NSC ADC08L060CIMTX

ADC08L060
8-Bit, 10 MSPS to 60 MSPS, 0.65 mW/MSPS A/D Converter
with Internal Sample-and-Hold
General Description
Features
The ADC08L060 is a low-power, 8-bit, monolithic analog-todigital converter with an on-chip track-and-hold circuit. Optimized for low cost, low power, small size and ease of use, this
product operates at conversion rates of 10 MSPS to
60 MSPS while consuming just 0.65 mW per MHz of clock
frequency, or 39 mW at 60 MSPS. Raising the PD pin puts
the ADC08L060 into a Power Down mode where it consumes
about 1 mW.
The unique architecture achieves 7.6 Effective Bits. The ADC08L060 is resistant to latch-up and the outputs are shortcircuit proof. The top and bottom of the ADC08L060s
reference ladder are available for connections, enabling a
wide range of input possibilities. The digital outputs are TTL/
CMOS compatible with a separate output power supply pin to
support interfacing with 1.8V to 3V logic. The output coding is
straight binary and the digital inputs (CLK and PD) are TTL/
CMOS compatible.
The ADC08L060 is offered in a 24-lead plastic package
(TSSOP) and is specified over the industrial temperature
range of −40°C to +85°C. An evaluation board is available to
assist in the evaluation of the ADC08L060.
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Single-ended input
Internal sample-and-hold function
Low voltage (single +3V) operation
Small package
Power-down feature
Key Specifications
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Resolution
Conversion rate
DNL
INL
SNR (10.1 MHz)
ENOB (10.1 MHz)
THD (10.1 MHz)
Latency
No missing codes
Power Consumption
— Operating
— Power Down Mode
8 bits
60 MSPS
±0.25 LSB (typ)
+0.5/−0.2 LSB (typ)
48 dB (typ)
7.6 bits (typ)
−57 dB (typ)
5 Clock Cycles
Guaranteed
0.65 mW/MSPS (typ)
1.0 mW (typ)
Applications
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Digital Imaging
Set-top boxes
Portable Instrumentation
Communication Systems
X-ray imaging
Viterbi decoders
Pin Configuration
20041701
© 2008 National Semiconductor Corporation
200417
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ADC08L060 8-Bit, 10 MSPS to 60 MSPS, 0.65 mW/MSPS A/D Converter with Internal
Sample-and-Hold
January 7, 2008
ADC08L060
Ordering Information
Order Number
Temperature Range
Package
ADC08L060CIMT
−40°C ≤ TA ≤ +85°C
TSSOP
ADC08L060CIMTX
−40°C ≤ TA ≤ +85°C
TSSOP (tape and reel)
ADC08L060EVAL
Evaluation Board
Block Diagram
20041702
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2
ADC08L060
Pin Descriptions and Equivalent Circuits
Pin No.
Symbol
Equivalent Circuit
Description
6
VIN
Analog signal input. Conversion range is VRB to VRT.
3
VRT
Analog Input that is the high (top) side of the reference ladder
of the ADC. Nominal range is 0.5V to VA. Voltage on VRT and
VRB inputs define the VIN conversion range. Bypass well. See
Section 2.0 for more information.
9
VRM
Mid-point of the reference ladder. This pin should be
bypassed to a quiet point in the analog ground plane with a
0.1 µF capacitor.
10
VRB
Analog Input that is the low side (bottom) of the reference
ladder of the ADC. Nominal range is 0.0V to (VRT – 0.5V).
Voltage on VRT and VRB inputs define the VIN conversion
range. Bypass well. See Section 2.0 for more information.
23
PD
Power Down input. When this pin is high, the converter is in
the Power Down mode and the data output pins hold the last
conversion result.
24
CLK
CMOS/TTL compatible digital clock Input. VIN is sampled on
the rising edge of CLK input.
13 thru 16
and
19 thru 22
D0–D7
Conversion data digital Output pins. D0 is the LSB, D7 is the
MSB. Valid data is output after the rising edge of the CLK
input.
7
VIN GND
Reference ground for the single-ended analog input, VIN.
1, 4, 12
VA
Positive analog supply pin. Connect to a quiet voltage source
of +3V. VA should be bypassed with a 0.1 µF ceramic chip
capacitor for each pin, plus one 10 µF capacitor. See Section
3.0 for more information.
18
VDR
Power supply for the output drivers. If connected to VA,
decouple well from VA.
17
DR GND
2, 5, 8, 11
AGND
The ground return for the output driver supply.
