TC74HCT374AP/AF TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74HCT374AP,TC74HCT374AF Octal D-Type Flip-Flop with 3-State Output The TC74HCT374A is high speed CMOS OCTAL FLIP-FLOP with 3-STATE OUTPUT fabricated with silicon gate C2MOS technology. It achieves the high speed operation similar to equivalent LSTTL while maintaining the CMOS low power dissipation. Their inputs are compatible with TTL, NMOS, and CMOS output voltage levels. This 8-bit D-type flip-flop is controlled by a clock input (CK) and an output enable input ( OE ). All inputs are equipped with protection circuits against static discharge or transient excess voltage. TC74HCT374AP TC74HCT374AF Features • High speed: fmax = 62 MHz (typ.) at VCC = 5 V • Low power dissipation: ICC = 4 μA (max) at Ta = 25°C • Compatible with TTL outputs: VIH = 2 V (min) VIL = 0.8 V (max) • Wide interfacing ability: LSTTL, NMOS, CMOS • Output drive capability: 15 LSTTL loads • • Symmetrical output impedance: |IOH| = IOL = 6 mA (min) Balanced propagation delays: tpLH ∼ − tpHL • Pin and function compatible with 74LS374 Weight DIP20-P-300-2.54A SOP20-P-300-1.27A : 1.30 g (typ.) : 0.22 g (typ.) Pin Assignment 1 2007-10-01 TC74HCT374AP/AF IEC Logic Symbol Truth Table Inputs Output OE CK D Q H X X Z L X Qn L L L L H H X: Don’t care Z: High impedance Qn: No change System Diagram 2 2007-10-01 TC74HCT374AP/AF Absolute Maximum Ratings (Note 1) Characteristics Supply voltage range Symbol Rating Unit VCC −0.5~7 V VIN −0.5~VCC + 0.5 V VOUT −0.5~VCC + 0.5 V Input diode current IIK ±20 mA Output diode current IOK ±20 mA DC output current IOUT ±35 mA DC VCC/ground current ICC ±75 mA Power dissipation PD 500 (DIP) (Note 2)/180 (SOP) mW Storage temperature Tstg −65~150 °C DC input voltage DC output voltage Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: 500 mW in the range of Ta = −40 to 65°C. From Ta = 65 to 85°C a derating factor of −10 mW/°C shall be applied until 300 mW. Operating Ranges (Note) Characteristics Supply voltage Input voltage Symbol Rating Unit VCC 4.5~5.5 V VIN 0~VCC V VOUT 0~VCC V Operating temperature Topr −40~85 °C Input rise and fall time tr, tf 0~500 ns Output voltage Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Electrical Characteristics DC Characteristics Characteristics Symbol Ta = 25°C Test Condition Ta = −40~85°C VCC (V) Min Typ. Max Min Max Unit High-level input voltage VIH ⎯ 4.5~5.5 2.0 ⎯ ⎯ 2.0 ⎯ V Low-level input voltage VIL ⎯ 4.5~5.5 ⎯ ⎯ 0.8 ⎯ 0.8 V High-level output voltage VOH IOH = −20 μA VIN = VIH or VIL I OH = −6 mA Low-level output voltage VOL IOL = 20 μA VIN = VIH or VIL I = 6 mA OL 3-state output off-state current IOZ Input leakage current IIN Quiescent supply current ICC IC 4.5 4.4 4.5 ⎯ 4.4 ⎯ 4.5 4.18 4.31 ⎯ 4.13 ⎯ 4.5 ⎯ 0.0 0.1 ⎯ 0.1 4.5 ⎯ 0.17 0.26 ⎯ 0.33 5.5 ⎯ ⎯ ±0.5 ⎯ ±5.0 μA VIN = VCC or GND 5.5 ⎯ ⎯ ±0.1 ⎯ ±1.0 μA VIN = VCC or GND 5.5 ⎯ ⎯ 4.0 ⎯ 40.0 μA Per input: VIN = 0.5 V or 2.4 V Other input: VCC or GND 5.5 ⎯ ⎯ 2.0 ⎯ 2.9 mA VIN = VIH or VIL VOUT = VCC or GND 3 V V 2007-10-01 TC74HCT374AP/AF Timing Requirements (input: tr = tf = 6 ns) Characteristics Symbol Minimum pulse width tW (H) (CK) tW (L) Minimum set-up time (Dn) Minimum hold time (Dn) Clock frequency Ta = 25°C Test Condition ⎯ ts ⎯ th ⎯ f ⎯ Ta = −40 ~85°C VCC (V) Typ. Limit Limit 4.5 ⎯ 15 19 5.5 ⎯ 14 17 4.5 ⎯ 15 19 5.5 ⎯ 14 17 4.5 ⎯ 0 0 5.5 ⎯ 0 0 4.5 ⎯ 31 25 5.5 ⎯ 37 30 Unit ns ns ns MHz AC Characteristics (input: tr = tf = 6 ns) Characteristics Output transition time (CK-Q) tpHL Output disable time ⎯ tTHL tpLH Output enable time CL (pF) VCC (V) tTLH Propagation delay time tpZL tpZH tpLZ tpHZ Ta = 25°C Test Condition Symbol 50 50 ⎯ 150 50 RL = 1 kΩ 150 RL = 1 kΩ 50 ⎯ 50 Ta = −40~85°C Min Typ. Max Min Max 4.5 ⎯ 7 12 ⎯ 15 5.5 ⎯ 6 11 ⎯ 14 4.5 ⎯ 20 30 ⎯ 38 5.5 ⎯ 17 25 ⎯ 31 4.5 ⎯ 25 38 ⎯ 48 5.5 ⎯ 22 33 ⎯ 41 4.5 ⎯ 17 30 ⎯ 38 5.5 ⎯ 14 25 ⎯ 31 4.5 ⎯ 25 38 ⎯ 48 5.5 ⎯ 19 33 ⎯ 41 4.5 ⎯ 16 28 ⎯ 35 5.5 ⎯ 14 24 ⎯ 30 4.5 31 50 ⎯ 25 ⎯ 5.5 37 59 ⎯ 30 ⎯ Unit ns ns ns ns Maximum clock frequency fmax Input capacitance CIN ⎯ ⎯ 5 10 ⎯ 10 pF COUT ⎯ ⎯ 10 ⎯ ⎯ ⎯ pF ⎯ ⎯ 48 ⎯ ⎯ ⎯ pF Output capacitance Power dissipation capacitance Note: CPD (Note) MHz CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD･VCC･fIN + ICC/8 (per F/F) And the total CPD when n pcs. of flip flop operate can be gained by the following equation: CPD (total) = 30 + 18･n 4 2007-10-01 TC74HCT374AP/AF Package Dimensions Weight: 1.30 g (typ.) 5 2007-10-01 TC74HCT374AP/AF Package Dimensions Weight: 0.22 g (typ.) 6 2007-10-01 TC74HCT374AP/AF RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-10-01