ETC HY57V168010DTC-10

HY57V168010D
2 Banks x 1M X 8 Bit Synchronous DRAM
DESCRIPTION
The Hyundai HY57V168010D is a 16,777,216-bits CMOS Synchronous DRAM, ideally suited for the main memory
applications which require large memory density and high bandwidth. HY57V168010D is organized as 2banks of
1,048,576x8.
HY57V168010D is offering fully synchronous operation referenced to a positive edge clock. All inputs and outputs are
synchronized with the rising edge of the clock input. The data paths are internally pipelined to achieve very high bandwidth. All input and output voltage levels are compatible with LVTTL.
Programmable options include the length of pipeline (Read latency of 1,2 or 3), the number of consecutive read or
write cycles initiated by a single control command (Burst length of 1,2,4,8 or full page), and the burst count
sequence(sequential or interleave). A burst of read or write cycles in progress can be terminated by a burst terminate
command or can be interrupted and replaced by a new burst read or write command on any cycle. (This pipeline
design is not restricted by a `2N` rule.)
FEATURES
•
Single 3.3V ± 0.3V power supply
•
Auto refresh and self refresh
•
All device pins are compatible with LVTTL interface
•
4096 refresh cycles / 64ms
•
JEDEC standard 400mil 44pin TSOP-II with 0.8mm
of pin pitch
•
Programmable Burst Length and Burst Type
•
All inputs and outputs referenced to positive edge of
system clock
•
Data mask function by DQM
•
Internal two banks operation
- 1, 2, 4, 8 and Full Page for Sequence Burst
- 1, 2, 4 and 8 for Interleave Burst
•
Programmable CAS Latency ; 1, 2, 3 Clocks
ORDERING INFORMATION
Part No.
Clock Frequency
HY57V168010DTC-8
125MHz
HY57V168010DTC-10P
100MHz
HY57V168010DTC-10S
100MHz
HY57V168010DTC-10
100MHz
Organization
Interface
Package
2Banks x 1Mbits x 8
LVTTL
400mil
44pin TSOP II
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied
Rev. 1.5/Dec.98
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HY57V168010D
PIN CONFIGURATION
VDD
DQ0
VSSQ
DQ1
VDDQ
DQ2
VSSQ
DQ3
VDDQ
NC
NC
WE
CAS
RAS
CS
BA
A10/AP
A0
A1
A2
A3
VDD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44pin TSOP II
400mil x 725mil
0.8mm pin pitch
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
VSS
DQ7
VSSQ
DQ6
VDDQ
DQ5
VSSQ
DQ4
VDDQ
NC
NC
DQM
CLK
CKE
NC
A9
A8
A7
A6
A5
A4
VSS
PIN DESCRIPTION
PIN
PIN NAME
DESCRIPTION
CLK
Clock
The system clock input. All other inputs are referenced to the SDRAM on the
rising edge of CLK.
CKE
Clock Enable
Controls internal clock signal and when deactivated, the SDRAM will be one
of the states among power down, suspend or self refresh.
CS
Chip Select
Command input enable or mask except CLK, CKE and DQM
BA
Bank Address
Select either one of banks during both RAS and CAS activity.
A0 ~ A10
Address
Row Address : RA0 ~ RA10, Column Address : CA0 ~ CA8
Auto-precharge flag : A10
RAS, CAS, WE
Row Address Strobe,
Column Address Strobe,
Write Enable
RAS, CAS and WE define the operation.
Refer function truth table for details
DQM
Data Input/Output Mask
DQM control output buffer in read mode and mask input data in write mode
DQ0 ~ DQ7
Data Input/Output
Multiplexed data input / output pin
VDD/VSS
Power Supply/Ground
Power supply for internal circuit and input buffer
VDDQ/VSSQ
Data Output Power/Ground
Power supply for DQ
NC
No Connection
No connection
Rev. 1.5/Dec.98
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2
HY57V168010D
FUNCTIONAL BLOCK DIAGRAM
2Mx8 Synchronous DRAM
Self Refresh Counter
Refresh
Interval Timer
Refresh
Counter
1Mx8
Bank 0
Address[0:10]
Sense AMP & I/O gates
Column Decoder
CLK
CKE
Precharge
Row Active
Address
Register
DQ0
BA(A11)
CS
DQ1
RAS
CAS
Column Addr.
