CAT25256 256-Kb SPI Serial CMOS EEPROM Description The CAT25256 is a 256−Kb Serial CMOS EEPROM device internally organized as 32Kx8 bits. This features a 64−byte page write buffer and supports the Serial Peripheral Interface (SPI) protocol. The device is enabled through a Chip Select (CS) input. In addition, the required bus signals are clock input (SCK), data input (SI) and data output (SO) lines. The HOLD input may be used to pause any serial communication with the CAT25256 device. The device features software and hardware write protection, including partial as well as full array protection. http://onsemi.com SOIC−8 V SUFFIX CASE 751BD TDFN−8 ZD2 SUFFIX CASE 511AK PDIP−8 L SUFFIX CASE 646AA TSSOP−8 Y SUFFIX CASE 948AL Features • • • • • • • • • • • • • • 10 MHz SPI Compatible 1.8 V to 5.5 V Supply Voltage Range SPI Modes (0,0) & (1,1) 64−byte Page Write Buffer Self−timed Write Cycle Hardware and Software Protection Block Write Protection − Protect 1/4, 1/2 or Entire EEPROM Array Low Power CMOS Technology 1,000,000 Program/Erase Cycles 100 Year Data Retention Industrial and Extended Temperature Range 8−lead PDIP, SOIC, TSSOP and 8−pad TDFN Packages 8−ball Chip Scale Package (CSP) This Device is Pb−Free, Halogen Free/BFR Free, and RoHS Compliant PIN CONFIGURATIONS CS SO WP VSS 1 VCC HOLD SCK SI PDIP (L), SOIC (V), TSSOP (Y), TDFN (ZD2) VCC HOLD SCK SI 1 CS SO WP VSS CSP−8B (X) (Top Views) VCC PIN FUNCTION SI Pin Name CS WP CAT25256 SO HOLD SCK CS Chip Select SO Serial Data Output WP Write Protect VSS Ground SI VSS Serial Data Input SCK Figure 1. Functional Symbol Function HOLD VCC Serial Clock Hold Transmission Input Power Supply ORDERING INFORMATION See detailed ordering and shipping information in the package dimensions section on page 16 of this data sheet. © Semiconductor Components Industries, LLC, 2010 February, 2010 − Rev. 3 1 Publication Order Number: CAT25256/D CAT25256 Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Operating Temperature −45 to +130 °C Storage Temperature −65 to +150 °C Voltage on any Pin with Respect to Ground (Note 1) −0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter NEND (Note 3) TDR Endurance Min Units 1,000,000 Program / Erase Cycles 100 Years Data Retention 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. 3. Page Mode, VCC = 5 V, 25°C. Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 1.8 V to 5.5 V, TA = −40°C to +85°C and VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.) Symbol ICCR Parameter Test Conditions Min Max Units Supply Current (Read Mode) Read, VCC = 5.5 V, SO open 10 MHz / −40°C to 85°C 2 mA 5 MHz / −40°C to 125°C 2 mA ICCW Supply Current (Write Mode) Write, VCC = 5.5 V, SO open 10 MHz / −40°C to 85°C 4 mA 5 MHz / −40°C to 125°C 4 mA ISB1 Standby Current VIN = GND or VCC, CS = VCC, WP = VCC, HOLD = VCC, VCC = 5.5 V TA = −40°C to +85°C 1 mA TA = −40°C to +125°C 3 mA VIN = GND or VCC, CS = VCC, WP = GND, HOLD = GND, VCC = 5.5 V TA = −40°C to +85°C 4 mA TA = −40°C to +125°C 5 mA −2 2 mA TA = −40°C to +85°C −1 1 mA TA = −40°C to +125°C −1 2 mA ISB2 IL ILO Standby Current Input Leakage Current VIN = GND or VCC Output Leakage Current CS = VCC, VOUT = GND or VCC VIL Input Low Voltage −0.5 0.3 VCC V VIH Input High Voltage 0.7 VCC VCC + 0.5 V VOL1 Output Low Voltage VCC > 2.5 V, IOL = 3.0 mA 0.4 V VOH1 Output High Voltage VCC > 2.5 V, IOH = −1.6 mA VOL2 Output Low Voltage VCC > 1.8 V, IOL = 150 mA VOH2 Output High Voltage VCC > 1.8 V, IOH = −100 mA VCC − 0.8 V V 0.2 VCC − 0.2 V V V Table 4. PIN CAPACITANCE (Note 2) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V) Symbol COUT CIN Test Conditions Output Capacitance (SO) Input Capacitance (CS, SCK, SI, WP, HOLD) Max Units VOUT = 0 V 8 pF VIN = 0 V 8 pF http://onsemi.com 2 Min Typ CAT25256 Table 5. A.C. CHARACTERISTICS (TA = −40°C to +85°C (Industrial) and TA = −40°C to +125°C (Extended).) (Notes 4, 7) Symbol VCC = 1.8 V − 5.5 V / −405C to +855C VCC = 2.5 V − 5.5 V VCC = 2.5 V − 5.5 V / −405C to +1255C −405C to +855C Parameter Min Max Min Max Units 5 DC 10 MHz fSCK Clock Frequency DC tSU Data Setup Time 40 20 ns tH Data Hold Time 40 20 ns tWH SCK High Time 75 40 ns tWL SCK Low Time 75 40 ns tLZ HOLD to Output Low Z 50 25 ns tRI (Note 5) Input Rise Time 2 2 ms tFI (Note 5) Input Fall Time 2 2 ms tHD HOLD Setup Time 0 tCD HOLD Hold Time 10 tV 0 10 Output Valid from Clock Low tHO Output Hold Time tDIS Output Disable Time ns ns 75 0 40 0 ns ns 50 20 ns 100 25 ns tHZ HOLD to Output High Z tCS CS High Time 50 20 ns tCSS CS Setup Time 20 15 ns tCSH CS Hold Time 30 20 ns tCNS CS Inactive Setup Time 20 15 ns tCNH CS Inactive Hold Time 20 15 ns tWPS WP Setup Time 10 10 ns tWPH WP Hold Time 100 60 ns tWC (Note 6) Write Cycle Time 5 5 ms 4. AC Test Conditions: Input Pulse Voltages: 0.3 VCC to 0.7 VCC Input rise and fall times: ≤ 10 ns Input and output reference voltages: 0.5 VCC Output load: current source IOL max/IOH max; CL = 50 pF 5. This parameter is tested initially and after a design or process change that affects the parameter. 6. tWC is the time from the rising edge of CS after a valid write sequence to the end of the internal write cycle. 7. All Chip Select (CS) timing parameters are defined relative to the positive clock edge (Figure 2). tCSH timing specification is valid for die revision C and higher. The die revision C is identified by letter “C” or a dedicated marking code on top of the package. For previous product revision (Rev. B) the tCSH is defined relative to the negative clock edge (please refer to data sheet Doc. No. MD-1127 Rev. B). Table 6. POWER−UP TIMING (Notes 5, 8) Symbol Max Units tPUR Power−up to Read Operation Parameter 1 ms tPUW Power−up to Write Operation 1 ms 8. tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. http://onsemi.com 3 CAT25256 Pin Description pausing, it is recommended the HOLD input to be tied to VCC, either directly or through a resistor. SI: The serial data input pin accepts op−codes, addresses and data. In SPI modes (0,0) and (1,1) input data is latched on the rising edge of the SCK clock input. SO: The serial data output pin is used to transfer data out of the device. In SPI modes (0,0) and (1,1) data is shifted out on the falling edge of the SCK clock. SCK: The serial clock input pin accepts the clock provided by the host and used for synchronizing communication between host and CAT25256. CS: The chip select input pin is used to enable/disable the CAT25256. When CS is high, the SO output is tri−stated (high impedance) and the device is in Standby Mode (unless an internal write operation is in progress). Every communication session between host and CAT25256 must be preceded by a high to low transition and concluded with a low to high transition of the CS input. WP: The write protect input pin will allow all write operations to the device when held high. When WP pin is tied low and the WPEN bit in the Status Register (refer to Status Register description, later in this Data Sheet) is set to “1”, writing to the Status Register is disabled. HOLD: The HOLD input pin is used to pause transmission between host and CAT25256, without