Si4447DY Datasheet

Si4447DY
Vishay Siliconix
P-Channel 40-V (D-S) MOSFET
FEATURES
PRODUCT SUMMARY
VDS (V)
RDS(on) (Ω)
- 40
ID (A)
0.054 at VGS = - 10 V
- 4.5
0.072 at VGS = - 4.5 V
- 3.9
Qg (Typ.)
9
• Halogen-free According to IEC 61249-2-21
Definition
• TrenchFET® Power MOSFET
• 100 % Rg Tested
• 100 % UIS Tested
APPLICATIONS
• CCFL Inverter
SO-8
S
S
1
8
D
S
2
7
D
S
3
6
D
G
4
5
D
G
Top View
D
Ordering Information: Si4447DY-T1-E3 (Lead (Pb)-free)
Si4447DY-T1-GE3 (Lead (Pb)-free and Halogen-free)
P-Channel MOSFET
ABSOLUTE MAXIMUM RATINGS TA = 25 °C, unless otherwise noted
Parameter
Symbol
10 s
Steady State
Drain-Source Voltage
VDS
- 40
Gate-Source Voltage
VGS
± 16
Continuous Drain Current (TJ = 150 °C)a
TA = 25 °C
TA = 70 °C
Pulsed Drain Current
Single Pulse Avalanche Energy
Maximum Power Dissipationa
IS
L = 0.1 mH
TA = 25 °C
TA = 70 °C
- 3.3
- 3.6
- 2.7
A
- 0.9
16
EAS
TJ, Tstg
Operating Junction and Storage Temperature Range
- 30
- 1.7
IAS
PD
V
- 4.5
IDM
Continuous Source Current (Diode Conduction)a
Avalanche Current
ID
Unit
13
mJ
2
1.1
1.3
0.7
- 55 to 150
W
°C
THERMAL RESISTANCE RATINGS
Parameter
Maximum
Junction-to-Ambienta
Maximum Junction-to-Foot (Drain)
Symbol
t ≤ 10 s
Steady State
Steady State
RthJA
RthJF
Typical
50
85
30
Maximum
62.5
110
40
Unit
°C/W
Notes:
a. Surface mounted on 1" x 1" FR4 board.
Document Number: 73662
S09-0322-Rev. B, 02-Mar-09
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Si4447DY
Vishay Siliconix
SPECIFICATIONS TJ = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
VGS(th)
VDS = VGS, ID = - 250 µA
- 0.8
Typ.
Max.
Unit
- 2.2
V
Static
Gate-Source Threshold Voltage
VDS Temperature Coefficient
ΔVDS/TJ
VGS(th) Temperature Coefficient
ΔVGS(th)/TJ
ID = - 250 µA
IGSS
VDS = 0 V, VGS = ± 16 V
± 100
VDS = - 40 V, VGS = 0 V
-1
VDS = - 40 V, VGS = 0 V, TJ = 55 °C
- 10
Gate-Source Leakage
Zero Gate Voltage Drain Current
IDSS
On-State Drain Currenta
ID(on)
Drain-Source On-State Resistancea
Forward Transconductancea
VGS = - 15 V, ID = - 4.5 A
13
Crss
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
trr
14
2
nC
3.6
f = 1 MHz
VDD = - 15 V, RL = 15 Ω
ID ≅ - 1 A, VGEN = - 10 V, Rg = 6 Ω
tf
Qrr
pF
9
tr
Body Diode Reverse Recovery Charge
V
120
VDS = - 20 V, VGS = - 4.5 V, ID = - 4.5 A
td(off)
Source-Drain Reverse Recovery Time
S
- 1.2
85
Rg
Fall Time
Ω
805
VDS = - 20 V, VGS = 0 V, f = 1 MHz
td(on)
Rise Time
0.072
- 0.79
Reverse Transfer Capacitance
Turn-Off DelayTime
0.059
IS = - 1.7 A, VGS = 0 V
Ciss
Gate Resistance
0.054
VDS = - 15 V, ID = - 4.5 A
Coss
µA
A
0.045
gfs
Output Capacitance
nA
- 20
VSD
Dynamicb
Input Capacitance
Turn-On Delay Time
mV/°C
3.4
VDS ≤ - 5 V, VGS = - 10 V
VGS = - 10 V, ID = - 4.5 A
RDS(on)
Diode Forward Voltagea
- 40
IF = 1.7 A, dI/dt = 100 A/µs
11.5
18
8
13
12
18
74
110
38
60
27
45
17
26
Ω
ns
nC
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
20
20
TC = - 55 °C
VGS = 10 V thru 4 V
25 °C
16
I D - Drain Current (A)
ID - Drain Current (A)
16
12
3V
8
4
125 °C
12
8
4
0
0
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2
1
2
3
4
5
