Silicon Technology Reliability Vishay Siliconix ACCELERATED OPERATING LIFE TEST RESULT Sample Size 2,199 Equivalent Device Hours 166,604,213 Number of Total Failures 0 Failure Rate in FIT 5.462 Failure Rate in FIT is calculated according to JEDEC Standard JESD85, Methods for Calculating Failure Rates in Units of FITs, based on accelerated high temperature operating life test results by using an apparent activation energy of 0.7 eV. The junction temperature of the device at use is assumed to be 55_C. A constant failure rate distribution is assumed. The upper confidence bound of the failure rate is 60%. Document Number: 72538 28-Jan-05 www.vishay.com 1