PD - 91861A IRFL024N HEXFET® Power MOSFET l l l l l l Surface Mount Advanced Process Technology Ultra Low On-Resistance Dynamic dv/dt Rating Fast Switching Fully Avalanche Rated D VDSS = 55V RDS(on) = 0.075Ω G ID = 2.8A S Description Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The SOT-223 package is designed for surface-mount using vapor phase, infra red, or wave soldering techniques. Its unique package design allows for easy automatic pickand-place as with other SOT or SOIC packages but has the added advantage of improved thermal performance due to an enlarged tab for heatsinking. Power dissipation of 1.0W is possible in a typical surface mount application. S O T -2 2 3 Absolute Maximum Ratings Parameter ID @ TA = 25°C ID @ TA = 25°C ID @ TA = 70°C IDM PD @TA = 25°C PD @TA = 25°C VGS EAS IAR EAR dv/dt TJ, TSTG Max. Continuous Drain Current, VGS @ 10V** Continuous Drain Current, VGS @ 10V* Continuous Drain Current, VGS @ 10V* Pulsed Drain Current Power Dissipation (PCB Mount)** Power Dissipation (PCB Mount)* Linear Derating Factor (PCB Mount)* Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy* Peak Diode Recovery dv/dt Junction and Storage Temperature Range Units 4.0 2.8 2.3 11.2 2.1 1.0 8.3 ± 20 214 2.8 0.1 5.0 -55 to + 150 A W W mW/°C V mJ A mJ V/ns °C Thermal Resistance Parameter RθJA RθJA Junction-to-Amb. (PCB Mount, steady state)* Junction-to-Amb. (PCB Mount, steady state)** Typ. Max. Units 90 50 120 60 °C/W * When mounted on FR-4 board using minimum recommended footprint. ** When mounted on 1 inch square copper board, for comparison with other SMD devices. www.irf.com 1 6/15/99 Powered by ICminer.com Electronic-Library Service CopyRight 2003 IRFL024N Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current V(BR)DSS ∆V(BR)DSS/∆TJ IGSS Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Min. 55 ––– ––– 2.0 3.0 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.056 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 8.1 13.4 22.2 17.7 400 145 60 Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.075 Ω VGS = 10V, ID = 2.8A 4.0 V VDS = VGS, ID = 250µA ––– S VDS = 25V, ID = 1.68A 25 VDS = 55V, VGS = 0V µA 250 VDS = 44V, VGS = 0V, TJ = 125°C 100 VGS = 20V nA -100 VGS = -20V 18.3 ID = 1.68A 3.0 nC VDS = 44V 7.7 VGS = 10V, See Fig. 6 and 9 ––– VDD = 28V ––– ID = 1.68A ns ––– RG = 24Ω ––– RD = 17Ω, See Fig. 10 ––– VGS = 0V ––– pF VDS = 25V ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions MOSFET symbol ––– ––– 2.8 showing the A integral reverse ––– ––– 11.2 p-n junction diode. ––– ––– 1.0 V TJ = 25°C, IS =1.68A, VGS = 0V ––– 35 53 ns TJ = 25°C, IF = 1.68A ––– 50 75 nC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Starting TJ = 25°C, L = 54.7 mH ISD ≤ 1.68A, di/dt ≤ 155A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C Pulse width ≤ 300µs; duty cycle ≤ 2%. RG = 25Ω, IAS = 2.8A. (See Figure 12) 2 Powered by ICminer.com Electronic-Library Service CopyRight 2003 www.irf.com IRFL024N 100 100 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V I D , Drain-to-Source Current (A) I D , Drain-to-Source Current (A) 10 4.5V 1 20µs PULSE WIDTH TJ = 25 °C 0.1 0.1 1 10 10 4.5V 1 100 2.0 R DS(on) , Drain-to-Source On Resistance (Normalized) I D , Drain-to-Source Current (A) 10 TJ = 150 ° C TJ = 25 ° C V DS = 25V 20µs PULSE WIDTH 5.5 6.0 Fig 3. Typical Transfer Characteristics www.irf.com Powered by ICminer.com Electronic-Library Service CopyRight 2003 10 100 Fig 2. Typical Output Characteristics, 100 5.0 1 VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics, VGS , Gate-to-Source Voltage (V) 20µs PULSE WIDTH TJ = 150 °C 0.1 0.1 VDS , Drain-to-Source Voltage (V) 1 4.5 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP TOP 6.5 I D = 2.8A 1.5 1.0 0.5 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 TJ , Junction