WINBOND W25Q40BVSSIG

W25Q40BV
4M-BIT
SERIAL FLASH MEMORY WITH
DUAL AND QUAD SPI
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
Table of Contents
1.
GENERAL DESCRIPTION ............................................................................................................... 5
2.
FEATURES....................................................................................................................................... 5
3.
PIN CONFIGURATION SOIC 150 / 208-MIL ................................................................................... 6
4.
PAD CONFIGURATION WSON 6X5-MM ........................................................................................ 6
5.
PIN DESCRIPTION SOIC 150/208-MIL, AND WSON 6X5-MM ...................................................... 6
5.1
Package Types..................................................................................................................... 7
5.2
Chip Select (/CS).................................................................................................................. 7
5.3
Serial Data Input, Output and IOs (DI, DO and IO0, IO1, IO2, IO3) .................................... 7
5.4
Write Protect (/WP)............................................................................................................... 7
5.5
HOLD (/HOLD) ..................................................................................................................... 7
5.6
Serial Clock (CLK) ................................................................................................................ 7
6.
BLOCK DIAGRAM............................................................................................................................ 8
7.
FUNCTIONAL DESCRIPTION ......................................................................................................... 9
7.1
7.2
SPI OPERATIONS ............................................................................................................... 9
7.1.1
Standard SPI Instructions.......................................................................................................9
7.1.2
Dual SPI Instructions ..............................................................................................................9
7.1.3
Quad SPI Instructions.............................................................................................................9
7.1.4
Hold Function .........................................................................................................................9
WRITE PROTECTION ....................................................................................................... 10
7.2.1
8.
Write Protect Features..........................................................................................................10
CONTROL AND STATUS REGISTERS ........................................................................................ 11
8.1
8.2
STATUS REGISTER .......................................................................................................... 11
8.1.1
BUSY....................................................................................................................................11
8.1.2
Write Enable Latch (WEL) ....................................................................................................11
8.1.3
Block Protect Bits (BP2, BP1, BP0)......................................................................................11
8.1.4
Top/Bottom Block Protect (TB).............................................................................................11
8.1.5
Sector/Block Protect (SEC) ..................................................................................................11
8.1.6
Complement Protect (CMP) .................................................................................................12
8.1.7
Status Register Protect (SRP1, SRP0).................................................................................12
8.1.8
Erase/Program Suspend Status (SUS) ................................................................................12
8.1.9
Security Register Lock Bits (LB3, LB2, LB1) ........................................................................12
8.1.10
Quad Enable (QE) ..............................................................................................................13
8.1.11
Status Register Memory Protection (CMP = 0)...................................................................14
8.1.12
Status Register Memory Protection (CMP = 1)...................................................................15
INSTRUCTIONS................................................................................................................. 16
8.2.1
Manufacturer and Device Identification ................................................................................16
8.2.2
Instruction Set Table 1 (Erase, Program Instructions) ..........................................................17
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W25Q40BV
9.
8.2.3
Instruction Set Table 2 (Read Instructions) ..........................................................................18
8.2.4
Instruction Set Table 3 (ID, Security Instructions).................................................................19
8.2.5
Write Enable (06h)................................................................................................................20
8.2.6
Write Enable for Volatile Status Register (50h) ....................................................................20
8.2.7
Write Disable (04h)...............................................................................................................21
8.2.8
Read Status Register-1 (05h) and Read Status Register-2 (35h).........................................22
8.2.9
Write Status Register (01h) ..................................................................................................22
8.2.10
Read Data (03h) .................................................................................................................24
8.2.11
Fast Read (0Bh) .................................................................................................................25
8.2.12
Fast Read Dual Output (3Bh) .............................................................................................26
8.2.13
Fast Read Quad Output (6Bh)............................................................................................27
8.2.14
Fast Read Dual I/O (BBh)...................................................................................................28
8.2.15
Fast Read Quad I/O (EBh) .................................................................................................30
8.2.16
Word Read Quad I/O (E7h) ................................................................................................32
8.2.17
Octal Word Read Quad I/O (E3h).......................................................................................34
8.2.18
Set Burst with Wrap (77h) ..................................................................................................36
8.2.19
Continuous Read Mode Bits (M7-0) ...................................................................................37
8.2.20
Continuous Read Mode Reset (FFh or FFFFh) ..................................................................37
8.2.21
Page Program (02h) ...........................................................................................................38
8.2.22
Quad Input Page Program (32h) ........................................................................................39
8.2.23
Sector Erase (20h) .............................................................................................................40
8.2.24
32KB Block Erase (52h) .....................................................................................................41
8.2.25
64KB Block Erase (D8h).....................................................................................................42
8.2.26
Chip Erase (C7h / 60h).......................................................................................................43
8.2.27
Erase / Program Suspend (75h) .........................................................................................44
8.2.28
Erase / Program Resume (7Ah) .........................................................................................45
8.2.29
Power-down (B9h) ..............................................................................................................46
8.2.30
Release Power-down / Device ID (ABh) .............................................................................47
8.2.31
Read Manufacturer / Device ID (90h) .................................................................................49
8.2.32
Read Manufacturer / Device ID Dual I/O (92h) ...................................................................50
8.2.33
Read Manufacturer / Device ID Quad I/O (94h)..................................................................51
8.2.34
Read Unique ID Number (4Bh)...........................................................................................52
8.2.35
Read JEDEC ID (9Fh) ........................................................................................................53
8.2.36
Read SFDP Register (5Ah) ................................................................................................54
8.2.37
Erase Security Registers (44h)...........................................................................................57
8.2.38
Program Security Registers (42h) ......................................................................................58
8.2.39
Read Security Registers (48h)............................................................................................59
ELECTRICAL CHARACTERISTICS .............................................................................................. 60
9.1
Absolute Maximum Ratings................................................................................................ 60
9.2
Operating Ranges .............................................................................................................. 60
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
10.
11.
9.3
Power-up Timing and Write Inhibit Threshold .................................................................... 61
9.4
DC Electrical Characteristics.............................................................................................. 62
9.5
AC Measurement Conditions ............................................................................................. 63
9.6
AC Electrical Characteristics .............................................................................................. 64
9.7
AC Electrical Characteristics (cont’d)................................................................................. 65
9.8
Serial Output Timing........................................................................................................... 66
9.9
Serial Input Timing.............................................................................................................. 66
9.10
Hold Timing ........................................................................................................................ 66
PACKAGE SPECIFICATION.......................................................................................................... 67
10.1
8-Pin SOIC 150-mil (Package Code SN) ........................................................................... 67
10.2
8-Pin SOIC 208-mil (Package Code SS) ........................................................................... 68
10.3
8-Pad WSON 6x5mm (Package Code ZP) ........................................................................ 69
ORDERING INFORMATION .......................................................................................................... 71
11.1
12.
Valid Part Numbers and Top Side Marking........................................................................ 72
REVISION HISTORY...................................................................................................................... 73
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W25Q40BV
1. GENERAL DESCRIPTION
The W25Q40BV (4M-bit) Serial Flash memory provides a storage solution for systems with limited space,
pins and power. The 25Q series offers flexibility and performance well beyond ordinary Serial Flash
devices. They are ideal for code shadowing to RAM, executing code directly from Dual/Quad SPI (XIP)
and storing voice, text and data. The device operates on a single 2.7V to 3.6V power supply with current
consumption as low as 4mA active and 1µA for power-down. All devices are offered in space-saving
packages.
The W25Q40BV array is organized into 2,048 programmable pages of 256-bytes each. Up to 256 bytes
can be programmed at a time. Pages can be erased in groups of 16 (4KB sector erase), groups of 128
(32KB block erase), groups of 256 (64KB block erase) or the entire chip (chip erase). The W25Q40BV
has 128 erasable sectors and 8 erasable blocks respectively. The small 4KB sectors allow for greater
flexibility in applications that require data and parameter storage. (See figure 2.)
The W25Q40BV supports the standard Serial Peripheral Interface (SPI), and a high performance
Dual/Quad output as well as Dual/Quad I/O SPI: Serial Clock, Chip Select, Serial Data I/O0 (DI), I/O1
(DO), I/O2 (/WP), and I/O3 (/HOLD). SPI clock frequencies of up to 104MHz are supported allowing
equivalent clock rates of 208MHz (104MHz x 2) for Dual I/O and 416MHz (104MHz x 4) for Quad I/O
when using the Fast Read Dual/Quad I/O instructions. These transfer rates can outperform standard
Asynchronous 8 and 16-bit Parallel Flash memories. The Continuous Read Mode allows for efficient
memory access with as few as 8-clocks of instruction-overhead to read a 24-bit address, allowing true
XIP (execute in place) operation.
A Hold pin, Write Protect pin and programmable write protection, with top, bottom or complement array
control, provide further control flexibility. Additionally, the device supports JEDEC standard manufacturer
and device identification with a 64-bit Unique Serial Number.
2. FEATURES
• Family of SpiFlash Memories
– W25Q40BV: 4M-bit/512K-byte (524,288)
– 256-byte per programmable page
– Standard SPI: CLK, /CS, DI, DO, /WP, /Hold
– Dual SPI: CLK, /CS, IO0, IO1, /WP, /Hold
– Quad SPI: CLK, /CS, IO0, IO1, IO2, IO3
• Highest Performance Serial Flash
– 104MHz Dual/Quad SPI clocks
– 208/416MHz equivalent Dual/Quad SPI
– 50MB/S continuous data transfer rate
– Up to 8X that of ordinary Serial Flash
– More than 100,000 erase/program cycles
– More than 20-year data retention
• Efficient “Continuous Read Mode”
– Low Instruction overhead
– Continuous Read with 8/16/32/64-Byte Wrap
– As few as 8 clocks to address memory
– Allows true XIP (execute in place) operation
– Outperforms X16 Parallel Flash
• Low Power, Wide Temperature Range
– Single 2.7 to 3.6V supply
– 4mA active current, <1µA Power-down current
– -40°C to +85°C operating range
• Flexible Architecture with 4KB sectors
– Uniform Sector Erase (4K-bytes)
– Uniform Block Erase (32K and 64K-bytes)
– Program one to 256 bytes
– Erase/Program Suspend & Resume
• Advanced Security Features
– Software and Hardware Write-Protect
– Top/Bottom, 4KB complement array protection
– Lock-Down and OTP array protection
– 64-Bit Unique Serial Number for each device
– Discoverable Parameters (SFDP) Register
– 3X256-Byte Security Registers with OTP locks
– Volatile & Non-volatile Status Register Bits
• Space Efficient Packaging
– 8-pin SOIC 150/208-mil
– 8-pad WSON 6x5-mm
– Contact Winbond for KGD and other options
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
3. PIN CONFIGURATION SOIC 150 / 208-MIL
/CS
1
8
VCC
DO (IO1)
2
7
/HOLD (IO3)
/WP (IO2)
3
6
CLK
GND
4
5
DI (IO0)
Figure 1a. W25Q40BV Pin Assignments, 8-pin SOIC 150 / 208-mil (Package Code SN & SS)
4. PAD CONFIGURATION WSON 6X5-MM
/CS
1
8
VCC
DO (IO1)
2
7
/HOLD (IO3)
/WP (IO2)
3
6
CLK
GND
4
5
DI (IO0)
Figure 1b. W25Q40BV Pad Assignments, 8-pad WSON 6x5-mm (Package Code ZP)
5. PIN DESCRIPTION SOIC 150/208-MIL, AND WSON 6X5-MM
PIN NO.
PIN NAME
I/O
FUNCTION
1
/CS
I
2
DO (IO1)
I/O
Data Output (Data Input Output 1)*1
3
/WP (IO2)
I/O
Write Protect Input ( Data Input Output 2)*2
4
GND
5
DI (IO0)
I/O
6
CLK
I
7
/HOLD (IO3)
I/O
8
VCC
Chip Select Input
Ground
Data Input (Data Input Output 0)*1
Serial Clock Input
2
Hold Input (Data Input Output 3)*
Power Supply
*1 IO0 and IO1 are used for Standard and Dual SPI instructions
*2 IO0 – IO3 are used for Quad SPI instructions
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W25Q40BV
5.1
Package Types
W25Q40BV is offered in an 8-pin plastic 150-mil or 208-mil width SOIC (package code SN & SS) and
6x5-mm WSON (package code ZP) as shown in figure 1a and 1b respectively. Package diagrams and
dimensions are illustrated at the end of this datasheet.
5.2 Chip Select (/CS)
The SPI Chip Select (/CS) pin enables and disables device operation. When /CS is high the device is
deselected and the Serial Data Output (DO, or IO0, IO1, IO2, IO3) pins are at high impedance. When
deselected, the devices power consumption will be at standby levels unless an internal erase, program or
write status register cycle is in progress. When /CS is brought low the device will be selected, power
consumption will increase to active levels and instructions can be written to and data read from the
device. After power-up, /CS must transition from high to low before a new instruction will be accepted.
The /CS input must track the VCC supply level at power-up (see “Write Protection” and figure 38). If
needed a pull-up resister on /CS can be used to accomplish this.
5.3 Serial Data Input, Output and IOs (DI, DO and IO0, IO1, IO2, IO3)
The W25Q40BV supports standard SPI, Dual SPI and Quad SPI operation. Standard SPI instructions use
the unidirectional DI (input) pin to serially write instructions, addresses or data to the device on the rising
edge of the Serial Clock (CLK) input pin. Standard SPI also uses the unidirectional DO (output) to read
data or status from the device on the falling edge of CLK.
Dual and Quad SPI instructions use the bidirectional IO pins to serially write instructions, addresses or
data to the device on the rising edge of CLK and read data or status from the device on the falling edge of
CLK. Quad SPI instructions require the non-volatile Quad Enable bit (QE) in Status Register-2 to be set.
