UT54ACS14E/UT54ACTS14E Hex Inverting Schmitt Triggers July, 2013 www.aeroflex.com/Logic Datasheet FEATURES DESCRIPTION m CRH CMOS Process The UT54ACS14E and the UT54ACTS14E are hex inverters with schmitt trigger inputs. The circuits perform the Boolean function Y = A. - Latchup immune High speed Low power consumption Wide power supply operating range of 3.0V to 5.5V Available QML Q or V processes 14-lead flatpack UT54ACS14E - SMD 5962-96524 UT54ACTS14E - SMD 5962-96525 The devices are characterized over full HiRel temperature range of -55C to +125C. PINOUTS 14-Lead Flatpack Top View FUNCTION TABLE INPUT OUTPUT A Y H L L H A1 1 14 Y1 VDD 2 13 A6 A2 3 12 Y6 Y2 4 11 A3 5 10 A5 Y5 Y3 6 9 A4 VSS 7 8 Y4 LOGIC DIAGRAM LOGIC SYMBOL A1 A2 A3 A4 A5 A6 (1) (3) 1 (2) (4) (5) (6) (9) (8) (11) (10) (13) (12) A1 Y1 A2 Y2 A3 Y3 A4 Y4 A5 Y5 A6 Y6 Y1 Y2 Y3 Y4 Y5 Y6 Note: 1. Logic symbol in accordance with ANSI/IEEE standard 91-1984 and IEC Publication 617-12. 1 OPERATIONAL ENVIRONMENT 1 PARAMETER LIMIT UNITS Total Dose 1.0E6 rads(Si) SEU Threshold 2 80 MeV-cm2/mg SEL Threshold 108 MeV-cm2/mg Neutron Fluence 1.0E14 n/cm2 Notes: 1. Logic will not latchup during radiation exposure within the limits defined in the table. 2. Device storage elements are immune to SEU affects. ABSOLUTE MAXIMUM RATINGS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage -0.3 to 7.0 V VI/O Voltage any pin -0.3 to VDD + 0.3 V TSTG Storage Temperature range -65 to +150 C TJ Maximum junction temperature +175 C TLS Lead temperature (soldering 5 seconds) +300 C JC Thermal resistance junction to case 15 C/W II DC input current 10 mA PD Maximum package power dissipation 3.3 W o permitted @ Tc = +125 C Note: 1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 2. Per MIL-STD-883, method 1012.1, Section 3.4.1, PD = (Tj(max) - Tc(max) ) / jc RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage 3.0 to 5.5 V VIN Input voltage any pin 0 to VDD V TC Temperature range -55 to +125 C 2 DC ELECTRICAL CHARACTERISTICS FOR THE UT54ACS14E7 ( VDD = 3.0V to 5.5V; VSS = 0V6; -55C < TC < +125C) SYMBOL DESCRIPTION CONDITION MIN MAX UNIT 0.7VDD V VT+ Schmitt trigger positive-going threshold 1 VDD from 3.0V to 5.5V VT- Schmitt trigger negative-going threshold 1 VDD from 3.0V to 5.5V 0.3VDD VH1 Range of hysteresis (VT+ - VT-) VDD from 4.5V to 5.5V 0.6 1.5 V VH2 Range of hysteresis (VT+ - VT-) VDD from 3.0V to 3.6V 0.3 1.2 V IIN Input leakage current VIN = VDD or VSS -1 1 A Low-level output voltage 3 IOL = 100A 0.25 V VOL V VDD from 3.0V to 5.5V VOH High-level output voltage 3 IOH = -100A VDD - 0.25 V VDD from 3.0V to 5.5V IOS1 Short-circuit output current 2 ,4 VO = VDD and VSS -200 200 mA -100 100 mA VDD from 4.5V to 5.5V IOS2 Short-circuit output current 2 ,4 VO = VDD and VSS VDD from 3.0V to 3.6V IOL1 Low level output current9 VIN = VDD or VSS (sink) VOL = 0.4V 8 mA 6 mA -8 mA -6 mA VDD from 4.5V to 5.5V IOL2 Low level output current 9 VIN = VDD or VSS (sink) VOL = 0.4V VDD from 3.0V to 3.6V IOH1 High level output current9 VIN = VDD or VSS (source) VOH = VDD - 0.4V VDD from 4.5V to 5.5V IOH2 High level output current9 VIN = VDD or VSS (source) VOH = VDD - 0.4V VDD from 3.0V to 3.6V 3 Ptotal1 Power dissipation 2, 8 CL = 50pF 1.9 mW/ MHz 0.76 mW/ MHz 10 A VDD from 4.5V to 5.5V Ptotal2 Power dissipation 2, 8 CL = 50pF VDD from 3.0V to 3.6V IDDQ Quiescent Supply Current VIN = VDD or VSS VDD from 3.0V to 5.5V CIN COUT Input capacitance 5 = 1MHz, VDD = 0 15 pF Output capacitance 5 = 1MHz, VDD = 0 15 pF Notes: 1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to VIH(min) and VIL(max). 