Modules
Manufacturer
3.2.4
Manufacturer's Part Number
Pulse
JW0A1P01R-E
Stewart
SI-70027
Foxconn
UBC11123-J51
Power Supplies for 82562EZ(EX) PLC Implementations
The 82562EZ(EX) PLC device uses a single 3.3 V power supply. The 3.3 V supply must provide
approximately 90 mA current for full speed operation. Standby power must be furnished in order to
wake up from powerdown.
3.2.5
82562EZ(EX) Device Test Capability
The device contains an XOR test tree mechanism for simple board tests. Details of the XOR tree
operation are contained in the 82562ET LAN on Motherboard Design Guide.
3.3
Designing with the 82547GI(EI) Gigabit Ethernet Controller
This section provides design guidelines specific to the 82547GI(EI) controller.
3.3.1
82547GI(EI) Ethernet Controller LAN Disable Guidelines
The 82547GI(EI) Controller has a LAN_DISABLE# function that is present on FLSH_SO ball P9.
This pin can be connected to a GPIO pin on the ICH5 component to allow the BIOS to disable the
Ethernet port (see Figure 6). If the serial FLASH interface is populated, make sure the FLASH
serial output pin does not interfere with this function.
14
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
For best results, do not attempt to use the LAN_POWER_GOOD signal for a LAN disable input.
This pin is intended to operate as a power-on reset connected to a power monitor circuit.
The input of FLSH_SO (ball P9) is the LAN_DISABLE signal. It is sampled on the rising edge of
LAN_PWR_GOOD and/or RST#. The signal must be held valid for 80 ns after either rising edge.
If sampled high, the LAN functions normally. If sampled low, then the following occurs:
1. The LAN is disabled.
2. The PHY is powered down.
3. Most MAC clock domains are gated.
4. Most functional blocks are held in reset.
5. The device is in a low power state – equivalent to D3 w/ no wake or manageability.
Note:
To use this configuration for the 82562EZ(EX) Platform LAN Connect device, be sure the AND
gate U1 is populated. Depopulate the 0 Ω resistor R2.
82562EZ(EX) Disable Circuit
IO
Control
Hub 5
Super IO
Chip
82547GI(EI)
RST#
RST# (B9)
FLSH_SO
(P9)
U1
RSM_RST#
R1
10 K
R2
0 Ohm
Pop = Y
LAN_PWR_GOOD
(A9)
Pop = Y means populate this option
Figure 6. 82547GI(EI) LAN Disable Circuitry
3.3.2
Serial EEPROM for 82547GI(EI) Controller Implementations
The 82547GI(EI) Gigabit Ethernet Controller can use either a Microwire* or an SPI* serial
EEPROM. The EEPROM mode is selected on the EEMODE input (ball C4). A pull-up resistor to
Vcc denotes SPI*. A pull-down resistor to ground denotes Microwire. Several words of the
EEPROM are accessed automatically by the device after reset to provide pre-boot configuration
data before it is accessed by host software. The remainder of the EEPROM space is available to
software for storing the MAC address, serial numbers, and additional information.
15
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
For non-ASF applications, use a 64 register by 16-bit Microwire serial EEPROM. For ASF 1.0
applications, use larger 93C66 Microwire or AT25040 SPI* Serial EEPROM. ASF 2.0 requires an
8K SPI* Serial EEPROM.
Intel has an MS-DOS* software utility called EEUPDATE, which can be used to program
EEPROM images in development or production line environments. To obtain a copy of this
program, contact your Intel representative.
The EEPROM access algorithm programmed into the 82547GI(EI) controller is compatible with
most, but not all, commercially available 3.3 V Microwire interface, serial EEPROM devices, with
64 x 16 (or 256 x 16) organization and a 1 MHz speed rating. The 82547GI(EI)'s EEPROM access
algorithm drives extra pulses on the shift clock at the beginnings and ends of read and write cycles.
The extra pulses may violate the timing specifications of some EEPROM devices. In selecting a
serial EEPROM, choose a device that specifies “don't care” shift clock states between accesses.
Microwire EEPROMs that have been found to work satisfactorily with the 82547GI(EI) Gigabit
Ethernet Controller are listed in the following table:
Table 10. Microwire 64 x 16 Serial EEPROMs
Manufacturer
Manufacturer's Part Number
Atmel
AT93C46
Catalyst
CAT93C461
1.
Revision H is not supported. Product die revision letter is marked on top of the package as a suffix to the production data
code (e.g., AYWWH.)
SPI* EEPROMs that have been found to work satisfactorily with the 82547GI(EI) device are listed
in Table 11. SPI EEPROMs must be rated for a clock rate of at least 2 MHz.
Table 11. SPI Serial EEPROMs for 82547GI(EI) Controller
Application
16
Manufacturer
Manufacturer's Part
Number
ASF 1.0 or IPMI Pass Through
Atmel
AT25040
ASF 2.0 or IPMI Advanced Pass Through
Atmel
AT25080
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
3.3.3
EEPROM Map Information
Table 12 summarizes the EEPROM map for the 82547GI(EI) Gigabit Ethernet Controller.
Table 12. 82547GI(EI) EEPROM Memory Layout
00h
HW/SW Reserved Area
3Fh
40h
FFh
100h
19F
1A0
...
EEPROM END
Note:
3.3.4
ASF and Legacy
Manageability
Manageability
Packet Filter Data
Loadable
Manageability Firmware
Code
Full manageability provided.
Magnetics Modules for 82547GI(EI) Controller Applications
Carefully select a Gigabit magnetics module for your design. Table 13 lists suggested integrated
magnetics modules for use with the 82547GI(EI) device. These modules also contain integrated
USB jacks. A good quality Gigabit Ethernet controller can also be used with the 82562EZ(EX)
PLC device.
Note:
These components are pin-compatible with the magnetics modules shown in Table 9 for the
82562EZ(EX) Platform LAN Connect device.
Table 13. 82547GI(EI) Recommended Magnetics Modules
Manufacturer
3.3.5
Manufacturer's Part Number
Pulse
JW0A2P019D
Others
TBD
Power Supplies for the 82547GI(EI) Device
The 82547GI(EI) controller requires three power supplies. The 1.2 V supply must provide
approximately 550 mA current. The 1.8 V supply must provide approximately 230 mA current.
The 3.3 V supply must provide only 5 mA current.
A central power supply can provide all the required voltage sources, or the power can be derived
and regulated locally near the Ethernet control circuitry. Keep in mind that all voltage sources must
remain present during powerdown in order to use the 82547GI(EI) Ethernet controller's LAN wake
up capability. This consideration makes it more likely that at least some of the voltage sources will
be local.
17
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Instead of using external regulators to supply 1.2 V and 1.8 V, the designer can use power
transistors in conjunction with on-chip regulation circuitry. See the reference schematic for an
implementation example.
