INTERSIL LP2998

LP2998
DDR-II and DDR-I Termination Regulator
General Description
Features
The LP2998 linear regulator is designed to meet JEDEC
SSTL-2 and JEDEC SSTL-18 specifications for termination of
DDR-SDRAM and DDR-II memory. The device contains a
high-speed operational amplifier to provide excellent response to load transients. The output stage prevents shoot
through while delivering 1.5A continuous current as required
for DDR-SDRAM termination. The LP2998 also incorporates
a VSENSE pin to provide superior load regulation and a VREF
output as a reference for the chipset and DIMMs.
An additional feature found on the LP2998 is an active low
shutdown (SD) pin that provides Suspend To RAM (STR)
functionality. When SD is pulled low the VTT output will tristate providing a high impedance output; while, VREF remains
active. A power savings advantage can be obtained in this
mode through lower quiescent current.
■
■
■
■
■
■
■
■
Source and sink current
Low output voltage offset
No external resistors required
Linear topology
Suspend to Ram (STR) functionality
Low external component count
Thermal Shutdown
Available in SO-8, PSOP-8 packages
Applications
■
■
■
■
DDR-I and DDR-II Termination Voltage
SSTL-18 Termination
SSTL-2 and SSTL-3 Termination
HSTL Termination
Typical Application Circuit
30026918
© 2007 National Semiconductor Corporation
300269
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LP2998 DDR-II and DDR-I Termination Regulator
December 12, 2007
LP2998
Connection Diagrams
30026903
PSOP-8 Layout
30026904
SO-8 Layout
Pin Descriptions
SO-8 Pin or PSOP-8 Pin
Name
1
GND
Function
2
SD
3
VSENSE
4
VREF
Buffered internal reference voltage of VDDQ /2.
5
VDDQ
Input for internal reference equal to VDDQ/2.
6
AVIN
Analog input pin.
7
PVIN
Power input pin.
8
VTT
Output voltage for connection to termination resistors.
EP
Exposed pad thermal connection. Connect to soft Ground.
Ground.
Shutdown.
Feedback pin for regulating VTT.
Ordering Information
Order Number
Package Type
NSC Package Drawing
LP2998MA
SO-8
M08A
95 Units per Rail
LP2998MAX
SO-8
M08A
2500 Units Tape and Reel
LP2998MR
PSOP-8
MRA08A
95 Units Tape and Reel
LP2998MRX
PSOP-8
MRA08A
2500 Units Tape and Reel
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2
Supplied As
SO-8 Thermal Resistance (θJA)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
PSOP-8 Thermal Resistance (θJA)
Minimum ESD Rating (Note 2)
PVIN, AVIN, VDDQ to GND
No pin should exceed AVIN
Storage Temp. Range
Junction Temperature
Lead Temperature (Soldering, 10 sec)
151°C/W
43°C/W
1kV
Operating Range
−0.3V to +6V
−65°C to +150°C
150°C
260°C
Junction Temp. Range (Note 3)
AVIN to GND
-40°C to +125°C
2.2V to 5.5V
Electrical Characteristics
Specifications with standard typeface are for TJ = 25°C and limits in boldface type
apply over the full Operating Temperature Range (TJ = -40°C to +125°C) (Note 4). Unless otherwise specified,
VIN = AVIN = PVIN = 2.5V.
