SANYO LE25FW203A

Ordering number : ENA1190B
CMOS IC
LE25FW203A
2M-bit (256K×8) Serial Flash Memory
30MHz SPI Bus
Overview
The LE25FW203A is an onboard programmable flash memory device with a 256K×8-bit configuration. It uses a single
3.0V power supply and supports the serial interface. It has three erase functions depending on the size of memory area in
which the data is to be erased: the chip erase function, the sector (64K bytes) erase function, and a page (256 bytes) erase
function. A page program method is supported for data writing and it can program any amount of data from 1 to 256
bytes. The page program time depends on the number of bytes programmed and the IC provides a high-speed program
time of 1.5ms (typ) when programming 256 bytes at one time. Moreover, equipped with a page write function that allows
anywhere from 1 to 256 bytes of data in a page to be rewritten, this device is optimal for applications that perform smallscale rewriting.
Features
• Read/write operations enabled by single 3.0V power supply: 2.7 to 3.6V supply voltage range
• Operating frequency
: 30MHz
• Temperature range
: 0 to 70°C
• Serial interface
: SPI mode 0, mode 3 supported
• Sector size
: 256 bytes/page sector, 64K bytes/sector
• Page erase, sector erase, chip erase functions
• Page program function (1 to 256 bytes/page), Page write function (1 to 256 bytes/page)
• Hardware protect function (lower 256 pages)
• Hardware reset function
Continued on next page.
* This product is licensed from Silicon Storage Technology, Inc. (USA), and manufactured and sold by
SANYO Semiconductor Co., Ltd.
Any and all SANYO Semiconductor Co.,Ltd. products described or contained herein are, with regard to
"standard application", intended for the use as general electronics equipment (home appliances, AV equipment,
communication device, office equipment, industrial equipment etc.). The products mentioned herein shall not be
intended for use for any "special application" (medical equipment whose purpose is to sustain life, aerospace
instrument, nuclear control device, burning appliances, transportation machine, traffic signal system, safety
equipment etc.) that shall require extremely high level of reliability and can directly threaten human lives in case
of failure or malfunction of the product or may cause harm to human bodies, nor shall they grant any guarantee
thereof. If you should intend to use our products for applications outside the standard applications of our
customer who is considering such use and/or outside the scope of our intended standard applications, please
consult with us prior to the intended use. If there is no consultation or inquiry before the intended use, our
customer shall be solely responsible for the use.
Specifications of any and all SANYO Semiconductor Co.,Ltd. products described or contained herein stipulate
the performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer' s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer' s products or
equipment.
70208 SY IM 20071206-S00007 No.A1190-1/18
LE25FW203A
Continued from preceding page.
• Highly reliable read/write
Number of rewrite times : 105 times
Page erase time
: 10ms (typ.), 20ms (max.), Number of rewrite times: 104 times or less
: 25ms (typ.), 300ms (max.), Number of rewrite times: 105 times or less
Sector erase time
: 30ms (typ.), 500ms (max.)
Chip erase time
: 200ms (typ.), 3s (max.)
Page program time
: 1.5ms/256 bytes (typ.), 2.5ms/256 bytes (max.)
Page write time
: 11ms (typ.), 22.5ms (max.), Number of rewrite times: 104 times or less
: 25ms (typ.), 300ms (max.), Number of rewrite times: 105 times or less
• Status functions
Ready/busy information
• Data retention period
: 20 years
• Package
: LE25FW203ATT MSOP8 (225mil)
Package Dimensions
unit:mm (typ)
3276
5.2
5
0.5
4.4
6.3
8
4
1
1.27
0.35
0.08
0.85max
0.125
(0.65)
(0.7)
SANYO : MSOP8(225mil)
Figure 1 Pin Assignment
SI
1
8
SO
SCK
2
7
VSS
RESET
3
6
VDD
CS
4
5
WP
Top view
No.A1190-2/18
LE25FW203A
Figure 2 Block Diagram
2M Bit
Flash EEPROM
Cell Array
XDECODER
ADDRESS
BUFFERS
&
LATCHES
Y-DECODER
I/O BUFFERS
&
DATA LATCHES
CONTROL
LOGIC
SERIAL INTERFACE
CS
SCK
SI
SO
WP
RESET
Table 1 Pin Description
Symbol
SCK
Pin Name
Serial clock
Description
This pin controls the data input/output timing.