having to retransmit the entire sequence at a later time. To pause, HOLD must be taken low and to resume it must be taken back high, with the SCK input low during both transitions. When not used for Functional Description The CAT25256 device supports the Serial Peripheral Interface (SPI) bus protocol, modes (0,0) and (1,1). The device contains an 8−bit instruction register. The instruction set and associated op−codes are listed in Table 7. Reading data stored in the CAT25256 is accomplished by simply providing the READ command and an address. Writing to the CAT25256, in addition to a WRITE command, address and data, also requires enabling the device for writing by first setting certain bits in a Status Register, as will be explained later. After a high to low transition on the CS input pin, the CAT25256 will accept any one of the six instruction op−codes listed in Table 7 and will ignore all other possible 8−bit combinations. The communication protocol follows the timing from Figure 2. Table 7. INSTRUCTION SET Instruction Opcode Operation WREN 0000 0110 Enable Write Operations WRDI 0000 0100 Disable Write Operations RDSR 0000 0101 Read Status Register WRSR 0000 0001 Write Status Register READ 0000 0011 Read Data from Memory WRITE 0000 0010 Write Data to Memory tCS CS tCSS tCNH tWH tWL tCSH tCNS SCK tSU tH tRI tFI VALID IN SI tV tV tDIS tHO SO HI−Z VALID OUT Figure 2. Synchronous Data Timing http://onsemi.com 4 HI−Z CAT25256 Status Register The Status Register, as shown in Table 8, contains a number of status and control bits. The RDY (Ready) bit indicates whether the device is busy with a write operation. This bit is automatically set to 1 during an internal write cycle, and reset to 0 when the device is ready to accept commands. For the host, this bit is read only. The WEL (Write Enable Latch) bit is set/reset by the WREN/WRDI commands. When set to 1, the device is in a Write Enable state and when set to 0, the device is in a Write Disable state. The BP0 and BP1 (Block Protect) bits determine which blocks are currently write protected. They are set by the user with the WRSR command and are non−volatile. The user is allowed to protect a quarter, one half or the entire memory, by setting these bits according to Table 9. The protected blocks then become read−only. The WPEN (Write Protect Enable) bit acts as an enable for the WP pin. Hardware write protection is enabled when the WP pin is low and the WPEN bit is 1. This condition prevents writing to the status register and to the block protected sections of memory. While hardware write protection is active, only the non−block protected memory can be written. Hardware write protection is disabled when the WP pin is high or the WPEN bit is 0. The WPEN bit, WP pin and WEL bit combine to either permit or inhibit Write operations, as detailed in Table 10. Table 8. STATUS REGISTER 7 6 5 4 3 2 1 0 WPEN 0 0 0 BP1 BP0 WEL RDY Table 9. BLOCK PROTECTION BITS Status Register Bits BP1 BP0 Array Address Protected Protection 0 0 None No Protection 0 1 6000−7FFF Quarter Array Protection 1 0 4000−7FFF Half Array Protection 1 1 0000−7FFF Full Array Protection Table 10. WRITE PROTECT CONDITIONS WPEN WP WEL Protected Blocks Unprotected Blocks Status Register 0 X 0 Protected Protected Protected 0 X 1 Protected Writable Writable 1 Low 0 Protected Protected Protected 1 Low 1 Protected Writable Protected X High 0 Protected Protected Protected X High 1 Protected Writable Writable http://onsemi.com 5 CAT25256 WRITE OPERATIONS The CAT25256 device powers up into a write