NSC CLC007AJE

CLC007
Serial Digital Cable Driver with Dual Complementary
Outputs
General Description
Applications
National’s Comlinear CLC007 is a monolithic, high-speed
cable driver designed for the SMPTE 259M serial digital
video data transmission standard. The CLC007 drives 75Ω
transmission lines (Belden 8281 or equivalent) at data rates
up to 400 Mbps. Controlled output rise and fall times (650 ps
typical) minimize transition-induced jitter. The output voltage
swing, typically 1.65V, set by an accurate, low-drift internal
bandgap reference, delivers an 800 mV swing to backmatched and terminated 75Ω cable.
The CLC007’s class AB output stage consumes less power
than other designs, 195 mW with all outputs terminated, and
requires no external bias resistors. The differential inputs accept a wide range of digital signals from 200 mVp-p to ECL
levels within the specified common-mode limits. All this
make the CLC007 an excellent general purpose high speed
driver for digital applications.
The CLC007 is powered from a single +5V or −5.2V supply
and comes in an 8-pin SOIC package.
n
n
n
n
n
n
Key Specifications
Connection Diagram (8-Pin SOIC)
n
n
n
n
n
Digital routers and distribution amplifiers
Coaxial cable driver for digital transmission line
Twisted pair driver
Digital distribution amplifiers
SMPTE, Sonet/SDH, and ATM compatible driver
Buffer applications
DS100085-1
650 ps rise and fall times
Data rates to 400 Mbps
2 sets of complimentary outputs
200 mV differential input
Low residual jitter (25 pspp)
Features
n
n
n
n
n
No external pull-down resistors
Differential input and output
Low power dissipation
Single +5V or −5.2V supply
Replaces GS9007 in most applications
DS100085-3
Order Number CLC007AJE
See NS Package Number M08A
Typical Application
DS100085-2
© 1998 National Semiconductor Corporation
DS100085
www.national.com
CLC007 Serial Digital Cable Driver with Dual Complementary Outputs
July 1998
Absolute Maximum Ratings (Note 1)
Package Thermal Resistance
θJA Surface Mount AJE
θJC Surface Mount AJE
Reliability Information
Transistor Count
MTTF
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage
Output Current
Maximum Junction Temperature
Storage Temperature Range
Lead Temperature
(Soldering 10 seconds)
ESD Rating (Human body Model)
6V
30 mA
+125˚C
−65˚C to +150˚C
125˚C
105˚C/W
72
254 Mhr
Recommended Operating
Conditions
Supply Voltage Range (VCC–VEE)
+300˚C
1000V
+4.5V to +5.5V
Electrical Characteristics
(VCC = 0V, VEE = −5V; unless otherwise specified).
Parameter
Typ
+25˚C
Conditions
Min/Max
+25˚C
Min/Max
0˚C to
+70˚C
Min/Max
−40˚C to
+85˚C
Units
STATIC PERFORMANCE
Supply Current, Loaded
(Notes 5, 7)
39
-
-
-
mA
Supply Current, Unloaded
(Note 3)
34
28/37
26/39
26/39
mA
Output HIGH Voltage (VOH)
(Note 3)
−1.7
−2.0/1.4
−2.0/1.4
−2.0/1.4
V
Output Low Voltage (VOL)
(Note 3)
−3.3
−3.6/3.0
−3.6/3.0
−3.6/3.0
V
µA
Input Bias Current
(Note 4)
10
30
50
50
Output Swing
(Note 3)
1.65
1.55/1.75
1.53/1.77
1.51/1.79
V
Common Mode Input Range Upper Limit
−0.7
−0.8
−0.8
−0.8
V
Common Mode Input Range Lower Limit
−2.6
−2.5
−2.5
−2.5
V
Minimum Differential Input Swing (Note 5)
200
200
200
200
mV
Power Supply Rejection Ratio (Note 3)
26
20
20
20
dB
650
425/825
400/850
400/850
ps
AC PERFORMANCE
Output Rise and Fall Time
(Notes 3, 6, 7)
Overshoot
(Note 5)
5
%
Propagation Delay
(Note 5)
1.0
ns
Duty Cycle Distortion
(Note 5)
50
Residual Jitter
(Note 5)
25
Input Capacitance
(Note 5)
1.0
Output Resistance
(Note 5)
10
Ω
Output Inductance
(Note 5)
6
nH
ps
-
-
-
pspp
MISCELLANEOUS PERFORMANCE
pF
Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices
should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation.
Note 2: Min/max ratings are based on product characterization and simulation. Individual parameters are tested as noted. Outgoing quality levels are determined
from tested parameters.
Note 3: Spec is 100% tested at +25˚C, sampled tested at +85˚C.
Note 4: Spec is 100% tested at +35˚C at wafer probe.
Note 5: Spec is guaranteed by design.
Note 6: Measured between the 20% and 80% levels of the waveform.
Note 7: Measured with both outputs driving 150Ω, AC coupled at 270 Mbps.
www.national.com
2
Operation
INPUT INTERFACING
used to provide input termination and biasing. The input D.C.
common-mode voltage range is 0.8V to 2.5V below the positive power supply (Vcc). Input signals plus bias should be
kept within the specified common-mode range. For an 800
mVP-P input signal, typical input bias levels range from 1.2V
to 2.1V below the positive supply.
The CLC007 has high impedance, emitter-follower buffered,
differential inputs. Single-ended signals may also be input.
