PDF Data Sheet Rev. B

Quad, 12-Bit, 50/65 MSPS,
Serial, LVDS, 3 V A/D Converter
AD9229
FEATURES
Four ADCs in 1 package
Serial LVDS digital output data rates
to 780 Mbps (ANSI-644)
Data and frame clock outputs
SNR = 69.5 dB (to Nyquist)
Excellent linearity
DNL = ±0.3 LSB (typical)
INL = ±0.4 LSB (typical)
400 MHz full power analog bandwidth
Power dissipation
1,350 mW at 65 MSPS
985 mW at 50 MSPS
1 V p-p to 2 V p-p input voltage range
3.0 V supply operation
Power-down mode
Digital test pattern enable for timing alignments
FUNCTIONAL BLOCK DIAGRAM
PDWN
DTP
DRVDD
DRGND
AD9229
VIN+A
VIN–A
SHA
PIPELINE
ADC
SHA
PIPELINE
ADC
SHA
PIPELINE
ADC
SHA
PIPELINE
ADC
VIN+B
VIN–B
VIN+C
VIN–C
VIN+D
VIN–D
12
12
12
12
SERIAL
LVDS
D+A
SERIAL
LVDS
D+B
SERIAL
LVDS
D+C
SERIAL
LVDS
D+D
D–A
D–B
D–C
D–D
VREF
SENSE
FCO+
0.5V
FCO–
REFT
REFB
DATA RATE
MULTIPLIER
REF
SELECT
DCO+
AGND
Digital beam-forming systems for ultrasound
Wireless and wired broadband communications
Communication test equipment
LVDSBIAS
CLK
04418-001
DCO–
APPLICATIONS
Figure 1.
GENERAL DESCRIPTION
PRODUCT HIGHLIGHTS
The AD9229 is a quad, 12-bit, 65 MSPS analog-to-digital
converter (ADC) with an on-chip sample-and-hold circuit that
is designed for low cost, low power, small size, and ease of use.
The product operates at up to a 65 MSPS conversion rate and is
optimized for outstanding dynamic performance in applications
where a small package size is critical.
1.
Four ADCs are contained in a small, space-saving package.
2.
A data clock out (DCO) is provided, which operates up to
390 MHz and supports double-data rate operation (DDR).
3.
The outputs of each ADC are serialized LVDS with data
rates up to 780 Mbps (12 bits × 65 MSPS).
4.
The AD9229 operates from a single 3.0 V power supply.
5.
Packaged in a Pb-free, 48-lead LFCSP package.
6.
The internal clock duty cycle stabilizer maintains
performance over a wide range of input clock duty cycles.
The ADC requires a single 3 V power supply and TTL-/CMOScompatible sample rate clock for full performance operation.
No external reference or driver components are required for
many applications.
The ADC automatically multiplies the sample rate clock for the
appropriate LVDS serial data rate. A data clock (DCO) for
capturing data on the output and a frame clock (FCO) trigger
for signaling a new output byte are provided. Power-down is
supported and typically consumes 3 mW when enabled.
Fabricated with an advanced CMOS process, the AD9229 is
available in a Pb-free, 48-lead LFCSP package. It is specified
over the industrial temperature range of –40°C to +85°C.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113 © 2005–2010 Analog Devices, Inc. All rights reserved.
AD9229
TABLE OF CONTENTS
Features .............................................................................................. 1
Equivalent Circuits ......................................................................... 10
Applications ....................................................................................... 1
Typical Performance Characteristics ........................................... 11
Functional Block Diagram .............................................................. 1
Terminology .................................................................................... 16
General Description ......................................................................... 1
Theory of Operation ...................................................................... 18
Revision History ............................................................................... 2
Analog Input Considerations ................................................... 18
Specifications..................................................................................... 3
Clock Input Considerations ...................................................... 19
AC Specifications.......................................................................... 4
Evaluation Board ............................................................................ 24
Digital Specifications ................................................................... 5
Power Supplies ............................................................................ 24
Switching Specifications .............................................................. 6
Input Signals................................................................................ 24
Timing Diagram ............................................................................... 7
Output Signals ............................................................................ 24
Absolute Maximum Ratings............................................................ 8
Default Operation and Jumper Selection Settings ................. 25
Explanation of Test Levels ........................................................... 8
Alternate Analog Input Drive Configuration ......................... 25
ESD Caution .................................................................................. 8
Outline Dimensions ....................................................................... 39
Pin Configuration and Function Descriptions ............................. 9
Ordering Guide .......................................................................... 39
REVISION HISTORY
5/10—Rev. A to Rev. B
Change to Item 47 in Table 11 ...................................................... 38
Updated Outline Dimensions ....................................................... 39
Change to Ordering Guide ............................................................ 39
9/05—Rev. 0 to Rev. A
Change to Specifications .................................................................. 3
Changes to Differential Input Configurations Section.............. 19
Changes to Exposed Paddle Thermal Heat Slug
Recommendations Section ........................................................ 23
Changes to Evaluation Board Section .......................................... 24
Changes to Table 11 ........................................................................ 36
3/05—Revision 0: Initial Version
Rev. B | Page 2 of 40
AD9229
SPECIFICATIONS
AVDD = 3.0 V, DRVDD = 3.0 V, maximum conversion rate, 2 V p-p differential input, 1.0 V internal reference, AIN = –0.5 dBFS, unless
otherwise noted.
Table 1.
AD9229-50
Parameter
RESOLUTION
ACCURACY
No Missing Codes
Offset Error
Offset Matching
Gain Error 1
Gain Matching1
Differential Nonlinearity (DNL)
Integral Nonlinearity (INL)
TEMPERATURE DRIFT
Offset Error
Gain Error1
Reference Voltage, VREF = 1 V
REFERENCE
Output Voltage Error, VREF = 1 V
Load Regulation @ 1.0 mA, VREF = 1 V
Output Voltage Error, VREF = 0.5 V
Load Regulation @ 0.5 mA,
VREF = 0.5 V
Input Resistance
ANALOG INPUTS
Differential Input Voltage Range
VREF = 1 V
Differential Input Voltage Range
VREF = 0.5 V
Common Mode Voltage
Input Capacitance 2
Analog Bandwidth, Full Power
POWER SUPPLY
AVDD
DRVDD
IAVDD
DRVDD
Power Dissipation 3
Power-Down Dissipation
CROSSTALK 4
AD9229-65
Temperature
Test
Level
Full
Full
Full
Full
Full
25°C
Full
25°C
Full
VI
VI
VI
VI
VI
V
VI
V
VI
Guaranteed
±5
±5
±0.3
±0.2
±0.3
±0.3
±0.6
±0.6
Full
Full
Full
V
V
V
±2
±12
±16
Full
Full
Full
Full
VI
V
VI
V
±10
3
±8
0.2
Full
V
7
7
kΩ
Full
VI
2
2
V p-p
Full
VI
1
1
V p-p
Full
Full
Full
V
V
V
1.5
7
400
1.5
7
400
V
pF
MHz
Full
Full
Full
Full
Full
Full
Full
IV
IV
VI
VI
VI
V
V
Min
12
2.7
2.7
Typ
3.0
3.0
300
28
985
3
–95
1
Max
Min
12
Typ
Guaranteed
±5
±5
±0.3
±0.2
±0.3
±0.3
±0.4
±0.4
±25
±25
±2.5
±1.5
±0.6
±1
Max
Unit
Bits
±25
±25
±2.5
±1.5
mV
mV
% FS
% FS
LSB
LSB
LSB
LSB
±0.7
±1
±3
±12
±16
±30
±10
3
±8
0.2
±17
3.6
3.6
330
31
1083
2.7
2.7
3.0
3.0
420
29
1350
3
–95
ppm/°C
ppm/°C
ppm/°C
±30
±17
3.6
3.6
455
33
1465
mV
mV
mV
mV
V
V
mA
mA
mW
mW
dB
Gain error and gain temperature coefficients are based on the ADC only, with a fixed 1.0 V external reference and a 2 V p-p differential analog input.
Input capacitance refers to the effective capacitance between one differential input pin and AGND. Refer to Figure 4 for the equivalent analog input structure.
3
Power dissipation measured with rated encode and 2.4 MHz analog input at –0.5 dBFS.
4
Typical specification over the first Nyquist zone.
2
Rev. B | Page 3 of 40
AD9229
AC SPECIFICATIONS
AVDD = 3.0 V, DRVDD = 3.0 V, maximum conversion rate, 2 V p-p differential input, 1.0 V internal reference, AIN = –0.5 dBFS, unless
otherwise noted.
Table 2.
AD9229-50
Parameter
SIGNAL-TO-NOISE RATIO (SNR)
SIGNAL-TO-NOISE RATIO (SINAD)
EFFECTIVE NUMBER OF BITS
(ENOB)
SPURIOUS-FREE DYNAMIC RANGE
(SFDR)
WORST HARMONIC
(Second or Third)
WORST OTHER
(Excluding Second or Third)
TWO-TONE INTERMODULATION
DISTORTION (IMD)
AIN1 and AIN2 = –7.0 dBFS
fIN = 2.4 MHz
fIN = 10.3 MHz
fIN = 25 MHz
fIN = 30 MHz
fIN = 70 MHz
fIN = 2.4 MHz
fIN = 10.3 MHz
fIN = 25 MHz
fIN = 30 MHz
fIN = 70 MHz
fIN = 2.4 MHz
Temperature
Full
25°C
Full
Full
25°C
Full
25°C
Full
Full
25°C
Full
Test
Level
IV
V
VI
VI
V
V
V
VI
VI
V
V
fIN = 10.3 MHz
fIN = 25 MHz
fIN = 30 MHz
fIN = 70 MHz
fIN = 2.4 MHz
25°C
Full
Full
25°C
Full
V
VI
VI
V
V
fIN = 10.3 MHz
fIN = 25 MHz
fIN = 30 MHz
fIN = 70 MHz
fIN = 2.4 MHz
fIN = 10.3 MHz
fIN = 25 MHz
fIN = 30 MHz
fIN = 70 MHz
fIN = 2.4 MHz
fIN = 10.3 MHz
fIN = 25 MHz
fIN = 30 MHz
fIN = 70 MHz
fIN1 = 15 MHz
25°C
Full
Full
25°C
Full
25°C
Full
Full
25°C
Full
25°C
Full
Full
25°C
25°C
V
VI
VI
V
V
V
VI
VI
V
V
V
VI
VI
V
V
fIN2 = 16 MHz
fIN1 = 69 MHz
fIN2 = 70 MHz
25°C
V
Rev. B | Page 4 of 40
Min
69.5
68.7
Typ
70.4
70.4
69.6
68.4
67.2
70.0
70.0
69.4
Max
AD9229-65
Min
69.0
Typ
70.2
70.2
68.0
69.5
67.1
69.8
69.8
67.3
69.0
66.7
11.3
66.8
11.3
11.1
11.3
11.2
11.3
10.9
10.8
85
76
85
85
11.2
10.8
85
85
77
–85
–85
–76
–85
–77
–90
–90
–73
–88
–83
–73
–79.7
–85
–73
–68.5
–68.5
–78
–90
–90
–88
Unit
dB
dB
dB
dB
dB
dB
dB
dB
dB
dB
Bits
Bits
Bits
Bits
Bits
dBc
85
73
78
–85
–85
–85
Max
–81.7
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
dBc
AD9229
DIGITAL SPECIFICATIONS
AVDD = 3.0 V, DRVDD = 3.0 V, maximum conversion rate, 2 V p-p differential input, 1.0 V internal reference, AIN = –0.5 dBFS, unless
otherwise noted.
