AT30TSE002A - Complete

AT30TSE002A
Integrated Temperature Sensor with SEEPROM
DATASHEET
Features
 Integrated Temperature Sensor (TS) + 2Kb Serial EEPROM
 Standard voltage operation

Optimized for voltage range: 2.7V to 3.6V
 100khz and 400khz compatibility
2
 2-wire serial interface: I C/SMBus™ compatible

SMBus Timeout supported
 Schmitt Trigger, filtered inputs for noise suppression
 Industry standard green (Pb/Halide-free/RoHS compliant) package options

8-lead Very Very Thin DFN (2 x 3 x 0.8mm)
Serial EEPROM Features
 Permanent and reversible software write protection for the first-half of the array

Software procedure to verify write protect status
 Internally organized as one block of 256-bytes (256 x 8)
 Supports byte and Page Write operation

Write 1, 2, 3, and up to 16 bytes at a time
 Self-timed write cycle (5ms max)
 High-reliability


Endurance: 1 million write cycles
Data retention: 100 years
 Low operating current


EEPROM write ~1.5mA (typical)
EEPROM read ~ 0.2mA (typical)
Temperature Sensor Features
 11-bit ADC temp-to-digital converter with 0.125°C resolution
 Programmable hysteresis threshold: off, 0°C, 1.5°C, 3°C, and 6 °C
 Accuracy
±0.5°C (typ.) for +75°C to +95°C
±1.0°C (typ.) for +20°C to +110°C
 ±2.0°C (typ.) for -20°C to +125°C