The ground return for the analog supply.
3
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ADC08L060
Absolute Maximum Ratings
Operating Ratings
(Notes 1, 2)
−40°C ≤ TA ≤ +85°C
(Notes 1, 2)
Operating Temperature Range
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage, VA
Driver Supply Voltage, VDR
Output Driver Voltage, VDR
Ground Difference |GND − DR GND|
Upper Reference Voltage (VRT)
Lower Reference Voltage (VRB)
VIN Voltage Range
Supply Voltage (VA)
Driver Supply Voltage (VDR)
Voltage on Any Input or Output Pin
Reference Voltage (VRT, VRB)
CLK, PD Voltage Range
Input Current at Any Pin (Note 3)
Package Input Current (Note 3)
Power Dissipation at TA = 25°C
ESD Susceptibility (Note 5)
Human Body Model
Machine Model
Soldering Temperature, Infrared,
10 seconds (Note 6)
Storage Temperature
3.8V
VA +0.3V
−0.3V to VA
VA to AGND
−0.05V to
(VA + 0.05V)
±25 mA
±50 mA
See (Note 4)
+2.4V to +3.6V
+2.4V to VA
1.8V to VA
0V to 300 mV
0.5V to (VA −0.3V)
0V to (VRT −0.5V)
VRB to VRT
Package Thermal Resistance
Package
θJA
24-Lead TSSOP
92°C/W
2500V
200V
235°C
−65°C to +150°C
Converter Electrical Characteristics
The following specifications apply for VA = VDR = +3.0VDC, VRT = +1.9V, VRB = 0.3V, CL = 10 pF, fCLK = 60 MHz at 50% duty cycle.
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C (Notes 7, 8)
Symbol
Parameter
Conditions
Typical
(Note 9)
Limits
(Note 9)
Units
(Limits)
DC ACCURACY
INL
Integral Non-Linearity
+0.5
−0.2
+1.9
−1.35
LSB (max)
LSB (min)
DNL
Differential Non-Linearity
±0.25
±0.90
LSB (max)
0
(max)
FSE
Missing Codes
Full Scale Error
3.0
±13
mV (max)
VOFF
Zero Scale Offset Error
19
27
mV (max)
ANALOG INPUT AND REFERENCE CHARACTERISTICS
VRB
V (min)
VRT
V (max)
VIN
Input Voltage
CIN
VIN Input Capacitance
RIN
RIN Input Resistance
>1
MΩ
BW
Full Power Bandwidth
270
MHz
VRT
Top Reference Voltage
1.9
VRB
1.6
VIN = 0.75V +0.5 Vrms
Bottom Reference Voltage
(CLK LOW)
3
pF
(CLK HIGH)
4
pF
0.3
VRT - VRB Reference Delta
1.6
RREF
Reference Ladder Resistance
VRT to VRB
720
Iref
Reference Ladder Current
VRT to VRB
2.2
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4
VA
V (max)
0.5
V (min)
VRT − 0.5
V (max)
0
V (min)
2.3
V (max)
1.0
V (min)
590
Ω (min)
1070
Ω (max)
1.5
mA (min)
2.7
mA (max)
Parameter
Conditions
Typical
(Note 9)
Limits
(Note 9)
Units
(Limits)
CLK, PD DIGITAL INPUT CHARACTERISTICS
VIH
Logical High Input Voltage
VDR = VA = 3.6V
2.0
V (min)
VIL
Logical Low Input Voltage
VDR = VA = 2.7V
0.8
V (max)
IIH
Logical High Input Current
VIH = VDR = VA = 3.6V
10
nA
IIL
Logical Low Input Current
VIL = 0V, VDR = VA = 2.7V
−50
nA
CIN
Logic Input Capacitance
3
pF
DIGITAL OUTPUT CHARACTERISTICS
VOH
High Level Output Voltage
VA = VDR = 2.7V, IOH = −400 µA
2.6
2.4
V (min)
VOL
Low Level Output Voltage
VA = VDR = 2.7V, IOL = 1.0 mA
0.4
0.5
V (max)
fIN = 10.1 MHz, VIN = FS − 0.25 dB
7.6
6.9
Bits (min)
fIN = 29 MHz, VIN = FS − 0.25 dB
7.4
fIN = 10.1 MHz, VIN = FS − 0.25 dB
47.4
fIN = 29 MHz, VIN = FS − 0.25 dB
46.1
DYNAMIC PERFORMANCE
ENOB
Effective Number of Bits
SINAD
Signal-to-Noise & Distortion
SNR
Signal-to-Noise Ratio
SFDR
Spurious Free Dynamic Range
THD
Total Harmonic Distortion
HD2
2nd Harmonic Distortion