Table 3.
AD9229-50
Parameter
CLOCK INPUT
Logic Compliance
High Level Input Voltage
Low Level Input Voltage
High Level Input Current
Low Level Input Current
Input Capacitance
LOGIC INPUTS (PDWN)
Logic 1 Voltage
Logic 0 Voltage
High Level Input Current
Low Level Input Current
Input Capacitance
DIGITAL OUTPUTS (D+, D–)
Logic Compliance
Differential Output Voltage
Output Offset Voltage
Output Coding
Temperature
Test
Level
Full
Full
Full
Full
25°C
IV
IV
VI
VI
V
Full
Full
Full
Full
25°C
IV
IV
IV
IV
V
Full
Full
Full
VI
VI
VI
Min
Typ
AD9229-65
Max
TTL/CMOS
2.0
0.8
±10
±10
2.0
Max
Unit
0.8
±10
±10
V
V
μA
μA
pF
0.5
0.5
2
0.8
±10
±10
V
V
μA
μA
pF
440
1.35
mV
V
2.0
0.5
0.5
2
Rev. B | Page 5 of 40
Typ
TTL/CMOS
2.0
0.5
0.5
2
LVDS
260
1.15
Min
1.25
Offset
binary
0.8
±10
±10
440
1.35
0.5
0.5
2
LVDS
260
1.15
1.25
Offset
binary
AD9229
SWITCHING SPECIFICATIONS
AVDD = 3.0 V, DRVDD = 3.0 V, maximum conversion rate, 2 V p-p differential input, 1.0 V internal reference, AIN = –0.5 dBFS, unless
otherwise noted.
Table 4.
AD9229-50
AD9229-65
Temp
Test
Level
Full
Full
Full
VI
IV
VI
8
10
6.2
Full
VI
8
10
Full
Full
VI
V
3.3
6.5
250
Full
V
250
250
ps
Full
V
6.5
6.5
ns
Full
V
IV
tFCO +
(tSAMPLE/24)
(tSAMPLE/24)
ns
Full
tFCO +
(tSAMPLE/24)
(tSAMPLE/24)
DCO-to-FCO Delay (tFRAME)
Full
IV
Data-to-Data Skew
(tDATA-MAX – tDATA-MIN)
Wake-Up Time
Pipeline Latency
Full
IV
±100
25°C
Full
V
IV
4
10
4
10
ms
CLK
cycles
25°C
25°C
V
V
1.8
<1
1.8
<1
25°C
V
2
2
ns
ps
rms
CLK
cycles
Parameter
CLOCK
Maximum Clock Rate
Minimum Clock Rate
Clock Pulse Width High
(tEH)
Clock Pulse Width Low
(tEL)
OUTPUT PARAMETERS
Propagation Delay (tPD)
Rise Time (tR)
(20% to 80%)
Fall Time (tF)
(20% to 80%)
FCO Propagation Delay
(tFCO)
DCO Propagation Delay
(tCPD)
DCO-to-Data Delay (tDATA)
APERTURE
Aperture Delay (tA)
Aperture Uncertainty
(Jitter)
OUT-OF-RANGE RECOVERY
TIME
Min
Typ
Max
50
Min
Typ
Max
Unit
10
7.7
MSPS
MSPS
ns
6.2
7.7
ns
3.3
6.5
250
65
10
(tSAMPLE/24) –
250
(tSAMPLE/24) –
250
(tSAMPLE/24)
7.9
(tSAMPLE/24) +
250
(tSAMPLE/24) +
250
±250
Rev. B | Page 6 of 40
(tSAMPLE/24) –
250
(tSAMPLE/24) –
250
(tSAMPLE/24)
±100
7.9
(tSAMPLE/24) +
250
(tSAMPLE/24) +
250
±250
ns
ps
ps
ps
ps
AD9229
TIMING DIAGRAM
N–1
AIN
N
tA
tEH
tEL
CLK
tCPD
DCO–
DCO+
tFCO
tFRAME
FCO–
FCO+
D+
MSB
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
MSB D10
(N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 10) (N – 9) (N – 9)
Figure 2. Timing Diagram
Rev. B | Page 7 of 40
04418-002
tDATA
tPD
D–
AD9229
ABSOLUTE MAXIMUM RATINGS
Table 5.
Parameter
ELECTRICAL
AVDD
DRVDD
AGND
AVDD
Digital Outputs (D+, D–,
DCO+, DCO–, FCO+, FCO–)
LVDSBIAS
CLK
VIN+, VIN–
PDWN, DTP
REFT, REFB
VREF, SENSE
ENVIRONMENTAL
Operating Temperature
Range (Ambient)
Maximum Junction
Temperature
Lead Temperature
(Soldering, 10 sec)
Storage Temperature Range
(Ambient)
Thermal Impedance 1
With
Respect To
Rating
AGND
DRGND
DRGND
DRVDD
DRGND
–0.3 V to +3.9 V
–0.3 V to +3.9 V
–0.3 V to +0.3 V
–3.9 V to +3.9 V
–0.3 V to DRVDD
DRGND
AGND
AGND
AGND
AGND
AGND
–0.3 V to DRVDD
–0.3 V to AVDD
–0.3 V to AVDD
–0.3 V to AVDD
–0.3 V to AVDD
–0.3 V to AVDD
–40°C to +85°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
I. 100% production tested.
II. 100% production tested at 25°C and guaranteed by design
and characterization at specified temperatures.
III. Sample tested only.
IV. Parameter is guaranteed by design and characterization
testing.
V. Parameter is a typical value only.
150°C
VI. 100% production tested at 25°C and guaranteed by design
and characterization for industrial temperature range.
300°C
–65°C to +150°C
25°C/W
1
θJA for a 4-layer PCB with a solid ground plane in still air.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
Rev. B | Page 8 of 40
AD9229
48
47
46
45
44
43
42
41
40
39
38
37
DCO+
DCO–
FCO+
FCO–
D+A
D–A
D+B
D–B
D+C
D–C
D+D
D–D
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
1
2
NC 3
DTP 4
AVDD 5
AGND 6
PDWN 7
AVDD 8
AGND 9
VIN+A 10
VIN–A 11
AGND 12
EXPOSED PADDLE, PIN 0
(Bottom of Package)
AD9229
TOP VIEW
(Not to Scale)
36
35
34
33
32
31
30
29
28
27
26
25
DRGND
DRVDD
LVDSBIAS
AGND
AVDD
AGND
CLK
AVDD
AGND
VIN+D
VIN–D
AGND
04418-003
VIN–B
VIN+B
AGND
AVDD
SENSE
VREF
REFB
REFT
AVDD
AGND
VIN+C
VIN–C
NC = NO CONNECT
PIN 1
INDICATOR
13
14
15
16
17
18
19
20
21
22
23
24
DRGND
DRVDD
Figure 3. LFCSP Top View
Table 6. Pin Function Descriptions
Pin No.
5, 8, 16, 21,
29, 32
6, 9, 12, 15, 22,
25, 28, 31, 33
2, 35
1, 36
0
Mnemonic
AVDD
Description
Analog Supply
Pin No.
26
Mnemonic
VIN–D
AGND
Analog Ground
DRVDD
DRGND
AGND
VIN+D
CLK
LVDSBIAS
37
D–D
3
4
7
NC
DTP
PDWN
38
39
D+D
D–C
40
41
D+C
D–B
10
11
VIN+A
VIN–A
42
43
D+B
D–A
13
VIN–B
14
17
18
19
20
23
24
VIN+B
SENSE
VREF
REFB
REFT
VIN+C
VIN–C
Digital Output Supply
Digital Ground
Exposed Paddle/Thermal Heat
Slug (Located on Bottom of
Package)
No Connect
Digital Test Pattern Enable
Power-Down Selection (AVDD =
Power Down)
ADC A Analog Input—True
ADC A Analog Input—
Complement
ADC B Analog Input—
Complement
ADC B Analog Input—True
Reference Mode Selection
Voltage Reference Input/Output
Differential Reference (Bottom)
Differential Reference (Top)
ADC C Analog Input—True
ADC C Analog Input—
Complement
27
30
34
44
45
D+A
FCO–
46
FCO+
47
DCO–
48
DCO+
Rev. B | Page 9 of 40
Description
ADC D Analog Input—
Complement
ADC D Analog Input—True
Input Clock
LVDS Output Current Set
Resistor Pin
ADC D Complement Digital
Output
ADC D True Digital Output
ADC C Complement Digital
Output
ADC C True Digital Output
ADC B Complement Digital
Output
ADC B True Digital Output
ADC A Complement Digital
Output
ADC A True Digital Output
Frame Clock Indicator—
Complement Output
Frame Clock Indicator—True
Output
Data Clock Output—
Complement
Data Clock Output—True
AD9229
EQUIVALENT CIRCUITS
AVDD
DRVDD
VIN+, VIN–
V
V
AGND
D+
V
V
DRGND
Figure 4. Equivalent Analog Input Circuit
04418-007
04418-004
D–
Figure 7. Equivalent Digital Output Circuit
AVDD
AVDD
DTP
AGND
04418-005
170Ω
AGND
Figure 5. Equivalent Clock Input Circuit
Figure 8. Equivalent DTP Input Circuit
AVDD
PDWN
04418-006
375Ω
AGND
100kΩ
04418-051
375Ω
CLK
Figure 6. Equivalent Digital Input Circuit
Rev. B | Page 10 of 40
AD9229
TYPICAL PERFORMANCE CHARACTERISTICS
0
0
AIN = –0.5dBFS
SNR = 70.4dB
ENOB = 11.4 BITS
SFDR = 85.8dBC
–20
AMPLITUDE (dBFS)
–40
–60
–80
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
–120
32.5
Figure 9. Single-Tone 32k FFT with fIN = 2.4 MHz, fSAMPLE = 65 MSPS
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
32.5
Figure 12. Single-Tone 32k FFT with fIN = 120 MHz, fSAMPLE = 65 MSPS
0
90
1V p-p, SFDR (dBc)
AIN = –0.5dBFS
SNR = 69.6dB
ENOB = 11.3 BITS
SFDR = 82.4dBC
85
2V p-p, SFDR (dBc)
SNR/SFDR (dB)
–40
–60
80
75
2V p-p, SNR (dB)
70
–100
65
04418-010
–80
–120
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
1V p-p, SNR (dB)
04418-013
–20
AMPLITUDE (dBFS)
–80
04418-012
–120
AIN = –0.5dBFS
60
10
32.5
Figure 10. Single-Tone 32k FFT with fIN = 30 MHz, fSAMPLE = 65 MSPS
15
20
25
30
35
ENCODE (MSPS)
40
45
50
Figure 13. SNR/SFDR vs. fSAMPLE, fIN = 10.3 MHz, fSAMPLE = 50 MSPS
0
90
1V p-p, SFDR (dBc)
AIN = –0.5dBFS
SNR = 68.5dB
ENOB = 11.1 BITS
SFDR = 81.3dBC
–20
85
SNR/SFDR (dB)
–40
–60
80
2V p-p, SNR (dB)
70
–100
65
–120
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
32.5
Figure 11. Single-Tone 32k FFT with fIN = 70 MHz, fSAMPLE = 65 MSPS
Rev. B | Page 11 of 40
2V p-p, SFDR (dBc)
75
–80
04418-011
AMPLITUDE (dBFS)
–60
–100
04418-009
–100
–40
1V p-p, SNR (dB)
AIN = –0.5dBFS
60
10
15
20
25
30
35
ENCODE (MSPS)
40
45
Figure 14. SNR/SFDR vs. fSAMPLE, fIN = 25 MHz, fSAMPLE = 50 MSPS
04418-014
AMPLITUDE (dBFS)
–20
AIN = –0.5dBFS
SNR = 68.1dB
ENOB = 11.0 BITS
SFDR = 77.0dBC
50
AD9229
95
90
1V p-p, SFDR (dBc)
2V p-p, SFDR (dBc)
80
90