 Low operating current

Temperature sensor active ~ 0.2mA (typical)
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
Figure 1.
Pin Configuration
Pin
Function
A0, A1, A2
Address Inputs
SDA
Serial Data
SCL
1.
Serial Clock Input
Temperature Alert
EVENT
GND
Ground
VCC
Power Supply
8-WDFN
VCC
EVENT
SCL
SDA
8
1
7
2
6
3
5
4
A0
A1
A2
GND
Bottom view
Description
Atmel® AT30TSE002A is a combination Serial EEPROM and temperature sensor device containing 2048-bits of Serially
Electrically Erasable and Programmable Read-Only Memory (EEPROM) organized as 256-bytes of eight bits each and
could be used to store memory module and vendor information. The EEPROM operation is tailored specifically for DRAM
Memory Modules Serial Presence Detect (SPD). The first 128-bytes of the memory incorporate a permanent and a
Reversible Software Write Protection (WP) feature. Once the Permanent Software WP is enabled, by sending a special
command, it cannot be reversed; however, once the reversible software WP is enabled, it can be reversed by sending a
special command.
The integrated temperature sensor converts temperatures from -20°C to +125°C to a digital word and provides an
accuracy of ±1.0°C (max.) for the temperature range +75°C to +95°C. The temperature sensor continuously monitors
temperature and updates data in the temperature register at least eight times per second. Temperature data is latched
internally by the device and may be read by software via a microcontroller at anytime. The AT30TSE002A has flexible
user programmable internal registers to configure the temperature sensor performance and response to over
temperature conditions. The device contains programmable high, low, and critical temperature limits. The device EVENT
pin is configured as active low and can be configured to operate as an interrupt or as a comparator output. Manufacturer
and Device ID Registers provide the ability to confirm the identity of the device. The AT30TSE002A supports the industry
standard 2-wire I2C/ SMBus serial interface to include time out feature to help prevent system lock-ups.
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AT30TSE002A [DATASHEET]
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2.
Absolute Maximum Ratings*
Temperature under Bias . . . . . . . -40°C to +125°C
Storage Temperature . . . . . . . . . -65°C to +150°C
Supply voltage
with respect to ground . . . . . . . . . . . -0.5V to +4.3V
A0 Pin . . . . . . . . . . . . . . . . . . . . . . -0.5V to +12.0V
All other input voltages
with respect to ground . . . . . . . -0.5V to VCC + 0.5V
EVENT Pin . . . . . . . . . . . . . . . -0.5V to VCC + 0.3V
All other output voltages
with respect to ground . . . . . . . -0.5V to VCC + 0.5V
*Notice: Stresses beyond those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
Functional operation of the device at these ratings or
any other conditions beyond those indicated in the
operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect device reliability. Voltage
extremes referenced in the “Absolute Maximum
Ratings” are intended to accommodate short duration
undershoot/overshoot conditions and does not imply or
guarantee functional device operation at these levels for
any extended period of time.
Pull-up voltages applied to the EVENT pin that exceed
the “Absolute Maximum Ratings” may forward bias the
ESD protection circuitry. Doing so may result in
improper device function and may corrupt temperature
measurements.
AT30TSE002A [DATASHEET]
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3
3.
Block Diagram
Serial EEPROM
Temperature Sensor
Selected Resolution
H.V Pump/Timing
Temp. Range
Capability
Accuracy
Configuration
EEPROM Write
Protected Section
(00h-7Fh)
X Address
Decoder
EEPROM
Second Half
(80h-FFh)
Output Feature
Critical Alarm Trip
EVENT Shutdown
Device ID
SMBus
Manufacturer ID
Temperature
A/D
Converter
Upper Alarm Trip
Y Address Decoder
Memory
Control Logic
Lower Alarm Trip
Band Gap
Temperature
Sensor
Write Protect Circutry
SMBus Timeout
Pointer
Register
Serial
Control Logic
VCC
4
GND
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
I2C / SMBus
Interface
SCLK SDA
EVENT A0
A1
A2
4.
Pin Description
AT30TSE002A requires no external components for operation except for pull-up resistors on SCL, SDA, and EVENT
pins. In order to provide effective noise protection and filtering, it is recommended that a decoupling capacitor of 0.1F be
used and is located as close as possible to the device between VCC and ground pins.
Serial Clock (SCL): The SCL input is used to positive edge clock data into each EEPROM device and negative edge
clock data out of each device.
Serial Data (SDA): The SDA pin is bidirectional for serial data transfer. This pin is open drain driven and may be
wire-ORed with any number of other open-drain or open collector devices.
Device Addresses (A2, A1, A0): The A2, A1, and A0 pins are device address inputs that are hardwired (directly to GND
or to VCC) for compatibility with 2-wire devices. When the pins are hardwired, as many as eight devices may be
addressed on a single bus system. A device is selected when a corresponding hardware and software match is true. If
these pins are left floating, the A2, A1, and A0 pins will be internally pulled to GND; however, Atmel recommends always
connecting the address pins to a known state by direct connection to ground or VCC, but if using a pull-up resistor, Atmel
recommends using 10k or less.
The A0 pin is also overvoltage tolerant, allowing up to 10V for software write protection functionality. (See Section 6.
through Section 9.)
Temperature Alert Output (EVENT): The EVENT pin outputs a signal when the temperature goes beyond the
user-programmed temperature limits and be configured in one of three modes; either Interrupt, Comparator, or Critical
Alarm modes.
The EVENT pin is an open-drain output and requires a pull-up resistor for proper operation (see Section 10.).
4.1
Pin Capacitance(1)
Applicable over recommended operating range from TA = 25°C, f = 100 kHz, VCC = +3.0V.
Symbol
Test Condition
CI/O
CIN
Note:
1.
Max
Units
Conditions
Input/output Capacitance (SDA), EVENT
8
pF
VI/O = 0V
Input Capacitance (A0, A1, A2, and SCL)
6
pF
VIN = 0V
This parameter is ensured by characterization only.
AT30TSE002A [DATASHEET]
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5
4.2
DC Characteristics
Applicable over recommended operating range: TA = -20°C to +125°C, VCC = +2.7v to +3.6V (unless otherwise noted).
Symbol
Parameter
VCC1
Supply Voltage
Test Condition
Min
Typ
2.7
Max
Units
3.6
V
Supply Current
EEPROM Read VCC = 3.6V(2)
100kHz
0.4
1.0
EEPROM Write VCC = 3.6V(2)
100kHz
1.5
3.0
Temp. Sensor VCC = 3.6V
EEPROM Inactive
0.2
0.5
Timeout Active VCC = 3.6V
EEPROM Inactive,
Temp. Sensor Shutdown
0.2
0.5
ISB
Standby Current VCC = 3.6V(3)
Vin = VHV = or VSS
1.6
4.0
μA
ILI
Input Leakage Current
Vin = VHV = or VSS
0.1
2.0
μA
ILO
Output Leakage Current
Vin = VHV = or VSS
0.1
2.0
μA
VIL
Input Low Level(1)
-0.6
VHV x 0.3
V
VIH
Input High Level(1)
VHV x0.7
VHV + 0.5
V
VOL
Output Low level VCC = 3.0V
IOL = 2.1mA
0.4
V
VHV
High Voltage Input A0
Pin = A0;
VHV - VCC  4.8V
10.0
V
VHYST
Input Hysteresis (SDA, SCL)
ICC
Notes: 1.
6
VIL min and VIH max are reference only and are not tested.
2.
Sensor in shutdown mode.
3.
EEPROM inactive; sensor in shutdown mode.
AT30TSE002A [DATASHEET]
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7.0
0.05 x VCC
mA
V
4.3
AC Characteristics
Applicable over recommended operating range:
TA = –20°C to +125°C, VCC = +2.7V to +3.6V, CL = 1 TTL Gate and 100μF (unless otherwise noted).
Symbol
Min
(2)
Max
Min
Max
Units
100
(2)
400
kHz
FSCL
Clock Frequency, SCL
10
TLOW
Clock Pulse Width Low
4.7
1.2
us
THIGH
Clock Pulse Width High
4.0
0.6
us
TR
Inputs Rise Time(1)
(1)
10
1.0
0.3
us
300
300
ns
TF
Inputs Fall Time
TSU.DAT
Data In Set-up Time
200
100
ns
THD.DI
Data In Hold Time
0.0
0.0
us
THD.DAT
Data Out Hold Time
200
TBUF
Time the bus must be free before a new
transmission can start(1)
4.7
1.2
us
TSU.STA
Start Set-up Time
4.7
0.6
us
THD.STA
Start Hold Time
4.0
0.6
us
TSU.STO
Stop Set-up Time
4.7
0.6
us
TI
Noise Suppression Time(1)
TOUT
SMBus Timeout Time
TWR
Write Cycle Time
EEPROM
Endurance(1)
25°C, Page Mode
Notes: 1.
2.
4.4
Parameter
3450
200
100
25
35
25
5.0
900
ns
50
ns
35
ms
5.0
ms
Write
Cycles
1,000,000
This parameter is ensured by characterization only.
The minimum frequency is specified at 10kHz to avoid activating the timeout feature.
Temperature Sensor Characteristics
Applicable over recommended operating range: TA= -20°C to +125°C, VCC = 2.7V to 3.6V (unless otherwise noted).
Symbol
TACC
Parameter
TS Accuracy
Test Condition
Min
Typ
Max
+75°C < Ta < +95°C
±0.500
+1.000
+20°C < Ta < +110°C
±1.000
+2.000
-20°C < Ta < +125°C
±2.000
+3.000
125.000
TCONV
TS Conversion Time
75.000
TRES
TS Resolution
0.125
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
Units
°C
ms
°C
7
5.
Memory Organization