Latch & Counter
Column Active
Burst Length
Counter
DQ2
DQ3
Overflow
DQ4
DQ5
WE
DQ6
DQ7
DQM
Column Decoder
Sense AMP & I/O gates
1Mx8
Bank 1
Mode Register
Rev. 1.5/Dec.98
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Test Mode
I/O Control
3
HY57V168010D
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Rating
Unit
Ambient Temperature
TA
0 ~ 70
°C
Storage Temperature
TSTG
-55 ~ 125
°C
Voltage on Any Pin relative to VSS
VIN, VOUT
-1.0 ~ 4.6
V
Voltage on VDD relative to VSS
VDD
-1.0 ~ 4.6
V
Short Circuit Output Current
IOS
50
mA
Power Dissipation
PD
1
W
Soldering Temperature·Time
TSOLDER
260·10
°C ·Sec
Note : Operation at above absolute maximun rating can adversely affect device reliability.
DC OPERATING CONDITION (TA=0°C to 70°C)
Parameter
Symbol
Min
Typ.
Max
Unit
Note
Power Supply Voltage
VDD, VDDQ
3.0
3.3
3.6
V
1
Input high voltage
VIH
2.0
3.0
VDD + 0.3
V
1, 2
Input low voltage
VIL
-0.5
0
0.8
V
1, 3
Note
Note :
1.All voltages are referenced to V SS = 0V.
2.VIH(max) is acceptable 4.6V AC pulse width with ≤ 10ns of duration.
3.VIL(min) is acceptable -1.5V AC pulse width with ≤ 10ns of duration.
AC OPERATING CONDITION (TA=0°C to 70°C, VDD=3.3V ± 0.3V, VSS=0V)
Parameter
Symbol
Value
Unit
AC input high / low level voltage
VIH / VIL
2.4/0.4
V
Vtrip
1.4
V
Input rise / fall time
tR / tF
1
ns
Output timing measurement reference level
Voutref
1.4
V
CL
50
pF
Input timing measurement reference level voltage
Output load capacitance for access time measurement
1
Note :
1. Output load to measure access times (tAC, tOH, etc) varies to clock frequency.
A load is equivalent to one TTL gate and one capacitance.
Rev. 1.5/Dec.98
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4
HY57V168010D
CAPACITANCE (TA=25°C, f=1MHz)
Parameter
Pin
Symbol
Min
Max
Unit
CLK
CI1
2.5
4
pF
Input capacitance
A0 ~ A10, BA
CKE, CS, RAS, CAS, WE,DQM
CI2
2.5
5
pF
Data input / output capacitance
DQ0 ~ DQ7
CI/O
4
6.5
pF
OUTPUT LOAD CIRCUIT
Vtt=1.4V
RT=250 Ω
Output
Output
50pF
50pF
DC Output Load Circuit
AC Output Load Circuit
DC CHARACTERISTICS I (TA=0°C to 70°C, VDD=3.3V ± 0.3V)
Parameter
Symbol
Min.
Max
Unit
Note
Input leakage current
IL
-1
1
uA
1
Output leakage current
IO
-1
1
uA
2
Output high voltage
VOH
2.4
-
V
IOH = -4mA
Output low voltage
VOL
-
0.4
V
IOL =+4mA
Note :
1.VIN = 0 to 3.6V, All other pins are not under test = 0V
2.DOUT is disabled, V OUT=0 to 3.6V
Rev. 1.5/Dec.98
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HY57V168010D
DC CHARACTERISTICS II (TA=0°C to 70°C, VDD=3.3V ± 0.3V, VSS=0V)
Speed
Parameter
Symbol
Test Condition
-8
-10P
-10S
-10
110
110
110
90
IDD1
Burst Length=1, One bank active
tRAS ≥ tRAS(min),tRP ≥ tRP(min), IO=0mA
IDD2P
CKE ≤ VIL(max), tCK = min.
1
IDD2PS
CKE ≤ VIL(max), tCK = ∞
1
IDD2N
CKE ≥ VIH(min), CS ≥ VIH(min), tCK = min
Input signals are changed one time during
2Clks. All other pins ≥ VDD-0.2V or ≤ 0.2V
20
IDD2NS
CKE ≥ VIH(min), tCK = ∞
Input signals are stable.
