ETC PHY1076

PHY1076-01
125Mbps to 2.7Gbps Laser Driver/
Post Amp with Digital Diagnostics
Features
Applications
Fibre Channel 1x, 2x
Gigabit Ethernet, SONET/SDH
OC-3, OC-12, OC-48
Ref
Internal
Registers
& 2 Wire I/F
Modulation
Mean Power
Control Loop
LASER BIAS
MPD
SHUTDOWN
SA_SDA
SA_SCL
Figure 1 - Outline Block Diagram
TSENSE
SHUTDOWN
28
RSSI
LOS
RXIN+
VGG
VDD_RXO
VSS_TX
VSS_RX
LASER+
36QFN
RXOUTRXOUT+
LASERVSS_TX
VDD_TXO
SDA
SCL
RREF
VDD_TX
19
9
18
SCL
SDA
Safety
Logic
VDD_TX
LASER_BIAS
MPD
TX_FAULT
Temperature
Comp
LASER-
27
NC
TSENSE
TX_DISABLE
Driver
1
RESET
VSS_TX
TXIN-
SA_SDA
RATESEL
LASER+
TXIN+
TXIN-
RXIN+
RXIN-
Low Pass
Filter
TXIN+
O/P
RXIN-
Level
Detect
RXOUT+
RXOUT-
RSSI
VDD_RX
Voltage
Reg
Ref
VSS_RX
MUX
SA_SCL
LOS
VSS_TX
•
•
•
36
•
10
•
•
•
The PHY1076-01 is a combined Laser driver and
limiting amplifier with support for Digital Diagnostic
Monitoring for use within small form factor
modules for Fibre Channel, GbE and SONET/SDH
applications.
The transmitter integrates a high speed output
stage with programmable bias and modulation
currents, controlled through a 2-wire serial
interface. The mean power control loop allows
connection in common anode configuration.
A Loss Of Signal (LOS) detector is included with
detection based on either the receiver photo
detector average current or received signal
modulation amplitude.
When used in digital diagnostics mode the
integrated A/D converters measuring temperature,
TX Bias, Supply Voltage, RX Signal Strength and
Mean Power are read via a 2-wire serial interface.
An external Microcontroller Unit (MCU) is used for
calibrating real time diagnostic monitors and alarm
generation.
TX_FAULT
•
•
•
Multi-rate from 125Mbps to 2.7Gbps
Laser driver output stage with 70mA max
modulation drive and 100mA bias current
Programmable mean power control loop
Temperature compensated modulation current
Integrated limiting amplifier with selectable
swing CML output
Programmable receiver low pass filter
Integrated Loss Of Signal function
Digital diagnostic mode compliant with SFF8472 using an external MCU
Stand-alone mode where device parameters
are loaded from an external EEPROM
-40°C to +95°C ambient operating range
36pin 6mm x 6mm QFN package
Eye safety logic
TX_DISABLE
•
•
Description
Figure 2 - Device Pin Out (Top View)
1
19-5684; Rev 9/12
Table of Contents
1.
2.
3.
Ordering Information .................................................................................................................................... 3
Pin Description ............................................................................................................................................. 3
Key Specifications........................................................................................................................................ 5
3.1.
Absolute Maximum Ratings ................................................................................................................ 5
3.2.
Continuous Ratings ............................................................................................................................. 5
3.3.
Receiver .............................................................................................................................................. 5
3.4.
Transmitter .......................................................................................................................................... 7
3.5.
2-Wire Serial Interface ...................................................................................................................... 10
3.6.
Typical Operating Characteristics ..................................................................................................... 12
4.
Functional Description ............................................................................................................................... 13
4.1.
Overview ........................................................................................................................................... 13
4.2.
Receiver Features ............................................................................................................................. 14
4.3.
Transmitter Features ......................................................................................................................... 17
4.4.
Laser Safety Features ....................................................................................................................... 19
4.5.
Tsense Temperature Sensor ............................................................................................................ 21
5.
Control Interface ........................................................................................................................................ 22
5.1.
Memory Map ..................................................................................................................................... 22
5.2.
Operation........................................................................................................................................... 23
5.3.
Digital Diagnostics Mode................................................................................................................... 28
5.4.
Stand-Alone Mode ............................................................................................................................ 30
5.5.
2-wire Serial Interface ....................................................................................................................... 32
6.
Register Map.............................................................................................................................................. 34
7.
Simplified Interface Models ........................................................................................................................ 43
8.
Typical Applications ................................................................................................................................... 45
8.1.
Power Supply Connections ............................................................................................................... 46
9.
Packaging .................................................................................................................................................. 48
10. Contact Information.................................................................................................................................... 49
2
1.
Ordering Information
Please refer to the Packaging section for test and package location ordering code definitions.
Part Number
Description
Package
PHY1076-01QD-RR
Enhanced 2.7G LASER driver and
Post Amp
QFN36, 6mmx6mm in Tape and Reel,
RoHS compliant (see Figure 41)
PHY1076-01QS-RR
Enhanced 2.7G LASER driver and
Post Amp
QFN36, 6mmx6mm in Tape and Reel,
RoHS (see Figure 41)
NOT FOR USE IN NEW DESIGNS
2.
Pin Description
Pin
No
Name
1,4
1
SA_SDA
2
RESET
Direction
Type
I/O
LVTTL
2-wire serial interface. Connects to EEPROM in stand-alone mode
I/P
CMOS
Reset
Power
Limiting amplifier output power supply
Ground
Receiver section ground connection
2
3
VDD_RXO
4
VSS_RX
3
5
RXOUT-
O/P
CML
Limiting amplifier differential serial data output.
6
RXOUT+
Limiting amplifier differential serial data output.
7
O/P
CML
4
I/O
LVTTL
2-wire serial data interface. Used in Digital Diagnostics Mode.
4
I/P
LVTTL
2-wire serial interface clock. Used in Digital Diagnostics Mode.
Analog
Connect to Ground through a 10k resistor
LVTTL
Transmit fail alarm. A logic 1 indicates a fault in the transmission
system. Requires external pull up for SFP MSA compliance
SDA
8
SCL
9
RREF
I/P
10
TX_FAULT
O/P
(open collector)
4
11
TX_DISABLE
12
VSS_TX
13
TXIN+
I/P
CML
Differential Laser driver input from host
14
TXIN-
I/P
CML
Differential Laser driver input from host
15
RATESEL
I/P
LVTTL
Toggles between two low pass filter characteristics. External 30k
pull down resistor required for SFP MSA compliance
16
VSS_TX
Ground
Transmission circuitry ground connection
17
NC
18
MPD
19
LASER_BIAS
20
3
Description
I/P
3
3
LVTTL
Output disable (active high). Disables Laser drive. On chip 8k pull
up
Ground
Transmission circuitry ground connection
No connection. Leave open circuit
VDD_TX
I/P
Analog
Monitor photodiode input
O/P
Analog
Laser bias current output
Power
Transmission circuitry power supply connection
Power
Transmission circuitry power supply connection
2
2
21
VDD_TXO
22
VSS_TX
3
23
LASER-
Ground
O/P
High speed
Transmission circuitry ground connection
Laser differential driver output
24
LASER+
25
VSS_TX
3
26
VGG
O/P
2
High speed
Laser differential driver output
Ground
Transmission circuitry ground connection
Ground
Ground substrate connection
Power
Transmission circuitry power supply connection
27
VDD_TX
28
SHUTDOWN
O/P
CMOS
Gate drive for optional Laser shutdown FET switch
29
TSENSE
I/P
Analog
External temperature sensing transistor connection
30
RSSI
I/P
Analog
Receive signal strength indicator & regulated supply for Rx
photodiode
31
LOS
O/P
LVTTL
Loss of signal output. Requires external pull up for SFP MSA
compliance
(open collector)
32
RXIN+
33
RXIN-
I/P
CML
Limiting amplifier differential serial data input
Ground
Receiver ground connection
Power
Limiting amp power supply
LVTTL
EEPROM 2-wire serial interface clock
Ground
Ground / Thermal Paddle
VDD_RX
-
Limiting amplifier differential serial data input
2
VSS_RX
35
SA_SCL
CML
3
34
36
I/P
1,4
PADDLE
I/P
1 Used in stand-alone mode only
2 All VDDs are internally connected by back-to-back protection diodes. VDDs should not be powered up independently.
3 All VSSs are internally connected to the IC substrate connection.
4 Internally pulled high with an 8kΩ pull-up resistor.
4
3.
Key Specifications
3.1.
Absolute Maximum Ratings
Parameter
Conditions
Min
Max
Unit
- 0.5
+6.5
V
VSS - 0.5
VDD + 0.5
V
150
°C
260
°C
Supply Voltage
Voltage on any pin
Typ
Storage Temperature
Soldering Temperature
For 25 seconds
Junction Temperature
ESD
140
Human Body Model
°C
2
kV
Under absolute maximum rating conditions device not guaranteed to meet specifications; permanent damage
may be incurred by operating beyond these limits.
3.2.
Continuous Ratings
Parameter
Conditions
Operating Supply Voltage
Continuous operation
Current consumption
Idd = Iddo + (Km*Imod) + (Kb*Ibias)
Min
Typ
Max
Unit
2.97
3.3
3.63
V
mA
High Swing, OMA LOS, Vref = 113
Current Consumption (Iddo)
2448Mbps Filter
118
155Mbps Filter
110
Current consumption (Km)
0.536
Current consumption (Kb)
0.075
Operating temperature
Ambient Still Air, Max Bias and Modulation
Current
3.3.
Receiver
3.3.1.
Receive Limiting Amplifier
Parameter
5
mA
Symbol
-40
Conditions
-12
25
Min
(125 - 2.125Gbps)
+95
°C
Typ
Max
Unit
5
7.5
mVpp
Sensitivity
Differential, BER=1*10
Max Differential Input
TJ within spec
Input Return Loss
Differential, f<2GHz, device powered on
10
dB
Output Return Loss
Differential, f<2GHz, device powered on
10
dB
Low Frequency Cutoff
High pass 3dB point for RX system
Differential Output
Swing
High swing mode
Low swing mode
Total Jitter, Tj
Measured over RX input voltage range 125Mbps
- 2.7Gbps
Duty Cycle Distortion
125Mbps - 2.7Gbps
40
Output Resistance
RXOUT+/- Single ended to VDD_RXO
40
1200
mVpp
15
800
400
50
kHz
1100
520
mVpp
100
mUI pp
60
%
60
Ω
Parameter
Symbol
Input Impedance
Rate select change time
Differential RXIN+ to RXIN-, DC
t_ratesel
Output Rise and Fall
Times (20%-80%)
3.3.2.
