ETC STB3015LT4

STB3015L
STP3015L
N-CHANNEL 30V - 0.013 Ω - 40A D2PAK/TO-220
STripFET POWER MOSFET
PRELIMINARY DATA
TYPE
STB3015L
STP3015L
■
■
■
■
■
VDSS
R DS(on)
ID
30 V
30 V
<0.0155 Ω
<0.0155 Ω
40 A
40 A
TYPICAL RDS(on) = 0.013 Ω
EXCEPTIONAL dv/dt CAPABILITY
LOW GATE CHARGE A 100 oC
APPLICATION ORIENTED
CHARACTERIZATION
FOR THROUGH-HOLE VERSION CONTACT
SALES OFFICE
3
1
D2PAK
TO-263
(suffix“T4”)
1
2
3
TO-220
DESCRIPTION
This Power Mosfet is the latest development of
STMicroelectronics unique “Single Feature Size” stripbased process. The resulting transistor shows extremely
high packing density for low on-resistance, rugged
avalance characteristics and less critical alignment steps
therefore a remarkable manufacturing reproducibility.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
SOLENOID AND RELAY DRIVERS
■ MOTOR CONTROL, AUDIO AMPLIFIERS
■ DC-DC & DC-AC CONVERTERS IN HIGH
PERFORMANCE VRMs
■ AUTOMOTIVE ENVIRONMENT (INJECTION,
ABS, AIR-BAG, LAMPDRIVERS, etc.)
ABSOLUTE MAXIMUM RATINGS
Symbol
V DS
V DGR
VGS
ID
ID
IDM(•)
Ptot
Parameter
Value
Unit
30
V
Drain-gate Voltage (RGS = 20 kΩ)
30
V
Gate- source Voltage
±20
V
Drain Current (continuos) at TC = 25°C
Drain Current (continuos) at TC = 100°C
40
A
28
A
Drain Current (pulsed)
160
A
Drain-source Voltage (VGS = 0)
Total Dissipation at TC = 25°C
Derating Factor
dv/dt (1)
Tstg
Tj
Peak Diode Recovery voltage slope
Storage Temperature
Max. Operating Junction Temperature
(•)Pulse width limited by safe operating area
80
W
0.53
W/°C
7
V/ns
–65 to 175
°C
175
°C
(1)ISD [ 40 A, di/dt m200A/ms, VDD [ V(BR)DSS, Tj [ TJMA
November 2000
This is preliminary data new product in development or undergoing evaluation. Details are subject to change without notice.
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STB3015L/STP3015L
THERMAL DATA
R thj-case
R thj-amb
Rthc-sink
Tj
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
1.88
62.5
0.5
300
°C/W
°C/W
°C/W
°C
Max Value
Unit
Max
Max
Typ
AVALANCHE CHARACTERISTICS
Symbol
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
40
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 15 V)
200
mJ
ELECTRICAL CHARACTERISTICS (Tcase = 25 °C unless otherwise specified)
OFF
Symbol
Parameter
Test Conditions
Drain-source
Breakdown Voltage
ID = 250 µA
IDSS
Zero Gate Voltage
Drain Current (V GS = 0)
VDS = Max Rating
VDS = Max Rating, TC = 125 °C
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20 V
V(BR)DSS
VGS = 0
Min.
Typ.
Max.
30
Unit
V
1
10
µA
µA
±100
nA
Max.
Unit
2.5
V
0.0155
0.022
Ω
Ω
ON (*)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS
ID = 250 µA
R DS(on)
Static Drain-source On
Resistance
VGS = 10 V
VGS = 5 V
ID = 20 A
I D = 20 A
ID(on)
On State Drain Current
VDS > ID(on) x RDS(on)max
VGS = 10 V
Min.
Typ.
1
0.013
40
A
DYNAMIC
Symbol
gfs
(*)
C iss
Coss
Crss
2/7
Parameter
Test Conditions
Forward Transconductance
VDS > ID(on) x R DS(on)max
ID=20 A
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitances
VDS = 25V f = 1 MHz VGS = 0
Min.
Typ.
15
20
Max.
Unit
S
2500
1200
400
pF
pF
pF
STB3015L/STP3015L
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
td(on)
tr
Qg
Parameter
Test Conditions
Turn-on Delay Time
Rise Time
VDD = 15 V
ID = 20 A
RG = 4.7 Ω
VGS = 5 V
(see test circuit, Figure 3)
Total Gate Charge
VDD= 24 V ID= 40 A VGS=5 V
Min.
Typ.
Max.
25
160
Unit
ns
ns
40
nC
Max.
Unit
SWITCHING OFF
Symbol
td(Voff)
tf
tc
Parameter
Off-voltage Rise Time
Fall Time
Cross-over Time
Test Conditions
Min.
Vclamp = 24 V
ID = 40 A
RG = 4.7 Ω
VGS = 5 V
(see test circuit, Figure 5)
Typ.
25
120
155
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
ISD
ISDM(•)
Source-drain Current
Source-drain Current (pulsed)
VSD (*)
Forward On Voltage
ISD =40 A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD =40 A
di/dt = 100 A/µs
VDD = 20 V
Tj = 150 °C
(see test circuit, Figure 5)
trr
Qrr
IRRM
Test Conditions
Min.
Typ.
V GS = 0
50
0.9
3.5
Max.
Unit
40
160
A
A
1.5
V
ns
nC
A
(*) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
(•)Pulse width limit ed by safe operating area.
.
.
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STB3015L/STP3015L
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
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STB3015L/STP3015L
D2PAK MECHANICAL DATA
DIM.
mm.
MIN.
TYP
inch
MAX.
MIN.
A
4.4
4.6
0.173
TYP.
0.181
MAX.
A1
2.49
2.69
0.098
0.106
A2
0.03
0.23
0.001
0.009
B
0.7
0.93
0.027
0.036
B2
1.14
1.7
0.044
0.067
C
0.45
0.6
0.017
0.023
C2
1.23
1.36
0.048
0.053
D
8.95
9.35
0.352
D1
E
8
10
10.4
0.393
4.88
5.28
0.192
0.208
E1
G
0.368
0.315
8.5
0.334
L
15
15.85
0.590
0.625
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.068
M
2.4
3.2
0.094
0.126
R
V2
0.4
0º
0.015
8º
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STB3015L/STP3015L
TO-220 MECHANICAL DATA
DIM.
mm.
MIN.
MAX.
MIN.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.051
D
2.40
2.72
0.094
0.107
D1
1.27
TYP.
MAX.
0.050
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.65
5.15
0.194
0.203
G1
2.4
2.7
0.094
0.106
H2
10.0
10.40
0.393
L2
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TYP
inch
16.4
0.409
0.645
L4
13.0
14.0
0.511
0.551
L5
2.65
2.95
0.104
0.116
L6
15.25
15.75
0.600
0.620
L7
6.2
6.6
0.244
0.260
L9
3.5
3.93
0.137
0.154
DIA
3.75
3.85
0.147
0.151
STB3015L/STP3015L
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in lif e support devices or systems without express written approval of STMicroelectronics.
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