2. Supplied as a design limit but not guaranteed or tested. 3. Per MIL-PRF-38535, for current density 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765pF/ MHz. 4. Not more than one output may be shorted at a time for maximum duration of one second. 5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at frequency of 1MHz and a signal amplitude of 50mV rms maximum. 6. Maximum allowable relative shift equals 50mV. 7. All specifications valid for radiation dose 1E6 rads(Si) per MIL-STD-883 Method 1019. 8. Power dissipation specified per switching output. 9. Guaranteed by characterization, but not tested. 4 AC ELECTRICAL CHARACTERISTICS FOR THE UT54ACS14E2 (VDD = 3.0V to 5.5V; VSS = 0V 1, -55C < TC < +125C) SYMBOL tPHL tPLH PARAMETER Input to Yn Input to Yn Condition VDD CL = 50pF 3.0V to 3.6V CL = 50pF Notes: 1. Maximum allowable relative shift equals 50mV. 2. All specifications valid for radiation dose 1E6 rads(Si) per MIL-STD-883 Method 1019. 5 MINIMUM MAXIMUM UNIT 2 18 ns 4.5V to 5.5V 2 18 ns 3.0V to 3.6V 2 17 ns 4.5V to 5.5V 2 13 ns DC ELECTRICAL CHARACTERISTICS FOR THE UT54ACTS14E7 ( VDD = 3.0V to 5.5V; VSS = 0V6; -55C < TC < +125C) SYMBOL DESCRIPTION CONDITION MIN MAX UNIT VT+1 Schmitt trigger positive-going threshold 1 VDD from 4.5V to 5.5V 2.25 V VT+2 Schmitt trigger positive-going threshold 1 VDD from 3.0V to 3.6V 2.0 V VT-1 Schmitt trigger negative-going threshold 1 VDD from 4.5V to 5.5V 0.5 V VT-2 Schmitt trigger negative-going threshold 1 VDD from 3.0V to 3.6V 0.5 V VH1 Range of hysteresis (VT+1 - VT-1) VDD from 4.5V to 5.0V 0.4 1.5 V VH2 Range of hysteresis (VT+2 - VT-2) VDD from 3.0V to 3.6V 0.2 1.2 V IIN Input leakage current VIN = VDD or VSS -1 1 A Low-level output voltage 3 IOL = 8mA 0.4 V 0.4 V VOL1 VDD from 4.5V to 5.5V VOL2 Low-level output voltage 3 IOL = 6mA VDD from 3.0V to 3.6V VOH1 High-level output voltage 3 IOH = -8mA 0.7VDD V 2.4 V VDD from 4.5V to 5.5V VOH2 High-level output voltage 3 IOH = -6mA VDD from 3.0V to 3.6V IOS1 Short-circuit output current 2 ,4 VO = VDD or VSS -200 200 mA -100 100 mA VDD from 4.5V to 5.5V IOS1 Short-circuit output current 2 ,4 VO = VDD or VSS VDD from 3.0V to 3.6V IOL1 Low level output current9 VIN = VDD or VSS 8 mA 6 mA VOL = 0.4V VDD from 4.5V to 5.5V IOL2 Low level output current9 VIN = VDD or VSS VOL = 0.4V VDD from 3.0V to 3.6V 6 IOH1 High level output current9 VIN = VDD or VSS -8 mA -6 mA VOH = VDD-0.4V, VDD from 4.5V to 5.5V IOH2 High level output current9 VIN = VDD or VSS VOH = VDD - 0.4V VDD from 3.0V to 3.6V Ptotal1 Power dissipation 2, 8 CL = 50pF 1.3 mW/ MHz 0.5 mW/ MHz 10 A 3.1 mA VDD from 4.5V to 5.5V Ptotal2 Power dissipation 2, 8 CL = 50pF VDD from 3.0V to 3.6V IDDQ Quiescent Supply Current VIN = VDD or VSS VDD from 3.0V to 5.5V IDDQ Quiescent Supply Current Delta For input under test VIN = VDD -2.1V For all other inputs VIN = VDD or VSS VDD = 5.5V CIN COUT Input capacitance 5 = 1MHz, VDD = 0 15 pF Output capacitance 5 = 1MHz, VDD = 0 15 pF Notes: 1. Functional tests are conducted in accordance with MIL-STD-883 with the following input test conditions: VIH = VIH(min) + 20%, - 0%; VIL = VIL(max) + 0%, 50%, as specified herein, for TTL, CMOS, or Schmitt compatible inputs. Devices may be tested using any input voltage within the above specified range, but are guaranteed to VIH(min) and VIL(max). 2. Supplied as a design limit but not guaranteed or tested. 