Temperature ( °C) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRFL024N C, Capacitance (pF) 600 Ciss 500 20 VGS = 0V, f = 1MHz Ciss = Cgs + Cgd , Cds SHORTED Crss = Cgd Coss = Cds + Cgd Coss 400 300 200 Crss 100 ID = 1.68 A VDS = 44V VDS = 27V VGS , Gate-to-Source Voltage (V) 700 15 10 5 FOR TEST CIRCUIT SEE FIGURE 13 0 0 1 10 0 100 5 10 15 20 QG , Total Gate Charge (nC) VDS , Drain-to-Source Voltage (V) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 100 I D , Drain Current (A) ISD , Reverse Drain Current (A) OPERATION IN THIS AREA LIMITED BY RDS(on) 10 1 10 100us 1ms 1 10ms TJ = 150 ° C TJ = 25 ° C 0.1 0.2 V GS = 0 V 0.4 0.6 0.8 1.0 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage 4 Powered by ICminer.com Electronic-Library Service CopyRight 2003 1.2 TC = 25 ° C TJ = 150 ° C Single Pulse 0.1 0.1 1 10 100 1000 VDS , Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area www.irf.com IRFL024N 10V VGS QGS RD VDS QG QGD D.U.T. RG + - VDD VG 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Charge Fig 9a. Basic Gate Charge Waveform Fig 10a. Switching Time Test Circuit Current Regulator Same Type as D.U.T. VDS 90% 50KΩ .2µF 12V .3µF D.U.T. + V - DS 10% VGS VGS td(on) 3mA IG tr t d(off) tf ID Current Sampling Resistors Fig 9b. Gate Charge Test Circuit Fig 10b. Switching Time Waveforms Thermal Response (Z thJC) 1000 100 D = 0.50 0.20 0.10 10 0.05 P DM 0.02 0.01 t1 1 t2 SINGLE PULSE (THERMAL RESPONSE) 0.1 0.0001 0.001 0.01 Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.1 1 10 100 1000 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient www.irf.com Powered by ICminer.com Electronic-Library Service CopyRight 2003 5 IRFL024N 1 5V D R IV E R L VD S D .U .T RG + - VD D IA S 10V A 0.0 1 Ω tp Fig 12a. Unclamped Inductive Test Circuit EAS , Single Pulse Avalanche Energy (mJ) 500 TOP 400 BOTTOM ID 1.3A 2.2A 2.8A 300 200 100 0 25 50 75 100 125 150 Starting TJ , Junction Temperature ( °C) V (B R )D SS tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms 6 Powered by ICminer.com Electronic-Library Service CopyRight 2003 www.irf.com IRFL024N Package Outline SOT-223 (TO-261AA) Outline Part Marking Information SOT-223 E X A M P L E : T H IS IS A N IR FL 0 14 P A R T NU M B E R IN TE RN A TIO NA L RE CT IF IE R LO G O F L0 14 31 4 TOP www.irf.com Powered by ICminer.com Electronic-Library Service CopyRight 2003 W A FER LO T CO D E XXXXXX D A TE CO D E (Y W W ) Y = LA S T D IG IT O F TH E Y E A R W W = W E EK B O TT O M 7 IRFL024N Tape & Reel Information SOT-223 Outline 2 .0 5 (.0 8 0 ) 1 .9 5 (.0 7 7 ) TR 4 .1 0 (.1 6 1 ) 3 .9 0 (.1 5 4 ) 0 .3 5 (.0 1 3 ) 0 .2 5 (.0 1 0 ) 1 .8 5 (.0 7 2 ) 1 .6 5 (.0 6 5 ) 7 .5 5 (.2 9 7) 7 .4 5 (.2 9 4) 1 6 .3 0 (.6 4 1 ) 1 5 .7 0 (.6 1 9 ) 7 .6 0 (.2 9 9 ) 7 .4 0 (.2 9 2 ) 1 .6 0 (.0 6 2 ) 1 .5 0 (.0 5 9 ) TYP . F E E D D IR E C T IO N 1 2 .1 0 (.4 7 5 ) 1 1 .9 0 (.4 6 9 ) 2 .3 0 (.0 9 0 ) 2 .1 0 (.0 8 3 ) 7 .1 0 (.2 7 9 ) 6 .9 0 (.2 7 2 ) NOTES : 1 . C O N T R O L L IN G D IM E N S IO N : M IL L IM E T E R . 2 . O U T L IN E C O N F O R M S T O E IA -4 8 1 & E IA -5 4 1 . 3 . E A C H O 3 30 .0 0 (1 3 .0 0 ) R E E L C O N T A IN S 2 ,5 0 0 D E V IC E S . 1 3 .2 0 (.5 1 9 ) 1 2 .8 0 (.5 0 4 ) 1 5 .40 (.6 0 7) 1 1 .90 (.4 6 9) 4 330.00 (13.000) M AX. N O TE S : 1 . O U T LIN E C O M F O R M S T O E IA -4 1 8 -1 . 2 . C O N T R O L L IN G D IM E N S IO N : M IL L IM E T E R .. 3 . D IM E N S IO N M E A S U R E D @ H U B . 4 . IN C L U D E S F L A N G E D IS T O R T IO N @ O U T E R E D G E . 5 0.00 (1 .9 6 9 ) M IN . 1 4 .4 0 (.5 6 6 ) 1 2 .4 0 (.4 8 8 ) 3 1 8 .4 0 (.72 4 ) M AX . 4 WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936 http://www.irf.com/ Data and specifications subject to change without notice. 6/99 8 Powered by ICminer.com Electronic-Library Service CopyRight 2003 www.irf.com