ETC DS3816C-512

DS3816C-512
16Mb Advanced NV SRAM with Clock
www.maxim-ic.com
FEATURES
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PACKAGE OUTLINE
5V operation ±10%
Surface-mount NV RAM BGA module
construction
512k x 32 NV SRAM memory space and
separate 64 x 8 real-time clock memory
space
Real-time clock maintains hundredths of
seconds, seconds, minutes, hours, day, date,
month and year with leap year compensation
valid up to 2100
Removable backup power source provides
more than 8 years of timekeeping and data
retention
Read and write access times as fast as 70ns
for NV SRAM memory and 150ns for
real-time clock
Automatic data protection during power loss
Unlimited write cycle endurance
Low-power CMOS operation
Battery monitor checks remaining capacity
daily
Industrial temperature range of -40°C to
+85°C
Top View
Bottom View
Side View
DESCRIPTION
The DS3816C-512 is a 524,288 x 32-advanced nonvolatile (NV) SRAM module with a 168-bump ball
grid array (BGA) pinout. The highly integrated DS3816C-512 contains a 64-byte real time clock, four
8Mb SRAMs and control circuitry which constantly monitors VCC for an out-of-tolerance condition.
When such a condition occurs, the DS3816C-512 makes use of an attached DS3802 Battery Cap to
maintain clock information and preserve stored data while protecting that data by disallowing all memory
accesses. Additionally, the DS3816C-512 has dedicated circuitry for monitoring the status of VCC and the
status of an attached DS3802 Battery Cap.
1 of 16
08/12/02
DS3816C-512
PIN ASSIGNMENT Figure 1 (Top View)
CEO
CEC
OE
WEC
WE1
CE1
OEC
CE3
A10
A11
A8
A9
A0
WE3
A1
A2
A3
A4
VCC
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
RECEPTACLES FOR DS3801
DS3802
BATTERY CAP PINS
GND
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
CE2
DQ31
DQ30
DQ29
WE2
DQ28
DQ27
DQ24
DQ25
DQ26
DQ16
DQ17
DQ18
DQ23
RSV1
DQ22
DQ21
DQ20
DQ19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
A15
A17
A13
A18
WE0
A16
A14
A12
A7
A6
A5
DQ7
DQ6
DQ5
RSV2
DQ4
DQ0
DQ1
DQ2
VCC
BW
VBAT
80
79
Because the DS3816C-512 has a total of 168 balls and only 75 active signals, balls are wired together into
numbered groups, thus providing redundant connections for every signal.
VBAT
DQC4
DQC5
NC
DQC6
DQC7
DQC0
DQC1
DQC2
DQ10
DQ9
DQ8
DQ15
INT
DQ14
DQ13
DQ12
DQ11
GND
GND
DQ3
DQC3
GND
PIN DESCRIPTION
A18- A0
DQ31 - DQ0
DQC7-DQC0
CE3 - CEO
CEC
WE3
WEC
OE
- WEO
-
Address Inputs
NV SRAM Data In/Data Out
Clock Data In/Data Out
NV SRAM Chip Enable Inputs
Clock Chip Enable Input
NV SRAM Write Enable Inputs
Clock Write Enable Input
NV SRAM Output Enable Input
BW
INT
VCC
GND
RSV1
RSV2
VBAT
OEC
2 of 16
- Battery Warning Output
- Interrupt Output
- Power (5V)
- Ground
- No Connect
- No Connect
- DS3802 Battery Cap Connection
- Clock Output Enable Input
DS3816C-512
BLOCK DIAGRAM Figure 2
DS3802
3 of 16
DS3816C-512
NV SRAM READ MODE
The DS3816C-512 executes an NV SRAM read cycle whenever WE0 – WE3 (Write Enables) are inactive
(high), any or all of CE0 – CE3 (Chip Enables) are active (low) and 0E (Output Enable) is active (low).
