ETC HN1C03FUB

HN1C03FU
TOSHIBA Transistor
Silicon Npn Epitaxial Type (PCT Process)
HN1C03FU
Unit: mm
For Muting and Switching Applications
l Including two devices in US6 (ultra super mini type with 6 leads)
l High emitter-base voltage: VEBO = 25V (min)
l High reverse hFE: reverse hFE = 150 (typ.)(VCE =−2V, IC =−4mA)
l Low on resistance: RON = 1Ω (typ.)(IB = 5mA)
Maximum Ratings (Ta = 25°°C) (Q1, Q2 Common)
Characteristic
Symbol
Rating
Unit
Collector-base voltage
VCBO
50
V
Collector-emitter voltage
VCEO
20
V
Emitter-base voltage
VEBO
25
V
Collector current
IC
300
mA
Base current
IB
60
mA
P C*
200
mW
Tj
150
°C
Tstg
−55~150
°C
Collector power dissipation
Junction temperature
Storage temperature range
* Total rating
1
JEDEC
EIAJ
TOSHIBA
Weight: 6.8mg
―
―
2-2J1A
2001-06-07
HN1C03FU
Electrical Characteristics (Ta = 25°°C) (Q1,Q2 Common)
Symbol
Test
Circuit
Collector cut-off current
ICBO
―
Emitter cut-off current
IEBO
Characteristic
Min
Typ.
Max
Unit
VCB = 50V, IE = 0
―
―
0.1
µA
―
VEB = 25V, IC = 0
―
―
0.1
µA
hFE (note)
―
VCE = 2V, IC = 4mA
200
―
1200
Collector-emitter saturation
VCE (sat)
voltage
―
IC = 30mA, IB = 3mA
―
0.042
0.1
V
Base-emitter voltage
VBE
―
VCE = 2V, IC = 4mA
―
0.61
―
V
Transition frequency
fT
―
VCE = 6V, IC = 4mA
―
30
―
MHz
Cob
―
VCB = 10V, IE = 0, f = 1MHz
―
4.8
7
pF
Turn-on time
―
―
―
160
―
Storage time
―
―
―
500
―
Fall time
―
―
―
130
―
DC current gain
Collector output
capacitance
Switching
time
Test Condition
ns
Note: hFE Classification
A: 200~700, B: 350~1200
Marking
Equivalent Circuit (Top View)
2
2001-06-07
HN1C03FU
(Q1,Q2 Common)
3
2001-06-07
HN1C03FU
(Q1,Q2 Common)
4
2001-06-07
HN1C03FU
RESTRICTIONS ON PRODUCT USE
000707EAA
· TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
· The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
· The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
· The information contained herein is subject to change without notice.
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2001-06-07