When QE=1, the /WP pin becomes IO2 and /HOLD pin becomes IO3.
5.4 Write Protect (/WP)
The Write Protect (/WP) pin can be used to prevent the Status Register from being written. Used in
conjunction with the Status Register’s Block Protect (CMP, SEC, TB, BP2, BP1 and BP0) bits and Status
Register Protect (SRP) bits, a portion as small as a 4KB sector or the entire memory array can be
hardware protected. The /WP pin is active low. When the QE bit of Status Register-2 is set for Quad I/O,
the /WP pin function is not available since this pin is used for IO2. See figure 1a & 1b for the pin
configuration of Quad I/O operation.
5.5 HOLD (/HOLD)
The /HOLD pin allows the device to be paused while it is actively selected. When /HOLD is brought low,
while /CS is low, the DO pin will be at high impedance and signals on the DI and CLK pins will be ignored
(don’t care). When /HOLD is brought high, device operation can resume. The /HOLD function can be
useful when multiple devices are sharing the same SPI signals. The /HOLD pin is active low. When the
QE bit of Status Register-2 is set for Quad I/O, the /HOLD pin function is not available since this pin is
used for IO3. See figure 1a and 1b for the pin configuration of Quad I/O operation.
5.6 Serial Clock (CLK)
The SPI Serial Clock Input (CLK) pin provides the timing for serial input and output operations. ("See SPI
Operations")
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
6. BLOCK DIAGRAM
SFDP Register
000000h
Security Register 1 - 3
0000FFh
003000h
002000h
001000h
Block Segmentation
xxFF00h
•
xxF000h
Sector 15 (4KB)
xxFFFFh
•
xxF0FFh
xxEF00h
•
xxE000h
Sector 14 (4KB)
xxEFFFh
•
xxE0FFh
xxDF00h
•
xxD000h
Sector 13 (4KB)
xxDFFFh
•
xxD0FFh
07FF00h
•
070000h
Block 7 (64KB)
07FFFFh
•
0700FFh
Sector 2 (4KB)
xx2FFFh
•
xx20FFh
xx1F00h
•
xx1000h
Sector 1 (4KB)
xx1FFFh
•
xx10FFh
xx0F00h
•
xx0000h
Sector 0 (4KB)
xx0FFFh
•
xx00FFh
Write Protect Logic and Row Decode
xx2F00h
•
xx2000h
04FF00h
•
040000h
Block 4 (64KB)
04FFFFh
•
0400FFh
03FF00h
•
030000h
Block 3 (64KB)
03FFFFh
•
0300FFh
Write Control
Logic
•
•
•
Status
Register
High Voltage
Generators
/HOLD (IO3)
CLK
/CS
DI (IO0)
DO (IO1)
SPI
Command &
Control Logic
Page Address
Latch / Counter
01FF00h
•
010000h
Block 1 (64KB)
01FFFFh
•
0100FFh
00FF00h
•
000000h
Block 0 (64KB)
00FFFFh
•
0000FFh
Beginning
Page Address
Ending
Page Address
Column Decode
And 256-Byte Page Buffer
Data
Byte Address
Latch / Counter
Figure 2. W25Q40BV Serial Flash Memory Block Diagram
-8-
W25Q40BV
•
•
•
•
•
•
/WP (IO2)
0030FFh
0020FFh
0010FFh
W25Q40BV
7.
FUNCTIONAL DESCRIPTION
7.1 SPI OPERATIONS
7.1.1 Standard SPI Instructions
The W25Q40BV is accessed through an SPI compatible bus consisting of four signals: Serial Clock
(CLK), Chip Select (/CS), Serial Data Input (DI) and Serial Data Output (DO). Standard SPI instructions
use the DI input pin to serially write instructions, addresses or data to the device on the rising edge of
CLK. The DO output pin is used to read data or status from the device on the falling edge CLK.
SPI bus operation Mode 0 (0,0) and 3 (1,1) are supported. The primary difference between Mode 0 and
Mode 3 concerns the normal state of the CLK signal when the SPI bus master is in standby and data is
not being transferred to the Serial Flash. For Mode 0, the CLK signal is normally low on the falling and
rising edges of /CS. For Mode 3, the CLK signal is normally high on the falling and rising edges of /CS.
7.1.2 Dual SPI Instructions
The W25Q40BV supports Dual SPI operation when using the “Fast Read Dual Output (3Bh)” and “Fast
Read Dual I/O (BBh)” instructions. These instructions allow data to be transferred to or from the device at
two to three times the rate of ordinary Serial Flash devices. The Dual SPI Read instructions are ideal for
quickly downloading code to RAM upon power-up (code-shadowing) or for executing non-speed-critical
code directly from the SPI bus (XIP). When using Dual SPI instructions, the DI and DO pins become
bidirectional I/O pins: IO0 and IO1.
7.1.3 Quad SPI Instructions
The W25Q40BV supports Quad SPI operation when using the “Fast Read Quad Output (6Bh)”, “Fast
Read Quad I/O (EBh)”, “Word Read Quad I/O (E7h)” and “Octal Word Read Quad I/O (E3h)” instructions.
These instructions allow data to be transferred to or from the device six to eight times the rate of ordinary
Serial Flash. The Quad Read instructions offer a significant improvement in continuous and random
access transfer rates allowing fast code-shadowing to RAM or execution directly from the SPI bus (XIP).
When using Quad SPI instructions the DI and DO pins become bidirectional IO0 and IO1, and the /WP
and /HOLD pins become IO2 and IO3 respectively. Quad SPI instructions require the non-volatile Quad
Enable bit (QE) in Status Register-2 to be set.
7.1.4 Hold Function
For Standard SPI and Dual SPI operations, the /HOLD signal allows the W25Q40BV operation to be
paused while it is actively selected (when /CS is low). The /HOLD function may be useful in cases where
the SPI data and clock signals are shared with other devices. For example, consider if the page buffer
was only partially written when a priority interrupt requires use of the SPI bus. In this case the /HOLD
function can save the state of the instruction and the data in the buffer so programming can resume
where it left off once the bus is available again. The /HOLD function is only available for standard SPI and
Dual SPI operation, not during Quad SPI.
To initiate a /HOLD condition, the device must be selected with /CS low. A /HOLD condition will activate
on the falling edge of the /HOLD signal if the CLK signal is already low. If the CLK is not already low the
/HOLD condition will activate after the next falling edge of CLK. The /HOLD condition will terminate on the
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
rising edge of the /HOLD signal if the CLK signal is already low. If the CLK is not already low the /HOLD
condition will terminate after the next falling edge of CLK. During a /HOLD condition, the Serial Data
Output (DO) is high impedance, and Serial Data Input (DI) and Serial Clock (CLK) are ignored. The Chip
Select (/CS) signal should be kept active low for the full duration of the /HOLD operation to avoid resetting
the internal logic state of the device.
7.2
WRITE PROTECTION
Applications that use non-volatile memory must take into consideration the possibility of noise and other
adverse system conditions that may compromise data integrity. To address this concern, the W25Q40BV
provides several means to protect the data from inadvertent writes.
7.2.1
Write Protect Features
•
•
•
•
•
•
Device resets when VCC is below threshold
Time delay write disable after Power-up
Write enable/disable instructions and automatic write disable after erase or program
Software and Hardware (/WP pin) write protection using Status Register
Write Protection using Power-down instruction
Lock Down write protection until next power-up
•
One Time Program (OTP) write protection
*
* Note: This feature is available upon special order. Please contact Winbond for details.
Upon power-up or at power-down, the W25Q40BV will maintain a reset condition while VCC is below the
threshold value of VWI, (See Power-up Timing and Voltage Levels and Figure 38). While reset, all
operations are disabled and no instructions are recognized. During power-up and after the VCC voltage
exceeds VWI, all program and erase related instructions are further disabled for a time delay of tPUW. This
includes the Write Enable, Page Program, Sector Erase, Block Erase, Chip Erase and the Write Status
Register instructions. Note that the chip select pin (/CS) must track the VCC supply level at power-up until
the VCC-min level and tVSL time delay is reached. If needed a pull-up resister on /CS can be used to
accomplish this.
After power-up the device is automatically placed in a write-disabled state with the Status Register Write
Enable Latch (WEL) set to a 0. A Write Enable instruction must be issued before a Page Program, Sector
Erase, Block Erase, Chip Erase or Write Status Register instruction will be accepted. After completing a
program, erase or write instruction the Write Enable Latch (WEL) is automatically cleared to a writedisabled state of 0.
Software controlled write protection is facilitated using the Write Status Register instruction and setting
the Status Register Protect (SRP0, SRP1) and Block Protect (CMP, SEC,TB, BP2, BP1 and BP0) bits.
These settings allow a portion as small as 4KB sector or the entire memory array to be configured as
read only. Used in conjunction with the Write Protect (/WP) pin, changes to the Status Register can be
enabled or disabled under hardware control. See Status Register section for further information.
Additionally, the Power-down instruction offers an extra level of write protection as all instructions are
ignored except for the Release Power-down instruction.
- 10 -
W25Q40BV
8.
CONTROL AND STATUS REGISTERS
The Read Status Register-1 and Status Register-2 instructions can be used to provide status on the
availability of the Flash memory array, if the device is write enabled or disabled, the state of write
protection, Quad SPI setting, Security Register lock status and Erase/Program Suspend status. The Write
Status Register instruction can be used to configure the device write protection features, Quad SPI setting
and Security Register OTP lock. Write access to the Status Register is controlled by the state of the nonvolatile Status Register Protect bits (SRP0, SRP1), the Write Enable instruction, and during
Standard/Dual SPI operations, the /WP pin.
8.1
STATUS REGISTER
8.1.1 BUSY
BUSY is a read only bit in the status register (S0) that is set to a 1 state when the device is executing a
Page Program, Quad Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register or
Erase/Program Security Register instruction. During this time the device will ignore further instructions
except for the Read Status Register and Erase/Program Suspend instruction (see tW, tPP, tSE, tBE, and
tCE in AC Characteristics). When the program, erase or write status/security register instruction has
completed, the BUSY bit will be cleared to a 0 state indicating the device is ready for further instructions.
8.1.2 Write Enable Latch (WEL)
Write Enable Latch (WEL) is a read only bit in the status register (S1) that is set to 1 after executing a
Write Enable Instruction. The WEL status bit is cleared to 0 when the device is write disabled. A write
disable state occurs upon power-up or after any of the following instructions: Write Disable, Page
Program, Quad Page Program, Sector Erase, Block Erase, Chip Erase, Write Status Register, Erase
Security Register and Program Security Register.
8.1.3 Block Protect Bits (BP2, BP1, BP0)
The Block Protect Bits (BP2, BP1, BP0) are non-volatile read/write bits in the status register (S4, S3, and
S2) that provide Write Protection control and status. Block Protect bits can be set using the Write Status
Register Instruction (see tW in AC characteristics). All, none or a portion of the memory array can be
protected from Program and Erase instructions (see Status Register Memory Protection table). The
factory default setting for the Block Protection Bits is 0, none of the array protected.
8.1.4 Top/Bottom Block Protect (TB)
The non-volatile Top/Bottom bit (TB) controls if the Block Protect Bits (BP2, BP1, BP0) protect from the
Top (TB=0) or the Bottom (TB=1) of the array as shown in the Status Register Memory Protection table.
The factory default setting is TB=0. The TB bit can be set with the Write Status Register Instruction
depending on the state of the SRP0, SRP1 and WEL bits.
8.1.5 Sector/Block Protect (SEC)
The non-volatile Sector/Block Protect bit (SEC) controls if the Block Protect Bits (BP2, BP1, BP0) protect
either 4KB Sectors (SEC=1) or 64KB Blocks (SEC=0) in the Top (TB=0) or the Bottom (TB=1) of the
array as shown in the Status Register Memory Protection table. The default setting is SEC=0.
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.1.6
Complement Protect (CMP)
The Complement Protect bit (CMP) is a non-volatile read/write bit in the status register (S14). It is used in
conjunction with SEC, TB, BP2, BP1 and BP0 bits to provide more flexibility for the array protection. Once
CMP is set to 1, previous array protection set by SEC, TB, BP2, BP1 and BP0 will be reversed. For
instance, when CMP=0, a top 4KB sector can be protected while the rest of the array is not; when
CMP=1, the top 4KB sector will become unprotected while the rest of the array become read-only. Please
refer to the Status Register Memory Protection table for details. The default setting is CMP=0.
8.1.7
Status Register Protect (SRP1, SRP0)
The Status Register Protect bits (SRP1 and SRP0) are non-volatile read/write bits in the status register
(S8 and S7). The SRP bits control the method of write protection: software protection, hardware
protection, power supply lock-down or one time programmable (OTP) protection.
SRP1
SRP0
/WP
Status
Register
Description
0
0
X
Software
Protection
/WP pin has no control. The Status register can be written to
after a Write Enable instruction, WEL=1. [Factory Default]
0
1
0
Hardware
Protected
When /WP pin is low the Status Register locked and can not
be written to.
0
1
1
Hardware
Unprotected
When /WP pin is high the Status register is unlocked and can
be written to after a Write Enable instruction, WEL=1.
1
0
X
Power Supply
Lock-Down
1
1
X
One Time
Program(2)
Status Register is protected and can not be written to again
until the next power-down, power-up cycle.(1)
Status Register is permanently protected and can not be
written to.
Notes:
1. When SRP1, SRP0 = (1, 0), a power-down, power-up cycle will change SRP1, SRP0 to (0, 0) state.
2. This feature is available upon special order. Please contact Winbond for details.
8.1.8
Erase/Program Suspend Status (SUS)
The Suspend Status bit is a read only bit in the status register (S15) that is set to 1 after executing a
Erase/Program Suspend (75h) instruction. The SUS status bit is cleared to 0 by Erase/Program Resume
(7Ah) instruction as well as a power-down, power-up cycle.