Symbol
VREF
ZVREF
Parameter
Conditions
Min
Typ
Max
Units
VREF Voltage (DDR I)
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
1.135 1.150 1.185
1.235 1.250 1.285
1.335 1.350 1.385
V
V
V
VREF Voltage (DDR II)
PVIN = VDDQ = 1.7V
PVIN = VDDQ = 1.8V
PVIN = VDDQ = 1.9V
0.837 0.850 0.887
0.887 0.910 0.937
0.936 0.950 0.986
V
V
V
VREF Output Impedance
IREF = -30 to +30 µA
2.5
kΩ
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
IOUT = +/- 1.5A
1.120 1.150 1.190
1.210 1.250 1.290
1.320 1.350 1.390
V
V
V
VIN = VDDQ = 2.3V
VIN = VDDQ = 2.5V
VIN = VDDQ = 2.7V
1.125 1.150 1.190
1.225 1.250 1.290
1.325 1.350 1.390
V
V
V
PVIN = VDDQ = 1.7V
0.822 0.850 0.887
PVIN = VDDQ = 1.8V
0.874 0.900 0.939
PVIN = VDDQ = 1.9V
0.923 0.950 0.988
IOUT = +/- 0.5A, AVIN = 2.5V
V
V
V
IOUT = 0A
VTT Output Voltage (DDR I) (Note 7)
VTT
IOUT = 0A, AVIN = 2.5V
VTT Output Voltage (DDR II) (Note 7)
PVIN = VDDQ = 1.7V
PVIN = VDDQ = 1.8V
PVIN = VDDQ = 1.9V
VTT Output Voltage Offset (VREF – VTT) for DDR I (Note 7)
0.820 0.850 0.890
0.870 0.900 0.940
0.920 0.950 0.990
V
V
V
IOUT = 0A
-30
0
30
mV
IOUT = -1.5A
-30
0
30
mV
IOUT = +1.5A
-30
0
30
mV
IOUT = 0A
-30
0
30
mV
IOUT = -0.5A
-30
0
30
mV
IOUT = +0.5A
-30
0
30
mV
320
500
VOSVtt VTT Output Voltage Offset (VREF – VTT) for DDR II (Note 7)
IQ
ZVDDQ
ISD
IQ_SD
Quiescent Current (Note 5)
100
µA
kΩ
Quiescent current in shutdown (Note 6)
SD = 0V
115
150
µA
Shutdown leakage current
SD = 0V
2
5
µA
VIH
Minimum Shutdown High Level
VIL
Maximum Shutdown Low Level
Iv
VTT leakage current in shutdown
ISENSE
IOUT = 0A
VDDQ Input Impedance
V
1.9
SD = 0V
VTT = 1.25V
VSENSE Input current
1
13
3
0.8
V
10
µA
nA
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LP2998
Absolute Maximum Ratings (Note 1)
LP2998
Symbol
TSD
Parameter
Conditions
Thermal Shutdown (Note 6)
TSD_HYS Thermal Shutdown Hysteresis
Min
Typ
Max
Units
165
°C
10
°C
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics.
The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under
the listed test conditions.
Note 2: The human body model is a 100 pF capacitor discharged through a 1.5 kΩ resistor into each pin.
Note 3: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θJA = 151.2° C/W
junction to ambient with no heat sink.
Note 4: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality
Control (SQC) methods. The limits are used to calculate National's Average Outgoing Quality Level (AOQL).
Note 5: Quiescent current defined as the current flow into AVIN.
Note 6: The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction to ambient thermal resistance, θJA,
and the ambient temperature, TA. Exceeding the maximum allowable power dissipation will cause excessive die temperature and the regulator will go into thermal
shutdown.
Note 7: VTT load regulation is tested by using a 10 ms current pulse and measuring VTT.
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LP2998
Typical Performance Characteristics
Iq vs AVIN in SD
Iq vs AVIN
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30026921
VIH and VIL
VREF vs VDDQ
30026922
30026924
VTT vs VDDQ
Iq vs AVIN in SD Temperature
30026927
30026926
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LP2998
Iq vs AVIN Temperature
Maximum Sourcing Current vs AVIN
(VDDQ = 1.8V, PVIN = 1.8V)
30026928
30026935
Maximum Sinking Current vs AVIN
(VDDQ = 1.8V)
Maximum Sourcing Current vs AVIN
(VDDQ = 2.5V, PVIN = 1.8V)
30026936
30026931
Maximum Sourcing Current vs AVIN
(VDDQ = 2.5V, PVIN = 2.5V)
Maximum Sourcing Current vs AVIN
(VDDQ = 2.5V, PVIN = 3.3V)
30026932
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30026933
6
LP2998
Maximum Sinking Current vs AVIN
(VDDQ = 2.5V)
Maximum Sourcing Current vs AVIN
(VDDQ = 1.8V, PVIN = 3.3V)
30026934
30026937
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LP2998
Block Diagram
30026905
ever, is used exclusively to provide the rail voltage for the
output stage used to create VTT. These pins have the capability to work off separate supplies, under the condition that
AVIN is always greater than or equal to PVIN. For SSTL-18
applications, it is recommended to connect PVIN to the 1.8V
rail used for the memory core and AVIN to a rail within its
operating range of 2.2V to 5.5V (typically a 2.5V supply). PVIN
should always be used with either a 1.8V or 2.5V rail. This
prevents the thermal limit from tripping because of excessive
internal power dissipation. If the junction temperature exceeds the thermal shutdown than the part will enter a shutdown state identical to the manual shutdown where VTT is tristated and VREF remains active. A lower rail such as 1.5V can
be used but it will reduce the maximum output current, therefore it is not recommended for most termination schemes.