15
IDD3P
CKE ≤ VIL(max), tCK = min
30
IDD3PS
CKE ≤ VIL(max), tCK = ∞
30
IDD3N
CKE ≥ VIH(min), CS ≥ VIH(min), tCK = min
Input signals are changed one time during
2CLKs. All other pins ≥ VDD-0.2V or ≤ 0.2V
50
IDD3NS
CKE ≥ VIH(min), tCK = ∞
Input signals are stable
30
Burst Mode Operating
Current
IDD4
tCK ≥ tCK(min),
tRAS ≥ tRAS(min), IO=0mA
All banks active
Auto Refresh Current
IDD5
tRRC ≥ tRRC(min), All banks active
Self Refresh Current
IDD6
CKE ≤ 0.2V
Operating Current
Precharge Standby Current
in power down mode
Precharge Standby Current
in non power down mode
Active Standby Current
in power down mode
Active Standby Current
in non power down mode
Unit
Note
mA
1
mA
mA
mA
mA
CL=3
110
90
90
75
CL=2
90
75
75
65
110
110
110
90
mA
2
1
mA
mA
Note :
1.IDD1 and I DD4 depend on output loading and cycle rates. Specified values are measured with the output open.
Rev. 1.5/Dec.98
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HY57V168010D
AC CHARACTERISTICS I (TA=0°C to 70°C, VDD=3.3V ± 0.3V, VSS=0V)
-8
Paramter
-10P
-10S
-10
Symbol
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Note
CAS Latency = 3
tCK3
8
-
10
-
10
-
10
-
CAS Latency = 2
tCK2
10
-
10
-
12
-
10
-
Clock high pulse width
tCHW
3
-
3
-
3
-
3
-
ns
1
Clock low pulse width
tCLW
3
-
3
-
3
-
3
-
ns
1
CAS Latency = 3
tAC3
-
6
-
6
-
6
-
8
CAS Latency = 2
tAC2
-
6
-
6
-
6
-
8
Data-out hold time
tOH
3
-
3
-
3
-
3
-
ns
Data-Input setup time
tDS
2
-
2
-
2
-
3
-
ns
1
Data-Input hold time
tDH
1
-
1
-
1
-
1
-
ns
1
Address setup time
tAS
2
-
2
-
2
-
3
-
ns
1
Address hold time
tAH
1
-
1
-
1
-
1
-
ns
1
CKE setup time
tCKS
2
-
2
-
2
-
3
-
ns
1
CKE hold time
tCKH
1
-
1
-
1
-
1
-
ns
1
Command setup time
tCS
2
-
2
-
2
-
3
-
ns
1
Command hold time
tCH
1
-
1
-
1
-
1
-
ns
1
CLK to data output in low Z-time
tOLZ
2
-
2
-
2
-
2
-
ns
CAS Latency = 3
tOHZ3
2
9
3
9
3
9
3
10
ns
CAS Latency = 2
tOHZ2
2
9
3
9
3
9
3
10
ns
System clock
cycle time
Access time
from clock
CLK to data output
in high Z-time
ns
ns
Note :
1.Assume tR / tF (input rise and fall time ) is 1ns.
2.Access times to be measured with input signals of 1V/ns edge rate, 0.8V to 2.0V
Rev. 1.5/Dec.98
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HY57V168010D
AC CHARACTERISTICS II (TA=0°C to 70°C, VDD=3.3V ± 0.3V, VSS=0V)
-8
Parameter
-10P
-10S
-10
Symbol
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Operation
tRC
70
-
70
-
70
-
80
-
ns
Auto Refresh
tRRC
70
-
70
-
70
-
80
-
ns
RAS to CAS delay
tRCD
20
-
20
-
20
-
20
-
ns
RAS active time
tRAS
50
100K
50
100K
50
100K
50
100K
ns
RAS precharge time
tRP
20
-
20
-
20
-
30
-
ns
RAS to RAS bank active delay
tRRD
20
-
20
-
20
-
20
-
ns
CAS to CAS bank active delay
tCCD
1
-
1
-
1
-
1
-
CLK
Write command to data-in delay
tWTL
0
-
0
-
0
-
0
-
CLK
Data-in to precharge command
tDPL
1
-
1
-
1
-
1
-
CLK
Data-in to active command
tDAL
4
-
3
-
3
-
3
-
CLK
DQM to data-in Hi-Z
tDQZ
2
-
2
-
2
-
2
-
CLK
DQM to data mask
tDQM
0
-
0
-
0
-
0
-
CLK
MRS to new command
tMRD
2
-
2
-
2
-
2
-
CLK
CAS Latency = 3
tPROZ3
3
-
3
-
3
-
3
-
CLK
CAS Latency = 2
tPROZ2
2
-
2
-
2
-
2
-
CLK
Power down exit time
tPDE
1
-
1
-
1
-
1
-
CLK
Self refresh exit time
tSRE
1
-
1
-
1
-
1
-
CLK
Refresh Time
tREF
64
-
64
-
64
-
64
-
ms
Note
RAS cycle time
Precharge to data
output Hi-Z
1
Note :
