AD AD1674JN

a
FUNCTIONAL BLOCK DIAGRAM
12/8
CS
A
0
CE
R/C
REF OUT
AGND
A
AAAA
AA
A
AAAAAA
AA
CONTROL
10V
REF
CLOCK
12
COMP
20k
REF IN
5k
BIP OFF
20V
IN
10VIN
SAR
12
10k
10k
5k
DAC
IDAC
2.5k
2.5k
5k
SHA
REGISTERS / 3-STATE OUTPUT BUFFERS
FEATURES
Complete Monolithic 12-Bit 10 ms Sampling ADC
On-Board Sample-and-Hold Amplifier
Industry Standard Pinout
8- and 16-Bit Microprocessor Interface
AC and DC Specified and Tested
Unipolar and Bipolar Inputs
65 V, 610 V, 0 V–10 V, 0 V–20 V Input Ranges
Commercial, Industrial and Military Temperature
Range Grades
MIL-STD-883 and SMD Compliant Versions Available
12-Bit 100 kSPS
A/D Converter
AD1674*
12
STS
DB11 (MSB)
DB0 (LSB)
AD1674
PRODUCT DESCRIPTION
PRODUCT HIGHLIGHTS
The AD1674 is a complete, multipurpose, 12-bit analog-todigital converter, consisting of a user-transparent onboard
sample-and-hold amplifier (SHA), 10 volt reference, clock and
three-state output buffers for microprocessor interface.
1. Industry Standard Pinout: The AD1674 utilizes the pinout
established by the industry standard AD574A and AD674A.
The AD1674 is pin compatible with the industry standard
AD574A and AD674A, but includes a sampling function while
delivering a faster conversion rate. The on-chip SHA has a wide
input bandwidth supporting 12-bit accuracy over the full
Nyquist bandwidth of the converter.
The AD1674 is fully specified for ac parameters (such as S/(N+D)
ratio, THD, and IMD) and dc parameters (offset, full-scale
error, etc.). With both ac and dc specifications, the AD1674 is
ideal for use in signal processing and traditional dc measurement applications.
The AD1674 design is implemented using Analog Devices’
BiMOS II process allowing high performance bipolar analog circuitry to be combined on the same die with digital CMOS logic.
Five different temperature grades are available. The AD1674J
and K grades are specified for operation over the 0°C to +70°C
temperature range. The A and B grades are specified from
–40°C to +85°C; the AD1674T grade is specified from –55°C
to +125°C. The J and K grades are available in both 28-lead
plastic DIP and SOIC. The A and B grade devices are available
in 28-lead hermetically sealed ceramic DIP and 28-lead SOIC.
The T grade is available in 28-lead hermetically sealed ceramic
DIP.
2. Integrated SHA: The AD1674 has an integrated SHA which
supports the full Nyquist bandwidth of the converter. The
SHA function is transparent to the user; no wait-states are
needed for SHA acquisition.
3. DC and AC Specified: In addition to traditional dc specifications, the AD1674 is also fully specified for frequency domain ac parameters such as total harmonic distortion,
signal-to-noise ratio and input bandwidth. These parameters
can be tested and guaranteed as a result of the onboard
SHA.
4. Analog Operation: The precision, laser-trimmed scaling and
bipolar offset resistors provide four calibrated ranges:
0 V to +10 V and 0 V to +20 V unipolar, –5 V to +5 V and
–10 V to +10 V bipolar. The AD1674 operates on +5 V and
± 12 V or ± 15 V power supplies.
5. Flexible Digital Interface: On-chip multiple-mode
three-state output buffers and interface logic allow direct
connection to most microprocessors.
*Protected by U. S. Patent Nos. 4,962,325; 4,250,445; 4,808,908; RE30586 .
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700
Fax: 617/326-8703
AD1674–SPECIFICATIONS
(TMIN to TMAX, VCC = +15 V 6 10% or +12 V 6 5%, VLOGIC = +5 V 6 10%, VEE = –15 V 6 10% or
DC SPECIFICATIONS –12 V 6 5% unless otherwise noted)
Parameter
Min
RESOLUTION
12
AD1674J
Typ
Min
AD1674K
Typ
Max
12
12
Unit
Bits
±1
INTEGRAL NONLINEARITY (INL)
DIFFERENTIAL NONLINEARITY (DNL)
(No Missing Codes)
Max
± 1/2
12
LSB
Bits
UNIPOLAR OFFSET 1 @ +25°C
±3
±2
LSB
BIPOLAR OFFSET1 @ +25°C
±6
±4
LSB
0.25
% of FSR
+70
°C
FULL-SCALE ERROR1, 2 @ +25°C
(with Fixed 50 Ω Resistor from REF OUT to REF IN)
TEMPERATURE RANGE
0.1
0
0.25
+70
0.1
0
TEMPERATURE DRIFT 3
Unipolar Offset2
Bipolar Offset2
Full-Scale Error2
±2
±2
±6
±1
±1
±3
LSB
LSB
LSB
POWER SUPPLY REJECTION
VCC = 15 V ± 1.5 V or 12 V ± 0.6 V
VLOGIC = 5 V ± 0.5 V
VEE = –15 V ± 1.5 V or –12 V ± 0.6 V
±2
± 1/2
±2
±1
± 1/2
±1
LSB
LSB
LSB
+5
+10
+10
+20
Volts
Volts
Volts
Volts
7
14
kΩ
kΩ
+5.5
+16.5
–11.4
Volts
Volts
Volts
ANALOG INPUT
Input Ranges
Bipolar
Unipolar
Input Impedance
10 Volt Span
20 Volt Span
POWER SUPPLIES
Operating Voltages
VLOGIC
VCC
VEE
Operating Current
ILOGIC
ICC
IEE
–5
–10
0
0
3
6
+4.5
+11.4
–16.5
POWER DISSIPATION
INTERNAL REFERENCE VOLTAGE
Output Current (Available for External Loads) 4
(External Load Should Not Change During Conversion
5
10
9.9
+5
+10
+10
+20
–5
–10
0
0
7
14
3
6
+5.5
+16.5
–11.4
+4.5
+11.4
–16.5
5
10
5
10
14
8
14
18
5
10
14
8
14
18
mA
mA
mA
385
575
385
575
mW
10.0
10.1
2.0
10.0
10.1
2.0
Volts
mA
9.9
NOTES
1
Adjustable to zero.