Description
The LP2998 is a linear bus termination regulator designed to
meet the JEDEC requirements of SSTL-2 and SSTL-18. The
output, VTT is capable of sinking and sourcing current while
regulating the output voltage equal to VDDQ / 2. The output
stage has been designed to maintain excellent load regulation
while preventing shoot through. The LP2998 also incorporates two distinct power rails that separates the analog circuitry from the power output stage. This allows a split rail
approach to be utilized to decrease internal power dissipation.
It also permits the LP2998 to provide a termination solution
for the next generation of DDR-SDRAM memory (DDRII). The
LP2998 can also be used to provide a termination voltage for
other logic schemes such as SSTL-3 or HSTL.
Series Stub Termination Logic (SSTL) was created to improve signal integrity of the data transmission across the
memory bus. This termination scheme is essential to prevent
data error from signal reflections while transmitting at high
frequencies encountered with DDR-SDRAM. The most common form of termination is Class II single parallel termination.
This involves one RS series resistor from the chipset to the
memory and one RT termination resistor. Typical values for
RS and RT are 25 Ohms, although these can be changed to
scale the current requirements from the LP2998. This implementation can be seen below in .
VDDQ
VDDQ is the input used to create the internal reference voltage for regulating VTT. The reference voltage is generated
from a resistor divider of two internal 50kΩ resistors. This
guarantees that VTT will track VDDQ / 2 precisely. The optimal
implementation of VDDQ is as a remote sense. This can be
achieved by connecting VDDQ directly to the 1.8V rail at the
DIMM instead of PVIN. This ensures that the reference voltage tracks the DDR memory rails precisely without a large
voltage drop from the power lines. For SSTL-18 applications
VDDQ will be a 1.8V signal, which will create a 0.9V termination voltage at VTT (See Electrical Characteristics Table for
exact values of VTT over temperature).
VSENSE
The purpose of the sense pin is to provide improved remote
load regulation. In most motherboard applications the termination resistors will connect to VTT in a long plane. If the output
voltage was regulated only at the output of the LP2998 then
the long trace will cause a significant IR drop resulting in a
termination voltage lower at one end of the bus than the other.
The VSENSE pin can be used to improve this performance, by
connecting it to the middle of the bus. This will provide a better
distribution across the entire termination bus. If remote load
regulation is not used then the VSENSE pin must still be connected to VTT. Care should be taken when a long VSENSE trace
is implemented in close proximity to the memory. Noise pickup in the VSENSE trace can cause problems with precise
regulation of VTT. A small 0.1uF ceramic capacitor placed next
to the VSENSE pin can help filter any high frequency signals
and preventing errors.
30026906
FIGURE 1. SSTL-Termination Scheme
Pin Descriptions
AVIN AND PVIN
AVIN and PVIN are the input supply pins for the LP2998. AVIN
is used to supply all the internal control circuitry. PVIN, how-
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VREF
VREF provides the buffered output of the internal reference
voltage VDDQ / 2. This output should be used to provide the
reference voltage for the Northbridge chipset and memory.
Since these inputs are typically an extremely high impedance,
there should be little current drawn from VREF. For improved
performance, an output bypass capacitor can be used, located close to the pin, to help with noise. A ceramic capacitor in
the range of 0.1 µF to 0.01 µF is recommended. This output
remains active during the shutdown state and thermal shutdown events for the suspend to RAM functionality.
VTT
VTT is the regulated output that is used to terminate the bus
resistors. It is capable of sinking and sourcing current while
regulating the output precisely to VDDQ / 2. The LP2998 is
designed to handle continuous currents of up to +/- 1.5A with
excellent load regulation. If a transient is expected to last
above the maximum continuous current rating for a significant
amount of time, then the bulk output capacitor should be sized
large enough to prevent an excessive voltage drop. If the
LP2998 is to operate in elevated temperatures for long durations care should be taken to ensure that the maximum junction temperature is not exceeded. Proper thermal de-rating
should always be used. (Please refer to the Thermal Dissipation section) If the junction temperature exceeds the thermal shutdown point than VTT will tri-state until the part returns
below the temperature hysteresis trip-point
Thermal Dissipation
Since the LP2998 is a linear regulator any current flow from
VTT will result in internal power dissipation generating heat.