The 82547GI(EI) controller has a LAN_PWR_GOOD input. Treat this signal as an external device
reset which works in conjunction with the internal power-on reset circuitry. In the situation where a
central power supply furnishes all the voltage sources, LAN_PWR_GOOD can possibly be tied to
the POWER_GOOD output of the power supply. Designs that generate some of the voltages
locally can connect LAN_PWR_GOOD to a power monitor chip. Ensure that the system drives
LAN_PWR_GOOD inactive for at least 80 ms after power-up.
The power sources are all expected to ramp up during a brief power-up interval (approximately 20
ms.) with LAN_PWR_GOOD de-asserted. Do not leave the 82547GI(EI) controller in a prolonged
state where some, but not all, voltages are applied.
3.3.6
82547GI(EI) Controller Power Supply Filtering
Provide several bypass capacitors for each power rail, selecting values in the range of 0.01µF to
0.01 µF. If possible, orient the capacitors close to the device and adjacent to power pads.
Decoupling capacitors should connect to the power planes with short, thick (15 mils - 0.4mm or
more) traces and 14 mil (0.35 mm) vias.
Furnish approximately 20 µF of bulk capacitance for each of the main 1.2 V and 1.8 V levels. A
convenient way to do this is to use about two 10 µF capacitors, placing them as close to the device
power connections as possible.
3.3.7
82547GI(EI) Controller Power Management and Wake Up
The 82547GI(EI) Gigabit Ethernet Controller supports low power operation as defined in the PCI
Bus Power Management Specification. There are two defined power states, D0 and D3. The D0
state provides full power operation and is divided into two sub-states: D0u (uninitialized) and D0a
(active). The D3 state provides low power operation and is also divided into two sub-states: D3hot
and D3cold.
To enter the low power state, the software driver must stop data transmission and reception. Either
the operating system or the driver must program the Power Management Control/Status Register
(PMCSR) and the Wakeup Control Register (WUC). If wakeup is desired, the appropriate wakeup
LAN address filters must also be set. The initial power management settings are specified by
EEPROM bits.
When the 82547GI(EI) controller transitions to either of the D3 low power states, the 1.2 V, 1.8 V,
and 3.3 V sources must continue to be supplied to the device. Otherwise, it will not be possible to
use a wakeup mechanism. The AUX_POWER signal is a logic input to the 82547GI(EI) controller
that denotes auxiliary power is available. If AUX_POWER is asserted, the 82547GI(EI) device
will advertise that it supports wake up from a D3cold state.
The 82547GI(EI) device supports both Advanced Power Management (APM) wakeup and
Advanced Configuration and Power Interface (ACPI) wakeup. APM wakeup has also been known
in the past as “Wake on LAN”.
Wakeup uses the PME# signal to wake the system up. PME# is an active low signal connected to a
GPIO port on the ICH5 that goes active in response to receiving a “Magic Packet”, a network
wakeup packet, or link status change indication. PME# remains asserted until it is disabled through
the Power Management Control/Status Register.
18
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
3.3.8
82547GI(EI) Device Test Capability
The 82547GI(EI) Gigabit Ethernet Controller contains a test access port conforming to the IEEE
1149.1a-1994 (JTAG) Boundary Scan specification. To use the test access port, connect these balls
to pads accessible by your test equipment. Be sure to connect the TRST# input to ground through a
pull-down resistor (approximately 1k value) so that the test capability cannot be invoked by
mistake.
A BSDL (Boundary Scan Definition Language) file describing the 82547GI(EI) device is available
for use in your test environment.
The controller also contains an XOR test tree mechanism for simple board tests. Details of XOR
tree operation may be obtained through your Intel representative.
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Note:
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.0
Ethernet Component Layout Guidelines
These sections provide recommendations for performing printed circuit board layouts. Good layout
practices are essential to meet IEEE PHY conformance specifications and EMI regulatory
requirements.
4.1
General Layout Considerations for Ethernet Controllers
Critical signal traces should be kept as short as possible to decrease the likelihood of being affected
by high frequency noise from other signals, including noise carried on power and ground planes.
Keeping the traces as short as possible can also reduce capacitive loading.
Since the transmission line medium extends onto the printed circuit board, special attention must
be paid to layout and routing of the differential signal pairs.
Designing for Gigabit operation is very similar to designing for 10 and 100 Mbps. For the
82547GI(EI) Gigabit Ethernet controller, system level tests should be performed at all three speeds.
4.1.1
Guidelines for Component Placement
Component placement can affect signal quality, emissions, and component operating temperature.
This section provides guidelines for component placement.
Careful component placement can:
• Decrease potential problems directly related to electromagnetic interference (EMI), which
could cause failure to meet applicable government test specifications.
• Simplify the task of routing traces. To some extent, component orientation will affect the
complexity of trace routing. The overall objective is to minimize turns and crossovers between
traces.
Minimizing the amount of space needed for the Ethernet LAN interface is important because other
interfaces will compete for physical space on a motherboard near the connector. The Ethernet LAN
circuits need to be as close as possible to the connector (see Figure 5).
21
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Keep silicon traces at least 1 inch from
edge of PCB (2 inches preferred)
Integrated
RJ-45
w/LAN
Magnetics
Keep LAN silicon 1 to 4 inches from LAN connector
LAN
Silicon
Keep 100 mil minimum distance between TX
and RX traces (300 mils is preferred)
Figure 5. General Placement Distances
Figure 5 shows some basic placement distance guidelines. The figure shows two differential pairs,
but can be generalized for a Gigabit system with four analog pairs. The ideal placement for the
Ethernet silicon would be approximately one inch behind the magnetics module.
While it is generally a good idea to minimize lengths and distances, this figure also illustrates the
need to keep the LAN silicon away from the edge of the board and the magnetics module for best
EMI performance.
4.1.2
Crystals
Crystals should not be placed near I/O ports or board edges. Radiation from these devices may be
coupled onto the I/O ports or out of the system chassis. Crystals should also be kept away from the
Ethernet magnetics module to prevent interference. Traces should be referenced to a continuous
low impedance plane.
Place the crystal and load capacitors on the printed circuit boards as close to the Ethernet
component as possible, within 0.75 inch. Keep other potentially noisy traces away from the crystal
traces.
4.1.3
Board Stack Up Recommendations
Printed circuit boards for these designs typically have four, six, eight, or more layers. Here is a
description of a typical six-layer board stackup:
• Layer 1 is a signal layer. It can contain the differential analog pairs from the Ethernet device to
the magnetics module.
• Layer 2 is a signal ground layer. Chassis ground may also be fabricated in Layer 2 under the
connector side of the magnetics module.
22
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
• Layer 3 is used for power planes.
• Layer 4 is a signal layer. For Gigabit designs, it is common to route two of the differential pairs
on this layer.
This board stack up configuration can be adjusted to conform to your company's design rules.