1V p-p, SFDR (dBc)
70
SNR/SFDR (dB)
SNR/SFDR (dB)
85
2V p-p, SFDR (dBc)
80
75
2V p-p, SNR (dB)
60
50
40
80 dB REFERENCE
30
70
20
04418-015
1V p-p, SNR (dB)
AIN = –0.5dBFS
60
10
15
20
25
30
35
40
45
ENCODE (MSPS)
50
55
60
10
0
–60
65
Figure 15. SNR/SFDR vs. fSAMPLE, fIN = 10.3 MHz, fSAMPLE = 65 MSPS
2V p-p, SNR (dB)
04418-018
65
1V p-p, SNR (dB)
–50
–40
–30
–20
ANALOG INPUT LEVEL (dBFS)
–10
0
Figure 18. SNR/SFDR vs. Analog Input Level,
fIN =25 MHz, fSAMPLE = 50 MSPS
85
90
2V p-p, SFDR (dBc)
2V p-p, SFDR (dBc)
80
70
SNR/SFDR (dB)
75
2V p-p, SNR (dB)
70
60
50
40
04418-016
1V p-p, SNR (dB)
AIN = –0.5dBFS
30
15
20
25
30
35
40
45
ENCODE (MSPS)
50
55
60
10
0
–60
65
Figure 16. SNR/SFDR vs. fSAMPLE, fIN = 30 MHz, fSAMPLE = 65 MSPS
2V p-p, SFDR (dBc)
–40
–30
–20
ANALOG INPUT LEVEL (dBFS)
–10
0
70
1V p-p, SFDR (dBc)
SNR/SFDR (dB)
60
50
40
80 dB REFERENCE
30
20
04418-017
1V p-p, SNR (dB)
–40
–30
–20
ANALOG INPUT LEVEL (dBFS)
1V p-p, SFDR (dBc)
60
50
40
80 dB REFERENCE
30
20
2V p-p, SNR (dB)
–50
2V p-p, SFDR (dBc)
80
70
SNR/SFDR (dB)
–50
90
80
0
–60
2V p-p, SNR (dB)
1V p-p, SNR (dB)
Figure 19. SNR/SFDR vs. Analog Input Level,
fIN = 10.3 MHz, fSAMPLE = 65 MSPS
90
10
80 dB REFERENCE
20
65
60
10
1V p-p, SFDR (dBc)
–10
0
10
0
–60
2V p-p, SNR (dB)
04418-020
SNR/SFDR (dB)
1V p-p, SFDR (dBc)
04418-019
80
1V p-p, SNR (dB)
–50
–40
–30
–20
ANALOG INPUT LEVEL (dBFS)
–10
Figure 20. SNR/SFDR vs. Analog Input Level,
fIN = 30 MHz, fSAMPLE = 65 MSPS
Figure 17. SNR/SFDR vs. Analog Input Level,
fIN = 10.3 MHz, fSAMPLE = 50 MSPS
Rev. B | Page 12 of 40
0
AD9229
90
80
85
70
SFDR (dBc)
2V p-p, SFDR (dBc)
60
75
SFDR (dB)
70
SNR (dB)
65
50
80 dB REFERENCE
40
30
60
1V p-p, SFDR (dBc)
20
55
10
04418-021
50
45
1
10
100
FREQUENCY (MHz)
0
–60 –56 –52 –48 –44 –40 –36 –32 –28 –23 –19 –15 –10
ANALOG INPUT LEVEL (dBFS)
1000
Figure 21. SNR/SFDR vs. fIN, fSAMPLE = 65 MHz
04418-024
SNR/SFDR (dB)
80
–7
Figure 24. Two-Tone SFDR vs. Analog Input Level, fIN1 = 15 MHz and
fIN2 = 16 MHz, fSAMPLE = 65 MSPS
0
80
AIN1 AND AIN2= –7.0dBFS
SFDR = 73.0dBc
IMD2 = 80.5dBc
IMD3 = 73.0dBc
–20
70
2V p-p, SFDR (dBc)
–40
SFDR (dB)
AMPLITUDE (dBFS)
60
–60
50
80 dB REFERENCE
40
1V p-p, SFDR (dBc)
30
–80
20
04418-022
10
–120
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
0
–60 –56 –52 –48 –44 –40 –36 –32 –28 –23 –19 –15 –10
ANALOG INPUT LEVEL (dBFS)
32.5
Figure 22. Two-Tone 32k FFT with fIN1 = 15 MHz and fIN2 = 16 MHz,
fSAMPLE = 65 MSPS
–7
Figure 25. Two-Tone SFDR vs. Analog Input Level, fIN1 = 69 MHz and
fIN2 = 70 MHz, fSAMPLE = 65 MSPS
0
90
AIN1 AND AIN2= –7.0dBFS
SFDR = 68.5dBc
IMD2 = 77.0dBc
IMD3 = 68.5dBc
–20
1V p-p, SFDR (dBc)
85
2V p-p, SFDR (dBc)
–40
SNR/SFDR (dB)
–60
–80
80
75
2V p-p, SINAD (dB)
70
–100
04418-023
65
–120
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
32.5
Figure 23. Two-Tone 32k FFT with fIN1 = 69 MHz and fIN2 = 70 MHz,
fSAMPLE = 65 MSPS
Rev. B | Page 13 of 40
60
–40
1V p-p, SINAD (dB)
–20
0
20
40
TEMPERATURE (°C)
04418-026
AMPLITUDE (dBFS)
04418-025
–100
60
80
Figure 26. SINAD/SFDR vs. Temperature, fIN 10.3 MHz, fSAMPLE = 65 MSPS
AD9229
–40
15
–50
5
CMRR (dB)
0
–5
–10
–60
–70
–20
–40
04418-027
–15
–20
0
20
40
TEMPERATURE (°C)
60
04418-031
GAIN ERROR (ppm/°C)
10
–80
0
80
5
10
15
20
FREQUENCY (MHz)
25
30
Figure 30. CMRR vs. Frequency, fSAMPLE = 65 MSPS
Figure 27. Gain Error vs. Temperature
0.5
10
0.4
9
0.3
8
NUMBER OF HITS (1M)
0.36LSB rms
0.1
0
–0.1
–0.2
–0.3
7
6
5
4
3
04418-028
2
–0.4
–0.5
0
512
1024
1536
2048
CODE
2560
3072
3584
04418-039
INL (LSB)
0.2
1
0
N–3
4095
Figure 28. Typical INL, fIN = 2.4 MHz, fSAMPLE = 65 MSPS
N–2
N
CODE
N+1
N+2
N+3
Figure 31. Input Referred Noise Histogram, fSAMPLE = 65 MSPS
0.5
0
NPR = 60.8dB
NOTCH = 18MHz
NOTCH WIDTH = 3MHz
0.4
–20
0.3
AMPLITUDE (dBFS)
0.2
0.1
0
–0.1
–0.2
–40
–60
–80
–0.3
–0.4
–0.5
0
512
1024
1536
2048
CODE
2560
3072
3584
4095
04418-035
–100
04418-030
DNL (LSB)
N–1
–120
0
4.1
8.1
12.2
16.3
20.3
FREQUENCY (MHz)
24.4
28.4
Figure 32. Noise Power Ratio (NPR), fSAMPLE = 65 MSPS
Figure 29. Typical DNL, fIN = 2.4 MHz, fSAMPLE = 65 MSPS
Rev. B | Page 14 of 40
32.5
AD9229
0
–2
–3
–4
–5
–6
–7
04418-038
FUNDAMENTAL LEVEL (dB)
–1
–8
0
50
100
150
200 250 300 350
FREQUENCY (MHz)
400
450
500
Figure 33. Full Power Bandwidth vs. Frequency, fSAMPLE = 65 MSPS
Rev. B | Page 15 of 40
AD9229
TERMINOLOGY
Analog Bandwidth
Analog bandwidth is the analog input frequency at which the
spectral power of the fundamental frequency (as determined by
the FFT analysis) is reduced by 3 dB from full scale.
Aperture Delay
Aperture delay is a measure of the sample-and-hold amplifier
(SHA) performance and is measured from the 50% point rising
edge of the clock input to the time at which the input signal is
held for conversion.
Aperture Uncertainty (Jitter)
Aperture jitter is the variation in aperture delay for successive
samples and can be manifested as frequency-dependent noise
on the ADC input.
Clock Pulse Width and Duty Cycle
Pulse width high is the minimum amount of time that the clock
pulse should be left in the Logic 1 state to achieve rated
performance. Pulse width low is the minimum time the clock
pulse should be left in the low state. At a given clock rate, these
specifications define an acceptable clock duty cycle.
Common Mode Rejection Ratio (CMRR)
CMRR is defined as the amount of rejection on the differential
analog inputs when a common signal is applied. Typically
expressed as 20 log (differential gain/common-mode gain).
Crosstalk
Crosstalk is defined as the measure of any feedthrough coupling
onto the quiet channel when all other channels are driven by a
full-scale signal.
Differential Analog Input Voltage Range
The peak-to-peak differential voltage that must be applied to
the converter to generate a full-scale response. Peak differential
voltage is computed by observing the voltage on a pin and
subtracting the voltage from a second pin that is 180° out of
phase.
Differential Nonlinearity (DNL, No Missing Codes)
An ideal ADC exhibits code transitions that are exactly 1 LSB
apart. DNL is the deviation from this ideal value. Guaranteed
no missing codes to an n-bit resolution indicates that all 2n
codes, respectively, must be present over all operating ranges.
Effective Number of Bits (ENOB)
For a sine wave, SINAD can be expressed in terms of the
number of bits. Using the following formula, it is possible to
obtain a measure of performance expressed as N, the effective
number of bits:
Full Power Bandwidth
Full power bandwidth is the measured –3 dB point at the analog
front-end input relative to the frequency measured.
Gain Error
The largest gain error is specified and is considered the
difference between the measured and ideal full-scale input
voltage range.
Gain Matching
Expressed as a percentage of FSR and computed using the
following equation:
Gain Matching =
FSR max − FSR min
⎛ FSR max + FSR min ⎞
⎜
⎟
2
⎝
⎠
× 100%
where FSRMAX is the most positive gain error of the ADCs, and
FSRMIN is the most negative gain error of the ADCs.
Input-Referred Noise
Input-referred noise is a measure of the wideband noise
generated by the ADC core. Histograms of the output codes are
created while a dc signal is applied to the ADC input. Inputreferred noise is calculated using the standard deviation of the
histograms and presented in terms of LSB rms.
Integral Nonlinearity (INL)
INL refers to the deviation of each individual code from a line
drawn from negative full scale through positive full scale. The
point used as negative full scale occurs 0.5 LSB before the first
code transition. Positive full scale is defined as a level 1.5 LSB
beyond the last code transition. The deviation is measured from
the middle of each code to the true straight line.