HD3
3rd Harmonic Distortion
IMD
Intermodulation Distortion
fIN = 10.1 MHz, VIN = FS − 0.25 dB
48
Bits
43.3
dB (min)
dB
44.5
dB (min)
fIN = 29 MHz, VIN = FS − 0.25 dB
47.2
dB
fIN = 10.1 MHz, VIN = FS − 0.25 dB
59.1
dBc
fIN = 29 MHz, VIN = FS − 0.25 dB
54.5
dBc
fIN = 10.1 MHz, VIN = FS − 0.25 dB
−56.9
dBc
fIN = 29 MHz, VIN = FS − 0.25 dB
−53.3
dBc
fIN = 10.1 MHz, VIN = FS − 0.25 dB
-61.1
dBc
fIN = 29 MHz, VIN = FS − 0.25 dB
−54.9
dBc
fIN = 10.1 MHz, VIN = FS − 0.25 dB
−64.2
dBc
fIN = 29 MHz, VIN = FS − 0.25 dB
−63.1
dBc
f1 = 11 MHz, VIN = FS − 6.25 dB
f2 = 12 MHz, VIN = FS − 6.25 dB
−55
dBc
DC Input
13
fIN = 10 MHz, VIN = FS − 3 dB
14
POWER SUPPLY CHARACTERISTICS
IA
DRID
Analog Supply Current
Output Driver Supply Current
IA + DRID Total Operating Current
PC
Power Consumption
DC Input
0.04
fIN = 10 MHz, VIN = FS − 3 dB
4.2
DC Input
13
fIN = 10 MHz, VIN = FS − 3 dB, PD = Low
18.2
CLK Low, PD = Hi
0.33
15.9
mA (max)
0.2
mA (max)
16.1
mA (max)
mA
mA
mA
mA
DC Input
39
fIN = 10 MHz, VIN = FS − 3 dB, PD = Low
53
mW
CLK Low, PD = Hi
1
mW
−51
dB
45
dB
PSRR1
Power Supply Rejection Ratio
FSE change with 2.7V to 3.3V change in
VA
PSRR2
Power Supply Rejection Ratio
SNR reduction with 200 mV at 1MHz on
supply
5
48.3
mW (max)
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ADC08L060
Symbol
ADC08L060
Symbol
Parameter
Conditions
Typical
(Note 9)
Limits
(Note 9)
Units
(Limits)
60
MHz (min)
AC ELECTRICAL CHARACTERISTICS
fC1
Maximum Conversion Rate
80
fC2
Minimum Conversion Rate
10
MHz
tCL
Minimum Clock Low Time
0.62
ns (min)
tCH
Minimum Clock High Time
0.62
ns (min)
DC
Clock Duty Cycle
5
95
%(min)
%(max)
tOH
Output Hold Time
CLK to Data Invalid
5.2
ns
tOD
Output Delay
CLK to Data Transition
7.1
Pipeline Delay (Latency)
tAD
Sampling (Aperture) Delay
tAJ
Aperture Jitter
5
CLK Rise to Acquisition of Data
5.0
ns (min)
9.4
ns (max)
Clock Cycles
2.6
ns
2
ps rms
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND = AGND = DR GND = 0V, unless otherwise specified.
Note 3: When the input voltage at any pin exceeds the power supplies (that is, less than AGND or DR GND, or greater than VA or VDR), the current at that pin
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input
current of 25 mA to two.
Note 4: The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by TJmax, the
junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula PDMAX = (TJmax − TA) / θJA. The values
for maximum power dissipation will be reached only when this device is operated in a severe fault condition (e.g., when input or output pins are driven beyond
the power supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.
Note 5: Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through ZERO Ohms.
Note 6: See AN-450, “Surface Mounting Methods and Their Effect on Product Reliability”.
Note 7: The analog inputs are protected as shown below. Input voltage magnitudes up to VA + 300 mV or to 300 mV below GND will not damage this device.
However, errors in the A/D conversion can occur if the input goes above VDR or below GND by more than 100 mV. For example, if VA is 2.7VDC the full-scale
input voltage must be ≤2.8VDC to ensure accurate conversions.