The input data and addresses are latched synchronized to the rising edge of the serial clock, and the data is
output synchronized to the falling edge of the serial clock.
SI
Serial data input
The data and addresses are input from this pin, and latched internally synchronized to the rising edge of the
SO
Serial data output
The data stored inside the device is output from this pin synchronized to the falling edge of the serial clock.
CS
Chip select
serial clock.
The device becomes active when the logic level of this pin is low; it is deselected and placed in standby
status when the logic level of the pin is high.
WP
Write protect
RESET
RESET
Lower 256 pages are protected when the logic level of this pin is low.
The device resets when the logic level of this pin is low. However, reset is disabled when write
(erase, program, or page write) are being internally executed by the device.
VDD
Power supply
VSS
Ground
This pin supplies the 2.7 to 3.6V supply voltage.
No.A1190-3/18
LE25FW203A
Table 2 Command Settings
Command
1st bus cycle
2nd bus cycle
3rd bus cycle
4th bus cycle
03h
A23-A16
A15-A8
A7-A0
0Bh
A23-A16
A15-A8
A7-A0
Read
Page erase
DBh
A23-A16
A15-A8
X
Sector erase
D8h
A23-A16
X
X
Chip erase
C7h
5th bus cycle
6th bus cycle
Nth bus cycle
X
Page program
02h
A23-A16
A15-A8
A7-A0
PD *1
PD *1
PD *1
Page write
0Ah
A23-A16
A15-A8
A7-A0
PD *1
PD *1
PD *1
Write enable
06h
Write disable
04h
Power down
B9h
Status register read
05h
Read silicon ID
9Fh *2
Exit power down mode
ABh
Explanatory notes for Table 2
X = don't care, h = Hexadecimal notation, A23-A18 = don’t care for all commands
Even if CS is raised for longer than the bus cycle given in the command settings table, the command will be
recognized. However, CS must be raised between one bus cycle and the next.
*1. PD: Program data. Input any number of bytes of data from 1 to 256 bytes in 1-byte units.
*2. After the first bus cycle, Silicon ID repeatedly outputs 62h (manufacturer code), 16h (device code),
and 00h (dummy code).
Device Operation
The LE25FW203A features electrical on-chip erase functions using a single 3.0V power supply, that have been added
to the EPROM functions of the industry standard that support serial interfaces. Interfacing and control are facilitated by
incorporating the command registers inside the chip. The read, erase, program and other required functions of the
device are executed through the command registers.
The command addresses and data are latched for program, erase and write operations.
Figures 3 and 4 show the timing waveforms of the serial data input.
First, at the falling CS edge the device is selected, and serial input is enabled for the commands, addresses, etc. These
inputs are introduced internally starting with bit 7 in synchronization with the rising SCK edge. At this time, output pin
is in the high-impedance state. The output pin is placed in the low-impedance state when the data is output starting with
bit 7 synchronized to the falling clock edge during read, status register read and silicon ID.
The LE25FW203A supports both serial interface SPI mode 0 and SPI mode 3. At the falling CS edge, SPI mode 0 is
automatically selected if the logic level of SCK is low, and SPI mode 3 is automatically selected if the logic level of
SCK is high.
Figure 3 Serial Input Timing
tCPH
CS
tCLS
tCLHI
tCSS
tCLLO tCSH
tCLH
SCK
tDS
SI
SO
tDH
DATA VALID
High Impedance
High Impedance
SPI Mode definition
* SPI mode 0: SCK is low logic level when CS falls
* SPI mode 3: SCK is high logic level when CS falls
No.A1190-4/18
LE25FW203A
Figure 4 Serial Output Timing
CS
SCK
tCLZ
SO
tHO
tCHZ
DATA VALID
tV
SI
Command Definition
"Table 2 Command Settings" provides a list and overview of the commands. A detailed description of the functions and
operations corresponding to each command is presented below.
1. Read
Figure 5 shows the read timing waveforms.
There are two read commands, the 4 bus cycle read and 5 bus cycle read. Consisting of the first through fourth bus
cycles, the 4 bus cycle read inputs the 24-bit address following (03h) and the data in the designated address is output
synchronized to SCK. The data is output on the falling clock edge of fourth bus cycle bit 0.
