TI SN74LVTH543PW

SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
D
D
D
D
D
D
description
These octal transceivers are designed specifically
for low-voltage (3.3-V) VCC operation, but with the
capability to provide a TTL interface to a 5-V
system environment.
LEBA
OEBA
A1
A2
A3
A4
A5
A6
A7
A8
CEAB
GND
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
VCC
CEBA
B1
B2
B3
B4
B5
B6
B7
B8
LEAB
OEAB
SN54LVTH543 . . . FK PACKAGE
(TOP VIEW)
4
A2
A3
A4
NC
A5
A6
A7
CEBA
B1
D
SN54LVTH543 . . . JT OR W PACKAGE
SN74LVTH543 . . . DB, DGV, DW, OR PW PACKAGE
(TOP VIEW)
A1
OEBA
LEBA
NC
VCC
D
State-of-the-Art Advanced BiCMOS
Technology (ABT) Design for 3.3-V
Operation and Low Static-Power
Dissipation
Ioff and Power-Up 3-State Support Hot
Insertion
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
Support Mixed-Mode Signal Operation
(5-V Input and Output Voltages With
3.3-V VCC )
Support Unregulated Battery Operation
Down to 2.7 V
Typical VOLP (Output Ground Bounce)
< 0.8 V at VCC = 3.3 V, TA = 25°C
Latch-Up Performance Exceeds 500 mA Per
JESD 17
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Shrink Small-Outline (PW), and
Thin Very Small-Outline (DGV) Packages,
Ceramic Chip Carriers (FK), Ceramic Flat
(W) Package, and Ceramic (JT) DIPs
5
2 1 28 27 26
25
6
24
7
23
8
22
9
21
10
20
3
19
11
12 13 14 15 16 17 18
B2
B3
B4
NC
B5
B6
B7
A8
CEAB
GND
NC
OEAB
LEAB
B8
D
NC – No internal connection
The ’LVTH543 devices contain two sets of D-type latches for temporary storage of data flowing in either
direction. Separate latch-enable (LEAB or LEBA) and output-enable (OEAB or OEBA) inputs are provided for
each register to permit independent control in either direction of data flow.
The A-to-B enable (CEAB) input must be low to enter data from A or to output data from B. If CEAB is low and
LEAB is low, the A-to-B latches are transparent; a subsequent low-to-high transition of LEAB puts the A latches
in the storage mode. With CEAB and OEAB both low, the 3-state B outputs are active and reflect the data present
at the output of the A latches. Data flow from B to A is similar, but requires using the CEBA, LEBA, and OEBA
inputs.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright  1999, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
description (continued)
When VCC is between 0 and 1.5 V, the device is in the high-impedance state during power up or power down.
However, to ensure the high-impedance state above 1.5 V, OE should be tied to VCC through a pullup resistor;
the minimum value of the resistor is determined by the current-sinking capability of the driver.
This device is fully specified for hot-insertion applications using Ioff and power-up 3-state. The Ioff circuitry
disables the outputs, preventing damaging current backflow through the device when it is powered down. The
power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down,
which prevents driver conflict.
The SN54LVTH543 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74LVTH543 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE†
INPUTS
CEAB
LEAB
OEAB
A
OUTPUT
B
H
X
X
X
Z
X
X
H
X
Z
L
H
L
X
L
L
L
L
B0‡
L
L
L
L
H
H
† A-to-B data flow is shown; B-to-A flow control is the
same except that it uses CEBA, LEBA, and OEBA.
‡ Output level before the indicated steady-state
input conditions were established
logic symbol§
OEBA
CEBA
LEBA
OEAB
2
23
1
13
11
CEAB
14
LEAB
A1
A2
A3
A4
A5
A6
A7
A8
1EN3
G1
1C5
2EN4
G2
2C6
3
4
3
1
5D
6D
1
4
21
5
20
6
19
7
18
8
17
9
16
10
15
§ This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DB, DGV, DW, JT, PW, and W packages.
