Revised August 1999 74F1056 8-Bit Schottky Barrier Diode Array General Description Features The 74F1056 is an 8-bit Schottky barrier diode array designed to be employed as termination on the inputs to memory bus lines or CLOCK lines. This device is designed to suppress negative transients caused by line reflections, switching noise and crosstalk. ■ 8-Bit array structure designed to suppress negative transients ■ Guaranteed ESD protection (HBM) in excess of 4 kV ■ Common anode shared by all eight diodes ■ Broadside pinout for ease of bus routing Ordering Code: Order Number 74F1056SC Package Number M16A Package Description 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram © 1999 Fairchild Semiconductor Corporation Schematic Diagram DS011655 www.fairchildsemi.com 74F1056 8-Bit Schottky Barrier Diode Array December 1993 74F1056 Absolute Maximum Ratings(Note 1) −65°C to +150°C Storage Temperature Operating Free-Air Temperature 0°C to 70°C Steady State Reverse Voltage, (VR) 7.0V Continuous Total Power Dissipation at or below 25°C Free-Air Temperature, (PD) 750 mW Continuous Forward Current, (If) Any Output Pin to GND 50 mA Total Through All GND Pins 170 mA Note 1: Absolute maximum ratings are valued beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Repetitive Peak Forward Current, lfp (Note 2) Any Output Pin to GND 300 mA Total Through All GND Pins Note 2: These values apply for the tw ≤ 100 µs, duty cycle ≤ 20%. 1.2A ESD (HBM) 4 kV DC Electrical Characteristics Over recommended operating free air temperature range, unless otherwise noted SINGLE DIODE OPERATION (Note 3) Symbol Parameter VBR Reverse Breakdown Voltage IR Static Reverse Current VF Static Forward Voltage CT Min Typ Max Units 7.0 IR = 10 µA VR = 7V 10 µA −0.65 −0.85 V −0.8 −1.0 5 10 4 8 Total Capacitance Conditions V IF = −16 mA IF = −50 mA pF VI = 0V, f = 1 MHz VI = 2V, f = 1 MHz Note 3: These tests apply to separate diode operation, diodes not under test are open-circuit. MULTIPLE DIODE OPERATION Symbol ICR Parameter Min Typ Max Units 0.2 2 mA Internal Crosstalk Current Note 4: ICR is measured under the following conditions: Conditions Total GND current = 1.2A (Note 4) One diode static, all others switching Switching diodes: tW = 100 µs; Static diode: VIN = 6V Duty cycle = 20%, If = 200 mA The static diode input current is the internal crosstalk current ICR. AC Electrical Characteristics TA = 25°C Symbol Parameter VFR Forward Recovery Voltage TRR Reverse Recovery Time Min Typ Units V IF = 300 mA Figure 1 5.0 ns IF = 10 mA, IR = 1 mA Figure 2 1.25 Conditions RL = 100Ω www.fairchildsemi.com 2 Figure Number Max 74F1056 AC Loading and Waveforms tr = 20 ns, ZO = 50Ω, freq = 500 Hz FIGURE 1. Forward Recovery Voltage tf = 0.5 ns, ZO = 50Ω, tW = 50 ns, duty cycle = 0.01 RL = 100Ω (Note ) Monitored by Oscilloscope having the following characteristics: tr ≤ 350 ps, RI = 50Ω, CI = 5 pF. FIGURE 2. Reverse Recovery Time 3 www.fairchildsemi.com 74F1056 8-Bit Schottky Barrier Diode Array Physical Dimensions inches (millimeters) unless otherwise noted 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Package Number M16A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com www.fairchildsemi.com 4