100314 Low Power Quint Differential Line Receiver General Description Features The 100314 is a monolithic quint differential line receiver with emitter-follower outputs. An internal reference supply (VBB) is available for single-ended reception. When used in single-ended operation the apparent input threshold of the true inputs is 25 mV to 30 mV higher (positive) than the threshold of the complementary inputs. Unlike other F100K ECL devices, the inputs do not have input pull-down resistors. Active current sources provide common-mode rejection of 1.0V in either the positive or negative direction. A defined output state exists if both inverting and non-inverting inputs are at the same potential between VEE and VCC. The defined state is logic HIGH on the Oa–Oe outputs. n n n n n Logic Symbol 35% power reduction of the 100114 2000V ESD protection Pin/function compatible with 100114 Voltage compensated operating range = −4.2V to −5.7V Standard Microcircuit Drawing (SMD) 5962-9162901 Pin Names Description Da–De Data Inputs Da–De Inverting Data Inputs Oa–Oe Data Outputs Oa–Oe Complementary Data Outputs DS100299-1 © 1998 National Semiconductor Corporation DS100299 www.national.com 100314 Low Power Quint Differential Line Receiver August 1998 Connection Diagrams 24-Pin DIP 24-Pin Quad Cerpak DS100299-3 DS100299-2 www.national.com 2 Absolute Maximum Ratings (Note 1) ≥2000V ESD (Note 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Recommended Operating Conditions Above which the useful life may be impaired (Note 1) −65˚C to +150˚C Storage Temperature (TSTG) Maximum Junction Temperture (TJ) Ceramic +175˚C −7.0V to +0.5V Pin Potential to Ground Pin (VEE) Input Voltage (DC) VEE to +0.5V Output Current (DC Output HIGH) −50 mA Case Temperature (TC) Military Supply Voltage (VEE) −55˚C to +125˚C −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C (Note 5) Symbol VOH Parameter Output HIGH Voltage Max Units TC −1025 Min Typ −870 mV 0˚C to −1085 −870 mV −55˚C −1830 −1620 mV 0˚C to −1830 −1555 mV −55˚C mV 0˚C to Conditions VIN = VIH (Max) or VIL (Min) Notes Loading with 50Ω to −2.0V +125˚C VOL Output LOW Voltage (Notes 3, 4, 5) +125˚C VOHC Output HIGH −1035 Voltage +125˚C −1085 VOLC Output LOW mV −55˚C −1610 mV 0˚C to −1555 mV −55˚C −1260 mV 0˚C to Voltage VBB VIN = VIH (Max) or VIL (Min) Loading with 50Ω to −2.0V (Notes 3, 4, 5) +125˚C Output Reference Voltage IVBB = 0 µA, VEE = 4.2V −1380 −1260 mV 0˚C to IVBB = −250 µA, VEE = −5.7V +125˚C VDIFF Input Voltage −1396 mV −55˚C 150 mV −55˚C to Differential VCM Common Mode Single-Ended VCC − 2.0 VCC − 0.5 V Single-Ended −1165 −870 mV −55˚C to +125˚C −1830 −1475 mV −55˚C to +125˚C Input HIGH Current 50 70 ICBO Input Leakage −10 µA Power Supply (Notes 3, 4, 5) −55˚C to −25 mA −55˚C to +125˚C (Notes 3, 4, 5, 6) Inputs (with Dn tied to VBB) VIN = VIH +125˚C −65 Guaranteed LOW Signal for All Da–De = VIL µA (Notes 3, 4, 5, 6) Inputs (with Dn tied to VBB) 0˚C to −55˚C Current Guaranteed HIGH Signal for All +125˚C µA Current IEE (Notes 3, 4, 5) +125˚C Input Low Voltage IIH Required for Full Output Swing −55˚C to Input High Voltage VIL (Notes 3, 4, 5) IVBB = −350 µA, VEE = −5.7V +125˚C Voltage VIH (Notes 3, 4, 5) +125˚C (Max), Da–De = VBB, (Min) VIN = VEE, Da–De = VBB, Da–De = VIL (Notes 3, 4, 5) (Min) Da–De = VBB, Da–De = VIL (Notes 3, 4, 5) (Notes 3, 4, 5) (Min) Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. 3 www.national.com AC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND Symbol Parameter tPLH Propagation Delay tPHL Data to Output tTLH Transition Time tTHL 20% to 80%, 80% to 20% TC = −55˚C TC = +25˚C TC = +125˚C Min Max Min Max Min Max 0.40 2.30 0.60 2.20 0.60 2.70 Units Conditions ns Notes (Notes 7, 8, 9) Figures 1, 2 0.20 1.40 0.20 1.40 0.20 1.40 ns (Note 10) Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11. Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data). Test Circuit DS100299-5 Note: VCC, VCCA = +2V, VEE = −2.5V L1 and L2 = equal length 50Ω impedance lines RT = 50Ω terminator internal to scope Decoupling 0.1 µF from GND to VCC and VEE All unused outputs are loaded with 50Ω to GND CL = Fixture and stray capacitance ≤ 3 pF FIGURE 1. AC Test Circuit www.national.com 4 Switching Waveforms DS100299-6 FIGURE 2. Propagation Delay and Transition Times 5 www.national.com 6 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Ceramic Dual-In-Line Package (0.400" Wide) (D) NS Package Number J24E 24-Lead Quad Cerpak (F) NS Package Number W24B 7 www.national.com 100314 Low Power Quint Differential Line Receiver LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. 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