5962-98541

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Changes in accordance with NOR 5962-R056-99. – LTG
99-04-21
Monica L. Poelking
B
Correct case outline descriptive designator. Editorial changes throughout. –
JAK
99-09-29
Monica L. Poelking
C
Update boilerplate to MIL-PRF-38535 requirements. Editorial changes
throughout. – LTG
05-10-04
Thomas M. Hess
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REV STATUS
REV
C
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OF SHEETS
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PMIC N/A
PREPARED BY
Charles F. Saffle, Jr.
STANDARD
MICROCIRCUIT
DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
http://www.dscc.dla.mil
CHECKED BY
Charles F. Saffle, Jr.
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
Monica L. Poelking
DRAWING APPROVAL DATE
MICROCIRCUIT, DIGITAL, RADIATION
HARDENED, ADVANCED CMOS, NONINVERTING
OCTAL BUFFER/LINE DRIVER WITH THREESTATE OUTPUTS, MONOLITHIC SILICON
98-01-25
REVISION LEVEL
AMSC N/A
C
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
1 OF
5962-98541
23
5962-E516-05
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)
and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
F
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
98541
01
V
X
C
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A
specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
Circuit function
ACS244
Radiation hardened, SOS, advanced CMOS,
noninverting octal buffer/line driver with
three-state outputs
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
Device requirements documentation
M
Vendor self-certification to the requirements for MIL-STD-883 compliant, nonJAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A
Q or V
Certification and qualification to MIL-PRF-38535
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
R
X
Descriptive designator
Terminals
Package style
CDIP2-T20
CDFP4-F20
20
20
Dual-in-line
Flat pack
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,
appendix A for device class M.
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REVISION LEVEL
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SHEET
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1.3 Absolute maximum ratings. 1/ 2/ 3/
Supply voltage range (VCC) .................................................................................. -0.5 V dc to +7.0 V dc
DC input voltage range (VIN) ................................................................................ -0.5 V dc to VCC + 0.5 V dc
DC output voltage range (VOUT) ........................................................................... -0.5 V dc to VCC + 0.5 V dc
DC input current, any one input (IIN)..................................................................... ±10 mA
DC output current, any one output (IOUT).............................................................. ±50 mA
Storage temperature range (TSTG) ....................................................................... -65°C to +150°C
Lead temperature (soldering, 10 seconds)........................................................... +265°C
Thermal resistance, junction-to-case (θJC):
Case outline R ................................................................................................... 24°C/W
Case outline X.................................................................................................... 28°C/W
Thermal resistance, junction-to-ambient (θJA):
Case outline R ................................................................................................... 72°C/W
Case outline X.................................................................................................... 107°C/W
Junction temperature (TJ) .................................................................................... +175°C
Maximum package power dissipation at TA = +125°C (PD): 4/
Case outline R ................................................................................................... 0.69 W
Case outline X.................................................................................................... 0.47 W
1.4 Recommended operating conditions. 2/ 3/
Supply voltage range (VCC) .................................................................................. +4.5 V dc to +5.5 V dc
Input voltage range (VIN) ...................................................................................... +0.0 V dc to VCC
Output voltage range (VOUT)................................................................................. +0.0 V dc to VCC
Maximum low level input voltage (VIL).................................................................. 30% of VCC
Minimum high level input voltage (VIH) ................................................................. 70% of VCC
Case operating temperature range (TC) ............................................................... -55°C to +125°C
Maximum input rise or fall time at VCC = 4.5 V (tr, tf) ............................................ 10 ns/V
1.5 Radiation features:
Maximum total dose available (dose rate = 50 – 300 rads(Si)/s) ......................... > 3 x 105 Rads (Si)
Single event phenomenon (SEP) effective
2
linear energy threshold (LET), no upsets (see 4.4.4.4)................................... > 100 MeV/(cm /mg) 5/
11
Dose rate upset (20 ns pulse) ............................................................................. > 1 x 10 Rads (Si)/s 5/
Latch-up .............................................................................................................. None 5/
12
Dose rate survivability ......................................................................................... > 1 x 10 Rads (Si)/s 5/
1/
2/
3/
4/
5/
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
Unless otherwise noted, all voltages are referenced to GND.
