INTEL NK80530VY650256S-L7UJ

R
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages
At 1.33 GHz, 1.26 GHz, 1.20 GHz, 1.13 GHz, 1.06
GHz,1.00 GHz; Low Voltage 866 MHz, 733 MHz,
650 MHz; and Ultra Low Voltage 800 MHz, 733
MHz, 700 MHz, and 650 MHz
Datasheet
April 2003
Order Number: 298517-006
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual
property rights is granted by this document. Except as provided in Intel’s Terms and Conditions of Sale for such products, Intel assumes no liability
whatsoever, and Intel disclaims any express or implied warranty, relating to sale and/or use of Intel products including liability or warranties relating to
fitness for a particular purpose, merchantability, or infringement of any patent, copyright or other intellectual property right. Intel products are not intended
for use in medical, life saving, or life sustaining applications.
The information provided in this report, and related materials and presentations, are intended to illustrate the effects of certain design variables
as determined by modeling, and are neither a recommendation nor endorsement of any specific system-level design practices or targets. The
model results are based on a simulated notebook configuration, and do not describe or characterize the properties of any specific, existing
system design. A detailed description of the simulated notebook configuration is available upon request.
Intel may make changes to specifications and product descriptions at any time, without notice.
Designers must not rely on the absence or characteristics of any features or instructions marked "reserved" or "undefined." Intel reserves these for future
definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them.
The Mobile Intel Celeron Processor may contain design defects or errors known as errata which may cause the product to deviate from published
specifications. Current characterized errata are available on request.
Contact your local Intel sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an ordering number and are referenced in this document, or other Intel literature, may be obtained from:
Intel Corporation
www.intel.com
or call 1-800-548-4725
Intel, Celeron, Pentium, and MMX™ are registered trademarks or trademarks of Intel Corporation and its subsidiaries in the United States and other
countries.
*Other names and brands may be claimed as the property of others.
Copyright © Intel Corporation 2000-2002
2
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Contents
1.
Introduction .................................................................................................................................10
1.1
1.2
1.3
1.4
2.
Mobile Intel Celeron Processor Features ...................................................................................13
2.1
2.2
2.3
2.4
3.
New Features in the Mobile Intel Celeron Processor ....................................................13
2.1.1 133-MHz PSB With AGTL Signaling ...................................................................13
2.1.2 256-K On-die Integrated L2 Cache .....................................................................13
2.1.3 Data Prefetch Logic .............................................................................................13
2.1.4 Differential Clocking.............................................................................................13
2.1.5 Signal Differences Between the Mobile Intel Celeron Processor (0.18 µ) (in
BGA2 and Micro-PGA2 Packages) and the Mobile Intel Celeron Processor
(0.13 µ) (in Micro-FCBGA and Micro-FCPGA Packages)...................................14
Power Management ......................................................................................................14
2.2.1 Clock Control Architecture...................................................................................14
2.2.2 Normal State........................................................................................................14
2.2.3 Auto Halt State ....................................................................................................14
2.2.4 Quick Start State .................................................................................................15
2.2.5 HALT/Grant Snoop State ....................................................................................16
2.2.6 Deep Sleep State ................................................................................................16
2.2.7 Operating System Implications of Low-power States..........................................17
AGTL Signals.................................................................................................................17
Mobile Intel Celeron Processor CPUID .........................................................................17
Electrical Specifications..............................................................................................................19
3.1
3.2
3.3
3.4
3.5
298517-006
Overview........................................................................................................................10
State of the Data............................................................................................................11
Terminology ...................................................................................................................11
References ....................................................................................................................12
Processor System Signals.............................................................................................19
3.1.1 Power Sequencing Requirements.......................................................................20
3.1.2 Test Access Port (TAP) Connection....................................................................20
3.1.3 Catastrophic Thermal Protection.........................................................................21
3.1.4 Unused Signals ...................................................................................................21
3.1.5 Signal State in Low-power States .......................................................................21
3.1.5.1
System Bus Signals ........................................................................21
3.1.5.2
CMOS and Open-drain Signals ......................................................21
3.1.5.3
Other Signals ..................................................................................22
Power Supply Requirements .........................................................................................22
3.2.1 Decoupling Guidelines ........................................................................................22
3.2.2 Voltage Planes ....................................................................................................22
3.2.3 Voltage Identification ...........................................................................................23
3.2.4 VTTPWRGD Signal Quality Specification ...........................................................24
3.2.4.1
Transition Region ............................................................................24
3.2.4.2
Transition Time ...............................................................................24
3.2.4.3
Noise ...............................................................................................25
System Bus Clock and Processor Clocking ..................................................................25
Maximum Ratings ..........................................................................................................26
DC Specifications ..........................................................................................................26
Datasheet
3
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
3.6
4.
System Signal Simulations......................................................................................................... 58
4.1
4.2
4.3
5.
Thermal Diode............................................................................................................... 82
Processor Initialization and Configuration.................................................................................. 83
7.1
7.2
8.
Socketable Micro-FCPGA Package.............................................................................. 65
Surface Mount Micro-FCBGA Package ........................................................................ 69
Signal Listings ............................................................................................................... 73
VCC Thermal Specifications ........................................................................................................ 80
6.1
7.
System Bus Clock (BCLK) and PICCLK DC Specifications and AC Signal Quality
Specifications ................................................................................................................ 58
AGTL AC Signal Quality Specifications ........................................................................ 60
Non-AGTL Signal Quality Specifications ...................................................................... 61
4.3.1 PWRGOOD, VTTPWRGD Signal Quality Specifications ................................... 62
4.3.1.1
VTTPWRGD Noise Parameter Specification ................................. 62
4.3.1.2
VTTPWRGD Transition Parameter Recommendation ................... 63
4.3.1.2.1
Transition Region ......................................................... 63
4.3.1.2.2
Transition Time............................................................. 63
4.3.1.2.3
Noise............................................................................. 63
Mechanical Specifications.......................................................................................................... 65
5.1
5.2
5.3
6.
AC Specifications .......................................................................................................... 41
3.6.1 System Bus, Clock, APIC, TAP, CMOS, and Open-drain AC Specifications..... 41
Description .................................................................................................................... 83
7.1.1 Quick Start Enable .............................................................................................. 83
7.1.2 System Bus Frequency....................................................................................... 83
7.1.3 APIC Enable........................................................................................................ 83
Clock Frequencies and Ratios ...................................................................................... 83
Processor Interface .................................................................................................................... 84
8.1
8.2
Alphabetical Signal Reference...................................................................................... 84
Signal Summaries ......................................................................................................... 94
Appendix A. PLL RLC Filter Specification ......................................................................................................... 96
A1.
A2.
A3.
A4.
4
Introduction .................................................................................................................. 96
Filter Specification........................................................................................................ 96
Recommendation for Mobile Systems ......................................................................... 97
Comments .................................................................................................................... 98
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figures
Figure 1. Clock Control States................................................................................................. 15
Figure 2. PLL RLC Filter.......................................................................................................... 23
Figure 3. VTTPWRGD System-Level Connections................................................................. 24
Figure 4. Noise Estimation ...................................................................................................... 25
Figure 5. Illustration of VCC Static and Transient Tolerances (VID = 1.15 V) ......................... 37
Figure 6. Illustration of Deep Sleep VCC Static and Transient Tolerances (VID
Setting = 1.15 V) ...................................................................................................... 37
Figure 7. Illustration of VCC Static and Transient Tolerances (VID = 1.40 V) ......................... 38
Figure 8. Illustration of Deep Sleep VCC Static and Transient Tolerances (VID
Setting = 1.40 V) ...................................................................................................... 39
Figure 9. BCLK (Single Ended)/PICCLK/TCK Generic Clock Timing Waveform.................... 49
Figure 10. Differential BCLK/BCLK# Waveform (Common Mode).......................................... 49
Figure 11. BCLK/BCLK# Waveform (Differential Mode) ......................................................... 50
Figure 12. Valid Delay Timings................................................................................................ 50
Figure 13. Setup and Hold Timings ......................................................................................... 51
Figure 14. Cold/Warm Reset and Configuration Timings........................................................ 51
Figure 15. Power-on Sequence and Reset Timings................................................................ 52
Figure 16. Power Down Sequencing and Timings (VCC Leading) ......................................... 53
Figure 17.Power Down Sequencing and Timings (VCCT Leading)........................................... 54
Figure 18.Test Timings (Boundary Scan)................................................................................ 55
Figure 19. Test Reset Timings ................................................................................................ 55
Figure 20.Quick Start/Deep Sleep Timing (BCLK Stopping Method)...................................... 56
Figure 21. Quick Start/Deep Sleep Timing (DPSLP# Assertion Method) ............................... 57
Figure 22. BCLK (Single Ended)/PICCLK Generic Clock Waveform...................................... 59
Figure 23. Maximum Acceptable Overshoot/Undershoot Waveform ...................................... 60
Figure 24. VTTPWRGD Noise Specification ........................................................................... 64
Figure 25. Socketable Micro-FCPGA Package - Top and Bottom Isometric Views................ 66
Figure 26. Socketable Micro-FCPGA Package - Top and Side View ..................................... 67
Figure 27. Socketable Micro-FCPGA Package - Bottom View ............................................... 68
Figure 28. Micro-FCBGA Package – Top and Bottom Isometric Views.................................. 70
Figure 29. Micro-FCBGA Package – Top and Side Views...................................................... 71
Figure 30. Micro-FCBGA Package - Bottom View .................................................................. 72
Figure 31. Pin/Ball Map - Top View ......................................................................................... 73
Figure 32. PLL Filter Specifications......................................................................................... 97
298517-006
Datasheet
5
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Tables
Table 1. New and Revised Mobile Intel Celeron Processor (0.13 µ) Signals .......................... 14
Table 2. Clock State Characteristics........................................................................................ 17
Table 3. Mobile Intel Celeron Processor CPUID...................................................................... 18
Table 4. Mobile Intel Celeron Processor CPUID Cache and TLB Descriptors ........................ 18
Table 5. System Signal Groups ............................................................................................... 19
Table 6. Recommended Resistors for Mobile Intel Celeron Processor Signals ...................... 20
Table 7. Mobile Intel Celeron Processor VID Values............................................................... 23
Table 8. VTTPWRGD Noise Specification............................................................................... 24
Table 9. VTTPWRGD Transition Time Specification ............................................................... 24
Table 10. Mobile Intel Celeron Processor Absolute Maximum Ratings................................... 26
Table 11. Power Specifications for Mobile Intel Celeron Processor1 ....................................... 27
Table 12. VCC Tolerances for the Low Voltage Mobile Intel Celeron Processor:
VID = 1.15 V ............................................................................................................ 28
Table 13. VCC Tolerances for the Low Voltage Mobile Intel Celeron Processor in the Deep
Sleep State: VID = 1.15 V ........................................................................................ 29
Table 14. VCC Tolerances for the Ultra Low Voltage Mobile Intel Celeron Processor:
VID = 1.1 V .............................................................................................................. 29
Table 15. VCC Tolerances for the Ultra Low Voltage Mobile Intel Celeron Processor
in the Deep Sleep State: VID = 1.1 V ...................................................................... 30
Table 16. VCC Tolerances for the Mobile Intel Celeron Processor: VID = 1.40 V ................... 31
Table 17. VCC Tolerances for the Mobile Intel Celeron Processor in the Deep Sleep State:
VID = 1.40 V ........................................................................................................... 32
Table 18. VCC Tolerances for the Mobile Intel Celeron Processor: VID = 1.45 V ................... 33
Table 19. VCC Tolerances for the Mobile Intel Celeron Processor in the Deep Sleep State:
VID = 1.45 V ........................................................................................................... 34
Table 20. VCC Tolerances for the Mobile Intel Celeron Processor: VID = 1.50 V .................... 35
Table 21. VCC Tolerances for the Mobile Intel Celeron Processor in the Deep Sleep State:
VID = 1.50 V ........................................................................................................... 36
Table 22. AGTL Signal Group DC Specifications .................................................................... 40
Table 23. AGTL Bus DC Specifications ................................................................................... 40
Table 24. CLKREF, APIC, TAP, CMOS, and Open-drain Signal Group DC Specifications.... 41
Table 25. System Bus Clock AC Specifications (Differential).................................................. 42
Table 26. System Bus Clock AC Specifications (133 MHz, Single Ended) ............................. 43
Table 27. System Bus Clock AC Specifications (100 MHz, Single Ended) ............................. 43
Table 28. Valid Mobile Intel Celeron Processor Frequencies.................................................. 44
Table 29. AGTL Signal Groups AC Specifications................................................................... 45
Table 30. CMOS and Open-drain Signal Groups AC Specifications ....................................... 45
Table 31. Reset Configuration AC Specifications and Power On/Power Down Timings......... 46
Table 32. APIC Bus Signal AC Specifications ......................................................................... 47
Table 33. TAP Signal AC Specifications.................................................................................. 48
Table 34. Quick Start/Deep Sleep AC Specifications .............................................................. 48
Table 35. BCLK (Differential) DC Specifications and AC Signal Quality Specifications.......... 58
Table 36. BCLK (Single Ended) DC Specifications and AC Signal Quality Specifications...... 58
Table 37. PICCLK DC Specifications and AC Signal Quality Specifications........................... 59
Table 38. 133-MHz AGTL Signal Group Overshoot/Undershoot Tolerance at the
Processor Core........................................................................................................ 61
Table 39. 100-MHz AGTL Signal Group Overshoot/Undershoot Tolerance at the
Processor Core........................................................................................................ 61
Table 40. Non-AGTL Signal Group Overshoot/Undershoot Tolerance at the Processor
Core ......................................................................................................................... 62
Table 41. VTTPWRGD Noise Parameter Specification ........................................................... 62
6
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 42. VTTPWRGD Transition Parameter Recommendation............................................ 63
Table 43. Socketable Micro-FCPGA Package Specification................................................... 65
Table 44. Micro-FCBGA Package Mechanical Specifications................................................. 69
Table 45. Signal Listing in Order by Pin/Ball Number ............................................................. 74
Table 46. Signal Listing in Order by Signal Name................................................................... 77
Table 47. Voltage and No-Connect Pin/Ball Locations ........................................................... 79
Table 48. Power Specifications for Mobile Intel Celeron Processor........................................ 81
Table 49. Thermal Diode Interface .......................................................................................... 82
Table 50. Thermal Diode Specifications.................................................................................. 82
Table 51. BSEL[1:0] Encoding ................................................................................................ 86
Table 52. Input Signals............................................................................................................ 94
Table 53. Output Signals ......................................................................................................... 94
Table 54. Input/Output Signals (Single Driver)........................................................................ 95
Table 55. Input/Output Signals (Multiple Driver) ..................................................................... 95
Table 56. PLL Filter Inductor Recommendations .................................................................... 97
Table 57. PLL Filter Capacitor Recommendations.................................................................. 97
Table 58. PLL Filter Resistor Recommendations.................................................................... 98
298517-006
Datasheet
7
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Revision History
Date
Revision
Updates
October 2001
298517-001
Initial release
January 2002
298517-002
Updates include:
• Added new processor speeds 1.2 GHz, 1.13 GHz, and 1.06 GHz at
1.45V.
• Added new Low Voltage 667 MHz
• Added new Ultra Low Voltage 650 MHz
• Updated Processor Specifications (Tables 9, 12-15, 40)
• Added Specification Clarification for VTTPWRGD in Table 25, Figure
21 and Section 4.3.1
• Added note 5 CMOSREF resistor divider recommendations to Table
24.
• Updated references
June 2002
298517-003
Updates include:
• Targeted processor frequencies updated
• Updated Tables 3, 9, 12 - 19, 29, and 44
• Updated/corrected Tables 39 and 40
• Updated Figure 5- Figure 7
• Updated Section 5
• Updated CMOSREF description in Section 8.1
• Added Section 3.2.4
August 2002
298517-004
Updates include:
• Added new processor frequencies
• Updated Table 11 and Table 48
December 2002
298517-005
Updates include:
• Added new processor frequencies
• Updated Table 11 and Table 48
April 2003
298517-006
Updates include:
• Added new processor frequencies (1.26 GHz)
• Updated Table 11 and Table 48
8
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Mobile Intel® Celeron® Processor
(0.13 µ) in Micro-FCBGA and MicroFCPGA Packages
Product Features
„
„
„
„
„
„
298517-006
Mobile Intel® Celeron® Processor with the
following Processor core/bus speeds:
 1.333 GHz/133 MHz at 1.50 V
 1.200 GHz/133 MHz at 1.45 V
 1.133 GHz/133 MHz at 1.45 V
 1.066 GHz/133 MHz at 1.45 V
 1.266 GHz/133 MHz at 1.40 V
 1.000 GHz/133 MHz at 1.40 V
Low Voltage Mobile Intel Celeron Processor
(0.13 µ) with the following Processor core/bus
speeds:
 866/133 MHz at 1.15 V
 733/133 MHz at 1.15 V
 650/100 MHz at 1.15 V
Ultra Low Voltage Mobile Intel Celeron
processor (0.13 µ) with the following Processor
core/bus speeds:
 800/133 MHz at 1.10V
 733/133 MHz at 1.10V
 700/100 MHz at 1.10V
 650/100 MHz at 1.10 V
Supports the Intel Architecture with Dynamic
Execution
On-die primary 16-Kbyte instruction cache and
16-Kbyte write-back data cache
On-die second level cache (256-Kbyte)
with Advanced Transfer Cache
Architecture
Datasheet
„
„
„
„
„
„
„
Data Prefetch Logic
Integrated AGTL termination
Integrated math co-processor
Micro-FCPGA and Micro-FCBGA
packaging technologies
 Supports thin form factor notebook
designs
 Exposed die enables more efficient
heat dissipation
 Mobile ULV and LV Celeron
processor (0.13 µ) are available only
in Micro-FCBGA package.
 Mobile Intel Celeron processors at
1.45 V and 1.50 V are available
only in Micro-FCPGA package.
Fully compatible with previous Intel
microprocessors
 Binary compatible with all
applications
 Support for MMX™ technology
 Support for Streaming SIMD
Extensions
Power Management Features
 Quick Start and Deep Sleep modes
provide low power dissipation
On-die thermal diode
9
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
1.
Introduction
Using Intel’s advanced 0.13-micron process technology with copper interconnect, the Mobile Intel
Celeron Processor offers high-performance and low-power consumption. The Mobile Intel Celeron
Processor (0.13µ) in Micro-FCBGA and Micro-FCPGA packages (hereafter referred to as “the Mobile
Intel Celeron Processor”) is based on the same core as existing mobile Intel® Pentium® III Processor-M.
Key performance features include Internet Streaming SIMD instructions, an Advanced Transfer Cache
architecture, and a processor system bus speed of 133 MHz. The Low Voltage and Ultra Low Voltage
Mobile Intel Celeron Processors will support both a 133-MHz and 100-MHz bus speed. These features
are offered in Micro-FCPGA packages for socketable boards and Micro-FCBGA packages for surface
mount boards. The Low Voltage and Ultra Low Voltage Mobile processors will be available only in the
Micro-FCBGA package. The Mobile Intel Celeron processors at 1.45 V and at 1.50 V are available only
in the Micro-FCPGA package. All of these technologies make outstanding performance possible for
mobile PCs in a variety of shapes and sizes.
The 256-KB integrated L2 cache based on the Advanced Transfer Cache architecture runs at full speed
and is designed to help improve performance. It complements the system bus by providing critical data
faster and reducing total system power consumption. The processor also features Data Prefetch Logic
that speculatively fetches data to the L2 cache, resulting in improved performance. The Mobile Intel
Celeron Processor’s 64-bit wide Assisted Gunning Transceiver Logic (AGTL) system bus provides a
glue-less, point-to-point interface for a memory controller hub.
This document covers the electrical, mechanical, and thermal specifications for the following:
• The Mobile Intel Celeron Processor at the following frequencies and voltages: 1.33 GHz at 1.50
V; 1.2 GHz, 1.13 GHz, 1.06 GHz at 1.45 V; and 1.266GHz, 1 GHz at 1.40 V.
• The Low Voltage Mobile Intel Celeron Processor at the following frequencies and voltages: 866
MHz, 733 MHz and 650 MHz at 1.15 V.
• The Ultra Low Voltage Mobile Intel Celeron Processor at the following frequencies and voltages:
800 MHz, 733 MHz, 700 MHz, and 650 MHz at 1.10 V.
• Unless explicitly stated, all references to the Mobile Intel Celeron Processor (0.13 µ) in MicroFCBGA and Micro-FCPGA packages in this document also apply to the Low Voltage and Ultra
Low Voltage Mobile Intel Celeron Processor (0.13 µ) in the Micro-FCBGA package.
1.1
Overview
• Performance features
— Supports the Intel Architecture with Dynamic Execution
— Supports the Intel Architecture MMX™ technology
— Supports Streaming SIMD Extensions for enhanced video, sound, and 3D performance
— Integrated Intel Floating Point Unit compatible with the IEEE 754 standard
— Data Prefetch Logic
• On-die primary (L1) instruction and data caches
— 4-way set associative, 32-byte line size, 1 line per sector
— 16-Kbyte instruction cache and 16-Kbyte write-back data cache
— Cacheable range controlled by processor programmable registers
10
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
• On-die second level (L2) cache
— 8-way set associative, 32-byte line size, 1 line per sector
— Operates at full core speed
— 256-Kbyte ECC protected cache data array
• AGTL system bus interface
— 64-bit data bus, 100-MHz and 133-MHz operation
— Uniprocessor, two loads only (processor and chipset)
— Integrated termination
• Processor clock control
— Quick Start for low power, low exit latency clock “throttling”
— Deep Sleep mode for lower power dissipation
• Thermal diode for measuring processor temperature
1.2
State of the Data
All information in this document is the best available information at the time of publication. Revisions
of this document will be provided on an as-required basis until the Mobile Intel Celeron Processor is
released for production orders.
1.3
298517-006
Terminology
Term
Definition
#
A “#” symbol following a signal name indicates that the signal is active low. This means that when the signal
is asserted (based on the name of the signal) it is in an electrical low state. Otherwise, signals are driven in
an electrical high state when they are asserted. In state machine diagrams, a signal name in a condition
indicates the condition of that signal being asserted
!
Indicates the condition of that signal not being asserted. For example, the condition “!STPCLK# and HS” is
equivalent to “the active low signal STPCLK# is unasserted (i.e., it is at 1.5V) and the HS condition is true.”