2
Includes internal voltage reference error.
3
Maximum change from 25°C value to the value at T MIN or TMAX.
4
Reference should be buffered for ± 12 V operation.
All min and max specifications are guaranteed.
Specifications subject to change without notice.
–2–
REV. C
AD1674
Parameter
Min
RESOLUTION
12
AD1674A
Typ Max
12
BIPOLAR OFFSET @ +25°C
FULL-SCALE ERROR1, 2 @ +25°C
(with Fixed 50 Ω Resistor from REF OUT to REF IN)
0.1
–40
AD1674T
Typ Max
Unit
Bits
± 1/2
± 1/2
12
1
Min
12
±1
±1
UNIPOLAR OFFSET 1 @ +25°C
TEMPERATURE RANGE
AD1674B
Typ Max
12
INTEGRAL NONLINEARITY (INL)
DIFFERENTIAL NONLINEARITY (DNL)
(No Missing Codes)
Min
± 1/2
±1
12
LSB
LSB
Bits
±2
±2
±2
LSB
±6
±3
±3
LSB
0.125
% of FSR
+125
°C
0.25
+85
0.1
–40
0.125
+85
0.1
–55
TEMPERATURE DRIFT 3
Unipolar Offset2
Bipolar Offset2
Full-Scale Error2
±2
±2
±8
±1
±1
±5
±1
±2
±7
LSB
LSB
LSB
POWER SUPPLY REJECTION
VCC = 15 V ± 1.5 V or 12 V ± 0.6 V
VLOGIC = 5 V ± 0.5 V
VEE = –15 V ± 1.5 V or –12 V ± 0.6 V
±2
± 1/2
±2
±1
± 1/2
±1
±1
± 1/2
±1
LSB
LSB
LSB
0
+5
+10
+10
+20
Volts
Volts
Volts
Volts
5
10
7
14
kΩ
kΩ
+5.5
+16.5
–11.4
Volts
Volts
Volts
ANALOG INPUT
Input Ranges
Bipolar
Unipolar
Input Impedance
10 Volt Span
20 Volt Span
POWER SUPPLIES
Operating Voltages
VLOGIC
VCC
VEE
Operating Current
ILOGIC
ICC
IEE
–5
–10
0
0
3
6
+4.5
+11.4
–16.5
POWER DISSIPATION
INTERNAL REFERENCE VOLTAGE
Output Current (Available for External Loads) 4
(External Load Should Not Change During Conversion
REV. C
5
10
9.9
+5
+10
+10
+20
–5
–10
0
0
7
14
3
6
5
10
+5.5 +4.5
+16.5 +11.4
–11.4 –16.5
+5
+10
+10
+20
–5
–10
0
7
14
3
6
+5.5 +4.5
+16.5 +11.4
–11.4 –16.5
5
10
14
8
14
18
5
10
14
8
14
18
5
10
14
8
14
18
mA
mA
mA
385
575
385
575
385
575
mW
10.0
10.1
2.0
10.0
10.1
2.0
10.0
10.1
2.0
Volts
mA
–3–
9.9
9.9
AD1674–SPECIFICATIONS
AC SPECIFICATIONS
(TMIN to TMAX, with VCC = +15 V 6 10% or +12 V 6 5%, VLOGIC = +5 V 6 10%, VEE = –15 V 610% or
–12 V 6 5%, fSAMPLE = 100 kSPS, fIN = 10 kHz, stand-alone mode unless otherwise noted)1
Parameter
Min
Signal to Noise and Distortion (S/N+D) Ratio2, 3
AD1674J/A
Typ
Max
69
4
70
Min
AD1674K/B/T
Typ
Max
70
Units
71
dB
Total Harmonic Distortion (THD)
–90
–82
0.008
–90
–82
0.008
dB
%
Peak Spurious or Peak Harmonic Component
–92
–82
–92
–82
dB
Full Power Bandwidth
Full Linear Bandwidth
1
500
Intermodulation Distortion (IMD)5
Second Order Products
Third Order Products
–90
–90
SHA (Specifications are Included in Overall Timing Specifications)
Aperture Delay
Aperture Jitter
Acquisition Time
50
250
1
1
500
MHz
kHz
–80
–80
–90
–90
–80
–80
dB
dB
50
250
1
ns
ps
µs
(for all grades TMIN to TMAX, with VCC = +15 V 6 10% or +12 V 6 5%, VLOGIC = +5 V 6 10%,
EE = –15 V 6 10% or –12 V 6 5%)
DIGITAL SPECIFICATIONS V
Parameter
LOGIC INPUTS
VIH
High Level Input Voltage
VIL
Low Level Input Voltage
IIH
High Level Input Current (VIN = 5 V)
IIL
Low Level Input Current (VIN = 0 V)
CIN
Input Capacitance
LOGIC OUTPUTS
VOH
High Level Output Voltage
VOL
Low Level Output Voltage
IOZ
High-Z Leakage Current
COZ
High-Z Output Capacitance
Test Conditions
Min
Max
Units
VIN = VLOGIC
VIN = 0 V
+2.0
–0.5
–10
–10
VLOGIC +0.5 V
+0.8
+10
+10
10
V
V
µA
µA
pF
+0.4
+10
10
V
V
µA
pF
IOH = 0.5 mA
IOL = 1.6 mA
VIN = 0 to VLOGIC
+2.4
–10
NOTES
1
fIN amplitude = –0.5 dB (9.44 V p-p) 10 V bipolar mode unless otherwise noted. All measurements referred to –0 dB (9.997 V p-p) input signal unless
otherwise noted.