AT30TSE002A, 2K Serial EEPROM: The 2K memory is internally organized with 16 pages of 16-bytes each. Random
word addressing requires an 8-bit data word address.
6.
Device Operation
Clock and Data Transitions: The SDA pin is normally pulled high with an external device. Data on the SDA pin may
change only during SCL low time periods. (See Figure 6-4) Data changes during SCL high periods will indicate a Start or
Stop condition as defined below.
Start Condition: A high-to-low transition of SDA with SCL high is a Start condition which must precede any other
command (see Figure 6-5).
Stop Condition: A low-to-high transition of SDA with SCL high is a Stop condition. After a Read sequence, the Stop
command will place the device in a standby power mode (see Figure 6-5).
Acknowledge: All addresses and data words are serially transmitted to and from the EEPROM in 8-bit words. The
device sends a zero to acknowledge that it has received each word. This happens during the ninth clock cycle.
Standby Mode: The AT30TSE002A features a low-power standby mode which is enabled:
a.
Upon power-up.
b.
After the receipt of the Stop bit and the completion of any internal operations. The temperature sensor must be
disabled by the user for low-power standby mode.
2-wire Software Reset: After an interruption in protocol, power loss or system reset, any 2-wire part can be reset by
following these steps:
1.
Create a Start bit condition.
2.
Clock nine cycles.
3.
Create another Start bit followed by Stop bit condition as shown below.
The device is ready for next communication after the above steps have been completed.
Figure 6-1. 2-wire Software Reset
Start Bit
SCL
1
SDA
8
Start Bit
Dummy Clock Cycles
AT30TSE002A [DATASHEET]
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2
3
8
9
Stop Bit
Figure 6-2. Bus Timing SCL — Serial Clock SDA: Serial Data I/O
tHIGH
tLOW
SCL
tHD:STA
tBUF
tSU:STO
SDA IN
tSU:STA
SDA
Input
tHD:DI
SDA
Change
tSU:DAT
Stop
Condition
Start
Condition
SCL
tHD:DAT
SDA OUT
Data Valid
Figure 6-3. Write Cycle Timing SCL — Serial Clock SDA: Serial Data I/O
SCL
tSU:STO
tSU:STA
SDA OUT
tW
Stop
Condition
Write
Cycle
Start
Condition
AT30TSE002A [DATASHEET]
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9
Figure 6-4. Data Validity
SDA
SCL
Data Stable
Data Stable
Data
Change
Figure 6-5. Start and Stop Condition
SDA
SCL
Start
Stop
Figure 6-6. Output Acknowledge
1
SCL
8
9
DATA IN
DATA OUT
Start
10
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Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
Acknowledge
7.
Device Addressing
AT30TSE002A device requires an 8-bit device address word following a Start condition to enable the chip to access
either the Temperature Sensor or EEPROM functions (See Table 7-1).
Table 7-1.
Control/Device Address Word
Control / Device Address Word
Device ID
Device
Device Address Bits
B7
B6
B5
B4
EEPROM
1
0
1
0
Temperature Sensor
0
0
1
1
EEPROM Write Protection
0
1
1
0
Note:
1.
R/W
A2
A1
A0
B0
X
X
X
X
X = User Selectable
The EEPROM device address word consists of a mandatory one-zero sequence for the first four most significant bits
(‘1010’) for normal Read and Write operations, a ‘0110’ for writing to the EEPROM Write Protect Register, and ‘0011’ for
Temperature Sensor operations. The next three bits are the A2, A1, and A0 device address bits for the AT30TSE002A
device. These three bits must match their corresponding hard-wired input pins. The eighth bit of the device address is the
Read/Write operation select bit. A Read operation is initiated if this bit is high and an EEPROM Write operation is
selected if this bit is low. Upon a compare of the device address, the device will output a zero, called an Acknowledge
(ACK). If a compare is not made, the chip will not ACK and will return to a standby state. The EEPROM will not ACK if the
Write Protect Register has been programmed and the control code is ‘0110’.
8.
EEPROM Write Operations
Byte Write: A Write operation requires an 8-bit data word address following the device address word and ACK. Upon
receipt of this address, the EEPROM will again respond with an ACK and then clock in the first 8-bit data word. Following
receipt of the 8-bit data word, the EEPROM will output an ACK and the addressing device, such as a microcontroller,
must terminate the Write sequence with a Stop condition. At this time the EEPROM enters an internally timed write cycle,
tWR, to the nonvolatile memory. All inputs are disabled during this write cycle and the EEPROM will not respond until the
write is complete (see Figure 13-2 and Figure 13-3).
The device will acknowledge a Write command, but not write the data, if the Software Write Protection has been enabled.
The write cycle time must be observed even when the Write Protection is enabled.
Page Write: The 2K EEPROM device is capable of 16-byte Page Write. A Page Write is initiated the same as a Byte
Write, but the microcontroller does not send a Stop condition after the first data word is clocked in. Instead, after the
EEPROM acknowledges receipt of the first data word, the microcontroller can transmit up to fifteen more data words. The
EEPROM will respond with a zero after each data word received. The microcontroller must terminate the Page Write
Sequence with a Stop condition (see Figure 13-3). The data word address lower four bits are internally incremented
following the receipt of each data word. The higher data word address bits are not incremented, retaining the memory
page row location. When the word address, internally generated, reaches the page boundary, the following byte is placed
at the beginning of the same page. If more than sixteen data words are transmitted to the EEPROM, the data word
address will roll-over and previous data will be overwritten. The address roll-over during Write is from the last byte of the
current page to the first byte of the same page. The device will acknowledge a Write command, but not write the data, if
the Software Write Protection has been enabled. The write cycle time must be observed even when the Write Protection
is enabled.
Acknowledge (ACK) Polling: Once the internally-timed write cycle has started and the EEPROM inputs are disabled,
ACK polling can be initiated. This involves sending a Start condition followed by the device address word. The
Read/Write bit is representative of the operation desired. Only if the internal write cycle has completed will the EEPROM
respond with a zero allowing the Read or Write sequence to continue.
AT30TSE002A [DATASHEET]
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9.
EEPROM Write Protection
The device supports Permanent and Reversible Software Write Protection and once enabled, Write protects the first-half
of the array (00H – 7FH).
Permanent Software Write Protection: The Software Write Protection is enabled by sending a command similar to a
normal Write command; to the device which programs the Permanent Write Protect Register. The Write Protect Register
is programmed by sending a Write command with the device address of ‘0110’ with the address and data bit being don’t
cares (see Figure 12-5 and Table 12-1). Once the Software Write Protection has been enabled, the device will no longer
acknowledge the ‘0110’ control byte. The Software Write Protection cannot be reversed even if the device is powered
down. The write cycle time must be observed.
Reversible Software Write Protection: The Reversible Software Write Protection is enabled by sending a command,
similar to a normal Write command; to the device which programs the Reversible Write Protect Register. The Write
Protect Register is programmed by sending a Write command ‘01100010’ with pins A2 and A1 tied to ground or no
connect and pin A0 connected to VHV (see Figure 12-6 and Table 12-1). The Reversible Write Protection can be reversed
by sending a command ‘01100110’ with pin A2 tied to ground or no connect, pin A1 tied to VCC, and pin A0 tied to VHV (see
Figure 12-6 and Table 12-1).
10.
Temperature Sensor Functional Description
AT30TSE002A consists of a Delta-Sigma Analog to Digital Converter (ADC) with a band gap type temperature sensor
that monitors and updates its own temperature reading at least eight times per second converting the readings into digital
data bits and latching them into a temperature register that can be read via 2-wire I2C/SMBus serial interface. The device
communicates over a 2-wire I2C/SMBus interface with the bus master or controller consisting of a serial clock (SCL) and
serial bidirectional data bus (SDA) with clock frequencies up to 400Khz. The bus master or controller generates the SCL
signal and is used by the AT30TSE002A to receive and send serial data on the SDA line with the most significant bit
transferred first. A pull-up resistor is required on the SDA pin since it has an open drain configuration.
10.1
EVENT Output
The EVENT pin has three operating modes depending on configuration settings. They are:

Interrupt mode

Comparator mode

Critical Alarm (Crit_Alarm) mode
In the Interrupt mode, once a temperature reaches a boundary limit, the AT30TSE002A asserts the EVENT pin. The
EVENT pin will remain asserted until software clears the interrupt by writing a Logic 1 to the EVTCLR bit five in the
Configuration Register. When the temperature drops below specified limits, the device returns back to either interrupt or
comparator mode as programmed in the Configuration Register’s EVTMOD bit zero.
In the comparator mode, the EVENT pin remains asserted until the error condition that caused the pin to be asserted no
longer exists and the EVENT pin will clear itself. In the Crit_Alarm mode, when the measured temperature exceeds
Crit_Alarm trip limit, the EVENT pin will remain asserted until the temperature drops below Crit_Alarm limit minus
hysteresis (See Figure 11-1). All event thresholds use hysteresis as programmed in the Configuration Register.
10.2
Alarm Window
The alarm window consists of the Upper Alarm Trip Register and Lower Alarm Trip Register. The Upper Alarm Trip
Register holds the upper temperature trip point and the Lower Alarm Trip Register holds the lower temperature trip point.
After the EVENT pin control is enabled, the EVENT output will be triggered upon entering and exiting from this window.
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10.3
Temperature Sensor Power-On Default
The AT30TSE002A has an internal Power-On Reset (POR) circuit. When the supply voltage drops below the POR
threshold, the device will reset to the following power-on default conditions:
10.4

Sensor starts monitoring temperature continuously.

Address Pointer Register = 00h.

Upper/Lower Alarm Trip registers and Crit_Alarm registers are set to 0°C.

EVENT Register cleared and pulled high by external pull up resistor.

Operational mode is comparator.

EVENT hysteresis is 0°C.