8.1.9
Security Register Lock Bits (LB3, LB2, LB1)
The Security Register Lock Bits (LB3, LB2, LB1) are non-volatile One Time Program (OTP) bits in Status
Register (S13, S12, S11) that provide the write protect control and status to the Security Registers. The
default state of LB[3:1] is 0, Security Registers are unlocked. LB[3:1] can be set to 1 individually using the
Write Status Register instruction. LB[3:1] are One Time Programmable (OTP), once it’s set to 1, the
corresponding 256-Byte Security Register will become read-only permanently.
- 12 -
W25Q40BV
8.1.10
Quad Enable (QE)
The Quad Enable (QE) bit is a non-volatile read/write bit in the status register (S9) that allows Quad SPI
operation. When the QE bit is set to a 0 state (factory default), the /WP pin and /HOLD are enabled.
When the QE bit is set to a 1, the Quad IO2 and IO3 pins are enabled, and /WP and /HOLD functions are
disabled.
WARNING: If the /WP or /HOLD pins are tied directly to the power supply or ground during
standard SPI or Dual SPI operation, the QE bit should never be set to a 1.
S7
S6
S5
S4
S3
S2
SRP0
SEC
TB
BP2
BP1
BP0
S1
S0
WEL BUSY
STATUS REGISTER PROTECT 0
(non-volatile)
SECTOR PROTECT
(non-volatile)
TOP/BOTTOM PROTECT
(non-volatile)
BLOCK PROTECT BITS
(non-volatile)
WRITE ENABLE LATCH
ERASE/WRITE IN PROGRESS
Figure 3a. Status Register-1
S15
S14
S13
S12
S11
S10
S9
S8
SUS
CMP
LB3
LB2
LB1
(R)
QE
SRP1
SUSPEND STATUS
COMPLEMENT PROTECT
(non-volatile)
SECURITY REGISTER LOCK BITS
(non-volatile OTP)
RESERVED
QUAD ENABLE
(non-volatile)
STATUS REGISTER PROTECT 1
(non-volatile)
Figure 3b. Status Register-2
- 13 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.1.11
Status Register Memory Protection (CMP = 0)
STATUS REGISTER(1)
W25Q40BV (4M-BIT) MEMORY PROTECTION(2)
SEC
TB
BP2
BP1
BP0
BLOCK(S)
ADDRESSES
DENSITY
PORTION
X
X
0
0
0
NONE
NONE
NONE
NONE
0
0
0
0
1
7
070000h – 07FFFFh
64KB
Upper 1/8
0
0
0
1
0
6 and 7
060000h – 07FFFFh
128KB
Upper 1/4
0
0
0
1
1
4 thru 7
040000h – 07FFFFh
256KB
Upper 1/2
0
1
0
0
1
0
000000h – 00FFFFh
64KB
Lower 1/8
0
1
0
1
0
0 and 1
000000h – 01FFFFh
128KB
Lower 1/4
0
1
0
1
1
0 thru 3
000000h – 03FFFFh
256KB
Lower 1/2
0
X
1
X
X
0 thru 7
000000h – 07FFFFh
512KB
ALL
1
0
0
0
1
7
07F000h – 07FFFFh
4KB
Upper 1/128
1
0
0
1
0
7
07E000h – 07FFFFh
8KB
Upper 1/64
1
0
0
1
1
7
07C000h – 07FFFFh
16KB
Upper 1/32
1
0
1
0
X
7
078000h – 07FFFFh
32KB
Upper 1/16
1
0
1
1
0
7
078000h – 07FFFFh
32KB
Upper 1/16
1
1
0
0
1
0
000000h – 000FFFh
4KB
Lower 1/128
1
1
0
1
0
0
000000h – 001FFFh
8KB
Lower 1/64
1
1
0
1
1
0
000000h – 003FFFh
16KB
Lower 1/32
1
1
1
0
X
0
000000h – 007FFFh
32KB
Lower 1/16
1
1
1
1
0
0
000000h – 007FFFh
32KB
Lower 1/16
1
X
1
1
1
0 thru 7
000000h – 07FFFFh
512KB
ALL
Notes:
1. X = don’t care
2. If any Erase or Program command specifies a memory region that contains protected data portion, this
command will be ignored.
- 14 -
W25Q40BV
8.1.12
Status Register Memory Protection (CMP = 1)
STATUS REGISTER(1)
W25Q40BV (4M-BIT) MEMORY PROTECTION(2)
SEC
TB
BP2
BP1
BP0
BLOCK(S)
ADDRESSES
DENSITY
PORTION
X
X
0
0
0
0 thru 7
000000h – 07FFFFh
512KB
ALL
0
0
0
0
1
0 thru 6
000000h – 06FFFFh
448KB
Lower 7/8
0
0
0
1
0
0 thru 5
000000h – 05FFFFh
384KB
Lower 3/4
0
0
0
1
1
0 thru 3
000000h – 03FFFFh
256KB
Lower 1/2
0
1
0
0
1
1 thru 7
010000h – 07FFFFh
448KB
Upper 7/8
0
1
0
1
0
2 thru 7
020000h – 07FFFFh
384KB
Upper 3/4
0
1
0
1
1
4 thru 7
040000h – 07FFFFh
256KB
Upper 1/2
1
0
0
0
1
0 thru 7
000000h – 07EFFFh
508KB
Lower 127/128
1
0
0
1
0
0 thru 7
000000h – 07DFFFh
504KB
Lower 63/64
1
0
0
1
1
0 thru 7
000000h – 07BFFFh
496KB
Lower 31/32
1
0
1
0
X
0 thru 7
000000h – 077FFFh
480KB
Lower 15/16
1
0
1
1
0
0 thru 7
000000h – 077FFFh
480KB
Lower 15/16
1
1
0
0
1
0 thru 7
001000h – 07FFFFh
508KB
Upper 127/128
1
1
0
1
0
0 thru 7
002000h – 07FFFFh
504KB
Upper 63/64
1
1
0
1
1
0 thru 7
004000h – 07FFFFh
496KB
Upper 31/32
1
1
1
0
X
0 thru 7
008000h – 07FFFFh
480KB
Upper 15/16
1
1
1
1
0
0 thru 7
008000h – 07FFFFh
480KB
Upper 15/16
X
X
1
1
1
NONE
NONE
NONE
NONE
Notes:
1. X = don’t care
2. If any Erase or Program command specifies a memory region that contains protected data portion, this
command will be ignored.
- 15 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2
INSTRUCTIONS
The instruction set of the W25Q40BV consists of thirty five basic instructions that are fully controlled
through the SPI bus (see Instruction Set table1-3). Instructions are initiated with the falling edge of Chip
Select (/CS). The first byte of data clocked into the DI input provides the instruction code. Data on the DI
input is sampled on the rising edge of clock with most significant bit (MSB) first.
Instructions vary in length from a single byte to several bytes and may be followed by address bytes, data
bytes, dummy bytes (don’t care), and in some cases, a combination. Instructions are completed with the
rising edge of edge /CS. Clock relative timing diagrams for each instruction are included in figures 4
through 37. All read instructions can be completed after any clocked bit. However, all instructions that
Write, Program or Erase must complete on a byte boundary (/CS driven high after a full 8-bits have been
clocked) otherwise the instruction will be ignored. This feature further protects the device from inadvertent
writes. Additionally, while the memory is being programmed or erased, or when the Status Register is
being written, all instructions except for Read Status Register will be ignored until the program or erase
cycle has completed.
8.2.1
Manufacturer and Device Identification
MANUFACTURER ID
(MF7-MF0)
Winbond Serial Flash
EFh
Device ID
(ID7-ID0)
(ID15-ID0)
Instruction
ABh, 90h, 92h, 94h
9Fh
W25Q40BV
12h
4013h
- 16 -
W25Q40BV
8.2.2
Instruction Set Table 1 (Erase, Program Instructions)(1)
INSTRUCTION NAME
Write Enable
BYTE 1
(CODE)
BYTE 2
BYTE 3
BYTE 4
BYTE 5
06h
Write Enable for
Volatile Status Register
50h
Write Disable
04h
Read Status Register-1
05h
(S7–S0)
Read Status Register-2
35h
(S15–S8)
Write Status Register
01h
S7–S0
S15-S8
Page Program
02h
A23–A16
A15–A8
A7–A0
D7–D0
Quad Page Program
32h
A23–A16
A15–A8
A7–A0
D7–D0, …
Sector Erase (4KB)
20h
A23–A16
A15–A8
A7–A0
Block Erase (32KB)
52h
A23–A16
A15–A8
A7–A0
Block Erase (64KB)
D8h
A23–A16
A15–A8
A7–A0
Chip Erase
75h
Erase / Program Resume
7Ah
Power-down
B9h
Continuous Read Mode
(4)
(2)
(2)
(3)
C7h/60h
Erase / Program Suspend
Reset
BYTE 6
FFh
FFh
Notes:
1.
Data bytes are shifted with Most Significant Bit first. Byte fields with data in parenthesis “()” indicate data being
read from the device on the DO pin.
2.
The Status Register contents will repeat continuously until /CS terminates the instruction.
3.
Quad Page Program Input Data:
IO0 = D4, D0, ……
IO1 = D5, D1, ……
IO2 = D6, D2, ……
IO3 = D7, D3, ……
4.
This instruction is recommended when using the Dual or Quad “Continuous Read Mode” feature. See section
8.2.19 & 8.2.20 for more information.
- 17 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.3
Instruction Set Table 2 (Read Instructions)
BYTE 1
(CODE)
BYTE 2
BYTE 3
BYTE 4
BYTE 5
Read Data
03h
A23-A16
A15-A8
A7-A0
(D7-D0)
Fast Read
0Bh
A23-A16
A15-A8
A7-A0
dummy
Fast Read Dual Output
3Bh
A23-A16
A15-A8
A7-A0
dummy
(D7-D0, …)
Fast Read Quad Output
6Bh
A23-A16
A15-A8
A7-A0
dummy
(D7-D0, …)
Fast Read Dual I/O
BBh
A23-A8
Fast Read Quad I/O
EBh
A23-A0, M7-M0
(4)
(x,x,x,x, D7-D0, …)
(D7-D0, …)
E7h
A23-A0, M7-M0
(4)
(x,x, D7-D0, …)
(6)
(D7-D0, …)
Octal Word Read Quad I/O
E3h
A23-A0, M7-M0
(4)
(D7-D0, …)
Set Burst with Wrap
77h
xxxxxx, W6-W4
INSTRUCTION NAME
(7)
Word Read Quad I/O
(8)
(2)
A7-A0, M7-M0
(2)
(1)
(D7-D0, …)
(5)
(3)
(3)
(4)
Notes:
1. Dual Output data
IO0 = (D6, D4, D2, D0)
IO1 = (D7, D5, D3, D1)
2. Dual Input Address
IO0 = A22, A20, A18, A16, A14, A12, A10, A8 A6, A4, A2, A0, M6, M4, M2, M0
IO1 = A23, A21, A19, A17, A15, A13, A11, A9 A7, A5, A3, A1, M7, M5, M3, M1
3. Quad Output Data
IO0 = (D4, D0, …..)
IO1 = (D5, D1, …..)
IO2 = (D6, D2, …..)
IO3 = (D7, D3, …..)
4. Quad Input Address
Set Burst with Wrap Input
IO0 = x, x, x, x, x, x, W4, x
IO0 = A20, A16, A12, A8, A4, A0, M4, M0
IO1 = A21, A17, A13, A9, A5, A1, M5, M1
IO1 = x, x, x, x, x, x, W5, x
IO2 = A22, A18, A14, A10, A6, A2, M6, M2
IO2 = x, x, x, x, x, x, W6, x
IO3 = A23, A19, A15, A11, A7, A3, M7, M3
IO3 = x, x, x, x, x, x, x, x
5. Fast Read Quad I/O Data
IO0 = (x, x, x, x, D4, D0, …..)
IO1 = (x, x, x, x, D5, D1, …..)
IO2 = (x, x, x, x, D6, D2, …..)
IO3 = (x, x, x, x, D7, D3, …..)
6. Word Read Quad I/O Data
IO0 = (x, x, D4, D0, …..)
IO1 = (x, x, D5, D1, …..)
IO2 = (x, x, D6, D2, …..)
IO3 = (x, x, D7, D3, …..)
