MOSEL V58C3643204SAT

MOSEL VITELIC
V58C3643204SAT
HIGH PERFORMANCE
3.3 VOLT 2M X 32 DDR SDRAM
4 X 512K X 32
System Frequency (fCK)
45
50
55
60
225MHz
200 MHz
183 MHz
166 MHz
5 ns
5.5 ns
6 ns
Clock Cycle Time (tCK3)
Clock Cycle Time (tCK4)
PRELIMINARY
4.5 ns
Features
Description
■ 4 banks x 512K x 32 organization
■ High speed data transfer rates with system
frequency up to 225 MHz
■ Data Mask for Write Control (DM)
■ Four Banks controlled by BA0 & BA1
■ Programmable CAS Latency: 3, 4
■ Programmable Wrap Sequence: Sequential
or Interleave
■ Programmable Burst Length:
2, 4, 8 full page for Sequential Type
2, 4, 8 full page for Interleave Type
■ Automatic and Controlled Precharge Command
■ Suspend Mode and Power Down Mode
■ Auto Refresh and Self Refresh
■ Refresh Interval: 2048 cycles/16ms
■ Available in 100-pin TQFP
■ SSTL-2 Compatible I/Os
■ Double Data Rate (DDR)
■ Bidirectional Data Strobe (DQs) for input and
output data, active on both edges
■ On-Chip DLL aligns DQ and DQs transitions with
CLK transitions
■ Differential clock inputs CLK and CLK
■ Power Supply 3.3V ± 0.3V
The V58C3643204SAT is a four bank DDR
DRAM organized as 4 banks x 512K x 32. The
V58C3643204SAT achieves high speed data
transfer rates by employing a chip architecture that
prefetches multiple bits and then synchronizes the
output data to a system clock
All of the control, address, circuits are synchronized with the positive edge of an externally supplied clock. I/O transactions are possible on both
edges of DQS.
Operating the four memory banks in an interleaved fashion allows random access operation to
occur at a higher rate than is possible with standard
DRAMs. A sequential and gapless data rate is possible depending on burst length, CAS latency and
speed grade of the device.
Device Usage Chart
Operating
Temperature
Range
Package Outline
100-pin TQFP
-45
-50
-55
-60
Std.
L
Temperature
Mark
0°C to 70°C
•
•
•
•
•
•
•
Blank
V58C3643204SAT Rev. 1.4 August 2001
CLK Cycle Time (ns)
1
Power
MOSEL VITELIC
V58C3643204SAT
Block Diagram
Row Addresses
Column Addresses
A0 - A7, AP, BA0, BA1
Row address
buffer
Column address
buffer
Refresh Counter
Row decoder
Row decoder
Memory array
Memory array
Memory array
Memory array
Bank 0
512K x 32
Bank 1
512K x 32
Input buffer
Column decoder
Sense amplifier & I(O) bus
Row decoder
Column decoder
Sense amplifier & I(O) bus
Row decoder
Column decoder
Sense amplifier & I(O) bus
Column decoder
Sense amplifier & I(O) bus
Column address
counter
A0 - A10, BA0, BA1
Bank 2
512K x 32
Output buffer
Bank 3
512K x 32
Control logic & timing generator
Strobe
Gen.
Data Strobe
V58C3643204SAT Rev. 1.4 August 2001
2
WE
CAS
CS
RAS
CKE
DM0-DM3
DQS
DLL
CLK
CLK, CLK
CLK
DQ0-DQ
MOSEL VITELIC
V58C3643204SAT
DQ28
VDDQ
DQ27
DQ26
VSSQ
DQ25
DQ24
VDDQ
DQ15
DQ14
VSSQ
DQ13
DQ12
VDDQ
VSS
VDD
DQ11
DQ10
VSSQ
DQ9
DQ8
VDDQ
VREF
DM3
DM1
CLK
CLK
CKE
MCL
A8(AP)
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
Top View
80
100 Pin TQFP
PIN CONFIGURATION
DQ29
81
50
A7
VSSQ
82
49
A6
DQ30
83
48
A5
DQ31
84
47
A4
VSS
85
46
VSS
VDDQ
86
45
A9
N.C
87
44
N.C
N.C
88
43
N.C
N.C
89
42
N.C
N.C
90
41
N.C
N.C
91
40
N.C
VSSQ
92
39
N.C
RFU
93
38
N.C
DQS
94
37
N.C
VDDQ
95
36
A10
VDD
96
35
VDD
DQ0
97
34
A3
DQ1
98
33
A2
VSSQ
99
32
A1
100
31
A0
20 x 14 mm2
15
16
17
18
19
20
21
22
23
24
VDD
VSS
DQ20
DQ21
VSSQ
DQ22
DQ23
VDDQ
DM0
DM2
30
14
VDDQ
BA1
13
DQ19
29
12
DQ18
BA0
11
VSSQ
28
10
DQ17
CS
9
DQ16
27
8
VDDQ
RAS
7
DQ7
26
6
DQ6
CAS
5
VSSQ
25
4
DQ5
WE
3
2
DQ4
1
DQ3
0.65mm pin Pitch
VDDQ
DQ2
100 Pin TQFP
Pin Names
CLK, CLK
Differential Clock Input
DQ0–DQ7
Data Input/Output
CKE
Clock Enable
DM0-DM3
Data Mask
CS
Chip Select
VDD
Power (3.3V ± 0.3V)
RAS
Row Address Strobe
VSS
Ground
CAS
Column Address Strobe
VDDQ
Power for I/O’s (+2.5V)
WE
Write Enable
VSSQ
Ground for I/O’s
DQS
Data Strobe (Bidirectional)
NC
Not connected
A0–A10
Address Inputs
VREF
Reference Voltage for Inputs
BA0, BA1
Bank Select
RFU
Reserved for future use.