The unique address specified by the 19 address inputs (A0 – A18) defines which of the 524,288 words of
data is accessed. The four chip enable signals ( CE0 – CE3 ) determine which bytes in the addressed word
are output on data lines DQ31 – DQ0. Valid data will be output within tACC (NV SRAM Access Time)
after the last address input signal is stable, providing that CE and 0E (Output Enable) access times are
also satisfied. If CE and 0E access times are not satisfied, then data access must be measured from the
later occurring signal ( CE or 0E ) and the limiting parameter is either tCO for CE or tOE for 0E rather
than tACC.
NV SRAM WRITE MODE
The DS3816C-512 executes an NV SRAM write cycle whenever any or all of the WE signals ( WE0 –
WE3 ) are active (low) and any of the corresponding CE signals ( CE0 – CE3 ) are active (low) after all
address inputs are stable. The later occurring falling edge of CE or WE will determine the start of the
write cycle. The write cycle is terminated by the earlier rising edge of CE or WE . All address inputs
must be kept valid throughout the write cycle. WE0 – WE3 must return to the high state for a minimum
recovery time (tWR) before another cycle can be initiated. The 0E control signal should be kept inactive
(high) during write cycles to avoid bus contention. However, if output drivers are enabled ( CE and 0E
active) then WE will disable the outputs in tODW from its falling edge.
CLOCK READ MODE
The DS3816C-512 executes a clock read cycle whenever WEC (Clock Write Enable) is inactive (high),
CEC (Clock Chip Enable) is active (low) and OEC (Output Enable) is active (low). The unique clock
address specified by address inputs A0 – A5 defines which of the 64 bytes of data is accessed. Valid data
will be output within tACC (Clock Access Time) after the last address input signal is stable, providing that
CEC and OEC (Output Enable) access times are also satisfied. If CEC and OEC access times are not
satisfied, then data access must be measured from the later occurring signal ( CEC or OEC ) and the
limiting parameter is either tCO for CEC or tOE for OEC rather than tACC. Only addresses 0 to 3 FH are
implemented in the clock address space. Accesses to clock addresses higher than 3 FH are undefined.
CLOCK WRITE MODE
The DS3816C-512 executes a clock write cycle whenever WEC is active (low) and CEC is active (low)
after all address inputs are stable. The later occurring falling edge of CEC or WEC will determine the
start of the write cycle. The write cycle is terminated by the earlier rising edge of CEC or WEC . All
address inputs must be kept valid throughout the write cycle. WEC must return to the high state for a
minimum recovery time (tWR) before another cycle can be initiated. The OEC control signal should be
kept inactive (high) during write cycles to avoid bus contention. However, if output drivers are enabled
( CEC and OEC active) then WEC will disable the outputs in tODW from its falling edge.
DATA RETENTION MODE
The DS3816C-512 provides full functional capability for VCC greater than 4.5V and write protects by
4.25V. Data is maintained in the absence of VCC without any additional support circuitry. The
DS3816C-512 constantly monitors VCC. Should the supply voltage decay to VTP, the device
automatically write protects itself, all inputs become “don’t care,” and all outputs become high
impedance. As VCC falls below approximately 2.7V, a power switching circuit electrically connects an
4 of 16
DS3816C-512
attached DS3802 Battery Cap to the SRAM to retain data. During power-up, when VCC rises above
approximately 2.7V, the power switching circuit connects external VCC to the SRAM and disconnects the
DS3802. Normal RAM operation can resume after VCC exceeds 4.5V.
BATTERY MONITORING
The DS3816C-512 automatically monitors the battery in an attached DS3802 Battery Cap on a 24-hour
time interval. Such monitoring begins within tREC after VCC rises above VTP and is suspended when
power failure occurs.
After each 24-hour period has elapsed, the battery is connected to an internal 1MW test resistor for one
second. During this one second, if battery voltage falls below the battery voltage trip point (2.6V), the
battery warning output BW is asserted. Once asserted, BW remains active until the battery cap or
DS3802 is replaced. The battery is still retested after each VCC power-up, however, even if BW is active.
If the battery voltage is found to be higher than 2.6V during such testing, BW is a de-asserted and regular
24-hour testing resume. BW has an open-drain output driver.