L
Electrical low signal levels
H
Electrical high signal levels
0
Logical low. For example, BD[3:0] = “1010” = “HLHL” refers to a hexadecimal “A,” and D[3:0]# = “1010” =
“LHLH” also refers to a hexadecimal “A.”
1
Logical high. For example, BD[3:0] = “1010” = “HLHL” refers to a hexadecimal “A,” and D[3:0]# = “1010” =
“LHLH” also refers to a hexadecimal “A.”
TBD
Specifications that are yet to be determined and will be updated in future revisions of the document.
X
Don’t care condition
Datasheet
11
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
1.4
References
• P6 Family of Processors Hardware Developer’s Manual (Order Number 244001-001)
• Intel® Architecture Optimization Reference Manual (Order Number 245127-001)
• Intel® Architecture Software Developer’s Manual
— Volume I: Basic Architecture (Order Number 245470)
— Volume II: Instruction Set Reference (Order Number 245471)
— Volume III: System Programming Guide (Order Number 245472)
• CK-408 (CK-Titan) Clock Synthesizer/Driver Specification (Contact your Intel Field Sales
Representative)
• Mobile Intel® Pentium® III Processor-M I/O Buffer Models, IBIS Format (Contact your Intel Field
Sales Representative)
• Intel® 830 Chipset Family: 82830 Graphics and Memory Controller Hub (GMCH-M) Datasheet
(Order Number 298338-003)
• Intel® 830 Chipset Family: Intel® 830 Chipset Platform Design Guide (Order Number 298339003)
• Intel® 830 Chipset Family: Intel® 82801CAM I/O Controller Hub 3 (ICH3-M) Datasheet (Order
Number 290716-001)
• Intel® Mobile Voltage Positioning -II (IMVP-II) Design Guide (Contact your Intel Field Sales
Representative)
• Mobile Intel® Pentium® III Processor-M /440MX Platform Design Guide (Contact your Intel Field
Sales Representative)
• Intel Processor Identification and the CPUID Instruction Application Note AP-485 (Order
Number 241618-020)
12
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
2.
Mobile Intel Celeron Processor
Features
2.1
New Features in the Mobile Intel Celeron
Processor
2.1.1
133-MHz PSB With AGTL Signaling
The Mobile Intel Celeron Processor uses Assisted GTL (AGTL) signaling on the PSB interface. The
main difference between AGTL and GTL+ used on previous Intel processors is VCCT = 1.25 V for AGTL
versus 1.5 V for GTL+. The lower voltage swing enables high performance at lower power. The Low
Voltage and Ultra Low Voltage Mobile Celeron Processors will also support a 100-MHz PSB.
2.1.2
256-K On-die Integrated L2 Cache
The 256-K on die integrated L2 cache on the Mobile Intel Celeron Processor is double the L2 cache size
on the Mobile Intel Celeron Processor (0.18 µ). The L2 cache runs at the processor core speed and the
increased cache size provides superior processing power.
2.1.3
Data Prefetch Logic
The Mobile Intel Celeron Processor features Data Prefetch Logic that speculatively fetches data to the
L2 cache before an L1 cache request occurs. This reduces transactions between the cache and system
memory reducing or eliminating bus cycle penalties, resulting in improved performance. The processor
also includes extensions to memory order and reorder buffers that boost performance.
2.1.4
Differential Clocking
Differential clocking requires the use of two complementary clocks: BCLK and BCLK#. Benefits of
differential clocking include easier scaling to lower voltages, reduced EMI, and less jitter. All references
to BCLK in this document apply to BCLK# also even if not explicitly stated. The Mobile Intel Celeron
Processor will also support Single Ended Clocking. The processor will configure itself for Differential or
Single Ended Clocking based on the waveforms detected on the BCLK and BCLK#/CLKREF signal
lines.
298517-006
Datasheet
13
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
2.1.5
Signal Differences Between the Mobile Intel Celeron Processor
(0.18 µ) (in BGA2 and Micro-PGA2 Packages) and the Mobile
Intel Celeron Processor (0.13 µ) (in Micro-FCBGA and MicroFCPGA Packages)
A list of new and changed signals is shown in Table 1.
Table 1. New and Revised Mobile Intel Celeron Processor (0.13 µ) Signals
Signals
BCLK, BCLK#
Function
Differential host clk signals.
CLKREF
Host Clock reference signal in Single Ended Clocking mode.
BSEL[1:0]
Signals are output only instead of I/O. Please refer to the Appendix for details.
DPSLP#
Deep Sleep pin (replaces SLP# pin on the mobile Celeron processor (0.18 µ))
NCTRL
AGTL output buffer pull down impedance control.
VID[4:0]
Voltage Identification (different implementation from mobile Celeron processor (0.18 µ)). Please refer
to Section 3.2.3 for details.
VTTPWRGD
Power Good signal for VCCT, which indicates that, the VID signals are stable. Please refer to Figure
3 for VTTPWRGD system level connections.
2.2
Power Management
2.2.1
Clock Control Architecture
The Mobile Intel Celeron Processor clock control architecture (Figure 1) has been optimized for leading
edge mobile computer designs. The clock control architecture consists of six different clock states:
Normal, Auto Halt, Quick Start, HALT/Grant Snoop and Deep Sleep states. The Auto Halt state
provides a low-power clock state that can be controlled through the software execution of the HLT
instruction. The Quick Start state provides a very low power and low exit latency clock state that can be
used for hardware controlled “idle” computer states. The Deep Sleep state provides extremely lowpower states that can be used for “Power-On-Suspend” computer states, which is an alternative to
shutting off the processor’s power. The exit latency of the Deep Sleep state is 30 msec in the Mobile
Intel Celeron Processor. Performing state transitions not shown in Figure 1 is neither recommended nor
supported. Figure 2 provides the clock state characteristics, which are described in detail in the following
sections.
2.2.2
Normal State
The Normal state of the processor is the normal operating mode where the processor’s core clock is
running and the processor is actively executing instructions.
2.2.3
Auto Halt State
This is a low-power mode entered by the processor through the execution of the HLT instruction. A
transition to the Normal state is made by a halt break event (one of the following signals going active:
NMI, INTR, BINIT#, INIT#, RESET#, FLUSH#, or SMI#).
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Asserting the STPCLK# signal while in the Auto Halt state will cause the processor to transition to the
Quick Start state. Deasserting STPCLK# will cause the processor to return to the Auto Halt state
without issuing a new Halt bus cycle.
The SMI# interrupt is recognized in the Auto Halt state. The return from the System Management
Interrupt (SMI) handler can be to either the Normal state or the Auto Halt state. See the Intel®
Architecture Software Developer’s Manual, Volume III: System Programmer’s Guide for more
information. No Halt bus cycle is issued when returning to the Auto Halt state from the System
Management Mode (SMM).
The FLUSH# signal is serviced in the Auto Halt state. After the on-chip and off-chip caches have been
flushed, the processor will return to the Auto Halt state without issuing a Halt bus cycle. Transitions in
the A20M# and PREQ# signals are recognized while in the Auto Halt state.
Figure 1. Clock Control States
BCLK stopped
or DPSLP#
STPCLK#1
Normal
HS=false
halt
break
(!STPCLK# and !HS)
or RESET#
STPCLK#1
HLT
instruction1
Auto Halt
HS=true
!STPCLK#
and HS
snoop
occurs
snoop
serviced
Deep Sleep 2
Quick Start
BCLK on
and !DPSLP#
snoop
serviced
snoop
occurs
HALT/Grant
Snoop
V0001-022
NOTES:
1. State transition does not occur until the Stop Grant or Auto Halt acknowledge bus cycle completes
Halt break – A20M#, BINIT#, FLUSH#, INIT#, INTR, NMI, PREQ#, RESET#, SMI#, or APIC interrupt
HLT – HLT instruction executed
HS – Processor Halt State
2. Restrictions apply to the use of both methods of entering Deep Sleep. See Deep Sleep state description for details.
2.2.4
Quick Start State
The processor is required to be configured for the Quick Start state by strapping the A15# signal low. In
the Quick Start state the processor is only capable of acting on snoop transactions generated by the
system bus priority device. Because of its snooping behavior, Quick Start can only be used in a
uniprocessor (UP) configuration.
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A transition to the Deep Sleep state can be made by stopping the clock input to the processor or asserting
the DPSLP# signal. A transition back to the Normal state (from the Quick Start state) is made only if the
STPCLK# signal is deasserted.
While in this state the processor is limited in its ability to respond to input. It is incapable of latching any
interrupts, servicing snoop transactions from symmetric bus masters, or responding to FLUSH# or
BINIT# assertions. While the processor is in the Quick Start state, it will not respond properly to any
input signal other than STPCLK#, RESET#, or BPRI#. If any other input signal changes, then the
behavior of the processor will be unpredictable. No serial interrupt messages may begin or be in progress
while the processor is in the Quick Start state.
RESET# assertion will cause the processor to immediately initialize itself, but the processor will stay in
the Quick Start state after initialization until STPCLK# is deasserted.
2.2.5
HALT/Grant Snoop State
The processor will respond to snoop transactions on the system bus while in the Auto Halt or Quick Start
state. When a snoop transaction is presented on the system bus the processor will enter the HALT/Grant
Snoop state. The processor will remain in this state until the snoop has been serviced and the system bus
is quiet. After the snoop has been serviced, the processor will return to its previous state. If the
HALT/Grant Snoop state is entered from the Quick Start state, then the input signal restrictions of the
Quick Start state still apply in the HALT/Grant Snoop state, except for those signal transitions that are
required to perform the snoop.
2.2.6
Deep Sleep State
The Deep Sleep state is a very low power state that the processor can enter while maintaining its context.
The Deep Sleep state is entered by stopping the BCLK and BCLK# inputs to the processor or by
asserting the DPSLP# signal, while it is in the Quick Start state. Note that either one of the methods can
be used to enter Deep Sleep but not both at the same time. When BCLK and BCLK# are stopped, they
must obey the DC levels specified in Table 38 and Table 39.
The processor will return to the Quick Start state from the Deep Sleep state when the BCLK and BCLK#
inputs are restarted or the DPSLP# signal is deasserted. Due to the PLL lock latency, there is a delay of
up to 30 µsec after the clocks have started before this state transition happens. PICCLK may be removed
in the Deep Sleep state. PICCLK should be designed to turn on when BCLK and BCLK# turn on or
DPSLP# is deasserted when transitioning out of the Deep Sleep state.
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Table 2. Clock State Characteristics
Clock State
Exit Latency
Snooping?
System Uses
Normal
N/A
Yes
Normal program execution
Auto Halt
10 µsec
Yes
S/W controlled entry idle mode
Quick Start
Through snoop, to
HALT/Grant Snoop state:
immediate
Yes
H/W controlled entry/exit mobile throttling
Through STPCLK#, to
Normal state: 10 µsec
2.2.7
HALT/Grant
Snoop
A few bus clocks after
snoop completion
Yes
Supports snooping in the low power states
Deep Sleep
30 µsec
No
H/W controlled entry/exit mobile powered-on
suspend support
Operating System Implications of Low-power States
The time-stamp counter and the performance monitor counters are not guaranteed to count in the Quick
Start state. The local APIC timer and performance monitor counter interrupts should be disabled before
entering the Deep Sleep state or the resulting behavior will be unpredictable.
2.3
AGTL Signals
The Mobile Intel Celeron Processor system bus signals use a variation of the low-voltage swing GTL
signaling technology. The AGTL system bus depends on incident wave switching and uses flight time
for timing calculations of the AGTL signals, as opposed to capacitive derating. Intel recommends analog
signal simulation of the system bus including trace lengths. Contact your field sales representative to
receive the IBIS models for the Mobile Intel Celeron Processor.
The AGTL system bus of the Mobile Intel Celeron Processor is designed to support high-speed data
transfers with multiple loads on a long bus that behaves like a transmission line. However, in mobile
systems the system bus only has two loads (the processor and the chipset) and the bus traces are short. It
is possible to change the layout and termination of the system bus to take advantage of the mobile
environment using the same AGTL I/O buffers. This termination is provided on the processor core
(except for the RESET# signal).
2.4
Mobile Intel Celeron Processor CPUID
When the CPUID version information is loaded with EAX=01H, the EAX and EBX registers contain the
values shown in Table 3. After a power-on RESET, the EDX register contains the processor version
information (type, family, model, stepping). Table 4 shows the CPUID Cache and TLB descriptor values
after the L2 cache is initialized. See the Intel Processor Identification and the CPUID Instruction
Application Note AP-485 for further information.
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Table 3. Mobile Intel Celeron Processor CPUID
EAX[31:0]
EBX[7:0]
Reserved [31:14] Type [13:12]
Family [11:8]
Model [7:4]
Stepping [3:0]
X
6
B
X
0
Brand ID
07
Table 4. Mobile Intel Celeron Processor CPUID Cache and TLB Descriptors
Cache and TLB Descriptors
18
01H, 02H, 03H, 04H, 08H, 0CH, 83H
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3.
Electrical Specifications
3.1
Processor System Signals
Table 5 lists the processor system signals by type. All AGTL signals are synchronous with the BCLK
and BCLK# signals. All TAP signals are synchronous with the TCK signal except TRST#. All CMOS
input signals can be applied asynchronously.
Table 5. System Signal Groups
Group Name
AGTL Input
Signals
BPRI#, DEFER#, RESET#, RSP#
AGTL Output
PRDY#
AGTL I/O
A[35:3]#, ADS#, AERR#, AP[1:0]#, BERR#, BINIT#, BNR#, BP[3:2]#, BPM[1:0]#,
BREQ0#, D[63:0]#, DBSY#, DEP[7:0]#, DRDY#, HIT#, HITM#, LOCK#, REQ[4:0]#, RP#,
RS[2:0]#, TRDY#
1.5 V CMOS Input
A20M#, DPSLP#, FLUSH#, IGNNE#, INIT#, LINT0/INTR, LINT1/NMI, PREQ#, SMI#,
STPCLK#
1.8 V CMOS Input
PWRGOOD
1.5 V Open Drain Output
FERR#, IERR#
3.3 V Open Drain Output
BSEL[1:0], VID[4:0]
1.25 V input
VTTPWRGD
Clock
BCLK, BCLK# (Differential Mode)
2.5 V Clock Input
BCLK (Single Ended Mode)
APIC Clock
PICCLK
APIC I/O
PICD[1:0]
Thermal Diode
THERMDC, THERMDA
TAP Input
TCK, TDI, TMS, TRST#
TAP Output
TDO
Power/Other
CLKREF, CMOSREF, EDGECTRLP, NC, NCTRL, PLL1, PLL2, RTTIMPEDP, VCC, VCCT,
VREF, VSS,
NOTES:
1. VCC is the power supply for the core logic.
2. PLL1 and PLL2 are power/ground for the PLL analog section. See Section 3.2.2 for details.
3. VCCT is the power supply for the system bus buffers.
4. VREF is the voltage reference for the AGTL input buffers.
5. VSS is system ground.
The APIC data and TAP outputs are Open-drain and should be pulled up to 1.5 V using resistors with the
values shown in Table 6. If Open-drain drivers are used for input signals, then they should also be pulled
up to the appropriate voltage using resistors with the values shown in Table 6.
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Table 6. Recommended Resistors for Mobile Intel Celeron Processor Signals
Recommended
Resistor Value (Ω)
Mobile Intel Celeron Processor Signal
10 pull-down
BREQ0#
14 pull-up
NCTRL
1, 2
3
39 pull-up
TMS
39 pull-down
TCK
56.2 pull-up
PRDY#, RESET#
56.2 pull-down
RTTIMPEDP
110 pull-down
EDGECTRLP
150 pull-up
PICD[1:0], TDO
200-300 pull-up
PREQ#, TDI
500 pull-down
TRST#
4
1K pull-up
BSEL[1:0], TESTHI, VID[4:0], VTTPWRGD
1K pull-down
TESTLO
1.5k pull-up
FERR#, IERR#, PWRGOOD
3K pull-up
FLUSH#
6
Additional Pullup/Pulldown Resistor Recommendations
270 pull-up
SMI#
680 pull-up
STPCLK#
1.5k pull-up
A20M#, DPSLP#, INIT#, IGNNE#, LINT0/INTR, LINT1/NMI
NOTES:
1. The recommendations above are only for signals that are being used. These recommendations are maximum
values only; stronger pull-ups may be used. Pull-ups for the signals driven by the chipset should not violate the
chipset specification. Refer to Section 3.1.4 for the required pull-up or pull-down resistors for signals that are not
being used.
2. Open-drain signals must never violate the undershoot specification in Section 4.3. Use stronger pull-ups if there
is too much undershoot.
3. A pull-down on BREQ0# is an alternative to having the central agent to drive BREQ0# low at reset.
4. A 56.2 Ω 1% terminating resistor connected to VCCT is required.
5. The following signals are actively driven high by the ICH3-M component and do not need external pull up
resistors on ICH3-M based platforms: A20M#, DPSLP#, INIT#, IGNNE#, LINT0/INTR, LINT1/NMI, SMI#,
STPCLK#.
6. These pull up recommendations apply to systems on which these signals are not actively pulled high such as
those utilizing the 82443MX chipset.
3.1.1
Power Sequencing Requirements
Unlike the Mobile Intel Celeron Processor (0.18 µ), the Mobile Intel Celeron Processor (0.13 µ) does
have specific power sequencing requirements. The power on sequencing and timings are shown in
Figure 15 and Table 31. Power down timing requirements are shown in Figure 16, Figure 17, and Table
31. The VCC power plane must not rise too fast. At least 200 µsec (TR) must pass from the time that VCC
is at 10% of its nominal value until the time that VCC is at 90% of its nominal value. For more details,
please refer to the Intel® Mobile Voltage Positioning -II (IMVP-II) Design Guide (contact your Field
Sales Representative).
3.1.2
Test Access Port (TAP) Connection
The TAP interface is an implementation of the IEEE 1149.1 (“JTAG”) standard. Due to the voltage
levels supported by the TAP interface, Intel recommends that the Mobile Intel Celeron Processor and the
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other 1.5-V JTAG specification compliant devices be last in the JTAG chain after any devices with 3.3V or 5.0-V JTAG interfaces within the system. A translation buffer should be used to reduce the TDO
output voltage of the last 3.3/5.0 V device down to the 1.5-V range that the Mobile Intel Celeron
Processor can tolerate. Multiple copies of TMS and TRST# must be provided, one for each voltage level.
A Debug Port and connector may be placed at the start and end of the JTAG chain containing the
processor, with TDI to the first component coming from the Debug Port and TDO from the last
component going to the Debug Port. There are no requirements for placing the Mobile Intel Celeron
Processor in the JTAG chain, except for those that are dictated by voltage requirements of the TAP
signals.
3.1.3
Catastrophic Thermal Protection
The Mobile Intel Celeron Processor does not support catastrophic thermal protection or the
THERMTRIP# signal. An external thermal sensor must be used to protect the processor and the system
against excessive temperatures. If the external thermal sensor detects a processor junction temperature of
101 °C (maximum), both the VCC and VCCT supplies to the processor must be reduced to at least 50% of
the nominal values within 500 ms and are recommended to be turned off completely within 1 second to
prevent damage to the processor. Processor temperature must be monitored in all states including low
power states.
3.1.4
Unused Signals
All signals named NC must be unconnected. Unused AGTL inputs, outputs, and bi-directional signals
should be unconnected. Unused CMOS active low inputs should be connected to 1.5 V and unused
active high inputs should be connected to VSS. Unused Open-drain outputs should be unconnected. When
tying any signal to power or ground, a resistor will allow for system testability. For unused signals, Intel
suggests that 1.5-kΩ resistors are used for pull-ups and 1.0-kΩ resistors are used for pull-downs.
PICCLK must be driven with a clock that meets specification and the PICD[1:0] signals must be pulled
up separately to 1.5 V with 150-Ω resistors, even if the local APIC is not used.
If the TAP signals are not used then the inputs should be pulled to ground with 1-kΩ resistors and TDO
should be left unconnected.
3.1.5
Signal State in Low-power States
3.1.5.1
System Bus Signals
All of the system bus signals have AGTL input, output, or input/output drivers. Except when servicing
snoops, the system bus signals are tri-stated and pulled up by the termination resistors. Snoops are not
permitted in the Deep Sleep state.
3.1.5.2
CMOS and Open-drain Signals
The CMOS input signals are allowed to be in either the logic high or low state when the processor is in a
low-power state. In the Auto Halt state these signals are allowed to toggle. These input buffers have no
internal pull-up or pull-down resistors and system logic can use CMOS or Open-drain drivers to drive
them.
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The Open-drain output signals have open drain drivers and external pull-up resistors are required. One of
the two output signals (IERR#) is a catastrophic error indicator and is tri-stated (and pulled-up) when the
processor is functioning normally. The FERR# output can be either tri-stated or driven to VSS when the
processor is in a low-power state depending on the condition of the floating-point unit. Since this signal
is a DC current path when it is driven to VSS, Intel recommends that the software clears or masks any
floating-point error condition before putting the processor into the Deep Sleep state.
3.1.5.3
Other Signals
The system bus clocks (BCLK, BCLK#) must be driven in all of the low-power states except the Deep
Sleep state. The APIC clock (PICCLK) must be driven whenever BCLK and BCLK# are driven.
Otherwise, it is permitted to turn off PICCLK by holding it at VSS. BCLK and BCLK# should be obey
the DC levels in Table 38 (for Differential Clocking) and Table 39 (for Single Ended Clocking).
In the Auto Halt state, the APIC bus data signals (PICD[1:0]) may toggle due to APIC bus messages.
These signals are required to be tri-stated and pulled-up when the processor is in the Quick Start or Deep
Sleep states.
3.2
Power Supply Requirements
3.2.1
Decoupling Guidelines
The Mobile Intel Celeron Processor in Micro-FCPGA package has twelve 0805IDC, 1-µF surface mount
decoupling capacitors. Eight capacitors are on the VCC supply and four capacitors are on VCCT. For the
Micro-FCBGA package, there are six 0.68-µF capacitors on VCC and two 0.68-µF capacitors on VCCT. In
addition to the package capacitors, sufficient board level capacitors are also necessary for power supply
decoupling. The guidelines are as follows:
• High and Mid Frequency VCC decoupling – Place twenty-four 0.22-µF 0603 capacitors directly
under the package on the solder side of the motherboard using at least two vias per capacitor node.
