### AVAGO HEDL-9X00

```HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series
Motion Sensing Products, Optical Encoder Modules
Reliability Data Sheet
Description
Failure Rate Prediction
The following cumulative test results have been obtained
from testing performed at Avago Technologies Malaysia
in accordance with the latest revisions of JEDEC standards
The failure rate of semiconductor devices is determined
by the junction temperature of the device. The relationship between ambient temperature and actual junction
temperature is given by the following:
Avago tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain from Avago parts depends on the
electrical and environmental characteristics of your application but will probably be better than the performance
outlined in Table 1.
TJ(°C) = TA(°C) + θJAPAVG
where TA = ambient temperature in °C
θJA = thermal resistance of junction-to-ambient in °C/Watt
PAVG = average power dissipated in Watt
The estimated MTTF and failure rate at temperatures
lower than the actual stress temperature can be determined by using an Arrhenius model for temperature
acceleration. Results of such calculations are shown in
the table below using an activation energy of 0.43eV
(reference MIL-HDBK-217).
Table 1. Life Tests
Demonstrated Performance
Point Typical Performance
Test Name
Stress Test Conditions
Total Device
Hours
Units
Tested
Total
Failed [3]
MTTF
Failure Rate
(% /1 K Hours)
High Temperature Operating Life
Vcc=5.0V, TA=100°C
30,000
30
0
32,700
3.06
Table 2.
Point Typical Performance in Time [1]
Performance in Time [2] (90% Confidence)
Ambient
Temperature (°C)
Junction
Temperature (°C)
MTTF(1)
Failure Rate
(% / 1K Hours)
MTTF(2)
Failure Rate
(% /1K Hours)
100
110
32,700
3.06
13,020
7.68
90
100
46,300
2.15
18,460
5.42
80
90
67,000
1.49
26,680
3.75
70
80
98,900
1.01
39,390
2.54
60
70
149,400
0.66
59,470
1.68
50
60
231,100
0.43
92,060
1.08
40
50
367,800
0.27
146,400
0.68
Notes:
1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero
failures, one failure is assumed for this calculation.
2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence
interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is
commonly used in describing useful life failures.
3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures are
failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is:
(8 hours/day) x (5 days/week) / (168 hours/week) = 0.25
The point failure rate per year (8760 hours) at 50°C ambient temperature is:
(0.43% / 1K hours) x 0.25 X (8760 hours/year) = 0.94% per year
Similarly, 90% confidence level failure rate per year at 50°C:
(1.08% / 1K hours) X 0.25 X (8760 hours/year) = 2.36% per year
Table 3. Environmental Tests
Test Name
Test Conditions
Units Tested
Unit Failed
Storage Temperature Cycle
-40°C to 100°C, 15min dwell time. 5 min transfer. 1000 cycles
90
0
Wet High Temperature Storage life
TA=85°C, RH=85%, 1000 hours
90
0
Low Temperature Storage Life
TA=-40°C, 1000 hours
90
0
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www.avagotech.com
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