Min
Typ
85
Using RATESEL pin
Max
Unit
115
Ω
5
µs
155 Mbps filter, slow CMLslew = ‘1’ , low swing
200
300
155 Mbps filter, fast CMLslew = ‘0’, low swing
192
300
155 Mbps filter, slow CMLslew = ‘1’ , high swing
261
400
155 Mbps filter, fast CMLslew = ‘0’, high swing
253
400
2488 Mbps filter, slow CMLslew = ‘1’ , low swing
71
100
2488 Mbps filter, fast CMLslew = ‘0’, low swing
63
90
2488 Mbps filter, slow CMLslew = ‘1’, high swing
96
120
2488 Mbps filter, fast CMLslew = ‘0’, high swing
83
110
Typ
Max
ps
ps
ps
ps
RSSI Indicator and Rx PD Regulator
Parameter
Symbol
Conditions
Voltage on RSSI pin
Ireg=2mA (10nF & 100Ω minimum load)
Current sourced by
RSSI pin
Measured using Rx Power ADC
Min
2.4
Unit
V
2000
µA
Max
Unit
RSSI LOS assert time
10
µs
RSSI LOS de-assert
time
40
µs
3.3.3.
0
Receive Photocurrent LOS
Parameter
Symbol
Conditions
Min
Typ
Electrical Hysteresis
20log10 (RSSIdeassert / RSSIassert)
2
4
dB
RSSI LOS assert level
range
Set by AVG_LOS_set, Address F4h
4.0
411
µA
3.3.4.
OMA LOS
Parameter
6
Conditions
Symbol
OMA LOS assert time
t_loss_on
OMA LOS de-assert
time
t_loss_off
Conditions
Min
Typ
Max
Unit
100
µs
20
µs
Electrical Hysteresis
20log10 (Vdeassert / Vassert)
2.5
5.5
dB
OMA LOS assert level
Set by OMA_LOS_set, Address F3h
10
50
mV
OMA Signal
LOS
t_loss_on
t_loss_off
Figure 3 - OMA LOS Detection
3.4.
Transmitter
3.4.1.
Transmitter Inputs
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
2400
mVpp
120
Ω
High-Speed Data Input
1
Signal Voltage
Differential, AC-coupled, from 125Mbps to
2.7Gbps
200
High-Speed Data Input
Impedance
Differential, DC
80
Input Return Loss
Differential, f<2GHz, device powered on
10
dB
Input common mode
return loss
Both inputs shorted together, measured using
25Ω source termination, 100MHz – 2.5GHz
10
dB
3.4.2.
100
Laser Driver
Parameter
Modulation Current
Symbol
Conditions
Imod
Min
Typ
7
Max
Unit
70
mA
65
ps
100
mUI pp
Electrical 20% to 80%
rise / fall time
Measured using 50Ωeffective termination, AC
and DC coupled applications
Total Jitter contribution
Measured over modulation current range
Laser output compliance
range
Allowed voltage for Laser driver output pins in
dynamic operation, referenced to ground
(VSS_TX).
600
mV
Bias current output
compliance
Minimum allowed voltage for pin LASER_BIAS,
referenced to ground (VSS_TX)
300
mV
3.4.3.
55
Laser Mean Power Control Loop
Parameter
Symbol
Conditions
Bias Current
Min
Typ
0.5
Max
Unit
100
mA
Bias current off
Transmitter disabled
10
µA
Max current at MPD pin
Sink current
2.6
mA
Turn on/off overshoot
Bias current overshoot, Loop_BW=1
15
%
APC -3dB Loop
Bandwidth
fLoop_BW
Bias loop settling time
t_settle
7
Loop_BW = “0”
5
Loop_BW = “1”
15
kHz
Loop_BW = “0”
5
ms
Loop_BW = “1”
500
µs
3.4.4.
Eye Safety Internal Fixed Limits
Operation outside these limits causes a TX_FAULT to be asserted
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
High supply voltage
assert limit
VeyeHa
3.75
4.10
V
High supply voltage
de-assert limit
VeyeHd
3.65
4.05
V
0.05
0.15
V
Max
Unit
High Supply
Hysteresis
Parameter
Symbol
Conditions
Min
Typ
Low supply voltage
assert limit
VeyeLa
2.70
2.95
V
Low supply voltage
de-assert limit
VeyeLd
2.75
2.95
V
0.01
0.15
V
0.9
1.1
V
Max
Unit
300
ms
Low Supply Hysteresis
RREF pin voltage limit
3.4.5.
RREF voltage applied to pin after calibration
Fault Timing
Parameter
Symbol
Condition
Min
Typ
Time to initialize
t_init
From power on or application of Vcc>2.97V
during plug in
Hard TX_DISABLE
assert time
t_off
Time from rising edge of TX_DISABLE to when
the optical output falls below 10% of nominal
2
µs
Hard TX_DISABLE
negate time
t_on
Time from falling edge of TX_DISABLE to when
the modulated optical output rises above 90%
of nominal
800
µs
100
µs
Hard TX_FAULT
assert time
t_fault
Time from fault to TX_FAULT on
TX_DISABLE pulse
width
t_reset
Time TX_DISABLE must be held high to reset
TX_FAULT
TX_FAULT deassert
time
t_faultdass
8
Time to deassert TX_FAULT after
TX_DISABLE
5
µs
300
ms
3.4.6.
Diagnostic Timing Diagrams
VCC>2.97
TX_FAULT
TX_DISABLE
LASER_BIAS
t_off
t_init
t_on
Figure 4 - Device turn on
Occurrence of
Fault
TX_FAULT
TX_DISABLE
Laser
Transmitting
t_fault
t_reset
Figure 5 - Fault detection
9
t_faultdass
3.5.
2-Wire Serial Interface
3.5.1.
AC Electrical Characteristics
Parameter
Comment
Symbol
SCL clock frequency
fSCL
LOW period of the SCL
clock
tLOW
HIGH period of the SCL
clock
tHIGH
Min
Typ
Max
Unit
0
100
kHz
4.7
–
µs
4.0
–
µs
4.7
–
µs
4.0
–
µs
Set-up time for a
repeated START
condition
tSU:STA
Hold time (repeated)
START condition
tHD:STA
Data hold time
tHD:DAT
0
3.45
µs
Data set-up time
tSU:DAT
250
–
ns
–
1000
ns
–
300
ns
4.0
–
µs
4.7
–
µs
0
250
ns
–
10
pF
Rise time of both SDA
and SCL signals
tR
Fall time of both SDA
and SCL signals
tF
Set-up time for STOP
condition
tSU:STO
Bus free time between a
STOP and START
condition
tBUF
Output fall time from
VIHmin to VILmax
tof
Capacitance for each
I/O pin
Ci
10pF < Cb(1) < 400pF
See note 1
1 Cb = capacitance of a single bus line in pF.
t SU:STA
t SU:DAT
tHD:DAT
t SU:STO
t BUF
SDA
SCL
t HD:STA
tHIGH
t LOW
tR
tF
Figure 6 - SDA and SCL bus timing
10
tof
3.5.2.
DC Electrical Characteristics
Parameter
Symbol
Low level input voltage
VIL
High level input voltage
VIH
Low level O/P voltage
VOL
I/P current each I/O pin
3.5.3.
Ii
Condition
Min
Max
Unit
- 0.5
0.3 VDD
V
0.7 VDD
VDD + 0.5
V
0
0.4
V
-10
10
mA
Max
Unit
Host VCC
+ 0.3
V
3 mA sink current
0.1VDD < Vi < 0.9VDD
Typ
DC Characteristics: TX_FAULT; TX_DISABLE;LOS
Parameter
Comment
Min
Typ
LVTTL Voltage Out High
External 4.7k to 10k pull-up
Host VCC
- 0.5
LVTTL Voltage Out Low
External 4.7k to 10k pull-up
0
0.5
V
V
LVTTL Voltage In High
Internal pull-up
2.0
VDD
+ 0.3
LVTTL Voltage In Low
Internal pull-up
0
0.8
V
R pull-up
Internal pull-up
6
10
kΩ
11
3.6.
Typical Operating Characteristics
3.6.1.
Electrical Receiver Eye Diagrams (3.3V; Ta = 25oC; PRBS 27-1)
Figure 7 - 2.125Gbps High swing mode
3.6.2.
Optical Transmit Eye Diagrams (3.3V; Ta = 25oC; PRBS 223-1)
Transmitter setup with Pmean = -3.5dBm; E.R. =10dB
Figure 9 – 2.5 Gbps; STM16/OC48 Filter and mask
12
Figure 8 - 1.065Gbps High swing mode
4.
Functional Description
4.1.
Overview
LOS
Receiver
RSSI
LOS
RXIN+
RXOUT+
RXOUT-
Programmable
LPF
CML
AGC
RXINRATESEL
TXIN+
Transmitter
LASER+
TXIN-
LASER-
Modulation
DAC
Mean power
DAC
Comp
Bias current
LASER_BIAS
MPD
Control interface
RESET
Controller
Control
registers
SDA
SCL
SA_SDA
SA_SCL
2-wire
slave
RAM
2-wire
master
LASER safety
Safety
critical
shutdown
Temperature
ADC
Figure 10 - Top-level block diagram of the PHY1076-01
13
SHUTDOWN
TX_FAULT
TX_DISABLE
TSENSE
RREF
4.2.
Receiver Features
The receiver input is designed to be AC-coupled to the transimpedance amplifier, with internal 100Ω
differential termination. The AGC amplifier is followed by a low-pass filter with programmable cut-off
frequency, enabling the PHY1076-01 receiver to support six discrete data rates in the range 125 Mbps to
2.7 Gbps.
The filter output is followed by a limiting stage. For minimum duty cycle distortion, DC feedback from the
limiter output is used for offset cancellation.
The output CML buffer completes the receiver chain, delivering the output at pins RXOUT+ and RXOUT-.
The output edge rate is dependent on the programmable filter setting. Additionally, the output swing is
programmable to satisfy different interface requirements (e.g. CML, AC-coupled LVPECL compatible).
The PHY1076-01 includes a regulator to deliver a controlled voltage to the receiver photodiode cathode at
the RSSI pin. The current at RSSI is digitized for use in measuring the received signal strength. This
signal can also be used to generate a Loss of Signal (LOS) alarm, with a pre-set hysteresis for assert and
de-assert levels. The LOS assert threshold can be adjusted using the LOSS LEVEL DAC.