CLOCK REGISTERS Figure 3
5 of 16
DS3816C-512
TIME OF DAY ALARM MASK BITS Figure 4
REGISTER
MINUTES HOURS
1
1
0
1
0
0
0
0
DAYS
1
1
1
0
ALARM ONCE PER MINUTE
ALARM WHEN MINUTES MATCH
ALARM WHEN MINUTES AND HOURS MATCH
ALARM WHEN MINUTES, HOURS AND DAYS MATCH
NOTE:
Any other bit combinations produce illogical operation.
CLOCK REGISTERS
The DS3816C-512 clock has 14 8-bit internal registers that contain all timekeeping, alarm, watchdog, and
control information. The clock, calendar, alarm, and watchdog registers are memory locations that
contain both external (user accessible) and internal copies of the data. The external copies are
independent of internal functions except that they are updated periodically by simultaneous transfer from
the incremented internal copies. The Command Register bits are affected by both internal and external
functions. In addition to the 14 registers, the clock also contains 50 bytes of user RAM. Clock registers 0,
1, 2, 4, 6, 8, 9, and A (hex) contain day, date, and time information stored in binary-code decimal (BCD)
format. Registers 3, 5, and 7 contain time-of-day alarm information also stored in BCD format. Register
B is the Command Register containing eight 1-bit binary fields. Registers C and D contain watchdog
alarm information stored in BCD format. Addresses E through 3F are general-purpose user RAM.
DAY, DATE AND TIME REGISTERS
Registers 0, 1, 2, 4, 6, 8, 9, and A (hex) contain day, date and time information in BCD format. Eleven
bits within these eight registers are not used and will always read zero regardless of how they are written.
Bits 6 and 7 in the Month Register (register 9) are binary control bits.
When set to logic 0, EOSC (register 9, bit 7) enables the clock oscillator. This bit will normally be turned
on by the user during device initialization. The oscillator can be turned on and off as needed by enabling
or disabling this bit.
Register 9, bit 6, ESQW , enables and disables the output of a 1024Hz square wave. Because this feature
is not supported in the DS3816C-512, ESQW should be set to logic one.
Bit 6 of the Hour Register (register 4) is defined as the 12- or 24-Hour Select Bit. When set to logic one,
the 12-hour format is selected. In the 12-hour format, bit 5 is the AM/PM bit with logic 1 being PM. In
the 24-hour mode, bit 5 is the upper-order 10-hour bit (set for hours 20-23).
The external day, date, and time registers are updated from their internal counterparts every 0.01 seconds
except when the TE bit (bit 7 of register B) is set low or the clock oscillator is not running ( EOSC high).
Setting TE low will freeze the external day, date, and time registers at their present values allowing all the
registers to be read or written without any of them being updated from the internal registers. After the
registers have been read or written, setting TE high will re-enable external register updates. While TE is
set low and the external registers are frozen, the internal registers continue to be incremented.
6 of 16
DS3816C-512
TIME OF DAY ALARM REGISTERS
Registers 3, 5, and 7 contain the Time of Day Alarm registers. Bits 3, 4, 5, and 6 of register 7 will always
read zero regardless of how they are written. Bit 7s of registers 3, 5, and 7 are mask bits (Figure 4).
When all of the mask bits are logic 0, a time of day alarm will only occur when registers 2, 4, and 6 match
the values stored in registers 3, 5, and 7. An alarm will be generated every day when bit 7 of register 7 is
set to logic 1. Similarly, an alarm is generated every hour when registers 7 and 5 both have bit 7 set to
logic 1. When registers 7, 5 and 3 all have bit 7 set to logic 1, an alarm will occur every minute at the
point where register 1 (seconds) rolls over from 59 to 00. Whenever an alarm occurs, the Time of Day
Alarm Flag TDF (register B bit 0) and the internal Time of Day Interrupt signal will go to the active state.
If the Interrupt Switch bit IPSW (register B bit 6) is set to a logic 0 and the Time of Day Alarm Mask bit
TDM (register B bit 3) is logic 0, the Interrupt Output pin INT will also activate.
Time of day alarm registers are written and read in the same format as the day, date, and time registers.
The Time of Day Alarm Flag, Time of Day Interrupt and INT output are always cleared when the Time
of Day Alarm registers are read or written.
