JDSU SWS20010-A-2

Swept Wavelength System
SWS2000 Series
Key Features
• Scalable architecture - add more stations any time
• ± 0.002 nm absolute wavelength accuracy
• Up to 128 detector channels available per station
• Remote source laser can be shared by up to 8 workstations
• High speed scanning (user controllable) up to 40 nm/s
• Flexible easy-to-use software
• Customized applications through dynamic link libraries (DLLs)
• 24/7 service and support
• Optical component and module
characterization in both R&D and
manufacturing environments
- ROADMs, Wavelength Switches,
Wavelength Blockers
- Circuit Packs
- Dense wavelength division
multiplexing (DWDM)
- Tunable Filters, Couplers,
Splitters, Switches, Attenuators,
Fiber Bragg Gratings (FBGs),
Interleavers, Dichroic Filters
- Micro-Electro-Mechanical
Systems (MEMS) and
Waveguide Devices
- Complies with IEC 61300-3-29,
IEC 61300-3-12
Safety Information
• Complies to CE requirements plus
UL3101.1 and CAN/CSA - C22.2 No.
1010.1. The laser source in the
Source Optics Module (SWS20010)
is a class 1. The Tunable Laser Source
(SWS17101) is a class 3B laser. Both
are classified per IEC standard
60825-1(2002) and comply with
21CFR1040.10 except deviations
per Laser Notice No. 50, July 2001.
WEBSITE : www.jdsu.com
The Swept Wavelength System SWS2000 series remains the industry standard
solution for measuring insertion loss (IL), polarization dependent loss (PDL),
return loss (RL) and directivity with high wavelength resolution in both research
and development (R&D) and production environments. Currently used at more
than 80 customer sites, with over 8500 detector channels deployed, the SWS test
platform validates optical performance for the latest in optical components and
modules including: ROADMs, Wavelength Switches, Tunable Filters and Circuit
Packs. The SWS system consists of a tunable laser source, a source optics module
(SOM), a control module, a receiver chassis, one or more detector modules and
application software.
With a ± 0.002 nm absolute wavelength accuracy over the entire 1520 to
1630 nm range, a high sweep speed of 40 nm/s, and a deep dynamic range of
> 70 dB, the SWS2000 provides excellent performance combined with a low cost
of ownership; the distributed architecture supports up to eight separate,
individually controlled measurement stations per source laser. Often purchased
initially as an R&D tool, this scalability in the number of measurement stations
provides customers the flexibility to transition the equipment from R&D to production.
Upgrade packages from legacy SWS systems to the SWS2000 platform are
available to ensure that existing SWS users receive the maximum benefit from
their existing capital infrastructure.
SWS directly measures IL, PDL and average loss as a function of wavelength. RL
is measured with the optional RL modules (SWS20005). Using the raw IL and
PDL data, the application software provides a comprehensive set of analysis tools
that calculate:
• Loss at peak
• Center wavelength, from x dB threshold
• Loss at center wavelength
• Bandwidth at x dB threshold
• Crosstalk, left/right and cummulative
• Flatness
These parameters are calculated relative to the measured peak, ITU grid or userdefined grid.
The SWS is delivered with a set of DLLs that can be used to develop software to
suit custom testing requirements. The DLLs function through the SWS receiver
hardware, allowing access to all SWS functionality. Using the supplied
DLLs, applications may be developed in Visual BasicTM, C, C++, or
LabView environments.
With a 4-State polarization controller located within the SOM, PDL and average
loss are measured quickly as a function of wavelength. Four polarization states at
0°, 90°, - 45° and circular polarization are measured, and the Mueller matrix
analysis is used to accurately determine PDL at all wavelengths scanned.
When the very highest accuracy PDL measurements are required, a special version
of the detector module should be used. The SWS15107-A contains specially
selected and tuned components to allow PDL measurement to an accuracy of
better than ± 0.01 dB. This module is supplied with a fixed FC/APC connector.
All specifications listed are met simultaneously. No change in wavelength accuracy
(± 2 pm) or scan speed (20 nm/s) is required to obtain a 70 dB dynamic range.
