CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate General Description Features These quad gates are monolithic complementary MOS (CMOS) integrated circuits constructed with N- and P-channel enhancement mode transistors. They have equal source and sink current capabilities and conform to standard B series output drive. The devices also have buffered outputs which improve transfer characteristics by providing very high gain. All inputs protected against static discharge with diodes to VDD and VSS. Y Y Y Y Low power TTL Fan out of 2 driving 74L compatibility or 1 driving 74LS 5V – 10V – 15V parametric ratings Symmetrical output characteristics Maximum input leakage 1 mA at 15V over full temperature range Connection Diagrams CD4071B Dual-In-Line Package TL/F/5977 – 3 Top View CD4081B Dual-In-Line Package TL/F/5977 – 6 Top View Order Number CD4071B or CD4081B C1995 National Semiconductor Corporation TL/F/5977 RRD-B30M105/Printed in U. S. A. CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate February 1988 Absolute Maximum Ratings (Notes 1 & 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Lead Temperature (TL) (Soldering, 10 seconds) Voltage at Any Pin b 0.5V to VDD a 0.5V Operating Conditions 700 mW 500 mW Operating Range (VDD) Operating Temperature Range (TA) CD4071BM, CD4081BM CD4071BC, CD4081BC Power Dissipation (PD) Dual-In-Line Small Outline VDD Range Storage Temperature (TS) b 0.5 VDC to a 18 VDC b 65§ C to a 150§ C 260§ C 3 VDC to 15 VDC b 55§ C to a 125§ C b 40§ C to a 85§ C DC Electrical Characteristics CD4071BM/CD4081BM (Note 2) Symbol Parameter b 55§ C Conditions Min Max a 25§ C Min a 125§ C Min Units Typ Max Max 0.25 0.50 1.0 0.004 0.005 0.006 0.25 0.50 1.0 7.5 15 30 mA mA mA 0.05 0.05 0.05 0 0 0 0.05 0.05 0.05 0.05 0.05 0.05 V V V IDD Quiescent Device Current VDD e 5V VDD e 10V VDD e 15V VOL Low Level Output Voltage VDD e 5V VDD e 10V VDD e 15V High Level Output Voltage VDD e 5V VDD e 10V VDD e 15V VIL Low Level Input Voltage VDD e 5V, VO e 0.5V VDD e 10V, VO e 1.0V VDD e 15V, VO e 1.5V VIH High Level Input Voltage VDD e 5V, VO e 4.5V VDD e 10V, VO e 9.0V VDD e 15V, VO e 13.5V 3.5 7.0 11.0 3.5 7.0 11.0 3 6 9 3.5 7.0 11.0 V V V IOL Low Level Output Current (Note 3) VDD e 5V, VO e 0.4V VDD e 10V, VO e 0.5V VDD e 15V, VO e 1.5V 0.64 1.6 4.2 0.51 1.3 3.4 0.88 2.25 8.8 0.36 0.9 2.4 mA mA mA IOH High Level Output Current (Note 3) VDD e 5V, VO e 4.6V VDD e 10V, VO e 9.5V VDD e 15V, VO e 13.5V b 0.64 b 1.6 b 4.2 b 0.51 b 1.3 b 3.4 b 0.88 b 2.25 b 8.8 b 0.36 b 0.9 b 2.4 mA mA mA IIN Input Current VDD e 15V, VIN e 0V VDD e 15V, VIN e 15V VOH ( ( lIOl k 1 mA lIOl k 1 mA 4.95 9.95 14.95 4.95 9.95 14.95 1.5 3.0 4.0 5 10 15 2 4 6 4.95 9.95 14.95 1.5 3.0 4.0 V V V 1.5 3.0 4.0 b 0.10 b 10 b 5 b 0.10 b 1.0 0.10 10b5 0.10 1.0 V V V mA mA Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation. Note 2: All voltages measured with respect to VSS unless otherwise specified. Note 3: IOH and IOL are tested one output at a time. 2 DC Electrical Characteristics CD4071BC/CD4081BC (Note 2) Symbol Parameter b 40§ C Conditions Min a 25§ C Max Min a 85§ C Min Units Typ Max Max 1 2 4 0.004 0.005 0.006 1 2 4 7.5 15 30 mA mA mA 0.05 0.05 0.05 0 0 0 0.05 0.05 0.05 0.05 0.05 0.05 V V V IDD Quiescent Device Current VDD e 5V VDD e 10V VDD e 15V VOL Low Level Output Voltage VDD e 5V VDD e 10V VDD e 15V High Level Output Voltage VDD e 5V VDD e 10V VDD e 15V VIL Low Level Input Voltage VDD e 5V, VO e 0.5V VDD e 10V, VO e 1.0V VDD e 15V, VO e 1.5V VIH High Level Input Voltage VDD e 5V, VO e 4.5V VDD e 10V, VO e 9.0V VDD e 15V, VO e 13.5V 3.5 7.0 11.0 3.5 