Noise Power Ratio (NPR)
NPR is the full-scale rms noise power injected into the ADC vs.
the rejected band of interest (notch depth measured).
Offset Error
The largest offset error is specified and is considered the
difference between the measured and ideal voltage at the analog
input that produces the midscale code at the outputs.
Offset Matching
Expressed in millivolts and computed using the following
equation:
Offset Matching = OFFMAX − OFFMIN
where OFFMAX is the most positive offset error, and OFFMIN is
the most negative offset error.
N = (SINAD – 1.76)/6.02
Rev. B | Page 16 of 40
AD9229
Out-of-Range Recovery Time
Out-of-range recovery time is the time it takes for the ADC to
reacquire the analog input after a transient from 10% above
positive full scale to 10% above negative full scale, or from 10%
below negative full scale to 10% below positive full scale.
Signal-to-Noise Ratio (SNR)
SNR is the ratio of the rms value of the measured input signal to
the rms sum of all other spectral components below the Nyquist
frequency, excluding the first six harmonics and dc. The value
for SNR is expressed in decibels.
Output Propagation Delay
The delay between the clock logic threshold and the time when
all bits are within valid logic levels.
Spurious-Free Dynamic Range (SFDR)
SFDR is the difference in decibels between the rms amplitude of
the input signal and the peak spurious signal.
Second and Third Harmonic Distortion
The ratio of the rms signal amplitude to the rms value of the
second or third harmonic component, reported in decibels
relative to the carrier.
Temperature Drift
The temperature drift for offset error and gain error specifies
the maximum change from the initial (25°C) value to the value
at TMIN or TMAX.
Signal-to Noise and Distortion (SINAD) Ratio
SINAD is the ratio of the rms value of the measured input
signal to the rms sum of all other spectral components below
the Nyquist frequency, including harmonics but excluding dc.
The value for SINAD is expressed in decibels.
Two-Tone SFDR
The ratio of the rms value of either input tone to the rms value
of the peak spurious component. The peak spurious component
may or may not be an IMD product. It may be reported in
decibels relative to the carrier (that is, degrades as signal levels
are lowered) or in decibels relative to full scale (always related
back to converter full scale).
Rev. B | Page 17 of 40
AD9229
THEORY OF OPERATION
The input stage contains a differential SHA that can be configured as ac- or dc-coupled in differential or single-ended modes.
The output staging block aligns the data, carries out the error
correction, and passes the data to the output buffers. The data is
then serialized and aligned to the frame and output clock.
The analog inputs of the AD9229 are not internally dc-biased.
In ac-coupled applications, the user must provide this bias
externally. For optimum performance, set the device so that
VCM = AVDD/2; however, the device can function over a wider
range with reasonable performance (see Figure 35 and Figure 36).
90
2V p-p, SFDR (dBc)
85
1V p-p, SFDR (dBc)
75
2V p-p, SNR (dB)
70
65
1V p-p, SNR (dB)
60
ANALOG INPUT CONSIDERATIONS
0
The analog input to the AD9229 is a differential switchedcapacitor SHA that has been designed for optimum performance while processing a differential input signal. The SHA
input can support a wide common-mode range and maintain
excellent performance. An input common-mode voltage of
midsupply minimizes signal-dependent errors and provides
optimum performance.
0.5
1.0
1.5
2.0
2.5
ANALOG INPUT COMMON-MODE VOLTAGE (V)
3.0
Figure 35. SNR/SFDR vs. Common-Mode Voltage, fIN = 2.4 MHz,
fSAMPLE = 65 MSPS
90
2V p-p, SFDR (dBc)
85
80
1V p-p, SFDR (dBc)
SNR/SFDR (dB)
75
H
S
80
04418-053
Each stage of the pipeline, excluding the last, consists of a low
resolution flash ADC connected to a switched capacitor DAC
and interstage residue amplifier (MDAC). The residue amplifier
magnifies the difference between the reconstructed DAC output
and the flash input for the next stage in the pipeline. One bit of
redundancy is used in each stage to facilitate digital correction
of flash errors. The last stage simply consists of a flash ADC.
of a clock cycle. A small resistor in series with each input can
help reduce the peak transient current required from the output
stage of the driving source. Also, a small shunt capacitor can
be placed across the inputs to provide dynamic charging
currents. This passive network creates a low-pass filter at the
ADC’s input; therefore, the precise values are dependent on
the application.
SNR/SFDR (dB)
The AD9229 architecture consists of a front-end switched capacitor sample-and-hold amplifier (SHA) followed by a pipelined
ADC. The pipelined ADC is divided into three sections: a 4-bit
first stage followed by eight 1.5-bit stages and a final 3-bit flash.
Each stage provides sufficient overlap to correct for flash errors
in the preceding stages. The quantized outputs from each stage
are combined into a final 12-bit result in the digital correction
logic. The pipelined architecture permits the first stage to
operate on a new input sample while the remaining stages
operate on preceding samples. Sampling occurs on the rising
edge of the clock.
S
VIN+
2V p-p, SNR (dB)
70
65
1V p-p, SNR (dB)
60
55
CPAR
04418-054
50
45
S
40
0
CPAR
04418-029
VIN–
S
H
Figure 34. Switched-Capacitor SHA Input
The clock signal alternately switches the SHA between sample
mode and hold mode (see Figure 34). When the SHA is
switched into sample mode, the signal source must be capable
of charging the sample capacitors and settling within one-half
0.5
1.0
1.5
2.0
2.5
ANALOG INPUT COMMON-MODE VOLTAGE (V)
3.0
Figure 36. SNR/SFDR vs. Common-Mode Voltage, fIN = 30 MHz,
fSAMPLE = 65 MSPS
For best dynamic performance, the source impedances driving
VIN+ and VIN− should be matched such that common-mode
settling errors are symmetrical. These errors are reduced by the
common-mode rejection of the ADC.
Rev. B | Page 18 of 40
AD9229
AVDD
R
2V p-p
49.9Ω
VIN+
C
AVDD
VIN–
AGND
1kΩ
REFT = 1/2 (AVDD + VREF)
REFB = 1/2 (AVDD − VREF)
Span = 2 × (REFT − REFB) = 2 × VREF
AD9229
R
04418-033
An internal reference buffer creates the positive and negative
reference voltages, REFT and REFB, respectively, that defines
the span of the ADC core. The output common-mode of the
reference buffer is set to midsupply, and the REFT and REFB
voltages and span are defined as
1kΩ
0.1μF
Figure 38. Differential Transformer—Coupled Configuration
It can be seen from the equations above that the REFT and
REFB voltages are symmetrical about the midsupply voltage
and, by definition, the input span is twice the value of the
VREF voltage.
Single-Ended Input Configuration
The internal voltage reference can be pin-strapped to fixed
values of 0.5 V or 1.0 V or adjusted within the same range, as
discussed in the Internal Reference Connection section.
Maximum SNR performance is achieved by setting the AD9229
to the largest input span of 2 V p-p.
A single-ended input can provide adequate performance in
cost-sensitive applications. In this configuration, SFDR and
distortion performance degrade due to the large input
common-mode swing. However, if the source impedances
on each input are matched, there should be little effect on
SNR performance. Figure 39 details a typical single-ended
input configuration.
10μF
1kΩ
2V p-p
49.9Ω
0.1μF
R
1kΩ
C
AVDD
Differential Input Configurations
1kΩ
Optimum performance is achieved by driving the AD9229 in a
differential input configuration. For ultrasound applications,
the AD8332 differential driver provides excellent performance
and a flexible interface to the ADC (see Figure 37).
10μF
0.1μF
R
1kΩ
AVDD
VIN+
AD9229
VIN–
AGND
04418-034
The SHA should be driven from a source that keeps the signal
peaks within the allowable range for the selected reference
voltage. The minimum and maximum common-mode input
levels are defined in Figure 35 and Figure 36.
Figure 39. Single-Ended Input Configuration
0.1μF
AVDD
LOP
1V p-p
VOH
187Ω
0.1μF
AVDD
R
VIN+
1.0kΩ
22p
LNA
AD8332
VGA
374Ω
LMD
VOL
LON
18nF
274Ω
VIN
187nH
AD9229
C
1.0kΩ
0.1μF
CLOCK INPUT CONSIDERATIONS
VIP
INH
R
VIN–
0.1μF
0.1μF
10μF
VREF
AGND
04418-032
0.1μF 120nH
0.1μF
Figure 37. Differential Input Configuration Using the AD8332
However, the noise performance of most amplifiers is not
adequate to achieve the true performance of the AD9229. For
applications where SNR is a key parameter, differential transformer coupling is the recommended input configuration. An
example of this is shown in Figure 38.
In any configuration, the value of the shunt capacitor, C, is
dependent on the input frequency and may need to be reduced
or removed.
Typical high speed ADCs use both clock edges to generate a
variety of internal timing signals and, as a result, may be sensitive to clock duty cycle. Typically, a 10% tolerance is required on
the clock duty cycle to maintain dynamic performance characteristics. The AD9229 has a self-contained clock duty cycle
stabilizer that retimes the nonsampling edge, providing an
internal clock signal with a nominal 50% duty cycle. This allows
a wide range of clock input duty cycles without affecting the
performance of the AD9229.
An on-board phase-locked loop (PLL) multiplies the input
clock rate for the purpose of shifting the serial data out. The
stability criteria for the PLL limits the minimum sample clock
rate of the ADC to 10 MSPS. Assuming steady state operation of
the input clock, any sudden change in the sampling rate could
create an out-of-lock condition leading to invalid outputs at the
DCO, FCO, and data out pins.
Rev. B | Page 19 of 40
AD9229
1400
High speed, high resolution ADCs are sensitive to the quality of
the clock input. The degradation in SNR at a given full-scale
input frequency (fA) due only to aperture jitter (tA) can be
calculated with the following equation:
IAVDD
400
300
TOTAL POWER
250
1100
200
1000
150
100
900
IDRVDD
The clock input should be treated as an analog signal in cases
where aperture jitter may affect the dynamic range of the
AD9229. Power supplies for clock drivers should be separated
from the ADC output driver supplies to avoid modulating the
clock signal with digital noise. Low jitter, crystal-controlled
oscillators make the best clock sources. If the clock is generated
from another type of source (by gating, dividing, or other
methods), it should be retimed by the original clock at the
last step.
Power Dissipation and Power-Down Mode
As shown in Figure 40 and Figure 41, the power dissipated by
the AD9229 is proportional to its sample rate. The digital power
dissipation does not vary much because it is determined
primarily by the DRVDD supply and bias current of the LVDS
output drivers.
1200
350
300
1100
IAVDD
CURRENT (mA)
POWER (mW)
250
1000
200
TOTAL POWER
900
150
800
700
50
IDRVDD
600
10
15
20
25
30
35
ENCODE (MSPS)
40
45
50
0
04418-056
100
Figure 40. Supply Current vs. fSAMPLE for fIN = 10.3 MHz, fSAMPLE = 50 MSPS
CURRENT (mA)
350
1200
800
10
20
30
40
ENCODE (MSPS)
50
50
60
0
04418-055
In the equation, the rms aperture jitter, tA, represents the root
sum square of all jitter sources, which include the clock input,
analog input signal, and ADC aperture jitter specification.
Applications that require undersampling are particularly
sensitive to jitter.