2
22
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
B1
B2
B3
B4
B5
B6
B7
B8
SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
logic diagram (positive logic)
OEBA
CEBA
LEBA
OEAB
CEAB
LEAB
A1
2
23
1
13
11
14
C1
3
1D
22
B1
C1
1D
To Seven Other Channels
Pin numbers shown are for the DB, DGV, DW, JT, PW, and W packages.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.6 V
Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Voltage range applied to any output in the high-impedance
or power-off state, VO (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
Voltage range applied to any output in the high state, VO (see Note 1) . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Current into any output in the low state, IO: SN54LVTH543 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96 mA
SN74LVTH543 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 mA
Current into any output in the high state, IO (see Note 2): SN54LVTH543 . . . . . . . . . . . . . . . . . . . . . . . . 48 mA
SN74LVTH543 . . . . . . . . . . . . . . . . . . . . . . . . 64 mA
Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
Package thermal impedance, θJA (see Note 3): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104°C/W
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139°C/W
DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81°C/W
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120°C/W
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. This current flows only when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.
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3
SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
recommended operating conditions (see Note 4)
SN54LVTH543
SN74LVTH543
MIN
MAX
MIN
MAX
2.7
3.6
2.7
3.6
UNIT
VCC
VIH
Supply voltage
VIL
VI
Low-level input voltage
0.8
0.8
Input voltage
5.5
5.5
V
IOH
IOL
High-level output current
–24
–32
mA
48
64
mA
∆t /∆v
Input transition rise or fall rate
10
10
ns/V
∆t/∆VCC
TA
Power-up ramp rate
200
Operating free-air temperature
–55
High-level input voltage
2
Low-level output current
Outputs enabled
2
V
–40
V
µs/V
200
125
V
85
°C
NOTE 4: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
VOH
VCC = 2.7 V,
VCC = 2.7 V to 3.6 V,
II = –18 mA
IOH = –100 µA
VCC = 2.7 V,
IOH = –8 mA
IOH = –24 mA
VCC = 3 V
VOL
VCC = 3 V
VCC = 3.6 V,
VCC = 0 or 3.6 V,
Ioff
II(hold)
(
)
A or B ports
0.2
IOL = 24 mA
IOL = 16 mA
0.5
0.5
0.4
0.4
IOL = 32 mA
IOL = 48 mA
0.5
0.5
V
0.55
VI = 2 V
VI = 0 to 3.6 V
0.55
±1
±1
10
10
20
20
1
1
–5
–5
±100
75
75
–75
–75
µA
µA
µA
±500
IOZPU
VCC = 3.6 V§
VCC = 0 to 1.5 V, VO = 0.5 to 3 V,
OE = don’t care
IOZPD
VCC = 1.5 V to 0, VO = 0.5 to 3 V,
OE = don’t care
ICC
VCC = 3.6
3 6 V,
V IO = 0,
0
VI = VCC or GND
∆ICC¶
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
Ci
VI = 3 V or 0
VO = 3 V or 0
Outputs high
Cio
V
2
0.2
VI or VO = 0 to 4.5 V
VI = 0.8 V
VCC = 3 V
UNIT
V
2
VI = VCC
VI = 0
VCC = 0,
–1.2
VCC–0.2
2.4
VI = 5.5 V
VI = 5.5 V
VCC = 3.6 V
SN74LVTH543
TYP†
MAX
MIN
–1.2
VCC–0.2
2.4
IOL = 64 mA
VI = VCC or GND
II
A or B ports‡
MIN
IOH = –32 mA
IOL = 100 µA
VCC = 2
2.7
7V
Control inputs
SN54LVTH543
TYP†
MAX
TEST CONDITIONS
Outputs low
Outputs disabled
±100∗
±100
µA
±100∗
±100
µA
0.19
0.19
5
5
0.19
0.19
0.2
0.2
mA
mA
4
4
pF
9
9
pF
∗ On products compliant to MIL-PRF-38535, this parameter is not production tested.