2
Specified at worst case temperatures and supplies after one minute warm-up.
3
See Figures 12 and 13 for other input frequencies and amplitudes.
4
See Figure 11.
5
fa = 9.08 kHz, fb = 9.58 kHz with f SAMPLE = 100 kHz. See Definition of Specifications section and Figure 15.
All min and max specifications are guaranteed.
Specifications subject to change without notice.
–4–
REV. C
AD1674
SWITCHING SPECIFICATIONS
(for all grades TMIN to TMAX with VCC = +15 V 6 10% or +12 V 6 5%,
VLOGIC = +5 V 610%, VEE = –15 V 6 10% or –12 V 6 5%; VIL = 0.4 V,
VIH = 2.4 V unless otherwise noted)
CONVERTER START TIMING (Figure 1)
Parameter
Conversion Time
8-Bit Cycle
12-Bit Cycle
STS Delay from CE
CE Pulse Width
CS to CE Setup
CS Low During CE High
R/C to CE Setup
R/C Low During CE High
A0 to CE Setup
A0 Valid During CE High
J, K, A, B, Grades T Grade
Symbol Min Typ Max Min Typ Max Units
tC
tC
tDSC
tHEC
tSSC
tHSC
tSRC
tHRC
tSAC
tHAC
7
9
8
10
200
50
50
50
50
50
0
50
7
9
50
50
50
50
50
0
50
tHEC
CE
__
CS
8
µs
10 µs
225 ns
ns
ns
ns
ns
ns
ns
ns
tHSC
tSSC
_
R/C
tSRC
tSAC
A0
tHRC
tHAC
tC
STS
READ TIMING—FULL CONTROL MODE (Figure 2)
Parameter
J, K, A, B, Grades
T Grade
Symbol Min Typ Max Min Typ Max Units
Access Time
Data Valid After CE Low
tDD1
tHD
Output Float Delay
CS to CE Setup
R/C to CE Setup
A0 to CE Setup
CS Valid After CE Low
R/C High After CE Low
A0 Valid After CE Low
tHL5
tSSR
tSRR
tSAR
tHSR
tHRR
tHAR
75
150
252
203
75
252
154
150
50
0
50
0
0
50
50
0
50
0
0
50
tDSC
DB11 – DB0
HIGH IMPEDANCE
Figure 1. Converter Start Timing
150 ns
ns
ns
150 ns
ns
ns
ns
ns
ns
ns
CE
__
CS
tHSR
tSSR
_
R/C
tSSR
A0
NOTES
1
tDD is measured with the load circuit of Figure 3 and is defined as the time
required for an output to cross 0.4 V or 2.4 V.
2
0°C to TMAX.
3
At –40°C.
4
At –55°C.
5
tHL is defined as the time required for the data lines to change 0.5 V when
loaded with the circuit of Figure 3.
All min and max specifications are guaranteed.
Specifications subject to change without notice.
tHRR
tSAR
tHAR
tHS
STS
tHD
DB11 – DB0
HIGH
HIGH
DATA
VALID
IMPEDANCE
tDD
IMP.
tHL
Figure 2. Read Timing
Test
VCP
COUT
Access Time High Z to Logic Low
Float Time Logic High to High Z
Access Time High Z to Logic High
Float Time Logic Low to High Z
5V
0V
0V
5V
100 pF
10 pF
100 pF
10 pF
IOL
DOUT
VCP
COUT
IOH
Figure 3. Load Circuit for Bus Timing Specifications
REV. C
–5–
AD1674
TIMING—STAND-ALONE MODE (Figures 4a and 4b)
Parameter
Symbol
Data Access Time
Low R/C Pulse Width
STS Delay from R/C
Data Valid After R/C Low
STS Delay After Data Valid
High R/C Pulse Width
tDDR
tHRL
tDS
tHDR
tHS
tHRH
Min
J, K, A, B Grades
Typ
Max
T Grade
Typ
Min
150
50
Units
150
ns
ns
ns
ns
µs
ns
50
200
25
0.6
150
Max
0.8
225
25
0.6
150
1.2
0.8
1.2
NOTE
All min and max specifications are guaranteed.
Specifications subject to change without notice.
tHRL
_
R/C
_
R/C
tDS
tHRH
tDS
STS
STS
tDDR
tC
tHS
tHDR
DB11 – DB0
DATA
VALID
DB11 – DB0
HIGH-Z
HIGH-Z
tC
tHDR
HIGH-Z
DATA
VALID
DATA VALID
tHL
Figure 4a. Stand-Alone Mode Timing Low Pulse for R/C
ABSOLUTE MAXIMUM RATINGS*
VCC to Digital Common . . . . . . . . . . . . . . . . . . . 0 to + 16.5 V
VEE to Digital Common . . . . . . . . . . . . . . . . . . . . . 0 to –16.5 V
VLOGIC to Digital Common . . . . . . . . . . . . . . . . . . 0 V to +7 V
Analog Common to Digital Common . . . . . . . . . . . . . . . ± 1 V
Digital Inputs to Digital Common . . . –0.5 V to VLOGIC +0.5 V
Analog Inputs to Analog Common . . . . . . . . . . . . VEE to VCC
20 VIN to Analog Common . . . . . . . . . . . . . . . . . VEE to +24 V
REF OUT . . . . . . . . . . . . . . . . . Indefinite Short to Common
Figure 4b. Stand-Alone Mode Timing High Pulse for R/C
. . . . . . . . . . . . . . . . . . . . . . . . . . . Momentary Short to VCC
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +175°C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . 825 mW
Lead Temperature, Soldering (10 sec) . . . . . . . +300°C, 10 sec
Storage Temperature . . . . . . . . . . . . . . . . . . . –65°C to +150°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the AD1674 features proprietary ESD protection circuitry, permanent damage may occur on
devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ORDERING GUIDE
Model1
Temperature Range
INL
(TMIN to TMAX)
S/(N+D)
(TMIN to TMAX)
Package
Description
Package
Option2
AD1674JN
AD1674KN
AD1674JR
AD1674KR
AD1674AR
AD1674BR
AD1674AD
AD1674BD
AD1674TD
0°C to +70°C
0°C to +70°C
0°C to +70°C
0°C to +70°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–55°C to +125°C
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
± 1/2 LSB
± 1 LSB
69 dB
70 dB
69 dB
70 dB
69 dB
70 dB
69 dB
70 dB
70 dB
Plastic DIP
Plastic DIP
Plastic SOIC
Plastic SOIC
Plastic SOIC
Plastic SOIC
Ceramic DIP
Ceramic DIP
Ceramic DIP
N-28
N-28
R-28
R-28
R-28
R-28
D-28
D-28
D-28
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military Products Databook or current
AD1674/883B data sheet. SMD is also available.
