5026 series Crystal Oscillator Module ICs OVERVIEW The 5026 series are miniature crystal oscillator module ICs. They feature a damping resistor RD matched to the crystal's characteristics to reduce crystal current. They support fundamental oscillation and 3rd overtone oscillation modes. The 5026 series can be used to correspond to wide range of applications. FEATURES ■ ■ ■ ■ ■ ■ Miniature-crystal matched oscillator characteristics Operating supply voltage range • 2.5V operation: 2.25 to 2.75V • 3.0V operation: 2.7 to 3.6V Recommended operating frequency range • For fundamental oscillator - 5026AL×: 20MHz to 50MHz - 5026BL1: 20MHz to 100MHz • For 3rd overtone oscillator - 5026ML×: 70MHz to 133MHz −40 to 85°C operating temperature range Oscillator capacitor with excellent frequency characteristics built-in Oscillator circuit with damping resistor RD builtin for reduced crystal current ■ ■ ■ ■ ■ ■ ■ ■ ■ Standby function • High impedance in standby mode, oscillator stops Low standby current • Power-saving pull-up resistor built-in Oscillation detector function Frequency divider built-in (5026AL×) • Varies with version: fO, fO/2, fO/4, fO/8, fO/16, fO/32 CMOS output duty level (1/2VDD) 50 ± 5% output duty @ 1/2VDD 30pF output load Molybdenum-gate CMOS process Chip form (CF5026×L×) SERIES CONFIGURATION Operating supply voltage range [V] Version Oscillation mode Recommended Output operating frequency current range (fundamental (VDD = 2.5V) oscillation)*1 [MHz] [mA] Standby mode Output frequency CF5026AL1 fO CF5026AL2 fO/2 CF5026AL3 2.25 to 3.6 Fundamental 20 to 50 4 fO/4 CF5026AL4 fO/8 CF5026AL5 fO/16 CF5026AL6 fO/32 CF5026BL1*2 2.25 to 3.6 Fundamental CF5026MLA CF5026MLB 20 to 100 Output duty level Oscillator stop function Output state CMOS Yes Hi-Z 8 fO CMOS Yes Hi-Z 8 fO CMOS Yes Hi-Z 70 to 80 2.25 to 3.6 3rd overtone CF5026MLC 80 to 100 90 to 133 *1. The recommended operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillator frequency band is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. The CF5026BL1 has a higher maximum operating frequency, hence the negative resistance is also larger than in the CF5026AL× devices. ORDERING INFORMATION Device Package CF5026×L×–3 Chip form SEIKO NPC CORPORATION —1 5026 series PAD LAYOUT (Unit: µm) HA5026 (750,850) Q Y VSS VDD INHN NPC XT XTN (0,0) X Chip size: 0.75 × 0.85mm Chip thickness: 180 ± 20µm PAD size: 90µm Chip base: VDD level PIN DESCRIPTION and PAD DIMENSIONS Pad dimensions [µm] Name I/O Description X Y INHN I Output state control input. High impedance when LOW (oscillator stops). Power-saving pull-up resistor built-in. 605 413 XT I Amplifier input 579 144 XTN O Amplifier output 171 144 VDD – Supply voltage 131 438 Q O Output. Output frequency determined by internal circuit to one of fO, fO/2, fO/4, fO/8, fO/16, fO/32. High impedance in standby mode 131 705 VSS – Ground 618 718 Crystal connection pins. Crystal is connected between XT and XTN. SEIKO NPC CORPORATION —2 5026 series BLOCK DIAGRAM For Fundamental Oscillator (5026AL×, 5026BL1) VDD VSS XTN CG CD RD XT Rf 1/2 1/2 1/2 1/2 1/2 Q INHN INHN = LOW active For 3rd Overtone Oscillator (5026ML×) VDD VSS XTN CG Rf 1 CD Cf RD XT Rf 2 Q INHN INHN = LOW active SEIKO NPC CORPORATION —3 5026 series SPECIFICATIONS Absolute Maximum Ratings VSS = 0V Parameter Symbol Condition Rating Unit Supply voltage range VDD −0.5 to +7.0 V Input voltage range VIN −0.5 to VDD + 0.5 V Output voltage range VOUT −0.5 to VDD + 0.5 V Operating temperature range Topr −40 to +85 °C Storage temperature range TSTG −65 to +150 °C Output current IOUT 20 mA Recommended Operating Conditions VSS = 0V Rating Parameter Operating supply voltage Symbol Condition Operating temperature Operating frequency*1 typ max 5026AL× CL ≤ 30pF 2.25 – 3.6 V 5026BL1 CL ≤ 30pF 2.25 – 3.6 V 5026MLA f ≤ 80MHz, CL ≤ 30pF 2.25 – 3.6 V 5026MLB f ≤ 100MHz, CL ≤ 30pF 2.25 – 3.6 V f ≤ 100MHz, CL ≤ 30pF 2.25 – 3.6 V f ≤ 133MHz, CL ≤ 15pF 2.25 – 3.6 V VIN VSS – VDD V TOPR −40 – +85 °C 5026AL× 20 – 50 MHz 5026BL1*2 20 – 100 MHz 5026MLA 70 – 80 MHz 5026MLB*2 80 – 100 MHz 5026MLC*2 90 – 133 MHz VDD 5026MLC Input voltage Unit min fO *1. The operating frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscillator frequency band is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. *2. When 2.5V operation, the ratings of switching characteristics are difference by the frequency or output load. Refer to “Switching Characteristics”. SEIKO NPC CORPORATION —4 5026 series Electrical Characteristics 5026AL× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.25V, IOH = 4mA 1.65 1.95 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.25V, IOL = 4mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD – – V LOW-level input voltage VIL INHN – – 0.3VDD V – 10 µA IZ Q: Measurement cct 2, INHN = LOW VOH = VDD – Output leakage current VOL = VSS – – 10 µA 5026AL1 – 7 14 mA 5026AL2 – 4.5 9 mA 5026AL3 – 3.5 7 mA 5026AL4 – 2.9 5.8 mA 5026AL5 – 2.5 5.0 mA 5026AL6 – 2.4 4.8 mA – – 3 µA 2 6 12 MΩ 20 100 200 kΩ Current consumption Standby current INHN pull-up resistance IDD2 IST RUP1 Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 50MHz Measurement cct 3, INHN = LOW Measurement cct 4 RUP2 Feedback resistance Rf Measurement cct 5 50 – 150 kΩ Oscillator amplifier output resistance RD Design value. A monitor pattern on a wafer is tested. 340 400 460 Ω 6.8 8 9.2 pF 8.5 10 11.5 pF Built-in capacitance CG CD Design value. A monitor pattern on a wafer is tested. SEIKO NPC CORPORATION —5 5026 series 5026AL× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.7V, IOH = 4mA 2.3 2.4 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.7V, IOL = 4mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD – – V LOW-level input voltage VIL INHN – – 0.3VDD V – 10 µA IZ Q: Measurement cct 2, INHN = LOW VOH = VDD – Output leakage current VOL = VSS – – 10 µA 5026AL1 – 8.5 17 mA 5026AL2 – 5.5 11 mA 5026AL3 – 4 8 mA 5026AL4 – 3.3 6.6 mA 5026AL5 – 2.9 5.8 mA 5026AL6 – 2.7 5.4 mA – – 5 µA 2 4 8 MΩ 15 75 150 kΩ Current consumption Standby current INHN pull-up resistance IDD2 IST RUP1 Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 50MHz Measurement cct 3, INHN = LOW Measurement cct 4 RUP2 Feedback resistance Rf Measurement cct 5 50 – 150 kΩ Oscillator amplifier output resistance RD Design value. A monitor pattern on a wafer is tested. 