Transmission lines supplying input signals must be properly
terminated close to the CLC007. Either A.C. or D.C. coupling
as in Figure 2 or Figure 3 may be used. Figures 2, 4 andFigure 5 show how Thevenin-equivalent resistor networks are
Resistor to VCC (R1)
Resistor to VEE (R2)
ECL, 50Ω, 5V, VT=2V
Load Type
82.5Ω
124Ω
ECL, 50Ω, 5.2V, VT=2V
80.6Ω
133Ω
ECL, 75Ω, 5V, VT=2V
124Ω
187Ω
ECL, 75Ω, 5.2V, VT=2V
121Ω
196Ω
800mVP-P, 50Ω, 5V, VT=1.6V
75.0Ω
154Ω
800mVP-P, 75Ω, 5V, VT=1.6V
110Ω
232Ω
800mVP-P, 2.2KΩ, 5V, VT=1.6V
3240Ω
6810Ω
DS100085-4
FIGURE 1. Input Stage
DS100085-5
FIGURE 2. AC Coupled Input
3
www.national.com
Operation
(Continued)
DS100085-6
FIGURE 3. DC Coupled Input
DS100085-7
FIGURE 4. Single Ended 50Ω ECL Input
DS100085-8
FIGURE 5. Differential 50Ω ECL Input
to the load. A bandgap voltage reference sets output voltage
levels which are compatible with F100K and 10K ECL when
correctly terminated. The outputs do not have the same output voltage temperature coefficient as 10K. Therefore, noise
margins will be reduced over the full temperature range
OUTPUT INTERFACING
The CLC007’s class AB output stage, Figure 6, requires no
standing current in the output transistors and therefore requires no biasing or pull-down resistors. Advantages of this
arrangement are lower power dissipation and fewer external
components. The output may be either D.C. or A.C. coupled
www.national.com
4
Operation
(Continued)
when driving 10K ECL. Noise margins will not be affected
when interfacing to F100K since F100K is fully voltage and
temperature compensated.
DS100085-9
FIGURE 6. Output Stage
DS100085-10
FIGURE 7. Differential Input DC Coupled Output
OUTPUT RISE AND FALL TIMES
Output load capacitance can significantly affect output rise
and fall times. The effect of load capacitance, stray or otherwise, may be reduced by placing the output back-match resistor close to the output pin and by minimizing all interconnecting trace lengths. Figure 8 shows the effect on risetime
of parallel load capacitance across a 150Ω load.
5
www.national.com
Operation
(Continued)
DS100085-11
FIGURE 8. Rise Time vs CL
www.national.com
6
EVALUATION BOARD
A schematic, parts list and layout for a suitable evaluation
board are given on the following page. The artwork includes
trace, silk screen and ground layers. The individual printed
circuit board is available unassembled from National Semiconductor. To order this evaluation board, part number
CLC730056, contact your local sales representative or
the National Semiconductor Customer Response Center
in your area. (This evaluation board is identical to that for
the CLC006 the use for which may require additional parts.)
The evaluation board is a guide to proper circuit layout and
makes prototyping and measurement-taking easy. Since the
board is designed to accommodate many of the application
circuits possible with the CLC007, your particular application
may not require all of the listed parts or may require different
values. The evaluation board may be powered from standard
ECL supply voltages by installing the two jumpers in the locations labeled “−5”. For PECL supply voltages, install the
jumpers in the locations labeled “+5”.
PCB Layout Recommendations
Printed circuit board layout affects the performance of the
CLC007. The following guidelines will aid in achieving satisfactory device performance.
• Use a ground plane or power/ground plane sandwich design for optimum performance.
• Bypass device power with a 0.01 µF monolithic ceramic
capacitor in parallel with a 6.8 µF tantalum electrolytic capacitor located no more than 0.1″ (2.5 mm) from the device power pins.
• Provide short, symmetrical ground return paths for:
— inputs,
— supply bypass capacitors and
— the output load.
• Provide short, grounded guard traces located
— under the centerline of the package,
— 0.1″ (2.5 mm) from the package pins
— on both top and bottom of the board with connecting
vias.
DS100085-12
CLC007 Evaluation Board Schematic
7
www.national.com
PCB Layout Recommendations
Item
(Continued)
Reference Designator
Part Description
Qty
1
C1, C2, C3, C4, C8, C9
0.1 µF SMD Capacitor, Size 1206
6
2
C7, C10, C13, C14
0.01 µF SMD Capacitor, Size 1206
4
3
C11, C12
6.8 µF SMD Tantalum Capacitor, Size 6032
2
4
J1, J2
BNC PC Amphenol #31-5329-52RFX
2
5
J3, J4, J5, J6
BNC PC Amphenol #31-5329-72RFX
4
6
R3, R1
154Ω SMD Resistor, Size 1206
2
7
R4, R5, R6, R7, R8, R9
75Ω SMD Resistor, Size 1206
6
8
U1
CLC007AJE Cable Driver
1
9
+5, −5
Jumper
2
www.national.com
8
PCB Layout Recommendations
(Continued)
DS100085-13
DS100085-14
DS100085-15
DS100085-16
9
www.national.com
CLC007 Serial Digital Cable Driver with Dual Complementary Outputs
Physical Dimensions
inches (millimeters) unless otherwise noted
Order Number CLC007AJE
NS Package Number M08A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into
sonably expected to cause the failure of the life support
the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness.
ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
Americas
Tel: 1-800-272-9959
Fax: 1-800-737-7018
Email: [email protected]
www.national.com
National Semiconductor
Europe
Fax: +49 (0) 1 80-530 85 86
Email: [email protected]
Deutsch Tel: +49 (0) 1 80-530 85 85
English Tel: +49 (0) 1 80-532 78 32
Français Tel: +49 (0) 1 80-532 93 58
Italiano Tel: +49 (0) 1 80-534 16 80
National Semiconductor
Asia Pacific Customer
Response Group
Tel: 65-2544466
Fax: 65-2504466
Email: [email protected]
National Semiconductor
Japan Ltd.
Tel: 81-3-5620-6175
Fax: 81-3-5620-6179
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.