7. The lowest address bit must be 0. ( A0 = 0 )
8. The lowest 4 address bits must be 0. ( A0, A1, A2, A3 = 0 )
- 18 -
(3)
BYTE 6
(D7-D0)
(1)
(3)
W25Q40BV
8.2.4
Instruction Set Table 3 (ID, Security Instructions)
INSTRUCTION
NAME
Release Power down/
Device ID
Manufacturer/
Device ID
(2)
Manufacturer/Device ID
by Dual I/O
Manufacture/Device ID
by Quad I/O
BYTE 1
(CODE)
BYTE 2
BYTE 3
BYTE 4
ABh
dummy
dummy
dummy
90h
dummy
dummy
00h
92h
A23-A8
A7-A0, M[7:0]
(MF[7:0], ID[7:0])
94h
A23-A0, M[7:0]
xxxx, (MF[7:0], ID[7:0])
(MF[7:0], ID[7:0], …)
(MF7-MF0)
(ID7-ID0)
(ID15-ID8)
(ID7-ID0)
Memory Type
Capacity
4Bh
dummy
dummy
dummy
dummy
(ID63-ID0)
5Ah
00h
00h
A7–A0
dummy
(D7-0)
(3)
44h
A23–A16
A15–A8
A7–A0
(3)
42h
A23–A16
A15–A8
A7–A0
D7-D0
D7-D0
(3)
48h
A23–A16
A15–A8
A7–A0
dummy
(D7-0)
Read Unique ID
Read SFDP Register
Erase
Program
Read
Security Registers
(1)
(ID7-ID0)
(MF7-MF0)
9Fh
Security Registers
BYTE 6
Manufacturer
JEDEC ID
Security Registers
BYTE 5
Notes:
1. The Device ID will repeat continuously until /CS terminates the instruction.
2. See Manufacturer and Device Identification table for Device ID information.
3. Security Register Address:
Security Register 1: A23-16 = 00h; A15-8 = 10h; A7-0 = byte address
Security Register 2: A23-16 = 00h; A15-8 = 20h; A7-0 = byte address
Security Register 3: A23-16 = 00h; A15-8 = 30h; A7-0 = byte address
- 19 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.5
Write Enable (06h)
The Write Enable instruction (Figure 4) sets the Write Enable Latch (WEL) bit in the Status Register to a
1. The WEL bit must be set prior to every Page Program, Quad Page Program, Sector Erase, Block
Erase, Chip Erase, Write Status Register and Erase/Program Security Registers instruction. The Write
Enable instruction is entered by driving /CS low, shifting the instruction code “06h” into the Data Input (DI)
pin on the rising edge of CLK, and then driving /CS high.
Figure 4. Write Enable Instruction Sequence Diagram
8.2.6
Write Enable for Volatile Status Register (50h)
The non-volatile Status Register bits described in section 8.1 can also be written to as volatile bits. This
gives more flexibility to change the system configuration and memory protection schemes quickly without
waiting for the typical non-volatile bit write cycles or affecting the endurance of the Status Register nonvolatile bits. To write the volatile values into the Status Register bits, the Write Enable for Volatile Status
Register (50h) instruction must be issued prior to a Write Status Register (01h) instruction. Write Enable
for Volatile Status Register instruction (Figure 5) will not set the Write Enable Latch (WEL) bit, it is only
valid for the Write Status Register instruction to change the volatile Status Register bit values.
Instruction (50h)
Figure 5. Write Enable for Volatile Status Register Instruction Sequence Diagram
- 20 -
W25Q40BV
8.2.7
Write Disable (04h)
The Write Disable instruction (Figure 6) resets the Write Enable Latch (WEL) bit in the Status Register to
a 0. The Write Disable instruction is entered by driving /CS low, shifting the instruction code “04h” into the
DI pin and then driving /CS high. Note that the WEL bit is automatically reset after Power-up and upon
completion of the Write Status Register, Erase/Program Security Registers, Page Program, Quad Page
Program, Sector Erase, Block Erase and Chip Erase instructions.
Write Disable instruction can also be used to invalidate the Write Enable for Volatile Status Register
instruction.
Figure 6. Write Disable Instruction Sequence Diagram
- 21 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.8
Read Status Register-1 (05h) and Read Status Register-2 (35h)
The Read Status Register instructions allow the 8-bit Status Registers to be read. The instruction is
entered by driving /CS low and shifting the instruction code “05h” for Status Register-1 or “35h” for Status
Register-2 into the DI pin on the rising edge of CLK. The status register bits are then shifted out on the
DO pin at the falling edge of CLK with most significant bit (MSB) first as shown in figure 7. The Status
Register bits are shown in figure 3a and 3b and include the BUSY, WEL, BP2-BP0, TB, SEC, SRP0,
SRP1, QE, LB[3:1], CMP and SUS bits (see Status Register section earlier in this datasheet).
The Read Status Register instruction may be used at any time, even while a Program, Erase or Write
Status Register cycle is in progress. This allows the BUSY status bit to be checked to determine when
the cycle is complete and if the device can accept another instruction. The Status Register can be read
continuously, as shown in Figure 7. The instruction is completed by driving /CS high.
Figure 7. Read Status Register Instruction Sequence Diagram
8.2.9
Write Status Register (01h)
The Write Status Register instruction allows the Status Register to be written. Only non-volatile Status
Register bits SRP0, SEC, TB, BP2, BP1, BP0 (bits 7 thru 2 of Status Register-1) and CMP, LB3, LB2,
LB1, QE, SRP1 (bits 14 thru 8 of Status Register-2) can be written to. All other Status Register bit
locations are read-only and will not be affected by the Write Status Register instruction. LB[3:1] are nonvolatile OTP bits, once it is set to 1, it can not be cleared to 0. The Status Register bits are shown in
figure 3 and described in 10.1.
To write non-volatile Status Register bits, a standard Write Enable (06h) instruction must previously have
been executed for the device to accept the Write Status Register Instruction (Status Register bit WEL
must equal 1). Once write enabled, the instruction is entered by driving /CS low, sending the instruction
code “01h”, and then writing the status register data byte as illustrated in figure 8.
To write volatile Status Register bits, a Write Enable for Volatile Status Register (50h) instruction must
have been executed prior to the Write Status Register instruction (Status Register bit WEL remains 0).
However, SRP1 and LB3, LB2, LB1 can not be changed from “1” to “0” because of the OTP protection for
these bits. Upon power off, the volatile Status Register bit values will be lost, and the non-volatile Status
Register bit values will be restored when power on again.
- 22 -
W25Q40BV
To complete the Write Status Register instruction, the /CS pin must be driven high after the eighth or
sixteenth bit of data that is clocked in. If this is not done the Write Status Register instruction will not be
executed. If /CS is driven high after the eighth clock (compatible with the 25X series) the CMP and QE
bits will be cleared to 0.
During non-volatile Status Register write operation (06h combined with 01h), after /CS is driven high, the
self-timed Write Status Register cycle will commence for a time duration of tW (See AC Characteristics).
While the Write Status Register cycle is in progress, the Read Status Register instruction may still be
accessed to check the status of the BUSY bit. The BUSY bit is a 1 during the Write Status Register cycle
and a 0 when the cycle is finished and ready to accept other instructions again. After the Write Status
Register cycle has finished, the Write Enable Latch (WEL) bit in the Status Register will be cleared to 0.
During volatile Status Register write operation (50h combined with 01h), after /CS is driven high, the
Status Register bits will be refreshed to the new values within the time period of tSHSL2 (See AC
Characteristics). BUSY bit will remain 0 during the Status Register bit refresh period.
Please refer to 10.1 for detailed Status Register Bit descriptions. Factory default for all status Register
bits are 0.
Status Register 1
Status Register 2
15 14 13 12 11 10
9
8
Figure 8. Write Status Register Instruction Sequence Diagram
- 23 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.10
Read Data (03h)
The Read Data instruction allows one or more data bytes to be sequentially read from the memory. The
instruction is initiated by driving the /CS pin low and then shifting the instruction code “03h” followed by
a 24-bit address (A23-A0) into the DI pin. The code and address bits are latched on the rising edge of the
CLK pin. After the address is received, the data byte of the addressed memory location will be shifted out
on the DO pin at the falling edge of CLK with most significant bit (MSB) first. The address is automatically
incremented to the next higher address after each byte of data is shifted out allowing for a continuous
stream of data. This means that the entire memory can be accessed with a single instruction as long as
the clock continues. The instruction is completed by driving /CS high.
The Read Data instruction sequence is shown in figure 9. If a Read Data instruction is issued while an
Erase, Program or Write cycle is in process (BUSY=1) the instruction is ignored and will not have any
effects on the current cycle. The Read Data instruction allows clock rates from D.C. to a maximum of fR
(see AC Electrical Characteristics).
Figure 9. Read Data Instruction Sequence Diagram
- 24 -
W25Q40BV
8.2.11
Fast Read (0Bh)
The Fast Read instruction is similar to the Read Data instruction except that it can operate at the highest
possible frequency of FR (see AC Electrical Characteristics). This is accomplished by adding eight
“dummy” clocks after the 24-bit address as shown in figure 10. The dummy clocks allow the devices
internal circuits additional time for setting up the initial address. During the dummy clocks the data value
on the DO pin is a “don’t care”.
Figure 10. Fast Read Instruction Sequence Diagram
- 25 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.12
Fast Read Dual Output (3Bh)
The Fast Read Dual Output (3Bh) instruction is similar to the standard Fast Read (0Bh) instruction except
that data is output on two pins; IO0 and IO1. This allows data to be transferred from the W25Q40BV at
twice the rate of standard SPI devices. The Fast Read Dual Output instruction is ideal for quickly
downloading code from Flash to RAM upon power-up or for applications that cache code-segments to
RAM for execution.
Similar to the Fast Read instruction, the Fast Read Dual Output instruction can operate at the highest
possible frequency of FR (see AC Electrical Characteristics). This is accomplished by adding eight
“dummy” clocks after the 24-bit address as shown in figure 11. The dummy clocks allow the device's
internal circuits additional time for setting up the initial address. The input data during the dummy clocks
is “don’t care”. However, the IO0 pin should be high-impedance prior to the falling edge of the first data
out clock.
Figure 11. Fast Read Dual Output Instruction Sequence Diagram
- 26 -
W25Q40BV
8.2.13
Fast Read Quad Output (6Bh)
The Fast Read Quad Output (6Bh) instruction is similar to the Fast Read Dual Output (3Bh) instruction
except that data is output on four pins, IO0, IO1, IO2, and IO3. A Quad enable of Status Register-2 must be
executed before the device will accept the Fast Read Quad Output Instruction (Status Register bit QE
must equal 1). The Fast Read Quad Output Instruction allows data to be transferred from the W25Q40BV
at four times the rate of standard SPI devices.
The Fast Read Quad Output instruction can operate at the highest possible frequency of FR (see AC
Electrical Characteristics). This is accomplished by adding eight “dummy” clocks after the 24-bit address
as shown in figure 12. The dummy clocks allow the device's internal circuits additional time for setting up
the initial address. The input data during the dummy clocks is “don’t care”. However, the IO pins should
be high-impedance prior to the falling edge of the first data out clock.
Figure 12. Fast Read Quad Output Instruction Sequence Diagram
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Preliminary - Revision B
W25Q40BV
8.2.14
Fast Read Dual I/O (BBh)
The Fast Read Dual I/O (BBh) instruction allows for improved random access while maintaining two IO
pins, IO0 and IO1. It is similar to the Fast Read Dual Output (3Bh) instruction but with the capability to
input the Address bits (A23-0) two bits per clock. This reduced instruction overhead may allow for code
execution (XIP) directly from the Dual SPI in some applications.
Fast Read Dual I/O with “Continuous Read Mode”
The Fast Read Dual I/O instruction can further reduce instruction overhead through setting the
“Continuous Read Mode” bits (M7-0) after the input Address bits (A23-0), as shown in figure 13a. The
upper nibble of the (M7-4) controls the length of the next Fast Read Dual I/O instruction through the
inclusion or exclusion of the first byte instruction code. The lower nibble bits of the (M3-0) are don’t care
(“x”). However, the IO pins should be high-impedance prior to the falling edge of the first data out clock.
If the “Continuous Read Mode” bits M5-4 = (1,0), then the next Fast Read Dual I/O instruction (after /CS
is raised and then lowered) does not require the BBh instruction code, as shown in figure 13b. This
reduces the instruction sequence by eight clocks and allows the Read address to be immediately entered
after /CS is asserted low. If the “Continuous Read Mode” bits M5-4 do not equal to (1,0), the next
instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus returning to
normal operation. A “Continuous Read Mode” Reset instruction can also be used to reset (M7-0) before
issuing normal instructions (See 8.2.20 for detail descriptions).
Figure 13a. Fast Read Dual I/O Instruction Sequence (Initial instruction or previous M5-4 ≠ 10)
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W25Q40BV
Figure 13b. Fast Read Dual I/O Instruction Sequence (Previous instruction set M5-4 = 10)
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.15
Fast Read Quad I/O (EBh)
The Fast Read Quad I/O (EBh) instruction is similar to the Fast Read Dual I/O (BBh) instruction except
that address and data bits are input and output through four pins IO0, IO1, IO2 and IO3 and four Dummy
clock are required prior to the data output. The Quad I/O dramatically reduces instruction overhead
allowing faster random access for code execution (XIP) directly from the Quad SPI. The Quad Enable bit
(QE) of Status Register-2 must be set to enable the Fast Read Quad I/O Instruction.
Fast Read Quad I/O with “Continuous Read Mode”
The Fast Read Quad I/O instruction can further reduce instruction overhead through setting the
“Continuous Read Mode” bits (M7-0) after the input Address bits (A23-0), as shown in figure 14a. The
upper nibble of the (M7-4) controls the length of the next Fast Read Quad I/O instruction through the
inclusion or exclusion of the first byte instruction code. The lower nibble bits of the (M3-0) are don’t care
(“x”). However, the IO pins should be high-impedance prior to the falling edge of the first data out clock.
If the “Continuous Read Mode” bits M5-4 = (1,0), then the next Fast Read Quad I/O instruction (after /CS
is raised and then lowered) does not require the EBh instruction code, as shown in figure 14b. This
reduces the instruction sequence by eight clocks and allows the Read address to be immediately entered
after /CS is asserted low. If the “Continuous Read Mode” bits M5-4 do not equal to (1,0), the next
instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus returning to
normal operation. A “Continuous Read Mode” Reset instruction can also be used to reset (M7-0) before
issuing normal instructions (See 8.2.20 for detail descriptions).