340 400 460 Ω 6.8 8 9.2 pF 8.5 10 11.5 pF Built-in capacitance CG CD Design value. A monitor pattern on a wafer is tested. SEIKO NPC CORPORATION —6 5026 series 5026BL1 (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.25V, IOH = 8mA 1.65 1.95 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.25V, IOL = 8mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD – – V LOW-level input voltage VIL INHN – – 0.3VDD V – 10 µA IZ Q: Measurement cct 2, INHN = LOW VOH = VDD – Output leakage current VOL = VSS – – 10 µA Current consumption IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 100MHz – 14 28 mA Standby current IST Measurement cct 3, INHN = LOW – – 3 µA 2 6 12 MΩ 20 100 200 kΩ INHN pull-up resistance RUP1 Measurement cct 4 RUP2 Feedback resistance Rf Measurement cct 5 50 – 150 kΩ Oscillator amplifier output resistance RD Design value. A monitor pattern on a wafer is tested. 170 200 230 Ω 6.8 8 9.2 pF 8.5 10 11.5 pF Built-in capacitance CG Design value. A monitor pattern on a wafer is tested. CD 5026BL1 (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA 2.3 2.4 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD – – V LOW-level input voltage VIL INHN – – 0.3VDD V – 10 µA IZ Q: Measurement cct 2, INHN = LOW VOH = VDD – Output leakage current VOL = VSS – – 10 µA Current consumption IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF, f = 100MHz – 19 38 mA Standby current IST Measurement cct 3, INHN = LOW – – 5 µA 2 4 8 MΩ 15 75 150 kΩ INHN pull-up resistance RUP1 Measurement cct 4 RUP2 Feedback resistance Rf Measurement cct 5 50 – 150 kΩ Oscillator amplifier output resistance RD Design value. A monitor pattern on a wafer is tested. 170 200 230 Ω 6.8 8 9.2 pF 8.5 10 11.5 pF Built-in capacitance CG CD Design value. A monitor pattern on a wafer is tested. SEIKO NPC CORPORATION —7 5026 series 5026ML× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.25V, IOH = 8mA 1.65 1.95 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.25V, IOL = 8mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD – – V LOW-level input voltage VIL INHN – – 0.3VDD V – 10 µA IZ Q: Measurement cct 2, INHN = LOW VOH = VDD – Output leakage current VOL = VSS – – 10 µA f = 133MHz 5026MLC – 15 30 mA f = 72MHz 5026MLA – 11 22 mA f = 100MHz 5026MLB – 15 30 mA f = 100MHz 5026MLC – 15 30 mA – – 3 µA 2 6 12 MΩ 20 100 200 kΩ 5026MLA 3.99 4.7 5.41 kΩ 5026MLB 2.29 2.70 3.11 kΩ 5026MLC 2.97 3.5 4.03 kΩ IDD1 Measurement cct 3, load cct 1, INHN = open, CL = 15pF IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF Current consumption Standby current INHN pull-up resistance IST RUP1 Measurement cct 3, INHN = LOW Measurement cct 4 RUP2 AC feedback resistance Rf1 Design value. A monitor pattern on a wafer is tested. DC feedback resistance Rf2 Measurement cct 5 50 – 150 kΩ Oscillator amplifier output resistance RD Design value. A monitor pattern on a wafer is tested. 85 100 115 Ω AC feedback capacitance Cf Design value. A monitor pattern on a wafer is tested. 8.5 10 11.5 pF 5026MLA 1.70 2 2.30 pF CG Design value. A monitor pattern on a wafer is tested. 5026MLB 1.70 2 2.30 pF 5026MLC 0.85 1 1.15 pF 5026MLA 3.40 4 4.60 pF 5026MLB 3.40 4 4.60 pF 5026MLC 3.40 4 4.60 pF Built-in capacitance CD Design value. A monitor pattern on a wafer is tested. SEIKO NPC CORPORATION —8 5026 series 5026ML× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol Condition Unit min typ max HIGH-level output voltage VOH Q: Measurement cct 1, VDD = 2.7V, IOH = 8mA 2.3 2.4 – V LOW-level output voltage VOL Q: Measurement cct 2, VDD = 2.7V, IOL = 8mA – 0.3 0.4 V HIGH-level input voltage VIH INHN 0.7VDD – – V LOW-level input voltage VIL INHN – – 0.3VDD V – 10 µA IZ Q: Measurement cct 2, INHN = LOW VOH = VDD – Output leakage current VOL = VSS – – 10 µA f = 