WATCHDOG ALARM REGISTERS
Registers C and D contain the timeout period for the Watchdog Alarm. The two registers contain a count
from 0.01 to 99.99 seconds in BCD format. The two Watchdog Alarm Registers can be written or read in
any order. After a new value is entered or either of the Watchdog Alarm Registers is read, an internal
watchdog timer will start counting down from the entered Watchdog Alarm Register value toward zero.
When zero is reached, the Watchdog Alarm Flag (register B, bit 1) and the internal Watchdog Interrupt
signal will go to the active state. If the Interrupt Switch bit IPSW (register B, bit 6) is set to logic 1 and
the Watchdog Alarm Mask bit WAM (register B, bit 3) is logic 0, the Interrupt Output INT will also
activate. The watchdog timer countdown is interrupted and the timer is re-initialized to the value in the
Watchdog Alarm Registers every time either Watchdog Alarm Register is accessed. Controlled, periodic
accesses to the Watchdog Alarm Registers can prevent the activation of the Watchdog Alarm Flag, the
internal Watchdog Interrupt signal and the INT output. The Watchdog Alarm Registers always read the
value entered. The actual watchdog timer is internal and is not accessible. Writing 00H to registers C
and D will disable the Watchdog Alarm feature.
COMMAND REGISTER
Register B, the Command Register, contains control bits and flag bits. The operation of each bit is
described below.
TE - Transfer Enable (bit 7) When set to logic 0, this bit disables the transfer of data between internal
and external clock registers. The contents of the external registers are frozen and reads and writes of day,
date and time information are not affected by updates. This bit must be set to logic 1 to enable updates.
IPSW - Interrupt Switch (bit 6) This bit should be initialized to logic 1 to connect the internal
Watchdog Interrupt signal to the INT output pin. Setting this bit to logic 0 connects the internal Time of
Day Interrupt signal to the INT output pin.
HI/LO - INT Sink or Source Current (bit 5) When this bit is set to logic 1 and VCC is applied, the INT
output pin will source current when activated (see IOH spec). When this bit is set to logic 0, INT will sink
current (see IOL spec).
7 of 16
DS3816C-512
PU/LVL - INT Pulse or Level (bit 4) When this bit is set to logic 0, INT will be in the level mode,
going to the logic level define by the HI/LO bit and staying there until the interrupt is cleared. When this
bit is set to logic 1, INT will be in pulse mode, sourcing or sinking current as defined by the HI/LO bit for
a minimum of 3ms and then releasing.
WAM - Watchdog Alarm Mask (bit 3) When this bit is set to logic 0, the internal Watchdog Interrupt
signal will be enabled. If IPSW is also set to logic 1, any Watchdog Alarm will activate the INT output.
When this bit is set to logic 1, Watchdog Alarms will have no effect on the internal Watchdog Interrupt
signal or on the INT pin.
TDM - Time of Day Alarm Mask (bit 2) When this bit is set to logic 0, the internal Time of Day
Interrupt signal will be enabled. If IPSW is set to logic 0, any Time of Day Alarm will activate the INT
output. When this bit is set to logic 1, Time of Day Alarms will have no effect on the internal Time of
Day Interrupt signal or on the INT pin.
WAF - Watchdog Alarm Flag (bit 1) This bit is set to logic 1 when a Watchdog Alarm occurs
(regardless of the state of the Watchdog Alarm Mask bit WAM). WAF is read-only. This bit is reset
when either of the Watchdog Alarm Registers is accessed. When the PU/LVL bit is in the pulse mode,
this flag will only be set to logic 1 for the 3 ms duration of the INT output pulse.
TDF - Time of Day Alarm Flag (bit 0) This bit is set to logic 1 when a Time of Day Alarm occurs
(regardless of the state of the Time of Day Alarm Mask bit TDM). TDF is read-only. The time the alarm
occurred can be determined by reading the Time of Day Alarm Registers. This bit is reset to logic 0
when any of the Time of Day Alarm Registers is accessed. When the PU/LVL bit is in the pulse mode,
this flag will only be set to logic 1 for the 3ms duration of the INT output pulse.