3. Per MIL-PRF-38535, for current density 5.0E5 amps/cm2, the maximum product of load capacitance (per output buffer) times frequency should not exceed 3,765pF/ MHz. 4. Not more than one output may be shorted at a time for maximum duration of one second. 5. Capacitance measured for initial qualification and when design changes may affect the value. Capacitance is measured between the designated terminal and VSS at frequency of 1MHz and a signal amplitude of 50mV rms maximum. 6. Maximum allowable relative shift equals 50mV. 7. All specifications valid for radiation dose 1E6 rads(Si) per MIL-STD-883 Method 1019. 8. Power dissipation specified per switching output. 9. Guaranteed by characterization, but not tested. 7 AC ELECTRICAL CHARACTERISTICS FOR THE UT54ACTS14E2 (VDD = 3.0V to 5.5V; VSS = 0V 1, -55C < TC < +125C) SYMBOL tPHL tPLH PARAMETER Input to Yn Input to Yn Condition VDD CL = 50pF 3.0V to 3.6V CL = 50pF MAXIMUM UNIT 2 20 ns 4.5V to 5.5V 2 9 3.0V to 3.6V 3 20 4.5V to 5.5V 2 12 Notes: 1. Maximum allowable relative shift equals 50mV. 2. All specifications valid for radiation dose 1E6 rads(Si) per MIL-STD-883 Method 1019. 8 MINIMUM ns 1. All exposed metallized areas are gold plated over electroplated nickel per MIL-PRF-38535. 2. The lid is electrically connected to VSS. 3. Lead finishes are in accordance with MIL-PRF38535. 4. Dimension symbol is in accordance with MILPRF-38533. 5. Lead position and colanarity are not measured. Figure 1. 14-Lead Flatpack 9 UT54ACS14E/UT54ACTS14E: SMD 5962 * ***** ** * * * Lead Finish: (Notes 1 & 2) A = Solder C = Gold X = Optional Package Type: X = 14-lead ceramic bottom-brazed dual-in-line Flatpack Class Designator: Q = QML Class Q V = QML Class V Device Type: 02 = 1 rad(Si)/sec 03 = 50 to 300 rads(Si)/sec Drawing Number: 96524 = UT54ACS14E 96525 = UT54ACTS14E Total Dose: (Note 3 & 4) R = 1E5 rads(Si) F = 3E5 rads(Si) G = 5E5 rads(Si) H = 1E6 rads(Si) Notes: 1. Lead finish (A,C, or X) must be specified. 2. If an “X” is specified when ordering, part marking will match the lead finish and will be either “A” (solder) or “C” (gold). 3. Total dose radiation must be specified when ordering. QML-2 and V is not available without radiation testing. For prototyping inquiries, contact factory. 4. Device type 02 is only offered with a TID tolerance guarantee of 3E5 rads(Si) or 1E6 rads(Si) and is tested in accordance with MIL-STD-883 Test Method 1019 Condition A and section 3.11.2. Device type 03 is only offered with a TID tolerance guarantee of 1E5 rads(Si), 3E5 rads(Si), and 5E5 rads(Si), and is tested in accordance with MIL-STD-883 Test Method 1019 Condition A. Aeroflex Colorado Springs - Datasheet Definition Advanced Datasheet - Product In Development Preliminary Datasheet - Shipping Prototype Datasheet - Shipping QML & Reduced HiRel COLORADO Toll Free: 800-645-8862 Fax: 719-594-8468 INTERNATIONAL Tel: 805-778-9229 Fax: 805-778-1980 NORTHEAST Tel: 603-888-3975 Fax: 603-888-4585 SE AND MID-ATLANTIC Tel: 321-951-4164 Fax: 321-951-4254 WEST COAST Tel: 949-362-2260 Fax: 949-362-2266 CENTRAL Tel: 719-594-8017 Fax: 719-594-8468 www.aeroflex.com [email protected] Aeroflex Colorado Springs (Aeroflex) reserves the right to make changes to any products and services herein at any time without notice. Consult Aeroflex or an authorized sales representative to verify that the information in this data sheet is current before using this product. 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