133MHz 5026MLC – 20 40 mA f = 72MHz 5026MLA – 15 30 mA f = 100MHz 5026MLB – 20 40 mA f = 100MHz 5026MLC – 20 40 mA – – 5 µA 2 4 8 MΩ 15 75 150 kΩ 5026MLA 3.99 4.7 5.41 kΩ 5026MLB 2.29 2.70 3.11 kΩ 5026MLC 2.97 3.5 4.03 kΩ IDD1 Measurement cct 3, load cct 1, INHN = open, CL = 15pF IDD2 Measurement cct 3, load cct 1, INHN = open, CL = 30pF Current consumption Standby current INHN pull-up resistance IST RUP1 Measurement cct 3, INHN = LOW Measurement cct 4 RUP2 AC feedback resistance Rf1 Design value. A monitor pattern on a wafer is tested. DC feedback resistance Rf2 Measurement cct 5 50 – 150 kΩ Oscillator amplifier output resistance RD Design value. A monitor pattern on a wafer is tested. 85 100 115 Ω AC feedback capacitance Cf Design value. A monitor pattern on a wafer is tested. 8.5 10 11.5 pF 5026MLA 1.70 2 2.30 pF CG Design value. A monitor pattern on a wafer is tested. 5026MLB 1.70 2 2.30 pF 5026MLC 0.85 1 1.15 pF 5026MLA 3.40 4 4.60 pF 5026MLB 3.40 4 4.60 pF 5026MLC 3.40 4 4.60 pF Built-in capacitance CD Design value. A monitor pattern on a wafer is tested. SEIKO NPC CORPORATION —9 5026 series Switching Characteristics 5026AL× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Output rise time Symbol tr1 tr2 Output fall time tf1 tf2 Output duty cycle*1 Duty1 Duty2 Output disable delay time*2 tPLZ Output enable delay time*2 tPZL Condition Unit min typ max Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD CL = 15pF – 3 6 ns CL = 30pF – 5 10 ns Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD CL = 15pF – 3 6 ns CL = 30pF – 5 10 ns Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C, f = 50MHz CL = 15pF 45 – 55 % CL = 30pF 45 – 55 % – – 100 ns – – 100 ns Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. 5026AL× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Output rise time Symbol tr1 tr2 Output fall time tf1 tf2 Output duty cycle*1 Duty1 Duty2 Output disable delay time*2 tPLZ Output enable delay time*2 tPZL Condition Unit min typ max Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD CL = 15pF – 2.5 5 ns CL = 30pF – 4.5 9 ns Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD CL = 15pF – 2.5 5 ns CL = 30pF – 4.5 9 ns Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, f = 50MHz CL = 15pF 45 – 55 % CL = 30pF 45 – 55 % – – 100 ns – – 100 ns Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. SEIKO NPC CORPORATION —10 5026 series 5026BL1 (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Symbol tr1 Output rise time tr2 tr3 tf1 Output fall time tf2 tf3 Condition Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD Measurement cct 3, load cct 1, 0.2VDD to 0.8VDD Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD Measurement cct 3, load cct 1, 0.8VDD to 0.2VDD Duty1 Output duty cycle*1 Duty2 Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C Duty3 Output disable delay time*2 tPLZ Output enable delay time*2 tPZL Unit min typ max CL = 15pF – 2 4 ns CL = 30pF – 3 6 ns CL = 30pF – 2.5 5 ns CL = 15pF – 2 4 ns CL = 30pF – 3 6 ns CL = 30pF – 2.5 5 ns CL = 15pF f = 100MHz 45 – 55 % CL = 30pF f = 80MHz 45 – 55 % CL = 30pF f = 100MHz 40 – 60 % – – 100 ns – – 100 ns Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. 