450
1300
POWER (mW)
SNR degradation = 20 × log 10 [1/2 × π × fA × tA]
500
Figure 41. Supply Current vs. fSAMPLE for fIN = 10.3 MHz, fSAMPLE = 65 MSPS
By asserting the PDWN pin high, the AD9229 is placed in
power-down mode. In this state, the ADC typically dissipates
3 mW. During power-down, the LVDS output drivers are placed
in a high impedance state. Reasserting the PDWN pin low
returns the AD9229 to normal operating mode.
In power-down mode, low power dissipation is achieved by
shutting down the reference, reference buffer, PLL, and biasing
networks. The decoupling capacitors on REFT and REFB are
discharged when entering standby mode and then must be
recharged when returning to normal operation. As a result, the
wake-up time is related to the time spent in the power-down
mode; shorter cycles result in proportionally shorter wake-up
times. With the recommended 0.1 μF and 10 μF decoupling
capacitors on REFT and REFB, it takes approximately 1 sec to
fully discharge the reference buffer decoupling capacitors and
4 ms to restore full operation.
Digital Outputs
The AD9229’s differential outputs conform to the ANSI-644
LVDS standard. To set the LVDS bias current, place a resistor
(RSET is nominally equal to 4.0 kΩ) to ground at the
LVDSBIAS pin. The RSET resistor current is derived on-chip
and sets the output current at each output equal to a nominal
3.5 mA. A 100 Ω differential termination resistor placed at the
LVDS receiver inputs results in a nominal 350 mV swing at the
receiver. To adjust the differential signal swing, simply change
the resistor to a different value, as shown in Table 7.
Table 7. LVDSBIAS Pin Configuration
RSET
3.7 kΩ
4.0 kΩ (default)
4.3 kΩ
Rev. B | Page 20 of 40
Differential Output Swing
375 mV p-p
350 mV p-p
325 mV p-p
AD9229
The AD9229’s LVDS outputs facilitate interfacing with LVDS
receivers in custom ASICs and FPGAs that have LVDS capability for superior switching performance in noisy environments. Single point-to-point net topologies are recommended
with a 100 Ω termination resistor placed as close to the receiver
as possible. It is recommended to keep the trace length no
longer than 12 inches and to keep differential output traces
close together and at equal lengths.
Table 9. Digital Test Pattern Pin Settings
The format of the output data is offset binary. An example of
the output coding format can be found in Table 8.
Voltage Reference
Table 8. Digital Output Coding
Code
4095
2048
2047
0
(VIN+) − (VIN−),
Input Span =
2 V p-p (V)
1.000
0
−0.000488
−1.00
(VIN+) − (VIN−),
Input Span =
1 V p-p (V)
0.500
0
−0.000244
−0.5000
Digital Output
Offset Binary
(D11 ... D0)
1111 1111 1111
1000 0000 0000
0111 1111 1111
0000 0000 0000
Timing
Data from each ADC is serialized and provided on a separate
channel. The data rate for each serial stream is equal to 12 bits
times the sample clock rate, with a maximum of 780 bps (12 bits
× 65 MSPS = 780 bps). The lowest typical conversion rate is
10 MSPS.
Two output clocks are provided to assist in capturing data from
the AD9229. The DCO is used to clock the output data and is
equal to six times the sampling clock (CLK) rate. Data is
clocked out of the AD9229 and can be captured on the rising
and falling edges of the DCO that supports double-data rate
(DDR) capturing. The frame clock out (FCO) is used to signal
the start of a new output byte and is equal to the sampling clock
rate. See the timing diagram shown in Figure 2 for more
information.
DTP Pin
The digital test pattern (DTP) pin can be enabled for two types
of test patterns, as summarized in Table 9. When the DTP is
tied to AVDD/3, all the ADC channel outputs shift out the
following pattern: 1000 0000 0000. When the DTP is tied to 2 ×
AVDD/3, all the ADC channel outputs shift out the following
pattern: 1010 1010 1010. The FCO and DCO outputs still work
as usual while all channels shift out the test pattern. This
pattern allows the user to perform timing alignment
adjustments between the FCO, DCO, and the output data. For
normal operation, this pin should be tied to AGND.
Selected DTP
Normal
operation
DTP1
AVDD/3
Resulting
D+ and D–
Normal
operation
1000 0000 0000
DTP2
2 × AVDD/3
1010 1010 1010
Restricted
AVDD
N/A
DTP Voltage
AGND
Resulting
FCO and DCO
Normal
operation
Normal
operation
Normal
operation
N/A
A stable and accurate 0.5 V voltage reference is built into the
AD9229. The input range can be adjusted by varying the reference voltage applied to the AD9229, using either the internal
reference or an externally applied reference voltage. The input
span of the ADC tracks reference voltage changes linearly.
When applying the decoupling capacitors to the VREF, REFT,
and REFB pins, use ceramic, low ESR capacitors. These
capacitors should be close to the ADC pins and on the same
layer of the PCB as the AD9229. The recommended capacitor
values and configurations for the AD9229 reference pin can be
found in Figure 42 and Figure 43.
Table 10. Reference Settings
Selected Mode
External Reference
Internal, 1 V p-p FSR
Programmable
Internal, 2 V p-p FSR
SENSE
Voltage
AVDD
Resulting
VREF (V)
N/A
VREF
0.2 V to
VREF
AGND to
0.2 V
0.5
0.5 × (1 +
R2/R1)
1.0
Resulting
Differential
Span (V p-p)
2 × external
reference
1.0
2 × VREF
2.0
Internal Reference Connection
A comparator within the AD9229 detects the potential at the
SENSE pin and configures the reference into four possible states
(summarized in Table 10). If SENSE is grounded, the reference
amplifier switch is connected to the internal resistor divider (see
Figure 42), setting VREF to 1 V. Connecting the SENSE pin to
the VREF pin switches the amplifier output to the SENSE pin,
configuring the internal op amp circuit as a voltage follower and
providing a 0.5 V reference output. If an external resistor
divider is connected as shown in Figure 43, the switch is again
set to the SENSE pin. This puts the reference amplifier in a
noninverting mode and defines the VREF output as
R2 ⎞
VREF = 0.5 × ⎛⎜1 +
⎟
R1 ⎠
⎝
In all reference configurations, REFT and REFB establish their
input span of the ADC core. The analog input full-scale range
of the ADC equals twice the voltage at the reference pin for
either an internal or an external reference configuration.
Rev. B | Page 21 of 40
AD9229
External Reference Operation
VIN+
VIN–
REFT
0.1μF
ADC
CORE
+
0.1μF
10μF
REFB
The use of an external reference may be necessary to enhance
the gain accuracy of the ADC or improve thermal drift characteristics. Figure 45 shows the typical drift characteristics of the
internal reference.
0.10
0.1μF
VREF
0.08
0.1μF
0.5V
0.06
04418-036
SENSE
VREF ERROR (%)
SELECT
LOGIC
0.04
0.02
VREF = 0.5V
0
–0.02
–0.04
Figure 42. Internal Reference Configuration
VREF = 1.0V
–0.06
04418-057
10μF
–0.08
VIN+
VIN–
–0.10
–40
REFT
0.1μF
ADC
CORE
+
0.1μF
0.1μF
0.5V
SENSE
R1
04418-037
If the internal reference of the AD9229 is used to drive multiple
converters to improve gain matching, the loading of the reference by the other converters must be considered. Figure 44
depicts how the internal reference voltage is affected by loading.
0.05
–0.05
When connecting power to the AD9229, it is recommended
that two separate 3.0 V supplies be used: one for analog
(AVDD) and one for digital (DRVDD). If only one supply is
available, it should be routed to the AVDD first and tapped off
and isolated with a ferrite bead or filter choke with decoupling
capacitors proceeding. The user can employ several different
decoupling capacitors to cover both high and low frequencies.
These should be located close to the point of entry at the PC
board level and close to the parts with minimal trace length.
VREF = 0.5V
–0.10
–0.15
–0.20
VREF = 1.0V
–0.25
–0.30
04418-058
VREF ERROR (%)
80
A single PC board ground plane should be sufficient when
using the AD9229. With proper decoupling and smart partitioning of the PC board’s analog, digital, and clock sections,
optimum performance is easily achieved.
0
–0.35
0.2
65
Power and Ground Recommendations
Figure 43. Programmable Reference Configuration
0
50
When the SENSE pin is tied to AVDD, the internal reference is
disabled, allowing the use of an external reference. The external
reference is loaded with an equivalent 7 kΩ load. An internal
reference buffer generates the positive and negative full-scale
references, REFT and REFB, for the ADC core. Therefore, the
external reference must be limited to a maximum of 1 V.
SELECT
LOGIC
R2
5
20
35
TEMPERATURE (°C)
Figure 45. Typical VREF Drift
0.1μF
VREF
–10
10μF
REFB
+
10μF
–25
0.4
0.6
0.8
1.0
1.2
ILOAD (mA)
1.4
1.6
1.8
2.0
Figure 44. VREF Accuracy vs. Load
Rev. B | Page 22 of 40
AD9229
It is mandatory that the exposed paddle on the underside of the
ADC be connected to analog ground (AGND) to achieve the
best electrical and thermal performance of the AD9229. A
continuous exposed copper plane on the PCB should mate to
the AD9229 exposed paddle, Pin 0. The copper plane should
have several vias to achieve the lowest possible resistive thermal
path for heat dissipation to flow through the bottom of the PCB.
These vias should be solder or epoxy filled (plugged).
To maximize the solder coverage and adhesion between the
ADC and PCB, overlay a silkscreen to partition the continuous
copper plane on the PCB into several uniform sections. This
provides several tie points between the two during the reflow
process. Using one continuous plane with no silkscreen
partitions only guarantees one tie point between the ADC and
PCB. See Figure 46 for a PCB layout example. For detailed
information on packaging and the PCB layout of chip scale
packages, visit www.analog.com.
Rev. B | Page 23 of 40
SILKSCREEN PARTITION
PIN 1 INDICATOR
04418-052
Exposed Paddle Thermal Heat Slug Recommendations
Figure 46. Typical PCB Layout
AD9229
EVALUATION BOARD
power supply. This enables the user to individually bias each
section of the board. Use P501 to connect a different supply for
each section. At least one 3.0 V supply is needed with a 1 A
current capability for AVDD_DUT and DRVDD_DUT;
however, it is recommended that separate supplies be used for
both analog and digital. To operate the evaluation board using
the VGA option, a separate 5.0 V analog supply is needed in
addition to the other 3.0 V supplies. The 5.0 V supply, or
AVDD_VGA, should have a 1 A current capability as well.
The AD9229 evaluation board provides all of the support circuitry required to operate the ADC in its various modes and
configurations. The converter can be driven differentially
through a transformer (default) or through the AD8332 driver.
The ADC can also be driven in a single-ended fashion. Separate
power pins are provided to isolate the DUT from the AD8332
drive circuitry. Each input configuration can be selected by
proper connection of various jumpers (see Figure 48 to Figure 52).
Figure 47 shows the typical bench characterization setup used
to evaluate the ac performance of the AD9229. It is critical that
the signal sources used for the analog input and clock have very
low phase noise (<1 ps rms jitter) to realize the ultimate
performance of the converter. Proper filtering of the analog
input signal to remove harmonics and lower the integrated or
broadband noise at the input is also necessary to achieve the
specified noise performance.