2
N = Plastic DIP; D = Hermetic Ceramic DIP; R = Plastic SOIC.
–6–
REV. C
AD1674
PIN DESCRIPTION
Symbol
Pin No. Type
Name and Function
AGND
A0
9
4
P
DI
BIP OFF
12
AI
CE
CS
DB11–DB8
6
3
27–24
DI
DI
DO
DB7–DB4
23–20
DO
DB3–DB0
19–16
DO
DGND
REF OUT
R/C
15
8
5
P
AO
DI
REF IN
STS
10
28
AI
DO
VCC
VEE
VLOGIC
10 VIN
7
11
1
13
P
P
P
AI
20 VIN
14
AI
12/8
2
DI
Analog Ground (Common).
Byte Address/Short Cycle. If a conversion is started with A0 Active LOW, a full 12-bit conversion
cycle is initiated. If A0 is Active HIGH during a convert start, a shorter 8-bit conversion cycle
results. During Read (R/C = 1) with 12/8 LOW, A0 = LOW enables the 8 most significant bits
(DB4–DB11), and A0 = HIGH enables DB3–DB0 and sets DB7–DB4 = 0.
Bipolar Offset. Connect through a 50 Ω resistor to REF OUT for bipolar operation or to Analog
Common for unipolar operation.
Chip Enable. Chip Enable is Active HIGH and is used to initiate a convert or read operation.
Chip Select. Chip Select is Active LOW.
Data Bits 11 through 8. In the 12-bit format (see 12/8 and A0 pins), these pins provide the upper 4 bits of data. In the 8-bit format, they provide the upper 4 bits when A0 is LOW and are
disabled when A0 is HIGH.
Data Bits 7 through 4. In the 12-bit format these pins provide the middle 4 bits of data. In the
8-bit format they provide the middle 4 bits when Ao is LOW and all zeroes when A0 is HIGH.
Data Bits 3 through 0. In the 12-bit format these pins provide the lower 4 bits of data. In the
8-bit format these pins provide the lower 4 bits of data when A0 is HIGH, they are disabled
when A0 is LOW.
Digital Ground (Common).
+10 V Reference Output.
Read/Convert. In the full control mode R/C is Active HIGH for a read operation and Active LOW
for a convert operation. In the stand-alone mode, the falling edge of R/C initiates a conversion.
Reference Input is connected through a 50 Ω resistor to +10 V Reference for normal operation.
Status is Active HIGH when a conversion is in progress and goes LOW when the conversion is
completed.
+12 V/+15 V Analog Supply.
–12 V/–15 V Analog Supply.
+5 V Logic Supply.
10 V Span Input, 0 V to +10 V unipolar mode or –5 V to +5 V bipolar mode. When using the
AD1674 in the 20 V Span 10 VIN should not be connected.
20 V Span Input, 0 V to +20 V unipolar mode or –10 V to +10 V bipolar mode. When using
the AD1674 in the 10 V Span 20 VIN should not be connected.
The 12/8 pin determines whether the digital output data is to be organized as two 8-bit words
(12/8 LOW) or a single 12-bit word (12/8 HIGH).
AI
AO
DI
DO
P
=
=
=
=
=
Analog Input
Analog Output
Digital Input
Digital Output
Power
FUNCTIONAL BLOCK DIAGRAM
12/8
CS
A
0
CE
R/C
REF OUT
AGND
A
AA
AA
AA
A
AA
AAAAAA
AA
CONTROL
10V
REF
CLOCK
12
COMP
20k
REF IN
5k
BIP OFF
20V
IN
10VIN
12
10k
10k
5k
DAC
IDAC
2.5k
2.5k
REV. C
SAR
5k
SHA
AD1674
–7–
REGISTERS / 3-STATE OUTPUT BUFFERS
TYPE:
12
PIN CONFIGURATION
STS
DB11 (MSB)
DB0 (LSB)
VLOGIC
1
28
STS
12/8
2
27
DB11(MSB)
CS
3
26 DB10
A0
4
25
DB9
R/C
5
24
DB8
CE
6
23
DB7
VCC
7
22
DB6
REF OUT
8
21
DB5
AGND
9
20
DB4
REF IN
10
19
DB3
VEE 11
18
DB2
BIP OFF
12
17
DB1
10VIN
13
16
DB0(LSB)
20VIN
14
15
DGND
AD1674
TOP VIEW
(Not to Scale)
AD1674
DEFINITION OF SPECIFICATIONS
INTEGRAL NONLINEARITY (INL)
The ideal transfer function for an ADC is a straight line drawn
between “zero” and “full scale.” The point used as “zero”
occurs 1/2 LSB before the first code transition. “Full scale” is
defined as a level 1 1/2 LSB beyond the last code transition.