Consisting of the first through fifth bus cycles, the 5 bus cycle read command inputs the 24-bit addresses and 8 dummy
bits following (0Bh). The data is output using the falling clock edge of fifth bus cycle bit 0. The only difference
between these two commands is whether the dummy bits in the fifth bus cycle are input.
While SCK is being input, the address is automatically incremented inside the device and the corresponding data is
output in sequence.
If the SCK input is continued after the data up to the highest address (3FFFFh) is output, the internal address returns to
the lowest address (00000h) and data output is continued.
By setting the logic level of CS to high, the device is deselected, and the read cycle ends. While the device is deselected,
the output pin is in a high-impedance state.
Figure 5: Read
4 Bus Read
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23 24
31 32
39 40
47
Mode0
8CLK
SI
03h
Add.
Add.
Add.
N
SO
High Impedance
DATA
MSB
N+1
DATA
MSB
N+2
DATA
MSB
No.A1190-5/18
LE25FW203A
5 Bus Read
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23 24
31 32
39 40
47 48
55
Mode0
8CLK
SI
0Bh
Add.
Add.
Add.
X
N
High Impedance
SO
DATA
MSB
N+1
DATA
MSB
N+2
DATA
MSB
2. Status Registers
Device status can be detected using status registers.
Table 3 gives the contents of status registers.
Table 3 Status Registers
Bit
Logic
Function
0
Ready
1
Erase/Program/Write
0
Write disabled
1
Write enabled
Bit2
0
Reserved bits
0
Bit3
0
Reserved bits
0
Bit4
0
Reserved bits
0
Bit5
0
Reserved bits
0
Bit6
0
Reserved bits
0
Bit7
0
Reserved bits
0
Bit0
Bit1
Name
RDY
WEN
Power-on Time Information
0
0
2-1. Status Register Read
The contents of the status registers can be read using the status register read command. This command can be executed
even during the following operations.
• Page erase
• Sector erase
• Chip erase
• Page program
• Page write
Figure 6 shows the timing waveforms of the status register read.
Consisting only of the first bus cycle, the status register read command outputs the contents of the status register from
bit 7 synchronized to the falling edge of the clock (SCK) when (05h) is input. If the clock (SCK) is continued after data
up to RDY (bit 0) are output, the data is output by returning to the bit 7. Data is output from the falling clock of the first
bus cycle bit 0.
No.A1190-6/18
LE25FW203A
Figure 6 Status Register Read
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23
Mode0
8CLK
SI
SO
05h
High Impedance
DATA
MSB
DATA
DATA
MSB
MSB
RDY (bit 0)
The RDY register is for detecting the write (program, erase and page write) end. When it is "1", the device is in a busy
state, and when it is "0", it means that write is completed.
WEN (bit 1)
The WEN register is for detecting whether the device can perform write operations. If it is set to "0", the device will not
perform the write operation even if the write command is input. If it is set to "1", the device can perform write
operations in any area that is not protected.
WEN can be controlled using the write enable and write disable commands. By inputting the write enable command
(06h), WEN can be set to "1"; by inputting the write disable command (04h), it can be set to "0." In the following states,
WEN is automatically set to "0" in order to protect against unintentional writing.
• At power-on
• Upon completion of page erase, sector erase or chip erase
• Upon completion of page program
• Upon completion of page write
• After hardware reset operations
* If a write operation has not been performed inside the LE25FW203A because, for instance, the command input for
any of the write operations (page erase, sector erase, chip erase, page program, or page write) has failed or a write
operation has been performed for a protected address, WEN will retain the status established prior to the issue of the
command concerned. Furthermore, its state will not be changed by a read operation.
Bit2, Bit3, Bit4, Bit5, Bit6, Bit7
These are reserved bits.
3. Write Enable
Write enable command sets the status register WEN to “1.” The write enable command must be issued before
performing any of the operations listed below.
• Page erase
• Sector erase
• Chip erase
• Page program
• Page write
Figure 7 shows the timing waveforms. The write enable command consists only of the first bus cycle, and it is initiated
by inputting (06h).
No.A1190-7/18
LE25FW203A
4. Write Disable
The write disable command sets status register WEN to “0” to prohibit unintentional writing. Figure 8 shows the timing
waveforms when the write disable operation is performed. The write disable command consists only of the first bus
cycle, and it is initiated by inputting (04h).
