REVISIONS LTR DESCRIPTION A DATE (YR-MO-DA) APPROVED 13-05-06 Charles F. Saffle Added radiation hardness assurance requirements. Table I: sheet 6, under the Group A subgroups column added footnote 4 for the Address input currents and Enable input current tests. Table I: sheet 7, under the Group A subgroups column added footnote 4 for all current tests. Updated drawing paragraphs. -sld REV SHEET REV A A A A A SHEET 15 16 17 18 19 REV STATUS REV A A A A A A A A A A A A A A OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PMIC N/A PREPARED BY Steve Duncan STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 CHECKED BY Greg Cecil APPROVED BY Charles F. Saffle DRAWING APPROVAL DATE 10-02-23 REVISION LEVEL A http://www.landandmaritime.dla.mil/ MICROCIRCUIT, HYBRID, LINEAR, DUAL 16 CHANNEL, ANALOG MULTIPLEXER SIZE CAGE CODE A 67268 SHEET DSCC FORM 2233 APR 97 1 OF 5962-09231 19 5962-E400-13 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 Federal stock class designator \ F RHA designator (see 1.2.1) 09231 01 Device type (see 1.2.2) / K Device class designator (see 1.2.3) X Case outline (see 1.2.4) C Lead finish (see 1.2.5) \/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type Generic number 01 MUX8522 02 MUX8523 Circuit function Dual 16 channel analog multiplexer, high impedance analog input Dual 16 channel analog multiplexer, high impedance analog input with ESD protection 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level. All levels are defined by the requirements of MIL-PRF-38534 and require QML Certification as well as qualification (Class H, K, and E) or QML Listing (Class G and D). The product assurance levels are as follows: Device class Device performance documentation K Highest reliability class available. This level is intended for use in space applications. H Standard military quality class level. This level is intended for use in applications where non-space high reliability devices are required. G Reduced testing version of the standard military quality class. This level uses the Class H screening and In-Process Inspections with a possible limited temperature range, manufacturer specified incoming flow, and the manufacturer guarantees (but may not test) periodic and conformance inspections (Group A, B, C, and D). E Designates devices which are based upon one of the other classes (K, H, or G) with exception(s) taken to the requirements of that class. These exception(s) must be specified in the device acquisition document; therefore the acquisition document should be reviewed to ensure that the exception(s) taken will not adversely affect system performance. D Manufacturer specified quality class. Quality level is defined by the manufacturers internal, QML certified flow. This product may have a limited temperature range. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 2 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator Terminals Package style See figure 1 56 Ceramic quad flat pack X 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. 1.3 Absolute maximum ratings. 1/ Positive supply voltage between +VEE and GND ...................................... Negative supply voltage between -VEE and GND...................................... VREF to GND.............................................................................................. Digital input overvoltage range: VEN (pins 13 and 44) .............................................................................. VA (pins 14, 15, 16, and 17)................................................................... VB (Pins 40,41,42, and 43) .................................................................... Analog input overvoltage range: Device type 01....................................................................................... Device type 02....................................................................................... Power dissipation (PD), TC = -55°C to +125°C .......................................... Thermal resistance junction-to-case (θJC) ................................................. Storage temperature ................................................................................. Lead temperature (soldering, 10 seconds) ............................................... +16.5 V dc -16.5 V dc +16.5 V dc (< VREF + 4)V, (> GND - 4)V (< VREF + 4)V, (> GND - 4)V (< VREF + 4)V, (> GND - 4)V -35 V dc ≤ VIN ≤ +35 V dc -18 V dc ≤ VIN ≤ +18 V dc 33 mW 10°C/W 2/ -65°C to +150°C +300°C 1.4 Recommended operating conditions. Positive supply voltage (+VEE) .................................................................. Negative supply voltage (-VEE).................................................................. VREF........................................................................................................... Logic low level voltage (VAL) ..................................................................... Logic high level voltage (VAH) ................................................................... Case operating temperature range (TC).................................................... +15 V dc 3/ -15 V dc 3/ +5 V dc 3/ +0.8 V dc +4.0 V dc -55°C to +125°C 1.5 Radiation features. 