Integral nonlinearity is the worst-case deviation of a code from
the straight line. The deviation of each code is measured from
the middle of that code.
DIFFERENTIAL NONLINEARITY (DNL)
A specification which guarantees no missing codes requires that
every code combination appear in a monotonic increasing
sequence as the analog input level is increased. Thus every code
must have a finite width. The AD1674 guarantees no missing
codes to 12-bit resolution; all 4096 codes are present over the
entire operating range.
UNIPOLAR OFFSET
The first transition should occur at a level 1/2 LSB above analog common. Unipolar offset is defined as the deviation of the
actual transition from that point at 25°C. This offset can be
adjusted as shown in Figure 11.
BIPOLAR OFFSET
In the bipolar mode the major carry transition (0111 1111 1111
to 1000 0000 0000) should occur for an analog value 1/2 LSB
below analog common. The bipolar offset error specifies the
deviation of the actual transition from that point at 25°C. This
offset can be adjusted as shown in Figure 12.
FULL-SCALE ERROR
The last transition (from 1111 1111 1110 to 1111 1111 1111)
should occur for an analog value 1 1/2 LSB below the nominal
full scale (9.9963 volts for 10 volts full scale). The full-scale
error is the deviation of the actual level of the last transition
from the ideal level at 25°C. The full-scale error can be adjusted
to zero as shown in Figures 11 and 12.
are present in a sample sequence. The result, called Prime
Coherent Sampling, is a highly accurate and repeatable measure
of the actual frequency-domain response of the converter.
NYQUIST FREQUENCY
An implication of the Nyquist sampling theorem, the “Nyquist
Frequency” of a converter is that input frequency which is onehalf the sampling frequency of the converter.
SIGNAL-TO-NOISE AND DISTORTION (S/N+D) RATIO
S/(N+D) is the ratio of the rms value of the measured input signal to the rms sum of all other spectral components below the
Nyquist frequency, including harmonics but excluding dc. The
value for S/(N+D) is expressed in decibels.
TOTAL HARMONIC DISTORTION (THD)
THD is the ratio of the rms sum of the first six harmonic components to the rms value of a full-scale input signal and is expressed as a percentage or in decibels. For input signals or
harmonics that are above the Nyquist frequency, the aliased
component is used.
INTERMODULATION DISTORTION (IMD)
With inputs consisting of sine waves at two frequencies, fa and
fb, any device with nonlinearities will create distortion products,
of order (m+n), at sum and difference frequencies of mfa ± nfb,
where m, n = 0, 1, 2, 3. . . . Intermodulation terms are those for
which m or n is not equal to zero. For example, the second
order terms are (fa + fb) and (fa – fb) and the third order terms
are (2fa + fb), (2fa – fb), (fa + 2fb) and (fa – 2fb). The IMD
products are expressed as the decibel ratio of the rms sum of the
measured input signals to the rms sum of the distortion terms.
The two signals are of equal amplitude and the peak value of
their sums is –0.5 dB from full scale. The IMD products are
normalized to a 0 dB input signal.
FULL-POWER BANDWIDTH
The full-power bandwidth is that input frequency at which the
amplitude of the reconstructed fundamental is reduced by 3 dB
for a full-scale input.
TEMPERATURE DRIFT
The temperature drifts for full-scale error, unipolar offset and
bipolar offset specify the maximum change from the initial
(25°C) value to the value at TMIN or TMAX.
POWER SUPPLY REJECTION
The effect of power supply error on the performance of the
device will be a small change in full scale. The specifications
show the maximum full-scale change from the initial value with
the supplies at various limits.
FREQUENCY-DOMAIN TESTING
The AD1674 is tested dynamically using a sine wave input and
a 2048 point Fast Fourier Transform (FFT) to analyze the
resulting output. Coherent sampling is used, wherein the ADC
sampling frequency and the analog input frequency are related
to each other by a ratio of integers. This ensures that an integral
multiple of input cycles is captured, allowing direct FFT processing without windowing or digital filtering which could mask
some of the dynamic characteristics of the device. In addition,
the frequencies are chosen to he “relatively prime” (no common
factors) to maximize the number of different ADC codes that
FULL-LINEAR BANDWIDTH
The full-linear bandwidth is the input frequency at which the
slew rate limit of the sample-hold-amplifier (SHA) is reached.
At this point, the amplitude of the reconstructed fundamental
has degraded by less than –0.1 dB. Beyond this frequency, distortion of the sampled input signal increases significantly.
APERTURE DELAY
Aperture delay is a measure of the SHA’s performance and is
measured from the falling edge of Read/Convert (R/C) to when
the input signal is held for conversion.
APERTURE JITTER
Aperture jitter is the variation in aperture delay for successive
samples and is manifested as noise on the input to the A/D.
–8–
REV. C
Typical Dynamic Performance–AD1674
AAAA
AAAA
AAA
AAA
80
fSAMPLE = 100kSPS
AMPLITUDE – dB
–20
60
–20dB INPUT
S/(N+D) – dB
0
THD
–40
–60
–80
1
10
100
1000
40
30
–60dB INPUT
10
2NDHARMONIC
–120
50
20
3RD
HARMONIC
–100
0dB INPUT
70
FULL-SCALE = +10V
0
10000
1
Figure 5. Harmonic Distortion vs.
