MNA14 Ceramic capacitors Multi-layer ceramic chip capacitor networks MNA14 (1608 (0603) × 4 size, chip capacitor networks) !External dimensions (Units : mm) 0.55±0.1 0.7±0.2 0.85±0.1 0.8±0.1 1.6±0.2 0.15 +− 0.09 0.12 !Features 1) Area ratio is approximately 55% smaller than that of the MCH18, enabling high - density mounting. 2) Mounting costs are reduced. 3) Use of convex electrodes prevents solder bridging during mounting, and makes it easy to perform a visual inspection of the mounted piece. Also facilitates automatic inspection. 4) Barrier layer and end terminations to improve solderability. 5) Each element is independent to ensure a wide range of circuit applications. 6) Can be packed on tape. 0.8±0.1 3.2±0.2 ∗Land pattern in 0.8mm pitch between each electrode is recommended. !Equivalent circuits !Structure C1 C2 C3 C4 C1 = C 2 = C 3 = C 4 External electrode ΙΙΙ (coating layer) Internal electrode Ceramic element External electrode ΙΙ (barrier layer) External electrode Ι (thick membrane layer) ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors !Product designation Code Product thickness Packaging specifications Reel K 0.8mm Paper tape (width 8 mm, pich 4 mm) φ180mm (7in.) Basic ordening unit (pcs.) 4,000 Reel (φ180mm) : compatible with EIAJ ET-7200A Part No. Packaging style M N A Rated voltage Code Voltage 2 25V 5 50V 1 4 5 A 1 0 1 K K Nominal Capacitance tolerance Capacitance-temperature characteristics tolerace Code EIA code Operating temperature range (°C) Temp. coefficient or percent change capacitance Code A C0G −55 ~ +125 0 ± 30ppm / °C ± 10% 3-digit designation K CN X7R −55 ~ +125 ± 15% according IEC M ± 20% !Capacitance range Product name Temperature characteristic Capacitance (pF) Rated voltage Tolerance MNA 14 A (C0G) CN (X7R) 50V 25V K ( ± 10%) M ( ± 20%) 10 22 47 100 220 470 1,000 2,200 4,700 10,000 22,000 Product thickness (mm) 0.8 ± 0.1 ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors !Characteristics Class 1 (For thermal compensation) Temperature characteristics A (C0G) Item Operating temperature −55°C ~ +125°C Nominal capacitance (C) Must be within the specified tolerance range. Dissipation factor (tanδ) 100 / (400 + 20C)% or less: Less than 30 pF 0.1% or less : 30 pF or larger Insulation resistance (IR) Withstanding voltage Temperature characteristics Terminal adherence Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tanδ) Resistance to soldering heat Temperature cycling Hightemperature load test The insulation must not be damaged. Based on paragraph 7.1. Apply 300% of the rated voltage for 1 to 5s then measure. Within 0 ± 30ppm / °C No detachment or signs of detachment. There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. Appearance There must be no mechanical damage. ± 2.5% or ± 0.25 pF, whichever is larger Dissipation factor (tanδ) Must satisfy initial specified value. Insulation resistance 10,000MΩ or 500MΩ⋅µF, whichever is smaller There must be no mechanical damage. Rate of capacitance change ± 2.5% or ± 0.25 pF, whichever is larger Dissipation factor (Tanδ) The temperature coefficients in table 12, paragraph 7.12 are calculated at 20°C and high temperature. Based on paragraph 8.11.2. Apply 5N for 10 ± 1s in the direction indicated by the arrow. Pressure (5N) Test board Capacitor Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and Board measured 24 ± 2 hours later. Based on paragraph 8.13, Soldering temperature : 235 ± 5°C : 2 ± 0.5s Soldering time Based on paragraph 8.14. Soldering temperature : 260 ± 5°C : 5 ± 0.5s Soldering time : 150 ± 10°C for 1 to 2 min. Preheating The insulation must not be damaged. Appearance Insulation resistance Humidity load test Based on paragraph 7.6. Measurement is made after rated voltage is applied for 60 ± 5s. Rate of capacitance change Withstanding voltage Based on paragraph 7.8 and paragraph 9, Measured at room temperature and standard humidity. Measurement frequency : 1 ± 0.1MHz Measurement voltage : 1 ± 0.1Vrms. 10,000MΩ or 500MΩ⋅µF, whichever is smaller At least 3/4 of the surface of the two terminals must be covered with new solder. Solderability Test methods / conditions (based on JIS C 5102) Must satisfy initial specified value. Based on paragraph 9.3, Number of cycles : 5 Capacitance measured after 24 ± 2 hrs. 10,000MΩ or 500MΩ⋅µF, whichever is smaller Appearance There must be no mechanical damage. Rate of capacitance change ± 7.5% or ± 0.75 pF, whichever is larger Dissipation factor (tanδ) 0.5% or less Insulation resistance 500MΩ or 25MΩ⋅µF, whichever is smaller Appearance There must be no mechanical damage. Rate of capacitance change ± 3.0% or ± 0.3 pF, whichever is larger Dissipation factor (tanδ) 0.3% or less Insulation resistance 10,000MΩ or 50MΩ⋅µF, whichever is smaller Based on paragraph 9.9, Test temperature : 40 ± 2°C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 24 ± 2 hrs. Based on paragraph 9.10, Test temperature : Max. operating temp. Applied voltage : rated voltage × 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 24 ± 2 hrs. ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors Class 2 (High dielectric constant) Temperature characteristics CN (X7R) Item Operating temperature Nominal capacitance (C) Dissipation factor (tanδ) Insulation resistance (IR) Withstanding voltage Temperature characteristics Terminal adherence Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tanδ) Appearance Rate of capacitance change Resistance to soldering heat 10,000MΩ or 500MΩ⋅µF, whichever is smaller The insulation must not be damaged. Within ± 15% No peeling or sign of peeling on terminal. There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. Within ± 5.0% 10,000MΩ or 500MΩ⋅µF, whichever is smaller Rate of capacitance change Within ± 7.5% Must satisfy initial specified value. 10,000MΩ or 500MΩ⋅µF, whichever is smaller There must be no mechanical damage. Within ± 12.5% Dissipation factor (tanδ) 5.0% or less Insulation resistance 500MΩ or 25MΩ⋅µF, whichever is smaller Rate of capacitance change The temperature coefficients in paragraph 7.12, table 8, condition B, are based on measurements carried out at 20°C, with no voltage applied. Based on paragraph 8.11.2. Apply 5N for 10 ± 1s in the direction indicated by the arrow. Pressure (5N) Test board Capacitor Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and measured 48 ± 4 hrs. later. Board Based on paragraph 8.13 Soldering temperature: 235 ± 5°C : 2 ± 0.5s Soldering time Based on paragraph 8.14. Soldering temperature: 260 ± 5°C Soldering time : 5 ± 0.5s Preheating : 150 ± 10°C for 1 to 2 min. The insulation must not be damaged. Dissipation factor (tanδ) Appearance Based on paragraph 7.6 Measurement is made after rated voltage is applied for 60 ± 5s. Based on paragraph 7.1 Apply 250% of the rated voltage for 1 to 5s then measure. There must be no mechanical damage. Insulation resistance Rate of capacitance change Based on paragraph 7.8 Measured at room temperature and standard humidity. Measurement frequency: 1 ± 0.1 kHz Measurement voltage : 0.1 ± 0.2 Vrms. There must be no mechanical damage. Insulation resistance Appearance Hightemperature load test 2.5% or less (when rated voltage is 16V : 3.5% or less) Must satisfy initial specified value. Appearance Humidity load test Must be within the specified tolerance range. Dissipation factor (tanδ) Withstanding voltage Temperature cycling −55°C ~ +125°C At least 3/4 of the surface of the two terminals must be covered with new solder. Solderability Test methods/conditions (based on JIS C 5102) Based on paragraph 9.3 Number of cycles : 5 Capacitance measured after 48 ± 4 hrs. Based on paragraph 9.9 Test temperature : 40 ± 2°C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 48 ± 4 hrs. There must be no mechanical damage. Within ± 10.0% Dissipation factor (tanδ) 5.0% or less Insulation resistance 1,000MΩ or 50MΩ⋅µF, whichever is smaller Based on paragraph 9.10 Test temperature : Max. operating temp. Applied voltage : rated voltage × 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 48 ± 4 hrs. ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors !Packaging specifications (Units : mm) Taping Reel t φJ C t1 F G φ13 ± 0.2 B H (Paper taping) C Symbol Dimensions D E Pulling direction F G H J t 11.4 ± 1.0 0 φ180 −1.5 D −0 φ 60 +1 9.0 ± 0.3 E A t1 3.5 1.75 4.0 2.0 4.0 φ1.5 1.05 1.2 8.0 MAX. MAX. ±0.3 ±0.05 ±0.1 ±0.1 ±0.05 ±0.1 +0.1 0 Label position Size Symbol 1608 × 4 A B 2.0 ±0.1 3.5 ±0.1 (φ180mm reel) EIAJ ET-7200A compliant ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors !Electrical characteristics gA (C0G) Characteristics 10000 4 1000 3 2 IMPEDANCE (Ω) RATE OF CAPACITANCE CHANGE : (%) 5 1 0 −1 −2 100 10 100pF 1 −3 220pF 0.1 −4 −5 470pF −50 0 50 0 100 1 10 100 1000 10000 FREQUENCY (MHz) TEMPERATURE : (°C) Fig.2 Fig.1 Capacitance-temperature characteristics Impedance-frequency characteristics gCN (X7R) Characteristics 1000 20 10 ∆C / C 0 100 IMPEDANCE (Ω) −10 −20 −30 15 10 5 tanδ −50 0 50 100 0 tanδ (%) RATE OF CAPACITANCE CHANGE : (%) 30 10 1,000pF 1 0.1 10,000pF 0.01 1 10 TEMPERATURE : (°C) Fig.3 Capacitance-temperature characteristics 100 1000 10000 FREQUENCY (MHz) Fig.4 Impedance-frequency characteristics ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors gTemperature cycling test A (C0G) Characteristics (100pF) 0.6 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 2.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 0.5 0 IR : (Ω) 0.4 0.3 −1.0 0.2 −2.0 0.1 −3.0 1 × 1011 0 INITIAL VALUE TESTED INITIAL VALUE Fig.5 Rate of capacitance change INITIAL VALUE TESTED TESTED Fig.7 Insulation resistance Fig.6 tanδ CN (X7R) Characterisics (10,000pF) 6.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 10.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 5.0 5.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 1 × 1012 tanδ : (%) 4.0 0 3.0 −5.0 2.0 −10.0 1.0 −15.0 INITIAL VALUE IR : (Ω) 15.0 RATE OF CAPACITANCE CHANGE : (%) JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs −55 / +125°C 100cyc 1 × 1 012 1.