20041707
Note 8: To guarantee accuracy, it is required that VA and VDR be well bypassed. Each supply pin must be decoupled with separate bypass capacitors.
Note 9: Typical figures are at TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to National's AOQL (Average Outgoing Quality
Level).
Note 10: IDR is the current consumed by the switching of the output drivers and is primarily determined by the load capacitance on the output pins, the supply
voltage, VDR, and the rate at which the outputs are switching (which is signal dependent), IDR = VDR (CO x fO + C1 x f1 + … + C71 x f7) where VDR is the output
driver power supply voltage, Cn is the total capacitance on any given output pin, and fn is the average frequency at which that pin is toggling.
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APERTURE (SAMPLING) DELAY is that time required after
the rise of the clock input for the sampling switch to open. The
Sample/Hold circuit effectively stops capturing the input signal and goes into the “hold” mode tAD after the clock goes
high.
APERTURE JITTER is the variation in aperture delay from
sample to sample. Aperture jitter shows up as input noise.
CLOCK DUTY CYCLE is the ratio of the time that the clock
wave form is at a logic high to the total time of one clock period.
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
Measured at 60 MSPS with a ramp input.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
Distortion Ratio, or SINAD. ENOB is defined as (SINAD –
1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits.
FULL POWER BANDWIDTH is a measure of the frequency
at which the reconstructed output fundamental drops 3 dB
below its low frequency value for a full scale input.
FULL-SCALE ERROR is a measure of how far the last code
transition is from the ideal 1½ LSB below VRT and is defined
as:
where SNR0 is the SNR measured with no noise or signal on
the supply lines and SNR1 is the SNR measured with a
1 MHz, 200 mVP-P signal riding upon the supply lines.
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in
dB, of the rms value of the input signal at the output to the rms
value of the sum of all other spectral components below onehalf the sampling frequency, not including harmonics or d.c.
SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or
SINAD) is the ratio, expressed in dB, of the rms value of the
input signal at the output to the rms value of all of the other
spectral components below half the clock frequency, including harmonics but excluding d.c.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the input
signal at the output and the peak spurious signal, where a
spurious signal is any signal present in the output spectrum
that is not present at the input.
TOTAL HARMONIC DISTORTION (THD) is the ratio expressed in dB, of the rms total of the first nine harmonic levels
at the output to the level of the fundamental at the output. THD
is calculated as
Vmax + 1.5 LSB – VRT
where Vmax is the voltage at which the transition to the maximum (full scale) code occurs.
INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a line drawn from zero
scale (½ LSB below the first code transition) through positive
full scale (½ LSB above the last code transition). The deviation of any given code from this straight line is measured from
the center of that code value. The end point test method is
used. Measured at 60 MSPS with a ramp input.
INTERMODULATION DISTORTION (IMD) is the creation of
additional spectral components as a result of two sinusoidal
frequencies being applied to the ADC input at the same time.
it is defined as the ratio of the power in the second and third
order intermodulation products to the power in one of the
original frequencies. IMD is usually expressed in dBFS.
LSB (LEAST SIGNIFICANT BIT) is the bit that has the smallest value or weight of all bits. This value is
where Af1 is the RMS power of the fundamental (output) frequency and Af2 through Af10 are the RMS power of the first 9
harmonic frequencies in the output spectrum.
ZERO SCALE OFFSET ERROR is the error in the input voltage required to cause the first code transition. It is defined as
(VRT − VRB) / 2n
where “n” is the ADC resolution, which is 8 in the case of the
ADC08L060.
MISSING CODES are those output codes that are skipped
and will never appear at the ADC outputs. These codes cannot be reached with any input value.
MSB (MOST SIGNIFICANT BIT) is the bit that has the largest
value or weight. Its value is one half of full scale.
OUTPUT DELAY is the time delay after the rising edge of the
input clock before the data update is present at the output
pins.
OUTPUT HOLD TIME is the length of time that the output data
is valid after the rise of the input clock.
PIPELINE DELAY (LATENCY) is the number of clock cycles
between initiation of conversion and when that data is pre-
VOFF = VZT − VRB
where VZT is the first code transition input voltage.
2nd HARMONIC DISTORTION (2nd HARM) is the difference, expressed in dB, between the rms power in the output
fundamental frequency and the power in its 2nd harmonic at
the output.
3rd HARMONIC DISTORTION (3rd HARM) is the difference,
expressed in dB, between the rms power in the output fundamental frequency and the power in its 3rd harmonic at the
output.