V58C3643204SAT Rev. 1.4 August 2001
3
MOSEL VITELIC
V58C3643204SAT
Signal Pin Description
Pin
Type
Signal
Polarity
Function
CLK
CLK
Input
Pulse
Positive
Edge
The system clock input. All inputs except DQs and DMs are sampled on the rising edge
of CLK.
CKE
Input
Level
Active High Activates the CLK signal when high and deactivates the CLK signal when low, thereby
initiates either the Power Down mode, Suspend mode, or the Self Refresh mode.
CS
Input
Pulse
Active Low CS enables the command decoder when low and disables the command decoder when
high. When the command decoder is disabled, new commands are ignored but previous
operations continue.
RAS, CAS
WE
Input
Pulse
Active Low When sampled at the positive rising edge of the clock, CAS, RAS, and WE define the
command to be executed by the SDRAM.
DQS
Input/
Output
Pulse
Active High Active on both edges for data input and output.
Center aligned to input data
Edge aligned to output data
A0 - A10
Input
Level
—
During a Bank Activate command cycle, A0-A10 defines the row address (RA0-RA10)
when sampled at the rising clock edge.
During a Read or Write command cycle, A0-An defines the column address (CA0-CAn)
when sampled at the rising clock edge. CAn depends from the SDRAM organization:
2M x 32 SDRAM CAn = CA7 (Page)
In addition to the column address, A8 is used to invoke autoprecharge operation at the
end of the burst read or write cycle. If A8 is high, autoprecharge is selected and BA0, BA1
defines the bank to be precharged. If A8 is low, autoprecharge is disabled.
During a Precharge command cycle, A8(=AP) is used in conjunction with BA0 and BA1
to control which bank(s) to precharge. If A10 is high, all four banks will be precharged
simultaneously regardless of state of BA0 and BA1.
BA0,
BA1
Input
Level
—
Selects which bank is to be active.
DQx
Input/
Output
Level
—
Data Input/Output pins operate in the same manner as on conventional DRAMs.
DM0-DM3
Input
Pulse
Active High In Write mode, DM has a latency of zero and operates as a word mask by allowing input
data to be written if it is low but blocks the write operation if is high.
VDD, VSS Supply
Power and ground for the input buffers and the core logic.
VDDQ
VSSQ
Supply
—
—
Isolated power supply and ground for the output buffers to provide improved noise
immunity.
VREF
Input
Level
—
SSTL Reference Voltage for Inputs
V58C3643204SAT Rev. 1.4 August 2001
4
MOSEL VITELIC
V58C3643204SAT
Auto Precharge Operation
The Auto Precharge operation can be issued by having column address A8 high when a Read or Write command is issued. If A10 is low when a Read or Write command is issued, then normal Read or Write burst operation is executed and the bank remains active at the completion of the burst sequence. When the Auto
Precharge command is activated, the active bank automatically begins to precharge at the earliest possible
moment during the Read or Write cycle once tRAS(min) is satisfied.
Read with Auto Precharge
If a Read with Auto Precharge command is initiated, the DDR SDRAM will enter the precharge operation
N-clock cycles measured from the last data of the burst read cycle where N is equal to the CAS latency programmed into the device. Once the autoprecharge operation has begun, the bank cannot be reactivated until
the minimum precharge time (tRP) has been satisfied.