Alternatively, the LOS alarm can be programmed to detect the amplitude of the AC signal, the Optical
Modulation Amplitude (OMA) at the receiver input. The OMA LOS assert threshold can be adjusted using
the RX AMP DAC.
4.2.1.
Input Stage Configuration
The differential RXIN inputs from the ROSA can be terminated to a common mode voltage. This should be
used for all recommended application frequencies of the PHY1076-01, where the inputs are AC coupled.
The common mode voltage should be connected by setting RX_dccouple = ‘0’ (E8h rxControl0 bit 3).
4.2.2.
Rate Selection
3
0
1
signal
out
Programmable
signal
low-pass
in
filter
F5h rateSel
0 - 2 RateselA
3 - 5 RateselB
6Eh STAT_CON
bit 3 Soft Rate Select
RATESEL
Figure 11 - Low pass filter rate selection
A programmable low pass filter provides band limiting in the received signal path. The filter bandwidth is
set to 0.75 x signal data rate for optimum signal to noise performance and is controlled by a 3-bit control
word as shown in Table 1.
The rate selection register, rateSel, stores two 3-bit codes for controlling the filter; code A in bits 0 to 2,
and code B in bits 3 to 5. The selection between the two codes is determined by the RATESEL pin and
the Soft Rate Select bit as shown in Figure 11. Thus, the RATESEL pin can be used to switch between
two pre-selected rates.
The rateSel register is unique in that it is directly accessible from the 2-wire serial slave interface. Write
accesses are routed to both the register in hardware and the RAM. Read accesses read the rateSel value
from the hardware. This enables the PHY1076-01 to respond more quickly to updates of this register. This
also means that during the intialization sequence, the bandwidth of the receiver can be set up before the
dsfail alarm is cleared (see Section 5.2.2). This feature does not exist in the 2-wire serial master interface.
When loading registers from EEPROM, rateSel is loaded via RAM in the same way as all other registers.
14
2
Bit
1
0
Data Rate
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
125/155 Mbps
622 Mbps
1062 Mbps
1250 Mbps
2125 Mbps
2488 Mbps
No Filter
N/A
Table 1 - Signal data rates supported by the low pass filter
4.2.3.
CML Output Stage Configuration
The CML output stage has two slew rate settings. For maximum receiver eye opening set CMLslew = ‘0’
(E8h rxControl0 bit 0). To minimize emitted radiation set CMLslew = ‘1’. The slew rates are defined in the
table of Parametric Performance characteristics for the Receive limiting amplifier (Section 3.3.1).
The signal swing can also be adjusted. Set HiLoSwing = ‘1’ (E9h rxControl1 bit 1) for higher amplitude
differential output swing as defined in the table in section 3.3.1. Set HiLoSwing = ‘0’ for lower amplitude
output swing.
4.2.4.
Loss Of Signal
Mean Rx power based LOS
LOS
LEVEL
DAC
0
LOS
1
6Eh STAT_CON
bit 1 LOS
E8h rxControl0
bit 2 LOSpolarity
bit 1 LOStype
F4h AVG_LOS_set
Power
detect
RSSI
Rx Power
ADC
FBh rxPowerADC
RX AMP
DAC
F3h OMA_LOS_set
Amplitude
detect
RXIN+
RXIN-
OMA based LOS
Figure 12 - Control of the LOS pin
Loss of signal (LOS) is determined in one of two ways. If LOStype = ‘1’ then the optical modulation
amplitude (OMA) method is selected. The signal amplitude measured at RXIN+/- is compared against a
threshold level set by the OMA_LOS_set register. If the OMA does not exceed the threshold then the
LOS pin and consequently the LOS bit in STAT_CON will be asserted.
If LOStype = ‘0’ then the mean received power based method is selected. The signal power detected on
the receiver signal strength indicator (RSSI) pin is compared against a threshold level set by
AVG_LOS_set. If the RSSI does not exceed the threshold then the LOS pin and LOS bit are asserted.
The polarity of the LOS pin is controlled by LOSpolarity. If LOSpolarity = ‘0’ then LOS is set high during
a loss of signal condition. Conversely, if LOSpolarity = ‘1’ then LOS is set high when a signal is detected.
15
Register
DAC
AVG_LOS_set
LOS LEVEL DAC
(8 bits)
For Codes 00h – 1Fh Step Size =1.3µA±0.4µA
0µA to 31µA
For Codes 1Fh – 7Eh Step Size = 4.6µA±1.0µA
31µA to 411µA
RX AMP DAC
(8 bits)
Use Codes 28h to C8h Step Size = 250µV
(nominal DAC range = 0mV to 64mV)
10mV to 50mV
OMA_LOS_set
Step Size
Threshold Range
Table 2 - LOS DAC characteristics
For measurement of RSSI, which is used by SFF-8472 Digital Diagnostics Monitoring, the PHY1076-01
can be connected as shown in Figure 13, sourcing the photodiode bias current. This shows a PHY1093
TIA interfacing to the PHY1076-01. The photodiode used is biased using the regulated output of the
PHY1076-01, providing a stable and low noise bias for the photodiode. The PHY1076-01 measures the
photodiode current and generates a report of received signal strength via an on board A-D converter.
3.3V
VCC
1nF
PHY1093
FILT
100Ω
Voltage
Regulator
50Ω
PDC
LOS
DAC
LOS
Photodiode
Regulator
RSSI
50Ω
LOS
ADC
RF
RX+
AGC
Amp
Amplifier
Amplifier
PDA
RXIN+
100Ω
Programmable
Programmable
Low Pass Filter &
Output Buffer
AMP
RX-
RXOUT-
RXIN-
Signal Detect &
DC Restore
Overload
RXOUT+
PHY1076-01
GNDA
Figure 13 - Connection to TIA for RSSI method of LOS detection
In some cases the TIA may produce an output current which is proportional to the Received Signal
Strength. In this case the application circuit shown in Figure 14 should be used. The current IRSSI is
mirrored using a dual NPN transistor as shown. This sinks an output current from the PHY1076-01 which
can then be measured using the on chip ADC.
3.3V
VCC
LOS
DAC
LOS
TIA
RI
Voltage
Regulator
BCV61 or Similar
Photodiode
Regulator
RSSI
IRSSI
0V
PDC
RX+
Amplifier
PDA
RX-Overload
RXIN+
100Ω
AMP
Programmable
Programmable
Low Pass Filter &
Output Buffer
RXIN
PHY1076-01
GNDA
Figure 14 - Connection to TIA with integrated RSSI output
16
LOS
ADC
RXOUT+
RXOUT-
4.3.
Transmitter Features
The transmitter input buffer provides the necessary drive to the Laser driver output stage. It is designed to
be AC-coupled, with an internal 100Ω differential termination.
The Laser driver output is designed to drive Lasers in common-anode configuration, using either AC or
DC coupling. The driver circuit delivers a maximum peak to peak modulation current of 70mA. The
maximum current delivered in DC-coupled mode is dependent on the Laser impedance. The voltage
swing must remain in the compliance range of the output stage as specified in section 3.4.2.
The PHY1076-01 Laser driver operates with an analog mean-power control loop, which is digitally
programmed using the Mean Power DAC. Modulation current is controlled by a Laser modulation DAC
with the characteristics shown in Table 3. The modulation DAC has a 375μA/bit resolution which suggests
an upper limit of 96mA at full scale, however the modulation output stage is rated to 70mA only for jitter
compliance. To satisfy the digital diagnostics requirements, the mean power, as represented by the
monitor photocurrent, is measured using the MPD current monitor analogue to digital converter (Tx Power
ADC). The bias current ADC (Tx Bias ADC) samples the Laser bias current.
Register
DAC
Step Size
Rated Range
tx_power_set
Mean Power DAC
(8 bits)
11µA±1.0µA
(Actual DAC range 0μA to 3060μA)
0 to 3mA
modulationDACDefault
Laser modulation DAC1
(8 bits)
363μA±50µA
(Actual DAC range is 0mA to 93mA)
7mA to 70mA
1 Range of modulation current measured at LASER+/- (jitter within spec)
Table 3 - Characteristics of the modulation and bias current DACs
4.3.1.
Bias Current Control
VDD
Tx Bias
ADC
FCh txBiasADC
F2h
tx_power_set
FDh
txPowerADC
Mean
Power
DAC
Tx Power
ADC
LASER_BIAS
Kfactor
Comp
MPD
E0h txControl1
1 - 2 Kselect
DFh txControl0
bit 1 Loop_BW
Figure 15 - Control registers affecting the APC loop
The Laser bias current is controlled by the mean-power control loop in which the current from the monitor
photodiode in the TOSA is compared with a reference current controlled by tx_power_set. Note: the
comparator is sensitive to large step changes in the value written to tx_power_set (or a small step
change at low values). This can cause the safety critical shutdown module to assert a TX_FAULT, as will
writing zero to tx_power_set.
Loop bandwidth and Kselect are used to optimize APC loop dynamics providing stability of the mean
power control and the required transmitter start up time. These settings are affected by the coupling
coefficient (Kfactor) between the Laser and monitor photodiode. The Kselect bits shown in Table 4 should
be used as a guide for the set-up. For example, for a TOSA with Kfactor of 1/100 (Laser bias current =
50mA, monitor diode current = 0.5mA) set Kselect = “01”.
17
Table 4 shows Kselect values that can be chosen to meet the start-up time and APC loop stability
requirements:
Coupling
coefficient
Kselect value
1
0
N/A
0
0
1/500 – 1/50
0
1
1/50 – 1/25
1
0
1/25 – 1/8
1
1
Table 4 – Kselect guide for the APC loop
The bandwidth of the control loop response can be controlled with Loop_BW. For a critically damped
loop, set Loop_BW to ‘0’. For a more rapid response, set Loop_BW to ‘1’. The frequency response of the
loop is detailed in section 3.4.3 Laser Mean Power Control Loop.
4.3.2.
Modulation Current Control
The modulation current can be controlled in two ways:
Set ModLUTdisab (DFh txControl0 bit5) to ‘1’ to directly access the modulation DAC. Then, adjust
modulation current by writing to modulationDACDefault (D5h).