Byte 1
Byte 2
Figure 14a. Fast Read Quad I/O Instruction Sequence (Initial instruction or previous M5-4 ≠ 10)
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W25Q40BV
Figure 14b. Fast Read Quad I/O Instruction Sequence (Previous instruction set M5-4 = 10)
Fast Read Quad I/O with “8/16/32/64-Byte Wrap Around”
The Fast Read Quad I/O instruction can also be used to access a specific portion within a page by
issuing a “Set Burst with Wrap” command prior to EBh. The “Set Burst with Wrap” command can either
enable or disable the “Wrap Around” feature for the following EBh commands. When “Wrap Around” is
enabled, the data being accessed can be limited to either a 8, 16, 32 or 64-byte section of a 256-byte
page. The output data starts at the initial address specified in the instruction, once it reaches the ending
boundary of the 8/16/32/64-byte section, the output will wrap around to the beginning boundary
automatically until /CS is pulled high to terminate the command.
The Burst with Wrap feature allows applications that use cache to quickly fetch a critical address and then
fill the cache afterwards within a fixed length (8/16/32/64-byte) of data without issuing multiple read
commands.
The “Set Burst with Wrap” instruction allows three “Wrap Bits”, W6-4 to be set. The W4 bit is used to
enable or disable the “Wrap Around” operation while W6-5 are used to specify the length of the wrap
around section within a page. See 8.2.18 for detail descriptions.
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Preliminary - Revision B
W25Q40BV
8.2.16
Word Read Quad I/O (E7h)
The Word Read Quad I/O (E7h) instruction is similar to the Fast Read Quad I/O (EBh) instruction except
that the lowest Address bit (A0) must equal 0 and only two Dummy clock are required prior to the data
output. The Quad I/O dramatically reduces instruction overhead allowing faster random access for code
execution (XIP) directly from the Quad SPI. The Quad Enable bit (QE) of Status Register-2 must be set to
enable the Word Read Quad I/O Instruction.
Word Read Quad I/O with “Continuous Read Mode”
The Word Read Quad I/O instruction can further reduce instruction overhead through setting the
“Continuous Read Mode” bits (M7-0) after the input Address bits (A23-0), as shown in figure 15a. The
upper nibble of the (M7-4) controls the length of the next Fast Read Quad I/O instruction through the
inclusion or exclusion of the first byte instruction code. The lower nibble bits of the (M3-0) are don’t care
(“x”). However, the IO pins should be high-impedance prior to the falling edge of the first data out clock.
If the “Continuous Read Mode” bits M5-4 = (1,0), then the next Fast Read Quad I/O instruction (after /CS
is raised and then lowered) does not require the E7h instruction code, as shown in figure 15b. This
reduces the instruction sequence by eight clocks and allows the Read address to be immediately entered
after /CS is asserted low. If the “Continuous Read Mode” bits M5-4 do not equal to (1,0), the next
instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus returning to
normal operation. A “Continuous Read Mode” Reset instruction can also be used to reset (M7-0) before
issuing normal instructions (See 8.2.20 for detail descriptions).
Instruction (E7h)
4
0
4
0
4
0
5
1
5
1
5
1
6
2
6
2
6
2
7
3
7
3
7
3
Byte 1
Byte 2
Figure 15a. Word Read Quad I/O Instruction Sequence (Initial instruction or previous M5-4 ≠ 10)
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Byte 3
W25Q40BV
4
0
4
0
4
0
5
1
5
1
5
1
6
2
6
2
6
2
7
3
7
3
7
3
Byte 1
Byte 2
Byte 3
Figure 15b. Word Read Quad I/O Instruction Sequence (Previous instruction set M5-4 = 10)
Word Read Quad I/O with “8/16/32/64-Byte Wrap Around”
The Word Read Quad I/O instruction can also be used to access a specific portion within a page by
issuing a “Set Burst with Wrap” command prior to E7h. The “Set Burst with Wrap” command can either
enable or disable the “Wrap Around” feature for the following E7h commands. When “Wrap Around” is
enabled, the data being accessed can be limited to either a 8, 16, 32 or 64-byte section of a 256-byte
page. The output data starts at the initial address specified in the instruction, once it reaches the ending
boundary of the 8/16/32/64-byte section, the output will wrap around to the beginning boundary
automatically until /CS is pulled high to terminate the command.
The Burst with Wrap feature allows applications that use cache to quickly fetch a critical address and then
fill the cache afterwards within a fixed length (8/16/32/64-byte) of data without issuing multiple read
commands.
The “Set Burst with Wrap” instruction allows three “Wrap Bits”, W6-4 to be set. The W4 bit is used to
enable or disable the “Wrap Around” operation while W6-5 are used to specify the length of the wrap
around section within a page. See 8.2.18 for detail descriptions.
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Preliminary - Revision B
W25Q40BV
8.2.17
Octal Word Read Quad I/O (E3h)
The Octal Word Read Quad I/O (E3h) instruction is similar to the Fast Read Quad I/O (EBh) instruction
except that the lower four Address bits (A0, A1, A2, A3) must equal 0. As a result, the dummy clocks are
not required, which further reduces the instruction overhead allowing even faster random access for code
execution (XIP). The Quad Enable bit (QE) of Status Register-2 must be set to enable the Octal Word
Read Quad I/O Instruction.
Octal Word Read Quad I/O with “Continuous Read Mode”
The Octal Word Read Quad I/O instruction can further reduce instruction overhead through setting the
“Continuous Read Mode” bits (M7-0) after the input Address bits (A23-0), as shown in figure 16a. The
upper nibble of the (M7-4) controls the length of the next Octal Word Read Quad I/O instruction through
the inclusion or exclusion of the first byte instruction code. The lower nibble bits of the (M3-0) are don’t
care (“x”). However, the IO pins should be high-impedance prior to the falling edge of the first data out
clock.
If the “Continuous Read Mode” bits M5-4 = (1,0), then the next Fast Read Quad I/O instruction (after /CS
is raised and then lowered) does not require the E3h instruction code, as shown in figure 16b. This
reduces the instruction sequence by eight clocks and allows the Read address to be immediately entered
after /CS is asserted low. If the “Continuous Read Mode” bits M5-4 do not equal to (1,0), the next
instruction (after /CS is raised and then lowered) requires the first byte instruction code, thus returning to
normal operation. A “Continuous Read Mode” Reset instruction can also be used to reset (M7-0) before
issuing normal instructions (See 8.2.20 for detail descriptions).
Instruction (E3h)
4
0
4
0
4
0
4
0
5
1
5
1
5
1
5
1
6
2
6
2
6
2
6
2
7
3
7
3
7
3
7
3
Byte 1
Byte 2
Byte 3
Byte 4
Figure 16a. Octal Word Read Quad I/O Instruction Sequence (Initial instruction or previous M5-4 ≠ 10)
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W25Q40BV
4
0
4
0
4
0
4
0
5
1
5
1
5
1
5
1
6
2
6
2
6
2
6
2
7
3
7
3
7
3
7
3
Byte 1
Byte 2
Byte 3
Byte 4
Figure 16b. Octal Word Read Quad I/O Instruction Sequence (Previous instruction set M5-4 = 10)
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.18
Set Burst with Wrap (77h)
The Set Burst with Wrap (77h) instruction is used in conjunction with “Fast Read Quad I/O” and “Word
Read Quad I/O” instructions to access a fixed length of 8/16/32/64-byte section within a 256-byte page.
Certain applications can benefit from this feature and improve the overall system code execution
performance.
Similar to a Quad I/O instruction, the Set Burst with Wrap instruction is initiated by driving the /CS pin low
and then shifting the instruction code “77h” followed by 24 dummy bits and 8 “Wrap Bits”, W7-0. The
instruction sequence is shown in figure 17. Wrap bit W7 and the lower nibble W3-0 are not used.
W6, W5
0
0
1
1
W4 = 0
W4 =1 (default)
Wrap Around
Wrap Length
Wrap Around
Wrap Length
Yes
Yes
Yes
Yes
8-byte
16-byte
32-byte
64-byte
No
No
No
No
N/A
N/A
N/A
N/A
0
1
0
1
Once W6-4 is set by a Set Burst with Wrap instruction, all the following “Fast Read Quad I/O” and “Word
Read Quad I/O” instructions will use the W6-4 setting to access the 8/16/32/64-byte section within any
page. To exit the “Wrap Around” function and return to normal read operation, another Set Burst with
Wrap instruction should be issued to set W4 = 1. The default value of W4 upon power on is 1. In the case
of a system Reset while W4 = 0, it is recommended that the controller issues a Set Burst with Wrap
instruction to reset W4 = 1 prior to any normal Read instructions since W25Q40BV does not have a
hardware Reset Pin.
/CS
Mode 3
CLK
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
Mode 0
Instruction (77h)
IO0
X
X
X
X
X
X
w4
X
IO1
X
X
X
X
X
X
w5
X
IO2
X
X
X
X
X
X
w6
X
IO3
X
X
X
X
X
X
X
X
don’t care don’t care don’t care
Figure 17. Set Burst with Wrap Instruction Sequence
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wrap bit
W25Q40BV
8.2.19
Continuous Read Mode Bits (M7-0)
The “Continuous Read Mode” bits are used in conjunction with “Fast Read Dual I/O”, “Fast Read Quad
I/O”, “Word Read Quad I/O” and “Octal Word Read Quad I/O” instructions to provide the highest random
Flash memory access rate with minimum SPI instruction overhead, thus allow true XIP (execute in place)
to be performed on serial flash devices.
M7-0 need to be set by the Dual/Quad I/O Read instructions. M5-4 are used to control whether the 8-bit
SPI instruction code (BBh, EBh, E7h or E3h) is needed or not for the next command. When M5-4 = (1,0),
the next command will be treated same as the current Dual/Quad I/O Read command without needing
the 8-bit instruction code; when M5-4 do not equal to (1,0), the device returns to normal SPI mode, all
commands can be accepted. M7-6 and M3-0 are reserved bits for future use, either 0 or 1 values can be
used.
8.2.20
Continuous Read Mode Reset (FFh or FFFFh)
Continuous Read Mode Reset instruction can be used to set M4 = 1, thus the device will release the
Continuous Read Mode and return to normal SPI operation, as shown in figure 18.
Mode Bit Reset
for Dual I/O
Mode Bit Reset
for Quad I/O
/CS
Mode 3
CLK
IO0
0
1
2
3
4
5
6
7
8
9
10
11
12
13
Mode 0
14
15
Mode 3
Mode 0
FFh
FFh
IO1
Don’t Care
IO2
Don’t Care
IO3
Don’t Care
Figure 18. Continuous Read Mode Reset for Fast Read Dual/Quad I/O
Since W25Q40BV does not have a hardware Reset pin, so if the controller resets while W25Q40BV is set
to Continuous Mode Read, the W25Q40BV will not recognize any initial standard SPI instructions from
the controller. To address this possibility, it is recommended to issue a Continuous Read Mode Reset
instruction as the first instruction after a system Reset. Doing so will release the device from the
Continuous Read Mode and allow Standard SPI instructions to be recognized.
To reset “Continuous Read Mode” during Quad I/O operation, only eight clocks are needed. The
instruction is “FFh”. To reset “Continuous Read Mode” during Dual I/O operation, sixteen clocks are
needed to shift in instruction “FFFFh”.
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.21
Page Program (02h)
The Page Program instruction allows from one byte to 256 bytes (a page) of data to be programmed at
previously erased (FFh) memory locations. A Write Enable instruction must be executed before the
device will accept the Page Program Instruction (Status Register bit WEL= 1). The instruction is initiated
by driving the /CS pin low then shifting the instruction code “02h” followed by a 24-bit address (A23-A0)
and at least one data byte, into the DI pin. The /CS pin must be held low for the entire length of the
instruction while data is being sent to the device. The Page Program instruction sequence is shown in
figure 19.
If an entire 256 byte page is to be programmed, the last address byte (the 8 least significant address bits)
should be set to 0. If the last address byte is not zero, and the number of clocks exceed the remaining
page length, the addressing will wrap to the beginning of the page. In some cases, less than 256 bytes (a
partial page) can be programmed without having any effect on other bytes within the same page. One
condition to perform a partial page program is that the number of clocks can not exceed the remaining
page length. If more than 256 bytes are sent to the device the addressing will wrap to the beginning of the
page and overwrite previously sent data.
As with the write and erase instructions, the /CS pin must be driven high after the eighth bit of the last
byte has been latched. If this is not done the Page Program instruction will not be executed. After /CS is
driven high, the self-timed Page Program instruction will commence for a time duration of tpp (See AC
Characteristics). While the Page Program cycle is in progress, the Read Status Register instruction may
still be accessed for checking the status of the BUSY bit. The BUSY bit is a 1 during the Page Program
cycle and becomes a 0 when the cycle is finished and the device is ready to accept other instructions
again. After the Page Program cycle has finished the Write Enable Latch (WEL) bit in the Status Register
is cleared to 0. The Page Program instruction will not be executed if the addressed page is protected by
the Block Protect (CMP, SEC, TB, BP2, BP1, and BP0) bits.
Figure 19. Page Program Instruction Sequence Diagram
- 38 -
W25Q40BV
8.2.22
Quad Input Page Program (32h)
The Quad Page Program instruction allows up to 256 bytes of data to be programmed at previously
erased (FFh) memory locations using four pins: IO0, IO1, IO2, and IO3. The Quad Page Program can
improve performance for PROM Programmer and applications that have slow clock speeds <5MHz.
Systems with faster clock speed will not realize much benefit for the Quad Page Program instruction
since the inherent page program time is much greater than the time it take to clock-in the data.
To use Quad Page Program the Quad Enable in Status Register-2 must be set (QE=1). A Write Enable
instruction must be executed before the device will accept the Quad Page Program instruction (Status
Register-1, WEL=1). The instruction is initiated by driving the /CS pin low then shifting the instruction
code “32h” followed by a 24-bit address (A23-A0) and at least one data byte, into the IO pins. The /CS pin
must be held low for the entire length of the instruction while data is being sent to the device. All other
functions of Quad Page Program are identical to standard Page Program. The Quad Page Program
instruction sequence is shown in figure 20.