Read with Autoprecharge Timing
(CAS Latency = 2; Burst Length = 4)
T0
T1
T2
T3
T4
T5
T6
T7
tRAS(min)
T8
T9
tRP(min)
CK, CK
Command
BA
NOP
R w/AP
NOP
NOP
NOP
NOP
NOP
BA
DQS
D0
DQ
D1
D2
D3
Begin Autoprecharge
Earliest Bank A reactivate
V58C3643204SAT Rev. 1.4 August 2001
5
MOSEL VITELIC
V58C3643204SAT
DC Characteristics
Recommended operating conditions Unless Otherwise Noted, TA=0 to 70°C
Version
Parameter
Operating Current
(One Bank Active)
Symbol
Test Condition
-45
-50
-55
-60
350
340
330
330
Unit Note
ICC1
Burst Lenth = 2 tRC Š tRC(min)
IOL= 0mA, tCC = tCC(min)
Precharge Standby Current in
Power-down mode
ICC2P
CKE ð VIL(max), tCC = tCC(min)
Precharge Standby Current in Non
Power-down mode
ICC2N
CKE ð VIH(min), CS Š VIH(min),
tCC = tCC(min)
Active Standby Current power-down mode
ICC3P
CKE ð VIL(max), tCC = tCC(min)
Active Standby Current in in Non
Power-down mode
ICC3N
CKE Š VIH(min), CS Š VIH(min),
tCC = tCC(min)
205
200
195
190
mA
60
165
160
mA
1
mA
155
150
95
mA
mA
Operating Current
(Burst Mode)
ICC4
IOL = 0mA, tCC = tCC(min),
Page Burst, All Banks activated
470
450
430
410
mA
1
Refresh Current
ICC5
tRC Š tRFC(min)
470
450
430
410
mA
2
Self Refresh Current
ICC6
CKE ð 0.2V
4
mA
Notes: 1. Measured with outputs open.
2. Refresh period is 16ms.
Absolute Maximum Ratings
Parameter
Symbol
Value
Unit
Voltage on any pin relative to VSS
VIN , VOUT
-1.0 ~ 4.6
V
Voltage on VDD supply relative to VSS
VDD, VDDQ
-1.0 ~ 4.6
V
TSTG
-55 ~ +150
°C
Power dissipation
PD
1.6
W
Short circuit current
IOS
50
mA
Storage temperature
Note: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
V58C3643204SAT Rev. 1.4 August 2001
6
MOSEL VITELIC
V58C3643204SAT
Power & DC Operating Conditions (SSTL_2 In/Out)
Recommended operating conditions (Voltage referenced to VSS=0V, TA=0 to 65°C)
Parameter
Symbol
Min
Typ
Max
Unit
Device Supply voltage
VDD
3.135
3.3
3.465
V
Output Supply voltage
VDDQ
2.375
2.50
2.625
V
Reference voltage
VREF
0.49*VDDQ
-
0.51*VDDQ
V
Termination voltage
Vtt
VREF-0.04
VREF
V REF+0.04
V
Input logic high voltage
VIH
VREF+0.15
-
VDDQ+0.30
V
Input logic low voltage
VIL
-0.30
-
VREF-0.15
V
Output logic high voltage IOH = -15.2mA
VOH
Vtt+0.76
-
-
V
Output logic low voltage
VOL
-
-
Vtt-0.76
V
Input leakage current
IIL
-5
-
5
µA
Output leakage current
IOL
-5
-
5
µA
AC Input Operating Conditions
Recommended operating conditions
(Voltage referenced to VSS=0V, VDD=3.3V+ 5%, VDDQ=2.5V+ 5%, TA=0 to 65°C)
Parameter
Symbol
Min
Typ
Max
Unit
Input High (Logic 1) Voltage; DQ
VIH
VREF+0.35
-
-
V
Input Low (Logic 0) Voltage; DQ
VIL
-
-
VREF -0.35
V
Clock Input Differential Voltage; CK and CK
VID
0.7
-
VDDQ+0.6
V
Clock Input Crossing Point Voltage; CK and CK
VIX
0.5*VDDQ-0.2
-
0.5*VDDQ+0.2
V
SSTL_2 AC Test Conditions
Symbol
Parameter
Value
Units
Notes
0.5*VDDQ
V
1
VREF
Input Reference Voltage
V SWING (max)
Input Signal Maximum Peak to Peak Swing
1.5
V
1, 2
SLEW
Input Signal Minimum Slew Rate
1.0
V/ns
3
Notes: 1. Input waveform timing is referenced to the input signal crossing the VREF level applied to the device.