The limits for the parameters specified herein shall apply over the full specified VCC range and case temperature range of
-55°C to +125°C unless otherwise noted.
If device power exceeds package dissipation capability, provide heat sinking or derate linearly (the derating is based on θJA)
at the following rate:
Case outline R ....................................................................................................... 13.9 mW/°C
Case outline X ....................................................................................................... 9.3 mW/°C
Guaranteed by design or process but not tested.
STANDARD
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A
REVISION LEVEL
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SHEET
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2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for
device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified
herein.
3.1.1 Microcircuit die. For the requirements for microcircuit die, see appendix A to this document.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Truth table. The truth table shall be as specified on figure 2.
3.2.4 Logic diagram. The logic diagram shall be as specified on figure 3.
3.2.5 Switching waveforms and test circuit. The switching waveforms and test circuit shall be as specified on figure 4.
3.2.6 Irradiation test connections. The irradiation test connections shall be as specified in table III.
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3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
case operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical
tests for each subgroup are defined in table I.
3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be
in accordance with MIL-PRF-38535, appendix A.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103
(see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product
(see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing.
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
microcircuit group number 37 (see MIL-PRF-38535, appendix A).
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REVISION LEVEL
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TABLE I. Electrical performance characteristics.
Test
Symbol
Device
type
Test conditions 1/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VCC
Group A
subgroups
Limits 2/
Min
High level output
voltage
Low level output
voltage
Input current, high
VOH
VOL
IIH
For all inputs affecting
output under test
VIN = 4.5 V or 0.0 V
For all other inputs
VIN = VCC or GND
M, D, P, L, R, F
IOH = -50 µA
3/
All
For all inputs affecting
output under test
VIN = 5.5 V or 0.0 V
For all other inputs
VIN = VCC or GND
M, D, P, L, R, F
IOH = -50 µA
3/
All
For all inputs affecting
output under test
VIN = 4.5 V or 0.0 V
For all other inputs
VIN = VCC or GND
M, D, P, L, R, F
IOL = 50 µA
3/
All
For all inputs affecting
output under test
VIN = 5.5 V or 0.0 V
For all other inputs
VIN = VCC or GND
M, D, P, L, R, F
IOL = 50 µA
3/
All
For input under test, VIN = 5.5 V
For all other inputs
VIN = VCC or GND
All
M, D, P, L, R, F
3/
Input current, low
IIL
For input under test, VIN = GND
For all other inputs
VIN = VCC or GND
5.5 V
4.40
1
4.40
1, 2, 3
5.40
1
5.40
All
4.5 V
V
1, 2, 3
0.1
1
0.1
1, 2, 3
0.1
1
0.1
1
+0.5
2, 3
+1.0
1
+1.0
1
-0.5
2, 3
-1.0
1
-1.0
All
5.5 V
Max
1, 2, 3
All
All
5.5 V
All
All
M, D, P, L, R, F
3/
4.5 V
Unit
5.5 V
All
V
µA
µA
See footnotes at end of table.
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TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Device
type
Test conditions 1/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VCC
Group A
subgroups
Limits 2/
Min
Output current, high
(Source)
Output current, low
(Sink)
Three-state output
leakage current,
high
IOH
4/
IOL
4/
IOZH
For all inputs affecting output
under test, VIN = 4.5 V or 0.0 V
For all other inputs
VIN = VCC or GND
M, D, P, L, R, F
VOUT = 4.1 V
3/
All
For all inputs affecting output
under test, VIN = 4.5 V or 0.0 V
For all other inputs
VIN = VCC or GND
M, D, P, L, R, F
VOUT = 0.4 V
3/
All
____
mOE = 5.5 V
For all other inputs
VIN = 0.0 V or 5.5 V
VOUT = 5.5 V
All
M, D, P, L, R, F
3/
Three-state output
leakage current,
low
IOZL
M, D, P, L, R, F
3/
Quiescent supply
current
ICC
All
VIN = VCC or GND
5.5 V
All
5.5 V
All
1
-16.0
2, 3
-12.0
1
-12.0
1
16.0
2, 3
12.0
1
12.0
Max
mA
mA
1
+1.0
2, 3
+35.0
1
+35.0
1
-1.0
2, 3
-35.0
1
-35.0
1
20.0
2, 3
400.0
1
400.0
µA
µA
µA
All
5.0 V
4
15.0
pF
COUT
All
5.0 V
4
10.0
pF
CPD
5/
All
5.0 V
4
60.0
pF
5, 6
60.0
Input capacitance
CIN
Output capacitance
Power dissipation
capacitance
VIH = 5.0 V, VIL = 0.0 V
f = 1 MHz, see 4.4.1c
5.5 V
All
All
M, D, P, L, R, F
3/
4.5 V
All
All
____
mOE = 5.5 V
For all other inputs
VIN = 0.0 V or 5.5 V
VOUT = 0.0 V
4.5 V
Unit
See footnotes at end of table.