4.1.4
Differential Pair Trace Routing
Trace routing considerations are important to minimize the effects of crosstalk and propagation
delays on sections of the board where high-speed signals exist. Signal traces should be kept as short
as possible to decrease interference from other signals, including those propagated through power
and ground planes. Observe the following suggestions to help optimize board performance:
• Maintain constant symmetry and spacing between the traces within a differential pair.
• Keep the signal trace lengths of a differential pair equal to each other.
• Keep the total length of each differential pair under four inches. Designs with differential
traces longer than 5 inches are much more likely to have degraded receive Bit Error Rate
(BER) performance, IEEE PHY conformance failures, and/or excessive Electromagnetic
Interference (EMI) radiation
• Do not route the transmit differential traces closer than 100 mils to the receive differential
traces.
• Do not route any other signal traces both parallel to the differential traces, and closer than 100
mils to the differential traces (300 mils is recommended).
• Keep maximum separation within differential pairs to seven mils.
• For high-speed signals, the number of corners and vias should be kept to a minimum. If a 90°
bend is required, it is recommended to use two 45° bends instead. See Figure 6.
• Traces should be routed away from board edges by a distance greater than the trace height
above the ground plane. This allows the field around the trace to couple more easily to the
ground plane rather than to adjacent wires or boards.
• Do not route traces and vias under crystals or oscillators. This will prevent coupling to or from
the clock. And as a general rule, place traces from clocks and drives at a minimum distance
from apertures by a distance that is greater than the largest aperture dimension.
45°
45°
Figure 6. Trace Routing
23
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
• The reference plane for the differential pairs should be continuous and low impedance. It is
recommended that the reference plane be either ground or 1.8 V (the voltage used by the
PHY). This provides an adequate return path for and high frequency noise currents.
• Do not route differential pairs over splits in the associated reference plane.
• Differential termination components should be placed as close as possible to the LAN silicon.
4.1.5
Signal Trace Geometry
The key factors in controlling trace EMI radiation are the trace length and the ratio of trace-width
to trace-height above the ground plane. To minimize trace inductance, high-speed signals and
signal layers that are close to a ground or power plane should be as short and wide as practical.
Ideally, this trace width to height above the ground plane ratio is between 1:1 and 3:1. To maintain
trace impedance, the width of the trace should be modified when changing from one board layer to
another if the two layers are not equidistant from the power or ground plane.
Each pair of signal should have a differential impedance of 100 Ω. +/- 20%. If a particular tool
cannot design differential traces, it is permissible to specify 55-65 Ω single-ended traces as long as
the spacing between the two traces is minimized. As an example, consider a differential trace pair
on Layer 1 that is eight mils (0.2 mm) wide and two mils (0.05 mm) thick, with a spacing of eight
mils (0.2mm). If the fiberglass layer is eight mils (0.2 mm) thick with a dielectric constant, ER, of
4.7, the calculated single-ended impedance would be approximately 61 Ω and the calculated
differential impedance would be approximately 100 Ω.
When performing a board layout, do not allow the CAD tool auto-router to route the differential
pairs without intervention. In most cases, the differential pairs will have to be routed manually. The
components should be laid out in the following order of priority:
1. Differential traces
2. Termination resistors
3. Bypass capacitors
4. Other components
This allows placing those components in the best locations and avoids using critical space by noncritical components.
Note:
Measuring trace impedance for layout designs targeting 100 Ω often results in lower actual
impedance. Designers should verify actual trace impedance and adjust the layout accordingly. If
the actual impedance is consistently low, a target of 105 to 110 Ω should compensate for second
order effects.
It is necessary to compensate for trace-to-trace edge coupling, which can lower the differential
impedance by up to 10 Ω, when the traces within a pair are closer than 30 mils (edge to edge).
4.1.6
Trace Length and Symmetry
As indicated earlier in Section 4.1.4, the overall length of differential pairs should be less than four
inches measured from the Ethernet device to the magnetics.
The differential traces should be equal within 50 mils (1.25 mm) within each pair and as
symmetrical as possible. Asymmetrical and unequal length traces in the differential pairs
contribute to common mode noise. Common mode noise can degrade the receive circuit’s
performance and contribute to radiated emissions.
24
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.1.7
Impedance Discontinuities
Impedance discontinuities cause unwanted signal reflections. Avoid vias (signal through holes) and
other transmission line irregularities. If vias must be used, a reasonable budget is two per
differential trace. Unused pads and stub traces should also be avoided.
4.1.8
Reducing Circuit Inductance
Traces should be routed over a continuous ground plane with no interruptions. If there are vacant
areas on a ground or power plane, the signal conductors should not cross the vacant area. This
increases inductance and associated radiated noise levels. Noisy logic grounds should be separated
from analog signal grounds to reduce coupling. Noisy logic grounds can sometimes affect sensitive
DC subsystems such as analog to digital conversion, operational amplifiers, etc. All ground vias
should be connected to every ground plane; and similarly, every power via, to all power planes at
equal potential. This helps reduce circuit inductance. Another recommendation is to physically
locate grounds to minimize the loop area between a signal path and its return path. Rise and fall
times should be as slow as possible. Because signals with fast rise and fall times contain many high
frequency harmonics, which can radiate significantly. The most sensitive signal returns closest to
the chassis ground should be connected together. This will result in a smaller loop area and reduce
the likelihood of crosstalk. The effect of different configurations on the amount of crosstalk can be
studied using electronics modeling software.
4.1.9
Signal Isolation
To maintain best signal integrity, keep digital signals far away from the analog traces. A good rule
of thumb is no digital signal should be within 300 mils (7.5 mm) of the differential pairs. If digital
signals on other board layers cannot be separated by a ground plane, they should be routed at right
angles with respect to the differential pairs. If there is another LAN controller on the board, take
care to keep the differential pairs from that circuit away.
Some rules to follow for signal isolation:
• Separate and group signals by function on separate layers if possible. Maintain a gap of 100
mils between all differential pairs (Ethernet) and other nets, but group associated differential
pairs together. Note: Over the length of the trace run, each differential pair should be at least
0.3 inches away from any parallel signal traces.
• Physically group together all components associated with one clock trace to reduce trace
length and radiation.
• Isolate I/O signals from high-speed signals to minimize crosstalk, which can increase EMI
emission and susceptibility to EMI from other signals.
• Avoid routing high-speed LAN traces near other high-frequency signals associated with a
video controller, cache controller, processor, or other similar devices.
4.1.10
Power and Ground Planes
Good grounding requires minimizing inductance levels in the interconnections and keeping ground
returns short, signal loop areas small, and power inputs bypassed to signal return, will significantly
reduce EMI radiation.
25
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
The following guidelines help reduce circuit inductance in both backplanes and motherboards:
• Route traces over a continuous plane with no interruptions. Do not route over a split power or
ground plane. If there are vacant areas on a ground or power plane, avoid routing signals over
the vacant area. This will increase inductance and EMI radiation levels.
• Separate noisy digital grounds from analog grounds to reduce coupling. Noisy digital grounds
may affect sensitive DC subsystems.