4/ Maximum Total Ionizing Dose (TID) (dose rate = 50 - 300 rad(Si)/s) ....... Enhanced Low Dose Rate Sensitvity (ELDRS) ........................................ Single Event Phenomenon (SEP) effective linear energy transfer (LET): Single Event Latchup (SEL) .................................................................. Single Event Upset (SEU) ..................................................................... Single Event Transient (SET)................................................................ 1/ 2/ 3/ 4/ 5/ 6/ 7/ 300 krad(Si) 5/ 6/ 150 krad(Si) 5/ Immune 5/ ≤ 86 MeV-cm2/mg 7/ ≤ 86 MeV-cm2/mg 7/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Based on the maximum power dissipation spread over the multiplexer die. Recommended power supply turn on sequence : +VEE, -VEE, followed by VREF. See section 4.3.5 for the manufacturer's radiation hardness assurance analysis and testing. The only active element in these devices are purchased as SMD 5962F9563002V9A which assures TID, ELDRS, and SEL. The package in this drawing is a larger version of the same type (flat package) as the one in SMD 5962-95630, the lid underside is nickel plate (no gold), and RGA data shows negligible amounts of hydrogen. SEU and SET testing performed at 86 MeV-cm2/mg with no upsets or single event transients. These devices will be retested after design or process changes that can affect RHA response of these devices. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 3 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 - Test Method Standard Microcircuits. MIL-STD-1835 - Interface Standard Electronic Component Case Outlines. DEPARTMENT OF DEFENSE HANDBOOKS MIL-HDBK-103 - List of Standard Microcircuit Drawings. MIL-HDBK-780 - Standard Microcircuit Drawings. (Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 shall include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or function of the device for the applicable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.2.3 Truth table(s). The truth table(s) shall be as specified on figure 3. 3.2.4 Switching waveform(s). The switching waveform(s) shall be as specified on figure 4. 3.2.5 Block diagram. The block diagram shall be as specified on figure 5. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 4 3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DLA Land and Maritime -VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 5 TABLE I. Electrical performance characteristics. Test Supply currents Address input currents Enable input current Symbol Group A subgroups Conditions 1/ 2/ -55°C ≤ TC ≤ +125°C unless otherwise specified Device types Limits Unit Min Max +IEE VEN(0-15) = VEN(16-31) = VA(0-3) = VB(0-3) = 0 1,2,3 All 0.1 1 mA -IEE VEN(0-15) = VEN(16-31) = VA(0-3) = VB(0-3) = 0 1,2,3 All -1 -0.1 mA +ISBY VEN(0-15) = VEN(16-31) = 4 V, VA(0-3) = VB(0-3) = 0 3/ 1,2,3 All 0.1 1 mA -ISBY VEN(0-15) = VEN(16-31) = 4 V, VA(0-3) = VB(0-3) = 0 3/ 1,2,3 All -1 -0.1 mA IAL(0-3)A VA = 0 V 1,2,3 4/ All -1 1 µA IAH(0-3)A VA = 5 V 1,2,3 4/ All -1 1 µA IAL(0-3)B VB = 0 V 1,2,3 4/ All -1 1 µA IAH(0-3)B VB = 5 V 1,2,3 4/ All -1 1 µA IENL(0-15) VEN(0-15) = 0 V 1,2,3 4/ All -1 1 µA IENH(0-15) VEN(0-15) = 5 V 1,2,3 4/ All -1 1 µA IENL(16-31) VEN(16-31) = 0 V 1,2,3 4/ All -1 1 µA IENH(16-31) VEN(16-31) = 5 V 1,2,3 4/ All -1 1 µA See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ 2/ -55°C ≤ TC ≤ +125°C unless otherwise specified Group A subgroups +ISOFFOUTPUT(ALL) Negative input leakage current (CH0-CH31) -ISOFFOUTPUT(ALL) Positive output leakage current outputs (pins 12 and 45) +IDOFFOUTPUT(ALL) VOUT = +10 V, VEN = 4 V, output and all unused inputs = -10 V 6/ 7/ Negative output leakage current outputs (pins 12 and 45) -IDOFFOUTPUT(ALL) VOUT = -10 V, VEN = 4 V, output and all unused inputs = +10 V 6/ 7/ Input clamped voltage (CH0-CH31) +VCLMP VEN = 4 V, all unused inputs are open 6/ -VCLMP VIN = +10 V, VEN = 4 V, output and all unused inputs = -10 V 5/ 6/ 01 -100 +100 02 -100 +700 01 -100 +100 02 -100 +700 All -100 +100 nA All -100 +100 nA 02 18.0 23.0 V 2 18.0 23.5 3 17.5 22.5 -23.0 -18.0 2 -23.5 -18.0 3 -22.5 -17.5 1,2,3 4/ 1,2,3 4/ 1 1 VEN = 4 V, all unused inputs are open 6/ Unit Max 1,2,3 4/ VIN = -10 V, VEN = 4 V, output and all unused inputs = +10 V 5/ 6/ Limits Min 1,2,3 4/ Positive input leakage current (CH0-CH31) Device types 02 nA nA V See footnotes at end of table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 7 TABLE I. Electrical performance characteristics - Continued. Test Symbol Switch ON resistance outputs (pins 12 and 45) Switching tests Conditions 1/ 2/ -55°C ≤ TC ≤ +125°C unless otherwise specified Group A subgroups Device types Limits Unit Min Max RDS(ON)(0-31)A VIN = +15 V, VEN = 0.8 V, IOUT = -1 mA 5/ 6/ 8/ 1,2,3 All 500 3000 Ω RDS(ON)(0-31)B VIN = +5 V, VEN = 0.8 V, IOUT = -1 mA 5/ 6/ 8/ 1,2,3 All 500 3000 Ω RDS(ON)(0-31)C VIN = -5 V, VEN = 0.8 V, IOUT = +1 mA 5/ 6/ 8/ 1,2,3 All 500 3000 Ω tAHL RL = 10 kΩ, CL = 50 pF, See figure 4 9,10,11 All 10 1500 ns tALH RL = 10 kΩ, CL = 50 pF, See figure 4 9,10 All 10 2000 ns 10 5000 11 tONEN RL = 1 kΩ, CL = 50 pF, See figure 4 9,10,11 All 10 1500 ns tOFFEN RL = 1 kΩ, CL = 50 pF, See figure 4 9,10,11 All 10 1000 ns 1/ +VEE = +15 V dc, -VEE = -15 V dc, and VREF = +5 V dc, unless otherwise specified. Recommended power supply turn on sequence : +VEE, -VEE, followed by VREF. 2/ Measure inputs sequentially. Ground all unused inputs. 3/ If not tested, shall be guaranteed to the limits specified in table I. 4/ Subgroup 3 for these parameters is guaranteed, but not production tested. 5/ VIN is the applied input voltage to the input channels (CH0-CH31). 6/ VEN is the applied input voltage to the enable lines EN(0- 5) and EN(16-31). 7/ VOUT is the applied input voltage to the output lines OUTPUT1(0-15) and OUTPUT2(16-31). 8/ Negative current is the current flowing out of each of the pins. Positive current is the current flowing into each of the pins. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 8 Case outline X. FIGURE 1. Case outline(s). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 9 Case outline X - Continued. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 10 Case outline X - Continued. Inches Symbol Min Millimeters Max A Min Max .190 4.83 A1 .139 .170 3.53 4.32 A2 .005 .011 0.13 0.28 b .0135 .0195 0.34 0.50 c .005 .008 0.13 0.20 D/E .790 .810 20.07 20.57 D1 .645 .655 16.38 16.64 e .050 BSC 1.27 BSC F .200 TYP 5.08 TYP J .035 TYP 0.89 TYP L 2.490 2.510 L1 63.25 63.75 2.580 65.53 L2 1.700 1.740 43.18 44.20 L3 2.090 2.110 53.09 53.59 L4 .650 TYP 16.51 TYP N 56 56 S1 .030 TYP 0.76 TYP S2 .015 TYP 0.38 TYP NOTES: 1. Pin 1 is indicated by an ESD triangle on top of the package and by an index on the bottom of the package. 2. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. 3. N equals 56, the total number of leads on the package. 4. Pin numbers are for reference only. FIGURE 1. Case outline(s) - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 11 Device types 01 and 02 Case outline Terminal number Terminal symbol X Terminal number Terminal symbol 1 CH0 29 CH31 2 CH1 30 CH30 3 CH2 31 CH29 4 CH3 32 CH28 5 CH4 33 CH27 6 CH5 34 CH26 7 GND 35 GND 8 GND 36 GND 9 CH6 37 CH25 10 CH7 38 CH24 11 CASE GND 39 VREF 12 OUTPUT1(0-15) 40 B3 13 EN (0 − 15 ) 41 B2 14 A0 42 B1 15 A1 43 B0 16 A2 44 EN (16 − 31) 17 A3 45 OUTPUT2(16-31) 18 +VEE 46 -VEE 19 CH15 47 CH16 20 CH14 48 CH17 21 GND 49 GND 22 GND 50 GND 23 CH13 51 CH18 24 CH12 52 CH19 25 CH11 53 CH20 26 CH10 54 CH21 27 CH9 55 CH22 28 CH8 56 CH23 NOTE: 1. Package lid is internally connected to circuit ground (Pins 7, 8, 11, 21, 22, 35, 36, 49, and 50). FIGURE 2. Terminal connections. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 12 Truth table (CH0-CH15) A3 X L L L L L L L L H H H H H H H H A2 X L L L L H H H H L L L L H H H H A1 X L L H H L L H H L L H H L L H H A0 X L H L H L H L H L H L H L H L H EN (0-15) H L L L L L L L L L L L L L L L L "ON" Channel OUTPUT1 1/ None CH0 CH1 CH2 CH3 CH4 CH5 CH6 CH7 CH8 CH9 CH10 CH11 CH12 CH13 CH14 CH15 Truth table (CH16-CH31) B3 X L L L L L L L L H H H H H H H H B2 X L L L L H H H H L L L L H H H H B1 X L L H H L L H H L L H H L L H H B0 X L H L H L H L H L H L H L H L H EN (16-31) H L L L L L L L L L L L L L L L L "ON" Channel OUTPUT2 2/ None CH16 CH17 CH18 CH19 CH20 CH21 CH22 CH23 CH24 CH25 CH26 CH27 CH28 CH29 CH30 CH31 1/ Between (CH0-CH15) and OUTPUT1(0-15). 2/ Between (CH16-CH31) and OUTPUT2(16-31). FIGURE 3. Truth table. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 13 NOTE: f = 10 kHz, duty cycle = 50%. FIGURE 4. Switching test waveform(s). STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 14 FIGURE 5. Block Diagram. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 15 FIGURE 5. Block diagram - Continued. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 16 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Subgroups (in accordance with MIL-PRF-38534, group A test table) Interim electrical parameters 1, 9 Final electrical parameters 1*, 2, 3, 9, 10, 11 Group A test requirements 1, 2, 3, 9, 10, 11 Group C end-point electrical parameters 1, 2, 3, 9, 10, 11 End-point electrical parameter for radiation hardness assurance (RHA) devices Not applicable * PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, and 8 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 17 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5. Radiation hardness assurance (RHA). RHA qualification is required only for those devices with the RHA designator as specified herein. 4.3.5.1 Radiation Hardness Assurance (RHA) inspection. RHA qualification is required for those devices with the RHA designator as specified herein. End-point electrical parameters for radiation hardness assurance (RHA) devices shall be specified in table II. Radiation testing will be in accordance with the qualifying activity (DLA Land and Maritime -VQ) approved plan and with MIL-PRF-38534, Appendix G. a. The hybrid device manufacturer shall establish procedures controlling component radiation testing, and shall establish radiation test plans used to implement component lot qualification during procurement. Test plans and test reports shall be filed and controlled in accordance with the manufacturer's configuration management system. b. The hybrid device manufacturer shall designate a RHA program manager to oversee component lot qualification, and to monitor design changes for continued compliance to RHA requirements. 4.3.5.1.1 Hybrid level RHA qualification. Hybrid level testing is not performed since the only active element other than diodes is a QML class V RHA-Radhard to level F (300 krad(Si) ELDRS and SEL free device. The hybrid package is a larger version of the class V flat package on 5962-95630 with a nickel underside lid, seam-sealed and with residual gas analysis data supporting negligible amounts of hydrogen in the package. 4.3.5.2 Qualification by similarity. The devices on this SMD are considered similar differing only in the number of 5962F9563002V9A die and the supporting diodes, capacitors, and resistors that go with each one. 4.3.5.3 Element level qualification. 4.3.5.3.1 Total ionizing dose irradiation. See SMD 5962-95630. 4.3.5.3.1.1 Single Event Phenomena (SEP). See SMD 5962-95630. 4.3.5.3.1.2 Radiation Lot Acceptance Testing (RLAT). The only active element other than diodes in these devices are purchased as 5962F9563002V9A. The radiation performance and post radiation electrical specifications in table I of this drawing are reflective of those specified in 5962-95630 device type 02. 4.3.5.4 Technologies not tested. Testing is not performed on device technologies including diodes, that the manufacturer considers to be radiation hardened. STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 18 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534. 6.4 Record of users. Military and industrial users shall inform DLA Land and Maritime when a system application requires configuration control and the applicable SMD to that system. DLA Land and Maritime will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DLA Land and Maritime-VA, telephone (614) 692-8108. 6.5 Comments. Comments on this drawing should be directed to DLA Land and Maritime-VA, Columbus, Ohio 43218-3990, or telephone (614) 692-1081. 6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DLA Land and Maritime-VA and have agreed to this dra STANDARD MICROCIRCUIT DRAWING DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 SIZE 5962-09231 A REVISION LEVEL A SHEET 19 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 13-05-06 Approved sources of supply for SMD 5962-09231 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information bulletin is superseded by the next dated revisions of MIL-HDBK-103 and QML-38534. DLA Land and Maritime maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/. 1/ 2/ Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-0923101KXC 5962F0923101KXC 88379 88379 MUX8522-201-1S MUX8522-901-1S 5962-0923102KXC 5962F0923102KXC 88379 88379 MUX8523-201-1S MUX8523-901-1S The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its availability. Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 88379 Vendor name and address Aeroflex Plainview Incorporated, (Aeroflex Microelectronic Solutions) 35 South Service Road Plainview, NY 11803-4193 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.