ETC IDT74FCT574CTQ

IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
FAST CMOS OCTAL D
REGISTERS (3-STATE)
IDT54/74FCT574T/AT/CT
FEATURES:
DESCRIPTION:
−
−
−
The FCT574T is an 8-bit register built using an advanced dual metal
CMOS technology. These registers consist of eight D-type flip-flops with a
buffered common clock and buffered 3-state output control. When the output
enable (OE) input is low, the eight outputs are enabled. When the OE input
is high, the outputs are in the high-impedance state.
−
−
−
−
−
−
Low input and output leakage ≤1µ A (max.)
CMOS power levels
True TTL input and output compatibility
• VOH = 3.3V (typ.)
• VOL = 0.3V (typ.)
Meets or exceeds JEDEC standard 18 specifications
Military product compliant to MIL-STD-883, Class B and DESC
listed (dual marked)
Std., A, and C speed grades
High drive outputs (-15mA IOH, 48mA IOL)
Power off disable outputs permit “live insertion”
Available in the following packages:
• Industrial: SOIC, SSOP, QSOP, TSSOP
• Military: CERDIP, LCC, CERPACK
Input data meeting the set-up and hold time requirements of the D inputs
is transferred to the Q outputs on the low-to-high transition of the clock input.
FUNCTIONAL BLOCK DIAGRAM
D0
D1
D2
D3
D4
D5
D6
D7
CP
CP
D
CP
D
CP
D
CP
D
CP
D
CP
D
CP
D
CP
D
Q
Q
Q
Q
Q
Q
Q
Q
Q0
Q1
Q2
Q3
Q4
Q5
Q6
Q7
OE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
AUGUST 2000
1
c
1999 Integrated Device Technology, Inc.
DSC-5494/-
IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
D0
2
19
Q0
D1
3
18
Q1
D5
7
18
Q1
17
Q2
16
Q3
17
Q2
16
Q3
15
Q4
D5
7
15
Q4
14
Q5
D6
8
14
Q5
D6
8
13
Q6
D7
9
12
Q7
10
11
CP
GND
6
19
L20-2
9
CERDIP/ SOIC/ SSOP/ QSOP/ TSSOP/ CERPACK
TOP VIEW
Rating
Terminal Voltage with Respect to GND
Max.
–0.5 to +7
Unit
V
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +120
mA
Pin Names
DN
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
No
terminal voltage may exceed Vcc by +0.5V unless otherwise noted.
QN
Clock Pulse for the register. Enters data on LOW-toHIGH transition.
3-state outputs (TRUE)
QN
3-state outputs (INVERTED)
OE
Active LOW 3-state Output Enable input
Function
HI-Z
LOAD
REGISTER
CAPACITANCE (TA = +25OC, f = 1.0MHz)
COUT
Output Capacitance
VOUT = 0V
8
12
(1)
Inputs
3. Outputs and I/O terminals only.
Max.
10
Description
FUNCTION TABLE
2. Inputs and Vcc terminals only.
Typ.
6
13
D flip-flop data inputs
CP
8T-link
Conditions
VIN = 0V
12
PIN DESCRIPTION
Symbol
VTERM(2)
Parameter(1)
Input Capacitance
11
LCC
TOP VIEW
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
CIN
10
Q6
6
D4
20
1
Q7
D4
5
2
CP
5
D3
3
GND
D3
D20-1
SO20-2
SO20-7
SO20-8
SO20-9
E20-1
D2
4
D7
D2
4
INDEX
Q0
V CC
V CC
20
OE
1
D0
OE
D1
PIN CONFIGURATION
Unit
pF
pF
NOTE:
1. This parameter is measured at characterization but not tested.
CP
DN
QN
QN
H
H
L
L
H
H
L
H
↑
↑
↑
↑
X
X
L
H
L
H
Z
Z
L
H
Z
Z
NC
NC
H
L
H
L
↑ = LOW-to-HIGH transition
2
Internal
OE
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedance
NC = No Change
8T-link
Outputs
IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
VIH
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
VIL
Input LOW Level
Guaranteed Logic LOW Level
IIH
Input HIGH Current(4)
VCC = Max.
IIL
Input LOW Current(4)
IOZH
High Impedance Output Current
IOZL
(3-State Output pins)(4)
II
Input HIGH Current(4)
VCC = Max., VI = VCC (Max.)
—
—
±1
µA
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
—
–0.7
–1.2
V
VH
Input Hysteresis
—
—
200
—
mV
ICC
Quiescent Power Supply Current
VCC = Max., VIN = GND or VCC
—
0.01
1
VI = 2.7V
VCC = Max.
Min.
2
Typ.(2)
—
Max.
—
Unit
V
—
—
0.8
V
—
—
±1
µA
VI = 0.5V
—
—
±1
VO = 2.7V
—
—
±1
VO = 0.5V
—
—
±1
mA
8T-link
OUTPUT DRIVE CHARACTERISTICS
Symbol
VOH
Parameter
Output HIGH Voltage
VOL
Output LOW Voltage
IOS
Short Circuit Current
Test Conditions(1)
VCC = Min.
IOH = –6mA MIL
VIN = VIH or VIL
IOH = –8mA IND
IOH = –12mA MIL
IOH = –15mA IND
VCC = Min.
IOL = 32mA MIL
VIN = VIH or VIL
IOL = 48mA IND
VCC = Max., VO = GND(3)
Min.
2.4
Typ.(2)
3.3
Max.