• All ground vias should be connected to every ground plane; and every power via should be
connected to all power planes at equal potential. This helps reduce circuit inductance.
• Physically locate grounds between a signal path and its return. This will minimize the loop
area.
• Avoid fast rise/fall times as much as possible. Signals with fast rise and fall times contain
many high frequency harmonics, which can radiate EMI.
• The ground plane beneath the magnetics module should be split. The RJ-45 connector side of
the transformer module should have chassis ground beneath it. Split Ground Planes for
Magnetics Modules
4.1.11
Traces for Decoupling Capacitors
Traces between decoupling and I/O filter capacitors should be as short and wide as practical. Long
and thin traces are more inductive and would reduce the intended effect of decoupling capacitors.
Also for similar reasons, traces to I/O signals and signal terminations should be as short as
possible. Vias to the decoupling capacitors should be sufficiently large in diameter to decrease
series inductance.
4.1.12
Ground Planes Under the Magnetics Module
The magnetics module chassis or output ground (secondary side of transformer) should be
separated from the digital or input ground (primary side) by a physical separation of 100 mils
minimum. Splitting the ground planes beneath the transformer minimizes noise coupling between
the primary and secondary sides of the transformer and between the adjacent coils in the magnetics.
This arrangement also improves the common mode choke functionality of magnetics module.
Table 7 illustrates the split plane layout for a discrete magnetics module. Capacitors are used to
interconnect chassis ground and signal ground.
.
0.10 Inches Minimum Spacing
Magnetics Module
Void or Separate
Ground Plane
Separate Chassis Ground Plane
Gnd_Plane_Sep
Figure 7. Ground Plane Separation
26
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Figure 8 below shows the preferred method for implementing a ground split under an integrated
magnetics module/RJ-45 connector. The capacitor stuffing options (C1 – C6) are used to reduce/
filter high frequency emissions. The value(s) of the capacitor stuffing options may be different for
each board. Experiments will need to be performed to determine which value(s) provide best EMI
performance.
Board Edge
RJ/Mag.
Chassis
GND
RJ Shield
connected to
Chassis
GND
Capacitor
Stuffing
Options
C1
C2
Capacitor
Stuffing
Options
C3
C4
C5
C6
Digital
GND
Resistive
Terminations
Figure 8. Ideal Ground Split Implementation
The table below gives some starting values for these capacitors.
Capacitors
Value
C3, C4
4.7µF or 10 µF
C1, C2, C5, C6
470 pF to 0.1 µF
The placement of C1 – C6 may also be different for each board design (i.e., not all of the capacitors
may need to be populated). Also, the capacitors may not be needed on both sides of the magnetic
module.
27
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.1.13
Special Considerations for Non-Integrated Magnetics Modules and
RJ-45 Connectors
It is possible to employ discrete (non-integrated) magnetics modules and RJ-45 connectors. Similar
rules will apply to design and layout. The differential pairs should be routed to be as short and
symmetrical as possible and the overall lengths of the differential pairs (including the width of the
magnetics module) should not exceed approximately four inches.
Additional design and layout steps will be required to add a dedicated board termination plane
parallel to chassis ground, 75 Ω termination resistors, and a 1500 pF capacitor. This “Bob Smith”
termination scheme is normally contained inside an integrated magnetics module.
In Ethernet designs, it is common practice to terminate unused connections on the RJ-45 connector
and the magnetics module to ground. Depending on overall shielding and grounding design, this
may be done to the chassis ground, signal ground, or a termination plane. Care must be taken when
using various grounding methods to insure that emission requirements are met. In the “Bob Smith”
termination method, a floating termination plane is cut out of a power plane layer. This floating
plane acts as a plate of a capacitor with an adjacent ground plane. The signals can be routed
through 75 Ω resistors to the plane. Stray energy on unused pins is then carried to the plane.
It is recommended that the termination plane capacitance equal a minimum value of 1500 pF. This
helps reduce the amount of crosstalk on the differential pairs from the unused pairs of the RJ-45
connector. Pads may be placed for an additional capacitance to chassis ground, which may be
required if the termination plane capacitance is not large enough to pass EFT (Electrical Fast
Transient) testing. If a discrete capacitor is used, to meet the EFT requirements it should be rated
for at least 1000 Vac.
TDP
N/C
TDN
RDP
RJ-45
RDN
Magnetics module
Termination plane
Additional capacitance that may be
required for EFT testing
LAN_term_plane
Figure 9. Termination Plane Example for 82562EZ(EX) PLC Device and Discrete Magnetics
28
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.2
Layout for the 82562EZ(EX) Platform LAN Connect Device
This section provides layout guidelines specific to the 82562EZ(EX) PLC device.
4.2.1
Termination Resistors for Designs Based on 82562EZ(EX) PLC
Device
Two differential pairs are terminated using 54.9 Ω (1% tolerance) resistors, placed near the LAN
controller. One resistor connects to the MDI+ (MDI positive) signal trace and another resistor
connects to the MDI- (MDI negative) signal trace (see Figure 10).
Termination resistor values were recently increased from 49.9 Ω to 54.9 Ω to improve return loss.
However, on some designs, this change caused the PCB’s output amplitude to be slightly above the
peak-to-peak center of the IEEE specification. As a result, RBIAS resistor values were increased
(RBIAS10 549 to 619 Ω and RBIAS100 619 to 649 Ω) to reduce the PCB’s output amplitude to
better meet the IEEE peak-to-peak center specification.
For 100Base-TX designs, the IEEE specification allows a -950 mVpk to -1050 mVpk for the
negative peak and +950 mVpk to +1050 mVpk for the positive peak. Ideally, a typical PCB output
amplitude should be within -975 mVpk to -1025 mVpk for the negative peak and +975 mVpk to
+1025 mVpk for the positive peak.
For 10Base-T designs, the IEEE specification allows a -2.2 mVpk to -2.8 mVpk for the negative
peak and +2.2 mVpk to +2.8 mVpk for the positive peak. Ideally, a typical PCB output amplitude
should be within -2.35 mVpk to -2.55 mVpk for the negative peak and +2.35 mVpk to +2.55 mVpk
for the positive peak.
The RBIAS values previously listed should be considered starting values. Intel recommends that
board designers measure each of their PCB’s output amplitude and then adjust the RBIAS values as
required.
Intel ®
ICH5
LAN Connect Interface
Intel
LAN
device
Magnetics
RJ45
Module
Place termination resistors as close to the Intel LAN device as possible.
Figure 10. 82562EZ(EX) PLC Device Differential Signal Termination
4.2.2
Light Emitting Diodes for Designs Based on 82562EZ(EX) PLC Device
The 82562EZ(EX) PLC device has three high-current outputs to directly drive LEDs for link,
activity and speed indication. Since LEDs are likely to be integral to a magnetics module, take care
to route the LED traces away from potential sources of EMI noise. In some cases, it may be
desirable to attach filter capacitors.