Ten 10-µF X7 6.3V 1206-size ceramic capacitors should be placed around the package periphery
near the balls. Trace lengths to the vias should be designed to minimize inductance. Avoid
bending traces to minimize ESL.
• High and Mid Frequency VCCT decoupling – Place ten 1-µF X7R 0603 ceramic capacitors close to
the package. Via and trace guidelines are the same as above.
• Bulk VCC decoupling – Minimum of 1200-µF capacitance with Equivalent Series Resistance
(ESR) less than or equal to 3.5 mΩ.
• Bulk VCCT decoupling – Platform dependent but recommendation is minimum of 660 µF with ESR
less than or equal to 7 mΩ.
Please refer to the appropriate platform design guidelines for bulk decoupling recommendations.
3.2.2
Voltage Planes
All VCC and VSS pins/balls must be connected to the appropriate voltage plane. All VCCT and VREF
pins/balls must be connected to the appropriate traces on the system electronics. In addition to the main
VCC, VCCT, and VSS power supply signals, PLL1 and PLL2 provide analog decoupling to the PLL
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section. PLL1 and PLL2 should be connected according to Figure 2. Do not connect PLL2 directly to
VSS. Appendix A contains the RLC filter specification.
Figure 2. PLL RLC Filter
L1
R1
PLL1
VCCT
C1
PLL2
3.2.3
V0027-01
Voltage Identification
There are five voltage identification balls/pins on the Mobile Intel Celeron Processor. These signals can
be used to support automatic selection of VCC voltages. They are needed to cleanly support voltage
specification variations on current and future processors. VID[4:0] are defined in Table 7. The voltages
specified in the VID table are the Battery Optimized Mode VCC voltages. The VID[4:0] signals are open
drain on the processor and need pull-up resistors to 3.3 V on the motherboard. Please refer to the mobile
VR guidelines provided by Intel for additional information.
Table 7. Mobile Intel Celeron Processor VID Values
VID[4:0]
VCC (V)
VID[4:0]
VCC (V)
VID[4:0]
VCC (V)
VID[4:0]
VCC (V)
00000
1.750
01000
1.350
10000
0.975
11000
0.775
00001
1.700
01001
1.300
10001
0.950
11001
0.750
00010
1.650
01010
1.250
10010
0.925
11010
0.725
00011
1.600
01011
1.200
10011
0.900
11011
0.700
00100
1.550
01100
1.150
10100
0.875
11100
0.675
00101
1.500
01101
1.100
10101
0.850
11101
0.650
00110
1.450
01110
1.050
10110
0.825
11110
0.625
00111
1.400
01111
1.000
10111
0.800
11111
0.600
Figure 3 shows the system level connections for the VTTPWRGD signal. Please refer to the appropriate
VR and system level guidelines provided by Intel for more details.
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Figure 3. VTTPWRGD System-Level Connections
Vcct
Vcct
Processor
Voltage Regulator
1k
Vcct
Vttpwrgd
(output)
Vttpwrgd
(input)
3.3V
100k
10k
Clock Generator
Vttpwrgd#
(input)
1.2V to 3.3V Level Shifter
3.2.4
VTTPWRGD Signal Quality Specification
The VTTPWRGD signal is an input to the processor used to determine that the VTT power is stable and
the VID and BSEL signals should be driven to their final state by the processor. To ensure the processor
correctly reads this signal, it must meet the following requirement while the signal is in its transition
region of 300 mV to 900 mV. Also, VTTPWRGD should only enter the transition region once, after
VTT is at nominal values, for the assertion of the signal.
Table 8. VTTPWRGD Noise Specification
Parameter
Specification
Amount of noise (glitch)
Less than 100 mV
In addition, the VTTPWRGD signal should have reasonable transition time through the transition region.
A sharp edge on the signal transition will minimize the chance of noise causing a glitch on this signal.
Intel recommends the following transition time for the VTTPWRGD signal.
Table 9. VTTPWRGD Transition Time Specification
Parameter
Recommendation
Transition time (300 mV to 900 mV)
3.2.4.1
Less than or equal to 100 µs
Transition Region
The transition region covered by this requirement is 300 mV to 900 mV. Once the VTTPWRGD signal
is in that voltage range, the processor is more sensitive to noise, which may be present on the signal.
The transition region when the signal first crosses the 300 mV voltage level and continues until the last
time it is below 900 mV.
3.2.4.2
Transition Time
The transition time is defined as the time the signal takes to move through the transition region. A
100-µs transition time will ensure that the processor receives a good transition edge.
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3.2.4.3
Noise
The signal quality of the VTTPWRGD signal is critical to the correct operation of the processor. Every
effort should be made to ensure this signal is monotonic in the transition region. If noise or glitches are
present on this signal, it must be kept to less than 100 mV of a voltage drop from the highest voltage
level received to that point. This glitch must remain less than 100 mV until the excursion ends by the
voltage returning to the highest voltage previously received. Please see Figure 4 for an example graph of
this situation and requirements.
Figure 4. Noise Estimation
3.3
System Bus Clock and Processor Clocking
The BCLK and BCLK# clock inputs directly control the operating speed of the system bus interface. All
system bus timing parameters are specified with respect to the crossing point of the rising edge of the
BCLK input and falling edge of the BCLK# input. The Mobile Intel Celeron Processor core frequency is
a multiple of the BCLK frequency. The processor core frequency is configured during manufacturing.
The configured bus ratio is visible to software in the Power-on configuration register. See Section 7.2 for
details.
Multiplying the bus clock frequency is necessary to increase performance while allowing for easier
distribution of signals within the system. Clock multiplication within the processor is provided by the
internal Phase Lock Loop (PLL), which requires constant frequency BCLK and BCLK# inputs. During
Reset or on exit from the Deep Sleep state, the PLL requires some amount of time to acquire the phase
of BCLK and BCLK#. This time is called the PLL lock latency, which is specified in Section 3.6, AC
timing parameters T18 and T47.
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3.4
Maximum Ratings
Table 10 contains the Mobile Intel Celeron Processor stress ratings. Functional operation at the absolute
maximum and minimum is neither implied nor guaranteed. The processor should not receive a clock
while subjected to these conditions. Functional operating conditions are provided in the AC and DC
tables. Extended exposure to the maximum ratings may affect device reliability. Furthermore, although
the processor contains protective circuitry to resist damage from static electric discharge, one should
always take precautions to avoid high static voltages or electric fields.
Table 10. Mobile Intel Celeron Processor Absolute Maximum Ratings
Symbol
Parameter
Max
Unit
Notes
TStorage
Storage Temperature
–40
85
°C
VCC(Abs)
Supply Voltage with respect to VSS
–0.5
1.75
V
VCCT
System Bus Buffer Voltage with respect to VSS
–0.3
1.75
V
VIN GTL
System Bus Buffer DC Input Voltage with respect to VSS
–0.3
1.75
V
Notes 2, 3
VIN125
1.25 V Buffer DC Input Voltage with respect to VSS
–0.3
1.75
V
Note 4
VIN15
1.5 V Buffer DC Input Voltage with respect to VSS
–0.3
2.0
V
Note 5
VIN18
1.8 V Buffer DC Input Voltage with respect to VSS
–0.3
2.0
V
Note 6
VIN20
2.0 V Buffer DC Input Voltage with respect to VSS
–0.3
2.4
V
Note 7
Note 1
VIN25
2.5 V Buffer DC Input Voltage with respect to VSS
–0.3
3.3
V
Note 9
VINVID
VID ball/pin DC Input Voltage with respect to VSS
—
3.465
V
Note 8
-0.3
3.6
mA
Note 8
IVID
VID Current
NOTES:
1. The shipping container is only rated for 65°C.
2.
3.
4.
5.
6.
7.
8.
9.
3.5
Min
Parameter applies to the AGTL signal groups only. Compliance with both VIN GTL specifications is required.
The voltage on the AGTL signals must never be below –0.3 V or above 1.75 V with respect to ground.
Parameter applies to CLKREF, TESTHI, VTTPWRGD signals.
Parameter applies to CMOS, Open-drain, APIC, TESTLO and TAP bus signal groups only.
Parameter applies to PWRGOOD signal.
Parameter applies to PICCLK signal.
Parameter applies to each VID pin/ball individually.
Parameter applies to BCLK signal in Single Ended Clocking Mode.
DC Specifications
Table 11 through Table 24 list the DC specifications for the Mobile Intel Celeron Processor.
Specifications are valid only while meeting specifications for the junction temperature, clock frequency,
and input voltages. The junction temperature range for all DC specifications is 0°C to 100°C unless
otherwise noted. Care should be taken to read all notes associated with each parameter. Unlike the
Mobile Intel Pentium III Processor, the Vcc tolerances for the Mobile Intel Celeron Processor are not
specified as a percentage of nominal. The tolerances are instead specified in the form of load lines for
the static and transient cases in Table 12 through Table 21. Illustration of the load lines is shown in
Figure 5 through Figure 8.
26
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 11. Power Specifications for Mobile Intel Celeron Processor1
Symbol
VCC
VCC,DC
VCCT
Parameter
Min
Transient VCC for core logic
Static VCC for core logic
Typ
Max
Unit
Notes
1.10
1.15
1.40
1.45
1.50
V
V
V
V
V
Note 11
Notes 9, 10
Notes 9, 10
Notes 9, 10
Notes 9, 10
1.10
1.15
1.40
1.45
1.50
V
V
V
V
V
Note 11
Notes 9, 10
Notes 9, 10
Notes 9, 10
Notes 9, 10
VCC for System Bus Buffers, Transient tolerance
1.138
1.25
1.362
V
± 9%, Notes 7,10
VCCT,DC
VCC for System Bus Buffers, Static tolerance
1.188
1.25
1.312
V
±5%, Notes 2,10
ICC
Current for VCC at core frequency
A
800 MHz & 1.10V
733 MHz & 1.10 V
700 MHz & 1.10 V
650 MHz & 1.10 V
650 MHz & 1.15 V
667 MHz & 1.15 V
733 MHz & 1.15 V
866 MHz & 1.15 V
1.00 GHz & 1.40 V
1.26 GHz & 1.40V
1.06 GHz & 1.45 V
1.13 GHz & 1.45 V
1.20 GHz & 1.45 V
1.33 GHz & 1.50 V
7.58
7.98
7.89
7.58
10.52
10.68
11.27
10.03
18.27
18.75
18.67
19.14
19.63
15.90
ICCT
Current for VCCT
2.7
ICC,AH
Processor Auto Halt current at
1.10 V
1.15 V
1.40 V
1.45 V
1.50 V
3.09
5.42
8.85
10.20
10.73
ICC,QS
Processor Quick Start current at
1.10 V
1.15 V
1.40 V
1.45 V
1.50 V
2.91
5.16
8.53
9.80
9.90
ICC,DSLP
Processor Deep Sleep Leakage current at
1.10 V
1.15 V
1.40 V
1.45 V
1.50 V
2.65
4.79
8.04
9.20
9.20
ILVID
VID leakage current
0.5
Notes 4, 11
Notes 4, 11
Notes 4, 11
Notes 4, 11
Note 4
Note 4
Note 4
Note 4
A
Notes 3, 4
A
Note 4
Notes 4, 11
A
Note 4
Notes 4, 11
A
Note 4
Notes 4, 11
mA
Note 8
dICC/dt
VCC power supply current slew rate
400
A/µs Notes 5, 6
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies. Processors will comply
with the ICCx,max specification for the current mode of operation.
2. Static voltage regulation includes: DC output initial voltage set point adjust, output ripple and noise, temperature
and warm up.
3. ICCT is the current supply for the system bus buffers, including the on-die termination.
298517-006
Datasheet
27
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
4. ICCx,max specifications are specified at VCC static (typical) derived from the tolerances in Table 12 through Table
19, VCCT,max, Tjmax, and under maximum signal loading conditions.
5. Based on simulations and averaged over the duration of any change in current. Use to compute the maximum
inductance and reaction time of the voltage regulator. This parameter is not tested.
6. Maximum values specified by design/characterization at nominal VCC and VCCT.
7. VCCx must be within this range under all operating conditions, including maximum current transients. VCCx must
return to within the static voltage specification, VCCx,DC, within 100 µs after a transient event.
8. VID leakage current is < 100 µA for VID voltages under 3.0 V.
9. Typical VCC indicates the VID encoded voltage. Voltage supplied must conform to the load line specification
shown in Table 12 through Table 19.
10. Voltages are measured at the processor socket pin for the Micro-FCPGA part and at the package ball on the
Micro-FCBGA part.
11. This specification applies only to the Ultra Low Voltage Mobile Intel Celeron Processor.
Table 12. VCC Tolerances for the Low Voltage Mobile Intel Celeron Processor: VID = 1.15 V
VCC (V)
ICC (A)
28
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.150
1.125
1.175
1.105
1.195
1.0
1.146
1.121
1.171
1.101
1.191
2.0
1.142
1.117
1.167
1.097
1.187
3.0
1.138
1.113
1.163
1.093
1.183
4.0
1.134
1.109
1.159
1.089
1.179
5.0
1.130
1.105
1.155
1.085
1.175
6.0
1.126
1.101
1.151
1.081
1.171
7.0
1.122
1.097
1.147
1.077
1.167
8.0
1.118
1.093
1.143
1.073
1.163
9.0
1.114
1.089
1.139
1.069
1.159
10.0
1.110
1.085
1.135
1.065
1.155
11.0
1.106
1.081
1.131
1.061
1.151
12.0
1.102
1.077
1.127
1.057
1.147
13.0
1.098
1.073
1.123
1.053
1.143
14.0
1.094
1.069
1.119
1.049
1.139
15.0
1.090
1.065
1.115
1.045
1.135
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 13. VCC Tolerances for the Low Voltage Mobile Intel Celeron Processor in the Deep Sleep
State: VID = 1.15 V
VCC (V)
ICC (A)
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.114
1.089
1.139
1.069
1.159
1.0
1.110
1.085
1.135
1.065
1.155
2.0
1.106
1.081
1.131
1.061
1.151
3.0
1.102
1.077
1.127
1.057
1.147
4.0
1.098
1.073
1.123
1.053
1.143
5.0
1.094
1.069
1.119
1.049
1.139
6.0
1.090
1.065
1.115
1.045
1.135
Table 14. VCC Tolerances for the Ultra Low Voltage Mobile Intel Celeron Processor: VID = 1.1 V
VCC (V)
ICC (A)
298517-006
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.100
1.075
1.125
1.055
1.145
1.0
1.096
1.071
1.121
1.051
1.141
2.0
1.092
1.067
1.117
1.047
1.137
3.0
1.088
1.063
1.113
1.043
1.133
4.0
1.084
1.059
1.109
1.039
1.129
5.0
1.080
1.055
1.105
1.035
1.125
6.0
1.076
1.051
1.101
1.031
1.121
7.0
1.072
1.047
1.097
1.027
1.117
8.0
1.068
1.043
1.093
1.023
1.113
9.0
1.064
1.039
1.089
1.019
1.109
10.0
1.060
1.035
1.085
1.015
1.105
11.0
1.056
1.031
1.081
1.011
1.101
12.0
1.052
1.027
1.077
1.007
1.097
13.0
1.048
1.023
1.073
1.003
1.093
Datasheet
29
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 15. VCC Tolerances for the Ultra Low Voltage Mobile Intel Celeron Processor in the Deep
Sleep State: VID = 1.1 V
VCC (V)
ICC (A)
30
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.068
1.043
1.093
1.023
1.113
1.0
1.064
1.039
1.089
1.019
1.109
2.0
1.060
1.035
1.085
1.015
1.105
3.0
1.056
1.031
1.081
1.011
1.101
4.0
1.052
1.027
1.077
1.007
1.097
5.0
1.048
1.023
1.073
1.003
1.093
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 16. VCC Tolerances for the Mobile Intel Celeron Processor: VID = 1.40 V
VCC (V)
ICC (A)
298517-006
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.400
1.375
1.425
1.355
1.445
1.0
1.396
1.371
1.421
1.351
1.441
2.0
1.392
1.367
1.417
1.347
1.437
3.0
1.388
1.363
1.413
1.343
1.433
4.0
1.384
1.359
1.409
1.339
1.429
5.0
1.380
1.355
1.405
1.335
1.425
6.0
1.376
1.351
1.401
1.331
1.421
7.0
1.372
1.347
1.397
1.327
1.417
8.0
1.368
1.343
1.393
1.323
1.413
9.0
1.364
1.339
1.389
1.319
1.409
10.0
1.360
1.335
1.385
1.315
1.405
11.0
1.356
1.331
1.381
1.311
1.401
12.0
1.352
1.327
1.377
1.307
1.397
13.0
1.348
1.323
1.373
1.303
1.393
14.0
1.344
1.319
1.369
1.299
1.389
15.0
1.340
1.315
1.365
1.295
1.385
16.0
1.336
1.311
1.361
1.291
1.381
17.0
1.332
1.307
1.357
1.287
1.377
18.0
1.328
1.303
1.353
1.283
1.373
19.0
1.324
1.299
1.349
1.279
1.369
20.0
1.320
1.295
1.345
1.275
1.365
21.0
1.316
1.291
1.341
1.271
1.361
22.0
1.312
1.287
1.337
1.267
1.357
23.0
1.308
1.283
1.333
1.263
1.353
Datasheet
31
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 17. VCC Tolerances for the Mobile Intel Celeron Processor in the Deep Sleep State: VID =
1.40 V
VCC (V)
ICC (A)
32
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.338
1.313
1.363
1.293
1.383
1.0
1.334
1.309
1.359
1.289
1.379
2.0
1.330
1.305
1.355
1.285
1.375
3.0
1.326
1.301
1.351
1.281
1.371
4.0
1.322
1.297
1.347
1.277
1.367
5.0
1.318
1.293
1.343
1.273
1.363
6.0
1.314
1.289
1.339
1.269
1.359
7.0
1.310
1.285
1.335
1.265
1.355
8.0
1.306
1.281
1.331
1.261
1.351
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 18. VCC Tolerances for the Mobile Intel Celeron Processor: VID = 1.45 V
VCC (V)
ICC (A)
298517-006
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.450
1.425
1.475
1.405
1.495
1.0
1.446
1.421
1.471
1.401
1.491
2.0
1.442
1.417
1.467
1.397
1.487
3.0
1.438
1.413
1.463
1.393
1.483
4.0
1.434
1.409
1.459
1.389
1.479
5.0
1.430
1.405
1.455
1.385
1.475
6.0
1.426
1.401
1.451
1.381
1.471
7.0
1.422
1.397
1.447
1.377
1.467
8.0
1.418
1.393
1.443
1.373
1.463
9.0
1.414
1.389
1.439
1.369
1.459
10.0
1.410
1.385
1.435
1.365
1.455
11.0
1.406
1.381
1.431
1.361
1.451
12.0
1.402
1.377
1.427
1.357
1.447
13.0
1.398
1.373
1.423
1.353
1.443
14.0
1.394
1.369
1.419
1.349
1.439
15.0
1.390
1.365
1.415
1.345
1.435
16.0
1.386
1.361
1.411
1.341
1.431
17.0
1.382
1.357
1.407
1.337
1.427
18.0
1.378
1.353
1.403
1.333
1.423
19.0
1.374
1.349
1.399
1.329
1.419
20.0
1.370
1.345
1.395
1.325
1.415
21.0
1.366
1.341
1.391
1.321
1.411
22.0
1.362
1.337
1.387
1.317
1.397
23.0
1.358
1.333
1.383
1.313
1.393
Datasheet
33
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 19. VCC Tolerances for the Mobile Intel Celeron Processor in the Deep Sleep State: VID =
1.45 V
VCC (V)
ICC (A)
34
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.388
1.363
1.413
1.343
1.433
1.0
1.384
1.359
1.409
1.339
1.429
2.0
1.380
1.355
1.405
1.335
1.425
3.0
1.376
1.351
1.401
1.331
1.421
4.0
1.372
1.347
1.397
1.327
1.417
5.0
1.368
1.343
1.393
1.323
1.413
6.0
1.364
1.339
1.389
1.319
1.409
7.0
1.360
1.335
1.385
1.315
1.405
8.0
1.356
1.331
1.381
1.31
1.401
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 20. VCC Tolerances for the Mobile Intel Celeron Processor: VID = 1.50 V
VCC (V)
ICC (A)
298517-006
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.50
1.475
1.525
1.455
1.545
1.0
1.496
1.471
1.521
1.451
1.541
2.0
1.492
1.467
1.517
1.447
1.537
3.0
1.488
1.463
1.513
1.443
1.533
4.0
1.484
1.459
1.509
1.439
1.529
5.0
1.480
1.455
1.505
1.435
1.525
6.0
1.476
1.451
1.501
1.431
1.521
7.0
1.472
1.447
1.497
1.427
1.517
8.0
1.468
1.443
1.493
1.423
1.513
9.0
1.464
1.439
1.489
1.419
1.509
10.0
1.460
1.435
1.485
1.415
1.505
11.0
1.456
1.431
1.481
1.411
1.501
12.0
1.452
1.427
1.477
1.407
1.497
13.0
1.448
1.423
1.473
1.403
1.493
14.0
1.444
1.419
1.469
1.399
1.489
15.0
1.440
1.415
1.465
1.395
1.485
16.0
1.436
1.411
1.461
1.391
1.481
17.0
1.432
1.407
1.457
1.387
1.477
18.0
1.428
1.403
1.453
1.383
1.473
19.0
1.424
1.399
1.449
1.379
1.469
20.0
1.420
1.395
1.445
1.375
1.465
21.0
1.416
1.391
1.441
1.371
1.461
22.0
1.412
1.387
1.437
1.367
1.457
23.0
1.408
1.383
1.433
1.363
1.453
Datasheet
35
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 21. VCC Tolerances for the Mobile Intel Celeron Processor in the Deep Sleep State: VID =
1.50 V
VCC (V)
ICC (A)
36
Static
Transient
Typ
Min
Max
Min
Max
0.0
1.438
1.413
1.463
1.393
1.483
1.0
1.434
1.409
1.459
1.389
1.479
2.0
1.430
1.405
1.455
1.385
1.475
3.0
1.426
1.401
1.451
1.381
1.471
4.0
1.422
1.397
1.447
1.377
1.467
5.0
1.418
1.393
1.443
1.373
1.463
6.0
1.414
1.389
1.439
1.369
1.459
7.0
1.410
1.385
1.435
1.365
1.455
8.0
1.406
1.381
1.431
1.361
1.451
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 5. Illustration of VCC Static and Transient Tolerances (VID = 1.15 V)
1.250
Transient Maximum
Static Maximum
1.200
Static Typical
1.150
V
C
C
1.100
Static Minimum
1.050
Transient Minimum
1.000
0.950
0.0
1.0
2.0
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
11.0
12.0
13.0
14.0
15.0
ICC
Figure 6. Illustration of Deep Sleep VCC Static and Transient Tolerances (VID Setting = 1.15 V)
1.180
Transient Maximum
Static Maximum
1.160
Static Typical
1.140
1.120
1.100
V
C 1.080
C
1.060
Static Minimum
1.040
1.020
Transient Minimum
1.000
0.980
0
1
2
3
4
5
6
ICC
298517-006
Datasheet
37
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 7. Illustration of VCC Static and Transient Tolerances (VID = 1.40 V)
1.500
Transient Maximum
1.450
Static Maximum
1.400
Static Typical
Vcc (V)
1.350
1.300
Static Minimum
Transient Minimum
1.250
1.200
9.
