EVERLIGHT ELSD

Technical Data Sheet
0.56" Dual Digit SMD Displays
ELSD-512SYGWA/S530-E2
Features
˙Packaged in tape and reel for SMT manufacturing.
˙Design flexibility(common cathode or anode).
˙Categorized for luminous intensity.
˙The thickness is thinness than tradition display.
˙Pb free
˙The product itself will remain with RoHS compliant
version.
Descriptions
˙The SMD type is much smaller than tradition
type components, thus enable smaller board
size, higher packing density, reduced storage space
and finally smaller equipment to be obtained.
Applications
˙Suitable for indoor use.
˙Audio system.
˙Set top box.
˙Game machine.
˙Channel indicator of TV.
Device Selection Guide
Chip
Face Color
Material
Emitted Color
AlGaInP
Brilliant Yellow Green
Everlight Electronics Co., Ltd.
Device No.: CDGD-512-004
http://www.everlight.com
Prepared date:2007/5/7
Gray
Rev.
2
Page: 1 of 6
Prepared by: Li Jing jing
ELSD-512SYGWA/S530-E2
Package Dimensions
Land Pattern(Recommend)
Notes:
˙All dimensions are in millimeters, tolerance is 0.25mm unless otherwise noted.
˙Above specification may be changed without notice. Supplier will reserve
authority on material change for above specification.
Absolute Maximum Ratings (Ta=25℃)
Parameter
Forward Current
Pulse Forward Current*1
Symbol
IF
IFP
Rating
25
60
Operating Temperature
Topr
-40 ~ +85
Units
mA
mA
℃
Storage Temperature
Tstg
-40 ~ +85
℃
Reflow Temperature
Tref
260
℃
Electrostatic Discharge
Power Dissipation
Reverse Voltage
ESD
Pd
VR
2000
60
5
V
mW
V
Notes: *1:IFP Conditions--Pulse Width≦10msec and Duty≦1/10.
*2:Reflow time≦5 seconds.
Everlight Electronics Co., Ltd.
Device No.: CDGD-512-004
http://www.everlight.com
Prepared date:2007/5/7
Rev.
2
Page: 2 of 6
Prepared by: Li Jing jing
ELSD-512SYGWA/S530-E2
Electro-Optical Characteristics (Ta=25℃)
Parameter
Symbol
Min.
Typ.
Max.
Units
Condition
Forward Voltage
VF
--
2.0
2.4
V
IF=20mA
Reverse Current
IR
--
--
10
μA
VR=5V
4.0
9.6
-mcd
IF=10mA
Luminous Per segment
Intensity Per decimal
point
IV
2.0
3.9
--
Peak Wavelenght
λp
--
575
--
nm
IF=20mA
Dominant Wavelenght
λd
--
573
--
nm
IF=20mA
Spectrum Radiation
Bandwidth
△λ
--
20
--
nm
IF=20mA
Chromaticity Coordinates Specifications for Bin Grading (Unit: mcd)
Rank
Min.
Max.
Rank
Min.
Max.
N
4.0
6.4
T
21.0
34.0
P
5.6
8.9
U
30.0
48.0
Q
7.8
12.5
V
42.0
67.0
R
11.0
17.6
W
59.0
94.0
S
15.0
24.0
---
---
---
Everlight Electronics Co., Ltd.
Device No.: CDGD-512-004
http://www.everlight.com
Prepared date:2007/5/7
Rev.
2
Page: 3 of 6
Prepared by: Li Jing jing
ELSD-512SYGWA/S530-E2
Typical Electro-Optical Characteristics Curves
Everlight Electronics Co., Ltd.
Device No.: CDGD-512-004
http://www.everlight.com
Prepared date:2007/5/7
Rev.
2
Page: 4 of 6
Prepared by: Li Jing jing
ELSD-512SYGWA/S530-E2
■ Reflow Temp. / Time :
■ Soldering Iron :
Basic spec is ≦5 sec when 260℃.If temperature is higher, time should be shorter (+10℃
→ -1sec). Power dissipation of iron should be smaller than 15 W , and temperature should
be controllable. Surface temperature of the device should be under 230 ℃.
■ Rework :
1. Customer must finish rework within 5 sec under 260℃.
2. The head of iron can not touch copper foil.
Everlight Electronics Co., Ltd.
Device No.: CDGD-512-004
http://www.everlight.com
Prepared date:2007/5/7
Rev.
2
Page: 5 of 6
Prepared by: Li Jing jing
ELSD-512SYGWA/S530-E2
■ Reliability test items and conditions:
The reliability of products shall be satisfied with items listed below.
Confidence level:90%
LTPD:10%
Failure
Judgment
Criteria
NO
Item
Test
Conditions
Test
Hours/Cycle
Sample
Size
1
Reflow
Soldering
TEMP:260°C±5°C
Min. 5 SEC
6 Min
22 PCS
0/1
Temperature
Cycle
H:+100°C 15min
∫ 5min
L:-40°C 15min
300 CYCLES
22 PCS
0/1
Thermal
Shock
H:+100°C 5min
∫ 10 sec
L:-10°C 5min
300 CYCLES
22 PCS
0/1
2
3
Ac/Re
Iv≦Ivt*0.5
or
VF≧U
or
VF≦L
4
High
Temperature
Storage
TEMP:100°C
1000 HRS
22PCS
5
Low
Temperature
Storage
TEMP:-40°C
1000 HRS
22 PCS
DC Operating
Life
TEMP:25°C
If=10mA
1000 HRS
22 PCS
0/1
85°C / 85% RH
1000 HRS
22 PCS
0/1
6
7
High
Temperature /
High
Humidity
Note:Ivt:The test Iv value of the chip before the reliablility test
Iv:The test value of the chip that has completed the reliablility test
U:Upper Specification Limit
L: Lower Specification Limit
Everlight Electronics Co., Ltd.
Device No.: CDGD-512-004
http://www.everlight.com
Prepared date:2007/5/7
Rev.
2
Page: 6 of 6
Prepared by: Li Jing jing
0/1
0/1