1. A new command can be given tRRC after self refresh exit.
Rev. 1.5/Dec.98
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HY57V168010D
DEVICE OPERATING OPTION TABLE
HY57V168010D-8
CAS Latency
tRCD
tRAS
tRC
tRP
tAC
tOH
125MHz
3CLKs
3CLKs
6CLKs
9CLKs
3CLKs
6ns
3ns
100MHz
2CLKs
2CLKs
5CLKs
7CLKs
2CLKs
6ns
3ns
83MHz
2CLKs
2CLKs
4CLKs
6CLKs
2CLKs
6ns
3ns
66MHz
2CLKs
2CLKs
4CLKs
6CLKs
2CLKs
6ns
3ns
CAS Latency
tRCD
tRAS
tRC
tRP
tAC
tOH
100MHz
2CLKs
2CLKs
5CLKs
7CLKs
2CLKs
6ns
3ns
83MHz
2CLKs
2CLKs
4CLKs
6CLKs
2CLKs
6ns
3ns
66MHz
2CLKs
2CLKs
3CLKs
5CLKs
2CLKs
6ns
3ns
50MHz
2CLKs
1CLK
3CLKs
4CLKs
1CLK
6ns
3ns
CAS Latency
tRCD
tRAS
tRC
tRP
tAC
tOH
100MHz
3CLKs
2CLKs
5CLKs
7CLKs
2CLKs
6ns
3ns
83MHz
2CLKs
2CLKs
4CLKs
6CLKs
2CLKs
6ns
3ns
66MHz
2CLKs
2CLKs
3CLKs
5CLKs
2CLKs
6ns
3ns
50MHz
2CLKs
1CLK
3CLKs
4CLKs
1CLK
6ns
3ns
CAS Latency
tRCD
tRAS
tRC
tRP
tAC
tOH
100MHz
3CLKs
3CLKs
5CLKs
8CLKs
3CLKs
8ns
3ns
83MHz
2CLKs
2CLKs
5CLKs
7CLKs
2CLKs
8ns
3ns
66MHz
2CLKs
2CLKs
4CLKs
6CLKs
2CLKs
8ns
3ns
50MHz
2CLKs
2CLKs
3CLKs
4CLKs
1CLK
8ns
3ns
HY57V168010D-10P
HY57V168010D-10S
HY57V168010D-10
Rev. 1.5/Dec.98
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HY57V168010D
COMMAND TRUTH TABLE
Command
CKEn
CS
RAS
CAS
WE
DQM
Mode Register Set
H
X
L
L
L
L
X
OP code
H
X
X
X
No Operation
H
X
X
X
L
H
H
H
Row Address
Bank Active
H
X
L
L
H
H
X
H
X
L
H
L
H
X
Read
Read with Auto precharge
Write
H
X
L
H
L
L
X
Write with Auto precharge
A0~A9
A10/
AP
CKEn-1
Column
Address
Column
Address
Precharge All Bank
H
X
L
L
H
L
X
Precharge selected Bank
Burst Stop
H
X
U/LDQM
H
Auto Refresh
H
H
L
L
L
Entry
H
L
L
L
H
X
Exit
L
H
H
H
H
L
V
V
H
L
V
H
H
X
L
V
X
X
V
X
H
X
X
L
H
X
X
X
X
X
L
H
H
H
H
X
X
X
L
H
H
H
H
X
X
X
L
H
H
H
H
X
X
X
L
V
V
V
L
Precharge
power down
Note
L
X
X
Self Refresh1
Entry
L
BA
X
X
Exit
Entry
L
H
H
L
Clock Suspend
Exit
L
X
H
X
X
X
X
Note :
1. Exiting Self Refresh occurs by asynchronously bringing CKE from low to high.
2. X=Do not care, L=Low, H=High, BA=Bank Address, RA= Row Address, CA=Column Address, Opcode=Operand Code,
NOP=No Operation.
Rev. 1.5/Dec.98
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HY57V168010D
PACKAGE INFORMATION
400mil 44pin Thin Small Outline Package (TC)
2Mx8 Synchronous DRAM
Rev. 1.5/Dec.98
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UNIT : INCH (mm)
11