5026BL1 (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Rating Parameter Output rise time Symbol tr1 tr2 Output fall time tf1 tf2 Output duty cycle*1 Duty1 Duty2 Output disable delay time*2 tPLZ Output enable delay time*2 tPZL Condition Unit min typ max Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD CL = 15pF – 1.5 3 ns CL = 30pF – 2.5 5 ns Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD CL = 15pF – 1.5 3 ns CL = 30pF – 2.5 5 ns Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, f = 100MHz CL = 15pF 45 – 55 % CL = 30pF 45 – 55 % – – 100 ns – – 100 ns Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. SEIKO NPC CORPORATION —11 5026 series 5026ML× (2.5V operation) VDD = 2.25 to 2.75V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter Output rise time Output fall time Symbol tr1 tr2 tf1 tf2 Duty1 Output disable delay time*2 tPLZ Output enable delay time*2 tPZL min typ max Unit Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD CL = 15pF – 2 4 ns CL = 30pF – 3 6 ns Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD CL = 15pF – 2 4 ns Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF Output duty cycle*1 Duty2 Rating Condition Measurement cct 3, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 30pF CL = 30pF – 3 6 ns f = 72MHz 5026MLA 45 – 55 % f = 100MHz 5026MLB 45 – 55 % f = 133MHz 5026MLC 45 – 55 % f = 72MHz 5026MLA 45 – 55 % f = 100MHz 5026MLB 40 – 60 % f = 100MHz 5026MLC 40 – 60 % – – 100 ns – – 100 ns Measurement cct 6, load cct 1, VDD = 2.5V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. 5026ML× (3.0V operation) VDD = 2.7 to 3.6V, VSS = 0V, Ta = −40 to +85°C unless otherwise noted. Parameter Output rise time Output fall time Symbol tr1 tr2 tf1 tf2 Duty1 Output duty cycle*1 Duty2 tPLZ Output enable delay time*2 tPZL min typ max Unit Measurement cct 3, load cct 1, 0.1VDD to 0.9VDD CL = 15pF – 1.5 3 ns CL = 30pF – 2.5 5 ns Measurement cct 3, load cct 1, 0.9VDD to 0.1VDD CL = 15pF – 1.5 3 ns Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF Measurement cct 3, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 30pF CL = 30pF – 2.5 5 ns f = 72MHz 5026MLA 45 – 55 % f = 100MHz 5026MLB 45 – 55 % f = 133MHz 5026MLC 45 – 55 % f = 72MHz 5026MLA 45 – 55 % f = 100MHz 5026MLB 45 – 55 % 5026MLC 45 – 55 % – – 100 ns – – 100 ns Measurement cct 3, load cct 1, VDD = 3.3V, Ta = 25°C, CL = 30pF, f = 100MHz Output disable delay time*2 Rating Condition Measurement cct 6, load cct 1, VDD = 3.0V, Ta = 25°C, CL = 15pF *1. The duty cycle characteristic is checked the sample chips of each production lot. *2. Oscillator stop function is built-in. When INHN goes LOW, normal output stops. When INHN goes HIGH, normal output is not resumed until after the oscillator start-up time has elapsed. SEIKO NPC CORPORATION —12 5026 series Current consumption and Output waveform with NPC’s standard crystal Cb L Ca f [MHz] R [Ω] L [mH] Ca [fF] Cb [pF] 50 16.12 6.88 1.48 1.18 72 − − − − 100 − − − − R Note. The 72MHz and 100MHz crystal parameters are confidential. FUNCTIONAL DESCRIPTION Standby Function When INHN goes LOW, the oscillator stops and the oscillator output on Q becomes high impedance. Version INHN 5026AL× HIGH (or open) 5026BL1, ML× 5026AL×, BL1, ML× Q Oscillator Any fO, fO/2, fO/4, fO/8, fO/16 or fO/32 output frequency Normal operation fO LOW High impedance Stopped Power-saving Pull-up Resistor The INHN pull-up resistance changes in response to the input level (HIGH or LOW). When INHN goes LOW (standby state), the pull-up resistance becomes large to reduce the current