disable state. The device contains a Write Enable Latch (WEL) which must be set before attempting to write to the memory array or to the status register. In addition, the address of the memory location(s) to be written must be outside the protected area, as defined by BP0 and BP1 bits from the status register. instruction to the CAT25256. Care must be taken to take the CS input high after the WREN instruction, as otherwise the Write Enable Latch will not be properly set. WREN timing is illustrated in Figure 3. The WREN instruction must be sent prior to any WRITE or WRSR instruction. The internal write enable latch is reset by sending the WRDI instruction as shown in Figure 4. Disabling write operations by resetting the WEL bit, will protect the device against inadvertent writes. Write Enable and Write Disable The internal Write Enable Latch and the corresponding Status Register WEL bit are set by sending the WREN CS SCK 0 SI SO 0 0 0 0 1 1 0 HIGH IMPEDANCE Dashed Line = mode (1, 1) Figure 3. WREN Timing CS SCK SI SO 0 0 0 0 0 1 0 HIGH IMPEDANCE Dashed Line = mode (1, 1) Figure 4. WRDI Timing http://onsemi.com 6 0 CAT25256 Byte Write Page Write Once the WEL bit is set, the user may execute a write sequence, by sending a WRITE instruction, a 16−bit address and data as shown in Figure 5. Only 15 significant address bits are used by the CAT25256. The rest are don’t care bits, as shown in Table 11. Internal programming will start after the low to high CS transition. During an internal write cycle, all commands, except for RDSR (Read Status Register) will be ignored. The RDY bit will indicate if the internal write cycle is in progress (RDY high), or the device is ready to accept commands (RDY low). After sending the first data byte to the CAT25256, the host may continue sending data, up to a total of 64 bytes, according to timing shown in Figure 6. After each data byte, the lower order address bits are automatically incremented, while the higher order address bits (page address) remain unchanged. If during this process the end of page is exceeded, then loading will “roll over” to the first byte in the page, thus possibly overwriting previously loaded data. Following completion of the write cycle, the CAT25256 is automatically returned to the write disable state. While the internal write cycle is in progress, the RDSR command will output the RDY (Ready) bit status only (i.e., data out = FFh). Table 11. BYTE ADDRESS Device Address Significant Bits Address Don’t Care Bits # Address Clock Pulses A14 − A0 A15 16 CAT25256 CS 0 1 2 3 4 5 6 7 8 21 22 23 24 25 26 27 28 29 30 31 SCK OPCODE SI 0 0 0 0 0 0 DATA IN BYTE ADDRESS* 1 0 A0 D7 D6 D5 D4 D3 D2 D1 D0 AN HIGH IMPEDANCE SO Dashed Line = mode (1, 1) * Please check the Byte Address Table (Table 11) Figure 5. Byte WRITE Timing CS 0 1 2 3 4 5 6 7 8 21 SCK 0 0 0 0 0 0 23 24−31 32−39 24+(N−1)x8−1 .. 24+(N−1)x8 24+Nx8−1 BYTE ADDRESS* OPCODE SI 22 1 0 AN DATA IN A0 Data Data Data Byte 1 Byte 2 Byte 3 HIGH IMPEDANCE SO Dashed Line = mode (1, 1) Data Byte N 7..1 0 * Please check the Byte Address Table (Table 11) Figure 6. Page WRITE Timing http://onsemi.com 7 CAT25256 Write Status Register Write Protection The Status Register is written by sending a WRSR instruction according to timing shown in Figure 7. Only bits 2, 3 and 7 can be written using the WRSR command. The Write Protect (WP) pin can be used to protect the Block Protect bits BP0 and BP1 against being inadvertently altered. When WP is low and the WPEN bit is set to “1”, write operations to the Status Register