Typical Application of SWS2000
Analysis Setup Window
Data Display and Control Window
RL Measurement with SWS2000
SWS2000 Specifications
Single Output Source Optics Module
Wavelength range
Absolute wavelength accuracy
Measurement resolution1
Wavelength sampling resolution
Insertion loss (IL) measurement accuracy2,3
including polarization state averaged IL
Dynamic range3
Loss measurement repeatability2
Loss measurement resolution
Return loss (RL) measurement range3,4
Polarization dependent loss (PDL) measurement accuracy2
using standard detector module SWS15107
PDL measurement accuracy2
using tuned PDL detector module SWS15107-A
with 13-point smoothing and 4 averages1
PDL measurement repeatability1
PDL measurement resolution1
Maximum slope resolution
Measurement time
Maximum scan speed5,7
Fiber type (to device-under-test)
Maximum outputs from device under test (DUT) measured
Measurement stations per transmitter
Detector adapters6
Input voltage
Receiver control
Receiver communication with computer
Operating temperature
Storage temperature
Operating humidity
Dimensions (W x H x D)
Source optics module(SOM) (SWS20010-B-2)
Tunable laser source (SWS17101)
Receiver chassis (OWB10002)
Control and detector modules
C+L-band 1520 to 1630 nm
± 2 pm
1 pm
3 pm
± 0.05 dB (0 to 25 dB device IL)
± 0.10 dB (25 to 45 dB device IL), ± 0.20 dB (45 to 65 dB device IL)
> 70 dB
± 0.02 dB
0.01 dB
60 dB
± 0.05 dB (0 to 20 dB device IL)
± 0.10 dB (20 to 40 dB device IL)
± 0.01 dB (0 to 20 dB device IL)
± 0.03 dB (20 to 40 dB device IL)
± 0.01 dB
0.01 dB
10 dB/pm (0 to 35 dB device IL)
9 seconds + 0.5 seconds per channel
40 nm/s
Up to 8, in 1, 2, 4, or 8 steps
FC, SC, ST, LC, bare fiber
110 to 230 V AC , 50 to 60 Hz
Custom interface for Win95/98/2000/XP
National InstrumentsTM PCI interface card
15 to 35 °C
0 to 70 °C
80 % RH maximum, non-condensing
48.3 x 13.3 x 37.5 cm
48.3 x 13.3 x 43.2 cm
48.3 x 13.3 x 46.0 cm
Plugged into chassis
1. Wavelength resolution defined as the minimum calculated center wavelength shift.
2. Does not include influence of connector.
3. Device IL range/dynamic range both reduced for multiple output SOM.
4. RL module SWS20005 required.
5. 10 and 20 nm/s also selectable.
6. High PDL accuracy Detector Module SWS15107-A using FC/APC only.
7. All other specifications are maintained when using a scan speed of 20 nm/s.
Ordering Information
SWS2000 Core System
Product Code
C+L-band Tunable Laser
Dual output integrated source optic module (SOM)
Four output integrated source optic module (SOM)
Eight output integrated source optic module (SOM)
All-band control module: computer and PCI kit included
Receiver chassis
All-band detector module
SWS2000 Optional Equipment and Accessories
Product Code
Polarization dependent loss (PDL)
Optimized all-band detector module
All-band detector module, multimode (MM)
PCI Interconnect card and cable kit
Return loss (RL) cassette (single channel)
All-band control module: PCI kit included
All-band calibration kit
Dual Laser + SOM transmission cabinet
Detector cap
FC detector adapter
ST detector adapter
SC detector adapter
LC detector adapter
Magnetic detector adapter
Bare fiber holder (requires AC120)
Integrating sphere
Swept Wavelength System
(SWS-OMNI Expansion Series)
Key Features
• Virtual Modulation Frequency Feature (VMFF) - flexible
• Measures IL, PDL, GD, DGD with a single bench or rack
mountable receiver
• Distributed Architecture - Add additional measurement
stations at any time
• Wideband scanning 1520 to 1630 nm, in one sweep
• Passive optical component and fiber
characterization in lab and
manufacturing environments.
Safety Information
• Complies to CE requirements plus
UL3101.1 and CAN/CSA-C22.2 No.
1010.1. The laser source in the
Source Optics Module is a class 1
laser. The Tunable Laser Source
(SWS-17101) is a class 3B laser. Both
are classified per IEC standard
60825-1 (2002) and comply with
FDA standard 21CFR 1040.10 except
deviations per Laser Notice No. 50,
July 2001.
• High speed; two-channel device characterization over
C-band or C+L-bands for simultaneous measurement
of all parameters
• Calibrated to NIST CD and Polarization Mode Dispersion
(PMD) standards
• Powerful engineering software package + DLL library custom software applications
With the simple addition of an RF modulator within the SOM and an OMNI
receiver, an existing Swept Wavelength System SWS2000 system can be used to
measure group delay (GD) and differential group delay (DGD). Existing test
stations can still be used.