Set ModLUTdisab to ‘0’ to enable the modulation current vs. temperature look-up table (LUT) in the
PHY1076-01. The 45 byte LUT is indexed by the value in temperatureADC (FEh), where Index is given
by:
Index = (temperatureADC x 45) / 255
and the index rounds down to the lower temperature. When the LUT is switched from the enabled to
disabled state, the last control value from the LUT will persist. On disabling the LUT the modulation DAC
will not revert back to a value previously written to modulationDACDefault. A new value must be
explicitly written to modulationDACDefault once the LUT has been disabled.
On power up the modulation DAC will not be programmed with the value uploaded from the EEPROM
and will default to taking the value from the LUT for the measured temperature.
4.3.3.
Laser Driver Setup
There is a trimming network on the output driver which adjusts the time constant for output damping on
LASER ± . It is controlled by the value in txDriverCap (F6h) which is used to set the value of the time
constant as shown in Table 5 based on the number of RC networks turned on. Set txDriverCap to '00' for
no damping and fastest edges. It is possible to enable combinations by programming txDriverCap with
values that set more than one bit high. e.g. txDriverCap = 07h enables RxC/2 + RxC + Rx2C.
txDriverCap
Time constant (RC=34ps)
Bit 0
RxC/2
Bit 1
RxC
Bit 2
Rx2C
Bit 3
Rx3C
Bit 4
Rx4C
Bits 5 to 7
Not used
From modulation driver
LASER +/-
R
R
R
R
R
C/2
C
2C
3C
4C
Bit 0
Bit 1
Bit 2
Bit 3
Table 5 -Time constant selection for the Tx output damping network.
18
Bit 4
4.4.
Laser Safety Features
The Laser safety circuitry monitors the device for potential faults. If a fault is detected, the safety logic
turns off the transmitter bias and modulation currents and indicates the fault condition at pin TX_FAULT.
The Laser output driver can be disabled in one of four ways:
1. The TX_DISABLE pin is taken high.
2. The internal safety critical shutdown circuitry detects a fault with
a. the APC loop or bias current
b. power supply 2.7V>VDD or VDD>3.9V
c. RREF shorted to Ground, VDD or open circuit
3. The Soft Tx Disable bit in STAT_CON is asserted
4. The watchdog timer times out, indicating that communication with the host/MCU has been
interrupted.
In all cases the modulation current and the current to the LASER_BIAS pin will be disabled, and the
SHUTDOWN pin will be asserted. The purpose of the SHUTDOWN pin is to provide a means by which the
Laser can be isolated from VDD (common anode configuration) when an electrical fault is detected. In
cases 2 and 4, TX_FAULT will also be set.
VDD
E0h txControl1
bit 3 SDpolarity
TX_DISABLE
SHUTDOWN
6Eh STAT_CON
bit 6 Soft Tx Disable
bit 7 Tx Disable State
FET
7Ah shutDownPassword
DFh txControl0
bit 6 Hardware_ignore
Controller
Safety critical
shutdown circuit
LASER_BIAS
eg. short
circuit
GND
E1h txControl2
bit 7 HostSFTtxfault
TX_FAULT
6Eh STAT_CON
bit 2 TX Fault
Figure 16 - TX_FAULT and SHUTDOWN pin control logic
4.4.1.
PHY1076-01 Fault Management
The safety critical shutdown circuit will shutdown and isolate the Laser if it senses a fault with the bias
current, the supply voltage or the reference voltage.
For example, consider a Laser arranged in common anode configuration. The Laser cathode connects to
the LASER_BIAS pin and the anode connects to VDD. If a short circuit to Ground occurs on the route
between the cathode and LASER_BIAS then the safety critical shutdown circuit will switch off the bias
current. However, this will not protect the Laser as a current path from VDD to ground still exists. A FET
device can provide the required isolation when switched off by the SHUTDOWN pin as shown in Figure
16. The SHUTDOWN pin is controlled by the same signal which switches off the bias current. The
SHUTDOWN pin output response to faults and polarity setting is shown in Table 6.
The safety critical shutdown circuit can be disabled in software by setting Hardware_ignore = ‘1’, and
entering the value 42h to the shutDownPassword register. In this case the Laser will not be disabled
when a fault is detected; however, a TX_FAULT will still be reported. This feature should be used with
great caution as the eye safety features of the device will be disabled. The PHY1076-01 will respond
to TX_DISABLE being set even if Hardware_ignore is set.
Power supply and RREF faults result in the TX_FAULT latching and the laser being disabled momentarily.
Once the fault condition is removed the laser will be reactivated, however the TX_FAULT output must be
cleared by toggling TX_DISABLE (or Soft Tx Disable). An APC loop fault results in the TX_FAULT
latching and the laser being disabled. TX_DISABLE (or Soft Tx Disable) must be pulsed high as shown in
Figure 5 to remove this latching condition and reactivate the laser. When the Laser is turned on, during
19
power up or after a fault, there will be a short period during which the bias control loop is allowed to settle
(t_settle, see Section 3.4.3) before the safety control loop circuit is enabled.
Fault Status
No Fault
Fault
SDpolarity
(TxControl2, Bit 3)
SHUTDOWN
Pin Voltage
0
High
1
Low
0
Low
1
High
Table 6 – Shutdown Output Voltage under Fault/No Fault conditions
4.4.2.
MCU and Host Fault Management
The MCU is responsible for maintaining and reporting alarms and warnings in accordance with the SFF8472 specification. When an alarm is triggered, the MCU must set HostSFTtxfault = ‘1’. This will cause
the PHY1076-01 to report a fault on the TX_FAULT pin and in the STAT_CON register. The PHY1076-01
will not disable the Laser at this point. The MCU or the host could disable the Laser when a TX Fault is
detected in STAT_CON by asserting Soft Tx Disable.
4.4.3.
Watchdog
A watchdog is implemented by the PHY1076-01 to monitor the activity of the attached MCU in digital
diagnostics mode. When WatchdogEn (E1h txControl2 bit0) is set to ‘1’, the PHY1076-01’s watchdog
feature is enabled. The MCU is required to increment the Watchdog[0:5] counter (E1h txControl2) at
least every 100ms. If no change is detected in the counter, the PHY1076-01 will disable the Laser and will
assert TX_FAULT. The Laser will be re-enabled, and TX_FAULT de-asserted when either the watchdog
counter is incremented, or the watchdog feature is disabled by writing ‘0’ to WatchdogEn. On power up
the watchdog feature is disabled.
20
4.5.
Tsense Temperature Sensor
The temperature is determined by measuring the ΔVBE across an external transistor connected to the
TSENSE pin. The transistor can be any standard npn silicon transistor with a beta > 100 connected in
diode mode (base and collector tied together). It is recommended to use a BC847B or similar.
Calibration and averaging of the temperature sensor readings using an external microcontroller are
required to optimize the accuracy. Once optimized, the PHY1076-01 can report temperature to SFF8472
requirements over the recommended operating conditions.
The temperature sensor operating range and corresponding TSENSE input levels are shown in Table 7.
Temperature
TSENSE delta input voltage
Symbol
Unit
Minimum
Maximum
t
°C
-70
+115
ΔVBE
mV
50
100
Table 7 – Temperature sensor operating range
Switching Current
Generator
i200uA
Temperature
ADC
Signal
Conditioning
i10uA
TSENSE
Figure 17 – Temperature sensor functional block diagram
21
∆VBE
5.
Control Interface
The PHY1076-01 can be operated in one of two modes as dictated by the design of the module. The
PHY1076-01 will identify the mode by attempting to read from its 2-wire serial EEPROM interface (See
section 5.4) on power up. If no EEPROM is present then diagnostic mode is inferred.
In digital diagnostics mode, the Micro Controller Unit (MCU) and EEPROM (Address A0h) present an
SFF-8472 compliant interface to the host. The MCU provides read/write access to all registers in the A2h
registers map, calculates digital diagnostics monitor values and maintains alarms and warnings. The MCU
must initialize the PHY1076-01 control registers from EEPROM, relay control information to the PHY107601, and fetch status information in real time.
In stand-alone mode, the PHY1076-01 is initialized directly from an external 4 kbit (8 x 512 bit) Serial
EEPROM. Serial ID information as specified in the SFP MSA is accessible via the 2-wire serial interface.
This mode supports temperature compensation of modulation current using a look-up table stored in
EEPROM.
Digital diagnostic mode
TWI
Stand-alone mode
ROSA
MCU
A0h
EEPROM
TWI
ROSA
PHY1076-01
A2h
EEPROM
PHY1076-01
A0h + A2h
EEPROM
TOSA
TOSA
Figure 18 - Optical transceiver module configurations
5.1.
Memory Map
A2h
tabsel = 00h or 01h
A0h
SFF-8472 Serial ID
SFF-8472 Diagnostics
Serial ID (96)
Vendor specific (32)
SFP MSA Diag (120)
Vendor specific (7)
tabsel
SFF-8472
SFF-8472 U. EEPROM
Reserved (128)
User EEPROM (120)
Vendor specific (8)
A2h
tabsel = 02h
A2h
tabsel = 03h
PHY1076-01
Expansion
EEPROM
PHY1076-01
Expansion
EEPROM
Undefined (127)
Undefined (127)
tabsel
PHY1076-01
Expansion
EEPROM
tabsel
7Fh
Device Settings
(128)
Undefined (128)
Figure 19 - Memory map for a 2G SFP or SFF transceiver module containing a PHY1076-01 device
Figure 19 shows the memory map of a module containing a PHY1076-01. An 8 kbit memory space is a
natural step up from the minimum 4 kbit memory space required for SFF-8472 compliance, providing
additional space in which to map the Device Settings registers of the PHY1076-01.
The internal RAM of the PHY1076-01 implements the SFF-8472 Diagnostics table and the Device
Settings table. Selection between tables is achieved using the tableSelect (tabsel) register located at
address offset 7Fh. To access the Diagnostics table, first write 00h to tabsel. To access the Device
Settings table, first write 03h to tabsel.
Tabsel is effectively write-only because to write to tabsel has the effect of switching to a different register
table. Thus, reading tabsel will not yield the value which was previously written.
22
5.2.
Operation
RESET
Controller
SDA
Host or
MCU
2-wire serial interface
slave
SCL
3
7Fh
2
tableSelect
RAM
arbiter
SA_SDA
EEPROM
SA_SCL
2-wire serial interface
master
1
Hardware registers
6Eh
STAT_CON
78h
alarmBytePHY1076
79h
testControl
D5h
modulationDACDefault
D6h
txPowerDown
DBh
rxPowerDown
txControl
DFh-E1h
E7h
diagnosticsSelect
rxControl
E8h-E9h
DACs
F1h-F4h
F5h
rateSel
F6h
txDriverCap
FBh-FFh ADCs
Figure 20 - Serial interfaces to RAM and the on-chip controller
5.2.1.