7
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ADC08L060
sented to the output driver stage. New data is available at
every clock cycle, but the data lags the conversion by the
Pipeline Delay plus the Output Delay.
POWER SUPPLY REJECTION RATIO (PSRR) is a measure
of how well the ADC rejects a change in the power supply
voltage. For the ADC08L060, PSRR1 is the ratio of the
change in Full-Scale Error that results from a change in the
d.c. power supply voltage, expressed in dB. PSRR2 is a measure of how well an a.c. signal riding upon the power supply
is rejected and is here defined as
Specification Definitions
ADC08L060
Timing Diagram
20041710
FIGURE 1. ADC08L060 Timing Diagram
Typical Performance Characteristics
VA = VDR = 3V, fCLK = 60 MHz, fIN = 10 MHz, unless otherwise
stated
INL
INL vs. Temperature
20041753
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20041712
8
ADC08L060
INL vs. Supply Voltage, VA
INL vs. Sample Rate
20041714
20041713
INL vs. Clock Duty Cycle
DNL
20041754
20041715
DNL vs. Temperature
DNL vs. Supply Voltage, VA
20041717
20041718
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ADC08L060
DNL vs. Sample Rate
DNL vs. Clock Duty Cycle
20041719
20041720
SNR, SINAD and SFDR vs. Temperature
SNR, SINAD and SFDR vs. Supply Voltage, VA
20041721
20041722
SNR, SINAD and SFDR vs. Sample Rate
SNR, SINAD and SFDR vs. Input Frequency
20041723
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20041724
10
ADC08L060
SNR, SINAD and SFDR vs. Clock Duty Cycle
Distortion vs. Temperature
20041725
20041726
Distortion vs. Supply Voltage, VA
Distortion vs. Sample Rate
20041728
20041727
Distortion vs. Input Frequency
Distortion vs. Clock Duty Cycle
20041729
20041730
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ADC08L060
Power Consumption (Active) vs.
Sample Rate (fIN = d.c.)
Power Consumption (Active) vs.
Sample Rate (fIN = d.c.)
20041731
20041738
Power Consumption (Active) vs.
Sample Rate (fIN = 1 MHz)
Power Consumption (Active) vs.
Sample Rate (fIN = 1 MHz)
20041739
20041740
Spectral Response @ fIN = 10 MHz
Spectral Response @ fIN = 29 MHz
20041755
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20041757
12
ADC08L060
Spectral Response @ fIN = 75 MHz
Spectral Response @ fIN = 98.9 MHz
20041756
20041758
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ADC08L060
The device is in the active state when the Power Down pin
(PD) is low. When the PD pin is high, the device is in the power
down mode, where the output pins hold the last conversion
before the PD pin went high and the device consumes about
1.4 mW. Holding the clock input low will further reduce the
power consumption in the power down mode to about 1 mW
Functional Description
The ADC08L060 uses a unique architecture that achieves
over 7 effective bits at input frequencies up to and beyond
Nyquist.
The analog input signal that is within the voltage range set by
VRT and VRB is digitized to eight bits. Input voltages below
VRB will cause the output word to consist of all zeroes. Input
voltages above VRT will cause the output word to consist of
all ones.
Incorporating a switched capacitor bandgap, the ADC08L060
exhibits a power consumption that is proportional to frequency, limiting power consumption to what is needed at the clock
rate that is used. This and its excellent performance over a
wide range of clock frequencies makes it an ideal choice as
a single ADC for many 8-bit needs.
Data is acquired at the rising edge of the clock and the digital
equivalent of that data is available at the digital outputs 5 clock
cycles plus tOD later. The ADC08L060 will convert as long as
an adequate clock signal is present at pin 24. The output coding is straight binary.
Applications Information
1.0 REFERENCE INPUTS
The reference inputs VRT and VRB are the top and bottom of
the reference ladder, respectively. Input signals between
these two voltages will be digitized to 8 bits. External voltages
applied to the reference input pins should be within the range
specified in the Operating Ratings table. Any device used to
drive the reference pins should be able to source sufficient
current into the VRT pin and sink sufficient current from the
VRB pin to keep these voltages stable.
20041732
FIGURE 2. Simple, low component count reference biasing. Because of the ladder and external resistor tolerances, the
reference voltage of this circuit can vary too much for some applications.
The reference bias circuit of Figure 2 is very simple and the
performance is adequate for many applications. However,
circuit tolerances will lead to a wide reference voltage range.