7.0 11.0 3 6 9 3.5 7.0 11.0 V V V IOL Low Level Output Current (Note 3) VDD e 5V, VO e 0.4V VDD e 10V, VO e 0.5V VDD e 15V, VO e 1.5V 0.52 1.3 3.6 0.44 1.1 3.0 0.88 2.25 8.8 0.36 0.9 2.4 mA mA mA IOH High Level Output Current (Note 3) VDD e 5V, VO e 4.6V VDD e 10V, VO e 9.5V VDD e 15V, VO e 13.5V b 0.52 b 1.3 b 3.6 b 0.44 b 1.1 b 3.0 b 0.88 b 2.25 b 8.8 b 0.36 b 0.9 b 2.4 mA mA mA IIN Input Current VDD e 15V, VIN e 0V VDD e 15V, VIN e 15V VOH ( ( lIOl k 1 mA lIOl k 1 mA 4.95 9.95 14.95 4.95 9.95 14.95 5 10 15 1.5 3.0 4.0 2 4 6 4.95 9.95 14.95 1.5 3.0 4.0 V V V 1.5 3.0 4.0 V V V b 0.30 b 10 b 5 b 0.30 b 1.0 0.30 10b5 0.30 1.0 mA mA AC Electrical Characteristics* CD4071BC/CD4071BM TA e 25§ C, Input tr; tf e 20 ns, CL e 50 pF, RL e 200 kX, Typical temperature coefficient is 0.3%/§ C Symbol Parameter Conditions Typ Max Units 100 40 30 250 100 70 ns ns ns tPHL Propagation Delay Time, High-to-Low Level VDD e 5V VDD e 10V VDD e 15V tPLH Propagation Delay Time, Low-to-High Level VDD e 5V VDD e 10V VDD e 15V 90 40 30 250 100 70 ns ns ns tTHL, tTLH Transition Time VDD e 5V VDD e 10V VDD e 15V 90 50 40 200 100 80 ns ns ns CIN Average Input Capacitance Any Input 5 7.5 pF CPD Power Dissipation Capacity Any Gate 18 pF *AC Parameters are guaranteed by DC correlated testing. Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’ they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation. Note 2: All voltages measured with respect to VSS unless otherwise specified. Note 3: IOH and IOL are tested one output at a time. 3 AC Electrical Characteristics* CD4081BC/CD4081BM TA e 25§ C, Input tr; tf e 20 ns, CL e 50 pF, RL e 200 kX, Typical temperature coefficient is 0.3%/§ C Conditions Typ Max Units tPHL Symbol Propagation Delay Time, High-to-Low Level Parameter VDD e 5V VDD e 10V VDD e 15V 100 40 30 250 100 70 ns ns ns tPLH Propagation Delay Time, Low-to-High Level VDD e 5V VDD e 10V VDD e 15V 120 50 35 250 100 70 ns ns ns tTHL, tTLH Transition Time VDD e 5V VDD e 10V VDD e 15V 90 50 40 200 100 80 ns ns ns CIN Average Input Capacitance Any Input 5 7.5 pF CPD Power Dissipation Capacity Any Gate 18 pF *AC Parameters are guaranteed by DC correlated testing. Typical Performance Characteristics TL/F/5977–7 FIGURE 1. Typical Transfer Characteristics TL/F/5977 – 8 FIGURE 2. Typical Transfer Characteristics TL/F/5977 – 9 FIGURE 3. Typical Transfer Characteristics TL/F/5977 – 11 FIGURE 5 TL/F/5977–10 FIGURE 4. Typical Transfer Characteristics 4 TL/F/5977 – 12 FIGURE 6 Typical Performance Characteristics (Continued) TL/F/5977–13 FIGURE 7 TL/F/5977 – 15 TL/F/5977 – 14 FIGURE 9 FIGURE 8 TL/F/5977–16 FIGURE 10 TL/F/5977 – 18 TL/F/5977 – 17 FIGURE 11 FIGURE 12 TL/F/5977 – 19 TL/F/5977 – 20 FIGURE 13 FIGURE 14 5 Schematic Diagrams CD4071B (/4 of device shown JeAaB Logical ‘‘1’’ e High Logical ‘‘0’’ e Low *All inputs protected by standard CMOS protection circuit. TL/F/5977 – 2 TL/F/5977–1 CD4081B (/4 of device shown JeA#B Logical ‘‘1’’ e High Logical ‘‘0’’ e Low *All inputs protected by standard CMOS protection circuit. TL/F/5977 – 5 TL/F/5977–4 6 Physical Dimensions inches (millimeters) Ceramic Dual-In-Line Package (J) Order Number CD4071BMJ, CD4071BCJ CD4081BMJ or CD4081BCJ NS Package Number J14A 7 CD4071BM/CD4071BC Quad 2-Input OR Buffered B Series Gate CD4081BM/CD4081BC Quad 2-Input AND Buffered B Series Gate Physical Dimensions inches (millimeters) (Continued) Molded Dual-In-Line Package (N) Order Number CD4071BMN, CD4071BCN CD4081BMN or CD4081BCN NS Package Number N14A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. 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