—
2
3
—
—
0.3
0.5
V
–60
–120
–225
mA
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µ A at TA = –55°C.
3
Unit
V
IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol
∆ICC
ICCD
Parameter
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply Current(4)
IC
Total Power Supply Current(6)
Test Conditions(1)
VCC = Max.
VIN = 3.4V(3)
VCC = Max.
Outputs Open
OE = GND
One Input Toggling
50% Duty Cycle
VCC = Max.
Outputs Open
fCP = 10MHz
50% Duty Cycle
OE = GND
fi = 5MHz
50% Duty Cycle
One Bit Toggling
VCC = Max.
Outputs Open
fCP = 10MHz
50% Duty Cycle
OE = GND
Eight Bits Toggling
fi = 2.5MHz
50% Duty Cycle
Min.
—
Typ.(2)
0.5
Max.
2
Unit
mA
VIN = VCC
VIN = GND
—
0.15
0.25
mA/
MHz
VIN = VCC
VIN = GND
—
1.5
3.5
mA
VIN = 3.4
VIN = GND
—
2
5.5
VIN = VCC
VIN = GND
—
3.8
7.3(5)
VIN = 3.4
VIN = GND
—
6
16.3(5)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
4
IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - INDUSTRIAL
FCT574T
Symbol
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
tSU
tH
tW
Parameter
Propagation Delay
CP to QN
Output Enable Time
Conditions(1)
Min (2)
CL = 50pF
RL = 500Ω
Output Disable Time
Set-up Time HIGH
or LOW, DN to CP
Hold Time HIGH
or LOW, DN to CP
CP Pulse Width
HIGH or LOW (3)
FCT574AT
FCT574CT
Max.
Min (2)
Max.
Min.(2)
Max.
Unit
2
10
2
6.5
2
5.2
ns
1.5
12.5
1.5
6.5
1.5
5.5
ns
1.5
8
1.5
5.5
1.5
5
ns
2
—
2
—
2
—
ns
1.5
—
1.5
—
1.5
—
ns
7
—
5
—
5
—
ns
.
.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE - MILITARY
FCT574T
Symbol
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
tSU
tH
tW
Parameter
Propagation Delay
CP to QN
Output Enable Time
Conditions(1)
Min (2)
CL = 50pF
RL = 500Ω
Output Disable Time
Set-up Time HIGH
or LOW, DN to CP
Hold Time HIGH
or LOW, DN to CP
CP Pulse Width (3)
HIGH or LOW
FCT574AT
FCT574CT
Max.
Min (2)
Max.
Min.(2)
Max.
Unit
2
11
2
7.2
2
6.2
ns
1.5
14
1.5
7.5
1.5
6.2
ns
1.5
8
1.5
6.5
1.5
5.7
ns
2
—
2
—
2
—
ns
1.5
—
1.5
—
1.5
—
ns
7
—
6
—
6
—
ns
.
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. This parameter is guaranteed but not tested.
5
.
IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
TEST CIRCUITS FOR ALL OUTPUTS
V CC
Test
7.0V
Switch
Open Drain
500 Ω
Disable Low
V OUT
V IN
Pulse
Generator
Enable Low
All Other Tests
D.U.T.
50pF
R
Closed
T
C
Open
8-link
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
500 Ω
L
O ctal lin k
PULSE WIDTH
SET-UP, HOLD, AND RELEASE TIMES
3V
1.5V
0V
3V
1.5V
0V
DATA
INPUT
tH
t SU
TIM ING
INPUT
ASYNCHRONOUS C ONTROL
PRES ET
CLEAR
ETC.
SYNCHRO NOUS CONTRO L
PRES ET
CLEAR
CLOCK ENABLE
ETC.
t REM
t SU
LO W -HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW -HIGH
PULSE
1.5V
3V
1.5V
0V
tH
O ctal lin k
O ctal lin k
PROPAGATION DELAY
ENABLE AND DISABLE TIMES
ENAB LE
SAM E PHASE
INPUT TRANSITION
t PLH
t PH L
OUTPUT
t PLH
OPPOSITE P HASE
INPUT TRANSITION
t PH L
3V
1.5V
0V
DISA BLE
3V
CO NTROL
INPUT
1.5V
t PZL
V OH
1.5V
V OL
OUTPUT
NO RM A LLY
LO W
3V
1.5V
0V
SW ITCH
CLOSE D
O ctal lin k
SW ITCH
OPEN
3.5V
3.5V
1.5V
0.3V
t PZH
OUTPUT
NO RM A LLY
HIGH
0V
t PLZ
V OL
t PHZ
0.3V
V OH
1.5V
0V
0V
O ctal lin k
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control DisableHIGH
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns
6
IDT54/74FCT574T/AT/CT
FAST CMOS OCTAL D REGISTER (3-STATE)
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
XX
Tem p. Range
FCT
XXXX
XX
X
Device Type
Package
Process
Blank
B
Industrial
MIL-STD-883, Class B
SO
PY
Q
PG
Industrial Options
Small Outline IC (SO20-2)
Shrink Small Outline Package (SO20-7)
Quarter-size Sm all Outline Package (SO20-8)
Thin Shrink Sm all Outline Package (SO20-9)
D
E
L
Military Options
CERDIP (D20-1)
CERPACK (E20-1)
Leadless Chip Carrier (L20-1)
574T
574AT
574CT
Fast CMOS Octal D Register
54
74
– 55°C to +125°C
– 40°C to +85°C
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7