Data Transfer Mechanisms
Three distinct data paths are identified in Figure 20.
When the PHY1076-01 comes out of reset, the 2-wire serial slave interface is disabled. Only path 1 is
active. The controller instructs the 2-wire serial master interface to attempt to transfer A2h register tables
(SFF-8472 diagnostics and device settings) from the external EEPROM to RAM. If this is successful then
the PHY1076-01 will operate in stand-alone mode. If the transfer fails, then the dsfail and eerxfail alarm
bits in the alarmBytePHY1076 (78h) register will be set and the PHY1076-01 will operate in diagnostics
mode. Regardless of the outcome, when the EEPROM read process is complete the controller enables
the 2-wire serial slave interface. The 2-wire serial master interface is then no longer used.
The 2-wire serial slave interface has slave address A2h. In diagnostics mode, the host or external MCU
uses the 2-wire serial slave interface to write to or read from copies of the device settings held in RAM.
When the boot sequence is complete, the controller transfers data between the RAM and the actual
registers implemented in hardware periodically every 10ms.
In stand-alone mode the RAM space is not used once the boot sequence is complete. Reading from A2h
will return zero.
Path 3 is a special case which supports modules designed for stand-alone mode, enabling them to be set
up or re-configured via the 2-wire serial interface slave. The PHY1076-01 can be forced into diagnostic
mode if the data integrity numbers in the EEPROM are deliberately erased (see section 5.4.2). This
enables the host/MCU to access both the RAM (path 2) and the EEPROM (path 3). All accesses to the
A0h address space are directed to the EEPROM only. Accesses to the A2h address space are examined
as they arrive by the 2-wire serial slave module, which in turn instructs the arbitration logic. The
destination for the transaction depends on the value of tabsel and the register address as shown in Table
8.
23
Access
type
tabsel
Address
range1
read
00
lower
RAM
read
03
upper
RAM
write
00
lower
RAM + EEPROM
write
00
upper
EEPROM
Destination
memory
write
03
upper
RAM
1 Addresses 00h to 7Fh = lower. Addresses 80h to FFh = upper.
Table 8 - Destination of 2-wire serial interface transactions as a function of write protection, tabsel and
address.
5.2.2.
Device Initialisation Sequence
The Initialisation Sequence is illustrated in Figure 21. The Data_Ready_Bar bit in the STAT_CON register
indicates when data from the ADCs may be read after power up. It is first set to ‘1’ before the 2-wire serial
slave interface is enabled to indicate that the PHY1076-01 is not ready. Once initialisation is complete and
the ADC data is ready Data_Ready_Bar is cleared to ‘0’. This event can be used by the external
host/MCU as a signal that the PHY1076-01 is ready for device settings to be uploaded from the MCU to
the PHY1076-01 RAM. The PHY1076-01 will not enter the main diagnostic function loop until the upload is
complete. This is initiated by the host/MCU clearing the dsfail and eerxfail bits in the alarmBytePHY1076
(78h) register. When dsfail is cleared and the main loop is executed the contents of RAM will be
transferred into the hardware registers of the PHY1076-01.
24
Power
up
Disable 2-wire serial
slave interface
Transfer A2h registers
from EEPROM to RAM
Stand-alone mode
Transfer RAM content to
hardware registers.
Erase RAM.
Yes
Success?
Diagnostic mode
No
Set dsfail alarm bit.
Disable the LASER.
Set Data_Ready_Bar.
25
Time delay, ms
Enable 2-wire serial
slave interface
Disable the LASER.
Set Data_Ready_Bar.
40
Enable 2-wire serial
slave interface
15 ms delay
15
WAIT
10
Index LUT using temp ADC
value. Transfer value to
modulation DAC.
WAIT
Read ADCs
10
Read ADCs
WAIT
Start the 10ms poll timer
10
Start the 10ms poll timer
Wait for analogue circuits to
finish initializing.
40 ms delay
WAIT
Update TX_FAULT pin.
Update STAT_CON register.
Clear Data_Ready_Bar.
10
10
When Data_Ready_Bar is
cleared, the host/MCU can start
to upload A2h register settings
to the PHY1076-01.
WAIT
The PHY1076-01 waits for the
host/MCU to finish the upload.
When the upload is complete
the host/MCU clears the dsfail
bit.
No
Enable LASER
dsfail set?
S-A
MAIN
Update TX_FAULT pin and
STAT_CON register based
on hardware status.
Yes
DIAG
MAIN
Figure 21 - PHY1076-01 initialisation sequence. Time delays for key stages are shown in ms.
25
5.2.3.
Polling Loop Timer
MBIST
selected
Yes
No
No
WAIT
Timer
expired
Yes
Enter Memory
No
BIST mode
Restart the poll timer.
(Refresh the reset timer)
Calculate checksum
(Diagnostic mode only)
Figure 22 - PHY1076-01 polling loop timer function.
A polling loop timer is implemented in the controller which expires every 10ms. This is used to schedule
functions in both the boot sequence and the main diagnostic and stand-alone operating modes. The WAIT
clouds shown in the flow diagrams represent the sequence of events shown in Figure 22.
The reset timer is the timer enabled by wdInhibit in the diagnosticsSelect register (E7h). Refer to the
registers map for details.
The checksum function is executed in diagnostic mode only. The PHY1076-01 will generate a checksum
of the device settings RAM area by addition of each of the bytes listed in Table 9, and store the result in
the 16 bit ddmChecksum register (E5h to E6h) in big endian format. The checksum will allow the MCU to
efficiently verify that the copies of these registers in the PHY1076-01 and in its own memory are coherent.
Address
Size (bytes)
Name
80h
40
Reserved
A8h
45
currentLUT
D6h
1
txPowerDown
D7h
4
undefined
DBh
1
rxPowerDown
DCh
3
undefined
E8h
2
rxControl
F1h
1
Vref
F2h
1
tx_power_set
F3h
1
OMA_LOS_set
F4h
1
AVG_LOS_set
F5h
1
rateSel
Table 9 - Registers included in the checksum calculation
26
5.2.4.
Controller Main Application Loop Functions
DIAG
MAIN
Read ADCs
Perform slope adjust
Write to DDM registers
LUT
enabled
Slope adjusted versions of the
ADC values are provided at
A2h addresses 60h to 69h.
No
Yes
Index LUT using temp ADC
value. Transfer value to
modulation DAC.
Transfer control data from
RAM to registers, and status
from registers to RAM.
When the Soft Tx Disable bit is
copied from RAM to hardware,
the Laser will be re-enabled if
the bit is ‘0’.
Check for Tx faults, and set
TX_FAULT pin if fault
detected.
Update STAT_CON register
value stored in RAM.
10
WAIT
Process watchdog timer
Yes
Reset the timer if the watchdog
counter has been incremented.
watchdog
expired
No
Figure 23 - PHY1076-01 diagnostic mode main loop function.
S-A
MAIN
10
WAIT
Read ADCs. Store temp
ADC value only.
LUT
enabled
Although only the temperature
value is required, the act of
reading all ADC values
automatically triggers the next
conversion.
No
Yes
Index LUT using temp ADC
value. Transfer value to
modulation DAC.
Figure 24 - PHY1076-01 stand-alone mode main loop function.
27
5.3.
Digital Diagnostics Mode
5.3.1.
Introduction
When used in digital diagnostic mode the PHY1076-01 contains all of the necessary analogue and digital
circuitry to generate the real time values required for SFF-8472 DDM reporting compliance. The power supply
voltage, Temperature, TxBias, MPD and RSSI are all sampled using an on board A/D converter. The digitized
values are then made available over the slave 2-wire serial interface, such that they can be used in
conjunction with SFF-8472 calibration constants, to provide the host user with the following five real time
reports: Supply Voltage, Temperature, Tx Bias current, Tx Output Power and Rx Input Power.
5.3.2.
On Chip Analogue to Digital Converter
The PHY1076-01 contains a single successive approximation ADC. The ADC coding is either linear or multislope, depending on the parameter being sampled. The multi-slope stage enables the ADC to cover the very
large dynamic range required for reporting Tx and Rx optical power within the SFF-8472 limits, using only 8bits to cover an equivalent 12-bit dynamic range. The ADC conversion time takes approximately 1ms.
5.3.3.
ADC Characteristics
DDM Name
ADC input
Supply Voltage
VDD
Temperature
Temperature
-70°C to +115°C
0.83 °C
Tx Bias
TxBias
0.0mA to 100mA
0.5mA
0.0µA to 32.0µA
0.96µA
±0.2μA
32.0µA to 416.0µA
4.2µA
±0.4μA
416.0µA to 2448.0µA
16 µA
±1.5μA
0.0µA to 32.0µA
1.07µA
±0.2μA
32.0µA to 416.0µA
4.3µA
±0.4μA
416.0µA to 2448.0µA
17.3µA
±1.5μA
Tx Power
Rx Power
Nominal Range
Min 1.6 – 1.9V
Max 4.1 – 5.0V
MPD
RSSI
Step Size
Slope Accuracy
11 mV
±1.5mV
Accuracy
±3μA Offset
±3μA Offset
Table 10 – ADC electrical characteristics
5.3.4.
3-Slope ADC
Tx and Rx Power DDM reports are represented by an 8 bit (0-255) ADC value even though the overall
dynamic range for both of these parameters is 0µA to 2448 µA. A linear coding scheme would only provide
9.5µA resolution at low currents. Acceptable low current resolution coupled with wide dynamic range is
possible by using a multi-slope gain stage within the ADC circuitry. The following formulae are used to
convert the 8-bit ADC (0 to 255) value into a linear pseudo 12-bit ADC (0 to 2448) value:
0 < ADC ≤ 32:
32 ≤ ADC ≤ 128
128 ≤ ADC ≤ 255
28
ADC_L = ADC
ADC_L = ((ADC – 32) * 4) + 32
ADC_L = ((ADC – 128) *16) + 416
250
ADC value (dec)
200
150
100
50
0
0
500
1000
1500
2000
Tx MPD Current / Rx RSSI Current (uA)
Figure 25– 3-slope ADC Function
5.3.5.
ADC DDM Register Locations
The 8-bit ADC values can be accessed in their raw format at addresses FBh to FFh (tabsel = 03h). The ADC
values are also accessible at addresses 60h to 69h (tabsel = 00h) where Tx Power and Rx Power ADC
values are linearized by the PHY1076-01 and, therefore, do not require any conversion from 3-slope format
unlike the raw 8-bit ADC values.