29
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.3
Layout for the 82547GI(EI) Gigabit Ethernet Controller
4.3.1
Termination Resistors for Designs Based on 82547GI(EI) Gigabit
Ethernet Controller
The four differential pairs are terminated with 49.9 Ω (1% tolerance) resistors, placed near the
82547GI(EI) controller. One resistor connects to the MDI+ signal trace and another resistor
connects to the MDI- signal trace. The opposite ends of the resistors connect together and to
ground through a single 0.1 µF capacitor. The capacitor should be placed as close as possible to the
49.9 Ω resistors, using a wide trace.
Do not vary the suggested component values. Be sure to lay out symmetrical pads and traces for
these components such that the length and symmetry of the differential pairs are not disturbed.
4.3.2
Light Emitting Diodes for Designs Based on 82547GI(EI) Controller
The 82547GI(EI) controller provides four programmable high-current outputs to directly drive
LEDs for link activity and speed indication. Since the LEDs are likely to be integral to a magnetics
module, take care with care to route the LED traces away from potential sources of EMI noise. In
some cases, it may be desirable to attach filter capacitors.
4.4
Physical Layer Conformance Testing
Physical layer conformance testing (also known as IEEE testing) is a fundamental capability for all
companies with Ethernet LAN products. PHY testing is the final determination that a layout has
been performed successfully. If your company does not have the resources and equipment to
perform these tests, consider contracting the tests to an outside facility.
Crucial tests are as follows, listed in priority order:
• Bit Error Rate (BER). Good indicator of real world network performance. Perform bit error
rate testing with long and short cables and many link partners. The test limit is 10-11 errors.
• Output Amplitude, Rise and Fall Time (10/100 Mbps), Symmetry and Droop (1000 Mbps).
For the 82547GI(EI) controller, use the appropriate PHY test waveform.
• Return Loss. Indicator of proper impedance matching, measured through the RJ-45 connector
back toward the magnetics module.
• Jitter Test (10/100 Mbps) or Unfiltered Jitter Test (1000 Mbps). Indicator of clock recovery
ability (master and slave for Gigabit controller).
30
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
4.5
Troubleshooting Common Physical Layout Issues
The following is a list of common physical layer design and layout mistakes in LAN On
Motherboard Designs.
1. Unequal length of the two traces within a differential pair. Inequalities create common-mode
noise and will distort the transmit or receive waveforms.
2. Lack of symmetry between the two traces within a differential pair. Asymmetry can create
common-mode noise and distort the waveforms. For each component and/or via that one trace
encounters, the other trace should encounter the same component or a via at the same distance
from the Ethernet silicon.
3. Excessive distance between the Ethernet silicon and the magnetics. Long traces on FR4
fiberglass epoxy substrate will attenuate the analog signals. In addition, any impedance
mismatch in the traces will be aggravated if they are longer than the four inch rule.
4. Routing any other trace parallel to and close to one of the differential traces. Crosstalk getting
onto the receive channel will cause degraded long cable BER. Crosstalk getting onto the
transmit channel can cause excessive EMI emissions and can cause poor transmit BER on long
cables. At a minimum, other signals should be kept 0.3 inches from the differential traces.
5. Routing one pair of differential traces too close to another pair of differential traces. After
exiting the Ethernet silicon, the trace pairs should be kept 0.3 inches or more away from the
other trace pairs. The only possible exceptions are in the vicinities where the traces enter or
exit the magnetics, the RJ-45 connector, and the Ethernet silicon.
6. Use of a low quality magnetics module.
7. Re-use of an out-of-date physical layer schematic in a Ethernet silicon design. The
terminations and decoupling can be different from one PHY to another.
8. Incorrect differential trace impedances. It is important to have ~100 Ω impedance between the
two traces within a differential pair. This becomes even more important as the differential
traces become longer. To calculate differential impedance, many impedance calculators only
multiply the single-ended impedance by two. This does not take into account edge-to-edge
capacitive coupling between the two traces. When the two traces within a differential pair are
kept close to each other, the edge coupling can lower the effective differential impedance by
5 Ω to 20 Ω. Short traces will have fewer problems if the differential impedance is slightly off
target.
9. For 82562EZ(EX) PLC designs, use of capacitor that is too large between the transmit traces
and/or too much capacitance on the magnetic module's transmit center tap to ground. Using
capacitors more than a few pF in either of these locations can slow the 100 Mbps rise and fall
time. This will also cause return loss to fail at higher frequencies and will degrade the transmit
BER performance. If a capacitor is used, it should almost certainly be less than 22 pF.
31
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Note:
32
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
5.0
Design and Layout Checklists
The Design and Layout checklists are in Portable Data Format (PDF) and available to aid designers
via:
http://developer.intel.com.
33
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Note:
34
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
6.0
Ball Number to Signal Mapping with Population
Options
Table 14 lists the ball names for both devices corresponding to the shared ball number. Please note
that signal names may vary slightly from the names on the reference schematic in Section 7.0. The
schematic names follow conventions used by Intel design engineers on their design tools.
Table 14. Ball Number to Signal Mapping (Sheet 1 of 7)
Ball
Ref
82562EZ(EX)
Pin Name
82547GI(EI) Pin
Name
Signal Name
Difference?
A1
NC
NC
A2
NC
NC
A3
3.3 V
3.3 V
A4
NC
NC
X
A5
NC
NC
X
A6
NC
PME#
X
A7
3.3 V
3.3 V
82562EZ(EX)
Connection?
Pop Option
Required?
Comment
X
X
X
A8
NC
NC
X
A9
NC
LAN_PWR_GOOD
X
A10
NC
SMBCLK
X
A11
VCCT
3.3 V
A12
LILED#
LED0/LINK_UP#
X
X
X
Same signal different
name
A13
TESTEN
TEST
X
X
X
Same signal different
name
A14
NC
NC
B1
NC
NC
X
B2
NC
NC
X
B3
VSS
VSS
B4
NC
NC
X
B5
NC
NC
X
B6
NC
NC
X
B7
VSS
VSS
B8
NC
NC
X
B9
NC
RST#
X
B10
NC
SMB_ALERT#
X
X
X
X
35
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 14. Ball Number to Signal Mapping (Sheet 2 of 7) (Continued)
Ball
Ref
82562EZ(EX)
Pin Name
82547GI(EI) Pin
Name
Signal Name
Difference?
82562EZ(EX)
Connection?
Pop Option
Required?