2. Compliant devices must still meet the VIH (AC) and VIL (AC) specifications under actual use conditions.
3. The 1 V/ns input signal minimum slew rate is to be maintained in the VIL max (AC) to VIL min (AC) range of the input
signal swing.
V58C3643204SAT Rev. 1.4 August 2001
7
MOSEL VITELIC
V58C3643204SAT
SSTL_2 Output Buffers
■
■
■
■
The input voltage provided to the receiver depends on three parameters:
VDDQ and current drive capabilities of the output buffer
Termination voltage
Termination resistance
VDDQ ð VDD
Class II SSTL_2 Output Buffer (Driver)
VDDQ
VTT = 0.5 *VDDQ
RT=50Ω
Output
Buffer
Receiver
VREF
VOUT
CLOAD = 30pF
VIN
VSSQ
Capacitance (VDD = 3.3V, TA = 25°C, f = 1MHz)
Parameter
Symbol
Min
Max
Unit
Input capacitance (A0~A10, BA0~BA1)
CIN1
2.5
4.5
pF
Input capacitance
( CK, CK, CKE, CS, RAS, CAS, WE )
CIN2
2.5
5.0
pF
Data & DQS input/output capacitance (DQ 0~DQ31)
COUT
2.5
5.5
pF
Input capacitance (DM0 ~ DM3)
CIN3
2.5
5.5
pF
V58C3643204SAT Rev. 1.4 August 2001
8
MOSEL VITELIC
V58C3643204SAT
AC Characteristics
-45
Parameter
CK cycle time
Symbol
CL=3
tCK
CL=4
-50
-55
-60
Min
Max
Min
Max
Min
Max
Min
•
7
5 .0
7
5.5
7
6 .0
4.5
•
•
Max Unit
7
•
ns
ns
CK high level width
tCH
0.45
0.55
0.45
0.55
0.45
0.55
tCK
CK low level width
tCL
0.45
0.55
0.45
0.55
0.45
0.55
tCK
DQS out access time from CK
tDQSCK
-0.70
+0.70
-0.70
+0.70
-0.75
+0.75
-0.75
+0.75
ns
Output access time from CK
tAC
-0.70
+0.70
-0.70
+0.70
-0.75
+0.75
-0.75
+0.75
ns
Data strobe edge to output data edge
tDQSQ
-
0.5
-
0.5
-
0.5
ns
Read preamble
tRPRE
0.9
1.1
0.9
1.1
0.9
1.1
tCK
Read postamble
tRPST
0.4
0.6
0.4
0.6
0.4
0.6
tCK
CK to valid DQS-in
tDQSS
0.75
1.25
0.75
1.25
0.75
1.25
tCK
DQS-In setup time
tWPRES
0
-
0
-
0
-
ns
DQS-in hold time
tWPREH
0.25
-
0.25
-
0.25
-
tCK
DQS write postamble
tWPST
0.4
0.6
0.4
0.6
0.4
0.6
tCK
DQS-In high level width
tDQSH
0.4
0.6
0.4
0.6
0.4
0.6
tCK
DQS-In low level width
tDQSL
0.4
0.6
0.4
0.6
0.4
0.6
tCK
Address and Control input setup time
tIS
1.2
-
1.2
-
1.2
-
ns
Address and Control input hold time
tIH
0.9
-
0.9
-
0.9
-
ns
DQ and DM setup time to DQS
tDS
0.5
-
0.5
-
0.5
-
ns
DQ and DM hold time to DQS
tDH
0.5
-
0.5
-
0.5
-
ns
Clock half period
tHP
tCLmin or
tCHmin
-
tCLmin or
tCHmin
-
tCLmin or
tCHmin
-
ns
Output DQS valid window
tQH
tHP0.75ns
-
tHP0.75ns
-
tHP0.75ns
-
ns
Row cycle time
tRC
58
60
60.5
60
ns
Refresh row cycle time
tRFC
69
70
71.5
72
ns
Row active time
tRAS
RAS to CAS delay
tRCD
18
Row precharge time
tRP
Row active to Row active delay
tRRD
Last data in to Row precharge
Last data in to Read command delay
40
100K
44
100K
48
100K
ns
20
22
24
ns
12
20
16.5
18
ns
9
14
11
12
ns
tWR
2
2
2
2
tCK
tCDLR
2
2
2
2
tCK
Col. address to Col. address delay
tCCD
1
1
1
1
tCK
Mode register set cycle time
tMRD
2
2
2
2
tCK
Power down exit time
tPEDX
1tCK+tIS
1tCK+tIS
1tCK+tIS
ns
70
71.5
72
ns
200
200
6
5
5
tCK
7.8
7.8
7.8
µs
Self refresh exit to active command delay tXSA
69
Self refresh exit to read command delay tXSR
Auto precharge write recovery +
Precharge
tDAL
Refresh interval time