0
10
.0
11
.0
12
.0
13
.0
14
.0
15
.0
16
.0
17
.0
18
.0
19
.0
20
.0
21
.0
22
.0
23
.0
8.
0
7.
0
6.
0
5.
0
4.
0
3.
0
2.
0
1.
0
0.
0
1.150
Icc (A)
38
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 8. Illustration of Deep Sleep VCC Static and Transient Tolerances (VID Setting = 1.40 V)
1.430
Transient Maxim um
Static Maxim um
Static Typical
1.380
Vcc (V)
1.330
1.280
Transient Minim um
Static Minim um
1.230
1.180
0
1
2
3
4
5
6
7
8
Icc (A)
298517-006
Datasheet
39
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 22. AGTL Signal Group DC Specifications
Symbol
Parameter
Min
Max
VIL
Input Low Voltage
-0.15
VIH
Input High Voltage
VREF+0.2 VCCT
VREF-0.2
VOH
Output High Voltage
—
RON
Output Low Drive Strength
Unit
Notes
V
V
See VCCT,max in Table 11
—
V
See VCCT,max in Table 11
16.67
Ω
Note 2
IL
Leakage Current for Inputs, Outputs and I/Os
100
Note 1
µA
NOTES:
1. Specification applies to leakage high only, for pins with on die RTT, (0 < VIN/OUT ≤ VCCT).
2. Refer to IBIS models for I/V characteristics.
Table 23. AGTL Bus DC Specifications
Symbol
VCCT
Parameter
Min
Bus Termination Voltage
Typ
Max
1.25
VREF
Input Reference Voltage
2
RTT
Bus Termination Strength
50
/3VCCT – 2%
V
2
2
56
65
/3VCCT
Unit
/3VCCT + 2% V
Ω
Notes
Note 1
±2%, Note 2
On-die RTT, Note 3
NOTES:
1. Please refer to Table 11 for minimum and maximum values.
40
2.
VREF should be created from VCCT by a voltage divider.
3.
The RESET# signal does not have an on-die RTT. It requires an off-die 56.2 Ω ±1% terminating resistor
connected to VCCT.
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 24. CLKREF, APIC, TAP, CMOS, and Open-drain Signal Group DC Specifications
Symbol
VIL15
Parameter
Min
Input Low Voltage, 1.5 V CMOS
Max
–0.15
VCMOSREFmin
– 300 mV
0.36
Unit
Notes
V
VIL18
Input Low Voltage, 1.8 V CMOS
–0.36
V
Notes 1, 2
VIH15
Input High Voltage, 1.5 V CMOS
VCMOSREFmax + 2.0
250 mV
V
Note 10
VIH15PICD
Input High Voltage, 1.5 V PICD[1:0]
VCMOSREFmax + 2.0
200 mV
V
Note 11
VIH18
Input High Voltage, 1.8 V CMOS
1.44
2.0
V
Notes 1, 2
VOH15
Output High Voltage, 1.5 V CMOS
N/A
1.615
V
All outputs are Open-drain
VOH33
Output High Voltage, 3.3 V signals
2.0
3.465
V
3.3V + 5%
VOL33
Output Low Voltage, 3.3 V signals
0.8
V
VOL
Output Low Voltage
0.3
V
Note 8
VCMOSREF
CMOSREF Voltage
0.90
1.10
V
Note 4
VCLKREF
CLKREF Voltage
1.187
1.312
V
Note 9
VILVTTPWR
Input Low Voltage, VTTPWRGD
0.4
V
Note 7
VIHVTTPWR
Input High Voltage, VTTPWRGD
V
Note 7
30
Ω
Note 3
mA
Note 6
µA
Note 5
1.0
RON
IOL
Output Low Current
IL
Leakage Current for Inputs, Outputs
and I/Os
10
±100
NOTES:
1. Parameter applies to the PWRGOOD signal only.
2. VIlx,min and VIhx,max only apply when BCLK, BCLK# and PICCLK are stopped. PICCLK should be stopped in the
low state. See Table 33 and Table 34 for DC levels when BCLK and BCLK# are stopped.
3. Measured at 9 mA.
4. VCMOSREF should be created from a stable 1.5-V supply using a voltage divider. It must track the voltage supply
to maintain noise immunity. The same 1.5-V supply should be used to power the chipset CMOS I/O buffers that
drive these signals.
5. (0 ≤ VIN/OUT ≤ VIhx,max).
6. Specified as the minimum amount of current that the output buffer must be able to sink. However, VOL,max cannot
be guaranteed if this specification is exceeded.
7. Parameter applies to VTTPWRGD signal only.
8. Applies to non-AGTL signals except BCLK, PWRGOOD, PICCLK, BSEL[1:0], VID[4:0].
9. ±5% DC tolerance. CLKREF must be generated from the 2.5-V supply used to generate the BCLK signal. AC
Tolerance must be less than –40 dB @ 1 MHz.
10. Applies to all TAP and CMOS signals (not to APIC signals).
11. Applies to PICD[1:0].
3.6
AC Specifications
3.6.1
System Bus, Clock, APIC, TAP, CMOS, and Open-drain AC
Specifications
All system bus AC specifications for the AGTL signal group are relative to the crossing point of the
rising edge of the BCLK input and falling edge of the BCLK# input. All AGTL timings are referenced to
VREF for both “0” and “1” logic levels unless otherwise specified. All APIC, TAP, CMOS, and Opendrain signals except PWRGOOD are referenced to 1.0 V. All minimum and maximum specifications are
at points within the power supply ranges shown in Table 12 through Table 21 and junction temperatures
298517-006
Datasheet
41
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
(Tj) in the range 0°C to 100°C unless otherwise noted. Tj must be less than or equal to 100°C (or the
otherwise-noted given value) for all functional processor states.
Table 25. System Bus Clock AC Specifications (Differential) 1
Symbol
Parameter
Min
System Bus Frequency
Typ
Max
133
T1
BCLK Period – average
7.5
T1abs
BCLK Period – Instantaneous minimum
7.3
Unit
Figure
Notes
MHz
7.7
ns
8
Note 2
ns
8
Note 2
T2
BCLK Cycle to Cycle Jitter
200
ps
8
Notes 2, 3, 4
T5
BCLK Rise Time
175
467
ps
8
Notes 2, 6, 8
175
550
T6
BCLK Fall Time
175
467
ps
8
Notes 2, 6, 8
175
550
0.51
0.76
V
7
Note 7
325
ps
7
Note 5
Vcross for 1-V swing
Rise/Fall Time Matching
Notes 2, 6, 9
Notes 2, 6, 9
BCLK Duty Cycle
45%
55%
8
Note 2
NOTES:
1. All AC timings for AGTL and CMOS signals are referenced to the BCLK and BCLK# crossing point.
2. Measured on differential waveform: defined as (BCLK – BCLK#).
3. Not 100% tested. Specified by design/characterization.
4. Due to the difficulty of accurately measuring clock jitter in a system, it is recommended that the clock driver be
designed to meet a period stability specification into a test load of 10 pF to 20 pF. This should be measured on
the rising edge of adjacent BCLKs at the BCLK, BCLK# crossing point. The jitter present must be accounted for
as a component of BCLK skew between devices. Period difference is measured around 0-V crossing points.
5. Measurement taken from common mode waveform, measure rise/fall time from 0.41 to 0.86 V. Rise/fall time
matching is defined as “the instantaneous difference between maximum BCLK rise (fall) and minimum BCLK#
fall (rise) time, or minimum BCLK rise (fall) and maximum BCLK# fall (rise) time ”. This parameter is designed to
guard waveform symmetry.
6. Rise time is measured from –0.35 V to 0.35 V and fall time is measured from 0.35 V to –0.35 V.
7. Measured on common mode waveform – includes every rise/fall crossing.
8. Measured at the package ball for the Micro-FCBGA package.
9. Measured at the socket pin for the Micro-FCPGA package.
42
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 26. System Bus Clock AC Specifications (133 MHz, Single Ended) 1
Symbol
Parameter
Min
System Bus Frequency
Max
Unit
133
Figure
Notes
MHz
T1S
BCLK Period
7.5
7.65
ns
±250
ps
6
Note 2
T1Sabs
BCLK Period – Instantaneous Minimum
7.25
T2S
BCLK Period Stability
T3S
BCLK High Time
1.4
ns
6
at>2.0 V
T4S
BCLK Low Time
1.4
ns
6
at<0.5 V
T5S
BCLK Rise Time
0.4
ns
6
Note 5
Note 2
1.6
Notes 2, 3, 4
T6S
BCLK Fall Time
0.4
1.6
ns
6
Note 5
NOTES:
1. All AC timings for AGTL and CMOS signals are referenced to the BCLK rising edge at 1.25 V.
2. Period, jitter, skew and offset measured at 1.25 V.
3. Not 100% tested. Specified by design/characterization.
4. Measured on the rising edge of adjacent BCLKs at 1.25 V. The jitter present must be accounted for as a
component of BCLK skew between devices.
5. Measured between 0.5 V and 2.0 V.
Table 27. System Bus Clock AC Specifications (100 MHz, Single Ended)1
Symbol
Parameter
Min
System Bus Frequency
T1S1
BCLK Period
T1S1abs BCLK Period – Instantaneous
Minimum
T2S1
BCLK Period Stability
T3S1
BCLK High Time
Typ
Max
100
MHz
10
ns
9.75
±250
BCLK Low Time
2.45
T5S1
BCLK Rise Time
0.4
Figure
6
ns
2.70
T4S1
Unit
1.6
Note 2
Note 2
ps
ns
Notes
Notes 2, 3, 4
6
at>2.0 V
ns
6
at<0.5 V
ns
6
Note 5
T6S1
BCLK Fall Time
0.4
1.6
ns
6
Note 5
NOTES:
1. All AC timings for AGTL and CMOS signals are referenced to the BCLK rising edge at 1.25 V.
2. Period, jitter, skew and offset measured at 1.25 V.
3. Not 100% tested. Specified by design/characterization.
4. Measured on the rising edge of adjacent BCLKs at 1.25 V. The jitter present must be accounted for as a
component of BCLK skew between devices.
5. Measured between 0.5 V and 2.0 V.
298517-006
Datasheet
43
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 28. Valid Mobile Intel Celeron Processor Frequencies
BCLK Frequency
(MHz)
Frequency Multiplier
Core Frequency
(MHz)
Power-on Configuration
bits [27,25:22]
100
6.5
650
0, 1111
133
5.5
733
0, 0100
133
7.5
1000
0, 1101
133
8
1066
133
8.5
1133
133
9
1200
1, 0000
133
10
1333
1, 1011
NOTE:
44
0, 1010
1, 0110
While other combinations of bus and core frequencies are defined, operation at frequencies other than those
listed above will not be validated by Intel and are not guaranteed. The frequency multiplier is programmed
into the processor when it is manufactured, and it cannot be changed.
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 29. AGTL Signal Groups AC Specifications1
2
RTT = 56Ω internally terminated to VCCT; VREF = /3VCCT; load = 50 ohms
Symbol
Parameter
T7
AGTL Output Valid Delay
T8
AGTL Input Setup Time
Min
0.40
Max
3.25
0.95
Unit
Figure
ns
9
ns
10
1.30
T9
AGTL Input Hold Time
1
Notes
Notes 2, 3, 6
Note 7
ns
10
Note 4
T10
RESET# Pulse Width
1
ms
11,12
Note 5
NOTES:
1. All AC timings for AGTL signals are referenced to the crossing point of the BCLK rising edge and the BCLK#
falling edge for Differential Clocking and to the BCLK rising edge at 1.25 V for Single Ended Clocking. All AGTL
signals are referenced at VREF. Unless other specified, all timings apply to both 100-MHz and 133-MHz bus
frequencies.
2. RESET# can be asserted (active) asynchronously, but must be deasserted synchronously.
3. Specification is for a minimum 0.40-V swing from Vref-200 mV to Vref+200 mV.
4. Specification is for a maximum 0.8-V swing from Vcct-0.8 V to Vcct.
5. After VCC, VCCT, and BCLK, BCLK# become stable and PWRGOOD is asserted.
6. Applies to all processors supporting 133-MHz bus clock frequency except Ultra Low Voltage processors.
7. Applies to all processors supporting 100-MHz bus clock frequency and Ultra Low Voltage processors supporting
133-MHz bus clock frequency.
Table 30. CMOS and Open-drain Signal Groups AC Specifications1, 2
Symbol
Parameter
Min Max
Unit
Figure
Notes
T14
1.5V Input Pulse Width, except PWRGOOD and
LINT[1:0]
2
BCLKs
9
Active and inactive
states
T14B
LINT[1:0] Input Pulse Width
6
BCLKs
9
Note 3
T15
PWRGOOD Inactive Pulse Width
2
12
Note 4,5
µs
NOTES:
1. All AC timings for CMOS and Open-drain signals are referenced to the crossing point of the BCLK rising edge
and BCLK# falling edge for Differential Clocking and to the rising edge of BCLK at 1.25 V for Single Ended
Clocking. All CMOS and Open-drain signals are referenced at 1.0 V.
2. Minimum output pulse width on CMOS outputs is 2 BCLKs.
3. This specification only applies when the APIC is enabled and the LINT1 or LINT0 signal is configured as an
edge triggered interrupt with fixed delivery, otherwise specification T14 applies.
4. When driven inactive, or after VCC, VCCT and BCLK, BCLK# become stable. PWRGOOD must remain below
VIL18,MAX until all the voltage planes meet the voltage tolerance specifications in Table 12 through Table 21 and
BCLK, BCLK# have met the BCLK, BCLK# AC specifications in Table 35 and Table 36 for at least 2 µs.
PWRGOOD must rise error-free and monotonically to 1.8 V.
5. If the BCLK Settling Time specification (T60) can be guaranteed at power-on reset then the PWRGOOD
Inactive Pulse Width specification (T15) is waived and BCLK may start after PWRGOOD is asserted.
PWRGOOD must still remain below VIL25,max until all the voltage planes meet the voltage tolerance
specifications.
298517-006
Datasheet
45
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 31. Reset Configuration AC Specifications and Power On/Power Down Timings
Symbol
Min Typ Max
Unit
Figure
Notes
BCLKs 11
Before deassertion of
RESET#
BCLKs 11
After clock that
deasserts RESET#
1
ms
12
Before deassertion of
1
RESET#
1
ms
12
ms
12
µs
12
BCLK
11
T16
Reset Configuration Signals (A[15:5]#,
BREQ0#, FLUSH#, INIT#, PICD0) Setup
Time
T17
Reset Configuration Signals (A[15:5]#,
2
BREQ0#, FLUSH#, INIT#, PICD0) Hold Time
T18
RESET#/PWRGOOD Setup Time
T18A
VCCT to VTTPWRGD Setup Time
T18B
VCC to PWRGOOD Setup Time
T18C
BSEL, VID valid time before VTTPWRGD
assertion
1
T18D
RESET# inactive to Valid Outputs
1
T18E
RESET# inactive to Drive Signals
4
T19A
Time from VCC(nominal)-12% to PWRGOOD
low
T19B
All outputs valid after PWRGOOD low
T19C
T20A
Time from VCCT-12% to VTTPWRGD low
T20B
All outputs valid after VTTPWRGD low
T20C
All inputs required valid after VTTPWRGD low 0
ns
14
T20D
VID, BSEL signals valid after VTTPWRGD
low
ns
14
T20E
VTTPWRGD Transition Time
NOTE:
46
Parameter
4
20
10
BCLKs 11
0
ns
13
0
ns
13
All inputs required valid after PWRGOOD low 0
ns
13
0
0
0
ns
14
ns
14
100 µs
VCC(nominal) is the VID
voltage setting
Measurement from 300
mV to 900 mV. Amount of
noise (glitch) less than
100 mV. See Section
4.3.1 for details
At least 1 ms must pass after PWRGOOD rises above VIH18min and BCLK, BCLK# meet their AC timing
specification until RESET# may be deasserted.
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 32. APIC Bus Signal AC Specifications 1
Symbol
Parameter
Min
Max
Unit
T21
PICCLK Frequency
2
33.3
MHz
T22
PICCLK Period
30
500
ns
Figure
Notes
Note 2
6
T23
PICCLK High Time
10.5
ns
6
at>1.6 V
T24
PICCLK Low Time
10.5
ns
6
at<0.4 V
T25
PICCLK Rise Time
0.25
3.0
ns
6
(0.4 V – 1.6 V)
T26
PICCLK Fall Time
0.25
3.0
T27
PICD[1:0] Setup Time
8.0
T28
PICD[1:0] Hold Time
2.5
T29
PICD[1:0] Valid Delay (Rising
Edge)
1.5
8.7
1.5
12.0
PICD[1:0] Valid Delay (Falling
Edge)
ns
6
(1.6 V – 0.4 V)
ns
9
Note 3
ns
9
Note 3
ns
8
Notes 3, 4
NOTES:
1. All AC timings for APIC signals are referenced to the PICCLK rising edge at 1.0 V. All CMOS signals are
referenced at 1.0 V.
2. The minimum frequency is 2 MHz when PICD0 is at 1.5 V at reset Referenced to PICCLK Rising Edge.
3. For Open-drain signals, Valid Delay is synonymous with Float Delay.
4. Valid delay timings for these signals are specified into 150 Ω to 1.5 V and 0 pF of external load. For real system
timings these specifications must be derated for external capacitance at 105 ps/pF.
298517-006
Datasheet
47
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 33. TAP Signal AC Specifications1
Symbol
Parameter
Min
Max
Unit
T30
TCK Frequency
—
16.67 MHz
T31
TCK Period
60
—
T32
TCK High Time
T33
TCK Low Time
T34
TCK Rise Time
Figure
Notes
ns
6
25.0
ns
6
25.0
ns
6
≤ VCMOSREF-0.2V, Note 2
ns
6
(VCMOSREF-0.2V) –
5.0
≥ VCMOSREF+0.2V, Note 2
(VCMOSREF+0.2V),
Notes 2, 3
T35
TCK Fall Time
5.0
ns
6
(VCMOSREF+0.2V) –
(VCMOSREF-0.2V) ,
Notes 2, 3
T36
TRST# Pulse Width
40.0
T37
TDI, TMS Setup Time
5.0
ns
15
Note 4
T38
TDI, TMS Hold Time
14.0
ns
15
Note 4
T39
TDO Valid Delay
1.0
T40
TDO Float Delay
T41
All Non-Test Outputs Valid Delay
T42
All Non-Test Outputs Float Delay
T43
All Non-Test Inputs Setup Time
2.0
ns
16
Asynchronous, Note 2
10.0
ns
15
Notes 5, 6
25.0
ns
15
Notes 2, 5, 6
25.0
ns
15
Notes 5, 7, 8
25.0
ns
15
Notes 2, 5, 7, 8
ns
15
Notes 4, 7, 8
5.0
T44
All Non-Test Inputs Hold Time
13.0
ns
15
Notes 4, 7, 8
NOTES:
1. All AC timings for TAP signals are referenced to the TCK rising edge at 1.0 V. All TAP and CMOS signals are
referenced at 1.0 V.
2. Not 100% tested. Specified by design/characterization.
3. 1 ns can be added to the maximum TCK rise and fall times for every 1 MHz below 16 MHz.
4. Referenced to TCK rising edge.
5. Referenced to TCK falling edge.
6. Valid delay timing for this signal is specified into 150 Ω terminated to 1.5 V and 0 pF of external load. For real
system timings these specifications must be derated for external capacitance at 105 ps/pF.
7. Non-Test Outputs and Inputs are the normal output or input signals (except TCK, TRST#, TDI, TDO, and TMS).
These timings correspond to the response of these signals due to boundary scan operations.
