74LCX00 Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Features General Description ■ 5V tolerant inputs The LCX00 contains four 2-input NAND gates. The inputs tolerate voltages up to 7V allowing the interface of 5V systems to 3V systems. ■ 2.3V–3.6V VCC specifications provided ■ 5.2ns tPD max. (VCC = 3.3V), 10µA ICC max. ■ Power down high impedance inputs and outputs ■ ±24mA output drive (VCC = 3.0V) ■ Implements proprietary noise/EMI reduction circuitry The 74LCX00 is fabricated with advanced CMOS technology to achieve high speed operation while maintaining CMOS low power dissipation. ■ Latch-up performance exceeds JEDEC 78 conditions ■ ESD performance: – Human body model > 2000V – Machine model > 200V ■ Leadless DQFN package Ordering Information Order Number Package Number Package Description 74LCX00M M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow 74LCX00SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74LCX00BQX(1) MLP14A 14-Terminal Depopulated Quad Very-Thin Flat Pack No Leads (DQFN), JEDEC MO-241, 2.5 x 3.0mm 74LCX00MTC MTC14 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Note: 1. DQFN package available in Tape and Reel only. Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering number. All packages are lead free per JEDEC: J-STD-020B standard. ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs February 2008 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Logic Symbol Connection Diagrams Pin Assignments for SOIC, SOP, and TSSOP IEEE/IEC Pad Assignments for DQFN (Top View) Pin Description Pin Names Description An, Bn Inputs On Outputs ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 2 Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only. Symbol VCC VI VO Parameter Rating Supply Voltage –0.5V to +7.0V DC Input Voltage –0.5V to +7.0V DC Output Voltage, Output in HIGH or LOW IIK DC Input Diode Current, VI < GND IOK DC Output Diode Current State(2) –0.5V to VCC + 0.5V –50mA VO < GND –50mA VO > VCC +50mA IO DC Output Source/Sink Current ICC DC Supply Current per Supply Pin IGND DC Ground Current per Ground Pin TSTG Storage Temperature ±50mA ±100mA ±100mA –65°C to +150°C Note: 2. IO Absolute Maximum Rating must be observed. Recommended Operating Conditions(3) The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings. Symbol VCC Parameter Min. Max. Units Operating 2.0 3.6 V Data Retention 1.5 3.6 Supply Voltage VI Input Voltage 0 5.5 V VO Output Voltage, HIGH or LOW State 0 VCC V VCC = 3.0V–3.6V ±24 mA VCC = 2.7V–3.0V ±12 VCC = 2.3V–2.7V ±8 IOH / IOL TA ∆t / ∆V Output Current Free-Air Operating Temperature Input Edge Rate, VIN = 0.8V–2.0V, VCC = 3.0V –40 85 °C 0 10 ns / V Note: 3. Unused inputs must be held HIGH or LOW. They may not float. ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 3 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Absolute Maximum Ratings TA = –40°C to +85°C Symbol VIH VIL VOH VOL II Parameter HIGH Level Input Voltage LOW Level Input Voltage HIGH Level Output Voltage LOW Level Output Voltage Input Leakage Current VCC (V) Min. 2.3–2.7 1.7 2.7–3.6 2.0 Max. 2.3–2.7 0.7 0.8 IOH = –100µA 2.3–3.6 V VCC – 0.2 2.3 IOH = –8mA 1.8 2.7 IOH = –12mA 2.2 3.0 IOH = –18mA 2.4 IOH = –24mA 2.2 V IOL = 100µA 0.2 2.3 IOL = 8mA 0.6 2.7 IOL = 12mA 0.4 3.0 IOL = 16mA 0.4 IOL = 24mA 0.55 0 ≤ VI ≤ 5.5V 2.3–3.6 2.3–3.6 Power-Off Leakage Current 0 ICC Quiescent Supply Current 2.3–3.6 Increase in ICC per Input 2.3–3.6 Units V 2.7–3.6 IOFF ∆ICC Conditions V ±5.0 µA VI or VO = 5.5V 10 µA VI = VCC or GND 10 µA 3.6V ≤ VI ≤ 5.5V ±10 VIH = VCC – 0.6V 500 µA AC Electrical Characteristics TA = –40°C to +85°C, RL = 500Ω VCC = 3.3V ± 0.3V, CL = 50pF Symbol tPHL, tPLH Parameter Propagation Delay tOSHL, tOSLH Output to Output Skew(4) VCC = 2.7V, CL = 50pF VCC = 2.5V ± 0.2V, CL = 30pF Min. Max. Min. Max. Min. Max. Units 1.5 5.2 1.5 6.0 1.5 6.2 ns 1.0 ns Note: 4. Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 4 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs DC Electrical Characteristics TA = 25°C Symbol Parameter VCC (V) VOLP Quiet Output Dynamic Peak VOL 3.3 VOLV Quiet Output Dynamic Valley VOL Conditions Typical Unit CL = 50pF, VIH = 3.3V, VIL = 0V 0.8 V 2.5 CL = 30pF, VIH = 2.5V, VIL = 0V 0.6 3.3 CL = 50pF, VIH = 3.3V, VIL = 0V –0.8 2.5 CL = 30pF, VIH = 2.5V, VIL = 0V –0.6 V Capacitance Symbol Parameter Conditions Typical Units Input Capacitance VCC = Open, VI = 0V or VCC 7 pF COUT Output Capacitance VCC = 3.3V, VI = 0V or VCC 8 pF CPD Power Dissipation Capacitance VCC = 3.3V, VI = 0V or VCC, f = 10MHz 25 pF CIN ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 5 