ATMEL AT49F1024A-45VL

Features
• Single-voltage Operation
•
•
•
•
•
•
•
•
•
– 5V Read
– 5V Reprogramming
Fast Read Access Time – 45 ns
Internal Program Control and Timer
8K Word Boot Block with Lockout
Fast Erase Cycle Time – 1.5 seconds
Word-by-word Programming – 10 µs/Word Typical
Hardware Data Protection
Data Polling for End of Program Detection
Small 10 x 14 mm VSOP Package
Typical 10,000 Write Cycles
Description
The AT49F1024A is a 5-volt-only in-system Flash memory organized as 65,536 words
by 16 bits. Manufactured with Atmel’s advanced nonvolatile CMOS technology, the
devices offer access times to 45 ns with power dissipation of just 275 mW over the
commercial temperature range. When the device is deselected, the CMOS standby
current is less than 100 µA.
1-megabit
(64K x 16)
5-volt Only
Flash Memory
AT49F1024A
To allow for simple in-system reprogrammability, the AT49F1024A does not require
high-input voltages for programming. Five-volt-only commands determine the read
and programming operation of the device. Reading data out of the device is similar to
reading from an EPROM. Reprogramming the AT49F1024A is performed by erasing a
block of data (entire chip or main memory block) and then programming on a word-byword basis. The typical word programming time is a fast 10 µs. The end of a program
cycle can be optionally detected by the Data Polling feature. Once the end of a byte
program cycle has been detected, a new access for a read or program can begin. The
typical number of program and erase cycles is in excess of 10,000 cycles.
VSOP Top View
Type 1
10 x 14 mm
Pin Configurations
Pin Name
Function
A0 - A15
Addresses
CE
Chip Enable
OE
Output Enable
WE
Write Enable
I/O0 - I/O15
Data Inputs/Outputs
NC
No Connect
A9
A10
A11
A12
A13
A14
A15
NC
WE
VCC
NC
CE
I/O15
I/O14
I/O13
I/O12
I/O11
I/O10
I/O9
I/O8
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
GND
A8
A7
A6
A5
A4
A3
A2
A1
A0
OE
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
GND
3415B–FLASH–12/03
The optional 8K word boot block section includes a reprogramming write lockout feature
to provide data integrity. The boot sector is designed to contain user secure code, and
when the feature is enabled, the boot sector is permanently protected from being erased
or reprogrammed.
Block Diagram
DATA INPUTS/OUTPUTS
I/O15 - I/O0
VCC
GND
OE
WE
CE
ADDRESS
INPUTS
16
OE, CE, AND WE
LOGIC
DATA LATCH
INPUT/OUTPUT
BUFFERS
Y DECODER
Y-GATING
X DECODER
MAIN MEMORY
(56K WORDS)
FFFFH
OPTIONAL BOOT
BLOCK (8K WORDS)
2000H
1FFFH
0000H
Device Operation
READ: The AT49F1024A is accessed like an EPROM. When CE and OE are low and
WE is high, the data stored at the memory location determined by the address pins is
asserted on the outputs. The outputs are put in the high impedance state whenever CE
or OE is high. This dual line control gives designers flexibility in preventing bus
contention.
CHIP ERASE: When the boot block programming lockout feature is not enabled, the
boot block and the main memory block will erase together from the same Chip Erase
command (See Command Definitions table). If the boot block lockout function has been
enabled, data in the boot section will not be erased. However, data in the main memory
section will be erased. After a chip erase, the device will return to the read mode.
MAIN MEMORY ERASE: As an alternative to the chip erase, a main memory block
erase can be performed, which will erase all words not located in the boot block region
to an FFFFH. Data located in the boot region will not be changed during a main memory
block erase. The Main Memory Erase command is a six-bus cycle operation. The
address (555H) is latched on the falling edge of the sixth cycle while the 30H data input
is latched on the rising edge of WE. The main memory erase starts after the rising edge
of WE of the sixth cycle. Please see main memory erase cycle waveforms. The main
memory erase operation is internally controlled; it will automatically time to completion.