Figure 20. Quad Input Page Program Instruction Sequence Diagram
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.23
Sector Erase (20h)
The Sector Erase instruction sets all memory within a specified sector (4K-bytes) to the erased state of all
1s (FFh). A Write Enable instruction must be executed before the device will accept the Sector Erase
Instruction (Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low
and shifting the instruction code “20h” followed a 24-bit sector address (A23-A0) (see Figure 2). The
Sector Erase instruction sequence is shown in figure 21.
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not done
the Sector Erase instruction will not be executed. After /CS is driven high, the self-timed Sector Erase
instruction will commence for a time duration of tSE (See AC Characteristics). While the Sector Erase
cycle is in progress, the Read Status Register instruction may still be accessed for checking the status of
the BUSY bit. The BUSY bit is a 1 during the Sector Erase cycle and becomes a 0 when the cycle is
finished and the device is ready to accept other instructions again. After the Sector Erase cycle has
finished the Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Sector Erase
instruction will not be executed if the addressed page is protected by the Block Protect (CMP, SEC, TB,
BP2, BP1, and BP0) bits (see Status Register Memory Protection table).
Figure 21. Sector Erase Instruction Sequence Diagram
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W25Q40BV
8.2.24
32KB Block Erase (52h)
The Block Erase instruction sets all memory within a specified block (32K-bytes) to the erased state of all
1s (FFh). A Write Enable instruction must be executed before the device will accept the Block Erase
Instruction (Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low
and shifting the instruction code “52h” followed a 24-bit block address (A23-A0) (see Figure 2). The Block
Erase instruction sequence is shown in figure 22.
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not done
the Block Erase instruction will not be executed. After /CS is driven high, the self-timed Block Erase
instruction will commence for a time duration of tBE1 (See AC Characteristics). While the Block Erase
cycle is in progress, the Read Status Register instruction may still be accessed for checking the status of
the BUSY bit. The BUSY bit is a 1 during the Block Erase cycle and becomes a 0 when the cycle is
finished and the device is ready to accept other instructions again. After the Block Erase cycle has
finished the Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Block Erase
instruction will not be executed if the addressed page is protected by the Block Protect (CMP, SEC, TB,
BP2, BP1, and BP0) bits (see Status Register Memory Protection table).
Figure 22. 32KB Block Erase Instruction Sequence Diagram
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.25
64KB Block Erase (D8h)
The Block Erase instruction sets all memory within a specified block (64K-bytes) to the erased state of all
1s (FFh). A Write Enable instruction must be executed before the device will accept the Block Erase
Instruction (Status Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low
and shifting the instruction code “D8h” followed a 24-bit block address (A23-A0) (see Figure 2). The Block
Erase instruction sequence is shown in figure 23.
The /CS pin must be driven high after the eighth bit of the last byte has been latched. If this is not done
the Block Erase instruction will not be executed. After /CS is driven high, the self-timed Block Erase
instruction will commence for a time duration of tBE (See AC Characteristics). While the Block Erase cycle
is in progress, the Read Status Register instruction may still be accessed for checking the status of the
BUSY bit. The BUSY bit is a 1 during the Block Erase cycle and becomes a 0 when the cycle is finished
and the device is ready to accept other instructions again. After the Block Erase cycle has finished the
Write Enable Latch (WEL) bit in the Status Register is cleared to 0. The Block Erase instruction will not be
executed if the addressed page is protected by the Block Protect (CMP, SEC, TB, BP2, BP1, and BP0)
bits (see Status Register Memory Protection table).
Figure 23. 64KB Block Erase Instruction Sequence Diagram
- 42 -
W25Q40BV
8.2.26
Chip Erase (C7h / 60h)
The Chip Erase instruction sets all memory within the device to the erased state of all 1s (FFh). A Write
Enable instruction must be executed before the device will accept the Chip Erase Instruction (Status
Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low and shifting the
instruction code “C7h” or “60h”. The Chip Erase instruction sequence is shown in figure 24.
The /CS pin must be driven high after the eighth bit has been latched. If this is not done the Chip Erase
instruction will not be executed. After /CS is driven high, the self-timed Chip Erase instruction will
commence for a time duration of tCE (See AC Characteristics). While the Chip Erase cycle is in progress,
the Read Status Register instruction may still be accessed to check the status of the BUSY bit. The
BUSY bit is a 1 during the Chip Erase cycle and becomes a 0 when finished and the device is ready to
accept other instructions again. After the Chip Erase cycle has finished the Write Enable Latch (WEL) bit
in the Status Register is cleared to 0. The Chip Erase instruction will not be executed if any page is
protected by the Block Protect (CMP, SEC, TB, BP2, BP1, and BP0) bits (see Status Register Memory
Protection table).
Figure 24. Chip Erase Instruction Sequence Diagram
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.27
Erase / Program Suspend (75h)
The Erase/Program Suspend instruction “75h”, allows the system to interrupt a Sector or Block Erase
operation or a Page Program operation and then read from or program/erase data to, any other sectors
or blocks. The Erase/Program Suspend instruction sequence is shown in figure 25.
The Write Status Register instruction (01h) and Erase instructions (20h, 52h, D8h, C7h, 60h, 44h) are not
allowed during Erase Suspend. Erase Suspend is valid only during the Sector or Block erase operation. If
written during the Chip Erase operation, the Erase Suspend instruction is ignored. The Write Status
Register instruction (01h) and Program instructions (02h, 32h, 42h) are not allowed during Program
Suspend. Program Suspend is valid only during the Page Program or Quad Page Program operation. A
maximum of time of “tSUS” (See AC Characteristics) is required to suspend the erase or program
operation. The BUSY bit in the Status Register will clear to 0 and the SUS bit in the Status Register will
be set to 1 after Erase/Program Suspend.
Unexpected power off during the Erase/Program suspend state will reset the device and release the
suspend state. SUS bit in the Status Register will also reset to 0. The data within the page, sector or
block that was being suspended may become corrupted. It is recommended for the user to implement
system design techniques against the accidental power interruption and preserve data integrity during
erase/program suspend state.
Figure 25. Erase/Program Suspend Instruction Sequence
- 44 -
W25Q40BV
8.2.28
Erase / Program Resume (7Ah)
The Erase/Program Resume instruction must be written to resume the Sector or Block Erase operation or
the Page Program operation after an Erase/Program Suspend. After issued the BUSY bit in the Status
Register will be set to a 1, the SUS bit in the Status Register will clear to 0 and the Sector or Block will
complete the erase operation or the page will complete the program operation. Resume instructions will
be ignored unless an Erase/Program Suspend operation is active. The Erase/Program Resume
instruction sequence is shown in figure 26.
Resume instruction is ignored if the previous Erase/Program Suspend operation was interrupted by
unexpected power off.
Figure 26. Erase/Program Resume Instruction Sequence
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Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.29
Power-down (B9h)
Although the standby current during normal operation is relatively low, standby current can be further
reduced with the Power-down instruction. The lower power consumption makes the Power-down
instruction especially useful for battery powered applications (See ICC1 and ICC2 in AC Characteristics).
The instruction is initiated by driving the /CS pin low and shifting the instruction code “B9h” as shown in
figure 27.
The /CS pin must be driven high after the eighth bit has been latched. If this is not done the Power-down
instruction will not be executed. After /CS is driven high, the power-down state will entered within the time
duration of tDP (See AC Characteristics). While in the power-down state only the Release from Powerdown / Device ID instruction, which restores the device to normal operation, will be recognized. All other
instructions are ignored. This includes the Read Status Register instruction, which is always available
during normal operation. Ignoring all but one instruction makes the Power Down state a useful condition
for securing maximum write protection. The device always powers-up in the normal operation with the
standby current of ICC1.
Figure 27. Deep Power-down Instruction Sequence Diagram
- 46 -
W25Q40BV
8.2.30
Release Power-down / Device ID (ABh)
The Release from Power-down / Device ID instruction is a multi-purpose instruction. It can be used to
release the device from the power-down state, or obtain the devices electronic identification (ID) number.
To release the device from the power-down state, the instruction is issued by driving the /CS pin low,
shifting the instruction code “ABh” and driving /CS high as shown in figure 28a. Release from powerdown will take the time duration of tRES1 (See AC Characteristics) before the device will resume normal
operation and other instructions are accepted. The /CS pin must remain high during the tRES1 time
duration.
When used only to obtain the Device ID while not in the power-down state, the instruction is initiated by
driving the /CS pin low and shifting the instruction code “ABh” followed by 3-dummy bytes. The Device ID
bits are then shifted out on the falling edge of CLK with most significant bit (MSB) first as shown in figure
28a. The Device ID values for the W25Q40BV is listed in Manufacturer and Device Identification table.
The Device ID can be read continuously. The instruction is completed by driving /CS high.
When used to release the device from the power-down state and obtain the Device ID, the instruction is
the same as previously described, and shown in figure 28b, except that after /CS is driven high it must
remain high for a time duration of tRES2 (See AC Characteristics). After this time duration the device will
resume normal operation and other instructions will be accepted. If the Release from Power-down /
Device ID instruction is issued while an Erase, Program or Write cycle is in process (when BUSY equals
1) the instruction is ignored and will not have any effects on the current cycle.
Figure 28a. Release Power-down Instruction Sequence
- 47 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
Figure 28b. Release Power-down / Device ID Instruction Sequence Diagram
- 48 -
W25Q40BV
8.2.31
Read Manufacturer / Device ID (90h)
The Read Manufacturer/Device ID instruction is an alternative to the Release from Power-down / Device
ID instruction that provides both the JEDEC assigned manufacturer ID and the specific device ID.
The Read Manufacturer/Device ID instruction is very similar to the Release from Power-down / Device ID
instruction. The instruction is initiated by driving the /CS pin low and shifting the instruction code “90h”
followed by a 24-bit address (A23-A0) of 000000h. After which, the Manufacturer ID for Winbond (EFh)
and the Device ID are shifted out on the falling edge of CLK with most significant bit (MSB) first as shown
in figure 29. The Device ID values for the W25Q40BV is listed in Manufacturer and Device Identification
table. If the 24-bit address is initially set to 000001h the Device ID will be read first and then followed by
the Manufacturer ID. The Manufacturer and Device IDs can be read continuously, alternating from one to
the other. The instruction is completed by driving /CS high.
31 32
33 34 35
36 37 38 39
40 41 42
43 44
45 46
Figure 29. Read Manufacturer / Device ID Diagram
- 49 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.32
Read Manufacturer / Device ID Dual I/O (92h)
The Manufacturer / Device ID Dual I/O instruction is an alternative to the Read Manufacturer/Device ID
instruction that provides both the JEDEC assigned manufacturer ID and the specific device ID at 2x
speed.
The Read Manufacturer / Device ID Dual I/O instruction is similar to the Fast Read Dual I/O instruction.
The instruction is initiated by driving the /CS pin low and shifting the instruction code “92h” followed by a
24-bit address (A23-A0) of 000000h, 8-bit Continuous Read Mode Bits, with the capability to input the
Address bits two bits per clock. After which, the Manufacturer ID for Winbond (EFh) and the Device ID
are shifted out 2 bits per clock on the falling edge of CLK with most significant bits (MSB) first as shown in
figure 30. The Device ID values for the W25Q40BV is listed in Manufacturer and Device Identification
table. If the 24-bit address is initially set to 000001h the Device ID will be read first and then followed by
the Manufacturer ID. The Manufacturer and Device IDs can be read continuously, alternating from one to
the other. The instruction is completed by driving /CS high.
Figure 30. Read Manufacturer / Device ID Dual I/O Diagram
Note:
The “Continuous Read Mode” bits M7-0 must be set to Fxh to be compatible with Fast Read Dual I/O instruction.
- 50 -
W25Q40BV
8.2.33
Read Manufacturer / Device ID Quad I/O (94h)
The Read Manufacturer / Device ID Quad I/O instruction is an alternative to the Read Manufacturer /
Device ID instruction that provides both the JEDEC assigned manufacturer ID and the specific device ID
at 4x speed.
The Read Manufacturer / Device ID Quad I/O instruction is similar to the Fast Read Quad I/O instruction.
The instruction is initiated by driving the /CS pin low and shifting the instruction code “94h” followed by a
24-bit address (A23-A0) of 000000h, 8-bit Continuous Read Mode Bits and then four clock dummy
cycles, with the capability to input the Address bits four bits per clock. After which, the Manufacturer ID for
Winbond (EFh) and the Device ID are shifted out four bits per clock on the falling edge of CLK with most
significant bit (MSB) first as shown in figure 31. The Device ID values for the W25Q40BV is listed in
Manufacturer and Device Identification table. If the 24-bit address is initially set to 000001h the Device ID
will be read first and then followed by the Manufacturer ID. The Manufacturer and Device IDs can be read
continuously, alternating from one to the other. The instruction is completed by driving /CS high.
Figure 31. Read Manufacturer / Device ID Quad I/O Diagram
Note:
The “Continuous Read Mode” bits M7-0 must be set to Fxh to be compatible with Fast Read Quad I/O instruction.
- 51 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.34
Read Unique ID Number (4Bh)
The Read Unique ID Number instruction accesses a factory-set read-only 64-bit number that is unique to
each W25Q40BV device. The ID number can be used in conjunction with user software methods to help
prevent copying or cloning of a system. The Read Unique ID instruction is initiated by driving the /CS pin
low and shifting the instruction code “4Bh” followed by a four bytes of dummy clocks. After which, the 64bit ID is shifted out on the falling edge of CLK as shown in figure 32.