8. During Debug Port operation use the normal specified timings rather than the TAP signal timings.
Table 34. Quick Start/Deep Sleep AC Specifications1
Symbol
Parameter
Min Max
T45
Quick Start Cycle Completion to Clock Stop or
DPSLP# assertion
100
T46
Quick Start Cycle Completion to Input Signals Stable
T47
Deep Sleep PLL Lock Latency
0
T48
STPCLK# Hold Time from PLL Lock
0
Unit
Figure
Notes
BCLKs 17, 18
0
µs
17, 18
30
µs
17, 18
ns
17, 18
Note 2
T49
Input Signal Hold Time from STPCLK# Deassertion 8
BCLKs 17, 18
NOTES:
1. Input signals other than RESET# and BPRI# must be held constant in the Quick Start state.
2. The BCLK, BCLK# Settling Time specification (T60) applies to Deep Sleep state exit under all conditions.
48
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 9. BCLK (Single Ended)/PICCLK/TCK Generic Clock Timing Waveform
Th
Tr
VH
CLK
VTRIP
VL
Tf
Tl
Tp
D0003-01
NOTES:
Tr=T5S, T5S1, T34, T25 (Rise Time)
Tf=T6S, T6S1, T35, T26 (Fall Time)
Th=T3S, T3S1, T32, T23 (High Time)
Tl=T4S, T4S1, T33, T24 (Low Time)
Tp=T1S, T1S1, T31, T22 (Period)
VTRIP=1.25V for BCLK (Single Ended);1.0V for PICCLK; 1.0V for TCK
VL=0.5V for BCLK (Single Ended);0.4V for PICCLK; (VCMOSREF-0.2V) for TCK
VH=2.0V for BCLK (Single Ended);1.6V for PICCLK; (VCMOSREF+0.2V) for TCK
Figure 10. Differential BCLK/BCLK# Waveform (Common Mode)
V2,V3 (max)
BCLK#
Vcross
BCLK
V1,V3 (min)
298517-006
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Mobile Intel® Celeron® Processor (0.13 µ) in
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Figure 11. BCLK/BCLK# Waveform (Differential Mode)
T1
VIH_DIFF
V4
0V
V5
VIl_DIFF
T5
T6
Figure 12. Valid Delay Timings
CLK
Vc
Vc
TX
Signal
Tx
V Valid
Valid
TPW
D0004-00
NOTES:
Tx = T7, T11, T29 (Valid Delay)
Tpw = T14, T14B (Pulse Width)
V = VREF for AGTL signal group; 1.0V for CMOS, Open-drain, APIC, and TAP signal groups
Vc = Crossing point of BCLK rising edge and BCLK# falling edge for BCLK references (Differential Clock)
= 1.25V (Single Ended Clock)
50
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 13. Setup and Hold Timings
Vc
CLK
Ts
Th
V Valid
Signal
D0005-00
NOTES:
Ts = T8, T27 (Setup Time)
Th = T9, T28 (Hold Time)
V = VREF for AGTL signals; 1.0V for CMOS, APIC, and TAP signals
Vc = Crossing point of BCLK rising edge and BCLK# falling edge for BCLK references (Differential Clock)
= 1.25V (Single Ended Clock)
Figure 14. Cold/Warm Reset and Configuration Timings
VC
BCLK
Tu
Tt
V
RESET#
Tv
Tx
Tw
Configuration
(A[15:5], BREQ0#,
FLUSH#, INIT#,
PICD0)
Valid
Ty
PICD[1:0]
AGTL/non-AGTL
outputs
Valid
Tz
Non-configuration
inputs
Active
D0006-02
NOTES:
Tt = T9 (AGTL Input Hold Time)
Tu = T8 (AGTL Input Setup Time)
Tv = T10 (RESET# Pulse Width)
Tw= T16 (Reset Configuration Signals (A[15:5]#, BREQ0#, FLUSH#, INIT#, PICD0) Setup Time)
Tx = T17 (Reset Configuration Signals (A[15:5]#, BREQ0#, FLUSH#, INIT#, PICD0) Hold Time)
Ty = T18D (RESET# inactive to Valid Outputs)
Tz = T18E (RESET# inactive to Drive Signals)
Vc= Crossing point of BCLK rising edge and BCLK# falling edge (Differential Clock)
= 1.25 V (Single Ended Clock)
298517-006
Datasheet
51
Mobile Intel® Celeron® Processor (0.13 µ) in
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Figure 15. Power-on Sequence and Reset Timings
BCLK/BCLK#
VCCT
Td
VTTPWRGD
VID[4:0]/
BSEL[1:0]
VIHVTTPWR,min
VILVTTPWR,max
Te
Valid
CMOSREF/
CLKREF/VREF
VCC
Tc
PWRGOOD
Ta
VIH18,min
VIL18,max
Tb
RESET#
V0040-00
NOTES:
Ta = T15 (PWRGOOD Inactive Pulse Width)
Tb = T18 (RESET#/PWRGOOD Setup Time)
Tc = T18B (Setup time from VCC valid until PWRGOOD assertion)
Td = T18A (Setup time from VCCT valid to VTTPWRGD assertion)
Te = T18C(VID, BSEL valid time before VTTPWRGD assertion)
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Figure 16. Power Down Sequencing and Timings (VCC Leading)
VCCT, VREF
VCCMOS,
CMOSREF,
CLKREF
VID[4:0]
BSEL[1:0]
VTTPWRGD
VCC-12%
VCC
BCLK/BCLK#
Valid
PICCLK
Valid
Ta
VIL18
PWRGOOD
RESET#
PICD[1:0]
Valid
Tb
AGTL OUTPUTS
OTHER CMOS OUTPUTS
Valid
ALL INPUTS
Valid
Tc
V0044-00
NOTES:
Ta = T19A (Time from VCC(nominal)-12% to PWRGOOD low)
Tb = T19B (All outputs valid after PWRGOOD low)
Tc = T19C (All inputs required valid after PWRGOOD low)
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Mobile Intel® Celeron® Processor (0.13 µ) in
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Figure 17.Power Down Sequencing and Timings (VCCT Leading)
VCCT-12%
VCCT, VREF
VCMOS,
CMOSREF,
CLKREF
Ta
VILVTTPWR
VTTPWRGD
VID[4:0]
BSEL[1:0]
Valid
VCC
Tb, Tc, Td
BCLK/BCLK#
Valid
PICCLK
Valid
PWRGOOD
RESET#
PICD[1:0]
Valid
AGTL OUTPUTS
OTHER CMOS OUTPUTS
Valid
ALL INPUTS
Valid
V0045-00
NOTES:
Ta = T20A (Time from VCCT-12% to VTTPWRGD low)
Tb = T20B (All outputs valid after VTTPWRGD low)
Tc = T20C (All inputs required valid after VTTPWRGD low)
Td = T20D (VID, BSEL signals valid after VTTPWRGD low)
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 18.Test Timings (Boundary Scan)
TCK
Tv
Tw
0.75V
TDI, TMS
Tr
Ts
Input
Signals
Tx
Tu
Ty
Tz
TDO
Output
Signals
D0008-01
NOTES:
Tr=T43 (All Non-Test Inputs Setup Time)
Ts=T44 (All Non-Test Inputs Hold Time)
Tu=T40 (TDO Float Delay)
Tv=T37 (TDI, TMS Setup Time)
Tw=T38 (TDI, TMS Hold Time)
Tx=T39 (TDO Valid Delay)
Ty=T41 (All Non-Test Outputs Valid Delay)
Tz=T42 (All Non-Test Outputs Float Delay)
Figure 19. Test Reset Timings
0.75V
TRST#
Tq
D0009-01
NOTE:
Tq=T36 (TRST# Pulse Width)
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Mobile Intel® Celeron® Processor (0.13 µ) in
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Figure 20. Quick Start/Deep Sleep Timing (BCLK Stopping Method)
Normal
Quick Start
BCLK
Deep Sleep
Normal
Stopped
Tv
STPCLK#
Tx
CPU bus
Quick Start
Ty
stpgnt
DPSLP#
Tz
Tw
Compatibility
Signals
Changing
Frozen
V00102-00
NOTES:
Tv=T45 (Stop Grant Acknowledge Bus Cycle Completion to Clock Shut Off Delay)
Tw=T46 (Setup Time to Input Signal Hold Requirement)
Tx=T47 (Deep Sleep PLL Lock Latency)
Ty=T48 (PLL lock to STPCLK# Hold Time)
Tz=T49 (Input Signal Hold Time)
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 21. Quick Start/Deep Sleep Timing (DPSLP# Assertion Method)
Normal
Quick Start
Deep Sleep
Quick Start
Normal
BCLK
Tv
STPCLK#
Tx
CPU bus
Ty
stpgnt
DPSLP#
Tz
Tw
Compatibility
Signals
Changing
Frozen
V00103-00
NOTES:
Tv=T45 (Stop Grant Acknowledge Bus Cycle Completion to DPSLP# assertion)
Tw=T46 (Setup Time to Input Signal Hold Requirement)
Tx=T47 (Deep Sleep PLL Lock Latency)
Ty=T48 (PLL lock to STPCLK# Hold Time)
Tz=T49 (Input Signal Hold Time)
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Mobile Intel® Celeron® Processor (0.13 µ) in
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4.
System Signal Simulations
Systems must be simulated using IBIS models to determine if they are compliant with this specification.
All references to BCLK signal quality also apply to BCLK# for Differential Clocking.
4.1
System Bus Clock (BCLK) and PICCLK DC
Specifications and AC Signal Quality
Specifications
Table 35. BCLK (Differential) DC Specifications and AC Signal Quality Specifications
Symbol
Parameter
Min
Max
Unit Figure
Notes
V1
VIL,BCLK
-0.2
0.35
V
7
Note 1
V2
VIH,BCLK
0.92
1.45
V
7
Note 1
V3
VIN Absolute Voltage Range
-0.2
1.45
V4
BCLK Rising Edge Ringback
0.35
V
7
Undershoot/Overshoot, Note 2
V
8
Note 3
8
V5
BCLK Falling Edge Ringback
-0.35
V
VBCLK_DPSLP
BCLK Voltage in Deep Sleep State 0.4
1.45
V
Note 4
VBCLK#_DPSLP
BCLK# Voltage in Deep Sleep
State
VBCLK_DPSLP V
Note 4
- 0.2 V
0
Note 3
NOTES:
1. The clock must rise/fall monotonically between VIL,BCLK and VIH,BCLK .
2. These specifications apply only when BCLK, BCLK# are running.
3. The rising and falling edge ringback voltage specified is the minimum (rising) or maximum (falling) voltage the
differential waveform can go to after passing the VIH_DIFF (rising) or VIL_DIFF (falling) levels. VIL_DIFF (max)
= -0.57 V, VIH_DIFF (min) = 0.57 V.
4. Applies when BCLK and BCLK# are stopped in Deep Sleep State.
Table 36. BCLK (Single Ended) DC Specifications and AC Signal Quality Specifications
Symbol
Parameter
V1
VIL,BCLK
V2
V3
V4
Min Max
Unit
Figure
20
Notes
0.3
V
Note 1
VIH,BCLK
2.2
V
20
Note 1
VIN Absolute Voltage Range
-0.5 3.1
V
20
Undershoot/Overshoot, Note 2
BCLK Rising Edge Ringback
2.0
V
20
Absolute Value, Note 3
V5
BCLK Falling Edge Ringback
0.5
V
20
Absolute Value, Note 3
NOTES:
1. The clock must rise/fall monotonically between VIL,BCLK and VIH,BCLK . BCLK must be stopped in the low state.
2. These specifications apply only when BCLK is running. BCLK may not be above VIH,BCLK,max or below VIL,BCLK,min
for more than 50% of the clock cycle.
3. The rising and falling edge ringback voltage specified is the minimum (rising) or maximum (falling) absolute
voltage the BCLK signal can go to after passing the VIH,BCLK (rising) or VIL,BCLK (falling) voltage limits.
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Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 37. PICCLK DC Specifications and AC Signal Quality Specifications
Symbol
Parameter
Min Max Unit
0.4
Figure
Notes
V1
VIL20
V
20
Note 1
V2
VIH20
1.6
V
20
Note 1
V3
VIN Absolute Voltage Range
-0.5 2.4
V
20
Undershoot, Overshoot, Note 2
V4
PICCLK Rising Edge Ringback
1.6
V
20
Absolute Value, Note 3
V5
PICCLK Falling Edge Ringback
0.4 V
20
Absolute Value, Note 3
NOTES:
1. The clock must rise/fall monotonically between VIL20 and VIH20.
2. These specifications apply only when PICCLK is running. See the DC specifications for when PICCLK is
stopped. PICCLK may not be above VIH20,max or below VIL20,min for more than 50% of the clock cycle.
3. The rising and falling edge ringback voltage specified is the minimum (rising) or maximum (falling) absolute
voltage the PICCLK signal can go to after passing the VIH20 (rising) or VIL20 (falling) voltage limits.
Figure 22. BCLK (Single Ended)/PICCLK Generic Clock Waveform
V3max
V4
V2
V1
V5
V3min
V0012-01
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4.2
AGTL AC Signal Quality Specifications
Ringback specifications for the AGTL signals are as follows: Ringback below VREF,max + 200 mV is not
authorized during low to high transitions. Ringback above VREF,min – 200 mV is not authorized during
high to low transitions.
Overshoot and undershoot specifications are documented in Table 38 and Table 39 and illustrated in
Figure 23.
Figure 23. Maximum Acceptable Overshoot/Undershoot Waveform
Time Dependant Overshoot
Max
Vss
Min
Time Dependant Undershoot
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 38. 133-MHz AGTL Signal Group Overshoot/Undershoot Tolerance at the Processor Core
Max VCCT + Overshoot/Undershoot
Magnitude (volts)
Allowed Pulse Duration (ns) [Tj=100C (see Note 7)]
Activity Factor = 0.01
Activity Factor = 0.1
Activity Factor = 1
1.78
1.5
0.15
0.015
1.73
3.5
0.35
0.035
1.68
7.2
0.72
0.072
1.63
15
1.5
0.15
1.58
15
3.2
0.32
1.53
15
6.5
0.65
1.48
15
14
1.40
NOTES:
1. Under no circumstances should the sum of the Max VCCT and absolute value of the Overshoot/Undershoot
voltage exceed 1.78 V.
2. Activity factor of 1 represents the same toggle rate as the 133-MHz clock.
3. Ringbacks below VCCT cannot be subtracted from overshoots. Lesser undershoot does not allocate longer or
larger overshoot.
4. Ringbacks above ground cannot be subtracted from undershoots. Lesser overshoot does not allocate longer or
larger undershoot.
5. System designers are encouraged to follow Intel provided AGTL layout guidelines.
6. All values are specified by design characterization and are not tested.
7. Tj = 85°C for 1.33 GHz.
Table 39. 100-MHz AGTL Signal Group Overshoot/Undershoot Tolerance at the Processor Core
Max VCCT + Overshoot/Undershoot
Magnitude (volts)
Allowed Pulse Duration (ns) [Tj=100C (see Note 7)]
Activity Factor = 0.01
Activity Factor = 0.1
Activity Factor = 1
1.78
1.6
0.16
0.016
1.73
4.5
0.45
0.045
1.68
9.5
0.95
0.095
1.63
20
2.0
0.2
1.58
20
4.2
0.42
1.53
20
8.5
0.85
1.48
20
19
1.9
NOTES:
1. Under no circumstances should the sum of the Max VCCT and absolute value of the Overshoot/Undershoot
voltage exceed 1.78 V.
2. Activity factor of 1 represents the same toggle rate as the 100-MHz clock.
3. Ringbacks below VCCT cannot be subtracted from overshoots. Lesser undershoot does not allocate longer or
larger overshoot.
4. Ringbacks above ground cannot be subtracted from undershoots. Lesser overshoot does not allocate longer or
larger undershoot.
5. System designers are encouraged to follow Intel provided AGTL layout guidelines.
6. All values are specified by design characterization and are not tested.
7. Tj = 85°C for 1.33 GHz.
4.3
Non-AGTL Signal Quality Specifications
Signals driven to the Mobile Intel Celeron Processor should meet signal quality specifications to ensure
that the processor reads data properly and that incoming signals do not affect the long-term reliability of
the processor. The overshoot and undershoot specifications for non-AGTL signals are shown in Table
40. Ringback must not exceed the CMOS VIH and VIL specification levels in Table 24.
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Mobile Intel® Celeron® Processor (0.13 µ) in
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Table 40. Non-AGTL Signal Group Overshoot/Undershoot Tolerance at the Processor Core
Max VCmos + Overshoot/Undershoot
Magnitude (volts)
Allowed Pulse Duration (ns) [Tj=100C (see note 6)]
Activity Factor = 0.01
Activity Factor = 0.1
Activity Factor = 1
0.065
2.38
6.5
0.65
2.33
13
1.3
0.13
2.28
29
2.9
0.29
2.23
60
6
0.6
2.18
60
12
1.2
2.13
60
26
2.6
2.08
60
56
5.6
NOTES:
1. VCMOS(nominal) = 1.5 V.
2. Under no circumstances should the sum of the Max VCMOS and absolute value of the Overshoot/Undershoot
voltage exceed 2.38 V.
3. Activity factor of 1 represents a toggle rate of 33 MHz.
4. System designers are encouraged to follow Intel provided non-AGTL layout guidelines.
5. All values are specified by design characterization, and are not tested.
6. Tj = 85°C for 1.33 GHz.
4.3.1
PWRGOOD, VTTPWRGD Signal Quality Specifications
The processor requires PWRGOOD to be a clean indication that clocks and the power supplies (VCC,
VCCT, etc.) are stable and within their specifications. Clean implies that the signal will remain below
VIL18 and without errors from the time that the power supplies are turned on, until they come within
specification. The signal will then transition monotonically to a high (1.8 V) state. The VTTPWRGD
signal must also transition monotonically.
The VTTPWRGD signal is an input to the processor used to determine that the VTT power is stable and
the VID and BSEL signals should be driven to their final state by the processor. To ensure the processor
correctly reads this signal, the processor must meet the requirement shown in Table 41 while the signal
is in its transition region of 300 mV to 900 mV. Also, VTTPWRGD should only enter the transition
region once, after VTT is at nominal values, for the assertion of the signal.
4.3.1.1
VTTPWRGD Noise Parameter Specification
Table 41. VTTPWRGD Noise Parameter Specification
Parameter
Specification
Amount of noise (glitch)
Less than 100 mV
In addition, the VTTPWRGD signal should have reasonable transition time through the transition region.
A sharp edge on the signal transition will minimize the chance of noise causing a glitch on this signal.
Intel recommends the following transition time for the VTTPWRGD signal.
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
4.3.1.2
VTTPWRGD Transition Parameter Recommendation
Table 42. VTTPWRGD Transition Parameter Recommendation
Parameter
Recommendation
Transition time (300 mV to 900 mV)
Less than or equal to 100 µs
In addition, the VTT_PWRGD signal should have reasonable transition time through the transition
region. A sharp edge on the signal transition will minimize the chance of noise causing a glitch on this
signal. Intel recommends the following transition time for the VTT_PWRGD signal.
4.3.1.2.1
Transition Region
The transition region covered by this requirement is 300 mV to 900 mV. Once the VTTPWRGD signal
is in that voltage range, the processor is more sensitive to noise, which may be present on the signal. The
transition region when the signal first crosses the 300-mV voltage level and continues until the last time
it is below 900 mV.
4.3.1.2.2
Transition Time
The transition time is defined as the time the signal takes to move through the transition region. A
100-µs transition time will ensure that the processor receives a good transition edge.
4.3.1.2.3
Noise
The signal quality of the VTTPWRGD signal is critical to the correct operation of the processor. Every
effort should be made to ensure this signal is monotonic in the transition region. If noise or glitches are
present on this signal, the noise or glitches must be kept to less than 100 mV of a voltage drop from the
highest voltage level received to that point. This glitch must remain less than 100 mV until the excursion
ends by the voltage returning to the highest voltage previously received. Please see Figure 24 for an
example graph of this situation and requirements.
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Mobile Intel® Celeron® Processor (0.13 µ) in
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Figure 24. VTTPWRGD Noise Specification
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
5.
Mechanical Specifications
5.1
Socketable Micro-FCPGA Package
The Mobile Intel Celeron Processor is packaged in a 478-pin Micro-FCPGA package. The Low Voltage
and Ultra Low Voltage processors will not be available in this package. The mechanical specifications
for the socketable package are provided in Table 43. Figure 25 through Figure 27 illustrate different
views of the package.
Table 43. Socketable Micro-FCPGA Package Specification
Symbol
A
Parameter
Min
Max
2.03
Unit
Overall height, top of die to package seating plane
1.81
-
Overall height, top of die to PCB surface, including socket(1)
4.69
5.15
mm
A1
Pin length
1.95
2.11
mm
A2
Die height
B
Pin diameter
0.28
0.36
mm
D
Package substrate length
34.9
35.1
mm
E
Package substrate width
34.9
35.1
mm
D1
Die length
3
mm
0.854
11.18
mm
mm
4
10.82
E1
3
Die width
7.20
mm
4
6.85
e
Pin pitch
K
Package edge keep-out
K1
Package corner keep-out
7
mm
K3
Pin-side capacitor boundary
14
mm
<=0.254
mm
-
Pin tip radial true position
N
Pin count
Pdie
Allowable pressure on the die for thermal solution
-
W
Package weight
4.5
1.27
mm
5
mm
478
Package surface Flatness
each
689
kPa
g
0.286
mm
NOTES:
1. All dimensions are subject to change.
2. Overall height with socket is based on design dimensions of the Micro-FCPGA package and socket with no
thermal solution attached. Values were based on design specifications and tolerances. This dimension is
subject to change based on socket design, OEM motherboard design, or OEM SMT process.
3. Dimension for CPUID = 0x06B1.
4. Dimension for CPUID = 0x06B4.
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Figure 25. Socketable Micro-FCPGA Package - Top and Bottom Isometric Views
PACKAGE KEEPOUT
CAPACITOR AREA
DIE
LABEL
TOP VIEW
66
BOTTOM VIEW
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Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 26. Socketable Micro-FCPGA Package - Top and Side View
SUBSTRATE KEEPOUT ZONE
DO NOT CONTACT PACKAGE
INSIDE THIS LINE
7 (K1)
8 places
5 (K)
4 places
A
1.25 MAX
(A3)
D1
35 (D)
Ø 0.32 (B)
478 places
E1
35 (E)
A2
PIN A1 CORNER
2.03 ± 0.08
(A1)
NOTE: All dimensions in millimeters. Values shown are for reference only. See Table 36 for specific details
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Mobile Intel® Celeron® Processor (0.13 µ) in
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Figure 27. Socketable Micro-FCPGA Package - Bottom View
14 (K3)
AF
AD
AB
Y
V
T
P
M
K
H
F
D
B
AE
AC
AA
W
U
R
14 (K3)
N
L
J
G
E
C
A
1
25X 1.27
(e)
3
2
5
4
7
6
9
8
10
11 13 15 17 19 21 23
25
12 14 16 18 20 22 24 26
25X 1.27
(e)
NOTE : All dimensions in millimeters. Values shown are for reference only. See Table 36 for specific details.
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
5.2
Surface Mount Micro-FCBGA Package
The Mobile Intel Celeron Processor will also be available in a surface mount, 479-ball Micro-FCBGA
package. The Low Voltage and Ultra Low Voltage processors will be available only in this package.
The Mobile Intel Celeron processors at 1.45V and 1.5V will not be available in this package.
Mechanical specifications are shown in Table 44. Figure 28 through Figure 30 illustrate different views
of the package.
The Micro-FCBGA package may have capacitors placed in the area surrounding the die. Because the
die-side capacitors are electrically conductive, and only slightly shorter than the die height, care should
be taken to avoid contacting the capacitors with electrically conductive materials. Doing so may short
the capacitors, and possibly damage the device or render it inactive. The use of an insulating material
between the capacitors and any thermal solution should be considered to prevent capacitor shorting.