† All typical values are at VCC = 3.3 V, TA = 25°C.
‡ Unused terminals are at VCC or GND.
§ This is the bus-hold maximum dynamic current. It is the minimum overdrive current required to switch the input from one state to another.
¶ This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
5
SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (see Figure 1)
SN54LVTH543
VCC = 3.3 V
± 0.3 V
MIN
tw
tsu
th
Pulse duration,
LEAB or LEBA low
MAX
SN74LVTH543
VCC = 3.3 V
± 0.3 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
VCC = 2.7 V
MIN
3.3
3.3
3.3
3.3
0.4
0.4
0.4
0.4
1
1.5
1
1.5
A or B before
LEAB or LEBA↑
Data high
A or B before
CEAB or CEBA↑
Data high
0.2
0.2
0.2
0.2
Data low
0.7
1.2
0.7
1.2
A or B after
LEAB or LEBA↑
Data high
1.5
0.6
1.5
0.6
Data low
1.3
1.5
1.3
1.5
A or B after
CEAB or CEBA↑
Data high
1.6
0.5
1.6
0.5
Data low
1.4
1.6
1.4
1.6
Data low
Setup time
Hold time
UNIT
MAX
ns
ns
ns
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
SN54LVTH543
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
tPLH
tPHL
A or B
B or A
tPLH
tPHL
LE
A or B
tPZH
tPZL
OE
A or B
tPHZ
tPLZ
OE
A or B
tPZH
tPZL
CE
A or B
tPHZ
tPLZ
CE
A or B
VCC = 3.3 V
± 0.3 V
SN74LVTH543
VCC = 2.7 V
VCC = 2.7 V
MAX
MIN
TYP†
MAX
3.9
4.5
1.3
2.5
3.7
4.3
1.2
3.9
4.5
1.3
2.5
3.7
4.3
1.2
5.1
6.1
1.3
2.9
4.7
5.9
1.2
5.1
6.1
1.3
2.9
4.7
5.9
1
5.1
6.4
1.1
2.9
4.9
6.2
1
5.1
6.4
1.1
3.2
4.9
6.2
1.9
5.6
6.2
2
3.4
5.3
5.9
1.9
5.6
6.2
2
3.7
5.3
5.9
1.2
5.5
7
1.3
3.2
5.3
6.8
1.2
5.5
7
1.3
3.5
5.3
6.8
2.2
5.7
6.2
2.3
3.8
5.4
5.9
2.2
5.7
5.9
2.3
3.9
5.4
5.6
MIN
MAX
1.2
MIN
† All typical values are at VCC = 3.3 V, TA = 25°C.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
VCC = 3.3 V
± 0.3 V
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
MIN
UNIT
MAX
ns
ns
ns
ns
ns
ns
SN54LVTH543, SN74LVTH543
3.3-V ABT OCTAL REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS704D – AUGUST 1997 – REVISED APRIL 1999
PARAMETER MEASUREMENT INFORMATION
6V
S1
500 Ω
From Output
Under Test
Open
GND
CL = 50 pF
(see Note A)
500 Ω
TEST
S1
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
6V
GND
2.7 V
LOAD CIRCUIT
1.5 V
Timing Input
0V
tw
tsu
2.7 V
Input
1.5 V
1.5 V
th
2.7 V
1.5 V
Data Input
1.5 V
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
2.7 V
1.5 V
Input
1.5 V
0V
tPLH
tPHL
VOH
1.5 V
Output
1.5 V
VOL
tPHL
1.5 V
Output
Waveform 1
S1 at 6 V
(see Note B)
1.5 V
1.5 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
1.5 V
0V
tPZL
tPLZ
3V
1.5 V
tPZH
tPLH
VOH
Output
2.7 V
Output
Control
Output
Waveform 2
S1 at GND
(see Note B)
VOL + 0.3 V
VOL
tPHZ
1.5 V
VOH – 0.3 V
VOH
≈0V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
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Copyright  1999, Texas Instruments Incorporated