DO
24 25
26
27
28
29 30
31 32 33
34
35 36
37 38
39
40
*
DO
41
42
63 62 61 60 59
*=MSB
Figure 32. Read Unique ID Number Instruction Sequence
- 52 -
43 44 101 102 103
2
1
0
W25Q40BV
8.2.35
Read JEDEC ID (9Fh)
For compatibility reasons, the W25Q40BV provides several instructions to electronically determine the
identity of the device. The Read JEDEC ID instruction is compatible with the JEDEC standard for SPI
compatible serial memories that was adopted in 2003. The instruction is initiated by driving the /CS pin
low and shifting the instruction code “9Fh”. The JEDEC assigned Manufacturer ID byte for Winbond (EFh)
and two Device ID bytes, Memory Type (ID15-ID8) and Capacity (ID7-ID0) are then shifted out on the
falling edge of CLK with most significant bit (MSB) first as shown in figure 33. For memory type and
capacity values refer to Manufacturer and Device Identification table.
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30 31
Figure 33. Read JEDEC ID Instruction Sequence
- 53 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.36 Read SFDP Register (5Ah)
The W25Q40BV features a 256-Byte Serial Flash Discoverable Parameter (SFDP) register that contains
information about devices operational capability such as available commands, timing and other features.
The SFDP parameters are stored in one or more Parameter Identification (PID) tables. Currently only one
PID table is specified but more may be added in the future. The Read SFDP Register instruction is
compatible with the SFDP standard initially established in 2010 for PC and other applications. Most
Winbond SpiFlash Memories shipped after June 2010 (date code 1023 and beyond) support the SFDP
feature as specified in the applicable datasheet.
The Read SFDP instruction is initiated by driving the /CS pin low and shifting the instruction code “5Ah”
followed by a 24-bit address (A23-A0)(1) into the DI pin. Eight “dummy” clocks are also required before the
SFDP register contents are shifted out on the falling edge of the 40th CLK with most significant bit (MSB)
first as shown in figure 34. For SFDP register values and descriptions, refer to the following SFDP
Definition table.
Note: 1. A23-A8 = 0; A7-A0 are used to define the starting byte address for the 256-Byte SFDP Register.
Instruction (5Ah)
Figure 34. Read SFDP Register Instruction Sequence Diagram
- 54 -
W25Q40BV
Serial Flash Discoverable Parameter (Revision 1.1) Definition Table
BYTE
ADDRESS
DATA
00h
53h
SFDP Signature
01h
46h
SFDP Signature
02h
44h
SFDP Signature
03h
50h
SFDP Signature
04h
01h
SFDP Minor Revisions
05h
01h
SFDP Major Revisions
06h
00h
Number of Parameter Headers (NPH)
07h
FFh
Reserved
08h
EFh
PID(3)(0): Manufacturer JEDEC ID
09h
00h
PID(0): Serial Flash Basics Minor Revisions
0Ah
01h
PID(0): Serial Flash Basics Major Revisions
0Bh
04h
PID(0): Serial Flash Basics Length
0Ch
80h
PID(0): Address of Parameter ID(0) Table (A7-A0)
0Dh
00h
PID(0): Address of Parameter ID(0) Table (A15-A8)
0Eh
00h
PID(0): Address of Parameter ID(0) Table (A23-A16)
0Fh
FFh
Reserved
10h
EFh
PID(1): Manufacturer JEDEC ID
11h
00h
PID(1): Serial Flash Properties Minor Revisions
12h
01h
PID(1): Serial Flash Properties Major Revisions
Serial Flash Properties
Revision 1.0
13h
00h
PID(1): Serial Flash Properties Length
00h = Unimplemented
14h
90h
PID(1): Address of Parameter ID(1) Table (A7-A0)
15h
00h
PID(1): Address of Parameter ID(1) Table (A15-A8)
16h
00h
PID(1): Address of Parameter ID(1) Table (A23-A16)
17h
FFh
Reserved
FFh
Reserved
...
(1)
80h
E5h
81h
20h
82h
F1h
83h
FFh
DESCRIPTION
COMMENT
SFDP Signature
= 50444653h
SFDP revision 1.1
1 Parameter Header
EFh = Winbond
Serial Flash Basics
Revision 1.0
4 Dwords(2)
PID(0) Table Address
= 000080h
EFh = Winbond
PID(1) Table Address
= 000090h
Bit[7:5]=111
Reserved
Bit[4:3]=00
Non-volatile Status Register
Bit[2] =1
Page Programmable
Bit[1:0]=01
Supports 4KB Erase
4K-Byte Erase Opcode
Bit[7] =1
Reserved
Bit[6] =1
Supports Single Input Quad Output
Bit[5] =1
Supports Quad Input Quad Output
Bit[4] =1
Supports Dual Input Dual Output
Bit[3] =0
Dual Transfer Rate not Supported
Bit[2:1]=00
3-Byte/24-Bit Addressing
Bit[0] =1
Supports Single Input Dual Output
Reserved
- 55 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
84h
FFh
Flash Size in Bits
85h
FFh
Flash Size in Bits
86h
3Fh
Flash Size in Bits
87h
00h
Flash Size in Bits
88h
44h
89h
EBh
8Ah
08h
8Bh
6Bh
8Ch
08h
8Dh
3Bh
8Eh
80h
8Fh
BBh
Bit[7:5]=000
No Mode Bits are needed
Bit[4:0]=01000
8 Dummy Bits are needed
Single Input Dual Output Fast Read Opcode
Bit[7:5]=100
8 Mode bits are needed
Bit[4:0]=00000
No Dummy bits are needed
Dual Input Dual Output Fast Read Opcode
FFh
Reserved
FFh
Reserved
...
(1)
FFh
4 Mega Bits =
003FFFFFh
Bit[7:5]=010
8 Mode Bits are needed
Bit[4:0]=00100
16 Dummy Bits are needed
Quad Input Quad Output Fast Read Opcode
Bit[7:5]=000
No Mode Bits are needed
Bit[4:0]=01000
8 Dummy Bits are needed
Single Input Quad Output Fast Read Opcode
Fast Read
Quad I/O
Setting
Fast Read
Quad Output
Setting
Fast Read
Dual Output
Setting
Fast Read
Dual I/O
Setting
Notes:
1. Data stored in Byte Address 18h to 7Fh & 90h to FFh are Reserved, the value is FFh.
2. 1 Dword = 4 Bytes
3. PID(x) = Parameter Identification Table (x)
- 56 -
W25Q40BV
8.2.37
Erase Security Registers (44h)
The W25Q40BV offers three 256-byte Security Registers which can be erased and programmed
individually. These registers may be used by the system manufacturers to store security and other
important information separately from the main memory array.
The Erase Security Register instruction is similar to the Sector Erase instruction. A Write Enable
instruction must be executed before the device will accept the Erase Security Register Instruction (Status
Register bit WEL must equal 1). The instruction is initiated by driving the /CS pin low and shifting the
instruction code “44h” followed by a 24-bit address (A23-A0) to erase one of the three security registers.
ADDRESS
A23-16
A15-12
A11-8
A7-0
Security Register #1
00h
0001
0000
Don’t Care
Security Register #2
00h
0010
0000
Don’t Care
Security Register #3
00h
0011
0000
Don’t Care
The Erase Security Register instruction sequence is shown in figure 35. The /CS pin must be driven high
after the eighth bit of the last byte has been latched. If this is not done the instruction will not be executed.
After /CS is driven high, the self-timed Erase Security Register operation will commence for a time
duration of tSE (See AC Characteristics). While the Erase Security Register cycle is in progress, the Read
Status Register instruction may still be accessed for checking the status of the BUSY bit. The BUSY bit is
a 1 during the erase cycle and becomes a 0 when the cycle is finished and the device is ready to accept
other instructions again. After the Erase Security Register cycle has finished the Write Enable Latch
(WEL) bit in the Status Register is cleared to 0. The Security Register Lock Bits LB[3:1] in the Status
Register-2 can be used to OTP protect the security registers. Once a lock bit is set to 1, the
corresponding security register will be permanently locked, Erase Security Register instruction to that
register will be ignored (See 8.1.9 for detail descriptions).
Instruction (44h)
Figure 35. Erase Security Registers Instruction Sequence
- 57 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8.2.38
Program Security Registers (42h)
The Program Security Register instruction is similar to the Page Program instruction. It allows from one
byte to 256 bytes of security register data to be programmed at previously erased (FFh) memory
locations. A Write Enable instruction must be executed before the device will accept the Program Security
Register Instruction (Status Register bit WEL= 1). The instruction is initiated by driving the /CS pin low
then shifting the instruction code “42h” followed by a 24-bit address (A23-A0) and at least one data byte,
into the DI pin. The /CS pin must be held low for the entire length of the instruction while data is being
sent to the device.
ADDRESS
A23-16
A15-12
A11-8
A7-0
Security Register #1
00h
0001
0000
Byte Address
Security Register #2
00h
0010
0000
Byte Address
Security Register #3
00h
0011
0000
Byte Address
The Program Security Register instruction sequence is shown in figure 36. The Security Register Lock
Bits LB[3:1] in the Status Register-2 can be used to OTP protect the security registers. Once a lock bit is
set to 1, the corresponding security register will be permanently locked, Program Security Register
instruction to that register will be ignored (See 8.1.9, 8.2.21 for detail descriptions).
Instruction (42h)
Figure 36. Program Security Registers Instruction Sequence
- 58 -
W25Q40BV
8.2.39
Read Security Registers (48h)
The Read Security Register instruction is similar to the Fast Read instruction and allows one or more data
bytes to be sequentially read from one of the three security registers. The instruction is initiated by driving
the /CS pin low and then shifting the instruction code “48h” followed by a 24-bit address (A23-A0) and
eight “dummy” clocks into the DI pin. The code and address bits are latched on the rising edge of the CLK
pin. After the address is received, the data byte of the addressed memory location will be shifted out on
the DO pin at the falling edge of CLK with most significant bit (MSB) first. The byte address is
automatically incremented to the next byte address after each byte of data is shifted out. Once the byte
address reaches the last byte of the register (byte FFh), it will reset to 00h, the first byte of the register,
and continue to increment. The instruction is completed by driving /CS high. The Read Security Register
instruction sequence is shown in figure 37. If a Read Security Register instruction is issued while an
Erase, Program or Write cycle is in process (BUSY=1) the instruction is ignored and will not have any
effects on the current cycle. The Read Security Register instruction allows clock rates from D.C. to a
maximum of FR (see AC Electrical Characteristics).
ADDRESS
A23-16
A15-12
A11-8
A7-0
Security Register #1
00h
0001
0000
Byte Address
Security Register #2
00h
0010
0000
Byte Address
Security Register #3
00h
0011
0000
Byte Address
Instruction (48h)
Figure 37. Read Security Registers Instruction Sequence
- 59 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
ELECTRICAL CHARACTERISTICS(1)
9.
9.1 Absolute Maximum Ratings (2)
PARAMETERS
SYMBOL
Supply Voltage
VCC
Voltage Applied to Any Pin
VIO
Transient Voltage on any Pin
VIOT
Storage Temperature
CONDITIONS
RANGE
UNIT
–0.6 to +4.0
V
Relative to Ground
–0.6 to VCC+0.4
V
<20nS Transient
Relative to Ground
–2.0V to VCC+2.0V
V
TSTG
–65 to +150
°C
Lead Temperature
TLEAD
See Note (3)
°C
Electrostatic Discharge Voltage
VESD
–2000 to +2000
V
Human Body Model(4)
Notes:
1. Specification for W25Q40BV is preliminary. See preliminary designation at the end of this document.
2. This device has been designed and tested for the specified operation ranges. Proper operation outside
of these levels is not guaranteed. Exposure to absolute maximum ratings may affect device reliability.
Exposure beyond absolute maximum ratings may cause permanent damage.
3. Compliant with JEDEC Standard J-STD-20C for small body Sn-Pb or Pb-free (Green) assembly and
the European directive on restrictions on hazardous substances (RoHS) 2002/95/EU.
4. JEDEC Std JESD22-A114A (C1=100pF, R1=1500 ohms, R2=500 ohms).
9.2 Operating Ranges
PARAMETER
Supply Voltage(1)
Ambient
Temperature,
Operating
SYMBOL
VCC
TA
CONDITIONS
FR = 80MHz, fR = 50MHz
FR = 104MHz, fR = 50MHz
Industrial
SPEC
UNIT
MIN
MAX
2.7
3.0
3.6
3.6
V
–40
+85
°C
Note:
1. VCC voltage during Read can operate across the min and max range but should not exceed ±10% of
the programming (erase/write) voltage.