consumption during standby. SEIKO NPC CORPORATION —13 5026 series MEASUREMENT CIRCUITS Measurement cct 1 Measurement cct 4 C1 Signal Generator VDD XT VDD XT Q XTN INHN R1 Q VSS XTN INHN R2 VSS V VPR VDD VOH 0V Q output 2Vp-p, 10MHz sine wave input signal C1: 0.001µF R1: 50Ω R2: 5026AL× : 412Ω (2.5V operation) 575Ω (3.0V operation) 5026BL1, ML× : 206Ω (2.5V operation) 287Ω (3.0V operation) IPR RUP1 = VDD IPR (VPR = V SS) RUP2 = VDD VPR IPR (VPR = 0.7VDD) A Measurement cct 5 Measurement cct 2 VDD XT Rf = Q XTN INHN IZ, IOL XT VDD IZ VSS V VDD IRf A A Q XTN INHN Rf 2 = VSS VDD IRf IRf VOH VOL Measurement cct 6 Signal Generator Measurement cct 3 C1 Q R1 A XT VDD XT XTN INHN VSS IDD IST VDD X'tal Q XTN INHN VSS 2Vp-p, 10MHz sine wave input signal C1: 0.001µF R1: 50Ω Load cct 1 Q output CL (Including probe capacitance) SEIKO NPC CORPORATION —14 5026 series Switching Time Measurement Waveform Output duty level, tr, tf 0.9VDD 0.8VDD 0.9VDD 0.8VDD Q output 0.2VDD 0.1VDD 0.2VDD 0.1VDD TW tr3 DUTY measurement voltage (0.5V DD ) tf3 tr1,tr2 tf1,tf2 Output duty cycle DUTY measurement voltage (0.5V DD) Q output TW DUTY= TW/ T T 100 (%) Output Enable/Disable Delay when the device is in standby, the oscillator stops. When standby is released, the oscillator starts and stable oscillator output occurs after a short delay. VIH INHN VIL tPLZ tPZL INHN input waveform tr = tf 10ns Q output SEIKO NPC CORPORATION —15 5026 series Please pay your attention to the following points at time of using the products shown in this document. The products shown in this document (hereinafter “Products”) are not intended to be used for the apparatus that exerts harmful influence on human lives due to the defects, failure or malfunction of the Products. Customers are requested to obtain prior written agreement for such use from SEIKO NPC CORPORATION (hereinafter “NPC”). Customers shall be solely responsible for, and indemnify and hold NPC free and harmless from, any and all claims, damages, losses, expenses or lawsuits, due to such use without such agreement. NPC reserves the right to change the specifications of the Products in order to improve the characteristic or reliability thereof. NPC makes no claim or warranty that the contents described in this document dose not infringe any intellectual property right or other similar right owned by third parties. Therefore, NPC shall not be responsible for such problems, even if the use is in accordance with the descriptions provided in this document. Any descriptions including applications, circuits, and the parameters of the Products in this document are for reference to use the Products, and shall not be guaranteed free from defect, inapplicability to the design for the mass-production products without further testing or modification. Customers are requested not to export or re-export, directly or indirectly, the Products to any country or any entity not in compliance with or in violation of the national export administration laws, treaties, orders and regulations. Customers are requested appropriately take steps to obtain required permissions or approvals from appropriate government agencies. SEIKO NPC CORPORATION 15-6, Nihombashi-kabutocho, Chuo-ku, Tokyo 103-0026, Japan Telephone: +81-3-6667-6601 Facsimile: +81-3-6667-6611 http://www.npc.co.jp/ Email: [email protected] NC0413CE 2008.12 SEIKO NPC CORPORATION —16