SMBus Register =00h.
Device Initialization
The AT30TSE002A Temperature Sensor has programmable registers that, upon device power-on, are initialized to zero.
Table 11-1 shows the Power-On register default values. The EVENT output is defaulted to deasserted state and
comparator mode.
The Upper Alarm Trip, Lower Alarm Trip, Critical Alarm Trip, and Configuration Registers need to be
programmed to desired values before temperature sensor can properly function.
10.5
SMBus Timeout
The AT30TSE002A supports the SMBus timeout feature for temperature sensor operations if enabled via setting the
SMBus Register (see Section 11.10). This feature helps prevent potential system bus hang-ups by resetting the serial
interface if SCL stays low for a time specified by the tOUT parameter. This requires a minimum SCL clock speed of 10kHz
as specified in the SMBus specification to avoid any timeout issues.
AT30TSE002A [DATASHEET]
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13
11.
Register Descriptions
This section describes all the temperature sensor registers that are used in AT30TSE002A. The AT30TSE002A has
several registers that are user accessible and or programmable and used for latching temperature readings, storing high
and low temperature limits, configuring the hysteresis threshold, and reporting status.
These registers include the Capability Register, Upper Alarm Trip Register, Lower Alarm Trip Register, Critical Alarm Trip
Register, Temperature Register, Manufacturer Identification Register, Device Identification Register, and SMBus
Register. The AT30TSE002A uses an 8-bit Pointer Register to access these registers and all other registers contain
16-bits.
Table 11-1 indicates the Write/Read access capability of each register. Reading from a Write-Only Register will result in
reading zero data and writing to Read-Only Register will have no impact even though the Write sequence was
acknowledged by the device.
Table 11-1. Register Summary
Register
Read/Write
Register Name
Section
Power-up Default
Register Data (hex)
N/A
W
Address Pointer
11.1
00h
00h
R
Capability
11.2
00F7h
01h
R/W
Configuration
11.3
0000h
02h
R/W
Upper Alarm Trip
11.4
0000h
03h
R/W
Lower Alarm Trip
11.5
0000h
04h
R/W
Critical Alarm Trip
11.6
0000h
05h
R
Temperature Data
11.7
N/A
06h
R
Manufacturer I.D.
11.8
001Fh
07h
R
Device I.D./Device Revision
11.9
8201h
N/A
0000h
11.10
0000h
N/A
0000h
Address (hex)
08h to 21h
R/W
Reserved(1)
22h
R/W
SMBus Timeout
23h to FFh
R/W
Reserved(1)
Note:
14
1.
Write operations to reserve registers should be avoided as it may cause undesirable results.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
11.1
Address Pointer Register
The AT30TSE002A uses a Pointer Register to select and access the 16-bit data registers shown in Table 11-1. The
Pointer Register is an 8-bit Write-Only Register (See Table 11-2). The power-on default value is 00h which is the address
location for the Capability Register.
Table 11-2. Address Pointer Register
Bit
7
6
5
4
Symbol
11.2
3
2
1
0
Pointer Bits
R/W
W
W
W
W
W
W
W
W
Default Value
0
0
0
0
0
0
0
0
Capability Register (16-bit Read Only, Address = 00h)
AT30TSE002A is capable of measuring temperature with ±1°C over the active range and ±2°C over the monitor range.
This register is a 16-bit Read-Only Register used to specify the capabilities of the temperature sensor. The Capability
Register functions are described in Table 11-3 and Table 11-4.
Table 11-3. Capability Register Bit Distribution
Bit
15
14
13
12
Symbol
11
10
9
8
RFU
Default Value
0
0
0
0
0
0
0
0
R/W Access
R
R
R
R
R
R
R
R
7
6
5
4
3
2
1
0
EVSD
TMOUT
VHV
RANGE
SACC
ICAP
Default Value
1
1
1
1
0
1
1
1
R/W Access
R
R
R
R
R
R
R
R
Bit
Symbol
TPRES
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
15
Table 11-4. Capability Register Bit Description
Bit
15:8
Symbol
Description
RFU
Reserved for Future Use. Must be zero.
Event Output Status during shutdown mode:
7
EVSD
1 = The EVENT pin output is deasserted (not driven) when entering shutdown mode and will resume
status update immediately upon exiting shutdown.
In addition, the EVTSTS bit in the Configuration Register will be cleared when entering shutdown mode
and will resume status update immediately upon exiting shutdown.
6
TMOUT
5
VHV
4:3
TPRES
2
RANGE
Bus Timeout:
1 = Supported within the SMBus compatible range 25 to 35ms (power-up default).
High Voltage Support for A0 pin:
1 = A0 pin supports a voltage up to 10V (power-up default).
Temperature Resolution:
10 = Supports 0.125°C
1 = Can read temperatures below 0°C and sets appropriate sign bit.
Supported Accuracy:
11.3
1
SACC
0
ICAP
1 = Supports accuracy of ±1°C (max.) over the range (75°C to 95°C) and ±3°C (max.) over the range
(-20°C to 125°C).
Interrupt Capability:
1 = Has alarm and critical trip interrupt capability.
Configuration Register (16-bit Read/Write, Address = 01h)
The AT30TSE002A contains a 16-bit Configuration Register allowing the user to set key operational features of the
Temperature Sensor. The Configuration Register functions are described in Table 11-5, Table 11-6, and Figure 11-1.
Table 11-5. Configuration Register Bit Distribution
Bit
15
14
Symbol
12
11
10
RFU
9
HYSTENB
8
SHTDWN
Default Value
0
0
0
0
0
0
0
0
R/W Access
R
R
R
R
R
R/W
R/W
R/W
7
6
5
4
3
2
1
0
CRTALML
WINLOCK
EVTCLR
EVTSTS
EVTOUT
CRITEVT
EVTPOL
EVTMOD
Default Value
0
0
0
0
0
0
0
0
R/W Access
R/W
R/W
W
R
R/W
R/W
R/W
R/W
Bit
Symbol
16
13
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
Table 11-6. Configuration Register Bit Description
Bit
15:11
Symbol
Description
RFU
Reserved for Future Use and must be zero.
Hysteresis Enable:
00 = 0°C Disable Hysteresis (default power-on condition)
01 = 1.5°C Enable Hysteresis
10 = 3.0°C Enable Hysteresis
11 = 6.0°C Enable Hysteresis
10:9
HYSTENB
The purpose of these bits is to control the hysteresis applied to the alarm trip point boundaries. The
above hysteresis applies to all limits when temperature drops below the user specified alarm trip
points.
Note:
Hysteresis applies to decreasing temperature only. Once ambient temperature is above
a given threshold, it must drop below the boundary limit minus hysteresis in order for a
comparator EVENT to be cleared.
Example:
If these bits are set to ‘01’ for 1.5°C and the Upper Alarm Trip limit is set to 85°C, as
temperature rises above 85°C, bit 14 of temperature register will be set to a Logic 1. Bit
14 will remain set until the ambient temperature drops below the threshold (85°C)
minus the hysteresis value or 83.5°C.
Note:
Hysteresis is also applied to the EVENT pin functionality. When either of the Crit_Alarm
Trip or Alarm Window lock bits is set, this bit cannot be altered until unlocked.
Shutdown Mode:
0 = Temperature sensor enabled for continuous conversion (power-on default).
1 = Temperature sensor disabled.
8
SHTDWN
In shutdown mode, the temperature sensor is not active and will not generate interrupts or update
temperature data. The EVENT pin is deasserted (not driven).
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered until
unlocked.
Crit_Alarm Trip Lock bit:
Locks the Critical Alarm Trip Register from being updated.
7
CRTALML
0 = Crit_Alarm Trip Register can be updated (power-on default).
1 = Crit_Alarm Trip Register is locked and cannot be updated.
Once set, it can be only be cleared to zero by internal POR which occurs when the device is powered
off and then powered on.
Alarm Window Lock bit:
0 = Upper and Lower Alarm Trip Registers can be updated (Power-on default).
6
WINLOCK
1 = Upper and Lower Alarm Trip Registers are locked and cannot be updated.
Once set, it can be only be cleared to zero by internal POR when device is powered off then powered
on.
EVENT Clear: This bit is a write only bit and will read zero.
This bit can clear the EVENT pin after it has been enabled and is self clearing.
5
EVTCLR
0 = has no effect (power-on default).
1 = clears (releases) the active EVENT pin in interrupt mode. This bit is ignored when in comparator
mode.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
17
Table 11-6. Configuration Register Bit Description (Continued)
Bit
Symbol
Description
EVENT Pin Output Status:
0 = The EVENT Output is not asserted by the device (power-on default).
4
EVTSTS
1 = The EVENT Output is asserted due to an alarm trip condition.
Note:
This bit will be cleared when entering shutdown mode and will resume status update
immediately upon exiting shutdown.
EVENT Output Control:
This bit, when set, prevents the EVENT pin from generating an interrupt.
0 = The EVENT output is disabled and will not generate interrupts (power-on default).
3
EVTOUT
1 = The EVENT output is enabled.
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered until
unlocked.
Note:
Please see note below for the recommended sequence for setting this bit.
Critical Temperature Only:
0 = The EVENT output is asserted for the Upper, Lower, and Critical Alarms (power-on default).
2
CRITEVT
1 = The EVENT output is asserted for only Critical Alarm when ambient temperature > Crit_Alarm trip
boundary.
When the Alarm Window lock bit is set, this bit cannot be altered until unlocked.
Note:
Please see note below for the recommended sequence for setting this bit.
EVENT Polarity:
0 = Active Low (power-on default). A pull-up resistor is required on this pin to set inactive state.
1
EVTPOL
1 = Active High.
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered until
unlocked
EVENT Mode:
0 = The EVENT pin will operate in Comparator mode (power-on default).
0
EVTMOD
1 = The EVENT pin will operate in Interrupt mode.
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered until
unlocked.
Note:
Any JEDEC TSE2002av compliant temperature sensor can be configured to report an over temperature limit condition
to the Host system via its EVENT pin. These temperature sensors have the default value for all temperature alarm
thresholds set at 0C. Often, if a system designer determines to utilize only the Critical Alarm temperature threshold to
trigger an Event, it is likely he/she would only setup the Critical Alarm temperature threshold to a proper value while
leaving the Upper Alarm temperature threshold unchanged at the default (0C). Due to some ambiguity in the
TSE2002av specification, it is possible a temperature sensor can process bit 3 (Event Output Control) of the
Configuration Register first while others process bit 2 (Critical Temperature only) first from the Configuration
Register. If both bits are set to Logic 1 state concurrently and bit 3 is processed first, the Event output would be
enabled before learning the Upper Alarm temperature threshold should be ignored. Since the Upper Alarm
temperature threshold is often left unchanged at 0C (if it is not used), and if the temperature sensor operates in
a greater than 0C environment, it naturally outputs an Event condition. Sometime later, after bit 2 is also
processed, the temperature sensor would ignore the Upper Alarm temperature threshold and deassert the Event
output if the ambient temperature has not exceeded the Critical Alarm temperature threshold; however, for a