WORD PROGRAMMING: Once the memory array is erased, the device is programmed
(to a logic “0”) on a word-by-word basis. Please note that a data “0” cannot be
programmed back to a “1”; only erase operations can convert “0”s to “1”s. Programming
is accomplished via the internal device command register and is a four-bus cycle
operation (please refer to the Command Definitions table). The device will automatically
generate the required internal program pulses.
The program cycle has addresses latched on the falling edge of WE or CE, whichever
occurs last, and the data latched on the rising edge of WE or CE, whichever occurs first.
Programming is completed after the specified tBP cycle time. The Data Polling feature
may also be used to indicate the end of a program cycle.
2
AT49F1024A
3415B–FLASH–12/03
AT49F1024A
BOOT BLOCK PROGRAMMING LOCKOUT: The device has one designated block
that has a programming lockout feature. This feature prevents programming of data in
the designated block once the feature has been enabled. The size of the block is 8K
words. This block, referred to as the boot block, can contain secure code that is used to
bring up the system. Enabling the lockout feature will allow the boot code to stay in the
device while data in the rest of the device is updated. This feature does not have to be
activated; the boot block’s usage as a write-protected region is optional to the user. The
address range of the boot block is 0000H to 1FFFH.
Once the feature is enabled, the data in the boot block can no longer be erased or programmed. Data in the main memory block can still be changed through the regular
programming method and can be erased using either the Chip Erase or the Main Memory Block Erase command. To activate the lockout feature, a series of six program
commands to specific addresses with specific data must be performed. Please refer to
the Command Definitions table.
BOOT BLOCK LOCKOUT DETECTION: A software method is available to determine if
programming of the boot block section is locked out. When the device is in the software
product identification mode (see Software Product Identification Entry and Exit sections), a read from address location 0002H will show if programming the boot block is
locked out. If the data on I/O0 is low, the boot block can be programmed; if the data on
I/O0 is high, the program lockout feature has been activated and the block cannot be
programmed. The software product identification exit code should be used to return to
standard operation.
PRODUCT IDENTIFICATION: The product identification mode identifies the device and
manufacturer as Atmel. It may be accessed by hardware or software operation. The
hardware operation mode can be used by an external programmer to identify the correct
programming algorithm for the Atmel product.
For details, see Operating Modes (for hardware operation) or Software Product Identification. The manufacturer and device code is the same for both modes.
DATA POLLING: The AT49F1024A features Data Polling to indicate the end of a program or erase cycle. During a program cycle, an attempted read of the last byte loaded
will result in the complement of the loaded data on I/O7. Once the program cycle has
been completed, true data is valid on all outputs and the next cycle may begin. Data
Polling may begin at any time during the program cycle.
TOGGLE BIT: In addition to Data Polling, the AT49F1024A provides another method for
determining the end of a program or erase cycle. During a program or erase operation,
successive attempts to read data from the device will result in I/O6 toggling between
one and zero. Once the program cycle has completed, I/O6 will stop toggling and valid
data will be read. Examining the toggle bit may begin at any time during a program
cycle.
HARDWARE DATA PROTECTION: Hardware features protect against inadvertent programs to the AT49F1024A in the following ways: (a) VCC sense: if VCC is below 3.8V
(typical), the program function is inhibited. (b) Program inhibit: holding any one of OE
low, CE high or WE high inhibits program cycles. (c) Noise filter: pulses of less than 15
ns (typical) on the WE or CE inputs will not initiate a program cycle.