B11
SPDLED#
LED2/LINK100#
X
X
X
B12
TOUT
LED3/LINK1000#
X
X
X
Comment
Same signal different
name
82562EZ: NC
82547GI(EI): LED
B13
RBIAS100
CTRL18
X
X
X
82562EZ: 649 ohm
external pull-down
82547GI(EI): Voltage
Transistor connection
B14
RBIAS10
IEEE_TEST+
X
X
X
82562EZ: 619 ohm
external pull-down
82547GI(EI): IEEE PHY
Test
C1
NC
NC
X
C2
NC
NC
X
C3
NC
NC
X
C4
NC
EEMODE
X
C5
NC
NC
X
C6
NC
NC
X
C7
NC
NC
X
C8
NC
NC
X
C9
NC
SMBDATA
X
C10
VSS
VSS
C11
ACTLED#
LED/ACTIVITY#
X
C12
VSS
ANALOG_VSS
C13
TDP
MDI[0]+
X
C14
TDN
MDI[0]-
X
D1
NC
NC
X
D2
NC
NC
X
D3
NC
NC
X
D4
VSS
VSS
X
X
X
X
Same signal different
name
X
X
Connected to magnetics.
X
X
Connected to magnetics.
X
X
Connected to VSS
X
Connected to VSS
X
D5
VSS
VSS
D6
VSS
VSS
D7
VSS
VSS
X
D8
VSS
VSS
X
D9
NC
NC
36
X
X
X
X
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 14. Ball Number to Signal Mapping (Sheet 3 of 7) (Continued)
Ball
Ref
D10
82562EZ(EX)
Pin Name
ISOL_EXEC
82547GI(EI) Pin
Name
NC
Signal Name
Difference?
X
82562EZ(EX)
Connection?
X
Pop Option
Required?
X
Comment
82562EZ: No Connect.
Internal Pull-Down.
82547GI(EI): No Connect.
D11
NC
1.8 V
X
D12
ISOL_TI
1.8 V
X
X
X
82562EZ: No Connect.
Internal Pull-Down.
82547GI(EI): 1.8 V.
D13
VSSA
ANALOG_VSS
D14
ISOL_TCK
IEEE_TEST-
X
X
X
X
82562EZ: No Connect.
Internal Pull-Down.
82547GI(EI): IEEE PHY
Test.
E1
VCC
3.3 V
X
E2
VSS
VSS
E3
NC
NC
X
E4
VSS
VSS
X
E5
VSS
VSS
X
E6
VSS
VSS
X
E7
VSS
VSS
X
E8
VSS
VSS
X
E9
VSS
VSS
X
X
X
X
Connected to VSS
E10
VSS
VSS
X
X
X
Connected to VSS
E11
VCCT
ANALOG_1.2V
X
X
X
3.3 V / 1.2 V Plane
E12
VCCT
ANALOG_1.2V
X
X
X
3.3 V / 1.2 V Plane
E13
RDP
MDI[1]+
X
X
X
Connected to magnetics.
E14
RDN
MDI[1]-
X
X
X
Connected to magnetics.
F1
NC
NC
X
F2
NC
NC
X
F3
NC
NC
X
F4
VSS
VSS
F5
VSS
VSS
X
Connected to VSS
F6
VSS
VSS
X
F7
VSS
VSS
X
F8
VSS
VSS
X
F9
VSS
VSS
X
F10
VSS
VSS
X
X
X
X
37
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 14. Ball Number to Signal Mapping (Sheet 4 of 7) (Continued)
Ball
Ref
82562EZ(EX)
Pin Name
82547GI(EI) Pin
Name
Signal Name
Difference?
82562EZ(EX)
Connection?
Pop Option
Required?
Comment
F11
VSS
VSS
X
F12
NC
NC
X
F13
NC
MDI[2]+
X
F14
NC
MDI[2]-
X
G1
NC
CI_CLK
X
G2
NC
CI[9]
X
G3
NC
NC
X
G4
NC
CSA_1.2V
X
G5
VCCR
1.2 V
X
X
X
3.3 V / 1.2 V Plane
G6
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
G7
VSS
VSS
X
G8
VSS
VSS
X
G9
VSS
VSS
X
G10
VSS
VSS
X
G11
VSS
VSS
G12
NC
1.8 V
X
G13
VCC
ANALOG_1.2V
X
X
3.3 V / 1.2 V Plane
G14
VSS
ANALOG_VSS
X
X
X
H1
NC
CI[10]
X
H2
NC
CSA_VSS
X
H3
NC
CI[8]
X
H4
NC
CSA_1.2V
X
H5
VCCR
1.2 V
X
X
X
3.3 V / 1.2 V Plane
H6
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
H7
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
H8
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
H9
VSS
VSS
X
H10
VSS
VSS
X
H11
3.3 V
ANALOG_1.2V
X
X
3.3 V / 1.2 V Plane
H12
NC
NC
X
H13
NC
MDI[3]+
X
H14
NC
MDI[3]-
X
J1
NC
CI[0]
X
38
X
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 14. Ball Number to Signal Mapping (Sheet 5 of 7) (Continued)
Ball
Ref
82562EZ(EX)
Pin Name
82547GI(EI) Pin
Name
Signal Name
Difference?
82562EZ(EX)
Connection?
Pop Option
Required?
Comment
J2
NC
CI[1]
X
J3
NC
CI[2]
X
J4
NC
CSA_1.2V
X
J5
VCCR
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J6
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J7
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J8
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J9
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J10
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J11
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
J12
NC
AUX_PWR
X
J13
NC
1.8 V
X
J14
X2
XTAL2
K1
NC
CI[3]
X
X
K2
VSS
CSA_VSS
X
K3
VCC
3.3 V
X
K4
VCC
3.3 V
X
X
X
Connected to 3.3 V
K5
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K6
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K7
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K8
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K9
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K10
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K11
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
K12
VSS
ANALOG_VSS
X
K13
VCC
3.3 V
X
K14
X1
XTAL1
L1
NC
CI_STRS
X
L2
NC
CI_STRF
X
L3
NC
CI[4]
X
L4
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
L5
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
L6
VSS
VSS
X
X
X
Connected to VSS
X
39
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 14. Ball Number to Signal Mapping (Sheet 6 of 7) (Continued)
Ball
Ref
L7
82562EZ(EX)
Pin Name
ADV10
82547GI(EI) Pin
Name
NC
Signal Name
Difference?
X
82562EZ(EX)
Connection?
X
Pop Option
Required?
X
Comment
82562EZ: No Connect.
Internal Pull-Down.
82547GI(EI): No Connect.
L8
NC
NC
X
L9
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
L10
VCC
1.2 V
X
X
X
3.3 V / 1.2 V Plane
L11
VSS
VSS
L12
NC
JTAG_TMS
X
L13
JTXD[1]
JTAG_TRST#
X
X
82562EZ: ICH LAN
Connect.
X
X
82547GI(EI): JTAG
Connect.
L14
JTXD[2]
JTAG_TCK
X
X
X
82562EZ: ICH LAN
Connect.
82547GI(EI): JTAG
Connect.
M1
NC
CI[6]
X
M2
NC
CI[5]
X
M3
NC
CSA_VSS
X
M4
NC
CSA_1.2V
X
M5
NC
1.2 V
X
M6
VSS
VSS
M7
NC
NC
X
X
M8
NC
NC
X
M9
NC
FLSH_CE#
X
M10
NC
EESK
X
M11
NC
FLSH_SI
X
M12
JRXD[2]
SDP[3]
X
X
X
82562EZ: ICH LAN
Connect.
