Asynchronous Page Mode Read in M29W320DT/B 32Mb

TN-13-20: Asynchronous Page Mode Read in M29W320DT/B
Automotive Devices
Introduction
Technical Note
Asynchronous Page Mode Read in M29W320DT/B 32Mb, 3V Supply NOR
Flash Memory (Automotive Grade) Devices
Introduction
This technical note describes the asynchronous page mode read feature available in the
following 32Mb, 3V supply NOR flash memory (automotive grade) devices:
•
•
•
•
•
•
M29W320DB70N3E/F
M29W320DB70ZA3F
M29W320DB7AN6E/F
M29W320DB7AZA6E/F
M29W320DB80ZA3E/F
M29W320DT70N3E
See the M29W320DT/B data sheet for additional information on these devices.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
Products and specifications discussed herein are for evaluation and reference purposes only and are subject to change by
Micron without notice. Products are only warranted by Micron to meet Micron's production data sheet specifications. All
information discussed herein is provided on an "as is" basis, without warranties of any kind.
TN-13-20: Asynchronous Page Mode Read in M29W320DT/B
Automotive Devices
General Description
General Description
The M29W320D is a 32Mb (4Mb x 8 or 2Mb x 16) non-volatile memory device that can
be read, erased and reprogrammed. These operations can be performed using a single
low voltage (2.7 to 3.6 V) supply.
The devices specified in this technical note support asynchronous page mode read and
page read from all blocks of the array. See the M29W320DT/B data sheet for more information on array organization.
The asynchronous page mode read feature consists of:
• Page size: 4 words or 8 bytes
• Page access: 25ns
Figure 1: Logic Diagram
VCC
VPP /WP#
15
A[20:0]
DQ[14:0]
DQ15/A-1
WE#
CE#
OE#
RY/BY#
RST#
BYTE#
VSS
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
TN-13-20: Asynchronous Page Mode Read in M29W320DT/B
Automotive Devices
General Description
Table 1: Signal Names
A[20:0]
Address Inputs
DQ0-DQ7
Data Input/Output
DQ8-DQ14
Data Input/Output
DQ15A–1
Data Input/Output or Address Input
CE#
Chip Enable
OE#
Output Enable
WE#
Write Enable
RST#
Reset/Block temporary unprotect
RY/BY#
Ready/Busy output
BYTE#
Byte/word organization select
VCC
Core Power Supply
VPP/WP#
VPP/Write Protect
VSS
Ground
NC
Not Connected Internally
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
TN-13-20: Asynchronous Page Mode Read in M29W320DT/B
Automotive Devices
PAGE READ
PAGE READ
BUS READ operations read from the memory cells, or specific registers, in the command interface. To accelerate the READ operation, the memory array can be read in
page mode, where data is internally read and stored in a page buffer.
Page size is 4 words (8 bytes) and is addressed by address inputs A[1:0] in x16 bus mode
and A[1:0] plus DQ15/A-1 in x8 bus mode.
A valid BUS READ operation involves setting the desired address on the address inputs,
applying a LOW signal (VIL) to Chip Enable (CE#) and Output Enable (OE#), and keeping Write Enable (WE#) HIGH (V IH). The data input/outputs will output the value. See
the following figure and table for details of when the output becomes valid.
Figure 2: Page Read AC Waveforms
A[MAX:2]
Valid
A[1:0]
Valid
Valid
Valid
Valid
tAVQV
CE#
tEHQX
tELQV
tEHQZ
OE#
tGHQX
tGLQV
DQ[15:0]
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tAVQV1
Valid
tGHQZ
Valid
4
Valid
Valid
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
TN-13-20: Asynchronous Page Mode Read in M29W320DT/B
Automotive Devices
PAGE READ
Table 2: Page Read AC Characteristics
M29W320D
Parameter
Symbol
Alt
Address valid to output valid
tAVQV
tACC
70/7A
80
CE# = VIL, OE# = VIL
Address valid to output valid
(page)
tAVQV1
tPAGE
CE# = VIL, OE# = VIL
MAX
70
80
ns
MAX
25
25
ns
CE# LOW to output transition
tELQX1
tLZ
OE# = VIL
MIN
0
0
ns
CE# LOW to output valid
tELQV
tCE
OE# = VIL
MAX
70
80
ns
tGLQX1
tOLZ
CE# = VIL
MIN
0
0
ns
OE# LOW to output valid
tGLQV
tOE
CE# = VIL
MAX
30
30
ns
CE# HIGH to output High-Z
tEHQZ1
tHZ
OE# = VIL
MAX
25
25
ns
OE# HIGH to output High-Z
tGHQZ1
tDF
OE# = VIL
MAX
25
25
ns
OE# LOW to output transition
Note:
Test Condition
Unit
1. Sampled only; not 100% tested.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
TN-13-20: Asynchronous Page Mode Read in M29W320DT/B
Automotive Devices
Revision History
Revision History
Rev. A – 9/12
• Initial release
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
www.micron.com/productsupport Customer Comment Line: 800-932-4992
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All other trademarks are the property of their respective owners.
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.