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Dynamic Switching Characteristics Test Switch tPLH, tPHL Open tPZL, tPLZ 6V at VCC = 3.3 ± 0.3V VCC x 2 at VCC = 2.5 ± 0.2V tPZH, tPHZ GND Figure 1. AC Test Circuit (CL includes probe and jig capacitance) Waveform for Inverting and Non-Inverting Functions 3-STATE Output High Enable and Disable Times for Logic Propagation Delay. Pulse Width and trec Waveforms Setup Time, Hold Time and Recovery Time for Logic 3-STATE Output Low Enable and Disable Times for Logic trise and tfall VCC Symbol 3.3V ± 0.3V 2.7V 2.5V ± 0.2V Vmi 1.5V 1.5V VCC / 2 Vmo 1.5V 1.5V VCC / 2 Vx VOL + 0.3V VOL + 0.3V VOL + 0.15V Vy VOH – 0.3V VOH – 0.3V VOH – 0.15V Figure 2. Waveforms (Input Characteristics; f = 1MHz, tr = tf = 3ns) ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 6 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs AC Loading and Waveforms (Generic for LCX Family) 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Schematic Diagram (Generic for LCX Family) ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 7 Tape Format for DQFN Package Designator Tape Section Number of Cavities Cavity Status Cover Tape Status BQX Leader (Start End) 125 (Typ.) Empty Sealed Carrier 3000 Filled Sealed Trailer (Hub End) 75 (Typ.) Empty Sealed Tape Dimensions inches (millimeters) Reel Dimensions inches (millimeters) Tape Size A B C D N W1 W2 12mm 13.0 (330.0) 0.059 (1.50) 0.512 (13.00) 0.795 (20.20) 2.165 (55.00) 0.488 (12.4) 0.724 (18.4) ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 8 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Tape and Reel Specification 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Physical Dimensions 8.75 8.50 0.65 A 7.62 14 8 B 5.60 4.00 3.80 6.00 PIN ONE INDICATOR 1 1.70 7 0.51 0.35 1.27 0.25 1.27 LAND PATTERN RECOMMENDATION M C B A (0.33) 1.75 MAX 1.50 1.25 SEE DETAIL A 0.25 0.10 C 0.25 0.19 0.10 C NOTES: UNLESS OTHERWISE SPECIFIED A) THIS PACKAGE CONFORMS TO JEDEC MS-012, VARIATION AB, ISSUE C, B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE MOLD GAGE PLANE FLASH OR BURRS. D) LANDPATTERN STANDARD: SOIC127P600X145-14M 0.36 E) DRAWING CONFORMS TO ASME Y14.5M-1994 F) DRAWING FILE NAME: M14AREV13 0.50 X 45° 0.25 R0.10 R0.10 8° 0° 0.90 0.50 (1.04) SEATING PLANE DETAIL A SCALE: 20:1 Figure 3. 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 9 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Physical Dimensions (Continued) Figure 4. 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 10 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Physical Dimensions (Continued) Figure 5. 14-Terminal Depopulated Quad Very-Thin Flat Pack No Leads (DQFN), JEDEC MO-241, 2.5 x 3.0mm Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 11 0.65 0.43 TYP 1.65 6.10 0.45 12.00° TOP & BOTTOM R0.09 min A. CONFORMS TO JEDEC REGISTRATION MO-153, VARIATION AB, REF NOTE 6 B. DIMENSIONS ARE IN MILLIMETERS C. DIMENSIONS ARE EXCLUSIVE OF BURRS, MOLD FLASH, AND TIE BAR EXTRUSIONS D. DIMENSIONING AND TOLERANCES PER ANSI Y14.5M, 1982 E. LANDPATTERN STANDARD: SOP65P640X110-14M F. DRAWING FILE NAME: MTC14REV6 1.00 R0.09min Figure 6. 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products. Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/packaging/ ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 12 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs Physical Dimensions (Continued) ACEx® Build it Now™ CorePLUS™ CROSSVOLT™ CTL™ Current Transfer Logic™ EcoSPARK® EZSWITCH™ * ™ PDP-SPM™ Power220® POWEREDGE® Power-SPM™ PowerTrench® Programmable Active Droop™ QFET® QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ SMART START™ SPM® STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 FPS™ FRFET® Global Power ResourceSM Green FPS™ Green FPS™e-Series™ GTO™ i-Lo™ IntelliMAX™ ISOPLANAR™ MegaBuck™ MICROCOUPLER™ MicroFET™ MicroPak™ MillerDrive™ Motion-SPM™ OPTOLOGIC® OPTOPLANAR® ® Fairchild® Fairchild Semiconductor® FACT Quiet Series™ FACT® FAST® FastvCore™ FlashWriter® * ® SupreMOS™ SyncFET™ ® The Power Franchise® TinyBoost™ TinyBuck™ TinyLogic® TINYOPTO™ TinyPower™ TinyPWM™ TinyWire™ µSerDes™ UHC® Ultra FRFET™ UniFET™ VCX™ * EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Product Status Definition Advance Information Formative or In Design This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Preliminary First Production This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only. Rev. I33 ©1995 Fairchild Semiconductor Corporation 74LCX00 Rev. 1.7.0 www.fairchildsemi.com 13 74LCX00 — Low Voltage Quad 2-Input NAND Gate with 5V Tolerant Inputs TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.