8 of 16
DS3816C-512
ABSOLUTE MAXIMUM RATINGS*
Voltage on any pin relative to ground
Operating temperature
Storage temperature
Soldering temperature
-0.3 to +6.0 V
-40°C to 85°C
-40°C to 85°C
See J-STD-020A specification
* This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operation sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect reliability.
RECOMMENDED DC OPERATING CONDITIONS
PARAMETER
Power Supply Voltage
Logic 1 Input Voltage
Logic 0 Input Voltage
SYMBOL
VCC
VIH
VIL
DC ELECTRICAL CHARACTERISTICS
PARAMETER
Input Leakage Current
I/O Leakage Current
Output Current @ 2.4V
Output Current @ 0.4V
Standby Current (all CE =VIH)
Standby Current
(all CE =VCC-0.3V)
Operating Current (one CE =VIL)
Operating Current (all CE =VIL)
Write Protection Voltage
SYMBOL
IIL
IIO
IOH
IOL
ICCS1
MIN
4.5
2.2
0
TYP
5.0
MAX
5.5
VCC
0.8
UNITS
V
V
V
MIN
-5
-1
-1
2.1
4.25
TYP
MAX
5
1
3
7
UNITS
mA
mA
mA
mA
mA
2
4
mA
4.37
85
350
4.5
mA
mA
V
CAPACITANCE
PARAMETER
Input Capacitance: A18-A0, OE
Input Capacitance: CE3 - CE0 , WE3 WE0 , CEC , WEC , OEC
I/O Capacitance: DQ31-DQ0,
DQC7-DQC0
Output Capacitance: BW , INT
NOTES
(TA = -40°C to 85°C; VCC= 5V±10%)
ICCS2
ICCO1
ICCO2
VTP
(TA = -40°C to 85°C)
NOTES
3
3
(TA = 25°C)
SYMBOL
CIN
MIN
TYP
25
MAX
50
UNITS
pF
CIN
5
10
pF
CI/O
5
10
pF
COUT
5
10
pF
9 of 16
NOTES
DS3816C-512
AC ELECTRICAL CHARACTERISTICS
PARAMETER
Read Cycle Time
Access Time
OE to Output Valid
CE to Output Valid
OE or CE to Output Active
Output High-Z from
Deselection
Output Hold from Address
Change
Write Cycle Time
CE Pulse Width
Write Pulse Width
Address Setup Time
Write Recovery Time
Output High-Z from WE
Output Active from WE
Data Setup Time
Data Hold Time
SYMBOL
tRC
tACC
tOE
tCO
tCOE
(TA = -40°C to 85°C; VCC = 5V±10%)
NV SRAM
MIN MAX
70
70
35
70
5
CLOCK
MIN MAX
150
150
70
150
5
25
tOD
50
UNITS
ns
ns
ns
ns
ns
NOTES
ns
5
tOH
5
5
ns
tWC
tCW
tWP
tAW
tWR1
tWR2
tODW
tOEW
tDS
tDH1
tDH2
70
55
55
0
5
12
150
150
100
0
10
10
ns
25
5
30
0
7
50
5
60
0
0
TIMING DIAGRAM: READ CYCLE
10 of 16
ns
ns
ns
ns
ns
ns
ns
ns
ns
5
11
12
5
5
4
11
12
DS3816C-512
TIMING DIAGRAM: WRITE CYCLE 1 ( WE )
TIMING DIAGRAM: WRITE CYCLE 2 ( CE )
11 of 16
DS3816C-512
POWER-DOWN/POWER-UP CONDITION
See Note 10
TIMING DIAGRAM: BATTERY WARNING DETECTION
See Note 13
12 of 16
DS3816C-512
POWER-DOWN/POWER-UP TIMING
PARAMETER
VCC Fail Detect to CE and WE
Inactive
VCC Slew from VTP to 0V
VCC Slew from 0V to VTP
VCC Valid to CE and WE Inactive
VCC Valid to End of Write Protection
VCC Valid to BW Valid
INT Pulse Width (PU/LVL bit high)
(TA = -40°C to 85°C)
SYMBOL
TYP
tPD
tF
tR
tPU
tREC
tBPU
tIPW
MAX
UNITS
NOTES
0
ms
10
ms
ms
ms
ms
s
ms
13
14
300
300
2
125
1
3
BATTERY WARNING TIMING
PARAMETER
Battery Test Cycle
Battery Test Pulse Width
Battery Test to BW Active
MIN
(TA = -40°C to 85°C; VCC = 5V±10%)
SYMBOL
tBTC
tBTPW
tBW
MIN
TYP
24
MAX
1
1
UNITS
hr
s
s
NOTES
(TA = 25°C)
PARAMETER
Expected Data Retention Time
SYMBOL
tDR
MIN
8
TYP
MAX
UNITS
years
NOTES
9
WARNING:
Under no circumstances are negative undershoots, of any amplitude, allowed when device is in battery
backup mode.