82547GI(EI): No Connect.
M13
JRSTSYNC
JTAG_TDI
X
X
X
82562EZ: ICH LAN
Connect.
82547GI(EI): JTAG
Connect.
M14
JTXD[0]
JTAG_TDO
X
X
X
82562EZ: ICH LAN
Connect.
82547GI(EI): JTAG
Connect.
N1
40
VSS
CSA_VSS
X
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Table 14. Ball Number to Signal Mapping (Sheet 7 of 7) (Continued)
Ball
Ref
82562EZ(EX)
Pin Name
82547GI(EI) Pin
Name
Signal Name
Difference?
N2
NC
CI[7]
X
N3
NC
CI_RCOMP
X
N4
NC
CI_VREF
X
N5
NC
1.2 V
X
N6
VCC
3.3 V
N7
NC
NC
82562EZ(EX)
Connection?
Pop Option
Required?
Comment
X
X
N8
VCC
3.3 V
N9
NC
FLSH_SCK
X
X
N10
NC
EEDO
X
N11
NC
NC
X
N12
VSSP
VSS
N13
JRXD[1]
SDP[2]
X
X
X
X
N14
JCLK
SDP[0]
X
X
X
P1
NC
NC
P2
VCC
3.3 V
P3
NC
CI_SWING
X
P4
NC
NC
X
P5
NC
NC
X
P6
NC
NC
X
P7
NC
EECS
X
82562EZ: ICH LAN
Connect.
82547GI(EI): No Connect.
82562EZ: ICH LAN
Connect.
82547GI(EI): No Connect.
X
P8
VSS
VSS
P9
NC
FLSH_SO/
LAN_DISABLE#
X
X
P10
NC
EEDI
X
P11
NC
CTRL12
X
P12
3.3 V
3.3 V
P13
JRXD[0]
SDP[1]
X
X
X
X
82562EZ: ICH LAN
Connect.
82547GI(EI): No Connect.
P14
NC
NC
41
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Note:
42
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
7.0
Dual Footprint Reference Schematic
The following pages illustrate a dual purpose 10/100 and 10/100/1000 design using the
82562EZ(EX) Platform LAN Connect device and the 82547GI(EI) Gigabit Ethernet Controller.
43
44
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
45
46
Place these
capacitors
close to the
divider
network.
Place these capacitors
close to their respective
pins of the 82547GI(EI).
Reserved Pins
Reserved Pins
2 of 2
82562EZ/EX Signal Name - 82547GI/EI Signal Name
Pin Name Decode =
1mm Pitch
15mm x 15mm BGA
10/100/1000 Mbps
Ethernet Controller
with
Communications Streaming
Architecture
(CSA)
82562EZ/EX - 82547GI/EI
R
82562EZ/EX - 82547GI/EI
Ref. Design
Intel
Install only for special debug or testing purposes
Install this component only when using the 82562EZ/EX Controller
B
D/T
Install this component only when using the 82547GI/EI Controller
A
Internal PHY clock
test point. IEEE
conformance testing.
Place this capacitor
close to it's respective
pin of the 82547GI(EI).
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
VDD Pins
VSS Pins
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
47
48
VCC3_3 Supply Note:
Linear Regulators:
Stuff only for 82547GI(EI)
Install only for special debug or testing purposes
Install this component only when using the 82562EZ/EX Controller
D/T
Install this component only when using the 82547GI/EI Controller
B
This LAN_DISABLE circuit is
for the 82562EZ(EX) only.
R
82562EZ/EX - 82547GI/EI
Ref. Design
Intel
Note: For the 82562EZ(EX) the BIOS must delay driving
LAN_RST# for 20ms after resetting the ICH.
Use the AND gate shown if this timing is not
already accounted for in your design.
Bypass Caps for 1.2V COREVDD
Place Close To LAN silicon
A
RSM_RST# should not be asserted
until 50 ms after the LAN power rails
are stable.
Choose Super IO pin that
defaults to input on power up and is
powered from the Resume (AUX) well
If Alerting is supported, VCC3_3 is sourced from either PCI_AUX_3.3v or the planar 3.3v_STBY.
Otherwise VCC3_3 can be sourced from a non-standby 3.3v power rail.
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
49
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Note:
50
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82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Appendix A Measuring LAN Reference Frequency Using a
Frequency Counter
A.1
Background
To comply with IEEE specifications for 10/100 Mbps and 10/100/1000Base-T Ethernet LAN, the
transmitter reference frequency must be correct and accurate within ±50 parts per million (ppm).
Note:
Intel recommends a frequency tolerance of ±30 (ppm).
Most Intel LAN devices will operate properly with a 25.000 MHz reference crystal, provided it
meets the recommended requirements for frequency stability, equivalent series resistance at
resonance (ESR), and load capacitance.
Most circuits for series resonant crystals include two discrete capacitors (typically C1 and C2),
with values between 5 pF and 36 pF.
The most accurate way to determine the appropriate value for the discrete capacitors is to install the
approximately correct values for C1 and C2. Next, a frequency counter should be used to measure
the transmitter reference frequency (or transmitter reference clock).
• If the transmitter reference frequency is more than 20 ppm below the target frequency, then the
values for C1 and C2 are too big and should be decreased.
• If the transmitter reference frequency is more than 20 ppm above the target frequency, then the
values for C1 and C2 are too small and should be increased.
This Appendix provides instructions and illustrations that explain how to use a frequency counter
and probe to determine the Ethernet LAN device transmit center frequency. An example describing
how to calculate the frequency accuracy of the measured and averaged center frequency with
respect to the target center frequency is also included.
A.2
Required Test Equipment
•
•
•
•
•
Tektronix CMC-251, or similar high resolution, digital counter
Tektronix P6246, or similar high bandwidth, low capacitance (less than 1 pF) probe
Tektronix 1103, or similar probe power supply or probe amplifier
BNC, 50-ohm coaxial cable (less than 6 feet long)
System with power supply and test software for the LAN circuit to be tested
51
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
A.3
Indirect Probing Method
The indirect probing test method is applicable foremost devices that support 100BASE-T. Since
probe capacitance can load the reference crystal and affect the measured frequency, the preferred
method is to use the indirect probing test method when possible.
Almost all Intel LAN silicon that support 1000BASE-T Ethernet can provide a buffered 125 MHz
clock, which can be used for indirect probing of the transmitter reference clock. The buffered 125
MHz clock will be a 5X multiple of the crystal circuit’s reference frequency (Figure 11).
Different LAN devices may require different register settings, to enable the buffered 125 MHz
reference frequency. Please obtain the settings or instructions that are appropriate for the LAN
controller you are using.