Table 44. Micro-FCBGA Package Mechanical Specifications
Symbol
Parameter
Min
Max
2.27
2.77
Unit
A
Overall height, as delivered (1)
mm
A2
Die height
0.854
b
Ball diameter
0.78
D
Package substrate length
34.9
35.1
mm
E
Package substrate width
34.9
35.1
mm
D1
Die length
3
mm
mm
mm
11.18
4
10.82
E1
3
Die width
mm
7.20
4
6.85
e
Ball pitch
1.27
mm
N
Ball count
479
each
K
Keep-out outline from edge of package
5
mm
K1
Keep-out outline at corner of package
7
mm
K2
Capacitor keep-out height
S
Package edge to first ball center
-
--
Solder ball coplanarity
Pdie
Allowable pressure on the die for thermal solution
0.7
1.625
0.2
-
mm
mm
mm
689
kPa
W
Package weight
4.5
g
NOTES:
1. All dimensions are subject to change.
2. Overall height as delivered. Values were based on design specifications and tolerances. Final height after
surface mount depends on OEM motherboard design and SMT process.
3. Dimension for CPUID = 0x06B1.
4. Dimension for CPUID = 0x06B4.
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Figure 28. Micro-FCBGA Package – Top and Bottom Isometric Views
PACKAGE KEEPOUT
CAPACITOR AREA
LABEL
DIE
TOP VIEW
70
BOTTOM VIEW
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Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Figure 29. Micro-FCBGA Package – Top and Side Views
SUBSTRATE KEEPOUT ZONE
DO NOT CONTACT PACKAGE
INSIDE THIS LINE
7 (K1)
8 places
5 (K)
4 places
0.20
A
A2
D1
35 (D)
Ø 0.78 (b)
479 places
E1
35 (E)
K2
PIN A1 CORNER
NOTE: All dimensions in millimeters. Values shown are for reference only. See Table 37 for specific details.
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Figure 30. Micro-FCBGA Package - Bottom View
1.625 (S)
4 places
AF
AD
AB
Y
V
T
P
M
K
H
F
D
B
AE
AC
1.625 (S)
4 places
AA
W
U
R
N
L
J
G
E
C
A
1
25X 1.27
(e)
3
2
5
4
7
6
9
8
10
11 13 15 17 19 21 23 25
12 14 16 18 20 22 24 26
25X 1.27
(e)
NOTE: All dimensions in millimeters. Values shown are for reference only. See Table 37 for specific details.
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
5.3
Signal Listings
Figure 31 is a top-side view of the ball or pin map of the Mobile Intel Celeron Processor with the voltage
balls/pins called out. Table 45 lists the signals in ball/pin number order. Table 46 lists the signals in
signal name order.
Figure 31. Pin/Ball Map - Top View
1
2
3
4
5
NC
A10#
VREF
NC
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
A27#
A24#
NC
A35#
A26#
A33#
A32#
D0#
D2#
D15#
D9#
D7#
VREF
D8#
D10#
D11#
VSS
VCCT
A
A
A31# BREQ0# A23#
B
B
NC
VSS
A25#
VSS
A17#
VSS
A21#
VSS
A20#
VSS
A18#
VSS
A34#
NC
A16#
A28#
NC
VCCT
A19#
VCCT
A22#
VCCT
A30#
VCCT
A29#
VCCT BERR# VCCT
VSS RESET# VSS
D1#
VSS
D4#
VSS
D17#
VSS
D18#
D14#
D24#
VSS
D6#
VCCT
D12#
VCCT
D5#
VCCT
NC
VSS
D20#
VSS
D30#
NC
VSS
A13#
VSS
VCCT
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
D3#
D13#
D22#
NC
NC
TESTHI
VCC
VCCT
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
D16#
D23#
VSS
D19#
NC
VSS
A14#
VSS
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
D21#
D36#
D27#
A9#
A5#
A15#
VCCT
VCC
VSS
VCC
VSS
VCCT
D25#
VSS
D32#
A12#
VSS
A8#
VSS
VSS
VCC
VSS
VCC
VSS
D26#
D29#
VREF
A4#
A7#
A11#
VCCT
VCC
VSS
VCC
VSS
VCCT
D34#
VSS
D38#
C
C
D
D
E
F
VTT
VCCT
PWRGD
E
F
G
G
H
H
J
J
K
K
A3#
VSS
A6#
VSS
VSS
VCC
VSS
VCC
VSS
D31#
D33#
D35#
NC
VSS
VCC
VSS
VCCT
D28#
VSS
D42#
L
L
REQ4# BNR# REQ1# VCCT
M
M
TESTLO VSS
VSS
VSS
RSP#
VCC
VSS
VCC
VSS
D39#
D45#
D48#
VREF
PLL2
PLL1
NC
VCC
VSS
VCC
VSS
VCCT
NC
VSS
D37#
NC
VSS
API#
NC
NC
VCC
VSS
VCC
VSS
D49#
D41#
NC
VID4
VSS
VCC
VSS
VCC
VSS
VCCT
D43#
VSS
D44#
RP#
VSS
VCC
VSS
VCC
VSS
D47#
D57#
D51#
VSS
VCC
VSS
VCC
VSS
VCCT
D52#
VSS
D40#
VSS
VCC
VSS
VCC
VSS
D63#
D46#
D55#
VCC
VSS
VCC
VSS
VCCT
D59#
VSS
D54#
VSS
VCC
VSS
D58#
D53#
D60#
N
N
P
P
R
R
REQ0# BPRI#
T
T
REQ2#
VSS DEFER#
U
U
REQ3# HITM#
RS2#
V
V
RS1#
VSS
LOCK# VCCT
W
W
TRDY# AERR# DBSY#
VSS
Y
Y
DRDY#
VSS
RS0# TESTLO VSS
VCC
VREF
HIT#
ADS#
VCCT
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCCT
D62#
VSS
D50#
VID0
VSS
AP0#
PWR
GOOD
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
D61#
D56#
VREF
BCLK
VID1
A20M# VCCT
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCC
VSS
VCCT
DEP3#
VSS
DEP6#
BCLK# /
CLKREF
VSS
SMI#
CMOS
REF
VCCT
TDI
TCK
TDO
VCCT
NC
VCCT
LINT0 NCTRL PICD1
VCCT
PICD0
VSS
VID2
VCCT STPCLK# VSS
INIT#
VSS
NC
VSS
BSEL0
VSS
LINT1
RTT
IMPEDP
VSS
VCCT
VSS
VCCT
VCCT
VID3
BSEL1 TESTHI CMOS THRMDATHRMDC TRST# EDGE
REF
CTRLP
NC
NC
1
2
3
17
18
AA
AA
AB
AC
AD
AB
AC
NC
AE
AD
VCCT IGNNE#
NC
VSS
VSS
AF
VCC
298517-006
IERR# FLUSH# FERR#
4
VSS
5
6
TMS DPSLP# VREF
7
8
VCCT Other
9
10
11
12
13
14
15
16
VCCT BPM1# BPM0#
NC
DEP7# DEP1# DEP5#
BP3#
VSS
DEP0# DEP2#
AE
VSS
PRDY#
VSS
AF
PREQ# PICCLK VREF
19
20
21
BP2#
22
BINIT# DEP4#
23
VSS
VSS
25
26
24
Note : A2 pin is de-populated on Micro-FCPGA package
Datasheet
73
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 45. Signal Listing in Order by Pin/Ball Number
No.
74
Signal Name
No.
Signal Name
No.
Signal Name
No.
Signal Name
A3
A10#
B18
VSS
D7
VSS
E22
VSS
A4
VREF
B19
D4#
D8
VCC
E23
D16#
A5
NC
B20
VSS
D9
VSS
E24
D23#
A6
A31#
B21
D17#
D10
VCC
E25
VSS
A7
BREQ0#
B22
VSS
D11
VSS
E26
D19#
A8
A23#
B23
D18#
D12
VCC
F1
NC
A9
A27#
B24
D14#
D13
VSS
F2
VSS
A10
A24#
B25
D24#
D14
VCC
F3
A14#
A11
NC
B26
VSS
D15
VSS
F4
VSS
A12
A35#
C1
NC
D16
VCC
F5
VSS
A13
A26#
C2
A16#
D17
VSS
F6
VCC
A14
A33#
C3
A28#
D18
VCC
F7
VSS
A15
A32#
C4
NC
D19
VSS
F8
VCC
A16
D0#
C5
VCCT
D20
VCC
F9
VSS
A17
D2#
C6
A19#
D21
VSS
F10
VCC
A18
D15#
C7
VCCT
D22
VCC
F11
VSS
A19
D9#
C8
A22#
D23
D3#
F12
VCC
A20
D7#
C9
VCCT
D24
D13#
F13
VSS
A21
VREF
C10
A30#
D25
D22#
F14
VCC
A22
D8#
C11
VCCT
D26
NC
F15
VSS
A23
D10#
C12
A29#
E1
NC
F16
VCC
A24
D11#
C13
VCCT
E2
TESTHI
F17
VSS
A25
VSS
C14
BERR#
E3
VTTPWRGD
F18
VCC
A26
VCCT
C15
VCCT
E4
VCCT
F19
VSS
B1
NC
C16
D6#
E5
VCC
F20
VCC
B2
VSS
C17
VCCT
E6
VCCT
F21
VSS
B3
A25#
C18
D12#
E7
VCC
F22
VCC
B4
VSS
C19
VCCT
E8
VSS
F23
VSS
B5
A17#
C20
D5#
E9
VCC
F24
D21#
B6
VSS
C21
VCCT
E10
VSS
F25
D36#
B7
A21#
C22
NC
E11
VCC
F26
D27#
B8
VSS
C23
VSS
E12
VSS
G1
A9#
B9
A20#
C24
D20#
E13
VCC
G2
A5#
B10
VSS
C25
VSS
E14
VSS
G3
A15#
B11
A18#
C26
D30#
E15
VCC
G4
VCCT
B12
VSS
D1
NC
E16
VSS
G5
VCC
B13
A34#
D2
VSS
E17
VCC
G6
VSS
B14
VSS
D3
A13#
E18
VSS
G21
VCC
B15
RESET#
D4
VSS
E19
VCC
G22
VSS
B16
VSS
D5
VCCT
E20
VSS
G23
VCCT
B17
D1#
D6
VCC
E21
VCC
G24
D25#
Datasheet
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
No.
298517-006
Signal Name
G25
VSS
G26
H1
No.
Signal Name
No.
P23
Signal Name
VSS
No.
V2
Signal Name
L4
VCCT
VSS
D32#
L5
NC
P24
D49#
V3
LOCK#
A12#
L6
VSS
P25
D41#
V4
VCCT
H2
VSS
L21
VCC
P26
NC
V5
VSS
H3
A8#
L22
VSS
R1
REQ0#
V6
VCC
H4
VSS
L23
VCCT
R2
BPRI#
V21
VSS
H5
VSS
L24
D28#
R3
VID4
V22
VCC
H6
VCC
L25
VSS
R4
VSS
V23
VSS
H21
VSS
L26
D42#
R5
VCC
V24
D63#
H22
VCC
M1
TESTLO
R6
VSS
V25
D46#
H23
VSS
M2
VSS
R21
VCC
V26
D55#
H24
D26#
M3
VSS
R22
VSS
W1
TRDY#
H25
D29#
M4
VSS
R23
VCCT
W2
AERR#
H26
VREF
M5
RSP#
R24
D43#
W3
DBSY#
J1
A4#
M6
VCC
R25
VSS
W4
VSS
J2
A7#
M21
VSS
R26
D44#
W5
VCC
J3
A11#
M22
VCC
T1
REQ2#
W6
VSS
J4
VCCT
M23
VSS
T2
VSS
W21
VCC
J5
VCC
M24
D39#
T3
DEFER#
W22
VSS
J6
VSS
M25
D45#
T4
RP#
W23
VCCT
J21
VCC
M26
D48#
T5
VSS
W24
D59#
J22
VSS
N1
VREF
T6
VCC
W25
VSS
J23
VCCT
N2
PLL2
T21
VSS
W26
D54#
J24
D34#
N3
PLL1
T22
VCC
Y1
DRDY#
J25
VSS
N4
NC
T23
VSS
Y2
VSS
J26
D38#
N5
VCC
T24
D47#
Y3
RS0#
K1
A3#
N6
VSS
T25
D57#
Y4
TESTLO
K2
VSS
N21
VCC
T26
D51#
Y5
VSS
K3
A6#
N22
VSS
U1
REQ3#
Y6
VCC
K4
VSS
N23
VCCT
U2
HITM#
Y21
VSS
K5
VSS
N24
NC
U3
RS2#
Y22
VCC
K6
VCC
N25
VSS
U4
VSS
Y23
VSS
K21
VSS
N26
D37#
U5
VCC
Y24
D58#
K22
VCC
P1
NC
U6
VSS
Y25
D53#
K23
VSS
P2
VSS
U21
VCC
Y26
D60#
K24
D31#
P3
API#
U22
VSS
AA1
VREF
K25
D33#
P4
NC
U23
VCCT
AA2
HIT#
K26
D35#
P5
NC
U24
D52#
AA3
ADS#
L1
REQ4#
P6
VCC
U25
VSS
AA4
VCCT
L2
BNR#
P21
VSS
U26
D40#
AA5
VCC
L3
REQ1#
P22
VCC
V1
RS1#
AA6
VSS
Datasheet
75
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
No.
AA7
76
Signal Name
No.
Signal Name
No.
Signal Name
No.
VCC
AB22
VCC
AD11
TDO
AA8
VSS
AB23
VSS
AD12
VCCT
AF1
VCCT
AA9
VCC
AB24
D61#
AD13
NC
AF2
VCCT
AA10
VSS
AB25
D56#
AD14
VCCT
AF3
VID3
AA11
VCC
AB26
VREF
AD15
LINT0
AF4
IERR#
AA12
VSS
AC1
BCLK
AD16
NCTRL
AF5
FLUSH#
AA13
VCC
AC2
VID1
AD17
PICD1
AF6
FERR#
AA14
VSS
AC3
A20M#
AD18
VCCT
AF7
TMS
AA15
VCC
AC4
VCCT
AD19
PICD0
AF8
DPSLP#
AA16
VSS
AC5
VCC
AD20
VCCT
AF9
VREF
AA17
VCC
AC6
VSS
AD21
BPM1#
AF10
BSEL1
AA18
VSS
AC7
VCC
AD22
BPM0#
AF11
TESTHI
AA19
VCC
AC8
VSS
AD23
NC
AF12
CMOSREF
AA20
VSS
AC9
VCC
AD24
DEP7#
AF13
THRMDA
AA21
VCC
AC10
VSS
AD25
DEP1#
AF14
THRMDC
AA22
VSS
AC11
VCC
AD26
DEP5#
AF15
TRST#
AA23
VCCT
AC12
VSS
AE1
VSS
AF16
EDGECTRLP
AA24
D62#
AC13
VCC
AE2
VID2
AF17
NC
AA25
VSS
AC14
VSS
AE3
VCCT
AF18
NC
AA26
D50#
AC15
VCC
AE4
STPCLK#
AF19
PREQ#
AB1
VID0
AC16
VSS
AE5
VSS
AF20
PICCLK
AB2
VSS
AC17
VCC
AE6
INIT#
AF21
VREF
AB3
AP0#
AC18
VSS
AE7
VSS
AF22
BP2#
AB4
PWRGOOD
AC19
VCC
AE8
NC
AF23
BINIT#
AB5
VSS
AC20
VSS
AE9
VSS
AF24
DEP4#
AB6
VCC
AC21
VCC
AE10
NC
AF25
VSS
AB7
VSS
AC22
VSS
AE11
VSS
AF26
VSS
AB8
VCC
AC23
VCCT
AE12
BSEL0
AB9
VSS
AC24
DEP3#
AE13
VSS
AB10
VCC
AC25
VSS
AE14
LINT1
AB11
VSS
AC26
DEP6#
AE15
AB12
VCC
AD1
BCLK#/CLKREF AE16
VSS
VSS
RTTIMPEDP
AB13
VSS
AD2
VSS
AE17
VSS
AB14
VCC
AD3
SMI#
AE18
VCCT
AB15
VSS
AD4
NC
AE19
VSS
AB16
VCC
AD5
CMOSREF
AE20
BP3#
AB17
VSS
AD6
VCCT
AE21
VSS
AB18
VCC
AD7
TDI
AE22
PRDY#
AB19
VSS
AD8
VCCT
AE23
VSS
AB20
VCC
AD9
IGNNE#
AE24
DEP0#
AB21
VSS
AD10
TCK
AE25
DEP2#
Datasheet
AE26
Signal Name
298517-006
Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 46. Signal Listing in Order by Signal Name
No.
298517-006
Signal Name
Signal Buffer Type
No.
Signal Name
Signal Buffer Type
K1
A3#
AGTL I/O
AF23
BINIT#
AGTL I/O
J1
A4#
AGTL I/O
L2
BNR#
AGTL I/O
G2
A5#
AGTL I/O
AF22
BP2#
AGTL I/O
K3
A6#
AGTL I/O
AE20
BP3#
AGTL I/O
J2
A7#
AGTL I/O
AD22
BPM0#
AGTL I/O
H3
A8#
AGTL I/O
AD21
BPM1#
AGTL I/O
G1
A9#
AGTL I/O
R2
BPRI#
AGTL Input
A3
A10#
AGTL I/O
A7
BREQ0#
AGTL I/O
J3
A11#
AGTL I/O
AE12
BSEL0
3.3 V CMOS Output
H1
A12#
AGTL I/O
AF10
BSEL1
3.3 V CMOS Output
D3
A13#
AGTL I/O
AD5
CMOSREF
CMOS Reference Voltage
F3
A14#
AGTL I/O
AF12
CMOSREF
CMOS Reference Voltage
G3
A15#
AGTL I/O
A16
D0#
AGTL I/O
C2
A16#
AGTL I/O
B17
D1#
AGTL I/O
B5
A17#
AGTL I/O
A17
D2#
AGTL I/O
B11
A18#
AGTL I/O
D23
D3#
AGTL I/O
C6
A19#
AGTL I/O
B19
D4#
AGTL I/O
B9
A20#
AGTL I/O
C20
D5#
AGTL I/O
B7
A21#
AGTL I/O
C16
D6#
AGTL I/O
C8
A22#
AGTL I/O
A20
D7#
AGTL I/O
A8
A23#
AGTL I/O
A22
D8#
AGTL I/O
A10
A24#
AGTL I/O
A19
D9#
AGTL I/O
B3
A25#
AGTL I/O
A23
D10#
AGTL I/O
A13
A26#
AGTL I/O
A24
D11#
AGTL I/O
A9
A27#
AGTL I/O
C18
D12#
AGTL I/O
C3
A28#
AGTL I/O
D24
D13#
AGTL I/O
C12
A29#
AGTL I/O
B24
D14#
AGTL I/O
C10
A30#
AGTL I/O
A18
D15#
AGTL I/O
A6
A31#
AGTL I/O
E23
D16#
AGTL I/O
A15
A32#
AGTL I/O
B21
D17#
AGTL I/O
A14
A33#
AGTL I/O
B23
D18#
AGTL I/O
B13
A34#
AGTL I/O
E26
D19#
AGTL I/O
A12
A35#
AGTL I/O
C24
D20#
AGTL I/O
AC3
A20M#
1.5V CMOS Input
F24
D21#
AGTL I/O
AA3
ADS#
AGTL I/O
D25
D22#
AGTL I/O
W2
AERR#
AGTL I/O
E24
D23#
AGTL I/O
AB3
AP0#
AGTL I/O
B25
D24#
AGTL I/O
P3
AP1#
AGTL I/O
G24
D25#
AGTL I/O
AC1
BCLK
Clock Input
H24
D26#
AGTL I/O
AD1
BCLK#/CLKREF
Clock Input
F26
D27#
AGTL I/O
C14
BERR#
AGTL I/O
L24
D28#
AGTL I/O
Datasheet
77
Mobile Intel® Celeron® Processor (0.13 µ) in
Micro-FCBGA and Micro-FCPGA Packages Datasheet
No.
H25
78
Signal Name
D29#
Signal Buffer Type
AGTL I/O
No.
AF24
Signal Name
DEP4#
Signal Buffer Type
AGTL I/O
C26
D30#
AGTL I/O
AD26
DEP5#
AGTL I/O
K24
D31#
AGTL I/O
AC26
DEP6#
AGTL I/O
G26
D32#
AGTL I/O
AD24
DEP7#
AGTL I/O
K25
D33#
AGTL I/O
Y1
DRDY#
AGTL I/O
J24
D34#
AGTL I/O
AF8
DPSLP#
1.5 V CMOS Input
K26
D35#
AGTL I/O
AF16
EDGECTRLP
AGTL Control
F25
D36#
AGTL I/O
AF6
FERR#
1.5 V Open Drain Output
N26
D37#
AGTL I/O
AF5
FLUSH#
1.5 V CMOS Input
J26
D38#
AGTL I/O
AA2
HIT#
AGTL I/O
M24
D39#
AGTL I/O
U2
HITM#
AGTL I/O
U26
D40#
AGTL I/O
AF4
IERR#
1.5 V Open Drain Output
P25
D41#
AGTL I/O
AD9
IGNNE#
1.5 V CMOS Input
L26
D42#
AGTL I/O
AE6
INIT#
1.5 V CMOS Input
R24
D43#
AGTL I/O
AD15
INTR/LINT0
1.5 V CMOS Input
R26
D44#
AGTL I/O
V3
LOCK#
AGTL I/O
M25
D45#
AGTL I/O
AE14
NMI/LINT1
1.5 V CMOS Input
V25
D46#
AGTL I/O
AD16
NCTRL
AGTL impedance control
T24
D47#
AGTL I/O
AF20
PICCLK
1.8 V APIC Clock Input
M26
D48#
AGTL I/O
AD19
PICD0
1.5 V Open Drain I/O
P24
D49#
AGTL I/O
AD17
PICD1
1.5 V Open Drain I/O
AA26
D50#
AGTL I/O
N3
PLL1
PLL Analog Voltage
T26
D51#
AGTL I/O
N2
PLL2
PLL Analog Voltage
U24
D52#
AGTL I/O
AE22
PRDY#
AGTL Output
Y25
D53#
AGTL I/O
AF19
PREQ#
1.5 V CMOS Input
1.8 V CMOS Input
W26
D54#
AGTL I/O
AB4
PWRGOOD
V26
D55#
AGTL I/O
R1
REQ0#
AGTL I/O
AB25
D56#
AGTL I/O
L3
REQ1#
AGTL I/O
T25
D57#
AGTL I/O
T1
REQ2#
AGTL I/O
Y24
D58#
AGTL I/O
U1
REQ3#
AGTL I/O
W24
D59#
AGTL I/O
L1
REQ4#
AGTL I/O
Y26
D60#
AGTL I/O
B15
RESET#
AGTL Input
AB24
D61#
AGTL I/O
T4
RP#
AGTL I/O
AA24
D62#
AGTL I/O
Y3
RS0#
AGTL I/O
V24
D63#
AGTL I/O
V1
RS1#
AGTL I/O
W3
DBSY#
AGTL I/O
U3
RS2#
AGTL I/O
T3
DEFER#
AGTL Input
M5
RSP#
AGTL Input
AE24
DEP0#
AGTL I/O
AE16
RTTIMPEDP
AGTL Pull-up Control
AD25
DEP1#
AGTL I/O
AD3
SMI#
1.5 V CMOS Input
AE25
DEP2#
AGTL I/O
AE4
STPCLK#
1.5 V CMOS Input
AC24
DEP3#
AGTL I/O
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Mobile Intel® Celeron® Processor (0.13 µ)
Micro-FCBGA and Micro-FCPGA Packages Datasheet
No.
