SIMTEK STK12C68-L

Statement of Material Content
Ceramic LCC Packages
STK11C68-L
STK12C68-L
STK14C88-L
This package type is not available in a lead-free version.
Detail
28 350 LEADLESS CHIP CARRIER
Unit
32 450 LEADLESS CHIP CARRIER
PACKAGE MATERIALS
Simtek Package ID
Pin/Lead Count
Simtek package pn
Package Manufacturer
Mfg Pkg ID/Simtek part ID/Dwg ID
Simtek package Outline
JEDEC Case Outline
Mil Case Outline ID
Assembly Facility
Plant
Leadframe Plating
Plating Process
Ceramic
Leads
Lead Plating [Gold Underplate]
Leads [Hot Solder Dip Finish]
L [hot solder dip lead finish]
28
STK-91-01-2303
Kyocera
PB-CA1771 / STK-91-01-2803
STK-40-05-007
MO-041
Figure C11, CQCC3-N28
Amkor Technologies
ATP1
Gold Plate 60µ" min over 80-250µ" Nickel
Electrolytic
Kyocera 440 Black [Al2O3 90%]
Alloy 42 [Fe 58% / Ni 42%]
Gold Plate 80µ"
Sn/Pb 60/40%
L [hot solder dip lead finish]
32
STK-91-01-3202
NTK Technical Ceramics
IRK32F1-5379C / STK-91-01-3202
STK-40-05-011
MO-041
Figure C11, CQCC3-N32
Amkor Technologies
ATP1
Gold Plate 80µ" min Over 50-350µ" Nickel
Electrolytic
NTK ALN
Alloy 42 [Fe 58% / Ni 42%]
Gold Plate 80µ"
Sn/Pb 60/40%
PACKAGE DIMENSIONS & CHARACTERISTICS
Nominal Cavity Volume
Die Size
Pad Size
Theta Ja [still air] -approx
Theta Ja [200fpm/1mps] - approx
Theta Jc
Lead Resistance
Lead to Lead Capacitance
3
in .0035
mil 146x153x19
mil 214x205
C/W 98
C/W 55
C/W 3
800 mOhm Max
pF 3pF max [1MHz]
.0062
144x374x19
310x440
73
42
3
500 mOhm Max
3pF max [1MHz]
SHIPPING INFORMATION
Carrier Type
Units Per Rail
Total Product Weight
rail
gm 0.9
rail
34
1.3
Williams Advanced Materials
Hi Rel Lid with Preform
STK-92-10-0003
in .330x.530 .280x.480 .01"
Kovar [Fe 54% / Co 17% / Ni 29%]
µ" Gold 25µ" min on Nickel 50-350µ"
Electrolytic
Au 80% / Sn 20%
in .002"
Williams Advanced Materials
Hi Rel Lid with Preform
STK-92-10-0007
.430x.530 .360x.500 .01 "
Kovar [Fe 54% / Co 17% / Ni 29%]
Gold 25µ" min on Nickel 50-350µ"
Electrolytic
Au 80% / Sn 20%
.002"
qty 34
LID DETAIL
Manufacturer
Lid Type
Simtek Lid ID
Dimensions
Lid Material
Plating
Plating Process
Frame
Frame Thickness
PL0122
Simtek Corporation
August 07
Statement of Material Content
Ceramic LCC Packages
STK11C68-L
STK12C68-L
STK14C88-L
This package type is not available in a lead-free version.
Detail
Unit
28 350 LEADLESS CHIP CARRIER
32 450 LEADLESS CHIP CARRIER
ASSEMBLY MATERIALS
Die Attach
Manufacturer
Die Attach Type
Die Attach Thickness
Die Thickness
Die Coating
Wire Bond Material
Wire Bond Diameter
JMI 7000
Johnson Matthey
Silver Glass
mil 0.5 - 1.0 mil
mil 19 mil
None
Al 99.99%
mil 1.25 mil
JMI 7000
Johnson Matthey
Silver Glass
0.5 - 1.0 mil
19 mil
None
Al 99.99%
1.25 mil
P596-0501-0202
Non Contact
Complete Saw Through
CO2 bubbler
High Power. 100%
High Power. 45 C=0
Manual
150-160°C, 10-30 minutes
Automatic
Reverse
Ball
Stitch
Low & High Power. 100%
Low & High Power. 45 C=0
Furnace / Nitrogen
°C Peak 420+/-5°C
min Dwell 7-10 Minutes @ 410°C
min Rise 60.5 Min 100-400°C
Cool 2.0-3.5 minutes 400-200°C
Markem 4489 White
[lot #] [assembly country]
150°C+10°C -0°C 1hr +30 -0 minutes
100% 10 cycles, -65°C to +150°C
100% 30KG
P596-0501-0202
Non Contact
Complete Saw Through
CO2 bubbler
High Power. 100%
High Power. 45 C=0
Manual
150-160°C, 10-30 minutes
Automatic
Reverse
Ball
Stitch
Low & High Power. 100%
Low & High Power. 45 C=0
Furnace / Nitrogen
Peak 420+/-5°C
Dwell 7-10 Minutes @ 410°C
Rise 60.5 Min 100-400°C
Cool 2.0-3.5 minutes 400-200°C
Markem 4489 White
[lot #] [assembly country]
150°C+10°C -0°C 1hr +30 -0 minutes
100% 10 cycles, -65°C to +150°C
100% 30KG
ASSEMBLY PROCESS FLOW
Flow ID
Wafer Mount
Scribe Method
Saw/Clean
2nd optical
2nd optical QA
Die Attach Method
Die Attach Cure
Bonder: Manual/Auto
Bond Type: Forward/Reverse
Bond Type: At The Die
Bond Type: At The Paddle
3rd Optical
3rd Optical QA
Seal Method/Atmosphere
Lid Seal Temp Profile
Marking Ink
Backside Mark
Ink Cure
Temp Cycle
Centrifuge
Fine Leak
Gross Leak
Final Visual QA
Pack & Ship
100% He 5x10-8 atm cc/sec
100% 5torr 0.5H 75psig 1H
100%
45, C=0
100% He 5x10-8 atm cc/sec
100% 5torr 0.5H 75psig 1H
100%
45, C=0
Amkor Procedure
Amkor Procedure
Amkor Procedure
Amkor Procedure
Amkor Procedure
Amkor Procedure
10,000 In D/A, Wire Bond Areas
Amkor Procedure
Amkor Procedure
Amkor Procedure
Amkor Procedure
Amkor Procedure
Amkor Procedure
10,000 In D/A, Wire Bond Areas
PROCESS MONITORS
Wire Bond Monitor
Die Attach Monitor
Lid Seal Monitor
PIND Monitor
Lead Trim Monitor
Seal Area Particulate Monitor
Area Particle Count Limits
PL0122
Simtek Corporation
August 07