are inhibited. WP going low while CS is still low will interrupt a write to the status register. If the internal write cycle has already been initiated, WP going low will have no effect on any write operation to the Status Register. The WP pin function is blocked when the WPEN bit is set to “0”. The WP input timing is shown in Figure 8. CS 0 1 2 3 4 5 6 7 8 9 10 11 1 7 6 5 4 12 13 14 15 2 1 0 SCK OPCODE SI 0 0 0 0 0 0 0 MSB HIGH IMPEDANCE SO Dashed Line = mode (1, 1) Figure 7. WRSR Timing tWPS tWPH CS SCK WP WP Dashed Line = mode (1, 1) Figure 8. WP Timing http://onsemi.com 8 DATA IN 3 CAT25256 READ OPERATIONS Read from Memory Array address, and the read cycle can be continued indefinitely. The read operation is terminated by taking CS high. To read from memory, the host sends a READ instruction followed by a 16−bit address (see Table 11 for the number of significant address bits). After receiving the last address bit, the CAT25256 will respond by shifting out data on the SO pin (as shown in Figure 9). Sequentially stored data can be read out by simply continuing to run the clock. The internal address pointer is automatically incremented to the next higher address as data is shifted out. After reaching the highest memory address, the address counter “rolls over” to the lowest memory Read Status Register To read the status register, the host simply sends a RDSR command. After receiving the last bit of the command, the CAT25256 will shift out the contents of the status register on the SO pin (Figure 10). The status register may be read at any time, including during an internal write cycle. While the internal write cycle is in progress, the RDSR command will output the RDY (Ready) bit status only (i.e., data out = FFh). CS 0 1 2 3 4 5 6 7 8 9 20 21 10 22 23 24 25 26 27 28 29 30 SCK OPCODE SI 0 0 0 0 0 0 BYTE ADDRESS* 1 1 A0 AN DATA OUT HIGH IMPEDANCE SO 7 Dashed Line = mode (1, 1) * Please check the Byte Address Table (Table 11) 6 5 4 3 2 1 0 MSB Figure 9. READ Timing CS 0 1 2 3 4 5 6 7 1 0 1 8 9 10 6 5 11 12 13 14 2 1 SCK OPCODE SI SO 0 0 0 0 0 DATA OUT HIGH IMPEDANCE 7 MSB Dashed Line = mode (1, 1) Figure 10. RDSR Timing http://onsemi.com 9 4 3 0 CAT25256 Hold Operation below the POR trigger level. This bi−directional POR behavior protects the device against ‘brown−out’ failure following a temporary loss of power. The CAT25256 device powers up in a write disable state and in a low power standby mode. A WREN instruction must be issued prior to any writes to the device. After power up, the CS pin must be brought low to enter a ready state and receive an instruction. After a successful byte/page write or status register write, the device goes into a write disable mode. The CS input must be set high after the proper number of clock cycles to start the internal write cycle. Access to the memory array during an internal write cycle is ignored and programming is continued. Any invalid op−code will be ignored and the serial output pin (SO) will remain in the high impedance state. The HOLD input can be used to pause communication between host and CAT25256. To pause, HOLD must be taken low while SCK is low (Figure 11). During the hold condition the device must remain selected (CS low). During the pause, the data output pin (SO) is tri−stated (high impedance) and SI transitions are ignored. To resume communication, HOLD must be taken high while SCK is low. Design Considerations The CAT25256 device incorporates Power−On Reset (POR) circuitry which protects the internal logic against powering up in the