3
3415B–FLASH–12/03
Command Definition (in Hex)
Command
Sequence
1st Bus
Cycle
Bus
Cycles
Addr
Data
Read
1
Addr
DOUT
Chip Erase
6
555
Main Memory Erase
6
Word Program
Boot Block
Lockout(3)
2nd Bus
Cycle
3rd Bus
Cycle
4th Bus
Cycle
5th Bus
Cycle
6th Bus
Cycle
Addr
Data
Addr
Data
Addr
Data
Addr
Data
Addr
Data
AA
AAA(2)
55
555
80
555
AA
AAA
55
555
10
555
AA
AAA
55
555
80
555
AA
AAA
55
555
30
4
555
AA
AAA
55
555
A0
Addr
DIN
6
555
AA
AAA
55
555
80
555
AA
AAA
55
555
40
Product ID Entry
3
555
AA
AAA
55
555
90
(4)
3
555
AA
AAA
55
555
F0
Product ID Exit
(4)
Product ID Exit
1
xxx
F0
Notes: 1. The DATA FORMAT in each bus cycle is as follows: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
The ADDRESS FORMAT in each bus cycle is as follows: A11 - A0 (Hex); A11 - A15 (Don’t Care).
2. Since A11 is a Don’t Care, AAA can be replaced with 2AA.
3. The 8K word boot sector has the address range 0000H to 1FFFH.
4. Either one of the Product ID Exit commands can be used.
Absolute Maximum Ratings*
Temperature under Bias ................................ -55°C to +125°C
Storage Temperature ..................................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ...................................-0.6V to +6.25V
All Output Voltages
with Respect to Ground .............................-0.6V to VCC + 0.6V
*NOTICE:
Stresses beyond those listed under “Absolute
Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any
other conditions beyond those indicated in the
operational sections of this specification is not
implied. Exposure to absolute maximum rating
conditions for extended periods may affect
device reliability.
Voltage on OE
with Respect to Ground ...................................-0.6V to +13.5V
4
AT49F1024A
3415B–FLASH–12/03
AT49F1024A
DC and AC Operating Range
AT49F1024A-45
Operating Temperature (Case)
Com.
0°C - 70°C
VCC Power Supply
5V ± 10%
Operating Modes
Mode
CE
OE
WE
Ai
I/O
VIL
VIL
VIH
Ai
DOUT
VIL
VIH
VIL
Ai
DIN
X
High-Z
Read
Program
(2)
Standby/Write Inhibit
(1)
VIH
X
X
Program Inhibit
X
X
VIH
Program Inhibit
X
VIL
X
Output Disable
X
VIH
X
VIL
VIL
VIH
High-Z
Product Identification
Hardware
Software(5)
Notes:
1.
2.
3.
4.
5.
A1 - A15 = VIL, A9 = VH(3), A0 = VIL
Manufacturer Code(4)
A1 - A15 = VIL, A9 = VH(3), A0 = VIH
Device Code(4)
A0 = VIL, A1 - A15 = VIL
Manufacturer Code(4)
A0 = VIH, A1 - A15 = VIL
Device Code(4)
X can be VIL or VIH.
Refer to AC programming waveforms.
VH = 12.0V ± 0.5V.
Manufacturer Code: 001FH, Device Code: 0087H.
See details under “Software Product Identification Entry/Exit” on page 11.
DC Characteristics
Symbol
Parameter
Condition
ILI
Input Load Current
ILO
Max
Units
VIN = 0V to VCC
10.0
µA
Output Leakage Current
VI/O = 0V to VCC
10.0
µA
ISB1
VCC Standby Current CMOS
CE = VCC - 0.3V to VCC
100.0
µA
ISB2
VCC Standby Current TTL
CE = 2.0V to VCC
1.0
mA
VCC Active Current
f = 5 MHz; IOUT = 0 mA
50.0
mA
0.8
V
ICC
(1)
Min
VIL
Input Low Voltage
VIH
Input High Voltage
VOL
Output Low Voltage
IOL = 2.1 mA
VOH1
Output High Voltage
IOH = -400 µA
2.4
V
Output High Voltage CMOS
IOH = -100 µA; VCC = 4.5V
4.2
V
VOH2
Note:
2.0
V
0.45
V
1. In the erase mode, ICC is 90 mA.
5
3415B–FLASH–12/03
AC Read Characteristics
AT49F1024A-45
Symbol
Parameter
tACC
Min
Max
Units
Address to Output Delay
45
ns
tCE(1)
CE to Output Delay
45
ns
tOE(2)
OE to Output Delay
0
30
ns
tDF(3)(4)
CE or OE to Output Float
0
25
ns
tOH
Output Hold from OE, CE or Address, whichever
occurred first
0
ns
AC Read Waveforms(1)(2)(3)(4)
Notes:
6
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).