- 60 -
W25Q40BV
9.3
Power-up Timing and Write Inhibit Threshold
Parameter
Symbol
spec
MIN
MAX
Unit
VCC (min) to /CS Low
tVSL(1)
10
Time Delay Before Write Instruction
tPUW
1
10
ms
Write Inhibit Threshold Voltage
VWI
1.0
2.0
V
(1)
(1)
µs
Note:
1. These parameters are characterized only.
Figure 38. Power-up Timing and Voltage Levels
- 61 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
9.4 DC Electrical Characteristics
SPEC
PARAMETER
SYMBOL
CONDITIONS
Input Capacitance
CIN(1)
VIN = 0V(1)
Output Capacitance
Cout(1)
Input Leakage
ILI
I/O Leakage
ILO
Standby Current
ICC1
/CS = VCC,
VIN = GND or VCC
Power-down Current
ICC2
/CS = VCC,
VIN = GND or VCC
Current Read Data /
Dual /Quad 1MHz(2)
ICC3
Current Read Data /
Dual /Quad 33MHz(2)
MIN
TYP
MAX
UNIT
6
pF
8
pF
±2
µA
±2
µA
25
50
µA
1
5
µA
C = 0.1 VCC / 0.9 VCC
DO = Open
4/5/6
6/7.5/9
mA
ICC3
C = 0.1 VCC / 0.9 VCC
DO = Open
6/7/8
9/10.5/12
mA
Current Read Data /
Dual Output Read/Quad
Output Read 50MHz(2)
ICC3
C = 0.1 VCC / 0.9 VCC
DO = Open
7/8/9
10/12/13.5
mA
Current Read Data /
Dual Output Read/Quad
Output Read 80MHz(2)
ICC3
C = 0.1 VCC / 0.9 VCC
DO = Open
10/11/12
15/16.5/18
mA
Current Write Status
Register
ICC4
/CS = VCC
8
12
mA
Current Page Program
ICC5
/CS = VCC
20
25
mA
Current Sector/Block
Erase
ICC6
/CS = VCC
20
25
mA
Current Chip Erase
ICC7
/CS = VCC
20
25
mA
Input Low Voltage
VIL
VCC x 0.3
V
Input High Voltage
VIH
Output Low Voltage
VOL
IOL = 100 µA
Output High Voltage
VOH
IOH = –100 µA
VOUT =
0V(1)
VCC x 0.7
V
0.2
VCC – 0.2
Notes:
1. Tested on sample basis and specified through design and characterization data. TA = 25° C, VCC = 3V.
2. Checker Board Pattern.
- 62 -
V
V
W25Q40BV
9.5 AC Measurement Conditions
PARAMETER
SYMBOL
Load Capacitance
Input Rise and Fall Times
Input Pulse Voltages
Input Timing Reference Voltages
Output Timing Reference Voltages
SPEC
MIN
MAX
UNIT
CL
30
pF
TR, TF
5
ns
VIN
0.2 VCC to 0.8 VCC
V
IN
0.3 VCC to 0.7 VCC
V
OUT
0.5 VCC to 0.5 VCC
V
Note:
1. Output Hi-Z is defined as the point where data out is no longer driven.
Figure 39. AC Measurement I/O Waveform
- 63 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
9.6 AC Electrical Characteristics
DESCRIPTION
SYMBOL
SPEC
ALT
MIN
TYP
UNIT
MAX
Clock frequency for all instructions
except Read Data instruction (03h)
2.7V-3.6V VCC & Industrial Temperature
FR
fC
D.C.
80
MHz
Clock frequency for all instructions
except Read Data instruction (03h)
3.0V-3.6V VCC & Industrial Temperature
FR
fC
D.C.
104
MHz
Clock frequency for Read Data instruction (03h)
fR
D.C.
50
MHz
Clock High, Low Time
for all instructions except Read Data (03h)
tCLH1,
tCLL1(1)
6
ns
Clock High, Low Time
for Read Data (03h) instruction
tCRLH,
tCRLL(1)
8
ns
Clock Rise Time peak to peak
tCLCH(2)
0.1
V/ns
Clock Fall Time peak to peak
tCHCL(2)
0.1
V/ns
5
ns
5
ns
/CS Active Setup Time relative to CLK
tSLCH
tCSS
/CS Not Active Hold Time relative to CLK
tCHSL
Data In Setup Time
tDVCH
tDSU
2
ns
Data In Hold Time
tCHDX
tDH
5
ns
/CS Active Hold Time relative to CLK
tCHSH
5
ns
/CS Not Active Setup Time relative to CLK
tSHCH
5
ns
/CS Deselect Time (for Array Read Æ Array Read)
tSHSL1
tCSH
10
ns
/CS Deselect Time (for Erase or Program Æ Read
Status Registers)
Volatile Status Register Write Time
tSHSL2
tCSH
50
ns
50
Output Disable Time
tSHQZ(2)
tDIS
7
ns
Clock Low to Output Valid
tCLQV1
tV1
7
ns
Clock Low to Output Valid (for Read ID instructions)
tCLQV2
tV2
7.5
ns
Output Hold Time
tCLQX
tHO
/HOLD Active Setup Time relative to CLK
tHLCH
0
ns
5
ns
Continued – next page
- 64 -
W25Q40BV
9.7 AC Electrical Characteristics (cont’d)
SPEC
DESCRIPTION
SYMBOL
ALT
UNIT
MIN
TYP
MAX
/HOLD Active Hold Time relative to CLK
tCHHH
5
ns
/HOLD Not Active Setup Time relative to CLK
tHHCH
5
ns
/HOLD Not Active Hold Time relative to CLK
tCHHL
5
ns
/HOLD to Output Low-Z
tHHQX(2)
tLZ
7
ns
/HOLD to Output High-Z
tHLQZ(2)
tHZ
12
ns
Write Protect Setup Time Before /CS Low
tWHSL(3)
20
ns
Write Protect Hold Time After /CS High
tSHWL(3)
100
ns
tDP(2)
3
µs
/CS High to Standby Mode without Electronic
Signature Read
tRES1(2)
3
µs
/CS High to Standby Mode with Electronic Signature
Read
tRES2(2)
1.8
µs
/CS High to next Instruction after Suspend
tSUS(2)
20
µs
/CS High to Power-down Mode
Write Status Register Time
tW
10
15
ms
Byte Program Time (First Byte) (4)
tBP1
20
50
µs
Additional Byte Program Time (After First Byte) (4)
tBP2
2.5
12
µs
Page Program Time
tPP
0.7
3.0
ms
Sector Erase Time (4KB)
tSE
30
200/400(5)
ms
Block Erase Time (32KB)
tBE1
120
800
ms
Block Erase Time (64KB)
tBE2
150
1,000
ms
Chip Erase Time
tCE
1
4
s
Notes:
1.
2.
3.
Clock high + Clock low must be less than or equal to 1/fC.
Value guaranteed by design and/or characterization, not 100% tested in production.
Only applicable as a constraint for a Write Status Register instruction when SRP0 bit is set to 1.
4.
For multiple bytes after first byte within a page, tBPN = tBP1 + tBP2 * N (typical) and tBPN = tBP1 + tBP2 * N (max), where N =
number of bytes programmed.
5.
Max Value tSE with <50K cycles is 200ms and >50K & <100K cycles is 400ms.
- 65 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
9.8 Serial Output Timing
9.9 Serial Input Timing
9.10 Hold Timing
- 66 -
W25Q40BV
10. PACKAGE SPECIFICATION
10.1 8-Pin SOIC 150-mil (Package Code SN)
8
c
5
E HE
L
1
4
θ
0.25
D
A
Y
e
SEATING PLANE
SYMBOL
A
A1
b
c
(3)
E
(3)
D
(2)
e
HE
(4)
Y
L
θ
GAUGE PLANE
A1
b
MILLIMETERS
INCHES
Min
Max
Min
Max
1.35
0.10
0.33
0.19
3.80
4.80
1.75
0.25
0.51
0.25
4.00
5.00
0.053
0.004
0.013
0.008
0.150
0.188
0.069
0.010
0.020
0.010
0.157
0.196
6.20
0.10
1.27
10°
0.228
--0.016
0°
1.27 BSC
5.80
--0.40
0°
0.050 BSC
0.244
0.004
0.050
10°
Notes:
1. Controlling dimensions: inches, unless otherwise specified.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package.
4. Formed leads shall be planar with respect to one another within .0004 inches at the seating plane.
- 67 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
10.2 8-Pin SOIC 208-mil (Package Code SS)
θ
GAUGE PLANE
SYMBOL
A
A1
A2
b
C
D
D1
E
E1
(2)
e
H
L
y
θ
MILLIMETERS
INCHES
Min
Nom
Max
Min
Nom
Max
1.75
0.05
1.70
0.35
0.19
5.18
5.13
5.18
5.13
1.95
0.15
1.80
0.42
0.20
5.28
5.23
5.28
5.23
1.27 BSC.
7.90
0.65
-----
2.16
0.25
1.91
0.48
0.25
5.38
5.33
5.38
5.33
0.069
0.002
0.067
0.014
0.007
0.204
0.202
0.204
0.202
0.085
0.010
0.075
0.019
0.010
0.212
0.210
0.212
0.210
8.10
0.80
0.10
8°
0.303
0.020
--0°
0.077
0.006
0.071
0.017
0.008
0.208
0.206
0.208
0.206
0.050 BSC.
0.311
0.026
-----
7.70
0.50
--0°
0.319
0.031
0.004
8°
Notes:
1. Controlling dimensions: inches, unless otherwise specified.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the package.
4. Formed leads shall be planar with respect to one another within .0004 inches at the seating plane.
- 68 -
W25Q40BV
10.3 8-Pad WSON 6x5mm (Package Code ZP)
SYMBOL
MILLIMETERS
INCHES
Min
Nom
Max
Min
Nom
Max
A
0.70
0.75
0.80
0.028
0.030
0.031
A1
0.00
0.02
0.05
0.000
0.001
0.002
b
0.35
0.40
0.48
0.014
0.016
0.019
C
---
0.20 REF.
---
---
0.008 REF.
---
D
5.90
6.00
6.10
0.232
0.236
0.240
D2
3.35
3.40
3.45
0.132
0.134
0.136
E
4.90
5.00
5.10
0.193
0.197
0.201
E2
4.25
4.30
4.35
0.167
0.169
0.171
e
(2)
1.27 BSC.
0.050 BSC.
L
0.55
0.60
0.65
0.022
0.024
0.026
y
0.00
---
0.075
0.000
---
0.003
- 69 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
8-Pad WSON 6x5mm Cont’d.
SYMBOL
MILLIMETERS
Min
Nom
INCHES
Max
Min
Nom
Max
SOLDER PATTERN
M
3.40
0.134
N
4.30
0.169
P
6.00
0.236
Q
0.50
0.020
R
0.75
0.026
Notes:
1. Advanced Packaging Information; please contact Winbond for the latest minimum and maximum specifications.
2. BSC = Basic lead spacing between centers.
3. Dimensions D and E1 do not include mold flash protrusions and should be measured from the bottom of the
package.
4. The metal pad area on the bottom center of the package is connected to the device ground (GND pin). Avoid
placement of exposed PCB vias under the pad.
- 70 -
W25Q40BV
11. ORDERING INFORMATION
W(1) 25Q 40B V xx(2)
W
=
Winbond
25Q
=
SpiFlash Serial Flash Memory with 4KB sectors, Dual/Quad I/O
40B
=
4M-bit
V =
SN
ZP
I
2.7V to 3.6V
= 8-pin SOIC 150-mil
= 8-pad WSON 6x5-mm
=
SS
=
8-pin SOIC 208-mil
Industrial (-40°C to +85°C)
(3,4)
G =
P =
Green Package (Lead-free, RoHS Compliant, Halogen-free (TBBA), Antimony-Oxide-free Sb2O3)
Green Package with Status Register Power-Down & OTP enabled
Notes:
1. The “W” prefix is not included on the part marking.
nd
2. Only the 2
letter is used for the part marking; WSON package type ZP is not used for the part marking.
3. Standard bulk shipments are in Tube (shape E). Please specify alternate packing method, such as Tape and
Reel (shape T) or Tray (shape S), when placing orders.
4. For shipments with OTP feature enabled, please specify when placing orders.
- 71 -
Publication Release Date: July 08, 2010
Preliminary - Revision B
W25Q40BV
11.1 Valid Part Numbers and Top Side Marking
The following table provides the valid part numbers for the W25Q40BV SpiFlash Memory. Please contact
Winbond for specific availability by density and package type. Winbond SpiFlash memories use an 12digit Product Number for ordering. However, due to limited space, the Top Side Marking on all packages
use an abbreviated 10-digit number.
PACKAGE TYPE
SN
SOIC-8 150mil
SS
SOIC-8 208mil
ZP(1)
WSON-8 6x5mm
DENSITY
4M-bit
4M-bit
4M-bit
PRODUCT NUMBER
TOP SIDE MARKING
W25Q40BVSNIG
W25Q40BVSNIP
W25Q40BVSSIG
W25Q40BVSSIP
W25Q40BVZPIG
W25Q40BVZPIP
25Q40BVNIG
25Q40BVNIP
25Q40BVSIG
25Q40BVSIP
25Q40BVIG
25Q40BVIP
Note:
1. WSON package type ZP is not used in the top side marking.
- 72 -
W25Q40BV
12. REVISION HISTORY
VERSION
DATE
A
03/26/09
B
07/08/10
PAGE
DESCRIPTION
New Create Preliminary
15
49, 52 & 53
67-69
62 & 65
5, 8, 19, 54-56
Updated memory protection description
Updated 90h, 4Bh & 9Fh waveforms
Updated package diagrams
Updated parameter VIL/VIH, tSE, tPP
Added SFDP feature
Preliminary Designation
The “Preliminary” designation on a Winbond datasheet indicates that the product is not fully
characterized. The specifications are subject to change and are not guaranteed. Winbond or an
authorized sales representative should be consulted for current information before using this product.
Trademarks
Winbond and SpiFlash are trademarks of Winbond Electronics Corporation.
All other marks are the property of their respective owner.
Important Notice
Winbond products are not designed, intended, authorized or warranted for use as components in
systems or equipment intended for surgical implantation, atomic energy control instruments,
airplane or spaceship instruments, transportation instruments, traffic signal instruments,
combustion control instruments, or for other applications intended to support or sustain life.
Further more, Winbond products are not intended for applications wherein failure of Winbond
products could result or lead to a situation wherein personal injury, death or severe property or
environmental damage could occur.
Winbond customers using or selling these products for use in such applications do so at their
own risk and agree to fully indemnify Winbond for any damages resulting from such improper use
or sales.
- 73 -
Publication Release Date: July 08, 2010
Preliminary - Revision B