An external MCU is required to apply the correct calibration slope and offset values to the PHY1076-01 ADC
DDM reports in order that the real time reports are meaningful. Table 11 shows the memory locations that
should be addressed on the 2-wire slave interface to access the various DDM ADC values. All 8 bit or 12 bit
ADC values are left aligned into the 16 bit registers with unused bits set to zero. For example the MSBit of Tx
Output Power is located at the MSBit of 66h (tabsel = 00h).
Address
Location
Name
Size
Table Select Byte (7F) = 00h
A2h
60h to 61h
Temperature
16-bit
A2h
62h to 63h
Vcc
16-bit
A2h
64h to 65h
Tx Bias
16-bit
A2h
66h to 67h
Tx Power
16-bit
A2h
68h to 69h
Rx Power
16-bit
Table Select Byte (7F) = 03h
A2h
FBh
rxPowerADC
8-bit
A2h
FCh
txBiasADC
8-bit
A2h
FDh
txPowerADC
8-bit
A2h
FEh
temperatureADC
8-bit
A2h
FFh
vddADC
8-bit
Table 11 – ADC DDM register locations
29
5.4.
Stand-Alone Mode
In stand-alone mode, the PHY1076-01 is initialized directly from an external 4 kbit (8 x 512 bit) Serial
EEPROM. In normal operation, there is no access to the device settings information via the 2-wire serial
interface. However, the Serial ID information as specified in the SFP MSA is still accessible. This mode
supports temperature compensation of modulation current using a look-up table stored in EEPROM.
5.4.1.
Data Integrity Checking
The (read-only) ADCs located at addresses FBh to FFh are dual-functioned with (write-only) data integrity
registers as follows:
Addr
Register
Value(hex)
FBh
FCh
FDh
FEh
FFh
SerialEepromIdentifier0
SerialEepromIdentifier1
SerialEepromIdentifier2
SerialEepromChecksum0
SerialEepromChecksum1
1Bh
2Ch
3Dh or 4Eh
---
Table 12 - Mapping of the data integrity numbers
On power-up, the PHY1076-01 will attempt to load its RAM from the EEPROM. If this is unsuccessful then
eerxfail and dsfail are both set to ‘1’ (78h alarmBytePHY1076) and initialisation will be stalled. If the transfer
is successful then the integrity of the data will be checked. This process is carried out in the following
sequence of events.
First the PHY1076-01 checks that the data read from EEPROM at addresses FBh to FCh matches the values
shown in Table 12. If there is a mismatch then dsfail is set to ‘1’ and initialisation will be stalled.
If SerialEepromIdentifier2 = 3Dh then the PHY1076-01 will accumulate a 16 bit checksum for the A2h RAM
address range 00h to FAh (excluding 7Fh). If this accumulated checksum does not compare correctly with
the two SerialEepromChecksum bytes, then dsfail will be set to ‘1’ and initialisation will be stalled.
Once all checks are complete, if no alarms have been set then the hardware registers in the PHY1076-01 are
updated from the RAM. Data in RAM addresses FBh to FFh will subsequently be overwritten by the ADCs.
5.4.2.
Device Setup
If a module is powered up with a blank or corrupted EEPROM then the data integrity checking will fail and
initialisation is stalled. However, the PHY1076-01 can be forced into a ‘setup’ mode if the dsfail alarm is
cleared by the host. This then permits the device to be configured and the EEPROM written in-system.
To reconfigure or analyse a module with its EEPROM already written, writing zero to the data integrity
register addresses in EEPROM will have the effect of forcing the PHY1076-01 into setup mode the next time
it is powered up.
5.4.3.
Writing to EEPROM
The addressing of the RAM in the PHY1076-01 is consistent with the memory map for the module as a whole
(see Figure 19). The table containing the SFF-8472 Diagnostics registers is selected by tabsel = 0 and the
table containing the Device settings registers is selected by tabsel = 3.
The serial EEPROM connected to a PHY1076-01 in stand-alone mode is typically small and is organized as
shown below:
30
FFh
mapped
to
A0h
80h
SFP MSA
Serial ID
(256)
00h
FFh
Device settings
(128)
mapped
to
A2h
80h
SFF-8472 Diagnostic
SFP MSA Diag (120)
Vendor specific (8)
00h
Figure 26 - Physical mapping of register tables into the EEPROM in the stand-alone mode
The device settings area in EEPROM is effectively stored in the address range normally occupied by the
SFF-8472 User EEPROM (in Diagnostics mode). When writing to Device settings two separate write
transactions are required: one write (into RAM) with tabsel = 3, and one write (into EEPROM) with tabsel = 0.
It is recommended that the write protect functionality of the EEPROM is utilized to effectively protect stored
settings after programming.
31
5.5.
2-wire Serial Interface
The PHY1076-01 has a pair of 2-wire serial interfaces - a slave for interfacing to an external MCU for use
in diagnostics mode and a master for interfacing to an external EEPROM for use in stand-alone mode.
Both interfaces communicate using the protocol described in this section.
5.5.1.
Framing and Data Transfer
The 2-wire interface comprises a clock line (SCL) and a data line (SDA). When the bus is idle both are
pulled high within the PHY1076-01 by 8 kΩ pullups.
An individual transaction is framed by a start condition and a stop condition. A start condition occurs when
a bus master pulls SDA low while the clock is high. A stop condition occurs when the bus master allows
SDA to transition low-to-high when the clock is high. Within the frame, the master has exclusive control of
the bus. The PHY1076-01 does not support REPEAT START conditions whereby the master may
simultaneously end one frame and start another without releasing the bus by replacing the STOP
condition with a START condition.
Within a frame, the state of SDA may only change when SCL is low. A data bit is transferred on a low-tohigh transition of SCL. Data is arranged in packets of 9 bits. The first 8 bits represent data to be
transferred (most significant bit first). The last bit is an acknowledge bit. The recipient of the data holds
SDA low during the ninth clock cycle of a data packet to acknowledge (ACK) the byte. Leaving SDA to
float high on the ninth bit signals a not-acknowledged (NACK) condition. The interpretation of the
acknowledge bit by the sender will depend on the type of transaction and the nature of the byte being
received.
5.5.2.
Device Addressing
The first byte to be sent after a START condition is an address byte. The first seven bits of the byte
contain the target slave address (msb first). The eighth bit indicates the transaction type – ‘0’ = write, ‘1’ =
read. Each slave interface on the bus is assigned a 7-bit slave address. If no slave matches the address
broadcast by the master then SDA will be left to float high during the acknowledge bit and the master
receives a NACK. The master must then assert a STOP condition. If a slave identifies the address then it
acknowledges the master and proceeds with the transaction identified by the type bit.
The slave interface of the PHY1076-01 can decode slave addresses A0h and A2h.
START
SDA
R/W NACK
ADDRESS
msb
7
6
5
4
3
2
1
STOP
0
SCL
Figure 27 - Address decoding example – slave not available
5.5.3.
Write Transaction
Figure 28 shows an example of a write transaction. The address byte is successfully acknowledged by
the slave, and the type bit is set low to signify a write transaction. After the acknowledge the master
sends a single data byte. All signalling is controlled by the master except for the SDA line during the
acknowledge bits. During the acknowledge the direction of the SDA line is reversed and the slave pulls
SDA low to return a ‘0’ (ACK) to the master.
32
START
ACK
ACK
7
SDA
1
msb
7
W
6
5
4
3
2
1
STOP
0
SCL
SDA
direction
to slave
from slave
Figure 28 - Write transaction
If the slave is unable to receive data then it should return a NACK after the data byte. This will cause the
master to issue a STOP and thus terminate the transaction.
The PHY1076-01 interprets the first data byte as a register address. This will be used to set an internal
memory pointer. Subsequent data bytes within the same transaction will then be written to the memory
location addressed by the pointer. The pointer is auto-incremented after each byte. There is no limit to the
number of bytes which may be written in a single burst to the 256 byte internal RAM of the PHY1076-01.
If the slave is not ready to receive a byte then it may hold SCL low immediately after the acknowledge bit.
When SCL is released the master starts to send the next byte. This is known as clock stretching. The
PHY1076-01 slave interface will not clock stretch at up to 100 kHz SCL frequency.
5.5.4.
Read Transaction
START
SDA
ACK
ACK
7
1
R
7
0
NACK
7
STOP
0
SCL
SDA
direction
to slave
from slave
Figure 29 - Read transaction
Figure 29 shows an example of a 2 byte read transaction. The address byte is successfully
acknowledged by the slave, and the type bit is set high to signify a read. After the ACK the slave returns a
byte from the location identified by the internal memory pointer. This pointer is then auto-incremented.
The slave then releases SDA so that the master can ACK the byte. If the slave receives an ACK then it
will send another byte. The master identifies the last byte by sending a NACK to the slave. The master
then issues a STOP to terminate the transaction.
Thus, to implement a random access read transaction, a write must first be issued by the master
containing a slave address byte and a single data byte (the register address) as shown in Figure 28. This
sets up the memory pointer. A read is then sent to retrieve data from this address (see Figure 29).
33
6.
Register Map
All Maxim Integrated-specific registers are listed in this section. For details of other registers refer to the
SFF-8472 Specification for Diagnostic Monitoring Interface for Optical Transceivers.
Where a single power-on reset (PoR) value is shown for a range of addresses, that value applies to all
bytes in the range. Note that the power on reset values may be overwritten during initialisation by the
MCU (or from EEPROM in stand-alone mode).
For registers containing a single 8-bit field, the most significant bit of the field is stored in bit 7 of the
register byte. Multi-byte registers are stored in big-endian order unless specified otherwise.
Note that ‘reserved’ or ‘internal use only’ register bits are specified as read only. These registers should
not change from their PoR default settings.
6Eh
STAT_CON
Bit
Field name
Type
PoR
7
Tx Disable State
R
0
6
Soft TX Disable
R/W
0
5
Reserved
R
0
Reserved for future use.
4
Rx Rate Select State
R
0
Digital state of the SFP RX Rate Select input pin.
Updated within 100msec of change on pin.
Status and Control register for some SFF-8472
functions
Digital state of the TX Disable input pin. Updated
within 100msec of change of pin.
Read/write bit that allows software disable of laser.
Writing ‘1’ disables laser. This bit is “OR’d” with the
hard TX_DISABLE pin value.