INPUT SIGNALS
When connecting the clock and analog source, use clean signal
generators with low phase noise, such as Rohde & Schwarz SMHU
or HP8644 signal generators or the equivalent. Use 1 m long,
shielded, RG-58, 50 Ω coaxial cable for making connections to
the evaluation board. Dial in the desired frequency and amplitude
within the ADC’s specifications tables. Typically, most ADI
evaluation boards can accept a ~2.8 V p-p or 13 dBm sine wave
input for the clock. When connecting the analog input source, it
is recommended to use a multipole, narrow-band band-pass
filter with 50 Ω terminations. ADI uses TTE, Allen Avionics,
and K&L types of band-pass filters. The filter should be
connected directly to the evaluation board if possible.
See Figure 47 to Figure 57 for complete schematics and layout
plots that demonstrate the routing and grounding techniques
that should be applied at the system level.
POWER SUPPLIES
This evaluation board comes with a wall mountable switching
power supply that provides a 6 V, 2 A maximum output. Simply
connect the supply to the rated 100 V to 240 V ac wall outlet at
47 Hz to 63 Hz. The other end is a 2.1 mm inner diameter jack
that connects to the PCB at P503. Once on the PC board, the
6 V supply is fused and conditioned before connecting to three
low dropout linear regulators that supply the proper bias to each
of the various sections on the board.
OUTPUT SIGNALS
The default setup uses the HSC-ADC-FPGA high speed
deserialization board, which deserializes the digital output data
and converts it to parallel CMOS. These two channels interface
directly with ADI’s standard dual-channel FIFO data capture
board (HSC-ADC-EVALA-DC). Two of the four channels can
then be evaluated at the same time. For more information on
channel settings on these boards and their optional settings,
visit www.analog.com/FIFO.
When operating the evaluation board in a nondefault condition,
L504 to L506 can be removed to disconnect the switching
WALL OUTLET
100V TO 240V AC
47Hz TO 63Hz
DRVDD_DUT
GND
XFMR
INPUT
+
AD9229
EVALUATION BOARD
ROHDE & SCHWARZ,
SMHU,
2V p-p SIGNAL
SYNTHESIZER
CLK
CHA–CHD
12-BIT
SERIAL
LVDS
HSC-ADC-FPGA
HIGH SPEED
DESERIALIZATION
BOARD
HSC-ADC-EVALA-DC
FIFO DATA
CAPTURE
BOARD
2 CH
12-BIT
PARALLEL
CMOS
USB
CONNECTION
Figure 47. Evaluation Board Connections
Rev. B | Page 24 of 40
PC
RUNNING
ADC
ANALYZER
04418-040
BAND-PASS
FILTER
3.0V
–
GND
–
AVDD_VGA
ROHDE & SCHWARZ,
SMHU,
2V p-p SIGNAL
SYNTHESIZER
3.0V
+
+
GND
5.0V
–
SWITCHING
POWER
SUPPLY
AVDD_DUT
6V DC
2Amax
AD9229
DEFAULT OPERATION AND JUMPER SELECTION
SETTINGS
•
DTP: To enable one of the two digital test patterns on
digital outputs of the ADC, use JP202. If Pins 2 and 3 on
JP202 are tied together (1.0 V source), this enables test
pattern 1000 0000 0000. If Pins 1 and 2 on JP202 are tied
together (2.0 V source), this enables test pattern 1010 1010
1010. See the DTP Pin section for more details.
•
LVDSBIAS: To change the level of the LVDS output level
swing, simply change the value of R204. Other recommended values can be found in the Digital Outputs
section.
•
D+, D–: If an alternate data capture method to the setup
described in Figure 47 is used, optional receiver
terminations, R205 to R210, can be installed next to the
high speed backplane connector.
The following is a list of the default and optional settings or
modes allowed on the AD9229 Rev C evaluation board.
•
•
•
•
•
POWER: Connect the switching power supply that is
supplied in the evaluation kit between a rated 100 V to
240 V ac wall outlet at 47 Hz to 63 Hz and P503.
AIN: The evaluation board is set up for a transformer
coupled analog input with optimum 50 Ω impedance
matching out to 400 MHz. For more bandwidth response,
the 2.2 pF differential capacitor across the analog inputs
could be changed or removed. The common mode of the
analog inputs is developed from the center tap of the
transformer or AVDD_DUT/2.
VREF: VREF is set to 1.0 V by tying the SENSE pin to
ground, R224. This causes the ADC to operate in 2.0 V p-p
full-scale range. A number of other VREF options are
available on the evaluation board, including 1.0 V p-p fullscale range, a variable range that the user can set by
choosing R219 and R220 as well as a separate external
reference option using the ADR510 or ADR520. Simply
populate R218 and R222 and remove C208. To use these
optional VREF modes, switch the jumper setting on R221
to R224. Proper use of the VREF options is noted in the
Voltage Reference section.
CLOCK: The clock input circuitry is derived from a simple
logic circuit using a high speed inverter that adds a very
low amount of jitter to the clock path. The clock input is
50 Ω terminated and ac-coupled to handle sine wave
type inputs. If using an oscillator, two oscillator footprint
options are also available (OSC200-201) to check the
ADC’s performance. J203 and J204 give the user flexibility
in using the enable pin, which is common on most
oscillators.
ALTERNATE ANALOG INPUT DRIVE
CONFIGURATION
The following is a brief description of the alternate analog input
drive configuration using the AD8332 dual VGA. This particular drive option may need to be populated, in which case all
the necessary components are listed in Table 11. This table lists
the necessary settings to properly configure the evaluation
board for this option. For more details on the AD8332 dual
VGA, how it works, and its optional pin settings, consult the
AD8332 data sheet.
To configure the analog input to drive the VGA instead of the
default transformer option, the following components need to
be removed and/or changed.
1.
Remove R102, R115, R128, R141, T101, T102, T103, and
T1044 in the default analog input path.
2.
Populate R101, R114, R127, and R140 with 0 Ω resistors in
the analog input path.
3.
Populate R106, R107, R119, R120, R132, R133, R144, and
R145 with 10 kΩ resistors to provide an input commonmode level to the analog input.
4.
Populate R105, R113, R118, R124, R131, R137, R151, and
R43 with 0 Ω resistors in the analog input path.
5.
Currently L305 to L312 and L405 to L412 are populated
with 0 Ω resistors to allow signal connection. This area
allows the user to design a filter if additional requirements
are necessary.
PWDN: To enable the power-down feature, simply short
JP201 to AVDD on the PWDN pin.
Rev. B | Page 25 of 40
AD9229
R105
0Ω
DNP
INH1
CHANNEL A
P101
AIN
R101
0Ω
DNP
P102
DNP
R104
0Ω
C101
0.1μF
AIN
FB101 C102 CM1
0.1μF
10
R103
0Ω
R102
65Ω
AVDD_DUT
CH_A
CM1
R111
1kΩ
T101
1
6
2
5
3
4
VGA INPUT
CONNECTION
INH2
R152
DNP
R108
33Ω
VIN_A
CM1
R160
499Ω
FB103
10
C103
DNP
C104
2.2pF
R109
1kΩ
C105
DNP
R156
DNP
R110
33Ω
VIN_A
R107
1kΩ
DNP
C106
DNP
AVDD_DUT
C107
0.1μF
R118
0Ω
DNP
FB104 C108
0.1μF
10
P104
DNP
AIN
FB102
10
AVDD_DUT
CH_B
R114
0Ω
DNP
R115
65Ω
R106
1kΩ
DNP
R113
0Ω
DNP
R112
1kΩ
CHANNEL B
P103
AIN
AVDD_DUT
CH_A
VGA INPUT
CONNECTION
R116
0Ω
R117
0Ω
AVDD_DUT
C109 CM2
0.1μF
CH_B
CM2
R125
1kΩ
T102
1
6
2
5
3
4
R119
1kΩ
DNP
FB105
10
R153
DNP
R121
33Ω
VIN_B
CM2
R161
499Ω
FB106
10
C110
DNP
R123
1kΩ
C112
DNP
R157
DNP
R122
33Ω
VIN_B
R124
0Ω
DNP
R120
1kΩ
DNP
C113
DNP
R126
1kΩ
C111
2.2pF
AVDD_DUT
C114
0.1μF
ANALOG INPUTS
R131
0Ω
DNP
INH3
CHANNEL C
P105
AIN
R127
0Ω
DNP
P106
DNP
R130
0Ω
C115
0.1μF
AIN
FB107 C116 CM3
0.1μF
10
R129
0Ω
R128
65Ω
AVDD_DUT
CH_C
CM3
R138
1kΩ
T103
1
6
2
5
3
4
VGA INPUT
CONNECTION
INH4
R154
DNP
R134
33Ω
VIN_C
CM3
R162
499Ω
FB109
10
C117
DNP
C118
2.2pF
R135
1kΩ
C119
DNP
R158
DNP
R136
33Ω
VIN_C
R133
1kΩ
DNP
C120
DNP
AVDD_DUT
C121
0.1μF
AVDD_DUT
CH_D
FB110 C122
0.1μF
10
P108
DNP
AIN
FB108
10
R151
0Ω
DNP
R140
0Ω
DNP
R141
65Ω
R132
1kΩ
DNP
R137
0Ω
DNP
R139
1kΩ
CHANNEL D
P107
AIN
AVDD_DUT
CH_C
VGA INPUT
CONNECTION
R143
0Ω
R142
0Ω
AVDD_DUT
C123 CM4
0.1μF
CH_D
CM4
R149
1kΩ
6
2
5
3
4
R43
0Ω
DNP
FB111
10
R155
DNP
R146
33Ω
VIN_D
CM4
R163
499Ω
FB112