tREF
V58C3643204SAT Rev. 1.4 August 2001
6
9
200
tCK
MOSEL VITELIC
V58C3643204SAT
AC Characteristics
V58C3643204SAT-45
Frequency
Cas Latency
tRC
tRFC
tRAS
tRCDRD
tRCDWR
tRP
tRRD
Unit
250MHz (4.5ns)
4
13
15
9
4
2
4
2
tCK
222MHz (5.0ns)
3
12
14
8
4
2
4
2
tCK
183MHz (5.5ns)
3
12
14
8
4
2
4
2
tCK
166MHz (6.0ns)
3
10
12
7
3
2
3
2
tCK
143MHz (7.0ns)
3
9
11
6
3
2
3
2
tCK
V58C3643204SAT-50
Frequency
Cas Latency
tRC
tRFC
tRAS
tRCDRD
tRCDWR
tRP
tRRD
Unit
200MHz (5.0ns)
3
12
14
8
4
2
4
2
tCK
183MHz (5.5ns)
3
12
14
8
4
2
4
2
tCK
166MHz (6.0ns)
3
10
12
7
3
2
3
2
tCK
143MHz (7.0ns)
3
9
11
6
3
2
3
2
tCK
V58C3643204SAT-55
Frequency
Cas Latency
tRC
tRFC
tRAS
tRCDRD
tRCDWR
tRP
tRRD
Unit
183MHz (5.5ns)
3
12
14
8
4
2
4
2
tCK
166MHz (6.0ns)
3
10
12
7
3
2
3
2
tCK
143MHz (7.0ns)
3
9
11
6
3
2
3
2
tCK
V58C3643204SAT-60
Frequency
Cas Latency
tRC
tRFC
tRAS
tRCDRD
tRCDWR
tRP
tRRD
Unit
166MHz (6.0ns)
3
10
12
7
3
2
3
2
tCK
143MHz (7.0ns)
3
9
11
6
3
2
3
2
tCK
V58C3643204SAT Rev. 1.4 August 2001
10
MOSEL VITELIC
V58C3643204SAT
Package Diagram
100-Pin TQFP
Dimensions in Millimeters
0 ~ 7∞
17.20 ± 0.20
14.00 ± 0.10
#100
#1
23.20 ± 0.20
0.575
20.00 ± 0.10
0.825
0.30 ± 0.08
0.13 MAX
0.65
0.09~0.20
1.00 ± 0.10
1.20 MAX *
0.10 MAX
0.05 MIN
0.80 ± 0.20
V58C3643204SAT Rev. 1.4 August 2001
11
MOSEL VITELIC
WORLDWIDE OFFICES
V58C3643204SAT
U.S.A.
TAIWAN
SINGAPORE
UK & IRELAND
3910 NORTH FIRST STREET
SAN JOSE, CA 95134
PHONE: 408-433-6000
FAX: 408-433-0952
7F, NO. 102
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TAIPEI
PHONE: 886-2-2545-1213
FAX: 886-2-2545-1209
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PHONE: 65-3231801
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PARK
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U.S. SALES OFFICES
NORTHWESTERN
SOUTHWESTERN
3910 NORTH FIRST STREET
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© Copyright 2001, MOSEL VITELIC Inc.
The information in this document is subject to change without
notice.
MOSEL VITELIC makes no commitment to update or keep current the information contained in this document. No part of this
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means without the prior written consent of MOSEL-VITELIC.
MOSEL VITELIC
CENTRAL,
NORTHEASTERN &
SOUTHEASTERN
604 FIELDWOOD CIRCLE
RICHARDSON, TX 75081
PHONE: 214-352-3775
FAX: 214-904-9029
8/01
Printed in U.S.A.
MOSEL VITELIC subjects its products to normal quality control
sampling techniques which are intended to provide an assurance
of high quality products suitable for usual commercial applications. MOSEL VITELIC does not do testing appropriate to provide
100% product quality assurance and does not assume any liability for consequential or incidental arising from any use of its products. If such products are to be used in applications in which
personal injury might occur from failure, purchaser must do its
own quality assurance testing appropriate to such applications.
3910 N. First Street, San Jose, CA 95134-1501 Ph: (408) 433-6000 Fax: (408) 433-0952 Tlx: 371-9461