SWS-OMNI adds to the SWS family of test systems and provides leading-edge
performance for fast all-parameter testing for efficient engineering, research and
development (R&D) and production testing operations. SWS-OMNI rapidly and
accurately measures insertion loss (IL), polarization dependent loss (PDL), GD
and DGD characteristics of a wide range of passive optical components and optical
fiber using a dual channel receiver for higher-throughput and lower-cost testing.
The modular architecture of the SWS-OMNI enables a user to add the SWSOMNI receiver to an existing SWS transmitter to provide a stand-alone all
parameter test station without the added expenditure of another tunable laser and
wavelength meter. These additional test stations are purchased at a relatively low
incremental cost providing best multi-station capital expenditure economics in
the industry.
From phase and IL measurements, SWS-OMNI software calculates CD, PDL, GD
and DGD as a function of wavelength or frequency. Displayed data may be further
analyzed on-screen using markers, or setup to automatically analyze the data in
the parameter ranges defined. This data can be exported for further analysis. The
software also has dynamic link libraries (DLLs) that can be used to easily develop
custom software in LabVIEW, Visual Basic or C+ a feature that is especially useful
in a production environment.
SWS-OMNI Virtual Modulation Frequency Feature (VMFF)
To improve the group delay noise and resolution, conventional modulation
phase measurement techniques often employ an adjustable modulation
frequency, which needs to be set before measurements are made. In contrast,
the SWS-OMNI system uses the proprietary VMFF. All swept group delay
measurements are made at a fixed modulation frequency (192 MHz) optimized
for the 3 pm wavelength sampling step of the SWS. The data is then
post-processed to achieve higher effective modulation.
Performance Curves
Ty pical Differential Group Delay Perfor mance Cur ves (3 σ)
Ty pical Group Delay Perfor mance Cur ves (3 σ)
Measurement range C+L-band
Wavelength span
Absolute accuracy
Wavelength sampling resolution
Measurement resolution1
Insertion loss (IL)2, 3
Dynamic range
(0 to < 5 dB)
(5 to < 25 dB)
(25 to 45 dB)
Group delay2, 3
Dynamic range
Accuracy (at < 10 dB IL)4
Modulation frequency6
Maximum slope
Polarization dependent loss (PDL)2
Dynamic range
Accuracy (0 to < 10 dB)
Differential group delay2
Dynamic range
DGD uncertainty5
Polarization mode dispersion (PMD) accuracy (typical)7
1520 to 1630 nm
110 nm
± 2 pm
3 pm
1 pm
45 dB
± 0.05 dB
± 0.10 dB
± 0.25 dB
0.01 dB
20 dB
1.5 % typical
See attached performance curves
192 MHz or greater
800 ns/nm
45 dB
± 0.05 dB
0.01 dB
20 dB
See performance curves below
± 0.02 ps
Measurement resolution is defined as the smallest shift in wavelength that can be detected using the analysis function.
Measured using SWS-OMNI transmitter under optimal power output.
Polarization state averaged.
Maximum deviation from NIST standard reference 2524.
Indicated uncertainty at 99.7% confidence level (3σ).
Theoretically no upper limit.
Based on the measurement of NIST standard reference 2518 (Mode-coupled PMD artifact, wavelength range 1520.5 to 1568.5 nm, DGD ~ 329 fs).
Ordering Information
C+L-band Tunable Laser
Dual output integrated source optic module (SOM) - OMNI version
SWS-OMNI Dual Channel Receiver: PCI kit included
SWS-OMNI Dual Channel Receiver: computer and PCI kit included
Test & Measurement Regional Sales
TEL : 1 866 228 3762
FAX : +1 301 353 9216
All statements, technical information and recommendations related to the products herein are based upon information believed to be
reliable or accurate. However, the accuracy or completeness thereof is not guaranteed, and no responsibility is assumed for any
inaccuracies. The user assumes all risks and liability whatsoever in connection with the use of a product or its application. JDSU reserves
the right to change at any time without notice the design, specifications, function, fit or form of its products described herein, including withdrawal at any time of a product offered for sale herein. JDSU makes no representations that the products
herein are free from any intellectual property claims of others. Please contact JDSU for more information. JDSU and the JDSU logo are
trademarks of JDS Uniphase Corporation. Other trademarks are the property of their respective holders. ©2006 JDS Uniphase
Corporation. All rights reserved. 10109651 008 0507 SWS2000.DS.FOPLT.TM.AE
TEL : +55 11 5503 3800
FAX : +55 11 5505 1598
TEL : +852 2892 0990
FAX : +852 2892 0770
TEL : +49 7121 86 2222
FAX : +49 7121 86 1222
WEBSITE : www.jdsu.com