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TABLE I. Electrical performance characteristics - Continued.
Test
Functional test
Symbol
6/
VIH = 3.15 V, VIL = 1.35 V
See 4.4.1b
Propagation delay
time, mAn to mYn
tPHL
7/
Device
type
Test conditions 1/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
All
CL = 50 pF
RL = 500Ω
See figure 4
All
CL = 50 pF
RL = 500Ω
See figure 4
All
tPZL
7/
All
tPZH
7/
CL = 50 pF
RL = 500Ω
See figure 4
All
tPLZ
7/
CL = 50 pF
RL = 500Ω
See figure 4
All
H
7
L
H
9
1.0
9.0
10, 11
1.0
10.0
9
1.0
10.0
9
1.0
9.0
10, 11
1.0
10.0
9
1.0
10.0
9
2.0
11.0
10, 11
2.0
14.0
9
2.0
14.0
9
2.0
10.0
10, 11
2.0
11.0
9
2.0
11.0
9
2.0
13.5
10, 11
2.0
14.0
9
2.0
14.0
9
2.0
14.5
10, 11
2.0
14.5
9
2.0
14.5
4.5 V
4.5 V
4.5 V
4.5 V
4.5 V
All
M, D, P, L, R, F 3/
tPHZ
7/
L
All
M, D, P, L, R, F 3/
Propagation delay
time, output
disable, mOE to
mYn
7, 8
4.5 V
All
M, D, P, L, R, F 3/
CL = 50 pF
RL = 500Ω
See figure 4
All
4.5 V
All
M, D, P, L, R, F 3/
Unit
Max
All
CL = 50 pF
RL = 500Ω
See figure 4
Limits 2/
Min
All
M, D, P, L, R, F 3/
Propagation delay
time, output
enable, mOE to
mYn
Group A
subgroups
All
M, D, P, L, R, F 3/
M, D, P, L, R, F 3/
tPLH
7/
VCC
ns
ns
ns
See footnotes at end of table.
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TABLE I. Electrical performance characteristics - Continued.
Test
Output transition
time
Symbol
tTHL,
tTLH
7/
Device
type
Test conditions 1/
-55°C ≤ TC ≤ +125°C
unless otherwise specified
CL = 50 pF
RL = 500Ω
See figure 4
All
VCC
Group A
subgroups
Unit
Min
Max
9
1.0
5.0
10, 11
1.0
5.0
9
1.0
5.0
4.5 V
All
M, D, P, L, R, F 3/
Limits 2/
ns
1/
Each input/output, as applicable, shall be tested at the specified temperature, for the specified limits, to the tests in table I
herein. Output terminals not designated shall be high level logic, low level logic, or open, except for the ICC test, the output
terminals shall be open. When performing the ICC test, the current meter shall be placed in the circuit such that all current
flows through the meter.
2/
For negative and positive voltage and current values, the sign designates the potential difference in reference to GND and
the direction of current flow, respectively; and the absolute value of the magnitude, not the sign, is relative to the minimum
and maximum limits, as applicable, listed herein.
3/
Devices supplied to this drawing meet all levels M, D, P, L, R, and F of irradiation. However, these devices are only tested
at the "F" level. Pre and post irradiation values are identical unless otherwise specified in table I. When performing post
irradiation electrical measurements for any RHA level, TA = +25°C.
4/
Force/measure functions may be interchanged.
5/
Power dissipation capacitance (CPD) determines both the power consumption (PD) and current consumption (IS). Where
PD = (CPD + CL) (VCC x VCC)f + (ICC x VCC)
IS = (CPD + CL) VCCf + ICC
f is the frequency of the input signal.
6/
The test vectors used to verify the truth table shall, at a minimum, test all functions of each input and output. All possible
input to output logic patterns per function shall be guaranteed, if not tested, to the truth table in figure 2 herein. For VOUT
measurements, L ≤ 0.5 V and H ≥ 4.0 V.
7/
AC limits at VCC = 5.5 V are equal to the limits at VCC = 4.5 V. For propagation delay tests, all paths must be tested.
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Device type
All
Case outlines
R and X
Terminal
number
Terminal
symbol
Terminal
number
Terminal
symbol
1
1OE
11
2A0
2
1A0
12
1Y3
3
2Y3
13
2A1
4
1A1
14
1Y2
5
2Y2
15
2A2
6
1A2
16
1Y1
7
2Y1
17
2A3
8
1A3
18
1Y0
9
2Y0
19
2OE
10
GND
20
VCC
FIGURE 1. Terminal connections.
Inputs
Outputs
mOE
mAn
mYn
L
L
L
L
H
H
H
X
Z
H = High voltage level
L = Low voltage level
X = Don't care
Z = High impedance
FIGURE 2. Truth table.
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FIGURE 3. Logic diagram.
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NOTES:
1. When measuring tPZL and tPLZ, S1 is closed and S2 is open.
2. When measuring tPLH, tPHL, tPZH, and tPHZ, S1 is open and S2 is closed.
3. CL = 50 pF minimum or equivalent (includes test jig and probe capacitance).
4. RL = 500Ω or equivalent.
5. Input signal from pulse generator: VIN = 0.0 V to VCC; PRR ≤ 10 MHz; tr ≤ 3.0 ns; tf ≤ 3.0 ns; tr and tf shall be measured
from 10% of VCC to 90% of VCC and from 90% of VCC to 10% of VCC, respectively.
FIGURE 4. Switching waveforms and test circuit.
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4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in
accordance with MIL-PRF-38535, appendix A.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
4.2.1 Additional criteria for device class M.
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
4.2.2 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table IIA herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B or as modified in the device manufacturer’s quality management (QM) plan.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for
device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed
for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections
(see 4.4.1 through 4.4.4).
STANDARD
MICROCIRCUIT DRAWING
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4.4.1 Group A inspection.
a.
Tests shall be as specified in table IIA herein.
b.
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table in figure 2 herein. For device
classes Q and V, subgroups 7 and 8 shall include verifying the functionality of the device.
c.
CIN, COUT, and CPD shall be measured only for initial qualification and after process or design changes which may affect
capacitance. CIN and COUT shall be measured between the designated terminal and GND at a frequency of
1 MHz. For CIN, COUT, and CPD, tests shall be sufficient to validate the limits defined in table I herein.
TABLE IIA. Electrical test requirements.
Test requirements
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
Device
class Q
Device
class V
1, 7, 9
1, 7, 9
1, 7, 9
1, 2, 3, 7,
8, 9, 10, 11
1/
1, 2, 3, 7,
8, 9, 10, 11
1/
1, 2, 3, 7,
8, 9, 10, 11
2/ 3/
1, 2, 3, 4, 5, 6,
7, 8, 9, 10, 11
1, 2, 3, 4, 5, 6,
7, 8, 9, 10, 11
1, 2, 3, 4, 5, 6,
7, 8, 9, 10, 11
1, 2, 3, 7, 8, 9,
10, 11
1, 2, 3, 7, 8, 9,
10, 11
1, 2, 3, 7, 8, 9,
10, 11 3/
Group D end-point electrical
parameters (see 4.4)
1, 7, 9
1, 7, 9
1, 7, 9
Group E end-point electrical
parameters (see 4.4)
1, 7, 9
1, 7, 9
1, 7, 9
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
1/ PDA applies to subgroups 1 and 7.
2/ PDA applies to subgroups 1, 7, 9, and ∆'s.
3/ Delta limits, as specified in table IIB herein, shall be required where specified, and the delta
values shall be completed with reference to the zero hour electrical parameters (see table I).
TABLE IIB. Burn-in and operating life test, delta parameters (+25°C).
Parameters 1/
Delta limits
ICC
±4 µA
IOL/IOH
±15%
IOZL/IOZH
±200 nA
1/ These parameters shall be recorded before and after the required burn-in
and life test to determine delta limits.
STANDARD
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TABLE III. Irradiation test connections.
Open
Ground
VCC = 5 V ± 0.5 V
3, 5, 7, 9, 12, 14, 16, 18
10
1, 2, 4, 6, 8, 11, 13
15, 17, 19, 20
NOTE: Each pin except VCC and GND will have a resistor of 47 kΩ ± 5% for irradiation testing.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
b.
TA = +125°C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table IIA herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25°C ±5°C,
after exposure, to the subgroups specified in table IIA herein.
4.4.4.1 Total dose irradiation testing. Total dose irradiation testing shall be performed in accordance with MIL-STD-883,
method 1019 and as specified herein.
4.4.4.1.1 Accelerated aging testing. Accelerated aging testing shall be performed on all devices requiring a RHA level greater
than 5k rads (Si). The post-anneal end-point electrical parameter limits shall be as specified in table I herein and shall be the
pre-irradiation end-point electrical parameter limits at 25°C ±5°C. Testing shall be performed at initial qualification and after any
design or process changes which may affect the RHA response of the device.
4.4.4.2 Dose rate induced latchup testing. Dose rate induced latchup testing shall be performed in accordance with method
1020 of MIL-STD-883 and as specified herein (see 1.5 herein). Tests shall be performed on devices, SEC, or approved test
structures at technology qualification and after any design or process changes which may affect the RHA capability of the
process.
STANDARD
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4.4.4.3 Dose rate upset testing. Dose rate upset testing shall be performed in accordance with method 1021 of
MIL-STD-883 and herein (see 1.5 herein).
a.
Transient dose rate upset testing shall be performed at initial qualification and after any design or process changes
which may affect the RHA performance of the devices. Test 10 devices with 0 defects unless otherwise specified.
b.
Transient dose rate upset testing for class Q and V devices shall be performed as specified by a TRB approved
radiation hardness assurance plan and MIL-PRF-38535.
4.4.4.4 Single event phenomena (SEP). SEP testing shall be required on class V devices (see 1.5 herein). SEP testing shall
be performed on a technology process on the Standard Evaluation Circuit (SEC) or alternate SEP test vehicle as approved by
the qualifying activity at initial qualification and after any design or process changes which may affect the upset or latchup
characteristics. The recommended test conditions for SEP are as follows:
a.
The ion beam angle of incidence shall be between normal to the die surface and 60° to the normal, inclusive
(i.e. 0° ≤ angle ≤ 60°). No shadowing of the ion beam due to fixturing or package related effects is allowed.
b.
The fluence shall be ≥ 100 errors or ≥ 106 ions/cm2.
c.
The flux shall be between 102 and 105 ions/cm2/s. The cross-section shall be verified to be flux independent by
measuring the cross-section at two flux rates which differ by at least an order of magnitude.
d.
The particle range shall be ≥ 20 micron in silicon.
e.
The test temperature shall be +25°C and the maximum rated operating temperature ±10°C.
f.
Bias conditions shall be defined by the manufacturer for the latchup measurements.
g.
Test four devices with zero failures.
4.5 Methods of inspection. Methods of inspection shall be specified as follows:
4.5.1 Voltage and current. Unless otherwise specified, all voltages given are referenced to the microcircuit GND terminal.
Currents given are conventional current and positive when flowing into the referenced terminal.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users
and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.
STANDARD
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6.4 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990 or telephone
(614) 692-0547.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to
this drawing.
6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.
The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been
submitted to and accepted by DSCC-VA.
6.7 Additional information. When applicable, a copy of the following additional data shall be maintained and available from
the device manufacturer:
a. RHA upset levels.
b. Test conditions (SEP).
c. Number of upsets (SEP).
d. Number of transients (SEP).
e. Occurrence of latchup (SEP).
STANDARD
MICROCIRCUIT DRAWING
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APPENDIX A
APPENDIX A FORMS A PART OF SMD 5962-98541
A.1 SCOPE
A.1.1 Scope. This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified
Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers
approved QM plan for use in monolithic microcircuits, multi-chip modules (MCMs), hybrids, electronic modules, or devices using
chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of
military high reliability (device class Q) and space application (device class V) are reflected in the Part or Identification Number
(PIN). When available, a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN.
A.1.2 PIN. The PIN is as shown in the following example:
5962
F
Federal
stock class
designator
\
RHA
designator
(see A.1.2.1)
98541
01
V
9
A
Device
type
(see A.1.2.2)
Device
class
designator
(see A.1.2.3)
Die
code
Die
details
(see A.1.2.4)
/
\/
Drawing number
A.1.2.1 RHA designator. Device classes Q and V RHA identified die meet the MIL-PRF-38535 specified RHA levels. A dash
(-) indicates a non-RHA die.
A.1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
Circuit function
ACS244
Radiation hardened, SOS,
advanced CMOS, noninverting octal
buffer/line driver with three-state
outputs
A.1.2.3 Device class designator.
Device class
Q or V
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Device requirements documentation
Certification and qualification to the die requirements of MIL-PRF-38535
SIZE
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APPENDIX A
APPENDIX A FORMS A PART OF SMD 5962-98541
A.1.2.4 Die details. The die details designation is a unique letter which designates the die's physical dimensions, bonding
pad location(s) and related electrical function(s), interface materials, and other assembly related information, for each product
and variant supplied to this appendix.
A.1.2.4.1 Die physical dimensions.
Die type
Figure number
01
A-1
A.1.2.4.2 Die bonding pad locations and electrical functions.
Die type
Figure number
01
A-1
A.1.2.4.3 Interface materials.
Die type
Figure number
01
A-1
A.1.2.4.4 Assembly related information.
Die type
Figure number
01
A-1
A.1.3 Absolute maximum ratings. See paragraph 1.3 herein for details.
A.1.4 Recommended operating conditions. See paragraph 1.4 herein for details.
A.2 APPLICABLE DOCUMENTS.
A.2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in
the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARD
MIL-STD-883 - Test Method Standard Microcircuits.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
STANDARD
MICROCIRCUIT DRAWING
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APPENDIX A
APPENDIX A FORMS A PART OF SMD 5962-98541
A.2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
A.3 REQUIREMENTS
A.3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 and as specified herein or as modified in the device manufacturer’s Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein.
A.3.2 Design, construction and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein and the manufacturer’s QM plan for device classes Q and V.
A.3.2.1 Die physical dimensions. The die physical dimensions shall be as specified in A.1.2.4.1 and on figure A-1.
A.3.2.2 Die bonding pad locations and electrical functions. The die bonding pad locations and electrical functions shall be as
specified in A.1.2.4.2 and on figure A-1.
A.3.2.3 Interface materials. The interface materials for the die shall be as specified in A.1.2.4.3 and on figure A-1.
A.3.2.4 Assembly related information. The assembly related information shall be as specified in A.1.2.4.4 and on figure A-1.
A.3.2.5 Truth table. The truth table shall be as defined in paragraph 3.2.3 herein.
A.3.2.6 Radiation exposure circuit. The radiation exposure circuit shall be as defined in paragraph 3.2.6 herein.
A.3.3 Electrical performance characteristics and post-irradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and post-irradiation parameter limits are as specified in table I of the body of this
document.
A.3.4 Electrical test requirements. The wafer probe test requirements shall include functional and parametric testing
sufficient to make the packaged die capable of meeting the electrical performance requirements in table I.
A.3.5 Marking. As a minimum, each unique lot of die, loaded in single or multiple stack of carriers, for shipment to a
customer, shall be identified with the wafer lot number, the certification mark, the manufacturer’s identification and the PIN listed
in A.1.2 herein. The certification mark shall be a “QML” or “Q” as required by MIL-PRF-38535.
A.3.6 Certification of compliance. For device classes Q and V, a certificate of compliance shall be required from a
QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see A.6.4 herein). The certificate of
compliance submitted to DSCC-VA prior to listing as an approved source of supply for this appendix shall affirm that the
manufacturer’s product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and the requirements herein.
A.3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535
shall be provided with each lot of microcircuit die delivered to this drawing.
STANDARD
MICROCIRCUIT DRAWING
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APPENDIX A
APPENDIX A FORMS A PART OF SMD 5962-98541
A.4 VERIFICATION
A.4.1 Sampling and inspection. For device classes Q and V, die sampling and inspection procedures shall be in accordance
with MIL-PRF-38535 or as modified in the device manufacturer’s Quality Management (QM) plan. The modifications in the QM
plan shall not affect the form, fit, or function as described herein.
A.4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and as defined in the
manufacturer’s QM plan. As a minimum, it shall consist of:
a.
Wafer lot acceptance for class V product using the criteria defined in MIL-STD-883, method 5007.
b.
100% wafer probe (see paragraph A.3.4 herein).
c.
100% internal visual inspection to the applicable class Q or V criteria defined in MIL-STD-883, method 2010 or the
alternate procedures allowed in MIL-STD-883, method 5004.
A.4.3 Conformance inspection.
A.4.3.1 Group E inspection. Group E inspection is required only for parts intended to be identified as radiation assured
(see A.3.5 herein). RHA levels for device classes Q and V shall be as specified in MIL-PRF-38535. End point electrical testing
of packaged die shall be as specified in table IIA herein. Group E tests and conditions are as specified in paragraphs 4.4.4
herein.
A.5 DIE CARRIER
A.5.1 Die carrier requirements. The requirements for the die carrier shall be accordance with the manufacturer’s QM plan or
as specified in the purchase order by the acquiring activity. The die carrier shall provide adequate physical, mechanical and
electrostatic protection.
A.6 NOTES
A.6.1 Intended use. Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with
MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original equipment), design applications, and
logistics purposes.
A.6.2 Comments. Comments on this appendix should be directed to DSCC-VA, Columbus, Ohio, 43218-3990 or telephone
(614) 692-0547.
A.6.3 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
A.6.4 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.
The vendors listed within QML-38535 have submitted a certificate of compliance (see A.3.6 herein) to DSCC-VA and have
agreed to this drawing.
STANDARD
MICROCIRCUIT DRAWING
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APPENDIX A
APPENDIX A FORMS A PART OF SMD 5962-98541
Die physical dimensions.
Die size:
Die thickness:
2540 x 2540 microns.
21 ±2 mils.
Die bonding pad locations and electrical functions.
The following metallization diagram supplies the locations and electrical functions of the bonding pads. The internal
metallization layout and alphanumeric information contained within this diagram may or may not represent the actual circuit
defined by this SMD.
NOTE: Pad numbers reflect terminal numbers when placed in case outlines R and X (see figure 1).
FIGURE A-1
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APPENDIX A
APPENDIX A FORMS A PART OF SMD 5962-98541
Interface materials.
Metal 1:
Metal 2 (Top):
AlSi
AISi
Backside metallization:
None
7.0 kÅ ±1 kÅ
10.0 kÅ ±1 kÅ
Glassivation
Type:
Thickness:
Substrate:
PSG
13.0 kÅ ±1.5 kÅ
Silicon on Sapphire (SOS)
Assembly related information.
Substrate potential:
Special assembly
instructions:
Insulator
Bond pad #20 (VCC) first
Two bond wires required for
VCC (one on each pad).
Two bond wires required for
GND (one on each pad).
FIGURE A-1 – Continued.
STANDARD
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STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 05-10-04
Approved sources of supply for SMD 5962-98541 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised
to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate
of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next
dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of
supply at http://www.dscc.dla.mil/Programs/SMCR/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962F9854101VRC
34371
ACS244DMSR-02
5962F9854101VXC
34371
ACS244KMSR-02
5962F9854101V9A
34371
ACS244HMSR-02
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed, contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
34371
Vendor name
and address
Intersil Corporation
2401 Palm Bay Blvd
PO Box 883
Melbourne, FL 32902-0883
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.