Better reference stability can be achieved by driving the reference pins with low impedance sources.
The circuit of Figure 3 will allow a more accurate setting of the
reference voltages. The upper amplifier must be able to
source the reference current as determined by the value of
the reference resistor and the value of (VRT - VRB). The lower
amplifier must be able to sink this reference current. Both
should be stable with a capacitive load. The LM8272 was
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chosen because of its rail-to-rail input and output capability,
its high current output and its ability to drive large capacitance
loads. Of course, the divider resistors at the amplifier input
could be changed to suit your reference voltage needs, or the
divider can be replaced with potentiometers for precise settings. The bottom of the ladder (VRB) may simply be returned
to ground if the minimum input signal excursion is 0V. Be sure
that the driving source can source sufficient current into the
VRT pin and sink enough current from the VRB pin to keep
these pins stable.
14
The VRM pin is the center of the reference ladder and should
be bypassed to a quiet point in the analog ground plane with
a 0.1 µF capacitor. DO NOT allow this pin to float.
20041733
FIGURE 3. Driving the reference to force desired values requires driving with a low impedance source.
board material. A resistor value should be chosen between
10Ω and 47Ω and the capacitor value chose according to the
formula
2.0 THE ANALOG INPUT
The analog input of the ADC08L060 is a switch followed by
an integrator. The input capacitance changes with the clock
level, appearing as 3 pF when the clock is low, and 4 pF when
the clock is high. The sampling nature of the analog input
causes current spikes that result in voltage spikes at the analog input pin. Any circuit used to drive the analog input must
be able to drive that input and to settle within the clock low
time. The LMH6702 has been found to be a good amplifier to
drive the ADC08L060.
Figure 4 shows an example of an input circuit using the
LMH6702. Any input amplifier should incorporate some gain
as operational amplifiers exhibit better phase margin and
transient response with gains above 2 or 3 than with unity
gain. If an overall gain of less than 3 is required, attenuate the
input and operate the amplifier at a higher gain, as shown in
Figure 4.
The RC at the amplifier output filters the clock rate energy that
comes out of the analog input due to the input sampling circuit.
The optimum time constant for this circuit depends not only
upon the amplifier and ADC, but also on the circuit layout and
This will provide optimum SNR performance. Best THD performance is realized when the capacitor and resistor values
are both zero. To optimize SINAD, reduce the capacitor value
until SINAD performance is optimized. That is, until SNR =
−THD. This value will usually be in the range of 20& to 65%
of the value calculated with the above formula. An accurate
calculation is not possible because of the board material and
layout dependence.
The circuit of Figure 4 has both gain and offset adjustments.
If you eliminate these adjustments normal circuit tolerances
may result in signal clipping unless care is exercised in the
worst case analysis of component tolerances and the input
signal excursion is appropriately limited to account for the
worst case conditions.
15
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ADC08L060
VRT should always be more positive than VRB by the minimum
VRT - VRB difference in the Electrical Characteristics table to
minimize noise. Furthermore, the difference between VRT and
VRB should not exceed the maxumum value specified in the
Electrical Characteristics table to avoid signal distortion.
ADC08L060
20041734
FIGURE 4. The input amplifier should incorporate some gain for best performance (see text).
3.0 POWER SUPPLY CONSIDERATIONS
A/D converters draw sufficient transient current to corrupt
their own power supplies if not adequately bypassed. A
10 µF tantalum or aluminum electrolytic capacitor should be
placed within an inch (2.5 cm) of the A/D power pins, with a
0.1 µF ceramic chip capacitor placed within one centimeter of
the converter's power supply pins. Leadless chip capacitors
are preferred because they have low lead inductance.
While a single voltage source is recommended for the VA and
VDR supplies of the ADC08L060, these supply pins should be
well isolated from each other to prevent any digital noise from
being coupled into the analog portions of the ADC. A choke
or 27Ω resistor is recommended between these supply lines
with adequate bypass capacitors close to the supply pins.
As is the case with all high speed converters, the ADC08L060
should be assumed to have little power supply rejection. None
of the supplies for the converter should be the supply that is
used for other digital circuitry in any system with a lot of digital
power being consumed. The ADC supplies should be the
same supply used for other analog circuitry.
No pin should ever have a voltage on it that is in excess of the
supply voltage or below ground by more than 300 mV, not
even on a transient basis. This can be a problem upon application of power and power shut-down. Be sure that the supplies to circuits driving any of the input pins, analog or digital,
do not come up any faster than does the voltage at the ADC08L060 power pins.