To prevent damaging the part by exceeding the maximum allowable junction temperature, care should be taken to derate
the part dependent on the maximum expected ambient temperature and power dissipation. The maximum allowable internal temperature rise (TRmax) can be calculated given the
maximum ambient temperature (TAmax) of the application and
the maximum allowable junction temperature (TJmax).
Component Selections
TRmax = TJmax − TAmax
From this equation, the maximum power dissipation (PDmax)
of the part can be calculated:
INPUT CAPACITOR
The LP2998 does not require a capacitor for input stability,
but it is recommended for improved performance during large
load transients to prevent the input rail from dropping. The
input capacitor should be located as close as possible to the
PVIN pin. Several recommendations exist dependent on the
application required. A typical value recommended for AL
electrolytic capacitors is 22 µF. Ceramic capacitors can also
be used. A value in the range of 10 µF with X5R or better
would be an ideal choice. The input capacitance can be reduced if the LP2998 is placed close to the bulk capacitance
from the output of the 1.8V DC-DC converter. For the AVIN
pin, a small 0.1uF ceramic capacitor is sufficient to prevent
excessive noise from coupling into the device.
PDmax = TRmax / θJA
The θJA of the LP2998 will be dependent on several variables:
the package used; the thickness of copper; the number of vias
and the airflow. For instance, the θJA of the SO-8 is 163°C/W
with the package mounted to a standard 8x4 2-layer board
with 1oz. copper, no airflow, and 0.5W dissipation at room
temperature. This value can be reduced to 151.2°C/W by
changing to a 3x4 board with 2 oz. copper that is the JEDEC
standard. Figure 2 shows how the θJA varies with airflow for
the two boards mentioned.
OUTPUT CAPACITOR
The LP2998 has been designed to be insensitive of output
capacitor size or ESR (Equivalent Series Resistance). This
allows the flexibility to use any capacitor desired. The choice
for output capacitor will be determined solely on the applica9
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LP2998
tion and the requirements for load transient response of VTT.
As a general recommendation the output capacitor should be
sized above 100 µF with a low ESR for SSTL applications with
DDR-SDRAM. The value of ESR should be determined by the
maximum current spikes expected and the extent at which the
output voltage is allowed to droop. Several capacitor options
are available on the market and a few of these are highlighted
below:
AL - It should be noted that many aluminum electrolytics only
specify impedance at a frequency of 120 Hz, which indicates
they have poor high frequency performance. Only aluminum
electrolytics that have an impedance specified at a higher frequency (100 kHz) should be used for the LP2998. To improve
the ESR several AL electrolytics can be combined in parallel
for an overall reduction. An important note to be aware of is
the extent at which the ESR will change over temperature.
Aluminum electrolytic capacitors can have their ESR rapidly
increase at cold temperatures.
Ceramic - Ceramic capacitors typically have a low capacitance, in the range of 10 to 100 µF range, but they have
excellent AC performance for bypassing noise because of
very low ESR (typically less than 10 mΩ). However, some
dielectric types do not have good capacitance characteristics
as a function of voltage and temperature. Because of the typically low value of capacitance it is recommended to use
ceramic capacitors in parallel with another capacitor such as
an aluminum electrolytic. A dielectric of X5R or better is recommended for all ceramic capacitors.
Hybrid - Several hybrid capacitors such as OS-CON and SP
are available from several manufacturers. These offer a large
capacitance while maintaining a low ESR. These are the best
solution when size and performance are critical, although
their cost is typically higher than any other capacitors.
SHUTDOWN
The LP2998 contains an active low shutdown pin that can be
used for suspend to RAM functionality. In this condition the
VTT output will tri-state while the VREF output remains active
providing a constant reference signal for the memory and
chipset. During shutdown VTT should not be exposed to voltages that exceed PVIN. With the shutdown pin asserted low
the quiescent current of the LP2998 will drop, however, VDDQ will always maintain its constant impedance of 100kΩ for
generating the internal reference. Therefore, to calculate the
total power loss in shutdown both currents need to be considered. For more information refer to the Thermal Dissipation
section. The shutdown pin also has an internal pull-up current;
therefore, to turn the part on the shutdown pin can either be
connected to AVIN or left open
LP2998
sources of loss: output current at VTT, either sinking or sourcing, and quiescent current at AVIN and VDDQ. During the
active state (when shutdown is not held low) the total internal
power dissipation can be calculated from the following equations:
PD = PAVIN + PVDDQ + PVTT
Where,
PAVIN = IAVIN * VAVIN
PVDDQ = VVDDQ * IVDDQ = VVDDQ2 x RVDDQ
To calculate the maximum power dissipation at VTT both conditions at VTT need to be examined, sinking and sourcing
current. Although only one equation will add into the total,
VTT cannot source and sink current simultaneously.
