WFP7N 70 Wisdom Semiconductor N-Channel MOSFET Features RDS(on) (Max 0.9 Ω )@VGS=10V ■ Gate Charge (Typical 32nC) Improved dv/dt Capability, High Ruggedness 100% Avalanche Tested Maximum Junction Temperature Range (150°C) ■ ■ ■ 2. Drain { Symbol ■ ● ◀ 1. Gate{ ▲ ● ● { General Description This Power MOSFET is produced using Wisdom’s advanced planar stripe, DMOS technology. This latest technology has been especially designed to minimize on-state resistance, have a high rugged avalanche characteristics. These devices are well suited for high efficiency switching DC/DC converters, switch mode power supply, DC-AC converters for uninterruped power supply, motor control. 3. Source TO-220 1 2 3 Absolute Maximum Ratings (TC=25C unless otherwise noted) Characteristic Symbol Rating Unit Drain-source voltage VDSS 700 V Gate-source voltage VGSS 30 V TC=25C 8 A TC=100C 4.8 A IDM 32 A PD 60 W Drain current (DC) * Drain current (Pulsed) ID * Power dissipation Avalanche current (Single) ② IAS 8 A Single pulsed avalanche energy ② EAS 266 mJ Avalanche current (Repetitive) ① IAR 8 A Repetitive avalanche energy ① EAR 11.6 mJ TJ 150 Tstg -55~150 Junction temperature Storage temperature range C * Limited by maximum junction temperature Characteristic Thermal resistance Symbol Typ. Max. Junction-case Rth(J-C) - 3.1 Junction-ambient Rth(J-A) - 62.5 Unit C/W Electrical Characteristics (TC=25C unless otherwise noted) Characteristic Symbol Test Condition Min. Typ. Max. Unit Drain-source breakdown voltage BVDSS ID=250uA, VGS=0V 700 - - V Gate threshold voltage VGS(th) ID=250uA, VDS=VGS 2.0 - 4.0 V Drain-source cut-off current IDSS VDS=700V, VGS=0V - - 1 uA Gate leakage current IGSS VDS=0V, VGS=30V - - 100 nA Drain-source on-resistance ④ RDS(on) VGS=10V, ID=4.0A - 0.77 0.90 Forward transfer conductance ④ gfs VDS=10V, ID=4.0A - 11 - S - 2006 2507 - 148 185 - 13.7 17.1 - 23 - - 69 - - 144 - - 77 - - 32 40 - 9 - - 8 - Input capacitance Ciss Output capacitance Coss Reverse transfer capacitance Crss Turn-on delay time td(on) Rise time tr Turn-off delay time td(off) Fall time tf Total gate charge Qg Gate-source charge Qgs Gate-drain charge VGS=0V, VDS=25V f=1 MHz VDD=300V, ID=8A RG=25Ω ③④ VDS=560V, VGS=10V ID=8A ③④ Qgd pF ns nC Source-Drain Diode Ratings and Characteristics (TC=25C unless otherwise noted) Characteristic Symbol Source current (DC) IS Test Condition Min. Typ. Max. Unit - - 8 - - 32 Source current (Pulsed) ① ISM Integral reverse diode in the MOSFET Forward voltage ④ VSD VGS=0V, IS=8A - - 1.4 V Reverse recovery time trr - 420 - ns Reverse recovery charge Qrr IS=8A, VGS=0V dIF/dt=100A/us - 4.2 - uC Note ; ① Repetitive rating : Pulse width limited by maximum junction temperature ② L=7.74mH, IAS=8A, VDD=50V, RG=25Ω, Starting TJ=25C ③ Pulse Test : Pulse width≤300us, Duty cycle≤2% ④ Essentially independent of operating temperature A Electrical Characteristic Curves Fig. 2 ID - VGS Fig. 1 ID - VDS ℃ - Fig. 3 RDS(on) - ID Fig. 4 IS - VSD ℃ Fig. 5 Capacitance - VDS Fig.6 VGS - QG ℃ Electrical Characteristic Curves Fig. 7 VDSS - TJ Fig.8 RDS(on) - TJ C Fig. 9 ID - TC C Fig. 10 Safe Operating Area * Fig. 11 Gate Charge Test Circuit & Waveform Fig. 12 Resistive Switching Test Circuit & Waveform Fig. 13 EAS Test Circuit & Waveform Fig. 14 Diode Reverse Recovery Time Test Circuit & Waveform Package Dimension TO-220 4.50 ±0.20 2.80 ±0.10 (3.00) +0.10 1.30 –0.05 18.95MAX. (3.70) ø3.60 ±0.10 15.90 ±0.20 1.30 ±0.10 (8.70) (1.46) 9.20 ±0.20 (1.70) 9.90 ±0.20 1.52 ±0.10 0.80 ±0.10 2.54TYP [2.54 ±0.20] 10.08 ±0.30 (1.00) 13.08 ±0.20 ) (45° 1.27 ±0.10 +0.10 0.50 –0.05 2.40 ±0.20 2.54TYP [2.54 ±0.20] 10.00 ±0.20 Dimensions in Millimeters