system that triggers action off this Event output, this correction has arrived too late. To remedy this ambiguity in
the TSE2002av specification, one must avoid setting both bit 2 and bit 3 of the Configuration Register to a
Logic 1 concurrently. Instead, Atmel recommends using a two step programming process to set bit 2 first
followed by bit 3 in separate commands if the system is designed to only trigger off the Critical Alarm
temperature threshold.
18
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
Figure 11-1. EVENT Pin Mode Functionality
Crit_Alarm
Upper Alarm
Measured
Temperature
Lower Alarm
Software Resets Interrupt
EVENT pin in
“Interrupt Mode”
(Active Low)
Switches to
Comparator
Mode
EVENT pin in
“Comparator”
(Active Low)
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
19
11.4
Upper Alarm Trip Register (16-bit Read/Write, Address = 02h)
The Upper Alarm Trip Register holds the user programmed upper temperature boundary trip point in 11-bit twos
complement format (0.25°C resolution) that can be used to monitor ambient temperature in an operating window (See
Table 11-7 and Table 11-8). When the temperature increases above this trip point, or drops below, or is equal to the trip
point (minus any hysteresis set), then the EVENT pin is asserted (if enabled). This register becomes read-only if the
Alarm Window Lock bit (WINLOCK) bit six in the Configuration Register is set to a Logic 1.
Table 11-7. Upper Alarm Trip Register Bit Distribution
Bit
15
Symbol
14
13
12
RFU
11
SIGN
9
8
ALMWINH
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R/W
R/W
R/W
R/W
R/W
7
6
5
4
3
2
1
0
Bit
Symbol
ALMWINH
Default Value
R/W access
RFU
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R
R
Table 11-8. Upper Alarm Trip Register Bit Description
Bit
Symbol
Description
15:13
RFU
Reserved for Future Use. Read as zero.
12
SIGN
Sign bit:
0 = Ambient temperature is greater than or equal to 0°C.
1= Ambient temperature is less than 0°C.
20
10
11:2
ALMWINH
0:1
RFU
Upper Alarm Trip temperature bits:
Represented in two’s complement format.
Reserved for Future Use. Read as zero.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
11.5
Lower Alarm Trip Register (16-bit Read/Write, Address = 03h)
The Lower Alarm Trip Register holds the user programmed lower temperature boundary trip point in 11-bit twos
complement format (0.25°C resolution) that can be used to monitor ambient temperature in an operating window (See
Table 11-9 and Table 11-10). When temperature decreases below this trip point minus any hysteresis set or increases to
meet or exceed this trip point, then the EVENT pin is asserted (if enabled).
This register becomes read-only if the Alarm Window Lock bit (WINLOCK) bit six in the Configuration Register is set to a
Logic 1.
Table 11-9. Lower Alarm Trip Register Bit Distribution
Bit
15
Symbol
14
13
12
RFU
11
10
SIGN
9
8
ALMWINL
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R/W
R/W
R/W
R/W
R/W
7
6
5
4
3
2
1
0
Bit
Symbol
ALMWINL
Default Value
R/W access
RFU
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R
R
Table 11-10. Lower Alarm Trip Register Bit Description
Bit
15:13
Symbol
Description
RFU
Reserved for Future Use. Read as zero.
Sign bit:
12
SIGN
0 = Ambient temperature is greater than or equal to 0°C.
1 = Ambient temperature is less than 0°C.
11:2
ALMWINL
0:1
RFU
Lower Alarm Trip temperature bits:
Represented in twos complement format.
Reserved for Future Use. Read as zero.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
21
11.6
Critical Alarm Trip Register (16-bit Read/Write, Address = 04h)
The Critical Alarm Trip Register holds the user programmed Critical Alarm temperature boundary trip point in
11-bit twos complement format (0.25°C resolution) that can be used to monitor ambient temperature (See Table 11-11
and Table 11-12). When the temperature increases above this trip point, the EVENT pin will be asserted (if enabled). It
will remain asserted until temperature decreases below or equal to the trip point minus any hysteresis set. This register
becomes read-only if the Critical Alarm Trip Lock Bit (CRTALML) bit 7 in the Configuration Register is set to a Logic 1.
Table 11-11. Critical Alarm Trip Register Bit Distribution
Bit
15
Symbol
14
13
12
RFU
11
SIGN
9
8
CRITEVT
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R/W
R/W
R/W
R/W
R/W
7
6
5
4
3
2
1
0
Bit
Symbol
CRITEVT
Default Value
R/W access
RFU
0
0
0
0
0
0
0
0
R/W
R/W
R/W
R/W
R/W
R/W
R
R
Table 11-12. Critical Alarm Trip Register Bit Description
Bit
Symbol
Description
15:13
RFU
Reserved for Future Use. Read as zero.
12
SIGN
Sign bit:
0 = Ambient temperature is greater than or equal to 0°C.
1 = Ambient temperature is less than 0°C.
22
10
11:2
CRITEVT
0:1
RFU
Critical Alarm Trip temperature bits:
Represented in two’s complement format.
Reserved for Future Use. Read as zero.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
11.7
Temperature Register (16-bit Read-only, Address = 05h)
The Temperature Register holds the internal temperature measurement data represented in 11-bit twos complement
word format allowing for resolution equal to 0.125°C (least significant bit). The upper three bits (15, 14, and 13) of the
temperature register indicates the trip status of the current temperature and most important, are not affected by the
status of the output of the EVENT pin (See Table 11-13 and Table 11-14).
Table 11-13. Temperature Register Bit Distribution
Bit
15
14
13
12
11
10
9
8
CRITHIGH
ALMHIGH
ALMLOW
SIGN
128°C
64°C
32°C
16°C
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R
R
R
R
R
7
6
5
4
3
2
1
0
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0.125°C
RFU
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R
R
R
R
R
Symbol
Bit
Symbol
Table 11-14. Temperature Register Bit Description
Bit
Symbol
Description
0 = Ambient temperature is less than the Critical Alarm Trip Register setting.
15
CRITHIGH
1 = Ambient temperature is greater than or equal to Critical Alarm Trip Register setting.
When this bit is set a Logic 1, it will automatically clear once the measured temperature decreases
below or is equal to the trip point minus any hysteresis set.
0 = Ambient temperature is below the Upper Alarm Trip Register setting.
14
ALMHIGH
1 = Ambient temperature is above the Upper Alarm Trip Register setting.
When the bit is set to a Logic 1, it will automatically clear once the measured temperature decreases
below or is equal to the trip point minus any hysteresis set.
0 = Ambient temperature is above the Lower Alarm Trip Register setting.
13
ALMLOW
1 = Ambient temperature is below the Lower Alarm Trip Register setting.
When the bit is set to a Logic 1, it will automatically clear once the measured temperature increases
above or is to equal to the trip point.
Sign bit:
12
SIGN
0 = Ambient temperature is greater than or equal to 0°C.
1 = Ambient temperature is less than 0°C.
Ambient Temperature bits:
11:1
TEMP
Represented in twos complement format.
The encoding of bits B11 through B2 is the same as in the Alarm Trip Registers.
0
RFU
Reserved for Future Use. Read as zero.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
23
11.7.1 Temperature Register Format
This section will clarify the temperature register format and temperature bit value assignments used for temperature for
the following registers: Upper Alarm Trip, Lower Alarm Trip, Critical Alarm Trip, and Temperature Data Registers. The
temperatures expressed in the Upper Alarm Trip, Lower Alarm Trip, Critical Alarm Trip, and Temperature Data Registers
are indicated in twos complement format. In each of the trip registers, bits 12 through bit 2 are used for temperature
settings, or in the case of the Temperature Register, holds the internal temperature measurement with bits 12 through bit
one allowing 0.125ºC resolution.
Table 11-15 indicates the Temperature Register’s assigned bit values used for temperature. Table 11-15 below shows
examples for Temperature Register bit values for various temperature readings.
Table 11-15. Temperature Register Format
Bit Position
Bit Value
12
11
10
9
8
7
6
5
4
3
2
1
0
SIGN
128°C
64°C
32°C
16°C
8°C
4°C
2°C
1°C
0.5°C
0.25°C
0.125°C
X
Table 11-16. Temperature Register Examples
Temperature Register Value Examples
Temperature
24
Binary (Bit 15 – Bit 0)
+125°C
xxx0 0111 1101 00xx
+99.75°C
xxx0 0110 0011 11xx
+85°C
xxx0 0101 0101 00xx
+39°C
xxx0 0010 0111 00xx
+15.75°C
xxx0 0000 1111 11xx
+0.25°C
xxx0 0000 0000 01xx
0°C
xxx0 0000 0000 00xx
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
11.8
Manufacturer ID Register (16-bit Read-only, Address = 06h)
This register is used to identity the manufacturer of the product. The Manufacturer ID for the AT30TSE002A is 001Fh
(See Table 11-17).
Table 11-17. Manufacturer ID Register Bit Distribution
Bit
15
14
13
Symbol
11
10
9
8
Manufacturer ID
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R
R
R
R
R
7
6
5
4
3
2
1
0
Bit
Symbol
11.9
12
Manufacturer ID
Default Value
0
0
0
1
1
1
1
1
R/W access
R
R
R
R
R
R
R
R
Device ID Register (16-bit Read-only, Address = 07h)
The upper or high order byte is used to specify the device identification and the other byte is used to specify device
revision. The Device ID for the AT30TSE002A is 8201h (See Table 11-18).
Table 11-18. Device ID Register Bit Distribution
Bit
15
14
13
12
Symbol
11
10
9
8
Device ID
Default Value
1
0
0
0
0
0
1
0
R/W access
R
R
R
R
R
R
R
R
7
6
5
4
3
2
1
0
Bit
Symbol
Device Revision
Default Value
0
0
0
0
0
0
0
1
R/W access
R
R
R
R
R
R
R
R
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
25
11.10 SMBus Register (16-bit Write/Read only, Address = 22h)
The SMBus Register allows the user to enable or disable the SMBus time out feature (See Table 11-19 and
Table 11-20).
Table 11-19. SMBus Register Bit Distribution
Bit
15
14
13
12
Symbol
11
10
9
8
RFU
Default Value
0
0
0
0
0
0
0
0
R/W access
R
R
R
R
R
R
R
R
7
6
5
4
3
2
1
0
Bit
Symbol
SMBOUT
Default Value
R/W access
RFU
0
0
0
0
0
0
0
0
R/W
R
R
R
R
R
R
R
Table 11-20. SMBus Register Bit Distribution
Bit
15:8
Symbol
Description
RFU
Reserved for Future Use. Read as zero.
SMBus Timeout:
0 = SMBus Timeout is enabled.
7
SMBOUT
1 = SMBus Timeout is disabled.
When enabled, timeout is active for temperature sensor operations.
When either of the Crit_Alarm Trip or Alarm Window lock bits is set, this bit cannot be altered until
unlocked.
6:0
26
RFU
Reserved for Future Use. Read as zero.
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
12.
TS Write Operations
Writing to the AT30TSE002A Temperature Register set is accomplished through a modified Write operation for two data
bytes. To maintain 2-Wire compatibility, the 16-bit register is accessed through a Pointer Register, requiring the Write
sequence to include an address pointer in addition to the device address. This indicates the storage location for the next
two bytes received. Table 12-1 shows an entire Write transaction on the bus.
Figure 12-1. TS Register Write Operation
S
T
A
R
T
Device
Address
0
0
1
W
R
I
T
E
Register
Pointer
S
T
O
P
Data
LSB
1 A2 A1 A0
R A
/ C
W K
12.1
Data
MSB
A
C
K
A
C
K
A
C
K
TS Read Operations
Reading data from the TS may be accomplished in one of two ways:

If the location latched in the Pointer Register is correct (for normal operation it is expected the same address will
be read repeatedly for temperature), the Read sequence may consist of a device address from the bus master
followed by two bytes of data from the device; or

The Pointer Register is loaded with the correct register address, and the data is read. The sequence to preset the
Pointer Register is shown in Figure 12-4, and the preset Pointer Read is shown in Figure 12-3. If it is desired to
read random address each cycle, the complete Pointer Write, Word Read sequence is shown in Figure 12-4.
The data byte has the most significant bit first. At the end of a Read, this device can accept either Acknowledge (ACK) or
No Acknowledge (No ACK) from the Master (No Acknowledge is typically used as a signal for the slave that the Master
has read its last byte).
Figure 12-2. Write to Pointer Register
S
T
A
R
T
Device
Address
0
0
1
W
R
I
T
E
S
T
O
P
Register
Pointer
1 A2 A1 A0
R A
/ C
W K
A
C
K
Figure 12-3. Preset Pointer Register Word Read
S
T
A
R
T
Device
Address
0
0
1
R
E
A
D
Data
MSB
S
T
O
P
Data
LSB
1 A2 A1 A0
R A
/ C
W K
A
C
K
N
O
A
C
K
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
27
Figure 12-4. 2-wire Pointer Write Register Word Read
S
T
A
R
T
W
R
I
T
E
Device
Address
0
0
1
S
T
A
R
T
Register
Pointer
1 A2 A1 A0
Device
Address
0
R A
/ C
W K
0
1
R
E
A
D
Data
MSB
1 A2 A1 A0
A
C
K
R A
/ C
W K
A
C
K
Figure 12-5. Setting Permanent Write Protect Register (PSWP)
S
T
A
R
T
SDA Line
Control Byte
Word Address
S
T
O
P
Data
0 1 1 0 A2 A1 A0 0
A
C
K
A
C
K
A
C
K
= Dummy bit
Figure 12-6. Setting Reversible Write Protect Register (RSWP)
S
T
A
R
T
SDA Line
Control Byte
0 1 1 0 0
0
Word Address
S
T
O
P
Data
1 0
A
C
K
A
C
K
A
C
K
= Dummy bit
Figure 12-7. Clearing Reversible Write Protect Register (RSWP)
S
T
A
R
T
SDA Line
Control Byte
0 1 1 0 0
1
Word Address
= Dummy bit
28
S
T
O
P
Data
1 0
A
C
K
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
S
T
O
P
Data
LSB
A
C
K
A
C
K
N
O
A
C
K
Table 12-1. EEPROM Write Protection
Pin
Preamble
R/W
Command
A2
A1
A0
B7
B6
B5
B4
B3
B2
B1
B0
Set PSWP
A2
A1
A0
0
1
1
0
A2
A1
A0
0
Set RSWP
0
0
VHV
0
1
1
0
0
0
1
0
Clear RSWP
0
1
VHV
0
1
1
0
0
1
1
0
Min
Max
Units
7
10
V
Table 12-2. VHV
VHV
Table 12-3. EEPROM Software Write Protection
R/W
Bit
Permanent Write
Protect Register
PSWP
Reversible Write
Protect Register
RSWP
Acknowledgement
from Device
1010
R
X
X
ACK
1010
W
Programmed
X
ACK
Can write to second Half (80H – FFH) only.
1010
W
X
Programmed
ACK
Can write to second Half (80H – FFH) only.
1010
W
Not
Programmed
Not
Programmed
ACK
Can write to full array.
Read PSWP
R
Programmed
X
No ACK
Stop – Indicates Permanent Write Protect
Register is programmed.
Read PSWP
R
Not
Programmed
X
ACK
Read out data don't care. Indicates PSWP
Register is not programmed.
Set PSWP
W
Programmed
X
No ACK
Stop – Indicates Permanent Write Protect
Register is programmed.
Set PSWP
W
Not
Programmed
X
ACK
Read RSWP
R
X
Programmed
No ACK
Stop – Indicates Reversible Write Protect
Register is programmed.
Read RSWP
R
X
Not
Programmed
ACK
Read out data don't care. Indicates RSWP
Register is not programmed.
Set RSWP
W
X
Programmed
No ACK
Stop – Indicates Reversible Write Protect
Register is programmed.
Set RSWP
W
X
Not
Programmed
ACK
Program Reversible Write Protect Register
(reversible).
Clear RSWP
W
Programmed
X
No ACK
Stop – Indicates Permanent Write Protect
Register is programmed.
Clear RSWP
W
Not
Programmed
X
ACK
Command
Action from Device
Program Permanent Write Protect Register
(irreversible).
Clear (unprogram) Reversible Write Protect
Register (reversible).
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
29
13.
EEPROM Read Operations
Read operations are initiated the same way as Write operations with the exception that the Read/Write Select bit in the
device address word is set to a Logic 1. There are three Read operations: Current Address Read, Random Address
Read, and Sequential Read.
Current Address Read: The internal data word address counter maintains the last address accessed during the last
Read or Write operation, incremented by one. This address stays valid between operations as long as the chip power is
maintained. The address roll-over during Read is from the last byte of the last memory page to the first byte of the first
page.
Once the device address with the Read/Write Select bit set to a Logic 1 is clocked in and acknowledged by the
EEPROM, the current address data word is serially clocked out. To end the command, the microcontroller does not
respond with an input zero but does generate a following Stop condition (see Figure 13-4).
Random Read: A Random Read requires a dummy byte write sequence to load in the data word address. Once the
device address word and data word address are clocked in and acknowledged by the EEPROM, the microcontroller must
generate another Start condition. The microcontroller now initiates a Current Address Read by sending a device address
with the Read/Write Select bit high. The EEPROM acknowledges the device address and serially clocks out the data
word. To end the command, the microcontroller does not respond with a zero but does generate a following Stop
condition (see Figure 13-5).
Sequential Read: Sequential Reads are initiated by either a Current Address Read or a Random Address Read. After
the microcontroller receives a data word, it responds with an ACK. As long as the EEPROM receives an ACK, it will
continue to increment the data word address and serially clock out sequential data words. When the memory address
limit is reached, the data word address will roll-over and the Sequential Read will continue. The Sequential Read
operation is terminated when the microcontroller does not respond with a zero but does generate a following Stop
condition (see Figure 13-6).
Permanent Write Protect Register (PSWP) Status: To find out if the register has been programmed, the same
procedure is used as to program the register except that the R/W bit is set to a Logic 1. If the device sends an
acknowledge, then the Permanent Write Protect Register has not been programmed; otherwise, it has been programmed
and the device is permanently write protected at the first half of the array.
Table 13-1. PSWP Status
Pin
Preamble
R/W
Command
A2
A1
A0
B7
B6
B5
B4
B3
B2
B1
B0
Read PSWP
A2
A1
A0
0
1
1
0
A2
A1
A0
1
Reversible Write Protect Register (RSWP) Status: To find out if the register has been programmed, the same
procedure is used as to program the register except that the R/W bit is set to a Logic 1. If the device sends an
acknowledge, then the Reversible Write Protect Register has not been programmed; otherwise, it has been programmed
and the device is write protected (reversible) at the first half of the array.
Figure 13-1. EEPROM Device Address
1
MSB
30
0
1
0
A2 A1 A0 R/W
LSB
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
Figure 13-2. EEPROM Byte Write
S
T
A
R
T
Device Address
W
R
I
T
E
Word Address
S
T
O
P
Data
SDA Line
M
S
B
R A
/ C
W K
M
S
B
A
C
K
A
C
K
Figure 13-3. EEPROM Page Write
S
T
A
R
T
Device Address
W
R
I
T
E
Word Address (n)
Data (n)
Data (n + 1)
S
T
O
P
Data (n + x)
SDA Line
M
S
B
L R A
S / C
B W K
A
C
K
A
C
K
A
C
K
A
C
K
Figure 13-4. EEPROM Current Address Read
S
T
A
R
T
Device Address
R
E
A
D
S
T
O
P
Data
SDA Line
M
S
B
L R A
S / C
B W K
N
O
A
C
K
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
31
Figure 13-5. EEPROM Random Read
S
T
A
R
T
Device Address
W
R
I
T
E
S
T
A
R
T
Word Address (n)
R
E
A
Device Address D
S
T
O
P
Data (n)
SDA Line
M
S
B
L R A
S / C
B W K
M
S
B
L A
S C
B K
M
S
B
L
S
B
A
C
K
N
O
A
C
K
Dummy Write
Figure 13-6. EEPROM Sequential Read
Device
Address
R
E
A
D
Data (n)
Data (n + 1)
Data (n + 2)
S
T
O
P
Data (n + x)
SDA Line
R A
/ C
W K
32
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
A
C
K
A
C
K
A
C
K
N
O
A
C
K
14.
Part Marking
14.1
WDFN Marking
AT30TSE002A: Package Marking Information
8-lead WDFN
2.0 x 3.0 mm Body
T2A
H2@
YXX
Note 1:
designates pin 1
Note 2: Package drawings are not to scale
Catalog Number Truncation
AT30TSE002A
Truncation Code: T2A
Date Codes
Y = Year
2: 2012
3: 2013
4: 2014
5: 2015
Voltages
6: 2016
7: 2017
8: 2018
9: 2019
M = Month
A: January
B: February
...
L: December
WW = Work Week of Assembly
02: Week 2
04: Week 4
...
52: Week 52
Country of Assembly
Lot Number
@ = Country of Assembly
AAA...A = Atmel Wafer Lot Number
Trace Code
2: 2.7V min
Grade/Lead Finish Material
H: Industrial/NiPdAu
Atmel Truncation
XX = Trace Code (Atmel Lot Numbers Correspond to Code)
Example: AA, AB.... YZ, ZZ
AT: Atmel
ATM: Atmel
ATML: Atmel
1/16/13
TITLE
Package Mark Contact:
[email protected]
30TSE002ASM, AT30TSE002A Package Marking Information
DRAWING NO.
REV.
30TSE002ASM
A
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
33
15.
Ordering Information
15.1
Ordering Code Detail
AT 3 0 T S E 0 0 2 A - M A H - T
Shipping Carrier Option
Atmel Designator
B = Bulk (Tubes)
T = Tape and Reel
Product Family
Device Grade
H = Green, NiPdAu Lead Finish
Temperature Range
(-20°C to +125°C)
Memory Type
E = EEPROM
Package Option
Sensor Type
MA = 8-lead, 2.0 x 3.0 x 0.8mm (WDFN)
Device Density
2 = 2-kilobit
Device Revision
15.2
Green Package Options (Pb/Halide-free/RoHS Compliant)
Ordering Code
Package
Lead Finish
Operating Voltage
Max. Freq. (KHz)
Operational Range
8M2
NiPdAu
2.7V to 3.6V
400
-20°C to 125°C
AT30TSE002A-MAH-T(1)
Note:
1.
T = Tape and reel