10
C124
DNP
C125
2.2pF
R148
1kΩ
C126
DNP
R159
DNP
R147
33Ω
VIN_D
R145
1kΩ
DNP
C127
DNP
AVDD_DUT
C128
0.1μF
04418-041
R150
1kΩ
T104
1
R144
1kΩ
DNP
DNP : DO NOT POPULATE
Figure 48. Evaluation Board Schematic, DUT Analog Inputs
Rev. B | Page 26 of 40
CHD
CHD
37
D–D
CHC
CHC
D+D
38
D–C
39
CHB
40
D–B
D+C
CHB
41
CHA
A–D
D+B
42
CHA
43
FCO
D+A
FCO
45
FCO–
FCO+
44
DCO
46
VIN +D
VIN –A
VIN –D
AGND
36
GND
35
DRVDD_DUT
34
33
GND
32
R204
4.0kΩ
AVDD_DUT
31
GND
30
GND
DUTCLK
29
AVDD_DUT
28
GND
27
VIN_D
26
VIN_D
25
GND
24
AGND
23
22
21
REFT
20
19
13
AGND
VIN –C
VIN +A
VIN +C
AGND
AVDD
AGND
REFB
AVDD
VREF
12
GND
AVDD
18
11
VIN_A
CLK
SENSE
10
VIN_A
OPTIONAL CLOCK OSCILLATOR
AGND
AD9229
PDWN
AVDD
GND
AGND
17
9
AVDD
16
8
AVDD_DUT
R203
10kΩ
AVDD
AGND
7
AVDD_DUT
47
AGND
6
GND
PWDN ENABLE
JP201
R228
10kΩ
4 DTP
15
3
JP202
DRVDD
LVDSBIAS
VIN +B
1
DRGND
DNC
5
AVDD_DUT
DRVDD
VIN –B
PIN 1 TO PIN 2 = 1010 1010 1010
PIN 2 TO PIN 3 = 1000 0000 0000
2
R202
10kΩ
3
DRGND
14
DRVDD_DUT
AVDD_DUT DIGITAL TEST
PATTERN
ENABLE
R201
10kΩ
2
DCO–
U201
1
GND
DCO+
48
DCO
AD9229
VIN_C
VIN _C
GND
AVDD_DUT
VREF_DUT
JP203
VSENSE_DUT
AVDD_DUT
JP204
AVDD_DUT
GND
VIN_B
VIN _B
DIGITAL OUTPUTS
OSC200
4
C209
0.1μF
EOH
GND
DCO
VCC
OUTPUT
3
C204
0.1μF
OSC201
1
14
C210
0.1μF
NC/ENB
GND
VCC
OUTPUT
FCO
40
C9
39
58
C202
10μF
REFERENCE
DECOUPLING
CBELV3I66MT
C10
59
C203
0.1μF
2
GNDCD10
R205
60
AVDD_VGA
1
P202
CHA
C201
0.1μF
C8
38
57
CHB
7
C7
37
56
8
CHC
R225
0Ω
DNP
CX3600C-65
DNP
C6
36
55
CHD
CLOCK CIRCUIT
AVDD_DUT
C5
35
DNP
GNDCD9
R206
DNP
GNDCD8
R207
DNP
GNDCD7
R208
DNP
GNDCD6
R209
DNP
GNDCD5
R210
DNP
GNDCD4
D10
50
D9
49
D8
48
D7
47
D6
46
D5
45
DCO
FCO
CHA
CHB
CHC
CHD
54
R212
1kΩ
P201
ENCODE
INPUT
C205
0.1μF
R213
49.9Ω
R211
1kΩ
R229
0Ω
U202
U202
1
R231
0Ω
DNP
2
3
4
34
R214
22Ω
AVDD_DUT:14 AVDD_DUT:14
GND:7
GND:7
C4
D4
GNDCD3
44
53
DUTCLK
R230
0Ω
DNP
33
C3
D3
GNDCD2
43
52
32
C2
D2
GNDCD1
42
51
31
C1
D1
GNDAB10
41
30
10
EXTERNAL REFERENCE CIRCUIT
9
REFERENCE CIRCUIT
8
VREF SELECT
R218
0Ω
DNP
R215
2kΩ
ADR510/ADR520
VREF_DUT
R221
0Ω
1NV VOUT
GND
TRIM/NC
B10
GNDAB9
20
A9
B9
GNDAB8
19
28
AVDD_DUT
U203
A10
29
VREF = 1V = DEFAULT
7
VREF = 0.5V
A8
B8
GNDAB7
18
27
A7
B7
GNDAB6
17
26
C206
0.1μF
R216
10kΩ
R217
470kΩ
C207
0.1μF
CW
C208
10μF
R219
DNP
AVDD_DUT
R222
0Ω
R223
0Ω
R224
0Ω
R220
DNP
6
VREF = EXTERNAL
A6
B6
GNDAB5
16
25
5
VREF = 0.5V (1 + R219/R220)
4
VREF = 1V
A5
B5
GNDAB4
15
24
A4
B4
GNDAB3
14
23
VSENSE_DUT
3
A3
B3
GNDAB2
13
22
REMOVE C208 WHEN
USING EXTERNAL VREF
2
A2
B2
GNDAB1
12
21
1
A1
B1
11
R205-R210
OPTIONAL OUTPUT
TERMINATIONS
DNP : DO NOT POPULATE
Figure 49. Evaluation Board Schematic, DUT, VREF, Clock Inputs, and Digital Output Interface
Rev. B | Page 27 of 40
04418-042
1469169-1
POPULATE L305 TO L312
WITH 0Ω RESISTORS OR
DESIGN YOUR OWN FILTER
R321
DNP
C303
DNP
C304
DNP
R318
DNP
C307
0.1μF
CH_C
R320
DNP
C305
DNP
L309
DNP
CH_C
L306
DNP L307
DNP
L310
DNP L311
DNP
1
C310
0.1μF
2
GND
VG
L312
DNP
R307
187Ω
R302
10kΩ
VG
CW
R303
39kΩ
R308
374Ω
C308
0.1μF
R306
187Ω
L308
DNP
EXT VG
JP301
R319
DNP
C309
0.1μF
R305
374Ω
R304
187Ω
C306
DNP
R309
187Ω
AVDD_VGA
C311
1nF
AVDD_VGA
C312
0.1μF
R310
100kΩ
DNP
16
RCLMP
26
15
ENBL
GAIN
HILO
MODE
27
14
28
13
VCM2
AD8332
29
12
VIN1
VIN2
VIP1
VIP2
30
11
31
10
COM1
C321
18nF
C325
0.1μF
C323
22pF
VPS2
LON2
C316
0.1μF
R316
274Ω
C319
0.1μF
C320
10μF
R317
10kΩ
DNP
C322
18nF
C326
0.1μF
C324
22pF
L313
120nH
L314
120nH
C327
0.1μF
C328
0.1μF
DNP : DO NOT POPULATE
INH4
INH3
Figure 50. Evaluation Board Schematic, Optional DUT Analog Input Drive
Rev. B | Page 28 of 40
044181-003
R315
274Ω
LOP2
8
7
INH2
LMD2
6
5
INH1
4
3
2
VPS1
LON1
1
C318
0.1μF
AVDD_VGA
C317
10μF
AVDD_VGA
R314
10kΩ
LMD1
9
LOP1
C315
0.1μF
C314
0.1μF
COM2
32
MODE PIN
POSITIVE GAIN SLOPE = 0V TO 1.0V
NEGATIVE GAIN SLOPE = 2.25V TO 5.0V
VCM1
C313
0.1μF
R311
10kΩ
DNP
VG
RCLAMP PIN
HILO PIN = LO = ± 50mV
HILO PIN = HI = ± 75mV
AVDD_VGA
COMM
VOH2
17
18
19
VOL2
20
NC
22
23
21
VPSV
ENBV
VOL1
25
R311
10kΩ
DNP
VOH1
U301
COMM
R312
10Ω
24
AVDD_VGA
HILO PIN
HI GAIN RANGE = 2.25V TO 5.0V
LO GAIN RANGE = 0V TO 1.0V
OPTIONAL VGA DRIVE CIRCUIT FOR CHANNELS C AND D
POWER-DOWN ENABLE
(0V TO 1V = DISABLE POWER)
L305
DNP
CH_D
VARIABLE GAIN CIRCUIT
(0V TO 1.0V DC)
CH_D
EXTERNAL
VARIABLE GAIN DRIVE
AD9229
AD9229
CH_B
POPULATE L405 TO L412
WITH 0Ω RESISTORS OR
DESIGN YOUR OWN FILTER
CH_A
R417
DNP
R418
DNP
C403
DNP
C404
DNP
C405
DNP
L409
DNP
CH_A
R415
DNP
L406
DNP L407
DNP
L410
DNP L411
DNP
C407
0.1μF
R405
187Ω
L408
DNP
L412
DNP
R416
DNP
C410
0.1μF
C409
0.1μF
C408
0.1μF
R404
374Ω
R403
187Ω
C406
DNP
R407
374Ω
R406
187Ω
R408
187Ω
C411
1nF
AVDD_VGA
C412
0.1μF
R409
100kΩ
DNP
16
RCLMP
26
15
ENBL
GAIN
HILO
MODE
27
14
28
13
VCM2
AD8332
29
12
VIN1
VIN2
VIP1
VIP2
30
11
31
10
COM1
LON2
VPS2
R412
274Ω
C423
18nF
C421
0.1μF
C425
22pF
C416
0.1μF
8
7
INH2
LMD2
6
5
4
3
INH1
VPS1
LON1
2
1
C418
0.1μF
LOP2
R413
274Ω
C419
0.1μF
C420
10μF
R414
10kΩ
DNP
C424
18nF
C422
0.1μF
C426
22pF
L413
120pH
L414
120nH
C427
0.1μF
C428
0.1μF
DNP : DO NOT POPULATE
INH2
INH1
Figure 51. Evaluation Board Schematic, Optional DUT Analog Input Drive Continued
Rev. B | Page 29 of 40
044181-044
C417
10μF
AVDD_VGA
R411
10kΩ
LMD1
9
LOP1
C415
0.1μF
C414
0.1μF
COM2
32
MODE PIN
POSITIVE GAIN SLOPE = 0V TO 1.0V
NEGATIVE GAIN SLOPE = 2.25V TO 5.0V
VCM1
C413
0.1μF
R409
10kΩ
DNP
VG
RCLAMP PIN
HILO PIN = LO = ± 50mV
HILO PIN = HI = ± 75mV
AVDD_VGA
COMM
VOH2
17
18
19
VOL2
20
NC
22
23
21
VPSV
ENBV
VOL1
25
R401
10kΩ
DNP
VOH1
U401
COMM
R402
10kΩ
24
AVDD_VGA
HILO PIN
HI GAIN RANGE = 2.25V TO 5.0V
LO GAIN RANGE = 0V TO 1.0V
OPTIONAL VGA DRIVE CIRCUIT FOR CHANNELS A AND B
POWER-DOWN ENABLE
(0V TO 1V = DISABLE POWER)
L405
DNP
CH_B
AD9229
POWER SUPPLY INPUT
6V
2A MAX
FER501
CHOKE_COIL
F501
P503
4
1
SMDC110F
1
D502
SHOT_RECT
3A
DO-214AB
PWR_IN
3
2
R500
374Ω
D501
S2A_RECT
2A
DO-214AA
C501
10μF
3 2
CR500
U501
L504
10μH
ADP33339AKC-3
PWR_IN
3
INPUT
OUTPUT1
2
OUTPUT4 4
C502
1μF
GND
1
DUT_AVDD
C503
1μF
U502
L506
10μH
ADP33339AKC-5
3
PWR_IN
INPUT
OUTPUT1
2
OUTPUT4 4
C514
1μF
GND
1
VGA_AVDD
C515
1μF
U503
L505
10μH
ADP33339AKC-3
PWR_IN
3
INPUT
C506
1μF
OUTPUT1
2
OUTPUT4 4
GND
1
DUT_DRVDD
C507
1μF
OPTIONAL POWER INPUT
P501
DNP
P1
P2
P3
P4
P5
P6
1
VGA_AVDD
L503
10μH
AVDD_VGA 5.0V
2
3
DUT_AVDD
4
5
C516
10μF
DUT_DRVDD
C517
0.1μF
L502
10μH
AVDD_DUT 3.0V
6
C508
10μF
C509
0.1μF
L501
10μH
DNP : DO NOT POPULATE
Figure 52. Evaluation Board Schematic, Power Supply Inputs
Rev. B | Page 30 of 40
C505
0.1μF
04418-045
DRVDD_DUT 3.0V
C504
10μF
AD9229
DECOUPLING CAPACITORS
DRVDD_DUT
C613
0.1μF
C614
0.1μF
AVDD_VGA
C617
0.1μF
C618
0.1μF
C619
0.1μF
C620
0.1μF
C625
0.1μF
C630
0.1μF
C631
0.1μF
C621
0.1μF
C632
0.1μF
C628
0.1μF
AVDD_DUT
C627
0.1μF
H1
H2
H3
H4
UNUSED GATES
U202
GND
5
MOUNTING HOLES
CONNECTED TO GROUND
6
AVDD_DUT : 14
GND : 7
U202
9
8
AVDD_DUT : 14
GND : 7
U202
11
10
AVDD_DUT : 14
GND : 7
U202
12
AVDD_DUT : 14
GND : 7
DNP : DO NOT POPULATE
Figure 53. Evaluation Board Schematic, Decoupling and Miscellaneous
Rev. B | Page 31 of 40
04418-046
13
04418-047
AD9229
Figure 54. Evaluation Board Layout, Primary Side
Rev. B | Page 32 of 40
04418-048
AD9229
Figure 55. Evaluation Board Layout, Ground Plane
Rev. B | Page 33 of 40
04418-049
AD9229
Figure 56. Evaluation Board Layout, Power Plane
Rev. B | Page 34 of 40
04418-050
AD9229
Figure 57. Evaluation Board Layout, Secondary Side (Mirrored Image)
Rev. B | Page 35 of 40
AD9229
Table 11. Evaluation Board Bill of Materials (BOM)
Item
1
2
Qnty.
per
Board
1
59
3
4
4
9
5
8
6
REFDES
AD9229LFCSP_REVC
C327, C328, C630, C628,
C629, C631, C632, C101,
C102, C107, C108, C109,
C114, C115, C116, C121,
C122, C123, C128, C201,
C203, C204, C205, C206,
C207, C313, C314, C315,
C312, C318, C319, C412,
C316, C325,C326, C413,
C414, C415, C418, C419,
C416, C421, C422, C427,
C428, C505, C509, C517,
C613, C614, C617, C618,
C619, C620, C621, C625,
C209, C210, C627
C104, C111, C118, C125
Device
PCB
Capacitor
Pkg.