3
Soft RX Rate Select
R/W
0
Soft RX Rate Select read/write bit that allows
software RX rate select. Writing ‘1’ selects full
bandwidth operation. This bit is “OR’d” with the
RATE_SELECT pin value.
2
TX Fault
R
0
Digital state of the TX_FAULT output pin. Updated
within 100msec of change on the pin.
1
LOS
R/W
0
Digital state of the LOS output pin. Updated within
100msec of change on the pin.
0
Data_Ready_Bar
R
0
Indicates PHY1076-01 has achieved power up and
data is ready. Bit remains high until data is ready to
be read at which time the device sets the bit low.
34
78h
alarmBytePHY1076
Bit
Field name
Type
PoR
7
Wd4
R
0
6
Wd3
R
0
5
Wd2
R
0
4
Wd1
R
0
3
Wd0
R
0
2
membistPassed
R
0
Built-in self test (BIST) result (‘1’ = passed) from
memory test initiated by testControl register bit 1.
Status register for the PHY1076-01 control module.
This counter records the number of times that the
PHY1076-01 has reset itself due to an internal
timeout. The timer is controlled by wdInhibit in the
diagnosticsSelect register.
1
dsfail
R/W
0
Data structure corrupt (‘1’ = data integrity bytes read
from EEPROM during power up are incorrect).
Clearing this bit during initialisation is necessary in
order to allow the PHY1076-01 to resume its normal
mission mode functions.
0
eerxfail
R
0
EEPROM dma load fail.
(‘1’ = no response from EEPROM during power up)
79h
testControl
Bit
Field name
Type
PoR
7
ATBcontrol5
R/W
0
Analog Test Bus Control Bit0
6
ATBcontrol4
R/W
0
Analog Test Bus Control Bit1
5
ATBcontrol3
R/W
0
Analog Test Bus Control Bit2
4
ATBcontrol2
R/W
0
Analog Test Bus Control Bit3
3
ATBcontrol1
R/W
0
Analog Test Bus Control Bit4
2
ATBcontrol0
R/W
0
Analog Test Bus Control Bit5
1
startMemoryBist
R/W
0
Set to ‘1’ to initiate Memory built-in self test (MBIST)
0
scanTestMode
R/W
0
Set to 1’ to enter Scan test mode.
7Ah
shutDownPassword
Type
R/W
7Bh 7Eh
reserved
Type
R
35
PoR
00h
This register puts the device into various test modes
and should not be written to during normal operation.
It should always have value ‘0’.
Set to 42h to prevent the safety critical shutdown
logic from disabling the Laser when a hardware fault
is detected (see also txControl0).
-PoR
00h
Indirect addressing for register tables. 00h selects
the SFF-8472 Diagnostics and user EEPROM register
tables. 03h selects the PHY1076-01 Device settings
table. Note that data read from this register is not
valid.
7Fh
tableSelect
Type
R/W
80h –
A7h
reserved
Type
R
A8h–
D4h
currentLUT
Type
R/W
D5h
modulationDACDefault
Type
R/W
D6h
txPowerDown
Bit
Field name
Type
PoR
7
VDDmeaspwrd
R/W
0
-
6
TERMpwrd
R/W
0
-
5
DACpwrd
R/W
0
Power down DAC
4
DRIVERpwrd
R/W
0
Power down Laser driver
3
TXBIASpwrd
R/W
0
Power down transmit bandgap bias + current gen.
(This will completely disable the IC).
2
DBuffApwrd
R/W
0
Power down data buffer
1
TEMPpwrd
R/W
0
Power down temperature sensor
0
SAFETYpwrd
R/W
0
Power down SAFETY logic
D7hDAh
undefined
Type
R
36
PoR
00h
-PoR
PoR
PoR
00h
Modulation current vs. temperature Look-up table
(LUT). The 45 entry LUT is indexed using the
temperatureADC as follows: (temperatureADC x 45) /
255.
00h
Controls the modulation current (DAC) when the LUT
is disabled. During power up, the temperature is
sampled and the DAC is re-loaded with a value from
the LUT.
00h
Selectively turns off the power supply to circuits in
the transmitter module. ‘0’ = power on. ‘1’ = power off.
-PoR
00h
DBh
rxPowerDown
Bit
Field name
Type
PoR
7
LIMITpwrd
R/W
0
Power down limiter
6
FILTpwrd
R/W
0
Power down RX filter
5
COMPSpwrd
R/W
0
ADC Comparator powerdown
4
AMPDETpwrd
R/W
0
Power down amplitude detector
3
REGpwrd
R/W
0
Power down regulator
2
AGCpwrd
R/W
0
Power down AGC amp
1
CMLpwrd
R/W
0
Power down CML (RX related)
0
RXBIASpwrd
R/W
0
Power down receiver bandgap bias + current gen.
DChDEh
undefined
Type
R
DFh
txControl0
Bit
Field name
Type
PoR
7
Osc_Mon
R/W
0
Multiplexes the internal oscillator onto TX_FAULT pin
for monitoring (oscillator = ‘1’, normal operation = ‘0’)
6
Hardware_ignore
R/W
0
Soft Disable for Safety Critical Shutdown. Set to ‘1’ to
prevent Laser shutdown when the SCS circuits detect
an electrical fault and asserts a tx fault condition.
5
ModLUTdisab
R/W
0
Modulation Current LUT loop control (disable LUT =
‘1’)
Selectively turns off the power supply to circuits in
the receiver module. ‘0’ = power on. ‘1’ = power off.
-PoR
00h
Control bits for the transmitter circuits.
4
SFTtxfault
R/W
0
(Internal use only. Set to ‘0’.) This bit is internally
updated and overwritten by the watchdog counter
and is not intended to be used as a software Tx Fault
assert function by an external host. Use E1h bit 7 for
this purpose.
3
DAC_ready
R/W
0
(Internal use only. Set to ‘0’.)
2
testBW
R/W
0
(Internal use only. Set to ‘0’.)
1
Loop_BW
R/W
0
Controls the average power control loop response.
Set to ‘0’ for critical damping.
0
MPC_polarity
R/W
1
(Internal use only. Set to ‘1’.)
37
E0h
txControl1
Bit
Field name
Type
PoR
7
Test_comp_hiZ
R
0
(Internal use only. Set to ‘0’.)
6
Test_compout_en
R
0
(Internal use only. Set to ‘0’.)
5
Test_compout
R
0
(Internal use only. Set to ‘0’.)
4
Test_koff
R
0
(Internal use only. Set to ‘0’.)
3
SDpolarity
R/W
1
Controls the polarity of the SHUTDOWN pin. (For
SHUTDOWN pin = 1 for shutdown, set SDpolarity = 1).
2
Kselect1
R/W
0
1
Kselect0
R/W
0
0
Tempsel3i
R
0
E1h
txControl2
Bit
Field name
Type
PoR
7
HostSFTtxfault
R/W
0
6
Watchdog5
R/W
0
5
Watchdog4
R/W
0
4
Watchdog3
R/W
0
3
Watchdog2
R/W
0
2
Watchdog1
R/W
0
1
Watchdog0
R/W
0
0
WatchdogEn
R/W
0
Control bits for the transmitter circuits.
(Internal use only. Set to ‘0’.)
Control bits for the transmitter circuits.
E2h txControlSpare
E4h
Type
R
E5h–
E6h
ddmChecksum
Type
R
38
Kselect[1:0] selects one of four gain settings for a
gain stage in the automatic power control loop (see
Table 4). This optimizes the loop gain for the coupling
coefficient of the TOSA.
PoR
PoR
Set to ‘1’ to assert a tx fault condition on the
TX_FAULT pin.
When the watchdog counter is enabled, it must be
incremented at least once every 100ms. If this does
not occur then the PHY1076-01 will disable the Laser
and assert a tx fault condition. Incrementing the
counter or disabling the watchdog will cause normal
operation to resume.
Watchdog Function Enable (enable = 1)
reserved
00h
00h
16-bit checksum updated by the PHY1076-01 every
10ms. See section 5.2.3 for a detailed description.
E7h
diagnosticsSelect
Bit
Field name
7
-
6
-
5
Type
PoR
Diagnostic functions (for internal use) are controlled
by this register.
0
spare
R
0
spare
-
R
0
spare
4
-
R
0
spare
3
-
R
0
spare
2
-
R
0
spare
1
wdInhibit
R/W
0
See also register 78h alarmBytePHY1076. Set to ‘1’ to
disable the timer and prevent the chip from resetting
itself if the timer is not serviced. Set to ‘0’ for normal
operation.
0
tstclksel
R/W
0
Set to ‘1’ to select the SA_SDA pin as the clock
source for the digital macro instead of the internal
oscillator.
E8h
rxControl0
Bit
Field name
Type
PoR
7
AMPDET
_dcfbdisable
R
0
(Internal use only. Set to ‘0’.)
6
Gc_disable
R
0
(Internal use only. Set to ‘0’.)
5
AGCdcfb_disable
R
0
(Internal use only. Set to ‘0’.)
4
Trimsel
R/W
0
(Internal use only. Set to ‘0’.)
3
RX_dccouple
R/W
0
For AC coupled input, set to ‘0’ to terminate the
differential signal at RXIN+/- to a common mode
voltage. Set to ‘1’ when the inputs are DC coupled.
2
LOSpolarity
R/W
0
LOS pin sense (‘1’=Signal Detect;’0’=Loss of signal)
1
LOStype
R/W
0
LOS Detection Type (‘1’=OMA;’0’=Mean RX power)
0
CMLslew
R/W
0
RXOUT+/- slew rate control. Set to ‘0’ for a fast slew
rate. Set to ‘1’ for slow slew rate.
39
Control bits for the receiver circuits.
E9h
rxControl1
Bit
Field name
Type
PoR
7
-
R
0
Spare
6
-
R
0
Spare
5
-
R
0
Spare
4
LorV
R
0
Always set to ‘1’ for laser operation
3
Fosctrim1
R
0
(Internal use only. Set to ‘0’.)
2
Fosctrim0
R
0
(Internal use only. Set to ‘0’.)
1
HiLoSwing
R/W
0
Controls the differential swing of the signal output on
RXOUT+/- (‘1’ = high amplitude, ‘0’ = low amplitude)
0
LIM_dcfbdisable
R
0
(Internal use only. Set to ‘0’.)
Control bits for the receiver circuits.