WDFN = 5K per reel
Package Type
8M2
34
8-lead, 2 x 3 x 0.8mm, Thermally Enhanced Plastic Very Very Thin Dual Flat No Lead (WDFN)
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
16.
Package Drawings
16.1
8M2 – 8-lead WDFN
D2
A
b
(8X)
E
E2
Pin 1
Index
Area
Pin 1 ID
L (8X)
D
e (6X)
A1
1.50 REF.
COMMON DIMENSIONS
(Unit of Measure = mm)
A3
SYMBOL
MIN
D
2.00 BSC
E
3.00 BSC
D2
1.35
1.40
1.45
E2
1.25
1.30
1.35
A
0.70
0.75
0.80
A1
0.0
0.02
0.05
A3
L
b
NOTE
0.20 REF
0.35
e
Notes:
MAX
NOM
0.40
0.45
0.50 BSC
0.18
0.25
0.30
2
1. This drawing is for general information only. Refer to JEDEC Drawing MO-229, WCED-3, for proper dimensions,
tolerances, datums, etc.
2. Dimension b applies to metallized terminal and is measured between 0.15 mm and 0.30 mm from the terminal tip. If the
terminal has the optional radius on the other end of the terminal, the dimension should not be measured in that radius area.
3. Soldering the large thermal pad is optional, but not recommended. No electrical connection is accomplished to the
device through this pad, so if soldered it should be tied to ground
Package Drawing Contact:
[email protected]
TITLE
8M2, 8-lead 2.0x3.0 mm Body, 0.50 mm Pitch,
WDFN, Very Very Thin, Dual No Lead Package
(Sawn)
GPC
YDL
6/12/09
DRAWING NO. REV.
8M2
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
A
35
17.
Revision History
Doc. Rev.
Date
8852A
07/2013
Comments
Initial document release.
Functionotes
36
AT30TSE002A [DATASHEET]
Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013
X X X X
Atmel Corporation
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T: (+1)(408) 441.0311
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© 2013 Atmel Corporation. / Rev.: Atmel-8852A-SEEPROM-AT30TSE002A-Datasheet_072013.
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