PVTT = VVTT x ILOAD (Sinking) or
PVTT = ( VPVIN - VVTT) x ILOAD (Sourcing)
30026907
The power dissipation of the LP2998 can also be calculated
during the shutdown state. During this condition the output
VTT will tri-state, therefore that term in the power equation will
disappear as it cannot sink or source any current (leakage is
negligible). The only losses during shutdown will be the reduced quiescent current at AVIN and the constant impedance
that is seen at the VDDQ pin.
FIGURE 2. θJA vs Airflow (SO-8)
Additional improvements can be made by the judicious use of
vias to connect the part and dissipate heat to an internal
ground plane. Using larger traces and more copper on the top
side of the board can also help. With careful layout it is possible to reduce the θJA further than the nominal values shown
in Figure 2
Optimizing the θJA and placing the LP2998 in a section of a
board exposed to lower ambient temperature allows the part
to operate with higher power dissipation. The internal power
dissipation can be calculated by summing the three main
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PD = PAVIN + PVDDQ
PAVIN = IAVIN x VAVIN
PVDDQ = VVDDQ * IVDDQ = VVDDQ2 x RVDDQ
10
Several different application circuits have been shown in Figure 5 through Figure 12 to illustrate some of the options that
are possible in configuring the LP2998. Graphs of the individual circuit performance can be found in the Typical Performance Characteristics section in the beginning of the
datasheet. These curves illustrate how the maximum output
current is affected by changes in AVIN and PVIN.
SSTL-2 APPLICATIONS
For the majority of applications that implement the SSTL-2
termination scheme it is recommended to connect all the input
rails to the 2.5V rail. This provides an optimal trade-off between power dissipation and component count and selection.
An example of this circuit can be seen in Figure 5.
30026910
FIGURE 3. Recommended SSTL-2 Implementation
If power dissipation or efficiency is a major concern then the
LP2998 has the ability to operate on split power rails. The
output stage (PVIN) can be operated on a lower rail such as
1.8V and the analog circuitry (AVIN) can be connected to a
higher rail such as 2.5V, 3.3V or 5V. This allows the internal
power dissipation to be lowered when sourcing current from
VTT. The disadvantage of this circuit is that the maximum
continuous current is reduced because of the lower rail voltage, although it is adequate for all motherboard SSTL-2 applications. Increasing the output capacitance can also help if
periods of large load transients will be encountered.
30026911
FIGURE 4. Lower Power Dissipation SSTL-2 Implementation
The third option for SSTL-2 applications in the situation that
a 1.8V rail is not available and it is not desirable to use 2.5V,
is to connect the LP2998 power rail to 3.3V. In this situation
AVIN will be limited to operation on the 3.3V or 5V rail as PVIN
can never exceed AVIN. This configuration has the ability to
provide the maximum continuous output current at the down-
side of higher thermal dissipation. Care should be taken to
prevent the LP2998 from experiencing large current levels
which cause the junction temperature to exceed the maximum. Because of this risk it is not recommended to supply
the output stage with a voltage higher than a nominal 3.3V
rail.
11
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LP2998
Typical Application Circuits
LP2998
30026912
FIGURE 5. SSTL-2 Implementation with higher voltage rails
in the Typical Performance Characteristics. Figure 6 shows
the recommended circuit configuration for DDR-II applications. The output stage is connected to the 1.8V rail and the
AVIN pin can be connected to either a 3.3V or 5V rail.
DDR-II APPLICATIONS
With the separate VDDQ pin and an internal resistor divider
it is possible to use the LP2998 in applications utilizing DDRII memory. Figure 6 and Figure 7 show several implementations of recommended circuits with output curves displayed
30026913
FIGURE 6. Recommended DDR-II Termination
If it is not desirable to use the 1.8V rail it is possible to connect
the output stage to a 3.3V rail. Care should be taken to not
exceed the maximum junction temperature as the thermal
dissipation increases with lower VTT output voltages. For this
reason it is not recommended to power PVIN off a rail higher
than the nominal 3.3V. The advantage of this configuration is
that it has the ability to source and sink a higher maximum
continuous current.