Input Frequency
100
10
INPUT FREQUENCY – kHz
1000
10000
INPUT FREQUENCY – kHz
Figure 6. S/(N+D) vs. Input Frequency
and Amplitude
Figure 7. S/(N+D) vs. Input Amplitude
0
0
–10
–20
–30
–40
AMPLITUDE – dB
AMPLITUDE – dB
–20
–60
–80
–100
–40
–50
–60
–70
–80
–90
–100
–120
–110
–120
–140
0
5
10
15
20
25
30
35
40
45
FREQUENCY – kHz
50
–130
0
Figure 8. Nonaveraged 2048 Point FFT
at 100 kSPS, fIN = 25.049 kHz
5
10
30
20
25
FREQUENCY – kHz
35
40
45
50
Figure 9. IMD Plot for fIN = 9.08 kHz (fa), 9.58 kHz (fb)
DAC current sum to be greater than or less than the input current. If the sum is less, the bit is left on; if more, the bit is
turned off. After testing all the bits, the SAR contains a 12-bit
binary code which accurately represents the input signal to
within ± 1/2 LSB.
GENERAL CIRCUIT OPERATION
The AD1674 is a complete 12-bit, 10 µs sampling analog-todigital converter. A block diagram of the AD1674 is shown on
page 7.
When the control section is commanded to initiate a conversion
(as described later), it places the sample-and-hold amplifier
(SHA) in the hold mode, enables the clock, and resets the successive approximation register (SAR). Once a conversion cycle
has begun, it cannot be stopped or restarted and data is not
available from the output buffers. The SAR, timed by the internal clock, will sequence through the conversion cycle and return
an end-of-convert flag to the control section when the conversion has been completed. The control section will then disable
the clock, switch the SHA to sample mode, and delay the STS
LOW going edge to allow for acquisition to 12-bit accuracy.
The control section will allow data read functions by external
command anytime during the SHA acquisition interval.
CONTROL LOGIC
The AD1674 may be operated in one of two modes, the fullcontrol mode and the stand-alone mode. The full-control mode
utilizes all the AD1674 control signals and is useful in systems
that address decode multiple devices on a single data bus. The
stand-alone mode is useful in systems with dedicated input ports
available and thus not requiring full bus interface capability.
Table I is a truth table for the AD1674, and Figure 10 illustrates the internal logic circuitry.
Table I. AD1674A Truth Table
During the conversion cycle, the internal 12-bit, 1 mA full-scale
current output DAC is sequenced by the SAR from the most
significant bit (MSB) to the least significant bit (LSB) to provide an output that accurately balances the current through the
5 kΩ resistor from the input signal voltage held by the SHA.
The SHA’s input scaling resistors divide the input voltage by 2
for the 10 V input span and by 4 V for the 20 V input span,
maintaining a 1 mA full-scale output current through the 5 kΩ
resistor for both ranges. The comparator determines whether
the addition of each successively weighted bit current causes the
REV. C
15
–9–
CE CS
R/C
12/8 A0 Operation
0
X
X
1
X
X
X
X
X
X
None
None
1
1
0
0
0
0
X
X
0
1
Initiate 12-Bit Conversion
Initiate 8-Bit Conversion
1
0
1
1
X
Enable 12-Bit Parallel Output
1
1
0
0
1
1
0
0
0
1
Enable 8 Most Significant Bits
Enable 4 LSBs +4 Trailing Zeroes
AD1674
VALUE OF A AT LAST
0
CONVERT COMMAND
D
Q
EN
D
Q
QB
EN
EOC 12
EOC 8
R
Q
S
S
Q
SAR RESET
R QB
1µs DELAY-HOLD SETTLING
CE
CLK ENABLE
CS
STATUS
R/C
1µs DELAY-ACQUISITION
HOLD/SAMPLE
A0
12/8
NYBBLE A
READ
NYBBLE B
NYBBLE C
TO OUTPUT
BUFFERS
NYBBLE B = 0
Figure 10. Equivalent Internal Logic Circuitry
FULL-CONTROL MODE
Chip Enable (CE), Chip Select (CS) and Read/ Convert (R/C)
are used to control Convert or Read modes of operation. Either
CE or CS may be used to initiate a conversion. The state of R/C
when CE and CS are both asserted determines whether a data
Read (R/C = 1) or a Convert (R/C = 0) is in progress. R/C
should be LOW before both CE and CS are asserted; if R/C is
HIGH, a Read operation will momentarily occur, possibly
resulting in system bus contention.
STAND-ALONE MODE
The AD1674 can be used in a “stand-alone” mode, which is
useful in systems with dedicated input ports available and thus
not requiring full bus interface capability. Stand-alone mode
applications are generally able to issue conversion start commands more precisely than full-control mode. This improves ac
performance by reducing the amount of control-induced aperture jitter.
In stand-alone mode, the control interface for the AD1674 and
AD674A are identical. CE and 12/8 are wired HIGH, CS and
A0 are wired LOW, and conversion is controlled by R/C. The
three-state buffers are enabled when R/C is HIGH and a conversion starts when R/C goes LOW. This gives rise to two possible control signals—a high pulse or a low pulse. Operation
with a low pulse is shown in Figure 4a. In this case, the outputs
are forced into the high impedance state in response to the falling edge of R/C and return to valid logic levels after the conversion cycle is completed. The STS line goes HIGH 200 ns after
R/C goes LOW and returns low 1 µs after data is valid.
If conversion is initiated by a high pulse as shown in Figure 4b,
the data lines are enabled during the time when R/C is HIGH.
The falling edge of R/C starts the next conversion and the data
lines return to three-state (and remain three-state) until the next
high pulse of R/C.
CONVERSION TIMING
Once a conversion is started, the STS line goes HIGH. Convert
start commands will be ignored until the conversion cycle is
complete. The output data buffers will be enabled a minimum
of 0.6 µs prior to STS going LOW. The STS line will return
LOW at the end of the conversion cycle.
The register control inputs, A0 and 12/8, control conversion
length and data format. If a conversion is started with A0 LOW,
a full 12-bit conversion cycle is initiated. If A0 is HIGH during a
convert start, a shorter 8-bit conversion cycle results.