To exit write disable status (WEN = 0), set WEN to 1 using the write enable command (06h).
Figure 7 Write Enable
CS
CS
Mode3
SCK
Figure 8 Write Disable
Mode3
0 1 2 3 4 5 6 7
SCK
Mode0
Mode0
8CLK
SI
06h
8CLK
SI
04h
High Impedance
SO
0 1 2 3 4 5 6 7
High Impedance
SO
5. Power-down
The power-down command sets all the commands, with the exception of the command to exit from power-down, to the
acceptance prohibited state (power-down). Figure 9 shows the timing waveforms. The power-down command consists
only of the first bus cycle, and it is initiated by inputting (B9h). The power-down state is exited using the power-down
exit command. Figure 10 shows the timing waveforms of the power-down exit command. The power-down exit
command consists only of the first bus cycle, and it is initiated by inputting (ABh). Power-down state is exited also
when power is tuned off or when hardware reset is performed.
Figure 9 Power-down
Figure 10 Exiting from Power-down
Power down
mode
CS
CS
tPRB
Mode3
SCK
Mode3
0 1 2 3 4 5 6 7
SCK
Mode0
B9h
SI
High Impedance
SO
Mode0
8CLK
8CLK
SI
0 1 2 3 4 5 6 7
SO
ABh
High Impedance
No.A1190-8/18
LE25FW203A
6. Page Erase
Page erase operation sets the memory cell data in any pages to “1.” A page consists of 256 bytes. Figure 11 shows the
timing waveforms, and Figure 21 shows a page erase flowchart.
The page erase command consists of the first through fourth bus cycles, and it is initiated by inputting the 24-bit
addresses following (DBh). Addresses A17 to A8 are valid, and all others are “don't care.”
After the command has been input, the erase operation starts from the rising edge of CS, and it ends automatically under
the control of internal timer. Also, end of erase operation can be detected using status register.
Page erase time depends on the number of rewrites performed. The page erase time is 10ms (typ)/20ms (max) for up to
104 rewrites, and 25ms (typ)/300ms (max) for up to 105 rewrites.
Figure 11 Page Erase
Self-timed
Erase Cycle
tPE
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23 24
31
Mode0
8CLK
SI
Add.
DBh
Add.
X
High Impedance
SO
7. Sector Erase
Sector erase operation sets the memory cell data in any sectors to “1.” A sector consists of 64K bytes. Figure 12 shows
the timing waveforms, and Figure 21 shows an erase flowchart.
The sector erase command consists of the first through fourth bus cycles, and it is initiated by inputting the 24-bit
addresses following (D8h). Addresses A17 and A16 are valid, and all others are “don’t care.”
After the command has been input, the erase operation starts from the rising edge of CS, and it ends automatically under
the control of internal timer. Also, end of erase operation can be detected using status register.
Sector erase time is 30ms (typ)/500ms (max).
If the lower 256 pages are being protected by setting the WP pin to low logic level, the sector erase operation cannot be
performed on sectors including the lower 256 pages.
Figure 12 Sector Erase
Self-timed
Erase Cycle
tSE
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23 24
31
Mode0
8CLK
SI
D8h
Add.
Add.
X
High Impedance
SO
No.A1190-9/18
LE25FW203A
8. Chip Erase
Chip erase operation sets the memory cell data in all the sectors to “1.” Figure 13 shows the timing waveforms, and
Figure 21 shows an erase flowchart.
The chip erase command consists only of the first bus cycle, and it is initiated by inputting (C7h).
After the command has been input, the erase operation starts from the rising edge of CS, and it ends automatically under
the control of internal timer. Also, end of erase operation can be detected using status register.
Chip erase time is 200ms (typ)/3s (max).
If the lower 256 pages are being protected by setting the WP pin to low logic level, the chip erase operation cannot be
performed.
Figure 13 Chip Erase
Self-timed
Erase Cycle
tCHE
CS
Mode3
SCK
0 1 2 3 4 5 6 7
Mode0
8CLK
SI
C7h
High Impedance
SO
9. Page Program
Page program operation can be used to program any number of bytes from 1 to 256 bytes for the erased pages (page
addresses: A17 to A8).
Figure 14 shows the timing waveforms, and Figure 22 shows a program flowchart.
After CS is set low, the command code (02H) is input followed by the 24-bit addresses. Addresses A17 to A0 are valid.