NOTES:
1.
2.
3.
4.
5.
6.
is high throughout read cycle.
OE = VIH or VIL. If OE = VIH during write cycle, the output buffers remain in a high impedance state.
All outputs open-circuited.
tDS is measured from the earlier of CE or WE going high.
These parameters are sampled with a 5pF load and are not 100% tested.
If the CE low transition occurs simultaneously with or later than the WE low transition, the output
buffers remain in a high impedance state during this period.
7. If the CE high transition occurs prior to or simultaneously with the WE high transition, the output
buffers remain in a high impedance state during this period.
8. If WE is low or the WE low transition occurs prior to or simultaneously with the CE low transition,
the output buffers remain in a high impedance state during this period.
9. Expected data retention time can be extended indefinitely if the DS3802 Battery Cap is periodically
replaced.
10. In a power down condition the voltage on any pin may not exceed the voltage on VCC.
11. tWR1, tDH1 are measured from WE going high.
12. tWR2, tDH2 are measured from CE going high.
13. BW are open-drain outputs and cannot source current. External pull-up resistors should be connected
to these pins for proper operation. Both pins will sink 10mA.
14. INT will activate within 100ns after the alarm condition arises.
WE
13 of 16
DS3816C-512
DC TEST CONDITIONS
AC TEST CONDITIONS
Outputs Open
All voltages are referenced to ground
Output load: 100pF + 1 TTL gate
Input pulse levels: 0V to 3.0V
Timing measurement reference levels
input: 1.5V
output: 1.5V
Input pulse rise and fall times: 5ns
DS3816C-512 PACKAGE DIMENSIONS
A
B
C
D
E
F
G
H
I
J
K
DIM
in
mm
in
mm
in
mm
in
mm
in
mm
in
mm
in
mm
in
mm
in
mm
in
mm
in
mm
MIN
1.720
43.69
1.720
43.69
0.108
2.74
1.497
38.02
0.047
1.19
0.108
2.74
0.047
1.19
0.305
7.74
0.125
3.10
0.025
0.64
MAX
1.730
43.94
1.730
43.94
0.118
3.00
1.503
38.18
0.053
1.35
0.118
3.00
0.053
1.35
0.320
8.13
0.135
3.43
.135
3.43
0.032
0.76
14 of 16
DS3816C-512
DS3816C-512 PACKAGE DIMENSIONS (With Attached DS3802 Battery Cap)
DIM
in
A
mm
in
B
mm
in
C
mm
in
D
mm
15 of 16
MIM
-
MAX
1.830
45.046
1.830
45.046
0.435
10.708
0.0390
0.9600
DS3816C-512
DS3816C-512 RECOMMENDED LAND PATTERN (With Overlaid
Package Outline)
The DS3816C-512 ball grid array is a subset of the industry-standard 40mm BGA format, with all balls
on a 50mil grid. Corner balls have been removed to provide space for the electrical and mechanical
interface features that facilitate attachment of the DS3802 Battery Cap.
V-BAT TEST PADS
0.027 DIA
2 PL
I/O PADS
0.27 DIA
X 168 PL
0.150
0.113
80 79 78 7776 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60
0.050
TYP
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
1.500
20 21 22 23 24 25 26 27 28 29 3031 32 33 34 35 36 3738 39 40
0.413
0.113
0.050
TYP
0.150
16 of 16
1.725
sq.