4.1 The PD Pin
The Power Down (PD) pin, when high, puts the ADC08L060
into a low power mode where power consumption is reduced
to 1.4 mW with the clock running, or to about 1 mW with the
clock held low. Output data is valid and accurate about 1 microsecond after the PD pin is brought low.
The digital output pins retain the last conversion output code
when either the clock is stopped or the PD pin is high.
4.2 The ADC08L060 Clock
Although the ADC08L060 is tested and its performance is
guaranteed with a 60 MHz clock, it typically will function well
with clock frequencies from 10 MHz to 80 MHz.
4.2.1 Clock Duty Cycle
The low and high times of the clock signal can affect the performance of any A/D Converter. Because achieving a precise
duty cycle is difficult, the ADC08L060 is designed to maintain
performance over a range of duty cycles. While it is specified
and performance is guaranteed with a 50% clock duty cycle
and 60 Msps, ADC08L060 performance is typically maintained with clock high and low times of 0.83 ns, corresponding
to a clock duty cycle range of 5% to 95% with a 60 MHz clock.
Note that minimum low and high times may not be simultaneously asserted.
4.2.2 Clock Line Termination
The CLOCK line should be series terminated at the clock
source in the characteristic impedance of that line. If the clock
line is longer than
4.0 THE DIGITAL INPUT PINS
The ADC08L060 has two digital input pins: The PD pin and
the Clock pin.
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16
where tr is the clock rise time and tprop is the propagation rate
of the signal along the trace. The CLOCK pin should be a.c.
terminated with a series RC to ground such that the resistor
value is equal to the characteristic impedance of the clock line
and the capacitor value is
where “L” is the line length in inches and ZO is the characteristic impedance of the clock line. Typical tPROP is about 150
ps/inch on FR-4 board material. For FR-4 board material, the
value of C becomes
This termination should be located as close as possible to,
but within one centimeter of, the ADC08L060 clock pin.
5.0 LAYOUT AND GROUNDING
Proper grounding and proper routing of all signals are essential to ensure accurate conversion. A combined analog and
digital ground plane should be used.
Since digital switching transients are composed largely of
high frequency components, total ground plane copper
weight will have little effect upon the logic-generated noise
because of the skin effect. Total surface area is more important than is total ground plane volume. Capacitive coupling
between the typically noisy digital circuitry and the sensitive
analog circuitry can lead to poor performance that may seem
impossible to isolate and remedy. The solution is to keep the
analog circuitry well separated from the digital circuitry.
The DR GND connection to the ground plane should not use
the same feedthrough used by other ground connections.
High power digital components should not be located on or
near a straight line between the ADC or any linear component
and the power supply area as the resulting common return
current path could cause fluctuation in the analog input
“ground” return of the ADC.
Keeping analog and digital return (ground) currents separate
from each other will improve system noise performance. Two
methods may be used to do this. Use of traces rather than a
solid plane to route power to all components will accomplish
this because return currents follow the path of the outgoing
currents. However, the advantage of the distributed capacitance of a power plane and a ground plane is lost. Analog and
digital power should be routed as far from each other as is
practical. The analog power trace should also be routed away
from digital areas of the board.
The use of power and ground planes in adjacent layers will
provide distributed capacitance for a low impedance power
distribution system and better system noise performance.
The use of separate analog and digital power planes, both in
the same PC board layer, and the use of a single, non-split
ground plane will keep analog and digital currents separated
from each other. Of course, locate all analog circuitry and
traces over the analog power plane and the digital circuitry
and traces over the digital power plane. To minimize RFI/EMI,
give proper attention to any lines crossing the analog/digital
power plane boundary.
20041736
FIGURE 5. Layout Example
The analog input should be isolated from noisy signal traces
to avoid coupling of spurious signals into the input. Any external component (e.g., a filter capacitor) connected between
the converter's input and ground should be connected to a
very clean point in the ground plane.
17
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ADC08L060
Noise performance is also enhanced by driving a single gate
with each ADC output pin and locating the gate as close as
possible to the ADC output. Inserting a 47Ω resistor in series
with the ADC digital output pins will also help reduce ADC
noise. Be sure to keep the resistors as close to the ADC output pins as possible. Eliminating ground plane copper beneath the ADC output lines can also help ADC noise
performance, but could produce unacceptable radiation from
the board.