After this, the program data can be loaded until CS rises. If the loaded data exceeds 256 bytes, the 256 bytes loaded last
are programmed.
Also, if the address of data being loaded reaches the last address of a page (A7 to A0: FFh), the device returns to the
start address of the same page (A7 to A0: 00h).
Program data must be loaded in 1-byte units. The program operation is not performed if data is loaded in less than byte
units and CS is set high.
The page program time depends on the number of bytes programmed. When programming 256 bytes, the page program
time is 1.5ms (typ)/2.5ms (max).
Figure 14 Page Program
Self-timed
Program Cycle
tPP
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23 24
31 32
39 40
47
2079
Mode0
8CLK
SI
02h
Add.
Add.
Add.
PD
PD
PD
High Impedance
SO
No.A1190-10/18
LE25FW203A
10. Page Write
Page write operation can be used to rewrite any number of bytes of data from 1 to 256 bytes in a page (page addresses:
A17 to A8) without executing erase operation beforehand. Figure 15 shows the timing waveforms, and Figure 23 shows
a flowchart. After CS is set low, the command code (0AH) is input followed by the 24-bit addresses. Addresses A17 to
A0 are valid. After this, re-write data can be loaded until CS rises. If loaded data exceeds 256 bytes, the 256 bytes
loaded last are programmed. If the loaded data is less than 256 bytes, data not loaded on the same page is not rewritten.
In addition, if the address of data being loaded reaches the last address of a page (A7 to A0: FFh), the device returns to
the start address of the same page (A7 to A0: 00h).
Rewrite data must be loaded in 1-byte units. The rewrite operation is not performed if data is loaded in less than byte
units and CS is set high. The page write time depends on the number of rewrites. The page write time is 11ms
(typ)/22.5ms (max) for up to 104 rewrites, or 25ms (typ)/300ms (max) for up to 105 rewrites.
Figure 15 Page Write
Self-timed
Write Cycle
tPW
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23 24
32
39 40
47
2079
Mode0
8CLK
SI
0Ah
Add.
Add.
Add.
PD
PD
PD
High Impedance
SO
11. Silicon ID Read
Silicon ID read allows manufacturer code and device code information to be read. Figure 16 shows the timing
waveforms, and Table 6 gives the silicon ID codes.
Table 6 Silicon ID Codes
Output Code
Manufacturer code
62h
Device code
16h
Dummy code
00h
The silicon ID read command consists of only the first bus cycle. If (9Fh) is input, the manufacturer code 62h, device
code 16h, and dummy code 00h are output in synchronization with the falling edge of SCK. If SCK input continues, the
IC repeatedly outputs the data described above.
Data output is performed from the falling edge of clock at the first bus cycle, bit 0. Silicon ID read is terminated by
making CS go to high logic level.
The silicon ID read command is not accepted during write operations.
No.A1190-11/18
LE25FW203A
Figure 16 Silicon ID Read
CS
Mode3
SCK
0 1 2 3 4 5 6 7 8
15 16
23
31
Mode0
8CLK
SI
9Fh
High Impedance
SO
N
N+1
62h
16h
MSB
MSB
N+2
00h
MSB
12. Hardware Reset
A hardware reset can be performed by setting the RESET pin to low logic level. Figure 17 shows the timing waveforms.
The hardware reset is disabled while write operation (erase, program, or page write) is being executed in the device.
The pin SO is held in the high-impedance state while the device is in the reset mode.
Figure 17 Hardware Reset
tRES
tHRB
CS
tRP
RESET
13. Hardware Data Protection
Lower 256 pages can be protected by setting the WP pin to low logic level. Figure 18 shows the timing waveforms.
In addition, the device has an internal power on reset function to prevent unintentional write operations at power on.
Figure 18 Write Protection
CS
tWPS
tWPH
WP
SCK
SI
SO
High Impedance
High Impedance
No.A1190-12/18
LE25FW203A
In order to protect against unintentional writing at power-on, the LE25FW203A incorporates a power-on reset function.
The following conditions must be met in order to ensure that the power reset circuit will operate stably.
No guarantees are given for data in the event of an instantaneous power failure occurring during the writing period.