AD10
Signal Name
Signal Buffer Type
No.
Signal Name
Signal Buffer Type
TCK
1.5V JTAG Clock Input
AC2
VID1
Voltage Identification
AD7
TDI
AD11
TDO
JTAG Input
AE2
VID2
Voltage Identification
JTAG Output
AF3
VID3
Voltage Identification
E2
TESTHI
Test Use Only
R3
VID4
Voltage Identification
AF11
TESTHI
Test Use Only
A4
VREF
AGTL Reference Voltage
M1
TESTLO
Test Use Only
A21
VREF
AGTL Reference Voltage
Y4
TESTLO
Test Use Only
N1
VREF
AGTL Reference Voltage
AF13
THERMDA
Thermal Diode Anode
AF9
VREF
AGTL Reference Voltage
AF14
THERMDC
Thermal Diode Cathode AF21
VREF
AGTL Reference Voltage
AF7
TMS
JTAG Input
AA1
VREF
AGTL Reference Voltage
W1
TRDY#
AGTL I/O
AB26
VREF
AGTL Reference Voltage
AF15
TRST#
JTAG Input
H26
VREF
AGTL Reference Voltage
AB1
VID0
Voltage Identification
E3
VTTPWRGD
VCCT power good signal
Table 47. Voltage and No-Connect Pin/Ball Locations
Signal
Name
NC
VCC
Pin/Ball Numbers
A2, A5, A11, B1, C1, C4, C22, D1, D26, E1, F1, L5, N4, N24, P1, P4, P5, P26, AD4, AD13, AD23, AE8,
AE10, AF17, AF18
D6, D8, D10, D12, D14, D16, D18, D20, D22, E5, E7, E9, E11, E13, E15, E17, E19, E21, F6, F8,
F10, F12, F14, F16, F18, F20, F22, G5, G21, H6, H22, J5, J21, K6, K22, L21, M6, M22, N5, N21,
P6, P22, R5, R21, T6, T22, U5, U21, V6, V22, W5, W21, Y6, Y22, AA5, AA7, AA9, AA11, AA13,
AA15, AA17, AA19, AA21, AB6, AB8, AB10, AB12, AB14, AB16, AB18, AB20, AB22, AC5,
AC7, AC9, AC11, AC13, AC15, AC17, AC19, AC21
VCCT
A26, C5, C7, C9, C11, C13, C15, C17, C19, C21, D5, E4, E6, G4, G23, J4, J23, L4, L23, N23, R23, U23,
V4, W23, AA4, AA23, AC4, AC23, AD6, AD8, AD12, AD14, AD18, AD20, AE3, AE18, AF1, AF2
VSS
A25, B2, B4, B6, B8, B10, B12, B14, B16, B18, B20, B22, B26, C23, C25, D2, D4, D7, D9, D11, D13,
D15, D17, D19, D21, E8, E10, E12, E14, E16, E18, E20, E22, E25, F2, F4, F5, F7, F9, F11, F13, F15,
F17, F19, F21, F23, G6, G22, G25, H2, H4, H5, H21, H23, J6, J22, J25, K2, K4, K5, K21, K23, L6, L22,
L25, M2, M3, M4, M21, M23, N6, N22, N25, P2, P21, P23, R4, R6, R22, R25, T2, T5, T21, T23, U4, U6,
U22, U25, V2, V5, V21, V23, W4, W6, W22, W25, Y2, Y5, Y21, Y23, AA6, AA8, AA10, AA12, AA14,
AA16, AA18, AA20, AA22, AA25, AB2, AB5, AB7, AB9, AB11, AB13, AB15, AB17, AB19, AB21, AB23,
AC6, AC8, AC10, AC12, AC14, AC16, AC18, AC20, AC22, AC25, AD2, AE1, AE5, AE7, AE9, AE11,
AE13, AE15, AE17, AE19, AE21, AE23, AE26, AF25, AF26
NOTE:
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A2 pin is de-populated on the Micro-FCPGA package.
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6.
VCC Thermal Specifications
In order to achieve proper cooling of the processor, a thermal solution (e.g., heat spreader, heat pipe, or
other heat transfer system) must make firm contact to the exposed processor die. The processor die must
be clean before the thermal solution is attached or the processor may be damaged.
Table 48 provides the Thermal Design Power (TDP) dissipation and the minimum and maximum TJ
temperatures for the Mobile Intel Celeron Processor. The thermal solution should be designed to ensure
the junction temperature never exceeds the specified value while operating at the Thermal Design
Power. Additionally, a secondary failsafe mechanism in hardware should be provided to shutdown the
processor at 101°C to prevent permanent damage, as described in Section 3.1.3. TDP is a thermal
design power specification based on the worst case power dissipation of the processor while executing
publicly available software under normal operating conditions at nominal voltages. Contact your Intel
Field Sales Representative for further information.
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
Table 48. Power Specifications for Mobile Intel Celeron Processor
Symbol
Core Frequency/Voltage
Thermal Design
Power
TDP
W
650 MHz & 1.10 V
700 MHz & 1.10 V
733 MHz & 1.10 V
800 MHz & 1.10V
650 MHz & 1.15 V
733 MHz & 1.15 V
866 MHz & 1.15 V
1.000 GHz & 1.40 V
1.266 GHz & 1.40 V
1.066 GHz & 1.45 V
1.133 GHz & 1.45 V
1.200 GHz & 1.45 V
1.333 GHz & 1.50 V
Symbol
Unit
7.0
7.0
7.0
7.0
10.6
11.2
9.61
22.0
22.0
23.2
23.8
24.4
19.0
Parameter
Min
At 100°C, Note 1
At 85°C, Note 4
Max
PAH
Auto Halt power at
1.10 V
1.15 V
1.40 V
1.45 V
1.50 V
1.9
3.6
7.0
8.2
10.1
PQS
Quick Start power at
1.10 V
1.15 V
1.40 V
1.45 V
1.50 V
1.7
3.2
6.5
7.6
8.9
PDSLP
Deep Sleep power at
1.10 V
1.15 V
1.40 V
1.45 V
1.50 V
1.6
2.4
4.8
5.6
6.8
TJ
Junction Temperature
For all processors except 1.33 GHz
0
Notes
Unit
Notes
W
At 50°C, Note 2
W
At 50°C, Note 2
W
At 35°C, Note 2
°C
Note 3
100
For 1.33 GHz processor only
0
85
Note 4
NOTES:
1. TDP is defined as the worst case power dissipated by the processor while executing publicly available software
under normal operating conditions at nominal voltages that meet the load line specifications. The TDP number
shown is a specification based on Icc (maximum) and indirectly tested by Icc (maximum) testing. TDP definition
is synonymous with the Thermal Design Power (typical) specification referred to in previous Intel datasheets.
The Intel TDP specification is a recommended design point and is not representative of the absolute maximum
power the processor may dissipate under worst case conditions.
2. Not 100% tested. These power specifications are determined by characterization of the processor currents at
higher temperatures and extrapolating the values for the temperature indicated.
3. TJ is measured with the on-die thermal diode.
4. TJ at 85°C only applies to 1.33 GHz processor. Intel recommends that the notebook thermal management
system include full-speed fan activation at no higher than 55°C to provide adequate cooling.
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6.1
Thermal Diode
The Mobile Intel Celeron Processor has an on-die thermal diode that should be used to monitor the die
temperature (TJ). A thermal sensor located on the motherboard, or a stand-alone measurement kit,
should monitor the die temperature of the processor for thermal management or instrumentation
purposes. Table 49 and Table 50 provide the diode interface and specifications.
Note:
The reading of the thermal sensor connected to the thermal diode will not necessarily reflect the
temperature of the hottest location on the die. This is due to inaccuracies in the thermal sensor, on-die
temperature gradients between the location of the thermal diode and the hottest location on the die, and
time based variations in the die temperature measurement. Time based variations can occur when the
sampling rate of the thermal diode (by the thermal sensor) is slower than the rate at which the TJ
temperature can change.
Table 49. Thermal Diode Interface
Signal Name
Pin/Ball Number
Signal Description
THERMDA
AF13
Thermal diode anode
THERMDC
AF14
Thermal diode cathode
Table 50. Thermal Diode Specifications
Symbol
n
Parameter
Min
Diode Ideality Factor (5-150uA)
Typ
Max
1.0011 1.0067 1.0122
Unit
Notes
Notes 1, 2, 3, 4, 6
n
Diode Ideality Factor (5-300uA)
1.0003 1.0091 1.0178
Notes 1, 2, 3, 5, 6
NOTES:
1. Intel does not support or recommend operation of the thermal diode under reverse bias. Intel does not support
or recommend operation of the thermal diode when the processor power supplies are not within their specified
tolerance range.
2. Characterized at 100°C.
3. Not 100% tested. Specified by design/characterization.
4. Specified for Forward Bias Current = 5 µA (min) and 150 µA (max).
5. Specified for Forward Bias Current = 5 µA (min) and 300 µA (max).
6. The ideality factor, n, represents the deviation from ideal diode behavior as exemplified by the diode equation:
Where Is = saturation current, q = electronic charge, Vd = voltage across the diode, k = Boltzmann Constant,
and T = absolute temperature (Kelvin).
 qVD

IFW = IS ⋅  e nkT − 1


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Micro-FCBGA and Micro-FCPGA Packages Datasheet
7.
Processor Initialization and
Configuration
7.1
Description
The Mobile Intel Celeron Processor has some configuration options that are determined by hardware and
some that are determined by software. The processor samples its hardware configuration at reset on the
active-to-inactive transition of RESET#. The P6 Family of Processors Developer’s Manual describes
these configuration options. Some of the configuration options for the Mobile Intel Celeron Processor
are described in the remainder of this section.
7.1.1
Quick Start Enable
Quick Start enabling is mandatory on the Mobile Intel Celeron Processor by strapping A15# low. When
the STPCLK# signal is asserted it will enter the Quick Start state when A15# is sampled active on the
RESET# signal’s active-to-inactive transition. The Quick Start state supports snoops from the bus
priority device but it does not support symmetric master snoops nor is the latching of interrupts
supported. A “1” in bit position 5 of the Power-on Configuration register indicates that the Quick Start
state has been enabled.
7.1.2
System Bus Frequency
The current generation Mobile Intel Celeron Processor will only function with a system bus frequency of
133 MHz. The Low Voltage and Ultra Low Voltage Mobile Intel Celeron Processors will support both
100-MHz and 133-MHz bus frequencies. Bit positions 18 to 19 of the Power-on Configuration register
indicates at which speed a processor will run.
7.1.3
APIC Enable
The processor APIC must be hardware enabled by pulling the PICD[1:0] signals separately up to 1.5 V
and supplying an active PICCLK to the processor. Software can be used to disable the APIC if it is not
being used, after PICD[1:0] are sampled high when RESET# is deasserted and the processor has started
executing instructions.
7.2
Clock Frequencies and Ratios
The Mobile Intel Celeron Processor uses a clock design in which the bus clock is multiplied by a ratio to
produce the processor’s internal (or “core”) clock. The ratio used is programmed into the processor
during manufacturing. The bus ratio programmed into the processor is visible in bit positions 22 to 25
and 27 of the Power-on Configuration register. Table 28 shows the 5-bit codes in the Power-on
Configuration register and their corresponding bus ratios.
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8.
Processor Interface
8.1
Alphabetical Signal Reference
A[35:3]# (I/O – AGTL)
The A[35:3]# (Address) signals define a 236-byte physical memory address space. When ADS# is active,
these signals transmit the address of a transaction; when ADS# is inactive, these signals transmit
transaction information. These signals must be connected to the appropriate pins/balls of both agents on
the system bus. The A[35:24]# signals are protected with the AP1# parity signal, and the A[23:3]#
signals are protected with the AP0# parity signal.
On the active-to-inactive transition of RESET#, each processor bus agent samples A[35:3]# signals to
determine its power-on configuration. See P6 Family of Processors Developer’s Manual for details.
A20M# (I - 1.5V Tolerant)
If the A20M# (Address-20 Mask) input signal is asserted, the processor masks physical address bit 20
(A20#) before looking up a line in any internal cache and before driving a read/write transaction on the
bus. Asserting A20M# emulates the 8086 processor's address wrap-around at the 1-Mbyte boundary.
Assertion of A20M# is only supported in Real mode.
ADS# (I/O - AGTL)
The ADS# (Address Strobe) signal is asserted to indicate the validity of a transaction address on the
A[35:3]# signals. Both bus agents observe the ADS# activation to begin parity checking, protocol
checking, address decode, internal snoop or deferred reply ID match operations associated with the new
transaction. This signal must be connected to the appropriate pins/balls on both agents on the system bus.
AERR# (I/O - AGTL)
The AERR# (Address Parity Error) signal is observed and driven by both system bus agents, and if used,
must be connected to the appropriate pins/balls of both agents on the system bus. AERR# observation is
optionally enabled during power-on configuration; if enabled, a valid assertion of AERR# aborts the
current transaction.
If AERR# observation is disabled during power-on configuration, a central agent may handle an
assertion of AERR# as appropriate to the error handling architecture of the system.
AP[1:0]# (I/O - AGTL)
The AP[1:0]# (Address Parity) signals are driven by the request initiator along with ADS#, A[35:3]#,
REQ[4:0]# and RP#. AP1# covers A[35:24]#. AP0# covers A[23:3]#. A correct parity signal is high if
an even number of covered signals is low and low if an odd number of covered signals are low. This
allows parity to be high when all the covered signals are high. AP[1:0]# should be connected to the
appropriate pins/balls on both agents on the system bus.
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
BCLK, BCLK# (I)
The BCLK and BCLK# signals determines the system bus frequency.
On systems with Differential Clocking, both system bus agents must receive these signals to drive their
outputs and latch their inputs on the BCLK rising edge and BCLK# falling edge. All external timing
parameters are specified with respect to the crossing point of the BCLK rising edge and BCLK# falling
edge.
On systems with Single Ended Clocking, both system bus agents must receive the BCLK signal to drive
their outputs and latch their inputs on the BCLK rising edge. All external timing parameters are specified
with respect to the BCLK signal. The BCLK# signal functions as the CLKREF input.
BERR# (I/O - AGTL)
The BERR# (Bus Error) signal is asserted to indicate an unrecoverable error without a bus protocol
violation. It may be driven by either system bus agent and must be connected to the appropriate
pins/balls of both agents, if used. However, the Mobile Intel Celeron Processors do not observe
assertions of the BERR# signal.
BERR# assertion conditions are defined by the system configuration. Configuration options enable the
BERR# driver as follows:
• Enabled or disabled
• Asserted optionally for internal errors along with IERR#
• Asserted optionally by the request initiator of a bus transaction after it observes an error
• Asserted by any bus agent when it observes an error in a bus transaction
BINIT# (I/O - AGTL)
The BINIT# (Bus Initialization) signal may be observed and driven by both system bus agents and must
be connected to the appropriate pins/balls of both agents, if used. If the BINIT# driver is enabled during
the power-on configuration, BINIT# is asserted to signal any bus condition that prevents reliable future
information.
If BINIT# is enabled during power-on configuration, and BINIT# is sampled asserted, all bus state
machines are reset and any data which was in transit is lost. All agents reset their rotating ID for bus
arbitration to the state after reset, and internal count information is lost. The L1 and L2 caches are not
affected.
If BINIT# is disabled during power-on configuration, a central agent may handle an assertion of BINIT#
as appropriate to the Machine Check Architecture (MCA) of the system.
BNR# (I/O - AGTL)
The BNR# (Block Next Request) signal is used to assert a bus stall by any bus agent that is unable to
accept new bus transactions. During a bus stall, the current bus owner cannot issue any new transactions.
Since multiple agents may need to request a bus stall simultaneously, BNR# is a wired-OR signal that
must be connected to the appropriate pins/balls of both agents on the system bus. In order to avoid wireOR glitches associated with simultaneous edge transitions driven by multiple drivers, BNR# is activated
on specific clock edges and sampled on specific clock edges.
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BP[3:2]# (I/O - AGTL)
The BP[3:2]# (Breakpoint) signals are the System Support group Breakpoint signals. They are outputs
from the processor that indicate the status of breakpoints.
BPM[1:0]# (I/O - AGTL)
The BPM[1:0]# (Breakpoint Monitor) signals are breakpoint and performance monitor signals. They are
outputs from the processor that indicate the status of breakpoints and programmable counters used for
monitoring processor performance.
BPRI# (I - AGTL)
The BPRI# (Bus Priority Request) signal is used to arbitrate for ownership of the system bus. It must be
connected to the appropriate pins/balls on both agents on the system bus. Observing BPRI# active (as
asserted by the priority agent) causes the processor to stop issuing new requests, unless such requests are
part of an ongoing locked operation. The priority agent keeps BPRI# asserted until all of its requests are
completed and then releases the bus by deasserting BPRI#.
BREQ0# (I/O - AGTL)
The BREQ0# (Bus Request) signal is a processor Arbitration Bus signal. The processor indicates that it
wants ownership of the system bus by asserting the BREQ0# signal.
During power-up configuration, the central agent must assert the BREQ0# bus signal. The processor
samples BREQ0# on the active-to-inactive transition of RESET#. Optionally, this signal may be
grounded with a 10-ohm resistor.
BSEL[1:0] (O – 3.3V Tolerant)
The BSEL[1:0] (Select Processor System Bus Speed) signal is used to configure the processor for the
system bus frequency. The chipset and system clock generator also uses the BSEL signals. The
VTTPWRGD signal informs the processor to output the BSEL signals. During power up the BSEL
signals will be indeterminate for a small period of time. The chipset and clock generator should not
sample the BSEL signals until the VTTPWRGD signal is asserted. The assertion of the VTTPWRGD
signal indicates that the BSEL signals are stable and driven to a final state by the processor. Please refer
to Figure 15 for the timing relationship between the BSEL and VTTPWRGD signals.
Table 51 shows the encoding scheme for BSEL[1:0]. The only supported system bus frequency for the
Mobile Intel Celeron Processor is 133 MHz. The Low Voltage and Ultra Low Voltage Mobile Intel
Celeron Processors will support both 100-MHz and 133-MHz bus frequencies. If another frequency is
used then the processor is not guaranteed to function properly.
Table 51. BSEL[1:0] Encoding
BSEL[1:0]
System Bus Frequency
01
100 MHz
11
133 MHz
CLKREF (Analog)
The CLKREF (System Bus Clock Reference) signal provides a reference voltage to define the trip point
for the BCLK signal on platforms supporting Single Ended Clocking. This signal should be connected to
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Micro-FCBGA and Micro-FCPGA Packages Datasheet
a resistor divider to generate 1.25 V from the 2.5-V supply. A minimum of 1-µF decoupling capacitance
is recommended on CLKREF. On systems with Differential Clocking, the CLKREF pin functions as the
BCLK# input.
CMOSREF (Analog)
The CMOSREF (CMOS Reference Voltage) signal provides a DC level reference voltage for the CMOS
input buffers. CMOSREF must be generated from a stable 1.5V supply (830 chipset family), 2.5 V
(440MX chipset family) and must meet the VCMOSREF specification. The same 1.5 V (830 chipset
family) or 2.5 V (440MX chipset family) supply should be used to power the chipset CMOS I/O buffers
that drive the CMOS signals. The Thevenin equivalent impedance of the VCMOSREF generation
circuits must be less than 0.5 KΩ/1 KΩ (i.e., top resistor 500 Ω, bottom resistor 1 KΩ) for the Intel 830
Chipset family. The Thevenin equivalent impedance of the VCMOSREF generation circuits must be less
than 0.75 KΩ/0.5 KΩ (i.e., top resistor 750 Ω, bottom resistor 500 Ω) for the Intel 440MX chipset
family.
D[63:0]# (I/O - AGTL)
The D[63:0]# (Data) signals are the data signals. These signals provide a 64-bit data path between both
system bus agents, and must be connected to the appropriate pins/balls on both agents. The data driver
asserts DRDY# to indicate a valid data transfer.
DBSY# (I/O - AGTL)
The DBSY# (Data Bus Busy) signal is asserted by the agent responsible for driving data on the system
bus to indicate that the data bus is in use. The data bus is released after DBSY# is deasserted. This signal
must be connected to the appropriate pins/balls on both agents on the system bus.
DEFER# (I - AGTL)
The DEFER# (Defer) signal is asserted by an agent to indicate that the transaction cannot be guaranteed
in-order completion. Assertion of DEFER# is normally the responsibility of the addressed memory agent
or I/O agent. This signal must be connected to the appropriate pins/balls on both agents on the system
bus.
DEP[7:0]# (I/O - AGTL)
The DEP[7:0]# (Data Bus ECC Protection) signals provide optional ECC protection for the data bus.
They are driven by the agent responsible for driving D[63:0]#, and must be connected to the appropriate
pins/balls on both agents on the system bus if they are used. During power-on configuration, DEP[7:0]#
signals can be enabled for ECC checking or disabled for no checking.