Analog and digital circuitry should be kept well away from
each other. Especially troublesome is high power digital components such as processors and large PLDs. Switch mode
power supplies, including capacitive DC-DC converters, can
cause noise problems with high speed ADCs. Keep such
components well away from ADCs and low level analog signal
areas. Such components should be located as close to the
power supply as possible and should not be in the path of
analog signal or power supply currents.
Digital circuits create substantial supply and ground current
transients. The noise thus generated could have significant
impact upon system noise performance. The best logic family
to use in systems with A/D converters is one that employs
non-saturating transistor designs, or has low noise characteristics, like the 74LS and the 74AC(T)Q families. The worst
noise generators are logic families that draw the largest supply current transients during clock or signal edges, like the
74HC, 74F and 74AC(T) families.
Since digital switching transients are composed largely of
high frequency components, total ground plane copper
weight will have little effect upon logic-generated noise. This
is because of the skin effect. Total surface area is more important than is total ground plane volume.
Clock lines should be isolated from ALL other lines, analog
AND digital. Even the generally accepted 90° crossing should
be avoided as even a little coupling can cause problems at
high frequencies. Best performance at high frequencies is
obtained with a straight signal path.
ADC08L060
ground. A 51Ω resistor in series with the offending digital input
will usually eliminate the problem.
Care should be taken not to overdrive the inputs of the ADC08L060. Such practice may lead to conversion inaccuracies
and even to device damage.
Attempting to drive a high capacitance digital data bus.
The more capacitance the output drivers must charge for
each conversion, the more instantaneous digital current is required from VDR and DR GND. These large charging current
spikes can couple into the analog section, degrading dynamic
performance. Buffering the digital data outputs (with a
74F541, for example) may be necessary if the data bus capacitance exceeds 5 pF. Dynamic performance can also be
improved by adding 100Ω series resistors at each digital output, reducing the energy coupled back into the converter input
pins.
Using an inadequate amplifier to drive the analog input.
As explained in Section 2.0, the capacitance seen at the input
alternates between 3 pF and 4 pF with the clock. This dynamic
capacitance is more difficult to drive than is a fixed capacitance, and should be considered when choosing a driving
device.
Driving the VRT pin or the VRB pin with devices that can
not source or sink the current required by the ladder. As
mentioned in Section 1.0, care should be taken to see that
any driving devices can source sufficient current into the
VRT pin and sink sufficient current from the VRB pin. If these
pins are not driven with devices than can handle the required
current, these reference pins will not be stable, resulting in a
reduction of dynamic performance.
Using a clock source with excessive jitter, using an excessively long clock signal trace, or having other signals
coupled to the clock signal trace. This will cause the sampling interval to vary, causing excessive output noise and a
reduction in SNR performance. The use of simple gates with
RC timing is generally inadequate as a clock source.
Figure 5 gives an example of a suitable layout. All analog circuitry (input amplifiers, filters, reference components, etc.)
should be placed together away from any digital components.
6.0 DYNAMIC PERFORMANCE
The ADC08L060 is a.c. tested and its dynamic performance
is guaranteed. To meet the published specifications, the clock
source driving the CLK input should exhibit less than 10 ps
(rms) of jitter. For best a.c. performance, isolating the ADC
clock from any digital circuitry should be done with adequate
buffers, as with a clock tree. See Figure 6.
It is good practice to keep the ADC clock line as short as possible and to keep it well away from any other signals. Other
signals can introduce jitter into the clock signal. The clock
signal can also introduce noise into the analog path.
20041737
FIGURE 6. Isolating the ADC Clock from Digital Circuitry
7.0 COMMON APPLICATION PITFALLS
Driving the inputs (analog or digital) beyond the power
supply rails. For proper operation, all inputs should not go
more than 300 mV below the ground pins or 300 mV above
the supply pins. Exceeding these limits on even a transient
basis may cause faulty or erratic operation. It is not uncommon for high speed digital circuits (e.g., 74F and 74AC devices) to exhibit undershoot that goes more than a volt below
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18
ADC08L060
Physical Dimensions inches (millimeters) unless otherwise noted
NOTES: UNLESS OTHERWISE SPECIFIED
REFERENCE JEDEC REGISTRATION mo-153, VARIATION AD, DATED 7/93.
24-Lead Package TC
Order Number ADC08L060CIMT
NS Package Number MTC24
19
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ADC08L060 8-Bit, 10 MSPS to 60 MSPS, 0.65 mW/MSPS A/D Converter with Internal
Sample-and-Hold
Notes
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