RR-AME8805 _rev. B Reliability Report for AME8805 Series Product Approved by Prepared by Amy Shen Eric Chen Quality & Reliability Dept. Manager Quality & Reliability Dept. Engineer Conclusion: The AME8805 series product has successfully met AME’s reliability standard that is required on all AME, Inc products. Furthermore, QRA Dept. of AME, Inc monitors the reliability continuously to make sure that all AME8805 series product will still meet AME’s reliability standard in the future. Table of Contents: General Description Product Information Failures In Time Calculation Product Reliability Test Result Package Reliability Test Result IR-reflow Test Result General Description: The AME8805 family of positive, linear regulators feature low quiescent current (30mA typ.) with low dropout voltage, making them ideal for battery applications. The space-saving SOT-89 and SOT-223 packages are attractive for "Pocket" and "Hand Held" applications. These rugged devices have both Thermal Shutdown, and Current Fold-back to prevent device failure under the "Worst" of operating conditions. The AME8805 is stable with an output capacitance of 2.2 F or greater. Product Information: Product Grade or Opition Operating Package Type Number of Special Pins Feature F: SOT-89 S: 2 Z: Lead Free G: SOT-223 T: 3 Temperature Range A: 3.3V B: 3.0V C: 2.8V D: 2.5V E: 3.8V F: 3.6V G: 3.5V H: 2.7V I: 3.4V J: 2.85V K: 3.7V L: 1.5V M: 1.8V N: 2.9V O: 3.1V P: 4.1V Q: 4.75V R: 2.65V S: 5.0V T: 1.2V U: 3.2V V: 3.15V W: 2.3V Y: 1.9V Z: 1.7V 1: 1.3V 2: 2.0V 3: 4.2V 4: 4.0V E:-40 to 85 Failures In Time Calculation: Use HTOL test information mentioned in section FIT = ( x 2 (ν , CL ) , FIT (Failures In Time) can be calculated as below: × 10 9 ) /( 2 × S × H × AF ) = ( 4 .61 × 10 9 ) /( 2 × 77 × 1000 × 280 .59 ) 9 =106.69 (pieces per 10 hours) @ 40 with 90% Confidence Level. Where AF is acceleration factor setting activation energy to 1.0eV as zero failure. Product Reliability Test Result: Test Item HTOL Test Condition Precondition TSTRESS=125 NOTE 1 Sample Size / Failures Result 77 pcs / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass 3 pcs per pin pair / 0 pcs Pass Duration=1000hrs Biased, Read at 168/504/1000 hours ESD Human Body Model Pin-to-Pin test Level 2, 2kV minimum Latch-up Level 3, 100mA minimum NOTE 1: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 245 (leaded) or 260 (lead-free). Package Reliability Test Result: Test Item Test Condition Sample Size / Failures Result MSL 85/85 168 hours 22 pcs / 0 pcs Level 1 45 pcs / 0 pcs Pass 45 pcs / 0 pcs Pass 45 pcs / 0 pcs Pass 45 pcs / 0 pcs Pass 5 pcs / 0 pcs Pass IR-reflow 3 cycles Peak Temp.= 260 (lead-free) IPC/JEDEC J-STD-020C HTS Precondition Temp.=150 NOTE 2 Duration=1000 hours Unbiased, Read at 168/504/1000 hours THT Precondition NOTE 2 Temp.=85 , R.H.=85% Duration=1000 hours Unbiased, Read at 168/504/1000 hours PCT Precondition NOTE 2 Temp.=121 , R.H.=100% 15PSIG, Unbiased Duration=168 hours Read at 168 hours TCT Precondition -65 ~ 150 NOTE 2 1000 cycles Unbiased, Read at 500/1000 cycles Solderability Temp.=245 Temp.=260 (leaded) (lead-free) Duration=5sec NOTE 2: 85/85 168 hours + IR-reflow 3 cycles with Peak Temp.= 245 (leaded) or 260 (lead-free). IR-reflow Test Result: Test Item Test Condition Sample Size / Failures Result IR-reflow See IR reflow Profile 22 pcs / 0 pcs Pass Perform 3 cycles test IR reflow Profile: Profile Feature Average Ramp-Up Rate (Tsmax to Tp) Preheat - Temperature Min (Tsmin) - Temperature Max (Tsmax) - Time (tsmin to tsmax) Time maintained above - Temperature (TL) - Time (tL) Peak/Classification Temperature (Tp) Time within 5 of actual Peak Temperature (tp) Ramp-Down Rate Time 25 to Peak Temperature Sn-Pb Eutectic Assembly Pb-Free Assembly 3 /second max. 3 /second max. 100 150 60~120 seconds 150 200 60~180 seconds 183 60~150 seconds 245 217 60~150 seconds 260 10~30 seconds 20~40 seconds 6 /second max. 6 minutes max. 6 /second max. 8 minutes max.