DRDY# (I/O - AGTL)
The DRDY# (Data Ready) signal is asserted by the data driver on each data transfer, indicating valid
data on the data bus. In a multi-cycle data transfer, DRDY# can be deasserted to insert idle clocks. This
signal must be connected to the appropriate pins/balls on both agents on the system bus.
DPSLP# (I - 1.5 V Tolerant)
The DPSLP# (Deep Sleep) signal, when asserted in the Quick Start state, causes the processor to enter
the Deep Sleep state. In order to return to the Quick Start state BCLK, BCLK# must be running and the
DPSLP# pin must be deasserted.
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EDGCTRLP (I-Analog)
The EDGCTRLP (Edge Rate Control) signal is used to configure the edge rate of the AGTL output
buffers. Connect the signal to VSS with a 110-Ω, 1% resistor.
FERR# (O - 1.5 V Tolerant Open-drain)
The FERR# (Floating-point Error) signal is asserted when the processor detects an unmasked floatingpoint error. FERR# is similar to the ERROR# signal on the Intel 387 coprocessor, and it is included for
compatibility with systems using DOS-type floating-point error reporting.
FLUSH# (I - 1.5 V Tolerant)
When the FLUSH# (Flush) input signal is asserted, the processor writes back all internal cache lines in
the Modified state and invalidates all internal cache lines. At the completion of a flush operation, the
processor issues a Flush Acknowledge transaction. The processor stops caching any new data while the
FLUSH# signal remains asserted.
On the active-to-inactive transition of RESET#, each processor bus agent samples FLUSH# to determine
its power-on configuration.
HIT# (I/O - AGTL), HITM# (I/O - AGTL)
The HIT# (Snoop Hit) and HITM# (Hit Modified) signals convey transaction snoop operation results,
and must be connected to the appropriate pins/balls on both agents on the system bus. Either bus agent
can assert both HIT# and HITM# together to indicate that it requires a snoop stall, which can be
continued by reasserting HIT# and HITM# together.
IERR# (O - 1.5 V Tolerant Open-drain)
The IERR# (Internal Error) signal is asserted by the processor as the result of an internal error. Assertion
of IERR# is usually accompanied by a SHUTDOWN transaction on the system bus. This transaction
may optionally be converted to an external error signal (e.g., NMI) by system logic. The processor will
keep IERR# asserted until it is handled in software or with the assertion of RESET#, BINIT, or INIT#.
IGNNE# (I - 1.5 V Tolerant)
The IGNNE# (Ignore Numeric Error) signal is asserted to force the processor to ignore a numeric error
and continue to execute non-control floating-point instructions. If IGNNE# is deasserted, the processor
freezes on a non-control floating-point instruction if a previous instruction caused an error. IGNNE# has
no affect when the NE bit in control register 0 (CR0) is set.
INIT# (I - 1.5 V Tolerant)
The INIT# (Initialization) signal is asserted to reset integer registers inside the processor without
affecting the internal (L1 or L2) caches or the floating-point registers. The processor begins execution at
the power-on reset vector configured during power-on configuration. The processor continues to handle
snoop requests during INIT# assertion. INIT# is an asynchronous input.
If INIT# is sampled active on RESET#'s active-to-inactive transition, then the processor executes its
built-in self-test (BIST).
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INTR (I - 1.5 V Tolerant)
The INTR (Interrupt) signal indicates that an external interrupt has been generated. INTR becomes the
LINT0 signal when the APIC is enabled. The interrupt is maskable using the IF bit in the EFLAGS
register. If the IF bit is set, the processor vectors to the interrupt handler after completing the current
instruction execution. Upon recognizing the interrupt request, the processor issues a single Interrupt
Acknowledge (INTA) bus transaction. INTR must remain active until the INTA bus transaction to
guarantee its recognition.
LINT[1:0] (I - 1.5 V Tolerant)
The LINT[1:0] (Local APIC Interrupt) signals must be connected to the appropriate pins/balls of all
APIC bus agents, including the processor and the system logic or I/O APIC component. When APIC is
disabled, the LINT0 signal becomes INTR, a maskable interrupt request signal, and LINT1 becomes
NMI, a non-maskable interrupt. INTR and NMI are backward compatible with the same signals for the
Pentium processor. Both signals are asynchronous inputs.
Both of these signals must be software configured by programming the APIC register space to be used
either as NMI/INTR or LINT[1:0] in the BIOS. If the APIC is enabled at reset, then LINT[1:0] is the
default configuration.
LOCK# (I/O - AGTL)
The LOCK# (Lock) signal indicates to the system that a sequence of transactions must occur atomically.
This signal must be connected to the appropriate pins/balls on both agents on the system bus. For a
locked sequence of transactions, LOCK# is asserted from the beginning of the first transaction through
the end of the last transaction.
When the priority agent asserts BPRI# to arbitrate for bus ownership, it waits until it observes LOCK#
deasserted. This enables the processor to retain bus ownership throughout the bus locked operation and
guarantee the atomicity of lock.
NCTRL (I - Analog)
The NCTRL signal provides the AGTL pull down impedance control. The processor samples this input
to determine the N-channel pull-down device strength when it is the driving agent. An external 14 ohm
(1% tolerance) pull-up resistor to VCCT is required for this signal. Please refer to platform design guide
for implementation details.
NMI (I - 1.5 V Tolerant)
The NMI (Non-Maskable Interrupt) indicates that an external interrupt has been generated. NMI
becomes the LINT1 signal when the APIC is disabled. Asserting NMI causes an interrupt with an
internally supplied vector value of 2. An external interrupt-acknowledge transaction is not generated. If
NMI is asserted during the execution of an NMI service routine, it remains pending and is recognized
after the IRET is executed by the NMI service routine. At most, one assertion of NMI is held pending.
NMI is rising edge sensitive.
PICCLK (I – 2.0 V Tolerant)
The PICCLK (APIC Clock) signal is an input clock to the processor and system logic or I/O APIC that is
required for operation of the processor, system logic, and I/O APIC components on the APIC bus.
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PICD[1:0] (I/O - 1.5 V Tolerant Open-drain)
The PICD[1:0] (APIC Data) signals are used for bi-directional serial message passing on the APIC bus.
They must be connected to the appropriate pins/balls of all APIC bus agents, including the processor and
the system logic or I/O APIC components. If the PICD0 signal is sampled low on the active-to-inactive
transition of the RESET# signal, then the APIC is hardware disabled. For the Mobile Intel Celeron
Processor, the APIC is required to be hardware enabled as described in Section 7.1.3.
PLL1, PLL2 (Analog)
The PLL1 and PLL2 signals provide isolated analog decoupling is required for the internal PLL. See
Section 3.2.2 for a description of the analog decoupling circuit.
PRDY# (O - AGTL)
The PRDY# (Probe Ready) signal is a processor output used by debug tools to determine processor
debug readiness.
PREQ# (I - 1.5 V Tolerant)
The PREQ# (Probe Request) signal is used by debug tools to request debug operation of the processor.
PWRGOOD (I – 1.8 V Tolerant)
PWRGOOD (Power Good) is a 1.8-V tolerant input. The processor requires this signal to be a clean
indication that clocks and the power supplies (VCC, VCCT, etc.) are stable and within their specifications.
Clean implies that the signal will remain low, (capable of sinking leakage current) and without glitches,
from the time that the power supplies are turned on, until they come within specification. The signal will
then transition monotonically to a high (1.8 V) state. Figure 15 through Figure 17 illustrate the
relationship of PWRGOOD to other system signals. PWRGOOD can be driven inactive at any time, but
clocks and power must again be stable before the rising edge of PWRGOOD. It must also meet the
minimum pulse width specified in Table 30 (Section 3.6) and be followed by a 1 ms RESET# pulse.
The PWRGOOD signal, which must be supplied to the processor, is used to protect internal circuits
against voltage sequencing issues. The PWRGOOD signal should be driven high throughout boundary
scan operation.
REQ[4:0]# (I/O - AGTL)
The REQ[4:0]# (Request Command) signals must be connected to the appropriate pins/balls on both
agents on the system bus. They are asserted by the current bus owner when it drives A[35:3]# to define
the currently active transaction type.
RESET# (I - AGTL)
Asserting the RESET# signal resets the processor to a known state and invalidates the L1 and L2 caches
without writing back Modified (M state) lines. For a power-on type reset, RESET# must stay active for
at least 1 ms after VCC and BCLK, BCLK# have reached their proper DC and AC specifications and after
PWRGOOD has been asserted. When observing active RESET#, all bus agents will deassert their
outputs within two clocks. RESET# is the only AGTL signal that does not have on-die AGTL
termination. A 56.2 Ω 1% terminating resistor connected to VCCT is required.
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A number of bus signals are sampled at the active-to-inactive transition of RESET# for the power-on
configuration. The configuration options are described in Section 4 and in the P6 Family of Processors
Developer’s Manual.
Unless its outputs are tri-stated during power-on configuration, after an active-to-inactive transition of
RESET#, the processor optionally executes its built-in self-test (BIST) and begins program execution at
reset-vector 000FFFF0H or FFFFFFF0H. RESET# must be connected to the appropriate pins/balls on
both agents on the system bus.
RP# (I/O - AGTL)
The RP# (Request Parity) signal is driven by the request initiator and provides parity protection on
ADS# and REQ[4:0]#. RP# should be connected to the appropriate pins/balls on both agents on the
system bus.
A correct parity signal is high if an even number of covered signals is low and low if an odd number of
covered signals are low. This definition allows parity to be high when all covered signals are high.
RS[2:0]# (I/O - AGTL)
The RS[2:0]# (Response Status) signals are driven by the response agent (the agent responsible for
completion of the current transaction) and must be connected to the appropriate pins/balls on both agents
on the system bus.
RSP# (I - AGTL)
The RSP# (Response Parity) signal is driven by the response agent (the agent responsible for completion
of the current transaction) during assertion of RS[2:0]#. RSP# provides parity protection for RS[2:0]#.
RSP# should be connected to the appropriate pins/balls on both agents on the system bus.
A correct parity signal is high if an even number of covered signals are low, and it is low if an odd
number of covered signals are low. During Idle state of RS[2:0]# (RS[2:0]#=000), RSP# is also high
since it is not driven by any agent guaranteeing correct parity.
RTTIMPEDP (I-Analog)
The RTTIMPEDP (RTT Impedance/PMOS) signal is used to configure the on-die AGTL termination.
Connect the RTTIMPEDP signal to VSS with a 56.2-Ω, 1% resistor.
SMI# (I - 1.5 V Tolerant)
The SMI# (System Management Interrupt) is asserted asynchronously by system logic. On accepting a
System Management Interrupt, the processor saves the current state and enters System Management
Mode (SMM). An SMI Acknowledge transaction is issued, and the processor begins program execution
from the SMM handler.
STPCLK# (I - 1.5 V Tolerant)
The STPCLK# (Stop Clock) signal, when asserted, causes the processor to enter a low-power Quick
Start state. The processor issues a Stop Grant Acknowledge special transaction and stops providing
internal clock signals to all units except the bus and APIC units. The processor continues to snoop bus
transactions and service interrupts while in the Quick Start state. When STPCLK# is deasserted and
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other conditions in are met, the processor restarts its internal clock to all units and resumes execution.
The assertion of STPCLK# has no affect on the bus clock.
TCK (I - 1.5 V Tolerant)
The TCK (Test Clock) signal provides the clock input for the test bus (also known as the test access
port).
TDI (I - 1.5 V Tolerant)
The TDI (Test Data In) signal transfers serial test data to the processor. TDI provides the serial input
needed for JTAG support.
TDO (O - 1.5 V Tolerant Open-drain)
The TDO (Test Data Out) signal transfers serial test data from the processor. TDO provides the serial
output needed for JTAG support.
TESTHI[2:1] (I - 1.25 V Tolerant)
The TESTHI[2:1] (Test input High) signals are used during processor test and need to be pulled high
during normal operation.
TESTLO[2:1] (I - 1.5 V Tolerant)
The TESTLO[2:1] (Test input Low) signals are used during processor test and needs to be pulled to
ground during normal operation.
THERMDA, THERMDC (Analog)
The THERMDA (Thermal Diode Anode) and THERMDC (Thermal Diode Cathode) signals connect to
the anode and cathode of the on-die thermal diode.
TMS (I - 1.5 V Tolerant)
The TMS (Test Mode Select) signal is a JTAG support signal used by debug tools.
TRDY# (I/O - AGTL)
The TRDY# (Target Ready) signal is asserted by the target to indicate that the target is ready to receive
write or implicit write-back data transfer. TRDY# must be connected to the appropriate pins/balls on
both agents on the system bus.
TRST# (I - 1.5 V Tolerant)
The TRST# (Test Reset) signal resets the Test Access Port (TAP) logic. The Mobile Intel Celeron
Processors do not self-reset during power on; therefore, it is necessary to drive this signal low during
power-on reset.
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VID[4:0] (O – Open-drain)
The VID[4:0] (Voltage ID) pins/balls can be used to support automatic selection of power supply
voltages. Please refer to Section 3.2.3 for details.
VREF (Analog)
The VREF (AGTL Reference Voltage) signal provides a DC level reference voltage for the AGTL input
buffers. A voltage divider should be used to divide VCCT by 2/3. Resistor values of 1.00 kΩ and 2.00 kΩ
are recommended. Decouple the VREF signal with three 0.1-µF high-frequency capacitors close to the
processor.
VTTPWRGD (I – 1.25 V)
The VTTPWRGD signal informs the processor to output the VID signals. During power up, the VID
signals will be in an indeterminate state for a small period of time. The voltage regulator should not
sample and/or latch the VID signals until the VTTPWRGD signal is asserted. The assertion of the
VTTPWRGD signal indicates that the VID signals are stable and are driven to the final state by the
processor. Please refer to Figure 15 for the power up sequence. (Also see Section 4.3.1.)
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8.2
Signal Summaries
Table 52. Input Signals
Name
Active Level
Clock
Signal Group
Qualified
A20M#
Low
Asynch
CMOS
Always
BCLK
High
—
System Bus
Always
BCLK#
Low
—
System Bus
Always
BPRI#
Low
BCLK
System Bus
Always
DEFER#
Low
BCLK
System Bus
Always
FLUSH#
Low
Asynch
CMOS
Always
IGNNE#
Low
Asynch
CMOS
Always
INIT#
Low
Asynch
System Bus
Always
INTR
High
Asynch
CMOS
APIC disabled mode
LINT[1:0]
High
Asynch
APIC
APIC enabled mode
NMI
High
Asynch
CMOS
APIC disabled mode
NCTRL
High
Asynch
PICCLK
High
—
APIC
Always
PREQ#
Low
Asynch
Implementation
Always
PWRGOOD
High
Asynch
Implementation
Always
RESET#
Low
BCLK
System Bus
Always
RSP#
Low
BCLK
System Bus
Always
SMI#
Low
Asynch
CMOS
Always
Always
STPCLK#
Low
Asynch
Implementation
TCK
High
—
JTAG
TDI
TCK
JTAG
TMS
TCK
JTAG
TRST#
Low
Asynch
JTAG
VTTPWRGD
High
Asynch
Power/Other
Table 53. Output Signals
94
Name
Active Level
Clock
Signal Group
BSEL[1:0]
High
Asynch
Open-drain
FERR#
Low
Asynch
Open-drain
IERR#
Low
Asynch
Open-drain
PRDY#
Low
BCLK
Implementation
TDO
High
TCK
JTAG
VID[4:0]
High
Asynch
Power/Other
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Table 54. Input/Output Signals (Single Driver)
Name
Active Level
Clock
Signal Group
Qualified
A[35:3]#
Low
BCLK
System Bus
ADS#, ADS#+1
ADS#
Low
BCLK
System Bus
Always
AP[1:0]#
Low
BCLK
System Bus
ADS#, ADS#+1
BREQ0#
Low
BCLK
System Bus
Always
BP[3:2]#
Low
BCLK
System Bus
Always
BPM[1:0]#
Low
BCLK
System Bus
Always
D[63:0]#
Low
BCLK
System Bus
DRDY#
DBSY#
Low
BCLK
System Bus
Always
DEP[7:0]#
Low
BCLK
System Bus
DRDY#
DRDY#
Low
BCLK
System Bus
Always
LOCK#
Low
BCLK
System Bus
Always
REQ[4:0]#
Low
BCLK
System Bus
ADS#, ADS#+1
RP#
Low
BCLK
System Bus
ADS#, ADS#+1
RS[2:0]#
Low
BCLK
System Bus
Always
TRDY#
Low
BCLK
System Bus
Response phase
Table 55. Input/Output Signals (Multiple Driver)
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Name
Active Level
Clock
Signal Group
Qualified
AERR#
Low
BCLK
System Bus
ADS#+3
BERR#
Low
BCLK
System Bus
Always
BINIT#
Low
BCLK
System Bus
Always
BNR#
Low
BCLK
System Bus
Always
HIT#
Low
BCLK
System Bus
Always
HITM#
Low
BCLK
System Bus
Always
PICD[1:0]
High
PICCLK
APIC
Always
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Appendix A. PLL RLC Filter Specification
A1.
Introduction
All Mobile Intel Celeron Processors have internal PLL clock generators, which are analog in nature and
require quiet power supplies for minimum jitter. Jitter is detrimental to a system; it degrades external
I/O timings as well as internal core timings (i.e. maximum frequency). The PLL RLC filter
specifications for the Mobile Intel Celeron Processor are the same as those for the mobile Intel Pentium
III Processor-M. The general desired topology is shown in Figure 2. Excluded from the external circuitry
are parasitics associated with each component.
A2.
Filter Specification
The function of the filter is two fold. It protects the PLL from external noise through low-pass
attenuation. It also protects the PLL from internal noise through high-pass filtering. In general, the lowpass description forms an adequate description for the filter.
The AC low-pass specification, with input at VCCT and output measured across the capacitor, is as
follows:
• < 0.2-dB gain in pass band
• < 0.5-dB attenuation in pass band < 1 Hz (see DC drop in next set of requirements)
• 34-dB attenuation from 1 MHz to 66 MHz
• 28-dB attenuation from 66 MHz to core frequency
• The filter specification (AC) is graphically shown in Figure 32.
Other requirements:
• Use a shielded type inductor to minimize magnetic pickup
• The filter should support a DC current of at least 30 mA
• The DC voltage drop from VCCT to PLL1 should be less than 60 mV, which in practice implies
series resistance of less than 2 Ω. This also means that the pass band (from DC to 1 Hz)
attenuation below 0.43 dB for VCCT = 1.25 V.
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Figure 32. PLL Filter Specifications
0.2 dB
0 dB
x dB
Forbidden
zone
-28 dB
Forbidden
zone
-34 dB
DC
1 Hz
fpeak
1 MHz
66 MHz
Passband
fcore
High Frequency
Band
x = 20.log[(Vcct-60 mV)/ Vcct]
NOTES:
Diagram is not to scale
No specification for frequencies beyond fcore.
Fpeak, if existent, should be less than 0.05 MHz.
A3.
Recommendation for Mobile Systems
The following LC components are recommended. The tables will be updated as other suitable
components and specifications are identified.
Table 56. PLL Filter Inductor Recommendations
Inductor
Part Number
Value
Tol
SRF
Rated I
4.7 µH 10% 35 MHz 30 mA
DCR
Min Damping R Needed
0.56 Ω (1Ω
max)
0Ω
L1
TDK MLF2012A4R7KT
L2
Murata LQG21N4R7K10 4.7 µH 10% 47 MHz 30 mA
0.7 Ω (+/-50%)
L3
Murata LQG21C4R7N00 4.7 µH 30% 35 MHz 30 mA
0.3 Ω max
NOTE:
0Ω
0.2 Ω (assumed)
Minimum damping resistance is calculated from 0.35 Ω – DCRmin. From vendor provided data, L1 and L2
DCRmin is 0.4Ω and 0.5Ω respectively, qualifying them for zero required trace resistance. DCRmin for L3 is
not known and is assumed to be 0.15Ω. Products with equivalent specifications may also be used.
Table 57. PLL Filter Capacitor Recommendations
Capacitor
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Part Number
Value
Tolerance
ESL
ESR
C1
Kemet T495D336M016AS
33 µF
20%
2.5 nH
0.225 Ω
C2
AVX TPSD336M020S0200
33 µF
20%
unknown
0.2 Ω
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Table 58. PLL Filter Resistor Recommendations
Resistor
Part Number
Value
Tolerance
Power
R1
Various
1Ω
10%
1/16W
To satisfy damping requirements, total series resistance in the filter (from VCCT to the top plate of the
capacitor) must be at least 0.35 Ω. This resistor can be in the form of a discrete component, or routing,
or both. For example, if the picked inductor has minimum DCR of 0.25 Ω, then a routing resistance of
at least 0.10 Ω is required. Be careful not to exceed the maximum resistance rule (2 Ω). For example, if
using discrete R1, the maximum DCR of the L should be less than 2.0 - 1.1 = 0.9 Ω, which precludes
using L2 and possibly L1.
Other routing requirements include:
• The capacitor should be close to the PLL1 and PLL2 pins, with less than 0.1 Ω per route (These
routes do not count towards the minimum damping resistance requirement).
• The PLL2 route should be parallel and next to the PLL1 route (minimize loop area).
• The inductor should be close to the capacitor; any routing resistance should be inserted between
VCCT and the inductor.
• Any discrete resistor should be inserted between VCCT and the inductor.
A4.
Comments
• A magnetically shielded inductor protects the circuit from picking up external flux noise. This
should provide better timing margins than with an unshielded inductor.
• A discrete or routed resistor is required because the LC filter by nature has an under-damped
response, which can cause resonance at the LC pole. Noise amplification at this band, although
not in the PLL-sensitive spectrum, could cause a fatal headroom reduction for analog circuitry.
The resistor serves to dampen the response. Systems with tight space constraints should consider a
discrete resistor to provide the required damping resistance. Too large of a damping resistance can
cause a large IR drop, which means less analog headroom and lower frequency.
• Ceramic capacitors have very high self-resonance frequencies, but they are not available in large
capacitance values. A high self-resonant frequency coupled with low ESL/ESR is crucial for
sufficient rejection in the PLL and high frequency band. The recommended tantalum capacitors
have acceptably low ESR and ESL.
• The capacitor must be close to the PLL1 and PLL2 pins; otherwise the value of the low ESR
tantalum capacitor is wasted. Note the distance constraint should be translated from the 0.1-Ω
requirement.
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