ATTENTION MITSUBISHI RF POWER MODULE OBSERVE PRECAUTIONS FOR HANDLING M68701M ELETROSTATIC SENSITIVE DEVICES Silicon MOS FET Power Amplifier, 860-915MHz 6W FM /Digital Mobile B L O C K D IAG R A M D im e n s i o n s i n m m O U T L IN E D R A W I N G 60.5 +/-1 2 3 57.5 +/-0.5 50.2+/-1 2 3 4 14+/-0.5 5 1 4 5 6+/-1 1 11+/-0.5 +0.2 0 2-R1.6 phai 0.45 +/-0.2 8.3 +/-1 PIN: 21.3 +/-1 1 P in 43.3 +/-1 : R F IN P U T 2 VGG : GATE BIAS SUPPLY 51.3 +/-1 3 V D D : D R A IN B I A S S U P P L Y 4 PO : RF OUTPUT (6.4) 2.3+/-0.3 -0.4 3.4+0.8 5 G N D : FIN H11 MAXIMUM RATINGS (Tc=25deg C UNLESS OTHERWISE NOTED) SYMBOL PARAMETER VDD SUPPLY VOLTAGE VGG GATE BIAS VOLTAGE Pin INPUT POWER Po OUTPUT POWER Tc(OP) OPERATION CASE TEMPERATURE Tstg STORAGE TEMPERATURE Note:Above parameters are guaranteed independently. CONDITIONS VGG<5V,ZG=ZL=50 ohms f=860-915MHz,ZG=ZL=50 ohms f=860-915MHz,ZG=ZL=50 ohms f=860-915MHz,ZG=ZL=50 ohms RATINGS 17 5.5 10 10 -30 to +100 -40 to +110 UNIT V V mW W deg. C deg. C ELECTRICAL CHARACTERISTICS (Tc=25deg. C ,Zg=Zl=50 ohms UNLESS OTHERWISE NOTED) SYMBOL f Po Efficiency 2fo VSWR in - PARAMETER FREQUENCY RANGE OUTPUT POWER TOTAL EFFICIENCY 2nd HARMONIC INPUT VSWR LOAD VSWR TOLERANCE TEST CONDITIONS VDD=12.5V,VGG=5V,Pin=1mW VDD=12.5V, Pout=6W (VGG adjust) Pin=1mW VDD=15.2V,Pin=1mW,Po=6W(VGG adjust) ZG=50 ohms, LOAD VSWR=20:1 LIMITS MIN MAX 860 915 6 35 -30 4 No degradation or destroy UNIT MHz W % dBc - ABOVE PARAMETERS, RATINGS, LIMITS AND CONDITIONS ARE SUBJECT TO CHANGE . Keep safety first in your circuit designs! Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap.