TI ADC08200CIMT

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Resolution
Maximum sampling frequency
DNL
ENOB (fIN= 50 MHz)
THD (fIN= 50 MHz)
Power Consumption
— Operating
— Power Down
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Key Specifications
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Single-ended input
Internal sample-and-hold function
Low voltage (single +3V) operation
Small package
Power-down feature
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The ADC08200 is a low-power, 8-bit, monolithic analog-todigital converter with an on-chip track-and-hold circuit. Optimized for low cost, low power, small size and ease of use,
this product operates at conversion rates up to 230 MSPS
while consuming just 1.05 mW per MHz of clock frequency,
or 210 mW at 200 MSPS. Raising the PD pin puts the
ADC08200 into a Power Down mode where it consumes
about 1 mW.
The unique architecture achieves 7.3 Effective Bits with
50 MHz input frequency. The ADC08200 is resistant to
latch-up and the outputs are short-circuit proof. The top and
bottom of the ADC08200’s reference ladder are available for
connections, enabling a wide range of input possibilities. The
digital outputs are TTL/CMOS compatible with a separate
output power supply pin to support interfacing with 3V or
2.5V logic. The digital inputs (CLK and PD) are TTL/CMOS
compatible. The output data format is straight binary.
The ADC08200 is offered in a 24-lead plastic package
(TSSOP) and, while specified over the industrial temperature
range of −40˚C to +85˚C, it will function over the to −40˚C to
+105˚C temperature range. An evaluation board is available
to assist in the easy evaluation of the ADC08200.
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Features
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General Description
9
ADC08200
8-Bit, 20 MSPS to 200 MSPS, 1.05 mW/MSPS A/D
Converter with Internal Sample-and-Hold
8 Bits
200 MSPS (min)
± 0.4 LSB (typ)
7.3 bits (typ)
61 dB (typ)
1.05 mW/MSPS (typ)
1 mW (typ)
Applications
Flat panel displays
Projection systems
Set-top boxes
Battery-powered instruments
Communications
Medical imaging
Astronomy
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Pin Configuration
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20017901
© 2006 National Semiconductor Corporation
DS200179
www.national.com
ADC08200 8-Bit, 20 MSPS to 200 MSPS, 1.05 mW/MSPS A/D Converter with Internal
Sample-and-Hold
July 2006
ADC08200
Ordering Information
Order Number
Temperature Range
Package
ADC08200CIMT
−40˚C ≤ TA ≤ +105˚C
TSSOP
ADC08200CIMTX
−40˚C ≤ TA ≤ +105˚C
TSSOP (tape and reel)
ADC08200EVAL
Evaluation Board
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Block Diagram
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Pin Descriptions and Equivalent Circuits
Symbol
Equivalent Circuit
Description
6
VIN
Analog signal input. Conversion range is VRB to VRT.
3
VRT
Analog Input that is the high (top) side of the reference
ladder of the ADC. Nominal range is 0.5V to VA. Voltage
on VRT and VRB inputs define the VIN conversion range.
Bypass well. See Section 2.0 for more information.
9
VRM
Mid-point of the reference ladder. This pin should be
bypassed to a quiet point in the ground plane with a 0.1
µF capacitor.
VRB
Analog Input that is the low side (bottom) of the
reference ladder of the ADC. Nominal range is 0.0V to
(VRT – 0.5V). Voltage on VRT and VRB inputs define the
VIN conversion range. Bypass well. See Section 2.0 for
more information.
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Pin No.
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ADC08200
Pin Descriptions and Equivalent Circuits
(Continued)
Symbol
Equivalent Circuit
Description
23
PD
Power Down input. When this pin is high, the converter is
in the Power Down mode and the data output pins hold
the last conversion result.
24
CLK
CMOS/TTL compatible digital clock Input. VIN is sampled
on the rising edge of CLK input.
13 thru 16
and
19 thru 22
D0–D7
Conversion data digital Output pins. D0 is the LSB, D7 is
the MSB. Valid data is output just after the rising edge of
the CLK input.
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VIN GND
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Pin No.
Reference ground for the single-ended analog input, VIN.
VA
18
VDR
Power supply for the output drivers. If connected to VA,
decouple well from VA.
17
DR GND
2, 5, 8, 11
AGND
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1, 4, 12
Positive analog supply pin. Connect to a quiet voltage
source of +3V. VA should be bypassed with a 0.1 µF
ceramic chip capacitor for each pin, plus one
10 µF capacitor. See Section 3.0 for more information.
The ground return for the output driver supply.
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The ground return for the analog supply.
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ADC08200
Absolute Maximum Ratings
Operating Ratings (Notes 1, 2)
(Notes 1, 2)
Operating Temperature Range
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (VA)
−40˚C ≤ TA ≤ +105˚C
+2.7V to +3.6V
Driver Supply Voltage (VDR)
+2.4V to VA
Ground Difference |GND - DR GND|
3.8V
VA +0.3V
Package Input Current (Note 3)
± 25 mA
± 50 mA
Power Dissipation at TA = 25˚C
See (Note 4)
Input Current at Any Pin (Note 3)
ESD Susceptibility (Note 5)
Human Body Model
Machine Model
2500V
200V
Soldering Temperature, Infrared,
10 seconds (Note 6)
235˚C
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θJA
Package
24-Lead TSSOP
−65˚C to +150˚C
Converter Electrical Characteristics
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Storage Temperature
Package Thermal Resistance
92˚C/W
44
−0.05V to
(VA + 0.05V)
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CLK, PD Voltage Range
VRB to VRT
:
VA to AGND
0V to (VRT −0.5V)
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Reference Voltage (VRT, VRB)
Lower Reference Voltage (VRB)
VIN Voltage Range
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−0.3V to VA
0.5V to (VA −0.3V)
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Driver Supply Voltage (VDR)
Voltage on Any Input or Output
Pin
0V to 300 mV
Upper Reference Voltage (VRT)
51
Supply Voltage (VA)
Symbol
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The following specifications apply for VA = VDR = +3.0VDC, VRT = +1.9V, VRB = 0.3V, CL = 5 pF, fCLK = 200 MHz at 50% duty
cycle. Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25˚C (Notes 7, 8)
Parameter
Conditions
Integral Non-Linearity
DNL
Differential Non-Linearity
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INL
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DC ACCURACY
Missing Codes
Full Scale Error
VOFF
Zero Scale Offset Error
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FSE
Typical
(Note 9)
Limits
(Note 9)
Units
(Limits)
+1.0
−0.3
+1.9
−1.2
LSB (max)
LSB (min)
± 0.4
± 0.95
LSB (max)
0
(max)
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50
mV (max)
46
60
mV (max)
VRB
V (min)
VRT
V (max)
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VIN Input Capacitance
1.6
VIN = 0.75V +0.5 Vrms
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Input Voltage
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ANALOG INPUT AND REFERENCE CHARACTERISTICS
(CLK
LOW)
3
pF
(CLK
HIGH)
4
pF
RIN Input Resistance
>1
MΩ
BW
Full Power Bandwidth
500
MHz
Top Reference Voltage
1.9
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RIN
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VRT
VRB
VRT VRB
RREF
Bottom Reference Voltage
0.3
Reference Voltage Delta
Reference Ladder Resistance
1.6
VRT to VRB
160
VA
V (max)
0.5
V (min)
VRT − 0.5
V (max)
0
V (min)
1.0
V (min)
2.3
V (max)
120
Ω (min)
200
Ω (max)
2.0
V (min)
CLK, PD DIGITAL INPUT CHARACTERISTICS
VIH
Logical High Input Voltage
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VDR = VA = 3.6V
4
(Continued)
The following specifications apply for VA = VDR = +3.0VDC, VRT = +1.9V, VRB = 0.3V, CL = 5 pF, fCLK = 200 MHz at 50% duty
cycle. Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25˚C (Notes 7, 8)
Symbol
Parameter
Conditions
Typical
(Note 9)
Limits
(Note 9)
Units
(Limits)
0.8
V (max)
VIL
Logical Low Input Voltage
VDR = VA = 2.7V
IIH
Logical High Input Current
VIH = VDR = VA = 3.6V
10
nA
IIL
Logical Low Input Current
VIL = 0V, VDR = VA = 2.7V
−50
nA
CIN
Logic Input Capacitance
3
pF
VA = VDR = 2.7V, IOH = −400 µA
2.6
2.4
Low Level Output Voltage
VA = VDR = 2.7V, IOL = 1.0 mA
0.4
0.5
fIN = 4 MHz, VIN = FS − 0.25 dB
7.5
7.4
7.3
fIN = 70 MHz, VIN = FS − 0.25 dB
7.2
Bits
fIN = 100 MHz, VIN = FS − 0.25 dB
7.0
Bits
47
dB
fIN = 20 MHz, VIN = FS − 0.25 dB
HD3
IMD
3rd Harmonic Distortion
Intermodulation Distortion
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dB
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dB
fIN = 20 MHz, VIN = FS − 0.25 dB
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fIN = 50 MHz, VIN = FS − 0.25 dB
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fIN = 70 MHz, VIN = FS − 0.25 dB
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2nd Harmonic Distortion
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dB (min)
fIN = 4 MHz, VIN = FS − 0.25 dB
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dB
dB
43.4
dB (min)
dB
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dB
60
dBc
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dBc
60
dBc
fIN = 70 MHz, VIN = FS − 0.25 dB
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dBc
fIN = 100 MHz, VIN = FS − 0.25 dB
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dBc
fIN = 4 MHz, VIN = FS − 0.25 dB
−60
dBc
限
fIN = 20 MHz, VIN = FS − 0.25 dB
fIN = 50 MHz, VIN = FS − 0.25 dB
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Total Harmonic Distortion
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THD
dB
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fIN = 4 MHz, VIN = FS − 0.25 dB
Spurious Free Dynamic Range
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fIN = 100 MHz, VIN = FS − 0.25 dB
SFDR
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Bits
Bits (min)
fIN = 100 MHz, VIN = FS − 0.25 dB
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Signal-to-Noise Ratio
6.9
fIN = 70 MHz, VIN = FS − 0.25 dB
,
SNR
fIN = 50 MHz, VIN = FS − 0.25 dB
Signal-to-Noise & Distortion
:
fIN = 20 MHz, VIN = FS − 0.25 dB
fIN = 4 MHz, VIN = FS − 0.25 dB
SINAD
Bits
fIN = 50 MHz, VIN = FS − 0.25 dB
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Effective Number of Bits
V (max)
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DYNAMIC PERFORMANCE
ENOB
V (min)
51
High Level Output Voltage
VOL
44
VOH
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DIGITAL OUTPUT CHARACTERISTICS
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CLK, PD DIGITAL INPUT CHARACTERISTICS
fIN = 20 MHz, VIN = FS − 0.25 dB
−58
dBc
fIN = 50 MHz, VIN = FS − 0.25 dB
−60
dBc
fIN = 70 MHz, VIN = FS − 0.25 dB
-56
dBc
fIN = 100 MHz, VIN = FS − 0.25 dB
−53
dBc
fIN = 4 MHz, VIN = FS − 0.25 dB
−66
dBc
fIN = 20 MHz, VIN = FS − 0.25 dB
-68
dBc
fIN = 50 MHz, VIN = FS − 0.25 dB
−66
dBc
fIN = 70 MHz, VIN = FS − 0.25 dB
-60
dBc
fIN = 100 MHz, VIN = FS − 0.25 dB
−55
dBc
fIN = 4 MHz, VIN = FS − 0.25 dB
−72
dBc
fIN = 20 MHz, VIN = FS − 0.25 dB
−58
dBc
fIN = 50 MHz, VIN = FS − 0.25 dB
−72
dBc
fIN = 70 MHz, VIN = FS − 0.25 dB
-58
dBc
fIN = 100 MHz, VIN = FS − 0.25 dB
−60
dBc
f1 = 11 MHz, VIN = FS − 6.25 dB
f2 = 12 MHz, VIN = FS − 6.25 dB
-55
dBc
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ADC08200
Converter Electrical Characteristics
ADC08200
Converter Electrical Characteristics
(Continued)
The following specifications apply for VA = VDR = +3.0VDC, VRT = +1.9V, VRB = 0.3V, CL = 5 pF, fCLK = 200 MHz at 50% duty
cycle. Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25˚C (Notes 7, 8)
Symbol
Parameter
Conditions
Typical
(Note 9)
Limits
(Note 9)
Units
(Limits)
86
mA (max)
POWER SUPPLY CHARACTERISTICS
PC
Power Consumption
DC Input, PD = Low
0.25
0.6
mA (max)
DC Input, PD = Low
70
86.6
mA (max)
CLK Low, PD = Hi
0.3
DC Input, Excluding Reference
210
CLK Low, PD = Hi
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PSRR1
Power Supply Rejection Ratio
FSE change with 2.7V to 3.3V change
in VA
PSRR2
Power Supply Rejection Ratio
SNR reduction with 200 mV at 1MHz
on supply
Minimum Conversion Rate
tCL
Minimum Clock Low Time
tCH
Minimum Clock High Time
230
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Maximum Conversion Rate
Output Hold Time, Output Rising
(Note 10)
CLK to Data Invalid, VA = 3.3V to
3.6V, tA = −40˚C to +105˚C, CL = 8
pF
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Output Delay, Output Rising
(Note 10)
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Output Slew Rate
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Aperture Jitter
mW
dB
dB
200
MHz (min)
10
MHz
0.87
1.0
ns (min)
0.65
0.75
ns (min)
2.4
3.3
ns (max)
1.9
2.5
ns (max)
2.4
ns (min)
5.1
ns (max)
2.4
ns (min)
4.0
ns (max)
CLK to Data Transition, VA = 3.3V to
3.6V, tA = −40˚C to +105˚C, CL = 8
pF
3.3
Output Falling, VA = 3.3V, CL = 8 pF,
tA = −40˚C to +105˚C
0.73
V/ns
Output Rising, VA = 3.3V, CL = 8 pF,
tA = −40˚C to +105˚C
0.88
V/ns
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Clock Cycles
CLK Rise to Acquisition of Data
2.6
ns
2
ps rms
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Sampling (Aperture) Delay
mW (max)
3.9
Pipeline Delay (Latency)
tAD
260
mA
CLK to Data Transition, VA = 3.3V to
3.6V, VA = −40˚C to +105˚C, CL = 8
pF
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Output Delay, Output Falling
(Note 10)
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Output Hold Time, Output Falling
(Note 10)
CLK to Data Invalid, VA = 3.3V to
3.6V, tA = −40˚C to +105˚C, CL = 8
pF
tOH
tSLEW
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fC1
fC2
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AC ELECTRICAL CHARACTERISTICS
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Total Operating Current
mA
81
IA + IDR
69.75
51
Output Driver Supply Current
69.75
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IDR
DC Input
fIN = 10 MHz, VIN = FS − 3 dB
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Analog Supply Current
:
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Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All voltages are measured with respect to GND = AGND = DR GND = 0V, unless otherwise specified.
Note 3: When the input voltage at any pin exceeds the power supplies (that is, less than AGND or DR GND, or greater than VA or VDR), the current at that pin should
be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of
25 mA to two.
Note 4: The absolute maximum junction temperature (TJmax) for this device is 150˚C. The maximum allowable power dissipation is dictated by TJmax, the
junction-to-ambient thermal resistance (θJA), and the ambient temperature (TA), and can be calculated using the formula PDMAX = (TJmax − TA) / θJA. The values
for maximum power dissipation listed above will be reached only when this device is operated in a severe fault condition (e.g., when input or output pins are driven
beyond the power supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.
Note 5: Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through ZERO Ohms.
Note 6: See AN-450, “Surface Mounting Methods and Their Effect on Product Reliability”.
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(Continued)
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Note 7: The analog inputs are protected as shown below. Input voltage magnitudes up to VA + 300 mV or to 300 mV below GND will not damage this device.
However, errors in the A/D conversion can occur if the input goes above VDR or below GND by more than 100 mV. For example, if VA is 2.7VDC the full-scale input
voltage must be ≤2.8VDC to ensure accurate conversions.
20017907
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Note 8: To guarantee accuracy, it is required that VA and VDR be well bypassed. Each supply pin must be decoupled with separate bypass capacitors.
:
Note 9: Typical figures are at TJ = 25˚C, and represent most likely parametric norms. Test limits are guaranteed to National’s AOQL (Average Outgoing Quality
Level).
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Note 10: These specifications are guaranteed by design and not tested.
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Note 11: Typical output slew rate is based upon the maximum tOD and tOH figures.
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ADC08200
Converter Electrical Characteristics
ADC08200
sented to the output driver stage. New data is available at
every clock cycle, but the data lags the conversion by the
Pipeline Delay plus the Output Delay.
POWER SUPPLY REJECTION RATIO (PSRR) is a measure of how well the ADC rejects a change in the power
supply voltage. For the ADC08200, PSRR1 is the ratio of the
change in Full-Scale Error that results from a change in the
DC power supply voltage, expressed in dB. PSRR2 is a
measure of how well an AC signal riding upon the power
supply is rejected from the output and is here defined as
Specification Definitions
APERTURE (SAMPLING) DELAY is that time required after
the rise of the clock input for the sampling switch to open.
The Sample/Hold circuit effectively stops capturing the input
signal and goes into the “hold” mode tAD after the clock goes
high.
APERTURE JITTER is the variation in aperture delay from
sample to sample. Aperture jitter shows up as input noise.
CLOCK DUTY CYCLE is the ratio of the time that the clock
wave form is at a logic high to the total time of one clock
period.
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SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in
dB, of the rms value of the input signal at the output to the
rms value of the sum of all other spectral components below
one-half the sampling frequency, not including harmonics or
d.c.
SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or
SINAD) is the ratio, expressed in dB, of the rms value of the
input signal at the output to the rms value of all of the other
spectral components below half the clock frequency, including harmonics but excluding d.c.
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the input
signal at the output and the peak spurious signal, where a
spurious signal is any signal present in the output spectrum
that is not present at the input.
TOTAL HARMONIC DISTORTION (THD) is the ratio expressed in dB, of the rms total of the first nine harmonic
levels at the output to the level of the fundamental at the
output. THD is calculated as
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where Vmax is the voltage at which the transition to the
maximum (full scale) code occurs.
INTEGRAL NON-LINEARITY (INL) is a measure of the
deviation of each individual code from a line drawn from zero
scale (1⁄2 LSB below the first code transition) through positive
full scale (1⁄2 LSB above the last code transition). The deviation of any given code from this straight line is measured
from the center of that code value. The end point test method
is used. Measured at 200 MSPS with a ramp input.
INTERMODULATION DISTORTION (IMD) is the creation of
additional spectral components as a result of two sinusoidal
frequencies being applied to the ADC input at the same time.
it is defined as the ratio of the power in the second and third
order intermodulation products to the power in one of the
original frequencies. IMD is usually expressed in dBFS.
MISSING CODES are those output codes that are skipped
and will never appear at the ADC outputs. These codes
cannot be reached with any input value.
OUTPUT DELAY is the time delay after the rising edge of
the input clock before the data update is present at the
output pins.
OUTPUT HOLD TIME is the length of time that the output
data is valid after the rise of the input clock.
PIPELINE DELAY (LATENCY) is the number of clock cycles
between initiation of conversion and when that data is pre-
where SNR0 is the SNR measured with no noise or signal on
the supply line and SNR1 is the SNR measured with a
1 MHz, 200 mVP-P signal riding upon the supply lines.
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FULL POWER BANDWIDTH is a measure of the frequency
at which the reconstructed output fundamental drops 3 dB
below its low frequency value for a full scale input.
FULL-SCALE ERROR is a measure of how far the last code
transition is from the ideal 11⁄2 LSB below VRT and is defined
as:
Vmax + 1.5 LSB – VRT
9
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
Measured at 200 MSPS with a ramp input.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
Distortion Ratio, or SINAD. ENOB is defined as (SINAD –
1.76) / 6.02 and says that the converter is equivalent to a
perfect ADC of this (ENOB) number of bits.
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where Af1 is the RMS power of the fundamental (output)
frequency and Af2 through Af10 are the RMS power of the
first 9 harmonic frequencies in the output spectrum
ZERO SCALE OFFSET ERROR is the error in the input
voltage required to cause the first code transition. It is defined as
VOFF = VZT − VRB
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where VZT is the first code transition input voltage.
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ADC08200
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Timing Diagram
44
20017931
:
VA = VDR = 3V, fCLK = 200 MHz, fIN = 50 MHz, unless other-
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Typical Performance Characteristics
71
FIGURE 1. ADC08200 Timing Diagram
wise stated
INL vs. Temperature
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INL
20017908
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INL vs. Sample Rate
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INL vs. Supply Voltage
20017914
20017915
20017910
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ADC08200
Typical Performance Characteristics VA = VDR = 3V, fCLK = 200 MHz, fIN = 50 MHz, unless
otherwise stated (Continued)
DNL vs. Temperature
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DNL
:
20017909
DNL vs. Sample Rate
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DNL vs. Supply Voltage
20017917
20017911
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20017918
SNR vs. Supply Voltage
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SNR vs. Temperature
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20017920
20017921
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ADC08200
Typical Performance Characteristics VA = VDR = 3V, fCLK = 200 MHz, fIN = 50 MHz, unless
otherwise stated (Continued)
SNR vs. Input Frequency
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SNR vs. Sample Rate
:
20017912
Distortion vs. Temperature
Distortion vs. Sample Rate
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Distortion vs. Supply Voltage
20017925
公
20017924
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ADC08200
Typical Performance Characteristics VA = VDR = 3V, fCLK = 200 MHz, fIN = 50 MHz, unless
otherwise stated (Continued)
Distortion vs. Clock Duty Cycle
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Distortion vs. Input Frequency
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SINAD/ENOB vs. Supply Voltage
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SINAD/ENOB vs. Temperature
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SINAD/ENOB vs. Input Frequency
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SINAD/ENOB vs. Sample Rate
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ADC08200
Typical Performance Characteristics VA = VDR = 3V, fCLK = 200 MHz, fIN = 50 MHz, unless
otherwise stated (Continued)
Power Consumption vs. Sample Rate
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SINAD/ENOB vs. Clock Duty Cycle
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Spectral Response @ fIN = 50 MHz
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Spectral Response @ fIN = 99 MHz
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Intermodulation Distortion
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ADC08200
The device is in the active state when the Power Down pin
(PD) is low. When the PD pin is high, the device is in the
power down mode, where the output pins hold the last
conversion before the PD pin went high and the device
consumes just 1.4 mW . Holding the clock input low will
further reduce the power consumption in the power down
mode to about 1 mW.
Functional Description
The ADC08200 uses a new, unique architecture that
achieves over 7 effective bits at input frequencies up to and
beyond 100 MHz.
The analog input signal that is within the voltage range set by
VRT and VRB is digitized to eight bits. Input voltages below
VRB will cause the output word to consist of all zeroes. Input
voltages above VRT will cause the output word to consist of
all ones.
Incorporating a switched capacitor bandgap, the ADC08200
exhibits a power consumption that is proportional to frequency, limiting power consumption to what is needed at the
clock rate that is used. This and its excellent performance
over a wide range of clock frequencies makes it an ideal
choice as a single ADC for many 8-bit needs.
Data is acquired at the rising edge of the clock and the digital
equivalent of that data is available at the digital outputs 6
clock cycles plus tOD later. The ADC08200 will convert as
long as the clock signal is present. The output coding is
straight binary.
Applications Information
1.0 REFERENCE INPUTS
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The reference inputs VRT and VRB are the top and bottom of
the reference ladder, respectively. Input signals between
these two voltages will be digitized to 8 bits. External voltages applied to the reference input pins should be within the
range specified in the Operating Ratings table. Any device
used to drive the reference pins should be able to source
sufficient current into the VRT pin and sink sufficient current
from the VRB pin to maintain the desired voltages.
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FIGURE 2. Simple, low component count reference biasing. Because of the ladder and external resistor tolerances,
the reference voltage of this circuit can vary too much for some applications.
LM8272 was chosen because of its rail-to-rail input and
output capability, its high current output and its ability to drive
large capacitive loads.
The divider resistors at the inputs to the amplifiers could be
changed to suit the application reference voltage needs, or
the divider can be replaced with potentiometers or DACs for
precise settings. The bottom of the ladder (VRB) may be
returned to ground if the minimum input signal excursion is
0V.
VRT should always be at least 1.0V more positive than VRB
to minimize noise. While VRT may be as high as the VA
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The reference bias circuit of Figure 2 is very simple and the
performance is adequate for many applications. However,
circuit tolerances will lead to a wide reference voltage range.
Better reference stability can be achieved by driving the
reference pins with low impedance sources.
The circuit of Figure 3 will allow a more accurate setting of
the reference voltages. The upper amplifier must be able to
source the reference current as determined by the value of
the reference resistor and the value of (VRT − VRB). The
lower amplifier must be able to sink this reference current.
Both amplifiers should be stable with a capacitive load. The
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The VRM pin is the center of the reference ladder and should
be bypassed to a quiet point in the ground plane with a 0.1
µF capacitor. DO NOT leave this pin open and DO NOT load
this pin with more than 10µA.
(Continued)
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supply voltage and VRB may be as low as ground, the
difference between these two voltages (VRT − VRB should
not exceed 2.3V to prevent waveform distortion.
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FIGURE 3. Driving the reference to force desired values requires driving with a low impedance source.
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2.0 THE ANALOG INPUT
The analog input of the ADC08200 is a switch followed by an
integrator. The input capacitance changes with the clock
level, appearing as 3 pF when the clock is low, and 4 pF
when the clock is high. The sampling nature of the analog
input causes current spikes at the input that result in voltage
spikes there. Any amplifier used to drive the analog input
must be able to settle within the clock high time. The
LMH6702 and the LMH6628 have been found to be good
amplifiers to drive the ADC08200.
Figure 4 shows an example of an input circuit using the
LMH6702. Any input amplifier should incorporate some gain
as operational amplifiers exhibit better phase margin and
transient response with gains above 2 or 3 than with unity
gain. If an overall gain of less than 3 is required, attenuate
the input and operate the amplifier at a higher gain, as
shown in Figure 4.
The RC at the amplifier output filters the clock rate energy
that comes out of the analog input due to the input sampling
circuit. The optimum time constant for this circuit depends
not only upon the amplifier and ADC, but also on the circuit
layout and board material. A resistor value should be chosen
between 18Ω and 47Ω and the capacitor value chose according to the formula
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The value of "C" in the formula above should include the
ADC input capacitance when the clock is high
This will provide optimum SNR performance for Nyquist
applications. Best THD performance is realized when the
capacitor and resistor values are both zero, but this would
compromise SNR and SINAD performance. Generally, the
capacitor should not be added for undersampling applications.
The circuit of Figure 4 has both gain and offset adjustments.
If you eliminate these adjustments normal circuit tolerances
may result in signal clipping unless care is exercised in the
worst case analysis of component tolerances and the input
signal excursion is appropriately limited to account for the
worst case conditions.
Full scale and offset adjustments may also be made by
adjusting VRT and VRB, perhaps with the aid of a pair of
DACs.
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ADC08200
Applications Information
ADC08200
(Continued)
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Applications Information
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FIGURE 4. The input amplifier should incorporate some gain for best performance (see text).
4.0 THE DIGITAL INPUT PINS
3.0 POWER SUPPLY CONSIDERATIONS
A/D converters draw sufficient transient current to corrupt
their own power supplies if not adequately bypassed. A
10 µF tantalum or aluminum electrolytic capacitor should be
placed within an inch (2.5 cm) of the A/D power pins, with a
0.1 µF ceramic chip capacitor placed within one centimeter
of the converter’s power supply pins. Leadless chip capacitors are preferred because they have low lead inductance.
While a single voltage source is recommended for the VA
and VDR supplies of the ADC08200, these supply pins
should be well isolated from each other to prevent any digital
noise from being coupled into the analog portions of the
ADC. A choke or 27Ω resistor is recommended between
these supply lines with adequate bypass capacitors close to
the supply pins.
As is the case with all high speed converters, the ADC08200
should be assumed to have little power supply rejection.
None of the supplies for the converter should be the supply
that is used for other digital circuitry in any system with a lot
of digital power being consumed. The ADC supplies should
be the same supply used for other analog circuitry.
No pin should ever have a voltage on it that is in excess of
the supply voltage or below ground by more than 300 mV,
not even on a transient basis. This can be a problem upon
application of power and power shut-down. Be sure that the
supplies to circuits driving any of the input pins, analog or
digital, do not come up any faster than does the voltage at
the ADC08200 power pins.
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The ADC08200 has two digital input pins: The PD pin and
the Clock pin.
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4.1 The PD Pin
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The Power Down (PD) pin, when high, puts the ADC08200
into a low power mode where power consumption is reduced
to about 1.4 mW with the clock running, or to about 1 mW
with the clock held low. Output data is valid and accurate
about 1 microsecond after the PD pin is brought low.
The digital output pins retain the last conversion output code
when either the clock is stopped or the PD pin is high.
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4.2 The ADC08200 Clock
Although the ADC08200 is tested and its performance is
guaranteed with a 200 MHz clock, it typically will function
well with clock frequencies from 10 MHz to 230 MHz.
The low and high times of the clock signal can affect the
performance of any A/D Converter. Because achieving a
precise duty cycle is difficult, the ADC08200 is designed to
maintain performance over a range of duty cycles. While it is
specified and performance is guaranteed with a 50% clock
duty cycle and 200 Msps, ADC08200 performance is typically maintained with clock high and low times of 0.65 ns and
0.87 ns, respectively, corresponding to a clock duty cycle
range of 13% to 82.5% with a 200 MHz clock. Note that
minimum low and high times may not be simultaneously
asserted.
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The analog input should be isolated from noisy signal traces
to avoid coupling of spurious signals into the input. Any
external component (e.g., a filter capacitor) connected between the converter’s input and ground should be connected
to a very clean point in the ground plane.
(Continued)
The CLOCK line should be series terminated at the clock
source in the characteristic impedance of that line if the clock
line is longer than
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where tr is the clock rise time and tprop is the propagation rate
of the signal along the trace. Typical tprop is about 150
ps/inch (59 ps/cm) on FR-4 board material.
If the clock source is used to drive more than just the
ADC08200, the CLOCK pin should be a.c. terminated with a
series RC to ground such that the resistor value is equal to
the characteristic impedance of the clock line and the capacitor value is
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Figure 5 gives an example of a suitable layout. All analog
circuitry (input amplifiers, filters, reference components, etc.)
should be placed together away from any digital components.
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Where L is the length of the clock line in inches.
This termination should be located as close as possible to,
but within one centimeter of, the ADC08200 clock pin.