EAh rxControlSpare
EFh
Type
R
F0h
undefined
Type
R
F1h
Vref
Type
R/W
F2h
tx_power_set
Type
R/W
F3h
OMA_LOS_set
Type
R/W
F4h
AVG_LOS_set
Type
R/W
40
PoR
reserved
00h
-PoR
PoR
PoR
PoR
PoR
00h
71h
00h
00h
00h
Reference voltage trim DAC. The reference voltage
can be set by adjusting Vref until the desired voltage
is seen at pin RREF. RREF is pulled to ground by a 10
KΩ resistor for a 1V reference.
Sets the Tx mean power DAC. This DAC therefore
controls the average output power of the Laser.
Sets the threshold level for optical measurement
amplitude based LOS detection.
Sets the threshold level for receiver signal strength
indicator (RSSI) based LOS detection.
F5h
rateSel
Bit
Field name
Type
PoR
Controls the bandwidth of the programmable low
pass filter in the receiver. The two rate selection
fields A and B enable switching between two different
bandwidths using the RATESEL pin.
7
TRIM1
R/W
0
(Internal use only. Set to ‘0’.)
6
TRIM0
R/W
0
(Internal use only. Set to ‘0’.)
5
RateselB2
R/W
0
4
RateselB1
R/W
0
3
RateselB0
R/W
0
2
RateselA2
R/W
0
1
RateselA1
R/W
0
0
RateselA0
R/W
0
F6h
txDriverCap
Type
R/W
F7hFAh
reserved
Type
R
FBh
rxPowerADC
Type
R/W
FCh
txBiasADC
Type
R/W
FDh
txPowerADC
Type
R/W
FEh
temperatureADC
Type
R/W
41
PoR
00h
Rate Selection B. Selects one of six cut-off frequency
settings (see Table 1).
Rate Selection A. Selects one of six cut-off frequency
settings (see Table 1).
Selects between different time constants for the
trimming network which controls the tx driver output
damping (see Table 5).
-PoR
PoR
PoR
PoR
PoR
00h
00h
00h
00h
00h
This register is dual functioned. Reads received
optical power, Rx ADC value. Writes data integrity
value SerialEepromIdentifier0.
This register is dual functioned. Reads Laser bias, Tx
Bias ADC value. Writes data integrity value
SerialEepromIdentifier1.
This register is dual functioned. Reads transmit
optical power, Tx Power ADC value. Writes data
integrity value SerialEepromIdentifier2.
This register is dual functioned. Reads module
temperature ADC value. Writes data integrity value
SerialEepromChecksum0.
FFh
vddADC
Type
R/W
42
PoR
00h
This register is dual functioned. Reads power supply,
VDD ADC value. Writes data integrity value
SerialEepromChecksum1.
7.
Simplified Interface Models
VDD
TXIN+
X
50
X
Predrive+/50
TXIN-
OUT+
OUT-
VCM
X
Figure 30- Transmit input structure
Figure 31- Transmit output structure
VDD
50
VDD
50
X
RXOUT+
X
RXOUT-
VDD
RXIN+
X
50
VCM
VDD
50
RXIN-
X
Figure 32- Receive input structure
43
Figure 33- Receive output structure
VDD
VDD
X
IMON
Figure 34- MPD input structure
VDD
IBIAS
Figure 35- Laser bias output structure
VDD
X
LOS, TXFAULT
Figure 36- LOS/TX_FAULT output
44
X
X
PDREG
Figure 37- RSSI regulator output structure
Typical Applications
4.7kΩ
SDA
2-wire serial
interface to/from
microcontroller
SCL
10kΩ
+3.3V
Host
Board
4.7kΩ
5% 0.125W
SMT0402
RREF
23
6
22
7
21
8
20
9
19
10
11
12
13
14
10nF
10nF
15
16
17
LoadΩ
VSS_TX
C pF
LASER+
RΩ
LASER10nF
VSS_TX
VDD_TXO
10nF
VDD_TX
+3.3V
seriesΩ
LASER_BIAS
18
From Host
(SFP Connector)
From Host
(SFP Connector)
High Speed
100Ω Differential
30kΩ
Figure 38 – PHY1076-01 in DDM Mode
45
100nF
BLM15BD102
SHUTDOWN
TSENSE
RSSI
RXIN+
RXIN-
PHY1076-01
5
+3.3V
+3.3V
10nF
+3.3V
BLM15BD102
RXOUT+
24
NC
10nF
+3.3V
VDD_TX
VGG
Optional
SHUTDOWN
FET
1nF
28
4
VSS_TX
RXOUT-
29
25
RATESEL
10nF
30
3
TXIN-
High Speed
100Ω Differential
VSS_RX
31
26
TXIN+
10nF
32
2
VSS_TX
+3.3V
33
100Ω
BC847B
or similar
27
TX_DISABLE
VDD_RXO
34
ROSA PD BIAS
10nF
1
TX_FAULT
RESET
From MCU
35
Host
Board
BLM15BD102
36
10nF
VSS_RX
SA_SCL
VDD_RX
10nF
LOS
+3.3V
SA_SDA
+3.3V
High Speed
100Ω Differential
MPD
8.
BLM15BD102 Ferrite Bead, Supplier:Murata
4.7kΩ
10nF
RXOUT-
10nF
RXOUT+
SDA
2-wire interface used to
set-up the PHY1076 and
program EEPROM
attached to pins 1 & 36.
+3.3V
Host
Board
4.7kΩ
5% 0.125W
SMT0402
RREF
28
+3.3V
2
26
3
25
4
24
PHY1076-01
5
23
6
22
7
21
8
20
9
19
10
11
12
13
14
10nF
10nF
15
16
17
VDD_TX
VGG
+3.3V
+3.3V
10nF
100nF
VSS_TX
LoadΩ
SHUTDOWN
LOS
RSSI
TSENSE
29
27
TX_FAULT
10kΩ
SCL
30
+3.3V
C pF
LASER+
RΩ
LASER10nF
VSS_TX
VDD_TXO
10nF
VDD_TX
+3.3V
seriesΩ
BLM15BD102
VSS_RX
31
Optional
SHUTDOWN
FET
1nF
LASER_BIAS
18
MPD
10nF
32
NC
VDD_RXO
+3.3V
33
VSS_TX
RESET
34
1
RATESEL
No Connection
35
BC847B
or similar
BLM15BD102
36
SA_SDA
RXIN+
8K EEPROM (512 x 8)
AT24C04 or similar
High Speed
100Ω Differential
10nF
SDA
TXIN-
5
100Ω
SCL
RXIN-
4
10nF
Host
Board
ROSA PD BIAS
TXIN+
6
VSS_RX
7
3
10nF
WP
VSS_TX
2
Vcc
VDD_RX
A2
GND
8
TX_DISABLE
1
A1
+3.3V
SA_SCL
A0
+3.3V
High Speed
100Ω Differential
BLM15BD102
+3.3V
From Host
(SFP Connector)
From Host
(SFP Connector)
High Speed
100Ω Differential
30kΩ
BLM15BD102 Ferrite Bead, Supplier:Murata
Figure 39 – PHY1076-01 in Stand-alone Mode
8.1.
Power Supply Connections
The PHY1076-01 has been designed as a low power device. In order to achieve low operating power
consumption the transmitter and receiver circuitry in the PHY1076-01 share some common internal bias
circuitry. This requires that the PHY1076-01 transmitter and receiver be powered up together for correct
operation. Powering up the transmitter VDDs and not the receiver VDDs, or the reverse, will not damage
the PHY1076-01 but will cause the part to function incorrectly.
8.1.1.
Power Supply Filtering
Although the Tx VDDs and Rx VDDs should be powered together and therefore, ultimately be connected
at a common node, it is beneficial to separately filter the power supplies for the Tx VDD and Rx VDD
supplies. Separately filtering the transmitter and receiver supplies off chip will reduce power supply noise
and cross talk between the transmitter and receiver – it is generally good practice to separately filter and
decouple the individual supplies on any multifunction IC.
In addition to supplying separately filtered supplies to the Tx VDDs and Rx VDDs of the PHY1076-01, it is
also recommended that any other ICs and digital circuitry connected to the PHY1076-01 in an application
environment (e.g. SFP module) be suitably filtered and decoupled also. An example of this would be to
supply a filtered digital supply for the external MCU, required to compliment the PHY1076-01 in DDM
SFF-8472 applications.
46
36
VDD_RXO
RX
VDD
VSS_RX
35
VSS_RX
VDD_RX
RX
VDD
+3.3V
34
33
32
31
30
29
28
FERRITE
1
27
2
26
3
25
4
24
VDD_TX
TX
VDD
TX
VDD
VGG
VSS_TX
RX
VDD
0.1uF
0.1uF
Pin 20/21
Pin 27
0.1uF
0.1uF
Pin 3
Pin 35
FERRITE
1.0uF
CENTRE GROUND PADDLE
5
23
PCB VIA CONNECT TO GROUND PLANE
RREF
22
7
21
8
20
9
19
11
12
13
VSS_TX
10
14
15
16
VSS_TX
10kΩ
6
17
18
VSS_TX
VDD_TXO
TX
VDD
VDD_TX
TX
VDD
TX VDD and RX VDD should be separately
filtered and well decoupled.
A single +3.3V connection should be used to
power both TX VDD and RX VDD using a star
topology filter scheme as shown above.
The PHY1076-01 TX VDDs and RX VDDs
should not be independently powered to avoid
conduction between TX and RX VDD ESD diode
circuits.
Figure 40 – Recommended power supply connections and filtering.
8.1.2.
Power-On-Reset
The PHY1076-01 features an internal power-on-reset function that applies a reset to the digital logic once
the supply voltage reaches a preset value (>2.0V). The internal power-on-reset typically takes 27ms after
power has been applied based on a 50ms slow start voltage ramp. The PHY1076-01 may be reset
externally by applying a logic low pulse to the reset pin which is internally pulled up. This is useful to
guarantee the state of the PHY1076-01 logic when using the device in conjunction with an external MCU.
47
9.
Packaging
Figure 41 - QFN 36 Package Outline Drawing
48
10.
Contact Information
For technical support, contact Maxim at www.maximintegrated.com/support.
49
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent
licenses are implied. Maxim reserves the right to change the circuitry and specifications without notice at any time. The parametric
values (min and max limits) shown in the Electrical Characteristics table are guaranteed. Other parametric values quoted in this data
sheet are provided for guidance.
Maxim Integrated 160 Rio Robles, San Jose, CA 95134 USA 1-408-601-1000
 2012 Maxim Integrated
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