4. This parameter is characterized and is not 100% tested.
AT49F1024A
3415B–FLASH–12/03
AT49F1024A
Input Test Waveforms and Measurement Level
tR, tF < 5 ns
Output Test Load
5.0V
1.8K
OUTPUT
PIN
1.3K
30 pF
Pin Capacitance
f = 1 MHz, T = 25°C(1)
Symbol
Typ
Max
Units
Conditions
CIN
4
6
pF
VIN = 0V
COUT
8
12
pF
VOUT = 0V
Note:
1. This parameter is characterized and is not 100% tested.
7
3415B–FLASH–12/03
AC Word Load Characteristics
Symbol
Parameter
Min
Max
Units
tAS, tOES
Address, OE Setup Time
0
ns
tAH
Address Hold Time
50
ns
tCS
Chip Select Setup Time
0
ns
tCH
Chip Select Hold Time
0
ns
tWP
Write Pulse Width (WE or CE)
50
ns
tDS
Data Setup Time
50
ns
tDH, tOEH
Data, OE Hold Time
0
ns
tWPH
Write Pulse Width High
40
ns
AC Word Load Waveforms
WE Controlled
OE
tOES
tOEH
ADDRESS
CE
WE
tAS
tAH
tCH
tCS
tWPH
tWP
tDH
tDS
DATA
IN
CE Controlled
OE
tOES
tOEH
ADDRESS
tAS
tAH
tCH
WE
tCS
CE
tWPH
tWP
tDS
DATA
8
tDH
IN
AT49F1024A
3415B–FLASH–12/03
AT49F1024A
Program Cycle Characteristics
Symbol
Parameter
Min
Typ
Max
Units
tBP
Word Programming Time
10
50
µs
tAS
Address Setup Time
0
ns
tAH
Address Hold Time
50
ns
tDS
Data Setup Time
50
ns
tDH
Data Hold Time
0
ns
tWP
Write Pulse Width
50
ns
tWPH
Write Pulse Width High
40
ns
tEC
Erase Cycle Time
1.5
3
seconds
Program Cycle Waveforms
A0-A15
Main Memory or Chip Erase Cycle Waveforms
OE
CE
t WP
t WPH
WE
t AS
A0-A15
t AH
t DH
555
555
555
AAA
555
AAA
t EC
t DS
DATA
AA
WORD 0
Notes:
55
WORD 1
80
WORD 2
AA
55
NOTE 2
WORD 3
WORD 4
WORD 5
1. OE must be high only when WE and CE are both low.
2. For chip erase, the address should be 10H. For a main memory erase, the data should be 30H.
9
3415B–FLASH–12/03
Data Polling Characteristics(1)
Symbol
Parameter
Min
tDH
Data Hold Time
10
ns
tOEH
OE Hold Time
10
ns
Max
(2)
tOE
OE to Output Delay
tWR
Write Recovery Time
Notes:
Typ
Units
ns
0
ns
1. These parameters are characterized and not 100% tested.
2. See tOE spec in “AC Read Characteristics” on page 6.
Data Polling Waveforms
Toggle Bit Characteristics(1)
Symbol
Parameter
Min
tDH
Data Hold Time
10
ns
tOEH
OE Hold Time
10
ns
(2)
tOE
OE to Output Delay
tOEHP
OE High Pulse
tWR
Write Recovery Time
Notes:
Typ
Max
Units
ns
150
ns
0
ns
1. These parameters are characterized and not 100% tested.
2. See tOE spec in “AC Read Characteristics” on page 6.
Toggle Bit Waveforms(1)(2)(3)
Notes:
10
1. Toggling either OE or CE or both OE and CE will operate toggle bit. The tOEHP specification must be met by the toggling
input(s).