wrong state. The device will power up into Standby mode after VCC exceeds the POR trigger level and will power down into Reset mode when VCC drops CS tCD tCD SCK tHD tHD HOLD tHZ HIGH IMPEDANCE SO tLZ Dashed Line = mode (1, 1) Figure 11. HOLD Timing http://onsemi.com 10 CAT25256 PACKAGE DIMENSIONS PDIP−8, 300 mils CASE 646AA−01 ISSUE A SYMBOL MIN NOM A E1 5.33 A1 0.38 A2 2.92 3.30 4.95 b 0.36 0.46 0.56 b2 1.14 1.52 1.78 c 0.20 0.25 0.36 D 9.02 9.27 10.16 E 7.62 7.87 8.25 E1 6.10 6.35 7.11 e PIN # 1 IDENTIFICATION MAX 2.54 BSC eB 7.87 L 2.92 10.92 3.30 3.80 D TOP VIEW E A2 A A1 c b2 L e eB b SIDE VIEW END VIEW Notes: (1) All dimensions are in millimeters. (2) Complies with JEDEC MS-001. http://onsemi.com 11 CAT25256 PACKAGE DIMENSIONS SOIC 8, 150 mils CASE 751BD−01 ISSUE O E1 E SYMBOL MIN A 1.35 1.75 A1 0.10 0.25 b 0.33 0.51 c 0.19 0.25 D 4.80 5.00 E 5.80 6.20 E1 3.80 MAX 4.00 1.27 BSC e PIN # 1 IDENTIFICATION NOM h 0.25 0.50 L 0.40 1.27 θ 0º 8º TOP VIEW D h A1 θ A c e b L END VIEW SIDE VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with JEDEC MS-012. http://onsemi.com 12 CAT25256 PACKAGE DIMENSIONS SOIC−8, 208 mils CASE 751BE−01 ISSUE O SYMBOL MIN NOM A E1 E MAX 2.03 A1 0.05 0.25 b 0.36 0.48 c 0.19 0.25 D 5.13 5.33 E 7.75 8.26 E1 5.13 5.38 1.27 BSC e L 0.51 0.76 θ 0º 8º PIN#1 IDENTIFICATION TOP VIEW D A e b q L A1 SIDE VIEW c END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with EIAJ EDR-7320. http://onsemi.com 13 CAT25256 PACKAGE DIMENSIONS TSSOP8, 4.4x3 CASE 948AL−01 ISSUE O b SYMBOL MIN NOM A E1 E MAX 1.20 A1 0.05 A2 0.80 b 0.19 0.15 0.90 1.05 0.30 c 0.09 D 2.90 3.00 0.20 3.10 E 6.30 6.40 6.50 E1 4.30 4.40 4.50 e 0.65 BSC L 1.00 REF L1 0.50 θ 0º 0.60 0.75 8º e TOP VIEW D A2 c q1 A A1 L1 SIDE VIEW L END VIEW Notes: (1) All dimensions are in millimeters. Angles in degrees. (2) Complies with JEDEC MO-153. http://onsemi.com 14 CAT25256 PACKAGE DIMENSIONS TDFN8, 3x4.9 CASE 511AM−01 ISSUE A D A DETAIL A DAP SIZE 2.6 x 3.3mm E E2 PIN #1 IDENTIFICATION A1 PIN #1 IDENTIFICATION D2 TOP VIEW SIDE VIEW SYMBOL MIN NOM MAX A 0.70 0.75 0.80 A1 0.00 0.02 0.05 A2 0.45 0.55 0.65 A3 A2 A A1 0.25 0.30 0.35 D 2.90 3.00 3.10 D2 0.90 1.00 1.10 E 4.80 4.90 5.00 E2 0.90 1.00 1.10 e b L 0.65 TYP 0.50 0.60 A3 FRONT VIEW 0.20 REF b L BOTTOM VIEW e 0.70 DETAIL A Notes: (1) All dimensions are in millimeters. (2) Complies with JEDEC MO-229. http://onsemi.com 15 CAT25256 Example of Ordering Information (Note 11) Prefix Device # CAT 25256 Suffix V I −G Temperature Range Company ID Product Number 25256 I = Industrial (−40°C to +85°C) E = Extended (−40°C to +125°C) T3 Lead Finish G: NiPdAu Blank: Matte−Tin Tape & Reel (Note 16) T: Tape & Reel 2: 2,000 Units / Reel 3: 3,000 Units / Reel Package L: PDIP V: SOIC, JEDEC X: SOIC, EIAJ (Note 12) Y: TSSOP ZD2: TDFN (3 x 4.9 mm) (Note 13) CAA8: CSP (Note 14) 9. All packages are RoHS−compliant (Lead−free, Halogen−free). 10. The standard lead finish is NiPdAu. 11. The device used in the above example is a CAT25256VI−GT3 (SOIC, Industrial Temperature, NiPdAu, Tape & Reel, 3,000/Reel). 12. The SOIC, EIAJ (X) package is only available in 2000 pcs/reel and Matte−Tin lead finish, i.e., CAT25256XI−T2. 13. The TDFN 3 x 4.9 mm (ZD2) is only available in 2000 pcs/reel. 14. For the Chip Scale Package (CSP) dimensions and ordering details, please contact factory. 15. For additional package and temperature options, please contact your nearest ON Semiconductor Sales office. 16. For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. 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