SHENZHENFREESCALE AOT3N60

AOT3N60
600V,2.5A N-Channel MOSFET
General Description
The AOT3N60 have been fabricated using an advanced high voltage MOSFET process that is designed to deliver
high levels of performance and robustness in popular AC- DC applications.By providing low RDS(on), Ciss and Crss
along with guaranteed avalanche capability these parts can be adopted quickly into new and existing offline power
supply designs.
Features
VDS
ID (at VGS=10V)
700V@150℃
2.5A
RDS(ON) (at VGS=10V)
<3.5Ω
D
G
S
Absolute Maximum Ratings TA=25°C unless otherwise noted
Symbol
Parameter
Drain-Source Voltage
VDS
VGS
Gate-Source Voltage
Continuous Drain
Current
TC=25°C
TC=100°C
Units
V
±30
V
2.5
ID
A
1.9
Pulsed Drain Current C
IDM
Avalanche Current C
IAR
2
A
Repetitive avalanche energy C
EAR
60
mJ
Single pulsed avalanche energy G
Peak diode recovery dv/dt
TC=25°C
Power Dissipation B Derate above 25oC
Junction and Storage Temperature Range
Maximum lead temperature for soldering
purpose, 1/8" from case for 5 seconds
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A,D
EAS
dv/dt
120
5
83
mJ
V/ns
W
0.7
-55 to 150
W/ oC
°C
300
°C
Maximum Case-to-sink A
Maximum Junction-to-Case
1/5
Maximum
600
8
PD
TJ, TSTG
TL
Symbol
RθJA
RθCS
RθJC
Typical
54
Maximum
65
Units
°C/W
1.2
0.5
1.5
°C/W
°C/W
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AOT3N60
600V,2.5A N-Channel MOSFET
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min
ID=250µA, VGS=0V, TJ=25°C
600
Typ
Max
Units
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
BVDSS
/∆TJ
Zero Gate Voltage Drain Current
IDSS
Zero Gate Voltage Drain Current
IGSS
ID=250µA, VGS=0V, TJ=150°C
V
700
ID=250µA, VGS=0V
V/ oC
0.65
VDS=600V, VGS=0V
1
VDS=480V, TJ=125°C
10
Gate-Body leakage current
VDS=0V, VGS=±30V
VGS(th)
Gate Threshold Voltage
VDS=5V ID=250µA
±100
3
µA
4
4.5
nΑ
V
3.5
Ω
1
V
RDS(ON)
Static Drain-Source On-Resistance
VGS=10V, ID=1.25A
2.9
gFS
Forward Transconductance
VDS=40V, ID=1.25A
2.8
VSD
Diode Forward Voltage
IS=1A,VGS=0V
0.64
S
IS
Maximum Body-Diode Continuous Current
2
A
ISM
Maximum Body-Diode Pulsed Current
8
A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
VGS=0V, VDS=25V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
SWITCHING PARAMETERS
Qg
Total Gate Charge
VGS=10V, VDS=480V, ID=2A
240
304
370
pF
25
31.4
38
pF
2.6
3.3
4
pF
2.3
2.9
6.0
Ω
9.9
12
nC
Qgs
Gate Source Charge
2.1
3
nC
Qgd
Gate Drain Charge
4.6
6
nC
tD(on)
Turn-On DelayTime
17
20
ns
tr
Turn-On Rise Time
17
20
ns
tD(off)
Turn-Off DelayTime
24
30
ns
tf
trr
Turn-Off Fall Time
16
20
ns
Body Diode Reverse Recovery Time
IF=2A,dI/dt=100A/µs,VDS=100V
175
210
Qrr
Body Diode Reverse Recovery Charge IF=2A,dI/dt=100A/µs,VDS=100V
1.4
1.7
ns
µC
VGS=10V, VDS=300V, ID=2A,
RG=25Ω
A. The value of R θJA is measured with the device in a still air environment with T A =25°C.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C, Ratings are based on low frequency and duty cycles to keep initial TJ
=25°C.
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of T J(MAX)=150°C. The SOA curve provides a single pulse rating.
G. L=60mH, IAS=2A, VDD=150V, RG=25Ω, Starting TJ=25°C
2/5
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AOT3N60
600V,2.5A N-Channel MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
5
10
10V
-55°C
VDS=40V
4
6.5V
6V
ID(A)
ID (A)
3
2
125°C
1
VGS=5.5V
25°C
1
0
0.1
0
5
10
15
20
25
30
2
4
VDS (Volts)
Fig 1: On-Region Characteristics
6
8
10
VGS(Volts)
Figure 2: Transfer Characteristics
2.5
6.0
Normalized On-Resistance
5.5
RDS(ON) (Ω )
5.0
VGS=10V
4.5
4.0
3.5
3.0
2.5
VGS=10V
ID=1.25A
2
1.5
1
0.5
2.0
0
1
2
3
4
5
0
6
-100
ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
-50
0
50
100
150
200
Temperature (°C)
Figure 4: On-Resistance vs. Junction Temperature
1.0E+01
1.2
40
125°C
1.0E-01
IS (A)
BVDSS (Normalized)
1.0E+00
1.1
1
1.0E-02
25°C
1.0E-03
0.9
1.0E-04
0.8
1.0E-05
-100
-50
0
50
100
150
200
TJ (°C)
Figure 5:Break Down vs. Junction Temparature
3/5
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VSD (Volts)
Figure 6: Body-Diode Characteristics (Note E)
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AOT3N60
600V,2.5A N-Channel MOSFET
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
15
1000
VDS=480V
ID=2A
Ciss
Capacitance (pF)
VGS (Volts)
12
9
6
100
Coss
10
Crss
3
0
1
0
2
4
6
8
10
12
Qg (nC)
Figure 7: Gate-Charge Characteristics
14
0.1
10
1
10
VDS (Volts)
Figure 8: Capacitance Characteristics
100
3.0
10µs
ID (Amps)
1
100µs
1ms
0.1
DC
TJ(Max)=150°C
TC=25°C
10ms
2.5
Current rating ID(A)
RDS(ON)
limited
2.0
1.5
1.0
0.5
0.01
1
10
100
1000
0.0
0
VDS (Volts)
25
50
75
100
125
150
TCASE (°C)
Figure 10: Current De-rating (Note B)
Figure 9: Maximum Forward Biased Safe
Operating Area for AOT3N60 (Note F)
Zθ JC Normalized Transient
Thermal Resistance
10
1
D=Ton/T
TJ,PK=TC+PDM.ZθJC.RθJC
RθJC=1.5°C/W
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
PD
0.1
Ton
Single Pulse
T
0.01
0.00001
0.0001
0.001
0.01
0.1
1
10
100
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance for AOT3N60 (Note F)
4/5
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AOT3N60
600V,2.5A N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
+
VDC
-
VDC
DUT
Qgs
Vds
Qgd
-
Vgs
Ig
Charge
Res istive Switching Test Circuit & Waveforms
RL
Vds
Vds
DUT
Vgs
+
VDC
90%
Vdd
-
Rg
10%
Vgs
Vgs
t d(on)
tr
t d(off)
t on
tf
t off
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
EAR= 1/2 LI
Vds
2
AR
BVDSS
Vds
Id
+
Vgs
Vgs
VDC
-
Rg
Vdd
I AR
Id
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Qrr = - Idt
Vds +
DUT
Vgs
Vds -
Isd
Vgs
Ig
5/5
L
Isd
+
VDC
-
IF
trr
dI/dt
IRM
Vdd
Vdd
Vds
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