During data read operations, A0 determines whether the threestate buffers containing the 8 MSBs of the conversion result (A0
= 0) or the 4 LSBs (A0 = 1) are enabled. The 12/8 pin determines whether the output data is to be organized as two 8-bit
words (12/8 tied LOW) or a single 12-bit word (12/8 tied
HIGH). In the 8-bit mode, the byte addressed when A0 is high
contains the 4 LSBs from the conversion followed by four trailing zeroes. This organization allows the data lines to be overlapped for direct interface to 8-bit buses without the need for
external three-state buffers.
INPUT CONNECTIONS AND CALIBRATION
The 10 V p-p and 20 V p-p full-scale input ranges of the
AD1674 accept the majority of signal voltages without the need
for external voltage divider networks which could deteriorate the
accuracy of the ADC.
The AD1674 is factory trimmed to minimize offset, linearity,
and full-scale errors. In many applications, no calibration trimming will be required and the AD1674 will exhibit the accuracy
limits listed in the specification tables.
In some applications, offset and full-scale errors need to be
trimmed out completely. The following sections describe the
correct procedure for these various situations.
UNIPOLAR RANGE INPUTS
Figure 11 illustrates the external connections for the AD1674 in
unipolar-input mode. The first output-code transition (from
0000 0000 0000 to 0000 0000 0001) should nominally occur
for an input level of +1/2 LSB (1.22 mV above ground for a 10 V
range; 2.44 mV for a 20 V range). To trim unipolar offset to this
nominal value, apply a +1/2 LSB signal between Pin 13 and
ground (10 V range) or Pin 14 and ground (20 V range) and adjust R1 until the first transition is located. If the offset trim is
not required, Pin 12 can be connected directly to Pin 9; the two
resistors and trimmer for Pin 12 are then not needed.
–10–
REV. C
AD1674
R1
100k
+15V
–15V
100k
R2
100Ω
100Ω
2
12/8
3
4
CS
A
5
6
10
8
12
R/C
CE
REF IN
REF OUT
BIP OFF
REFERENCE DECOUPLING
STS 28
HIGH BITS
24-27
0
It is recommended that a 10 µF tantalum capacitor be connected between REF IN (Pin 10) and ground. This has the
effect of improving the S/(N+D) ratio through filtering possible
broad-band noise contributions from the voltage reference.
MIDDLE BITS
20-23
LOW BITS
16-19
BOARD LAYOUT
AD1674
0 TO +10V
ANALOG
INPUTS
0 TO +20V
13 10VIN
14 20VIN
9 ANA COM
+5V 1
+15V 7
–15V 11
DIG COM 15
Figure 11. Unipolar Input Connections with Gain and
Offset Trims
The full-scale trim is done by applying a signal 1 1/2 LSB below
the nominal full scale (9.9963 V for a 10 V range) and adjusting
R2 until the last transition is located (1111 1111 1110 to 1111
1111 1111). If full-scale adjustment is not required, R2 should
be replaced with a fixed 50 Ω ± 1% metal film resistor. If REF
OUT is connected directly to REF IN, the additional full-scale
error will be approximately 1%.
BIPOLAR RANGE INPUTS
The connections for the bipolar-input mode are shown in Figure
12. Either or both of the trimming potentiometers can be
replaced with 50 Ω ± 1% fixed resistors if the specified AD1674
accuracy limits are sufficient for the application. If the pins are
shorted together, the additional offset and gain errors will be
approximately 1%.
To trim bipolar offset to its nominal value, apply a signal 1/2
LSB below midrange (–1.22 mV for a ± 5 V range) and adjust
R1 until the major carry transition is located (0111 1111 1111
to 1000 0000 0000). To trim the full-scale error, apply a signal
1 1/2 LSB below full scale (+4.9963 V for a ± 5 V range) and
adjust R2 to give the last positive transition (1111 1111 1110 to
1111 1111 1111). These trims are interactive so several iterations may be necessary for convergence.
R2
100Ω
±5V
ANALOG
INPUTS
±10V
R1
100Ω
12/8
CS
A0
R/C
CE
REF IN
REF OUT
BIP OFF
IN
14 20VIN
9 ANA COM
Analog and digital signals should not share a common path.
Each signal should have an appropriate analog or digital return
routed close to it. Using this approach, signal loops enclose a
small area, minimizing the inductive coupling of noise. Wide PC
tracks, large gauge wire, and ground planes are highly recommended to provide low impedance signal paths. Separate analog
and digital ground planes are also desirable, with a single interconnection point to minimize ground loops. Analog signals
should be routed as far as possible from digital signals and
should cross them (if necessary) only at right angles.
SUPPLY DECOUPLING
The AD1674 power supplies should be well filtered, well regulated, and free from high frequency noise. Switching power supplies are not recommended due to their tendency to generate
spikes which can induce noise in the analog system.
Decoupling capacitors should be used in very close layout proximity between all power supply pins and ground. A 10 µF tantalum capacitor in parallel with a 0.1 µF disc ceramic capacitor
provides adequate decoupling over a wide range of frequencies.
STS 28
HIGH BITS
24-27
MIDDLE BITS
20-23
An effort should be made to minimize the trace length between
the capacitor leads and the respective converter power supply
and common pins. The circuit layout should attempt to locate
the AD1674, associated analog input circuitry, and interconnections as far as possible from logic circuitry. A solid analog
ground plane around the AD1674 will isolate large switching
ground currents. For these reasons, the use of wire-wrap circuit
construction is not recommended; careful printed-circuit construction is preferred.
LOW BITS
16-19
AD1674
13 10V
The AD1674 has a wide bandwidth sampling front end. This
means that the AD1674 will “see” high frequency noise at the
input, which nonsampling (or limited-bandwidth sampling)
ADCs would ignore. Therefore, it’s important to make an effort
to eliminate such high frequency noise through decoupling or by
using an anti-aliasing filter at the analog input of the AD1674.