0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
VDS - Drain-to-Source Voltage (V)
VGS - Gate-to-Source Voltage (V)
Output Characteristics
Transfer Characteristics
3.5
4.0
Document Number: 73662
S09-0322-Rev. B, 02-Mar-09
Si4447DY
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
1240
0.10
992
0.08
C - Capacitance (pF)
RDS(on) - On-Resistance (Ω)
1116
VGS = 4.5 V
0.06
VGS = 10 V
0.04
Ciss
868
744
620
496
372
248
0.02
Coss
124
Crss
0
0.00
0
4
8
12
16
0
20
5
15
20
25
30
ID - Drain Current (A)
VDS - Drain-to-Source Voltage (V)
On-Resistance vs. Drain Current
Capacitance
35
40
125
150
1.8
6
VGS = 10 V
ID = 4.5 A
ID = 4.5 A
1.6
5
RDS(on) - On-Resistance
(Normalized)
VGS - Gate-to-Source Voltage (V)
10
4
VDS = 10 V
3
VDS = 20 V
2
1.4
1.2
1.0
0.8
1
0.6
- 50
0
0
2
4
6
8
10
12
- 25
0
25
50
75
100
Qg - Total Gate Charge (nC)
TJ - Junction Temperature (°C)
Gate Charge
On-Resistance vs. Junction Temperature
0.30
20
ID = 4.5 A
10
RDS(on) - On-Resistance (Ω)
0.25
I S - Source Current (A)
TJ = 150 °C
TJ = 25 °C
0.20
0.15
TA = 125 °C
0.10
0.05
TA = 25 °C
1
0.0
0.00
0.2
0.4
0.6
0.8
1.0
1.2
1.4
0
2
4
6
8
VSD - Source-to-Drain Voltage (V)
VGS - Gate-to-Source Voltage (V)
Source-Drain Diode Forward Voltage
On-Resistance vs. Gate-to-Source Voltage
Document Number: 73662
S09-0322-Rev. B, 02-Mar-09
10
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Si4447DY
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
0.6
50
40
ID = 250 µA
Power (W)
V GS(th) Variance (V)
0.4
0.2
0.0
30
20
10
- 0.2
- 0.4
- 50
- 25
0
25
50
75
100
125
0
0.001
150
0.01
0.1
1
10
100
600
Time (s)
TJ - Temperature (°C)
Threshold Voltage
Single Pulse Power, Junction-to-Ambient
100
IDM Limited
Limited by RDS(on)*
ID - Drain Current (A)
10
1 ms
1
10 ms
ID(on)
Limited
100 ms
TA = 25 °C
Single Pulse
0.1
1s
10 s
DC
BVDSS Limited
0.01
0.1
1
10
100
VDS - Drain-to-Source Voltage (V)
* VGS > minimum VGS at which RDS(on) is specified
Safe Operating Area
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
Notes:
0.1
PDM
0.1
0.05
t1
t2
1. Duty Cycle, D =
0.02
t1
t2
2. Per Unit Base = RthJA = 65 °C/W
3. TJM - TA = PDMZthJA(t)
Single Pulse
4. Surface Mounted
0.01
10-4
10-3
10-2
10-1
1
10
100
600
Square Wave Pulse Duration (s)
Normalized Thermal Transient Impedance, Junction-to-Ambient
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Document Number: 73662
S09-0322-Rev. B, 02-Mar-09
Si4447DY
Vishay Siliconix
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
2
Normalized Effective Transient
Thermal Impedance
1
Duty Cycle = 0.5
0.2
0.1
0.1
0.05
0.02
Single Pulse
0.01
10-4
10-3
10-2
10-1
Square Wave Pulse Duration (s)
1
10
Normalized Thermal Transient Impedance, Junction-to-Foot
Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon
Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and
reliability data, see www.vishay.com/ppg?73662.
Document Number: 73662
S09-0322-Rev. B, 02-Mar-09
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Document Number: 91000
Revision: 18-Jul-08
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