LAN Silicon IEEE Test Out +
2-pin
header
P6246 or similar
high impedance
probe
with less than 1 pF
input
Ch.1
input
Ch.2
LAN Silicon IEEE Test Out -
Tektronix
1103
Probe
Power Supply
50 ohm Coaxial
Cable
50 ohm
input
125.00047
Tektronix CMC251
or a similar capability
Frequency Counter
Figure 11. Indirect Probing Setup
52
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
A.4
Indirect Frequency Measurement and Frequency Accuracy
Calculation Steps
1. Make sure the system BIOS has the LAN controller enabled.
2. Connect the test equipment as shown in Figure 11.
3. Using the appropriate controls for your model of high resolution digital counter, make sure it
can display ~125.0000 MHz with at least four decimal places frequency resolution.
4. Enable the 125 MHz buffered reference clock. An example can be found in Appendix B,
“GigConf.exe Register Settings for 82547GI(EI) Devices”.
5. Determine the center reference frequency as accurately as possible. This can be done by taking
30 to 50 different readings using the frequency counter and then calculating the average results
of the readings.
6. Calculate the accuracy of the measured and averaged center frequency with respect to an ideal
125.0000 MHz reference frequency.
(x – y)
FrequencyAccuracy ( ppm ) = -------------------------------( y ⁄ 1000000 )
where
x = Average measured frequency in Hertz and
y = Ideal reference frequency in Hertz
Example 1.
Given: The measured averaged center frequency is 124.99942 MHz (or 124,999,420 Hertz).
( 124999420 – 125000000 )
FrequencyAccuracy ( ppm ) = ---------------------------------------------------------------- = – 4.64ppm
( 125000000 ⁄ 1000000 )
53
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Example 2.
Given: The measured averaged center frequency is 125.00087 MHz (or 125,000,870 Hertz).
( 125000870 – 125000000 )
FrequencyAccuracy ( ppm ) = ---------------------------------------------------------------- = 6.96ppm
( 125000000 ⁄ 1000000 )
Note:
The following items should be noted for an ideal reference crystal on a typical printed circuit
board.
• If the transmitter reference frequency is more than 8 ppm below the target frequency, then the
values for C1 and C2 are too big and they should be decreased. When tests are performed
across temperature, it may be acceptable for the center frequency deviation to be a little greater
than 8 ppm.
• If the transmitter reference frequency is more than 8 ppm above the target frequency, then the
values for C1 and C2 are too small and they should be increased. When tests are performed
across temperature, it may be acceptable for the center frequency deviation to be a little greater
than 8 ppm.
A.5
Direct Probing Test Method, Applicable for Most 10/100
Devices (Devices that do NOT support 1000Base-T)
Because probe capacitance can load the reference crystal affecting the measured frequency, it is
preferable to use a probe with less than 1 pF capacitance.
Note:
Direct probing is not recommended for the 82547GI(EI) LAN silicon.
The probe should be connected between the X2 (or Xout) pin of the LAN device and a nearby
ground. Typically, it is possible to connect the probe pins across one of the discrete load capacitors
(C2 in Figure 12).
54
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Figure 12. Direct Probing Method
A.6
Direct Frequency Measurement and Frequency Accuracy
Calculation Steps
1. Make sure the system BIOS has the LAN controller enabled.
2. Connect the test equipment as shown in Figure 12.
3. Using the appropriate controls for your model of high resolution digital counter, make sure it
can display ~25.0000 MHz with at least four decimal places frequency resolution.
4. Ensure the LAN circuits are powered.
5. Determine the center reference frequency as accurately as possible. This can be done by taking
30 to 50 different readings using the frequency counter and then calculating the average results
of the readings.
6. Calculate the accuracy of the measured and averaged center frequency with respect to an ideal
25.0000 MHz reference frequency.
55
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
(x – y)
FrequencyAccuracy ( ppm ) = -------------------------------( y ⁄ 1000000 )
where
x = Average measured frequency in Hertz and
y = Ideal reference frequency in Hertz
Example 3.
Given: The measured averaged center frequency is 24.99963 MHz (or 24,999,630 Hertz).
( 24999630 – 25000000 )
FrequencyAccuracy ( ppm ) = ---------------------------------------------------------- = – 14.8ppm
( 25000000 ⁄ 1000000 )
Example 4.
Given: The measured averaged center frequency is 25.00027 MHz (or 25,000,270 Hertz).
( 25000270 – 25000000 )
FrequencyAccuracy ( ppm ) = ---------------------------------------------------------- = 10.8ppm
( 25000000 ⁄ 1000000 )
Note:
The following items should be noted for an ideal reference crystal on a typical printed circuit
board.
• If the transmitter reference frequency is more than 8 ppm below the target frequency, then the
values for C1 and C2 are too big and they should be decreased. When tests are performed
across temperature, it may be acceptable for the center frequency deviation to be a little greater
than 8 ppm.
• If the transmitter reference frequency is more than 8 ppm above the target frequency, then the
values for C1 and C2 are too small and they should be increased. When tests are performed
across temperature, it may be acceptable for the center frequency deviation to be a little greater
than 8 ppm.
56
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
Appendix B GigConf.exe Register Settings for 82547GI(EI)
Devices
The following steps describe the indirect probing test method using GigConf.exe for 82547GI(EI)
devices.
1. Boot to DOS using a DOS Boot Diskette.
2. Launch Gigconf from the diskette (gigconf.exe).
3. Select the Intel network connection to be measured.
a. If multiple adapters are installed, use the arrow keys to navigate to highlight the selected
adapter and press Enter.
4. Select Registers by pressing “R”.
5. Select PHY Registers by pressing “P”.
6. Use the arrow keys to navigate to the value listed next to address 0000.
7. Press Enter when the value is highlighted and then use Backspace to clear out the current
value.
8. Type “0100” for the value and then press Enter.
9. Navigate to the value listed next to address 0012.
10. Press Enter to select the highlighted value and use Backspace to clear the current value.
11. Type “8000” for the value and then press Enter.
12. Navigate to the Set Address field on the right side of the screen (use the right arrow key)
13. Press Enter to select the highlighted value and then use Backspace to clear out the current
value.
14. Type “4011” for the value and then press Enter.
This changes the PHY register screen and updates it with new addresses and values.
15. Use the arrow keys to navigate to the value for address 4011.
16. Press Enter when the value is highlighted and then use Backspace to clear the current value.
17. Type “8000” for the value and then press Enter.
18. Use the right arrow key to navigate to the Set Address field on the right side of the screen.
19. Press Enter when the value is highlighted and use Backspace to clear the current value.
20. Enter “2F5B” (capital letters are not required) for the address and then press Enter.
21. Use the arrow keys to navigate to the value for address “2F5B”.
22. Press Enter when the value is highlighted and then use Backspace to clear the current value.
23. Type “0003” for the value and then press Enter.
24. Use the right arrow key to navigate to the Set Address field on the right side of the screen.
25. Press Enter when the value is highlighted and then use Backspace to clear the current value.
57
82562EZ(EX)/82547GI(EI) Dual Footprint Design Guide
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