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where tPD is the signal propagation rate down the clock line,
"L" is the line length and ZO is the characteristic impedance
of the clock line. This termination should be located as close
as possible to, but within one centimeter of, the ADC08200
clock pin. Further, this termination should be close to but
beyond the ADC08200 clock pin as seen from the clock
source. Typical tprop is about 150 ps/inch on FR-4 board
material. For FR-4 board material, the value of C becomes
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5.0 LAYOUT AND GROUNDING
Proper grounding and proper routing of all signals are essential to ensure accurate conversion. A combined analog
and digital ground plane should be used.
Coupling between the typically noisy digital circuitry and the
sensitive analog circuitry can lead to poor performance that
may seem impossible to isolate and remedy. The solution is
to keep all lines separated from each other by at least six
times the height above the reference plane, and to keep the
analog circuitry well separated from the digital circuitry.
The DR GND connection to the ground plane should not use
the same feedthrough used by other ground connections.
High power digital components should not be located on or
near a straight line between the ADC or any linear component and the power supply area as the resulting common
return current path could cause fluctuation in the analog
input “ground” return of the ADC.
Generally, analog and digital lines should cross each other at
90˚ to avoid getting digital noise into the analog path. In high
frequency systems, however, avoid crossing analog and
digital lines altogether. Clock lines should be isolated from
ALL other lines, analog AND digital. Even the generally
accepted 90˚ crossing should be avoided as even a little
coupling can cause problems at high frequencies. Best performance at high frequencies is obtained with a straight
signal path.
6.0 DYNAMIC PERFORMANCE
The ADC08200 is a.c. tested and its dynamic performance is
guaranteed. To meet the published specifications, the clock
source driving the CLK input must exhibit less than 2 ps
(rms) of jitter. For best a.c. performance, isolating the ADC
clock from any digital circuitry should be done with adequate
buffers, as with a clock tree. See Figure 6.
It is good practice to keep the ADC clock line as short as
possible and to keep it well away from any other signals.
Other signals can introduce jitter into the clock signal. The
clock signal can also introduce noise into the analog path.
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FIGURE 6. Isolating the ADC Clock from Digital
Circuitry
7.0 COMMON APPLICATION PITFALLS
Driving the inputs (analog or digital) beyond the power
supply rails. For proper operation, all inputs should not go
more than 300 mV below the ground pins or 300 mV above
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ADC08200
Applications Information
ADC08200
Applications Information
Using an inadequate amplifier to drive the analog input.
As explained in Section 2.0, the capacitance seen at the
input alternates between 3 pF and 4 pF with the clock. This
dynamic capacitance is more difficult to drive than is a fixed
capacitance, and should be considered when choosing a
driving device.
Driving the VRT pin or the VRB pin with devices that can
not source or sink the current required by the ladder. As
mentioned in Section 1.0, care should be taken to see that
any driving devices can source sufficient current into the VRT
pin and sink sufficient current from the VRB pin. If these pins
are not driven with devices than can handle the required
current, these reference pins will not be stable, resulting in a
reduction of dynamic performance.
Using a clock source with excessive jitter, using an
excessively long clock signal trace, or having other
signals coupled to the clock signal trace. This will cause
the sampling interval to vary, causing excessive output noise
and a reduction in SNR performance. The use of simple
gates with RC timing is generally inadequate as a clock
source.
(Continued)
the supply pins. Exceeding these limits on even a transient
basis may cause faulty or erratic operation. It is not uncommon for high speed digital circuits (e.g., 74F and 74AC
devices) to exhibit undershoot that goes more than a volt
below ground. A 51Ω resistor in series with the offending
digital input will usually eliminate the problem.
Care should be taken not to overdrive the inputs of the
ADC08200. Such practice may lead to conversion inaccuracies and even to device damage.
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Attempting to drive a high capacitance digital data bus.
The more capacitance the output drivers must charge for
each conversion, the more instantaneous digital current is
required from VDR and DR GND. These large charging current spikes can couple into the analog section, degrading
dynamic performance. Buffering the digital data outputs (with
a 74AF541, for example) may be necessary if the data bus
capacitance exceeds 5 pF. Dynamic performance can also
be improved by adding 47Ω to 56Ω series resistors at each
digital output, reducing the energy coupled back into the
converter input pins.
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NOTES: UNLESS OTHERWISE SPECIFIED
REFERENCE JEDEC REGISTRATION mo-153, VARIATION AD, DATED 7/93.
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24-Lead Package TC
Order Number ADC08200CIMT
NS Package Number MTC24
技
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the right at any time without notice to change said circuitry and specifications.
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1. Life support devices or systems are devices or systems
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ADC08200 8-Bit, 20 MSPS to 200 MSPS, 1.05 mW/MSPS A/D Converter with Internal
Sample-and-Hold
Physical Dimensions