2. Beginning and ending state of I/O6 will vary.
3. Any address location may be used but the address should not vary.
AT49F1024A
3415B–FLASH–12/03
AT49F1024A
Software Product Identification
Entry(1)
Boot Block Lockout Enable Algorithm(1)
LOAD DATA AA
TO
ADDRESS 555
LOAD DATA AA
TO
ADDRESS 555
LOAD DATA 55
TO
ADDRESS AAA
LOAD DATA 55
TO
ADDRESS AAA
LOAD DATA 80
TO
ADDRESS 555
LOAD DATA 90
TO
ADDRESS 555
LOAD DATA AA
TO
ADDRESS 555
ENTER PRODUCT
IDENTIFICATION
MODE(2)(3)(5)
LOAD DATA 55
TO
ADDRESS AAA
Software Product Identification Exit(1)
LOAD DATA AA
TO
ADDRESS 555
LOAD DATA 55
TO
ADDRESS AAA
OR
LOAD DATA F0
TO
ANY ADDRESS
LOAD DATA 40
TO
ADDRESS 555
EXIT PRODUCT
IDENTIFICATION
MODE(4)
PAUSE 1 second(2)
Notes:
LOAD DATA F0
TO
ADDRESS 555
1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
Address Format: A11 - A0 (Hex); A11 - A15 (Don’t Care).
2. Boot Block Lockout feature enabled.
EXIT PRODUCT
IDENTIFICATION
MODE(4)
Notes:
1. Data Format: I/O15 - I/O8 (Don’t Care); I/O7 - I/O0 (Hex).
Address Format: A11 - A0 (Hex); A11 - A15 (Don’t Care).
2. A1 - A15 = VIL.
Manufacturer Code is read for A0 = VIL.
Device Code is read for A0 = VIH.
3. The device does not remain in identification mode if
powered down.
4. The device returns to standard operation mode.
5. Manufacturer Code: 001FH
Device Code: 0087H
11
3415B–FLASH–12/03
AT49F1024A Ordering Information
ICC (mA)
tACC
(ns)
Active
Standby
45
50
45
50
Ordering Code
Package
Operation Range
0.1
AT49F1024A-45VC
40V
Commercial
(0° to 70° C)
0.1
AT49F1024A-45VL
Lead Free
40V
Commercial
(0° to 70° C)
Package Type
40V
12
40-lead, 10 mm x 14 mm, Thin Small Outline Package (VSOP)
AT49F1024A
3415B–FLASH–12/03
AT49F1024A
Packaging Information
40V – VSOP
PIN 1
0º ~ 8º
c
Pin 1 Identifier
D1 D
L
b
e
L1
A2
E
A
GAGE PLANE
SEATING PLANE
COMMON DIMENSIONS
(Unit of Measure = mm)
A1
MIN
NOM
MAX
A
–
–
1.20
A1
0.05
–
0.15
A2
0.95
1.00
1.05
D
13.80
14.00
14.20
D1
12.30
12.40
12.50
Note 2
E
9.90
10.00
10.10
Note 2
L
0.50
0.60
0.70
SYMBOL
Notes:
1. This package conforms to JEDEC reference MO-142, Variation CA.
2. Dimensions D1 and E do not include mold protrusion. Allowable
protrusion on E is 0.15 mm per side and on D1 is 0.25 mm per side.
3. Lead coplanarity is 0.10 mm maximum.
L1
0.25 BASIC
b
0.17
0.22
0.27
c
0.10
–
0.21
e
NOTE
0.50 BASIC
10/18/01
R
2325 Orchard Parkway
San Jose, CA 95131
TITLE
40V, 40-lead (10 x 14 mm Package) Plastic Thin Small Outline
Package, Type I (VSOP)
DRAWING NO.
REV.
40V
B
13
3415B–FLASH–12/03
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3415B–FLASH–12/03