30026914
FIGURE 7. DDR-II Termination with higher voltage rails
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VTT = VDDQ/2 ( 1 + R1/R2)
30026915
FIGURE 8. Increasing VTT by Level Shifting
VTT = VDDQ/2 (1 - R1/R2)
Conversely, the R2 resistor can be placed between VSENSE
and VDDQ to shift the VTT output lower than the internal reference voltage of VDDQ/2. The equations relating VTT and the
resistors can be seen below:
30026916
FIGURE 9. Decreasing VTT by Level Shifting
VREF voltage of approximately 0.75V for the termination resistors. AVIN and PVIN should be connected to a 2.5V rail for
optimal performance.
HSTL APPLICATIONS
The LP2998 can be easily adapted for HSTL applications by
connecting VDDQ to the 1.5V rail. This will produce a VTT and
30026917
FIGURE 10. HSTL Application
13
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LP2998
from VTT to the VSENSE pin. This has been illustrated in Figures
10 and 11. Figure 10 shows how to use two resistors to level
shift VTT above the internal reference voltage of VDDQ/2. To
calculate the exact voltage at VTT the following equation can
be used.
LEVEL SHIFTING
If standards other than SSTL-2 are required, such as SSTL-3,
it may be necessary to use a different scaling factor than 0.5
times VDDQ for regulating the output voltage. Several options
are available to scale the output to any voltage required. One
method is to level shift the output by using feedback resistors
LP2998
tor divider or one of the LP2998 signals. Because VREF and
VTT are expected to track and the part to part variations are
minor, there should be little difference between the reference
signals of each LP2998.
QDR APPLICATIONS
Quad data rate (QDR) applications utilize multiple channels
for improved memory performance. However, this increase in
bus lines has the effect of increasing the current levels required for termination. The recommended approach in terminating multiple channels is to use a dedicated LP2998 for
each channel. This simplifies layout and reduces the internal
power dissipation for each regulator. Separate VREF signals
can be used for each DIMM bank from the corresponding
regulator with the chipset reference provided by a local resis-
OUTPUT CAPACITOR SELECTION
For applications utilizing the LP2998 to terminate SSTL-2 I/O
signals the typical application circuit shown in Figure 9 can be
implemented.
30026918
FIGURE 11. Typical SSTL-2 Application Circuit
This circuit permits termination in a minimum amount of board
space and component count. Capacitor selection can be varied depending on the number of lines terminated and the
maximum load transient. However, with motherboards and
other applications where VTT is distributed across a long plane
it is advisable to use multiple bulk capacitors and addition to
high frequency decoupling. Figure 10 shown below depicts
an example circuit where 2 bulk output capacitors could be
situated at both ends of the VTT plane for optimal placement.
Large aluminum electrolytic capacitors are used for their low
ESR and low cost.
30026919
FIGURE 12. Typical SSTL-2 Application Circuit for Motherboards
In most PC applications an extensive amount of decoupling
is required because of the long interconnects encountered
with the DDR-SDRAM DIMMs mounted on modules. As a re-
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sult bulk aluminum electrolytic capacitors in the range of
1000uF are typically used.
14
1.
2.
3.
4.
The input capacitor for the power rail should be placed
as close as possible to the PVIN pin.
VSENSE should be connected to the VTT termination bus
at the point where regulation is required. For
motherboard applications an ideal location would be at
the center of the termination bus.
VDDQ can be connected remotely to the VDDQ rail input at
either the DIMM or the Chipset. This provides the most
accurate point for creating the reference voltage.
For improved thermal performance excessive top side
copper should be used to dissipate heat from the
5.
6.
15
package. Numerous vias from the ground connection to
the internal ground plane will help. Additionally these can
be located underneath the package if manufacturing
standards permit.
Care should be taken when routing the VSENSE trace to
avoid noise pickup from switching I/O signals. A 0.1uF
ceramic capacitor located close to the SENSE can also be
used to filter any unwanted high frequency signal. This
can be an issue especially if long SENSE traces are used.
VREF should be bypassed with a 0.01 µF or 0.1 µF
ceramic capacitor for improved performance. This
capacitor should be located as close as possible to the
VREF pin.
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LP2998
PCB Layout Considerations
LP2998
Physical Dimensions inches (millimeters) unless otherwise noted
8-Lead Small Outline Package (M8)
NS Package Number M08A
8-Lead PSOP Package (PSOP-8)
NS Package Number MRA08A
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LP2998
Notes
17
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LP2998 DDR-II and DDR-I Termination Regulator
Notes
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