Figure 19 Power-down Timing
Program, Erase and Write Command not Allowed
VDD
No Device Access Allowed
VDD(max)
VDD(min)
tPU_READ
tPU_WRITE
tPD
vBOT
0V
14. Software Data Protection
The LE25FW203A eliminates the possibility of unintentional operations by not recognizing commands under the
following conditions.
• When a write command is input and the rising CS edge timing is not in a bus cycle (8 CLK units of SCK)
• When the page program and page write data is not in 1-byte increments
15. Power On
VDD is applied to CS at power on to prevent unintentional write operations.
To start read operations, turn the power on and input a command 100µs (tPU_READ) after the power supply voltage
has reached 2.7V or higher and has been stabilized.
In addition, to start write operations, turn the power on and input a command 10ms (tPU_WRITE) after power supply
voltage has reached 2.7V or higher and has been stabilized.
Figure 20 Power On Timing
Program, Erase and Write Command not Allowed
Full Access Allowed
VDD
VDD(max)
Chip selection not Allowed
Read Access Allowed
VDD(min)
tPU_READ
tPU_WRITE
0V
16. Decoupling Capacitor
A 0.1µF ceramic capacitor must be provided to each device and connected between VDD and VSS in order to ensure
that the device will operate stably.
No.A1190-13/18
LE25FW203A
Specifications
Absolute Maximum Ratings
Parameter
Symbol
Conditions
Maximum supply voltage
DC voltage (all pins)
Storage temperature
Ratings
unit
With respect to VSS
-0.5 to +4.6
With respect to VSS
-0.5 to VDD+0.5
V
-55 to +150
°C
Tstg
V
Operating Conditions
Parameter
Symbol
Conditions
Ratings
unit
Operating supply voltage
2.7 to 3.6
V
0 to 70
°C
Operating ambient temperature
Allowable DC Operating Conditions
Parameter
Symbol
Ratings
Conditions
min
Read mode operating current
ICCR
unit
typ
max
CS=0.1VDD, RESET=WP=0.9VDD
SI=0.1VDD/0.9VDD, SO=open,
Operating frequency=30MHz,
6
mA
VDD=VDD max
Write mode operating current
ICCW
VDD=VDD max
15
mA
CMOS standby current
ISB
CS=RESET=WP=VDD,
SI=VSS/VDD, SO=open,
10
µA
VDD=VDD max
Input leakage current
ILI
VIN=VSS to VDD, VDD=VDD max
2
µA
Output leakage current
ILO
VIN=VSS to VDD, VDD=VDD max
2
µA
Input low voltage
VIL
VDD=VDD max
-0.3
0.3VDD
V
Input high voltage
VIH
VDD=VDD min
0.7VDD
VDD+0.3
V
Output low voltage
VOL
IOL=100µA, VDD=VDD min
0.2
IOL=1.6mA, VDD=VDD min
0.4
Output high voltage
VOH
IOH=-100µA, VDD=VDD min
V
VDD-0.2
V
Power-on Timing
Parameter
Ratings
Symbol
min
unit
max
Time from power-on to read operation
tPU_READ
100
µs
Time from power-on to write operation
tPU_WRITE
10
ms
Power-down time
tPD
10
ms
Power-down voltage
vBOT
0.2
V
Pin Capacitance at Ta=25°C, f=1MHz
Parameter
Symbol
Conditions
max
unit
Output pin capacitance
CDQ
VDQ=0V
12
pF
Input pin Capacitance
CIN
VIN=0V
6
pF
Note: These parameter values do not represent the results of measurements undertaken for all devices but rather values
for some of the sampled devices.