PCB
402
Value
PCB
0.1 μF, ceramic,
X5R, 10 V, 10% tol
Mfg.
Mfg. Part Number
Panasonic
ECJ-0EB1A104K
Capacitor
402
Murata
GRM1555C1H2R2GZ01B
Capacitor
805
AVX
08056D106KAT2A
Capacitor
603
C0603C104K4RACTU
Capacitor
402
Kemet
C0402C102K3RACTU
7
4
C321, C322, C423, C424
Capacitor
402
AVX
0402YC183KAT2A
8
4
C323, C324, C425, C426
Capacitor
402
Kemet
C0402C220J5GACTU
9
1
C501
Capacitor
1206
Kemet
T491B106K016AS
10
6
Capacitor
603
Panasonic
ECJ-1VB0J105K
11
1
C502, C503, C506, C507,
C514, C515
CR500
LED
603
Panasonic
LNJ314G8TRA
12
1
D502
Diode
DO-214AB
0.1 μF, ceramic,
X7R, 16 V, 10% tol
1000 pF, ceramic,
X7R, 25 V, 10% tol
0.018 μF, ceramic,
X7R, 16 V, 10% tol
22 pF, ceramic,
NPO, 5% tol, 50 V
10 μF, tantalum,
16 V, 10% tol
1 μF, ceramic, X5R,
6.3 V, 10% tol
Green, 4 V, 5 m
candela
3 A, 30 V, SMC
Kemet
2
C202, C208, C317, C320,
C417, C420, C504, C508,
C516
C307, C308, C309, C310,
C407, C408, C409, C410
C311, C411
2.2 pF, ceramic,
COG, 0.25 pF tol,
50 V
10 μF, 6.3 V ±10%
ceramic X5R
SK33MSCT
13
1
D501
Diode
DO-214AA
2 A, 50 V, SMC
14
1
F501
Fuse
1210
15
1
FER501
2020
Murata
DLW5BSN191SQ2L
16
12
Murata
BLM18BA100SN1
17
2
FB101, FB102, FB103,
FB104, FB105, FB106,
FB107, FB108, FB109,
FB110, FB111, FB112
JP201, JP301
Ferrite
bead
Ferrite
bead
6.0 V, 2.2 A trip
current resettable
fuse
10 μH, 5 A, 50 V,
190 Ω @ 100 MHz
10 Ω, test freq
100 MHz, 25% tol,
500 mA
Micro
Commercial
Co.
Micro
Commercial
Co.
Tyco/Raychem
Connector
2-pin
Samtec
TSW-102-07-G-S
18
3
JP204, JP203, JP202
Connector
3-pin
Samtec
TSW-103-07-G-S
603
100 mil header
jumper, 2-pin
100 mil header
jumper, 3-pin
Rev. B | Page 36 of 40
S2A
NANOSMDC110F-2
AD9229
Item
19
Qnty.
per
Board
6
20
REFDES
L501, L502, L503, L504,
L505, L506
Device
Ferrite
bead
Pkg.
1210
Value
10 μH, bead core
3.2 × 2.5 × 1.6 SMD,
2A
120 nH, test freq
100 MHz, 5% tol,
150 mA
0 Ω, 1/8 W, 5% tol
Mfg.
Panasonic ECG
Mfg. Part Number
EXC-CL3225U1
4
L313, L314, L413, L414
Inductor
402
Murata
LQG15HNR12J02B
21
12
Resistor
805
22
1
L305, L306, L307, L308,
L309, L310, L405, L406,
L407, L408, L409, L410,
L311, L312, L411, L412
OSC200
Panasonic
ERJ-6GEY0R00V
Oscillator
SMT
Clock oscillator,
66.66 MHz, 3.3 V
Sidemount SMA
for 0.063" board
thickness
1469169-1, right
angle 2-pair,
25 mm, header
assembly
RAPC722, power
supply connector
10 kΩ, 1/16 W, 5%
tol
CTS REEVES
CB3LV-3C-66M6666-T
23
5
P201, P101, P103, P105,
P107
Connector
SMA
Johnson
Components
142-0711-821
24
1
P202
Connector
HEADER
Tyco
1469169-1
25
1
P503
Connector
0.1", PCMT
Switchcraft
SC1153
26
10
Resistor
402
27
7
R201, R202, R228, R203,
R312, R314, R317, R402,
R411, R414
R225, R129, R142, R224
Yageo
America
9C04021A1002JLHF3
Resistor
402
0 Ω, 1/16 W, 5% tol
9C04021A0R00JLHF3
Resistor
402
ERJ-2RKF64R9X
Resistor
Resistor
603
402
Panasonic
Panasonic
ERJ-3GEY0R00V
ERJ-2RKF1001X
Resistor
402
Resistor
402
Yageo
America
Panasonic
9C04021A33R0JLHF3
4
R104, R116, R130, R143
R111, R112, R125, R126,
R138, R139, R149, R150,
R211, R212, R109, R123,
R135, R148
R108, R110, R121, R122,
R134, R136, R146, R147
R160, R161, R162, R163
64.9 Ω, 1/16 W,
1% tol
0 Ω, 1/10 W, 5% tol
1 kΩ, 1/16 W, 1% tol
Yageo
America
Panasonic
28
4
R102, R115, R128, R141
29
30
4
14
31
8
32
33
1
R215
Resistor
402
9C04021A2001JLHF3
34
1
R204
Resistor
402
Yageo
America
Panasonic
35
1
R213
Resistor
402
Susumu
RR0510R-49R9-D
36
1
R214
Resistor
402
9C04021A22R0JLHF3
37
2
R216,R302
Potentiom
eter
3-lead
Yageo
America
BC
Components
38
1
R217
Resistor
402
39
1
R303
Resistor
402
40
8
R304, R306, R307, R309,
R403, R405, R406, R408,
Resistor
402
33 Ω, 1/16 W, 5%
tol
499 Ω, 1/16 W,
1% tol
2 kΩ, 1/16 W, 5% tol
4.02 kΩ, 1/16 W,
1% tol
49.9 Ω, 1/16 W,
0.5% tol
22 Ω, 1/16 W,
5% tol
10 kΩ, Cermet
trimmer
potentiometer,
18 turn top adjust,
10%, ½ W
470 kΩ, 1/16 W,
5% tol
39 kΩ, 1/16 W,
5% tol
187 Ω, 1/16 W,
1% tol
Rev. B | Page 37 of 40
ERJ-2RKF4990X
ERJ-2RKF4021X
CT-94W-103
Yageo
America
Susumu
9C04021A4703JLHF3
Panasonic
ERJ-2RKF1870X
RR0510P-393-D
AD9229
Item
41
Qnty.
per
Board
4
42
4
REFDES
R305, R308, R404, R407,
R500
R315, R316, R412, R413
43
4
44
Device
Resistor
Pkg.
402
Resistor
402
T101, T102, T103, T104
Transforme
r
CD542
2
U501, U503
IC
SOT-223
45
2
U301, U401
IC
LFCSP, CP32
46
47
1
1
U502
U201
IC
IC
SOT-223
LFCSP, CP48-1
48
1
U203
IC
SOT-23
49
1
U202
IC
TSSOP
50
4
MP101-104
Part of
assembly
51
4
MP105-108
52
4
MP109-112
Part of
assembly
Part of
assembly
Value
374 Ω, 1/16 W,
1% tol
274 Ω, 1/16 W,
1% tol
ADT1-1WT, 1:1
impedance ratio
transformer
ADP33339AKC-3,
1.5 A, 3.0 V LDO
regulator
AD8332ACP,
ultralow noise
precision dual VGA
ADP33339AKC-5
AD9229-65, quad
12-bit, 65 MSPS
serial LVDS 3 V ADC
ADR510AR, 1.0 V,
precision low noise
shunt voltage
reference
74VHC04MTC, hex
inverter
CBSB-14-01A-RT,
7/8" height,
standoffs for circuit
board support
SNT-100-BK-G-H,
100 mil jumpers
5-330808-3, pin
sockets, closed end
for OSC200
Rev. B | Page 38 of 40
Mfg.
Panasonic
Mfg. Part Number
ERJ-2RKF3740X
Panasonic
ERJ-2RKF2740X
Mini-Circuits
ADT1-1WT
ADI
ADP33339AKC-3
ADI
AD8332ACP
ADI
ADI
ADP33339AKC-5
AD9229ABCPZ-65
ADI
ADR510AR
Fairchild
74VHC04MTC
Richco
CBSB-14-01A-RT
Samtec
SNT-100-BK-G-H
AMP
5-330808-3
AD9229
OUTLINE DIMENSIONS
0.30
0.23
0.18
0.60 MAX
0.60 MAX
37
36
PIN 1
INDICATOR
6.85
6.75 SQ
6.65
48
1
0.50
REF
*5.55
EXPOSED
PAD
5.50 SQ
5.45
(BOTTOM VIEW)
25
24
TOP VIEW
1.00
0.85
0.80
12° MAX
0.80 MAX
0.65 TYP
0.50
0.40
0.30
13
12
0.22 MIN
5.50 REF
0.05 MAX
0.02 NOM
COPLANARITY
0.08
0.20 REF
SEATING
PLANE
PIN 1
INDICATOR
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
SECTION OF THIS DATA SHEET.
*COMPLIANT TO JEDEC STANDARDS MO-220-VKKD-2
WITH EXCEPTION TO EXPOSED PAD DIMENSION.
02-23-2010-C
7.10
7.00 SQ
6.90
Figure 58. 48-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
7 mm × 7 mm Body, Very Thin Quad
(CP-48-8)
Dimensions shown in millimeters
ORDERING GUIDE
Model 1
AD9229ABCPZ-65
AD9229ABCPZRL7-65
AD9229ABCPZ-50
AD9229ABCPZRL7-50
1
Temperature Range
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
Package Description
48-Lead LFCSP_VQ
48-Lead LFCSP_VQ
48-Lead LFCSP_VQ
48-Lead LFCSP_VQ
Z = RoHS Compliant Part.
Rev. B | Page 39 of 40
Package Option
CP-48-8
CP-48-8
CP-48-8
CP-48-8
AD9229
NOTES
© 2005–2010 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D04418–0–5/10(B)
Rev. B | Page 40 of 40