The AD1674 incorporates several features to help the user’s layout. Analog pins are adjacent to help isolate analog from digital
signals. Ground currents have been minimized by careful circuit
architecture. Current through AGND is 2.2 mA, with little
code-dependent variation. The current through DGND is dominated by the return current for DB11–DB0.
A single-pass calibration can be done by substituting a negative
full-scale trim for the bipolar offset trim (error at midscale),
using the same circuit. First, apply a signal 1/2 LSB above minus
full scale (–4.9988 V for a ±5 V range) and adjust R1 until the
minus full-scale transition is located (0000 0000 0001 to 0000
0000 0000). Then perform the gain error trim as outlined above.
2
3
4
5
6
10
8
12
Designing with high resolution data converters requires careful
attention to board layout. Trace impedance is a significant issue.
At the 12-bit level, a 5 mA current through a 0.5 Ω trace will
develop a voltage drop of 2.5 mV, which is 1 LSB for a 10 V
full-scale range. In addition to ground drops, inductive and capacitive coupling need to be considered, especially when high
accuracy analog signals share the same board with digital signals. Finally, power supplies should be decoupled in order to
filter out ac noise.
+5V 1
+15V 7
–15V 11
DIG COM 15
Figure 12. Bipolar Input Connections with Gain and Offset
Trims
REV. C
–11–
AD1674
GROUNDING
PACKAGE INFORMATION
If a single AD1674 is used with separate analog and digital
ground planes, connect the analog ground plane to AGND and
the digital ground plane to DGND keeping lead lengths as short
as possible. Then connect AGND and DGND together at the
AD1674. If multiple AD1674s are used or the AD1674 shares
analog supplies with other components, connect the analog and
digital returns together once at the power supplies rather than at
each chip. This prevents large ground loops which inductively
couple noise and allow digital currents to flow through the analog system.
Dimensions shown in inches and (mm).
0.505 (12.83)
28
15
0.59 ±0.01
(14.98 ±0.254)
PIN 1
14
1
GENERAL MICROPROCESSOR INTERFACE
CONSIDERATIONS
0.050 ±0.010
(1.27 ±0.254)
1.42 (36.07)
1.40 (35.56)
A typical A/D converter interface routine involves several operations. First, a write to the ADC address initiates a conversion.
The processor must then wait for the conversion cycle to complete, since most ADCs take longer than one instruction cycle to
complete a conversion. Valid data can, of course, only be read
after the conversion is complete. The AD1674 provides an output signal (STS) which indicates when a conversion is in
progress. This signal can be polled by the processor by reading
it through an external three-state buffer (or other input port).
The STS signal can also be used to generate an interrupt upon
completion of a conversion, if the system timing requirements
are critical (bear in mind that the maximum conversion time of
the AD1674 is only 10 microseconds) and the processor has
other tasks to perform during the ADC conversion cycle. Another possible time-out method is to assume that the ADC will
take 10 microseconds to convert, and insert a sufficient number
of “no-op” instructions to ensure that 10 microseconds of processor time is consumed.
0.095
(2.41)
0.145 ±0.02
(3.68 ±0.51)
0.125
(3.17)
MIN
0.010 ±0.002
(0.254 ±0.05)
0.085
(2.16)
0.017 ±0.003
(0.43 ±0.076)
0.047 ±0.007
(1.19 ±0.178)
0.1 (2.54)
0.6 (15.24)
SEATING
PLANE
28-Lead Plastic DIP Package (N-28)
15
28
0.550 (13.97)
0.530 (13.462)
PIN 1
1
14
1.450 (38.83)
1.440 (35.576)
0.160 (4.06)
0.140 (3.56)
0.200
(5.080)
MAX
0.175 (4.45)
0.120 (3.05)
0.020 (0.508)
0.015 (0.381)
0.105 (2.67)
0.095 (2.41)
0.606 (15.39)
0.594 (15.09)
15°
0°
0.065 (1.65)
0.045 (1.14) SEATING
PLANE
0.012 (0.305)
0.008 (0.203)
28-Lead Wide-Body SO Package (R-28)
15
28
0.2992 (7.60)
0.2914 (7.40)
PIN 1
14
1
0.1043 (2.65)
0.0926 (2.35)
0.7125 (18.10)
0.6969 (17.70)
0.0118 (0.30)
0.0040 (0.10)
0.0500 (1.27)
BSC
0.4193 (10.65)
0.3937 (10.00)
0.0192 (0.49)
0.0138 (0.35)
0.0125 (0.32)
0.0091 (0.23)
0.0291 (0.74)
x 45°
0.0098 (0.25)
8°
0°
0.0500 (1.27)
0.0157 (0.40)
AD1674 Data Format for 8-Bit Bus
–12–
REV. C
PRINTED IN U.S.A.
Once it is established that the conversion is finished, the data
can be read. In the case of an ADC of 8-bit resolution (or less),
a single data read operation is sufficient. In the case of converters with more data bits than are available on the bus, a choice of
data formats is required, and multiple read operations are
needed. The AD1674 includes internal logic to permit direct interface to 8-bit or 16-bit data buses, selected by the 12/8 input.
In 16-bit bus applications (12/8 HIGH) the data lines (DB11
through DB0) may be connected to either the 12 most significant or 12 least significant hits of the data bus. The remaining
four bits should be masked in software. The interface to an 8-bit
data bus (12/8 LOW) contains the 8 MSBs (DB11 through
DB4). The odd address (A0 HIGH) contains the 4 LSBs (DB3
through DB0) in the upper half of the byte, followed by four
trailing zeroes, thus eliminating bit masking instructions.
C1425b–10–3/94
28-Pin Ceramic DIP Package (D-28)