No.A1190-14/18
LE25FW203A
AC Characteristics
Parameter
Ratings
Symbol
min
unit
typ
max
Clock frequency
fCLK
Input signal rising/falling time
tRF
CS setup time
tCSS
10
ns
CS hold time
tCSH
10
ns
CS wait pulse width
tCPH
25
Output high impedance time from CS
tCHZ
Data setup time
tDS
Data hold time
30
MHz
20
ns
ns
15
ns
5
ns
tDH
5
ns
SCK setup time
tCLS
10
ns
SCK hold time
tCLH
10
ns
SCK logic high level pulse width
tCLHI
16
ns
SCK logic low level pulse width
tCLLO
16
ns
Output low impedance time from SCK
tCLZ
Output data time from SCK
tV
Output data hold time
Page erase cycle
Number of rewrite times: 104 times or less
time
Number of rewrite times: 105 times or less
tHO
0
ns
8
15
ns
10
20
ms
0
tPE
ns
25
300
ms
Sector erase cycle time
tSE
30
500
ms
Chip erase cycle time
tCHE
0.2
3
Page programming cycle time (256 bytes)
tPP
1.5
Page programming cycle time (n bytes)
s
2.5
ms
11
22.5
ms
25
300
ms
0.04+
n*1.46/256
Page write cycle
Number of rewrite times: 104 times or less
time
Number of rewrite times: 105 times or less
tPW
WP setup time
tWPS
50
ns
WP hold time
tWPH
50
ns
Reset setup time
tRES
10
ns
Reset pulse width
tRP
Hardware reset recovery time
Power-down recovery time
100
ns
tHRB
1
µs
tPRB
25
ns
AC Test Conditions
Input pulse level···················· 0V, 3.0V
Input rising/falling time········· 5ns
Input/Output timing level······ High data: 2.0V, Low data: 0.8V
Output load ··························· 30pF
Note: As the test conditions for "typ", the measurements are conducted using 3.0V for VDD at room temperature.
No.A1190-15/18
LE25FW203A
Figure 21 Erase Flowchart
Chip erase
Page/sector erase
Start
Start
06h
Write enable
C7h
Set chip erase
command
Write enable
06h
DBh/D8h
Address 1
Set page erase and small
sector erase command
Start erase on rising edge
of CS
Address 2
05h
Set status register read
command
Dummy
Bit 0 = “0” ?
Start erase on rising
edge of CS
YES
Set status register read
command
05h
NO
Bit 0 = “0” ?
NO
End of erase
* Automatically placed in write disabled state at
the end of the erase
YES
End of erase
* Automatically placed in write disabled
state at the end of the erase
No.A1190-16/18
LE25FW203A
Figure 22 Program Flowchart
Figure 23 Page Write Flowchart
Start
Start
06h
06h
Write enable
02h
0Ah
Address 1
Set page program
command
Address 1
Address 2
Address 2
Address 3
Address 3
Program
data 0
Rewrite
data 0
Program
data n
Rewrite
data n
Start program on rising
edge of CS
Start program on rising
edge of CS
Set status register read
command
05h
NO
Write enable
Bit 0= “0” ?
YES
End of
programming
* Automatically placed in write disabled state at
the end of the programming operation.
Set status register read
command
05h
NO
Set page program
command
Bit 0= “0” ?
YES
End of
programming
* Automatically placed in write disabled state at
the end of the programming operation.
No.A1190-17/18
LE25FW203A
SANYO Semiconductor Co.,Ltd. assumes no responsibility for equipment failures that result from using
products at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition
ranges, or other parameters) listed in products specifications of any and all SANYO Semiconductor Co.,Ltd.
products described or contained herein.
SANYO Semiconductor Co.,Ltd. strives to supply high-quality high-reliability products, however, any and all
semiconductor products fail or malfunction with some probability. It is possible that these probabilistic failures or
malfunction could give rise to accidents or events that could endanger human lives, trouble that could give rise
to smoke or fire, or accidents that could cause damage to other property. When designing equipment, adopt
safety measures so that these kinds of accidents or events cannot occur. Such measures include but are not
limited to protective circuits and error prevention circuits for safe design, redundant design, and structural
design.
In the event that any or all SANYO Semiconductor Co.,Ltd. products described or contained herein are
controlled under any of applicable local export control laws and regulations, such products may require the
export license from the authorities concerned in accordance with the above law.
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,
without the prior written consent of SANYO Semiconductor Co.,Ltd.
Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. When designing equipment, refer to the "Delivery Specification" for the
SANYO Semiconductor Co.,Ltd. product that you intend to use.
Information (including circuit diagrams and circuit parameters) herein is for example only; it is not guaranteed
for volume production.
Upon using the technical information or products described herein, neither warranty nor license shall be granted
with regard to intellectual property rights or any other rights of SANYO Semiconductor Co.,Ltd. or any third
party. SANYO Semiconductor Co.,Ltd. shall not be liable for any claim or suits with regard to a third party's
intellectual property rights which has resulted from the use of the technical information and products mentioned
above.
This catalog provides information as of July, 2008. Specifications and information herein are subject
to change without notice.
PS No.A1190-18/18