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 1 × 1011 0 TESTED INITIAL VALUE Fig.8 Rate of capacitance change INITIAL VALUE TESTED TESTED Fig.10 Insulation resistance Fig.9 tanδ gHigh – temperature load test A (C0G) Characteristics (100pF) 0.6 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 2.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 0.5 1.0 1 × 1012 0.0 0.3 −1.0 0.2 −2.0 0.1 −3.0 IR : (Ω) 0.4 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 1 × 1011 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 0 0 240 480 720 1000 0 240 480 720 TIME (h) TIME (h) Fig.11 Rate of capacitance change Fig.12 tanδ 1000 1 × 1010 0 240 480 720 1000 TIME (h) Fig.13 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors CN (X7R) Characteristics (10,000pF) 6.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 10.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 5.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125°C 1,000h OVERLOAD : 200% RATED VOLTAGE 1 × 1012 0.0 3.0 −5.0 2.0 −10.0 1.0 −15.0 IR : (Ω) 4.0 5.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 15.0 0 0 240 480 720 0 1000 240 480 720 1000 1 × 1011 0 240 480 720 1000 TIME (h) TIME (h) TIME (h) Fig.14 Rate of capacitance change Fig.15 tanδ Fig.16 Insulation resistance gHumidity load test A (C0G) Characteristics (100pF) 0.6 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 1.0 0.0 0.3 0.2 −2.0 0.1 0 240 480 720 0 240 TIME (h) Fig.17 Rate of capacitance change 480 720 1000 1 × 1010 0 240 480 720 1000 TIME (h) TIME (h) Fig.18 tanδ Fig.19 Insulation resistance CN (X7R) Characteristics (10,000pF) 6.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 10.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 1 × 1012 5.0 0 −5.0 IR : (Ω) 4.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 15.0 1 × 1012 1 × 1011 0 1000 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0.4 −1.0 −3.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0.5 IR : (Ω) 2.0 tanδ : (%) RATE OF CAPACITANCE CHANGE : (%) 3.0 3.0 1 × 1011 2.0 −10.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40°C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 1.0 −15.0 0 240 480 720 1000 TIME (h) Fig.20 Rate of capacitance change 0 0 240 480 720 1000 1 × 1010 0 240 480 720 1000 TIME (h) TIME (h) Fig.21 tanδ Fig.22 Insulation resistance ∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. Appendix Notes No technical content pages of this document may be reproduced in any form or transmitted by any means without prior permission of ROHM CO.,LTD. The contents described herein are subject to change without notice. The specifications for the product described in this document are for reference only. Upon actual use, therefore, please request that specifications to be separately delivered. Application circuit diagrams and circuit constants contained herein are shown as examples of standard use and operation. Please pay careful attention to the peripheral conditions when designing circuits and deciding upon circuit constants in the set. Any data, including, but not limited to application circuit diagrams information, described herein are intended only as illustrations of such devices and not as the specifications for such devices. ROHM CO.,LTD. disclaims any warranty that any use of such devices shall be free from infringement of any third party's intellectual property rights or other proprietary rights, and further, assumes no liability of whatsoever nature in the event of any such infringement, or arising from or connected with or related to the use of such devices. Upon the sale of any such devices, other than for buyer's right to use such devices itself, resell or otherwise dispose of the same, no express or implied right or license to practice or commercially exploit any intellectual property rights or other proprietary rights owned or controlled by ROHM CO., LTD. is granted to any such buyer. Products listed in this document use silicon as a basic material. Products listed in this document are no antiradiation design. The products listed in this document are designed to be used with ordinary electronic equipment or devices (such as audio visual equipment, office-automation equipment, communications devices, electrical appliances and electronic toys). Should you intend to use these products with equipment or devices which require an extremely high level of reliability and the malfunction of with would directly endanger human life (such as medical instruments, transportation equipment, aerospace machinery, nuclear-reactor controllers, fuel controllers and other safety devices), please be sure to consult with our sales representative in advance. About Export Control Order in Japan Products described herein are the objects of controlled goods in Annex 1 (Item 16) of Export Trade Control Order in Japan. In case of export from Japan, please confirm if it applies to "objective" criteria or an "informed" (by MITI clause) on the basis of "catch all controls for Non-Proliferation of Weapons of Mass Destruction. Appendix1-Rev1.0